PV Module Hotspot Detection
J. Gallon, G.S. Horner, J.E. Hudson, L.A. Vasilyev, K. Lu,
Tau Science Corporation, Hillsboro, OR, USA
Abstract Module Measurement Method
Hotspot defects are known to cause reliability problems in both thin-film and conventional c-Si Method: Lock-in & Time-resolved
modules. Detection of hotspots in completed modules can identify potential failures before the Patents Pending
Thermography
module is installed in the field. We describe several root causes for hotspot failures in PV modules,
and demonstrate an infrared measurement technique, IRIS™, to quickly identify and characterize the Camera: LWIR (8-12 micron)
severity of module hotspots. Speed: a) Inline: ~20 seconds / module
b) R&D: 30ms- 5 min.
Hotspots: Common Causes
Background Cell Manufacture
Hotspots are, in general, most noticeable when a • Incomplete edge isolation
cell is placed in reverse bias. As an example, • Crystalline defects intersecting junction
consider the c-Si module shown below. • Metal-decorated cracks
• Overfiring: pn junction “punchthrough”
Assume that one cell (outlined in red) is shaded • Scribeline shunts- incomplete removal
while all other cells are fully illuminated. or redeposition
• Metal particles & bridges on backside
Causes of shading might include:
• Bird or Leaf • Print alignment errors
Complete Module Inspection
• Dirt or Snow Module Manufacture
• Building Shadow… etc. • High resistance or “cold” solder points
• Current mismatch between cells
A shaded cell with minor defects will readily
withstand the high reverse bias (~10-12 Volts,
typical) that persists until the shadow is removed,
but a cell with significant shunts will leak reverse
current and exhibit extremely localized heating at Typical Damage (x-Si)
each defect. Mild (<80°C rise)
The temperature rise near a defect can vary from
• Low damage probability
1 cm
Moderate (~80-200°C rise)
mild (1-80°C) to extreme (>200°C), but • Backsheet bubbles
equilibrium is reached within 10’s of seconds. Analysis of Module Regions
• Coverglass cracking
• loss of quasi-hermetic seal
Extreme (>200°C rise)
• Cell damage
Long term effect
Moisture Intrusion
à Corrosion & Power Loss Summary
à Warranty failure. Using this technique, hotspots may be
conclusively identified before or during field
Manufacturing Requirement installation with IRIS inspection machines
• Reduce Warranty Exposure by capable of >25 modules per hour. The technique
identifying hotspot modules with high works in ambient light and directly measures the
reliability (>99.9% accurate) inspection. local heating due to defects.
