C103-E005H

FTIR Series
Accessories

Sh i ma dzu
F o u ri e r Tra n sfo r m
In fra re d Spe c tro ph o to me te rs
 F TI R Acc e s s o r i e s O v e r v iew

Se l e c t i on o f O p tio n al A cc essories
Shimadzu's FTIR instruments have simple optics to give an Rubbers
attachment having complicated optics its full play. In FTIR, which
ensures exceptionally high wavenumber accuracy, even a single-
beam instrument provides satisfactory spectra, which means that the
Powders
reference sample and the unknown sample can be measured
individually; the net result is that, in FTIR, only one piece of
attachment or accessory is useful enough. In dispersive IR, by
contrast, attachments and accessories must be used as a pair. This
Paper, cloth, yarns
is a great advantage from an economic viewpoint.
Films, plastics
Most of the attachments and accessories are designed so that
samples may be measured without preparation.

Shown to the right is a flow chart for selecting attachments and

Solids
accessories. The results of FTIR analysis depend greatly
on the type of attachment and accessory used in analysis.
Coating films
on metals

Coating films
on resins

Semiconductors

Oil content measurement

Type of
Sample Nonvolatile organic
solvents
Volatile organic
Liquids solvents
Aqueous solutions

Extract solutions
IRPrestige-21

Gases Concentration

Micro/trace Liquids
samples

IRAffinity-1 Solids

2
 Total reflectance method ATR-8000A, ATR-8200HA, Single-reflection ATR, etc. (Black rubbers requires Ge prism)
Pyrolysis
Liquid film method Demountable cell
Nujol method Demountable cell
KBr pellet method KBr die + hydraulic press + vacuum pump or mini hand press
Total reflectance method Single-reflection ATR
Diffuse reflectance method DRS-8000A ............ Mix with KBr powder
Total reflectance method ATR-8000A, ATR-8200HA, Single-reflection ATR, etc.
Total reflectance method ATR-8000A, ATR-8200HA, Single-reflection ATR, etc.
Thicker than 100μm
Thinner than 100μm
Transmission method Film holder .............. Use grid polarizer for study of molecular orientation
Dissolve in solvent
Film method Demountable cell .... Evaporate the solvent to obtain the film
Grind
SiC sampler DRS-8000A, SiC sampler

Thicker than 1 μm
Specular reflectance method SRM-8000A, VeeMAX2A

Total reflectance method ATR-8200HA, .......... Measurement to a depth of 1/5 of the wavelength with
Single-reflection ATR a KRS-5 prism and to 1/10 with a Ge prism
Thinner than 1 μm
Reflection absorption RAS-8000A, ............ Use of a grid polarizer enhances sensitivity about two times
Mix with spectrometry VeeMAX2A
KBr powder
KBr pellet method KBr die + hydraulic press + vacuum pump (or mini hand press)
Diffuse reflectance method DRS-8000A

Total reflectance method ATR-8200HA, .......... Measurement to a depth of 1/5 of the wavelength with a
Single-reflection ATR KRS-5 prism and to 1/10 with a Ge prism
Specular reflectance method SRM-8000A, ............ Convert a reflection spectrum into the absorption
VeeMAX2A spectrum by the Kramers-Kronig method
Film holder
Surface measurement Total reflectance method
Total reflectance method ATR-8200HA, Single-reflection ATR (Ge prism)

Quartz cell .............. Detection limit is 1ppm level with 10 mm optical path

Liquid film method Demountable cell

Rapid measurement
Solution method Fixed thickness cell, sealed liquid cell
Above 10% in concentration
Liquid film method Demountable cell with KRS-5 or ZnSe window
Below 10% in concentration
Total reflectance method ATR-8200HA, Single-reflection ATR
Difference spectrometry
Solution method Fixed thickness cell
Evaporate solvent
Diffuse reflectance method DRS-8000A ............. The sample solution is supplied dropwise on KBr powder
and measured after evaporating the solvent

Total reflectance method ATR-8200HA, Single-reflectionATR ............ The sample solution is supplied
dropwise on prism and measured
after evaporating the solvent
% order
5cm/10cm gas cell
ppm order
Gas cell with long pathlength

μRorder
Transmission method Micro cell
Total reflectance method Single-reflection ATR
Below several handreds of μm
Infrared microscopy AIM-8800 ................ Applicable to transmission, reflection, and ATR methods
Above several hundreds of μm
Total reflectance method Single-reflection ATR

3
 Shi m adz u A c c e s s o r y L i n e - u p

1. Options from Shimadzu

Description P/N Remarks Page
ATR-8000A 206-62303-91
Attenuated Total Reflection Attachment with KRS-5 prism 6
ATR-8000 206-62303
ATR-8200HA 208-97240-91
Horizontal Type Attenuated Total Reflection Attachment with ZnSe prism 7
ATR-8200H 208-97240
MIRacleA 208-97247-95
with ZnSe prism
Attenuated Total Reflectance Measurement MIRacle 208-97247-91
Single-Reflection Horizontal Attenuated Total 8
MIRacleA 208-97247-96
Reflection Attachment with Ge prism
MIRacle 208-97247-92
DuraSampllR2 (Diamond ATR) See page 9 9
Single-Reflection Horizontal Attenuated 208-92184
DuraScope with Diamond prism 10
Total Reflection Attachment 208-92207
SRM-8000A 206-62304-91 Incident Angle:
Specular Reflectance Attachment 12
SRM-8000 206-62304 10°C
RAS-8000A 206-62302-91 Incident Angle:
Reflection Absorption Spectrometry Attachment 13
Reflectance Measurement RAS-8000 206-62302 70 to 75 °C
Grid Polarizer GPR-8000 206-61550 14
VeeMAX2A 208-977284-91 Incident Angle:
Variable Incident Angle Reflectance Attachment 15
VeeMAX2 208-97284-92 30 to 80 °C
DRS-8000A 206-62301-91
Diffuse Reflectance Attachment 17
DRS-8000 206-62301
Diffuse Reflectance Measurement
SiC Sampler 200-66750 18
Automatic Diffuse Reflectance Attachment DRS-8010ASC 206-62308 19
Reflection-Type Beam Condenser RBC-8000 206-62305 21
Type 1 206-72500-92
Automatic Infrared Microscope AIM-8800 22
Type 2 206-72500-96
ATR Objective Mirror ATR-8800M 206-70450-91 with Ge prism
23
Micro Sample Measurement Sampling Kit 208-92171
Diamond Cell C 208-92236
24
Diamond Cell B 200-66752
Micro Magnetic Sample Holder 208-97206
25
Micro Vise Holder 208-97202
Automatic Sampler Diffuse Reflectance Attachment DRS-8010ASC 206-62308
Accessories for Automated Measurement Auto Sampler for Transmission Measurement ASC-8000T 206-63900 27
Sample Switcher 21 206-63663-92
PCK-8000 206-62309
PCK-8730 206-70170-91
Purge Control Kit PCK-8940 206-71122-91 28
Purge Control Kit PCK-8941 206-73512
PCK-21 206-72352-91
50Hz 200-64185-01
Dry Air Supply Unit 28
60Hz 200-64185-02
External light Beam Switching Kit 206-70125-92
29
MCT Kit 206-72017-91
External Detector / Optional Detector Second Sample Compartment (with MCT detector) SSU-8000MCT 206-62306-01
Second Sample Compartment SSU-8000 206-62306 30
MCT Detector MCTD-8000 206-62307
Cassette (Sample Holder) 206-17384
31
Magnetic-Type Film Sample Holder 200-66754-11
Universal Clip Holder 208-97207
EZ-Clip 13 208-97208 32
Transmission Measurement
EZ-Clip 25 208-97209
5cm Gas Cell 202-32006-
10cm Gas Cell 202-32007- 33
Gas Cell Long Pathlength Gas Cell —
Mini Hand Press MHP-1 200-66747-91
34
Evacuable Die for KBr Pellets 202-32010
Micro Die for 2mm dia. KBr Pellets 202-32011
Micro Die for 5mm dia. KBr Pellets 202-32012
35
Pellet Measurement Hydraulic Press SSP-10A 200-64175
Vacuum Pump SA18-3M 261-79017
Magnetic-Type Pellet Holder 200-66753-11
Agate Mortar and Pestle 200-93508 36
KBr Crystal (100g) 202-34141
Demountable Cell 202-32000-
Sealed Liquid Cell 202-32001- 38
Cells for Liquid Samples Fixed Thickness Cell 202-32002-
Sample Cell for Oil Content Determination See page 32
39
Crystal Polishing Kit 202-32024
Others Far Infrared Kit 206-72016-91 40
NIR Set 206-72015-91
Upload Type Diffuse Reflectance Attachment UpIR A 208-97271-91 42
NIR Integrating Sphere IntegratIR A 208-97272-91
NIR Measurement Fiber Coupler 206-72751-91
43
Reflective Fiber Probe 206-72760-91
Heating Transmission Cell 206-72716-91
44
Infrared Microscope AIM-8800 206-73700-
IRsolution Agent 206-21600-92
45
Mapping Program 206-73738-91
Macro Platform 206-72330-91
Optional Software
3D Display Program 206-73737-91
46
PLS Quantitation Software 206-72331-91
Curvefitting (Peak split) Software 206-72333-91

4
A t t enuat ed Tot al R ef l ect ance M easurement

A t t enu at ed To t al R ef lect io n M et h o d
The Attenuated Total Reflection (ATR) method, also called Multiple Internal Reflectance (MIR) method, is a versatile and powerful technique
for infrared absorption spectrophotometry. This method is popular not only in FTIR but also in conventional dispersive IR, because it is not
necessary to chemically treat, or machine, the samples. Measurement is made without destroying the samples.
FTIR instruments, which ensure far higher sensitivity than dispersive lR instruments, dramatically widen the scope of application scope of the
attenuated total reflection method; hence, a wide variety of attachments have been developed for this application.
Shimadzu also provides a variety of ATR attachments.

Prin cip le
The sample is held in contact with a prism made of highly refractive
Prism lnfrared rays
material, which transmits infrared rays; infrared rays are made Sample

incident on this sample at an angle larger than the critical angle

(angle that induces total reflection). The light that is totally reflected
by the interface between the sample and the prism is measured to Sample
obtain an infrared spectrum.
Though it is called "total reflection", the light travels through the thin
Prism
surface layer of the sample, as shown in the figure below, and
therefore, the spectrum obtained is similar to that obtained from a
Sample
very thin slice of the same sample.

R eq u iremen t s f or M easurement s by t he ATR M et hod

The sample must be placed in close contact This method is applicable to soft rubber or plastic samples,
with the surface of the prism. solid samples with a flat surface, liquid samples, and powder samples.

The prism has a higher refractive index

lt is necessary to use a prism having an appropriate refractive index.
than the sample.

Pen et rat io n D ept h of IR Light ( Sa m pl e t h i c k n e s s )

Infrared light can penetrate where, θ : lncident angle

to a depth expressed λ n21: (Refractive index of sample) /
dp= 1
by the next equation: 2π(sin2θ-n212) 2 (Refractive index of prism)
λ : Wavelength

Examp le o f Pen et rat ion D ept h When θ= 45° and n21 = 0.5, therefore, 10μm (1000 cm-1) dp
Sample refractive index of 1.5 corresponds to 3.18μm and 5μm dp (2000 cm-1) to 1.6μm.
Material ZnSe/KRS-5/Diamond The ATR method provides spectra of surface layers without actually
Refractive index (1,000 cm-1) 2.4 slicing them.
Incident angle 45° 60° Since the measurable depth (thickness) differs with the wavelength
4,000 cm-1 1.2μm 0.7μm
of the light, the ATR method give spectra of a little different shape
Penetration 2,000 cm-1 2.4μm 1.3μm
depth 1,000 cm-1 4.8μm 2.7μm
though the peak wavenumbers are the same.
400 cm-1 12.0μm 6.6μm
The software program for correcting for penetration depth,
Material Germanium incorporated in the IRPrestige-21, IRAffinity-1, FTIR-8000 Series
Refractive index (1,000 cm-1) 4 further widens the application field of the ATR method.
Incident angle 30° 45° 60°
4,000 cm-1 1.2μm 0.7μm 0.5μm
Penetration 2,000 cm-1 2.4μm 1.3μm 1.0μm
depth 1,000 cm-1 4.8μm 2.7μm 2.0μm
400 cm-1 12.0μm 6.6μm 5.1μm

5
 A ttenuat e d R e f l e c t a n c e Me a s u re me n t

Attenuated Total Reflection Attachment

ATR-8000A ( P/ N 206- 62303- 91)
ATR-8000 ( P/ N 206- 62303) to detector

In the ATR-8000 series, the incident angle is changeable in three 60°

steps of 30°, 45°, and 60°, so that measurement can be made to
Prism 45°
different depths. Combined with the program to correct for the
penetrating depth of the infrared rays (which is a weak point of the 30°

ATR method because it differs depending on the wavenumber), this

feature provides spectra that are highly comparable to those given by
another method. QuickStart ATR-8000A includes the automatic
accessory recognition function.

Optics of ATR-8000

Features
It is not necessary to adjust the position of the prism when a new
sample is set.
The sample holder is held at one point; hence, the prism is under
minimized force.
45 times reflection (with an incident angle of 45°) ensures high
sensitivity.
Standard software includes a program to correct for penetration
depth.
Maximum sample size: 40mm x 15mm, 10mm thick

ATR-8000
Standard Content
Description Quantity
Attenuated Total Reflection Attachment 1
ATR prism (KRS-5) 1
Sample holder 1 set
Hex key wrench 1
PhiIlips screwdriver 1

Prisms
Material Refractive Index With holder Without holder
(1000cm-1) (P/N) (P/N)
KRS-5 2.37 206-61560-01 200-66125-01
Ge 4.0 206-61560-02 200-66125-02
ATR Spectrum of PET (KRS-5 prism)
Note: Prisms without a holder are recommended as supplies, while those with a
holder are recommended when prisms of different materials are purchased.

(52)
°
45

(48)

50
20

Dimensions of Prism ATR Spectrum of PET, corrected for Penetration Depth

6
H o rizo n t al T yp e A t t enuat ed Tot al R ef lect ion At t achment
A T R - 8200H A ( P/ N 2 0 8 - 9 7 2 4 0 - 9 1 )
Sample
A T R - 8200H ( P/ N 2 0 8 - 9 7 2 4 0 )
The principle is the same as the ATR-8000. Since the prism can be
placed horizontally, powder or liquid samples, which cannot be
analyzed with the ordinary ATR attachment, can be readily
measured. QuickStart ATR-8200HA includes the automatic
accessory recognition function.
Prism

F eat u res
Prisms for liquid samples and for solid samples are provided as to detector
standard. Optics of ATR-8200H
The prism is mounted and dismounted by one-touch operation,
which ensures easy exchange of samples.
ZnSe prisms are very chemically stable and ensure high
mechanical strength.

St an d ard C o n t ent
Description Quantity
1 Horizontal Type Attenuated Total Reflection
1
Attachment
2 ZnSe prism for solid samples, 45° incident angle 1
3 ZnSe prism for liquid samples, 45° incident angle 1
4 Gripper (P/N 208-97240-25) 1
ATR-8200H

The prism for liquid samples is fixed in the groove, as shown in the
figure, so that liquid, powder, or gel samples may be easily FTIR Spectrum of Oil
measured.
The dent to accept a sample is accessible from above to ensure
ease when replacing samples and cleaning the prism.
Spectrum of Edible Oil
The prism for liquid samples is fixed in the bottom of a boat-shaped groove, as shown in the
above figure, so that liquid, powder or gel samples can be easily measured.
The indentation to accept the sample is accessible from above to ensure ease when replacing
samples and cleaning the prism.

The prism for solid samples permits easy measurement of film type
and other solid samples, the operation being the same as that for the
ATR-8000. FTIR Spectrum of PVDC Sheet
A plate is fixed with screws to put the sample in close contact with
the prism surface, which ensures high reliability of the spectra.

Spectrum of PVDC Sheet

The prism for solid samples permits easy measurement of film and other solid samples, with
operation being the same as that for the regular ATR.
A gripper is fixed to hold the sample in close contact with the prism surface, which enables highly
reliable spectra.

Prisms
Description P/N
ZnSe prism for solid samples, 45° incident angle 208-97240-03
ZnSe prism for liquid samples, 45° incident angle 208-97240-01
Ge prism for solid samples, 45° incident angle 208-97240-13
Ge prism for liquid samples, 45° incident angle 208-97240-10

7
 A ttenuat e d To t a l R e f l e c t an c e M e a s u re me n t

Single-Reflection Horizontal Attenuated

Total Reflection Attachment Trough Insert
MIRacleA ZnSe prism model (P/N 208-97247-95)
MIRacle ZnSe prism model (P/N 208-97247-91) Prism
MIRacleA Ge prism model (P/N 208-97247-96)
MIRacle Ge prism model (P/N 208-97247-92)
MIRacle is a single-reflection horizontal attenuated total reflection
attachment which uses a 2 mm prism in diameter. Since the prism is
placed horizontally, solid samples, such as plastics, fibers, films and
powders, and liquid samples can be measured. QuickStart MIRacleA to detector
includes the automatic accessory recognition function.
Thumb screw

Optics of MIRacle
Features
Since the small prism is mounted, small solid samples and a bit of
a liquid sample can be measured.
The ZnSe prism can measure the wavenumber range from 5000
cm-1 to 650 cm-1.
The Ge prism can measure the wavenumber range from 5000 cm-1
to 700 cm-1 and can be used for the measurement of high
refractive index samples such as black rubber samples.

Standard Content
Description Quantity
Single-Reflection Horizontal Attenuated Total MIRacle
1
Reflection Attachment
Single-Reflection HATR UniversaI plate
1
(Selected prism, ZnSe prism or Ge prism)
Pressure clamp 1
Trough Insert 1

Prisms
Description P/N
Single-Reflection HATR Universal Plate, ZnSe prism 208-97247-93
Single-Reflection HATR Universal Plate, Ge prism 208-97247-94
ZnSe Prism Plate

Spectrum of EVA (Ethylene Vinyl Acetate) pellet

8
D u raSamp lIR2 ( D iamond A TR )
This is a single-reflection ATR system that presses an approximately
Metal Plate Diamond Prism
2 mm diameter diamond prism tightly against the sample. The
diamond prism allows the analysis of hard samples. The fit between
the sample and prism is extremely good, making it convenient for
liquids, solids, powders, fibers and film samples. With System I
(High-Pressure Device type), the sample is pressed tightly against
the prism by the clamper accessory while adjusting the clamping
pressure. With System H (ViewIR type), the sample can be observed
as it is being clamped. System I is also available with a pressure
sensor included.
ZnSe and KRS-5 support elements are available to support the Infrared Light ZnSe or KRS-5 Support Element
diamond prism. The measurement wavenumber range is up to 650
DuraSamplIR2 Optics
cm-1 for ZnSe and 400 cm-1 for KRS-5.
The pressure sensor cannot be added later. If it will be needed,
please include it when purchasing the system.

D u raSamp lIR2 Part N ames and P/N

Description P/N
DuraSamplIR2A System I
208-92143-11
(ZnSe support element)
DuraSamplIR2A System I
208-92144-11
(ZnSe support element, with pressure sensor)
DuraSamplIR2A System I
208-92143-12
(KRS-5 support element)
DuraSamplIR2A System I
208-92144-12 Exterior of System I (High-Pressure Device Type)
(KRS-5 support element, with pressure sensor)
DuraSamplIR2A System H
208-92145-11
(ZnSe support element)
DuraSamplIR2A System H
208-92145-12
(KRS-5 support element)
The systems above include an automatic accessory detection feature.

Description P/N
DuraSamplIR2 System I
208-92143-01
(ZnSe support element)
DuraSamplIR2 System I
208-92144-01
(ZnSe support element, with pressure sensor)
DuraSamplIR2 System I
208-92143-02
(KRS-5 support element)
DuraSamplIR2 System I
208-92144-02
(KRS-5 support element, with pressure sensor)
Exterior of System I (with pressure sensor)
DuraSamplIR2 System H
208-92145-01
(ZnSe support element)
DuraSamplIR2 System H
208-92145-02
(KRS-5 support element)

Op t io n al an d St andard Part s
Description P/N
DuraDisk (ZnSe support element) 208-92147
DuraDisk (KRS-5 support element) 208-92148
DuraDisk (Ge/Ge) 208-92238

The DuraDisk is the section where the diamond prism and the
support element are joined together (the cylindrical metal section
shown in the photo of the System I exterior). DuraDisks can be
replaced by the customer. Exterior of System H (ViewIR Type)

9
 Attenuat e d To t a l R e f l e c t an c e M e a s u re me n t

DuraScope ( P/ N 208- 92184)

As with the DuraSamplIR, this is a single-reflection diamond ATR,
where measurements are conducted by pressing the sample against Video Monitor
the approximately 2 mm diameter diamond prism. A micro CCD
camera is provided directly below the diamond prism to allow the
observation of the contact status between the sample and prism on a
video monitor. The built-in pressure sensor indicates the pressure
being applied to the prism. Apart from solid samples such as plastics,
film or powders, liquid samples can be also analyzed by being
dropped onto the prism surface.

Description P/N
DuraScope
208-92184
(ZnSe support element)
DuraScope
(KRS-5 support element)
208-92207

DuraScope
Options for DuraSampllR II and DuraScope
Description P/N
DuraDisk
208-92144
(ZnSe support element)
DuraDisk
208-92148
(KRS-5 support element)

DuraDisk (Ge/Ge) 208-92238

The DuraDisk is the section where the diamond prism and the support element
are joined together. A DuraDisk for the Ge prism for measuring high refractive
index samples also is available. DuraDisks can be replaced by the customer.

10
R ef l ect ance M easur em ent

Sp ecu lar R ef lect an ce M et h o d

FTIR measurement by the specular reflectance method provides three types of information shown below:

1 The incident light passes through the 2 The incident light is reflected by the surface 3 The above mentioned two types of
sample layer and is reflected by the of the sample: the reflection spectrum is information are mixed: the spectrum given is
substrate: the spectrum given is similar to obtained, which can be converted into the sum of the transmission spectrum and the
that obtained by the transmission method. absorption spectrum through the use of the reflection spectrum. When the sample has a
Measurement of thin film on a metal plate Kramers-Kronig analysis method. uniform thickness, the two reflection light
is a typical Metal substratum Transmitted beams interfere with each other, and the
example of this light cannot be sample thickness can be obtained from the
method. detected. interference pattern.
Metal substratum
Sample
The measurement of
Thin film
a epitaxiaI layer of a
semi-conductor
Thin film
IR rays IR rays sample is a typical
application of this
method. IR rays
1.R ef lect io n A b sorpt ion Spect roscopy
The Reflection Absorption Spectroscopy (RAS) method permits high-
sensitivity measurement of a thin film sample on a metal substrate.
This method has recently come to be applied to the measurement of
1. In vertical polarization, the vectors of the polarized light are
very thin (a few tens of angstroms thick) samples, e.g. organic LB
opposite to each other. Therefore, no stationary waves are
films (Langmuir-Brodgett's Iayers), and to the determination of
produced on the substrate, and interaction with the film material is
molecular orientation.
not detected.
When a polarized Iight beam is made incident on a metal substrate,
2. ln parallel polarization, the vectors of the polarized Iight meet at a
as shown below, it is changed in phase when reflected by the metal
point to produce stationary waves, which interact with the film and
surface.
are absorbed. The intensity of this absorption is dependent on the
incident angle: the larger the incident angle, the higher the
intensity of absorption. The optimum incident angle is different
with the type of sample and the wavelength of the peak under
Vertical polarization Parallel polarization
study. In many cases, an incident angle between 70° and 80° is
Metal plate Metal plate
used.
Reflection of Light on MetaI Substratum

2.C o n versio n o f R ef lect ion Spect ra int o Absorpt ion Spect ra

A reflection spectrum, which provides information on the optical where, R: Reflectance value
properties of the sample, must be converted into the absorption θ: phase shift when the light is reflected.
spectrum to be informative about the chemical structure of the The θ for the wavenumber vg may be calculated from the following
sample. The Kramers-Kronig analysis method is quite convenient in Kramers-Kronig equation:
that it is useful to convert a reflection spectrum into an absorption 2νg ∞ In√R(ν)
spectrum: it is not necessary to shave or slice the sample. In the θ(νg)=
π 0∫ ν2−νg2
dν (3)
example (2) shown below, when the ø is sufficiently small, each
element of the complex refractive index of a material may be The θ can be obtained from the reflectance value R, and substituting
expressed as: that θ in the equation (2) gives the absorption coefficient k.
1-R Performing this calculation for all the wavenumbers will give the
Reflectance value n= (1)
1+R-2√Rcosθ absorption spectrum.
-2√Rsinθ
Absorption coefficient k= (2)
1+R-2√Rcosθ

Examp les o f A p plicat ions

Since a reflection spectrum can be converted into the absorption spectrum through Kramers-Kronig analysis,
1Absorption spectrum can be obtained without shaving or slicing the sample, provided that the sample has a smooth surface. lt is not
necessary to use an ATR prism or a costly attachment.
2Kramers-Kronig analysis method is especially effective for infrared microscopy, where it is virtually impossible to slice the sample.

11
 R efl ecta n c e M e a s u r e m e nt

Specular Reflectance Attachment

SRM-8000A ( P/ N 206- 62304- 91) Sample
SRM-8000 ( P/ N 206- 62304)
The specular reflectance measurement method is an old method to
obtain reflection lR spectra.
The SRM-8000 series permits not only measurement of reflection
spectra, but also measurement of absorption spectra through the
combined use of the Kramers-Kronig analysis method. This
attachment provides absorption spectra of solids, such as high
to detector
polymers, without using a prism, which is required in the ATR
method. QuickStart SRM-8000A includes the automatic accessory
recognition function.

Optics of SRM-8000

Features
Easy sample setting.
Kramers-Kronig conversion software provides IR spectra without
sample preparation.

Description P/N Quantity

Specular reflectance attachment 1
Standard mirror, 30 x 30 mm 200-66123 1
Sample mask, 15 mm dia. 206-18752-02 1
Hex key wrench 1
Phillips screwdriver 1

SRM-8000

Specular Reflectance Spectrum of the Inner Wall of Aluminum Can

Specular Reflectance Spectrum of PMMA after

Kramers-Kronig Conversion

12
R ef lect io n A b sorpt ion Spect romet ry
A t t ach men t
R A S- 8000A ( P/N 2 0 6 - 6 2 3 0 2 - 9 1 )
R A S- 8000 ( P/N 2 0 6 - 6 2 3 0 2 ) Incident Stationary wave
light
The reflection absorption spectrometry method is used only in FTIR.
When a vertically polarized light and a horizontally polarized light are
made incident on a metal substrate, the lights are changed in the Reflected
respective phase. light

In the case of vertically polarized light, the phase change Vertical polarization Parallel polarization
is about π , irrespective of the incident angle, and, hence,
the vectors of the reflected light interact destructively with
each other; the stationary waves produced have almost
zero amplitude - no absorption of the sample is detected.
Principle of Reflection Absorption Spectrometry
In the case of horizontally polarized light, the amount of
phase change varies continuously from zero (for 0° incident angle) to
π (for 90°). The amplitude of the stationary waves produced also Sample
changes with the incident angle: when a high incident angle is
20°
selected, the stationary waves will have a high amplitude and the
interaction of the light beam and the sample will be high, resulting in
a high detecting sensitivity. This method permits high-sensitivity
measurement of thin films on metals having a high reflectance.
Combined use of a grid polarizer further enhances the sensitivity.
A grid polarizer (P/N 206-61550) is not included in the standard Light shield
plate
content of the RAS-8000 series but is available as an option.
QuickStart RAS-8000A includes the automatic accessory recognition
function. Mask (at wedge)

Optics of RAS-8000

F eat u res
Easy sample setting.
The incident angle is selectable between 70° and 75°.

St an d ard C o n t ent
Description P/N Quantity
Reflection absorption spectrometry attachment 1
Standard mirror 200-66123 1
Sample mask, 8 mm dia. 206-18752-01 1
Sample mask, 15 mm dia. 206-18752-02 1
Sample mask, 25 mm dia. 206-18752-03 1
Light beam mask, 3 x 3 mm 206-18608-01 1 RAS-8000
Light beam mask, 5 x 5 mm 206-18608-02 1
Light shielding plate* 1
Hex key wrench 1
PhiIIips screwdriver 1
* Attaching the light shielding plate raises the mean incident angle of the light
beam from 70° to 75°.

Relationship Between Spectrum of Fluorine Film on Hard Disk,

Peak Area and Film Thickness (calibration curve)

13
 R efl ecta n c e M e a s u r e m e nt

Grid Polarizer
GPR-8000 ( P/ N 206- 61550)

A grid is precisely produced on the substrate by the photographic

technique. The grid polarizer enhances the sensitivity of the RAS-
8000 Reflection Absorption Spectroscopy Attachment.

Degree of polarization: 99% (at 10 μm), 95% (at 3 μm)

Quenching ratio: 148: 1 (at 10 μm), 23:1 (at 3 μm)
Effective area: 25 mm dia.
Angle scale: 360°, 10° increments
Material of substrate: KRS-5, 2 mm thick
Measurement wavelength range: 5,000 to 350 cm-1

Note
GPR-8000
This grid polarizer cannot be used with the VeeMax II Series.

Spectrum of Elongated Polyethylene Film

Red: Parallel polarization
Black: Vertical polarization

Spectrum of Elongated Polyethylene Film (Enlarged)

Red: Parallel polarization
Black: Vertical polarization

14
Variab le In cid ent A ngle R ef lect ance
A t t ach men t
VeeM A X 2 A ( P/ N 2 0 8 - 9 7 7 2 8 4 - 9 1 )
VeeM A X 2 ( P/ N 2 0 8 - 9 7 2 8 4 - 9 2 )
On this attachment, the incident angle can be varied within the range
30 to 80°.
Large samples can be measured as they are since the measurement
position exits the sample compartment.
An optional ATR prism and polarizer can be attached.
VeeMAX II A is equipped with an accessory recognition function.

F eat u res
Incident angle can be varied within the range 30 to 80°. Exterior of VeeMAX 2 and Optional Polarizer
Measurement is possible by merely placing the measurement
surface of the sample face down.
A polarizer can be used to perform high-sensitivity measurement of
thin films and measure the orientation of polarized light.
A single-reflection ATR prism can also be attached.

M easu rab le Samples

Coatings on flat metal surfaces
Flat plastic sheet
Attaching the optional ATR prism allows measurement of the
following samples:
Film, paper, rubber, plastic, fluid, gel samples

St an d ard C o n t ent
Description P/N Quantity VeeMAX 2 Optical System
VeeMAX 2 1
Sample mask set 208-97284-11 1
Gold-coated mirror 208-97271-13 1

Op t io n s
Description P/N
ZnSe prism plate for solid samples, 45° incident angle 208-97284-21
Ge prism plate for solid samples, 45° incident angle 208-97284-24
Sample clamp for VeeMAX 208-97284-14
KRS-5 polarizer for VeeMAX 208-97300-12
Liquid sample retainer for VeeMAX 208-97300-28

Syst em C o mb in at ions
Reflectance measurement in the range 30 to 80° can be handled
on the VeeMAX II Series.
When performing high-sensitivity reflectance measurement using a High-Sensitivity Reflection Spectrum of Hydroxylapatatite on Gold Plate
and Fibrinogen Laminated Thin Film
polarizer, purchase a VeeMAX II Series main unit and KRS-5
polarizer for the VeeMAX. The GPR-8000 cannot be used.
When performing ATR measurement of solid and film samples,
purchase a VeeMAX II Series main unit, prism plate (45°) for solid
samples for VeeMAX, and sample clamp for VeeMAX.
When performing ATR measurement of liquid samples, purchase a
VeeMAX II Series main unit, prism plate (45°) for solid samples for
VeeMAX, and liquid retainer for VeeMAX.

15
 D i ffuse R e f l e c t a n c e M e a s u re me n t

D i f f u s e R e flec tan ce S p ec troscopy

In measurement of powder samples by the dispersive IR method, the Diffuse reflected light, which has been repeatedly transmitted within
KBr pellet method is often used. The powder sample is mixed with the powder sample, gives a spectrum similar to ordinary transmission
alkali halide powder, such as KBr, and briquetted into a pellet, which spectrum. The spectral intensity is not completely proportional to the
is then measured by the transmission method. This KBr pellet concentration of the compounds under study: those components
method is also used in FTIR, but the diffuse reflection spectroscopic which are detected as rather low intensity absorption bands are
method is easier to perform. detected at higher intensity because the light beam is transmitted
As shown in the figure below, when a light beam is made incident on repeatedly in the sample. It is necessary, therefore, to compare
a powder sample, some part of the light is specularly reflected by the diffuse reflected spectra with ordinary transmission spectra or to
surface of the powder. The other part penetrates into the sample and convert them with the Kubelka-Munk equation.
is transmitted and reflected repeatedly, and then emerges out of the f= (1-R)2/2R = K/S
sample as a diffuse reflected (scattered) light. This diffuse reflected where, K: absorption coefficient
light is informative of the IR spectrum of the powder sample. S: scattering coefficient
R: reflection index
(sample power spectrum/dilution power spectrum)
Incident light
Since it is very difficult to measure absolute reflection indices, diffuse
reflection indices, which are the values relative to the reflection of
Specularly
Diffuse reflected light
KBr or KCI powder having no absorption in the IR region, are
reflected light generally used.
The spectra thus obtained are Kubelka-Munk converted to have
intensities proportional to concentration. The result is spectra useful
for quantitative determination. The FTIR-8000 Series / IRPrestige-21
incorporates the Kubelka-Munk conversion function as a standard
feature.
Reflection Within Powder Sample

Applications
The diffuse reflectance spectroscopic method is applicable to any
sample that can be pulverized. It also permits using, as the diluting
Remove mobile phase
substance, diamond powder or the like, which is not applicable to the through evaporation
KBr pellet method.
This method is also applicable to detection of substances dissolved Diffuse reflectance attachment
in a volatile solvent, such as fractions of liquid chromatography. LC
effluent is made to drop on KBr powder, the mobile phase is
Interferometer
removed by evaporation, and then the fraction is analyzed with the
Detector

FTIR instrument equipped with a diffuse reflectance attachment.

HPLC
fraction
KBr powder
FTIR

FTIR Analysis of HPLC Fractions

16
D if f u se R ef lect ance A t t achment
D R S- 8000A ( P/N 2 0 6 - 6 2 3 0 1 - 9 1 )
D R S- 8000 ( P/N 2 0 6 - 6 2 3 0 1 )
The method of diffuse reflectance spectrometry is one of the most
popular FTIR application methods of application of FTIR. lt features
high-energy throughput and simple operation. Sample
The Shimadzu FTIR Series incorporates, as standard, the Kubelka-
Munk conversion functions, essential to diffuse reflectance
spectrometry for correcting the light scattering by the KBr powder. to detector
QuickStart DRS-8000A includes the automatic accessory recognition
function.

Optics of DRS-8000
F eat u res
The small measuring light beam (1.8 x 1.8mm) ensures reliable
analysis of small samples.
The attachment is a drawer type, which ensures easy replacing.
The standard data processing functions include the Kubelka-Munk
conversion functions as standard.

St an d ard C o n t ent
Description P/N Quantity
Diffuse reflectance attachment 1
Sample holder 2 mm ID cup 1
Sample holder 4 mm ID cup 1
Aluminum cup holder* 1 DRS-8000
Standard mirror 206-61184-01 1
Ground glass mirror 206-61184-02 1
Sample holding rod 1
Hex key wrench 1
Phillips screwdriver 1
* Holder for disposable sample cup. Disposable sample cups are available as
extra.

Op t io n s
Description P/N
Sample cup, 50 pieces per set,
201-52943
aluminum, 6 dia. x 1.5 deep (mm)
Sample die for aluminum cup 206-63950 Diffuse Reflectance Spectrum of Lactose
SiC sampler 200-66750

Diffuse Reflectance Spectrum of Lactose After Kubelka-Munk Conversion

17
 D i ffuse R e f l e c t a n c e M e a s u re me n t

SiC Sampler ( P/ N 200- 66750)

In diffuse reflectance spectrometry, it is necessary to pulverize the
sample and mix the powder with KBr powder.
When the SiC sampler is used, the operation is simplified as follows: Sample holder that can be
Diluent such as KBr powder is not required. directly installed to
the DRS-8000
The solid sample is ground with SiC emery paper and the sample
powder on the emery paper is directly analyzed with the DRS-
8000. (The SiC has a hardness of 9.0 and is quite chemically Sticker type SiC
stable.) emery paper
New emery paper is used as reference.

Standard Content
Solid
Description P/N Quantity sample
Holding rod 1
Sample holder 208-92176 2
SiC emery paper (#320) 100 sheets
SiC emery paper (#400) 100 sheets

Construction of SiC Sample

Supplies
Description P/N
SiC emery paper (#320), 100 sheets 200-66751-01
SiC emery paper (#400), 100 sheets 200-66751-02

SiC Sampler

Diffuse Reflectance Spectrum of Plastic Products Obtained

with SiC Sampler

18
A u t o mat ic D if f use R ef lect ance A t t achment
D R S- 8010A SC ( P/ N 2 0 6 - 6 2 3 0 8 )
Having the same optics as the DRS-8000, the DRS-8010ASC
accepts 24 samples to permit automated measurement.

F eat u res
One-touch connection to the FTIR Series, which has the control
capability as standard.
Sample
With no external control unit required, the DRS-8010ASC is very
compact.
Controlled by the auto program incorporated as standard in the
FTIR Series. The program is user-definable. to detector

Manual control to reduce the frequency of opening the lid of the

sample compartment is possible, resulting in higher analytical
productivity.
Use of the disposable sample cups ensures easy exchange of
samples.

N o t es Optical Diagram of DRS-8010ASC

When this attachment is used on IRAffinity-1, the ASC cable (P/N
206-73433-91) is required.
The BASIC software is required separately for the HYPER-IR
model.

St an d ard C o n t ent
Description Quantity
Automatic diffuse reflectance attachment 1
Sample holder, 24-sample type 2
Standard mirror 1 set
Sample cup 200
Die 1
Tweezers 1 pair
Sample handling rod 1
Hex key wrench 1
Phillips screwdriver 1 DRS-8010ASC

Su p p lies
Description P/N
Sample holder, 24-sample type 206-65234
Sample cup, aluminum, 6 dia. x 1.5 deep (mm) 201-52943

F o r co n n ect io n wit h FTIR main body,

a cab le is req u ired.
Description P/N
Cable for IRPrestige-21, IRAffinity-1 206-73433-91
Cable for FTIR-8400S 208-94914-02

Sample stage

19
 M i cro S a m p l e M e a s u r e m e n t

M e a s u reme n t o f Micro S amples

FTIR ensures such a high sensitivity as to Reflection-type beam lR microscope
permit reliable measurement of micro condenser
samples. Measurement mode Transmission only Transmission/reflection/ATR
There are two popular devices to measure Selection of the Not possible Selection by aperture
micro samples: beam condenser and infrared part to be measured after observation in visual mode
microscope. The objects of measurement are Minimum About 200 μm About 10μm
classified as the selected small part of the measurable size
sample and a small part of a sample of Detector Detector of the FTIR Dedicated MCT detector
uniform composition; measurement is made in (Measurement wavenumber
either the reflection mode or transmission range is limited by the MCT
mode. These may be tabulated as follows: detector.)
Installation Sample compartment of the FTIR External installation

Transmission mode MCT detector

As shown in the figures, both in the beam condenser and the IR microscope, the

IR light from interferometer

to detector
IR light beam from the interferometer is condensed by the optics and made Aperture
incident on the sample. The light beam from the sample is expanded to the original
size and condensed on the detector, and then measured with the detector. Reflecting
objective
The measurement principle of measurement is the same as that of ordinary
Autome
samples, but in the case of micro samples, it is important to take the sample sample
thickness into due consideration.
X-Y-Z Condenser Entrance for IR
In measurement of 50 μm thick yarn samples, for example, if measurement is Sample mirror beam from the
stage
made without reducing the thickness, the detector signal will be saturated-resulting FTIR main
Beam Condenser Infrared Microscope
in deformed absorption bands. It is necessary to compress the sample using a
(Transmission mode)
diamond cell or the like.
Ordinary glass lenses are used for visual observation, while reflection mirrors must
be used for lR measurement.

Reflection mode
Infrared microscopy is effectively used in reflection mode. As shown in the figure,
the IR light from the interferometer is condensed by the reflecting objective and
made incident on the sample, and the reflected light travels back to the same
objective to be sensed by the detector. The paths for the incident light beam and
the reflected light beam are switched by the wedge mirror.
Though the measurement principle is the same as that of the samples of ordinary
sizes, since the measurement is made on a very small area, specular reflection
often occurs, resulting in abnormal peaks. The optics for visual observation and for
lR rays are the same as that for the transmission mode.
Infrared Microscope
(Reflection mode)

ATR mode microscopy

The Attenuated Total Reflection (ATR) method is effectively used for
IR beam
samples that are opaque to IR rays, as well as for IR microscopy. It
is especially effective for analysis of foreign materials on the resin
surface and measurement of samples with curved surfaces.
As shown in the figure, a semicircular prism is placed at the focus of
the reflecting objective, and the light totally reflected by the interface
Schwarzchild
of the sample and prism is measured to obtain the IR spectrum. reflecting objective mirrors.

ATR (Ge) prism

Sample

20
R ef lect io n - T yp e B eam C ondenser
R B C - 8000 ( P/N 2 0 6 - 6 2 3 0 5 )
This beam condenser is especially useful for transmittance
measurement of micro samples.

F eat u res
Since no lenses are used, measurement can be made over the
entire wavenumber region of the FTIR instrument.
Combined use with an ultramicro cell, 0.05 mm optical path,
permits transmission measurement of 2 to 3 μL of liquid samples.
The light beam is reduced to 1/5 (about 1.8 x 1.8mm).

St an d ard C o n t ent
Description Quantity
RBC-8000 reflection-type beam condenser 1
Sample holder, with X-Y-Z stage 1 W-Y-Z Sample
stage
Pellet sample holder 1
Hex key wrench 1
Optical Diagram of RBC-8000
Phillips screwdriver 1

RBC-8000

21
 M i cro S a m p l e M e a s u r e m e n t

Automatic Infrared Microscope

AIM-8800
450 340
Type 1 (P/N 206-72500-92 for 120V, -93 for 220V, -94 for 240V, -34 for CE, 230V)
Type 2 (P/N 206-72500-96 for 120V, -97 for 220V, -98 for 240V, -35 for CE, 230V) PC

300
Printer
The AIM-8800 is used with the FTIR Series, and is installed to the right CRT
of the instrument. This infrared microscope features ideal, bright optics

700
340
and a state-of-the-art MCT detector, enabling high-sensitivity detection

150
Key Board
of micro samples to enhance the full potential of the FTIR. In addition,
the numerous advanced functions, such as auto aperture setting and 450

auto focusing, greatly simplify the analysis of micro samples.

948

The microscope may remain attached to the instrument during ordinary

mm
measurement, so switching to microscopic measurement from ordinary
Relative Positioning of IRAffinity-1 and Microscope Monitor
measurement is no more than a touch away. (Note: The AIM-8800
cannot be installed on the FTIR-8100.)

Features
Ideal optical system, employing a state-of-the-art MCT detector
for high-sensitivity analysis.
Auto aperture, auto centering and auto X-Y stage functions simplify
determination of the analysis location.
Auto focus brings image in clear focus with one mouse-click.
Up to 10 samples and 2 background measurement sites can be
stored in memory.
Stage movement, aperture setting and focusing, as well as
switching between transmission / reflection and measurement / IRAffinity-1 Infrared Microscope System

observation modes are all performed via the PC screen.

Control is also possible using the microscope's key-board.

Specifications
Optics 15 x Cassegrain objective
15 x Cassegrain condenser mirrors
MCT detector Wavelength range : Wavelength range (near-infrared) (Note 1)
(Glass dewar type) Type 1 : 5000-720cm-1 10,000 to 3,800 cm-1
Type 2 : 5000-650cm-1 With liquid nitrogen monitoring system

Signal-to-noise ratio Transmission mode, aperture size 50 μm, 8cm-1

60 repeat scans
2600: 1 or higher (Type 1), 2000: 1 or higher (Type 2)
Electrically activated XYθ directional drive. Setting of XY direction
aperture increments is 1 μm over Sample surface, and 1° increments in
θ direction (numerical entry possible).
Minimum setting value : 3 μm
Motor-driven X-Y Positioning range : X axis : 70mm; Y axis : 30mm
Adhesive on Metal (measurement of part enclosed in blue in photo on right)
sample stage Resolution. 1 μm pitch
Sample thickness : Reflection mode : <
= 40mm
Transmission mode : <= 10mm
Microscope keyboard Measuring mode selection /
Operation XY stage operation (speed variable in 4 steps) / manual focusing /
illumination control
PC control Measuring mode selection / XY stage operation /auto centering /
manual focusing / auto focusing / illumination control /
aperture setting / aperture preview /
measurement position and aperture setting recording
(10 sample positions, 2 background positions)

(Note 1) Near-infrared measurement is possible only when the NIR Set is mounted
on IRPrestige-21.

Remarks:
1) When connecting to a PC-type FTIR-8000 Series, IRAffinity-1 and IRPrestige-21,
the PC for operating the FTIR main unit is also used for operating the AIM-8800.
When connecting to a non-PC-type FTIR-8000 Series, the PC must be purchased
separately. Spectrum of Adhesive on Metal
2) Contact us for details on parts required for connecting the FTIR to the AIM-8800.

22
A T R Ob ject ive M irror
A T R - 8800M ( P/N 2 0 6 - 7 0 4 5 0 - 9 1 )
A semicircular prism made of ZnSe is used. x 15 magnification; 30°
incident angle, and single reflection.
The prism is a slide type and permits switching between visual
observation mode and IR measurement mode.

F eat u res
Small prism enables focusing and measurement of even small
samples.
Measurement range of 5,000 to 700 cm -1

M ain t en an ce Part s
Description P/N
Replacement Ge prism 206-70451-91

ATR-8800M ATR Objective Mirror

Ot h er Op t io n al f or M icroscope
Description P/N Remarks
Aluminum reference mirror 206-90104 13 mm dia.
KBr window plate 200-66752-04 13 mm dia. x 2 mm thick
CaF2 window plate 200-66752-02 13 mm dia. x 2 mm thick
Visible light objective lens (x10) 208-92180-01 Manufactured by
Visible light objective lens (x20) 208-92180-02 Kyowa Optical Co., Ltd.
Infrared polarizer (Infrared polarizer 206-81524 Infrared polarizer holder
and holder are required.) 208-92014 Infrared polarizer (STJ-1001)
Visible light polarizer Please contact us for details.

Spectrum of Adhesive on Fiber

Samp lin g K it ( P/ N 2 0 8 - 9 2 1 7 1 )

This kit is for pretreating samples for microscope measurement.

It comprises a set of tweezers, roller knife, needles, scissors,
replacement blades and replacement needles.

St an d ard C o n t ent
Description Quantity
Tweezers (straight) 1
Tweezers (curved) 1
Roller knife 1
Needle (straight) 1
Needle (bent) 1
Needle holder 1
Scissors 1
Replacement blades (pack of 5) 1
Replacement needles (pack of 5) 1
Exclusive case 1 Sampling Kit

23
 M i cro S a m p l e M e a s u r e m e n t

Diamond Cell
This pressurized cell thinly compresses samples with a certain degree
of thickness or minute samples placed on a microscope's stage to
perform transmission measurement as they are. This cell is applicable
to a variety of samples including drugs, rubber and plastic.
Two types of cells are available, Diamond Cell C using an artificial
diamond and Diamond Cell B using a natural diamond.
Notes • Diamonds exhibit slight absorption in the range 3,000 to 1,500 cm-1.
• Diamonds are hard but brittle and may crack depending on the
sample and method of use.

Diamond Cell C
Diamond Cell C ( P/ N 208- 92236)
A pressurized cell-enabling microscopic measurement of minute, thinly
compressed samples as they are. Applicable for analysis of drugs, rubbers,
plastics, polymers, etc.
The Diamond Cell B noted above employs a natural diamond, and is
therefore relatively expensive. This Diamond Cell, on the other hand, uses
an artificial diamond, so is less expensive and, further, employs a thinner
and larger diameter window (1.6 mm). Although its strength is slightly inferior
to the natural diamond, it is adequate for compressing nearly all samples.
Features
Large-size diamond provides 1.6mm diameter window
Large diameter window allows measurement even when placed in
standard sample compartment
Measurement possible by merely placing on infrared microscope stage Spectrum of Single Fiber
Red: Diamond cell used
Black: Diamond cell not used
Standard Content
Description Quantity
C plate 1 Options and Maintenance Parts
C screws 3 Description P/N
Holder with diamond window for C 2 C plate 208-92172-01
Case 1 C screws (pack of 3) 208-92172-02
Hex key wrench 1 Holder with diamond window for C 208-92236-01

Diamond Cell B ( P/ N 200- 66752)

This attachment is used to compress a micro sample into a thin plate,
which is then directly measured by infrared microscopy.
This method is applicable to various types of samples, such as
pharmaceuticals, rubbers, plastics, and polymers.

Features
Use of the Type II diamond cell allows measurement to be made over
the entire wavenumber range.
Even thick samples can be measured in the transmission mode, with a
high sensitivity.
Micro samples are made flat, so that high sensitivity is obtained during
measurement.
Measurement is made with the diamond cell placed on the stage as it is.
Adjustment for sample thickness is made with a precision screw. Diamond Cell B
Cells with a cell plate of lower-cost material are also applicable.
Combined use with an infrared microscope is recommended.

Standard Content Options and Supplies

Description Quantity Description P/N
Diamond cell 1 pair Diamond cell for spare 200-66752-01
Holder with compression cap 1 CaF2 window, a pair 200-66752-02
O ring 1 set KBr window, a pair 200-66752-04

24
M icro M ag n et ic Sample H older
Sample slide, made of stainless steel
( P/N 2 0 8 - 9 7 2 0 6 )
Silver mirror
This is exclusively used for IR microscopy.
Same reflectivity as gold and
This holder allows samples to be held by a magnetic cover and harder than gold or aluminm.
loaded by one-touch operation without being dirtied. Samples are
Magnetic cover with micro
held between magnet sheets and placed on the microscope's stage.
scale (10 μm square)
The sample slide is made of stainless steel, and has three holes, 5 Convenient for measurement
mm dia., 13 mm dia. x 1 mm and 13 mm dia. x 2 mm. Samples of and positioning of samples
Magnetic covers
thickness up to 0.5 mm can be held.
13mm dia. and 5mm dia.
are available for selective
use
F eat u res
Fiber samples are easily loaded.
Applicable to both reflection and transmission measurement
modes.
Provided with a micro scale (10 μm square grid).

St an d ard C o n t ent
Description Quantity
Stainless steel sample slide 1
Magnetic cover (5 mm dia. hole) 1
Magnetic cover (13 mm dia. hole) 1
Magnetic cover (with micro 10 μm scale) 1
Hole, 13mm dia. and
2mm thick
Used for refelctometry
or to accept a diamond
window

Hole, 13mm dia. and

1mm thick

Hole, 5mm dia.

Used for measurement of small samples

Slit for fiber sample

Used for measurement of monofilament
samples, for example

M icro Vise H o lder ( P/ N 2 0 8 - 9 7 2 0 2 )

This holds various types of samples for microscopy. It ensures positive
holding of samples of a difficult shape or measurement of a sample at a
user-selectable angle.
Measurement with a polarizer, with the sample under tensile load,
provides information on the molecular orientation.

Sizes o f H o ld ab le Samples
Tensile load Within approx. width of 20 mm
Film of length 14 to 54 mm (excluding grip allowance)
Gripped load Max. approx. length 40 mm
Approx. width 40 mm
Micro Vise Holder
St an d ard C o n t ent
Description Quantity
Micro vise holder 1
Holding fixture 2

25
 A ccesso r i e s fo r Au t o m a te d M e a s u re me n t

Au t o ma t in g th e Op era tio n
The technique of Fourier Transform Infrared Spectrophotometry (FTIR)
is now extensively used in various fields for R&D and industrial
purposes.
Since samples measured by infrared spectrophotometry are mostly
chemically stable and can be measured without pretreatment, it is fairly
easy to automate the measurement of many samples.
Automating the measurement saves labor and ensures high analytical
productivity.

Automating the FTIR Measurement

One of the most important methods to automate the operation of the
FTIR main is to utilize a computer system.
Combination of a computer and the program, described below, provides
automation of sample loading and unloading, measurement, data
processing, and presentation of the analytical results.
The photo to the right shows the ASC connector (supplied as standard),
ASC Connector
which is used to export the control signals to an automatic sample
changer. The software incorporated in the FTIR can control the
automatic sample changer via a pair of the ASC connectors.

Operation by Automated Sequence

The operation must be carried out in the sequence programmed to be
most appropriate for the particular type of samples under study.
The Shimadzu FTIR-8000 Series instruments (except FTIR-8000PC
Series) incorporate, as standard, the SPECTROMACRO software,
which permits flexible programming through simple procedures.
As for the FTIR-8000PC Series, the optional BASIC software has the
same functions as SPECTROMACRO.
IRPrestige-21, IRAffinity-1 and FTIR-8400S (IRsolution model) can be
controlled from the IRsolution software.

26
A u t o mat ic D if f use R ef lect ance A t t achment
D R S- 8010A SC ( P/ N 2 0 6 - 6 2 3 0 8 )
This attachment automates measurement of up to 24 samples.
For details, refer to page 19.
N o t es
When this attachment is used on IRAffinity-1, the ASC cable (P/N 206-73433-91) is required.
The BASIC software is required separately for the HYPER-IR model.

A u t o Samp ler f or Transmission M easurement

A SC - 8000T ( P/N 2 0 6 - 6 3 9 0 0 )
This attachment accepts up to 18 samples for measurement in the
transmission mode.

F eat u res
The control is made by the standard control signals from the FTIR DRS-8010ASC

main, meaning no external controller is required.

The attachment is easily installed in the standard sample compartment.
A holder for a 13 mm dia. pellet is provided.
Use of the window-plate option enables measurement in the Nujol method.
N o t es
When this attachment is used on IRAffinity-1, the ASC cable (P/N 206-73433-91) is required.
The BASIC software is required separately for the HYPER-IR model.

St an d ard C o n t ent
Description P/N Quantity
ASC-8000T main 1
Pellet holder 206-63917 20
Fixing spring 206-63951-01 20
Tweezers 1 pair
Op t io n s
Description P/N ASC-8000T
KRS-Window set (with a set of window holder) 206-66699
Film holder (9 pcs. as a set) 206-81522
F o r co n n ect io n wit h FTIR main body,
a cab le is req u ired.
Description P/N
Cable for IRAffinity-1 206-73433-91

Samp le Swit ch er 21 ( P/ N 2 0 6 - 6 3 6 6 3 - 9 2 )
All the Shimadzu FTIR Series spectrophotometers are single-beam type.
This attachment allows any one of them to be operated in the "quasi
double-beam mode" by switching two samples during measurement.

F eat u res
Two cassettes for liquid cells or pellet holders are provided.
In the case of the FTIR Series, the optional BASIC software is
necessary for the "quasi double-beam mode” (except FTIR-8200PC /
8300 / 8400 / 8400S / 8700 / 8900, IRAffinity-1, IRPrestige-21).

A ccesso ries T h at C an B e U sed

Evacuable die for KBr pellets Sample holder for MHP-1 Mini Hand Press
Sealed liquid cell Fixed thickness cell
Magnetic pellet holder Magnetic film holder Sample Switcher 21
Diamond cell 10 cm gas cell
A ccesso ries T h at C annot B e U sed For connection with FTIR m ain body,
5 cm gas cell
a cable is requir ed.
N o t es
When this attachment is used on IRAffinity-1, the ASC cable (P/N 206-73433-91) is required. Description P/N
The BASIC software is required separately for the HYPER-IR model. Cable for IRAffinity-1 206-73433-91

27
 Purg e Co n t ro l K i t

Purge Control Kit

PCK-8000 ( P/ N 206- 62309) for FTIR-8100/8200/8600 Series
PCK-8730 ( P/ N 206- 70170- 91) for FTIR-8300/8700 Series
PCK-8940 ( P/ N 206- 71122- 91) for FTIR-8400/8400S/8900 Series
PCK-8941 ( P/ N 206- 73512- 91) for IRAffinity-1, FTIR-8400/8400S/8900 Series
PCK-21 (P / N 206- 72352- 91) for IRPrestige-21
The FTIR Series uses a sealed interferometer to ensure high
sensitivity and stability during measurement without using dry air. To
eliminate the interference of carbon dioxide and water vapor, it is
recommended to purge the interferometer, the sample compartment,
the second sample compartment, etc. through a combined use of the
purge control unit and the dry air supply unit or nitrogen gas.

This kit is for adjusting the piping between the FTIR and purge gas
source, piping sections along which purge gas flows and the purge
gas flow rate.
This kit contains the following parts:
Flow path and flow rate controller
Purge tube (10 m, 7 mm I.D., 10 mm O.D.)
Exhaust parts
PCK-8730

Notes
The purge control kit cannot be used with the DBX-8000.
Ventilate the site when purging with nitrogen gas.

Dry Air Supply Unit

(P/N 2 00 -64 185- 01 f or 50 Hz l i ne, 100 VA C )
(P/N 2 00 -64 185- 02 f or 60 Hz l i ne, 100 VA C )
This unit is very easy to install: all you have to do is to connect pipes
to the inlet and outlet of the unit. Also, the unit is quite compact and
provided with casters so that it can be easily carried around. The
noise of the air compressor is minimized by the use of sound-
proofing materials.

Note
Dimensions: 400W x 610D x 610H mm
Dry air supply capacity: 10 to 20L / min.
Dry air: -17°C or lower in dew point.

28
Ext er nal D et ect or / O pt i onal D et ect or

Ext ern al D et ect or / Opt ional D et ect or Required Par ts

A DLATGS detector or LiTaO3 detector is mounted as standard on When Using the When Using an External
the IRPrestige-21, IRAffinity-1 and FTIR-8000 Series. Some MCT Detector Optical System1
applications require use of a high-sensitivity MCT detector or IRPrestige-21 MCT Kit External Light Beam
external installation of a special optical system. Switching Kit
IRAffinity-1 - External Light Beam
Switching Kit
FTIR-8000 Series 1) Second sample Second sample
compartment compartment
External Light Flux
Extraction Kit
1) Cannot be used on the FTIR-8100/8200/8500/8600.

Ext ern al L ig h t B eam

Swit ch in g K it ( P/ N 2 0 6 - 7 0 1 2 5 - 9 2 )
This kit extracts infrared light from the right side of the IRPrestige-21,
IRAffinity-1 and FTIR-8000 Series, and switches the light to
externally installed accessories such as an infrared microscope.
Also attached is a polystyrene film about 50 μm thick so that
instrument validation can be filly automated based upon Japanese
Pharmacopoeia, European Pharmacopoeia or ASTM. Note, however,
that a separate standard sample must be prepared if traceability is
required.
This kit can be used on the FTIR-8300/8400/8400S/8700/8900,
IRAffinity-1 and IRPrestige-21.

St an d ard C o n t ent Exterior and Content of External Light Beam Switching Kit
Description Quantity
Switching mirror (with polystyrene film) 1
External input signal connector 1set

N o t es
Traceability is not provided for the polystyrene film.
This kit cannot be used on the
FTIR-8100/8100M/8100A/8200/8200D/8200A/8500/8600 and
FTIR-8200PC/8600PC.

M C T K it ( P/N 2 0 6 - 7 2 0 1 7 - 9 1 )
A high-sensitivity MCT detector is used when analyzing minute or Specif icat ions
dark samples, or performing measurement using a long pathlength Detector Liquid nitrogen cooled MCT detector
gas cell. This kit is an MCT detector unit installed on the IRPrestige- With glass dewar (approx. 300 ml)
21 for switching between the standard DLATGS detector. With liquid nitrogen monitor
Switching of detectors is performed automatically from IRsolution. Wavelength range 4,600 to 650 cm-1
It has a built-in liquid nitrogen monitor to cut off current flow when the Liquid nitrogen 8 hours
detector element is not being cooled, thus protecting the MCT retention time (when liquid nitrogen is newly purchased)
detector. The liquid nitrogen dewar is made of glass and does not
require reevacuation. Not es
This kit cannot be mounted at the same time as the NIR set
(P/N 206-72015-91).
Liquid nitrogen is required when using the MCT detector.

29
 Exter nal D e t e c t o r / O p t i o na l De t e c t o r

Second Sample Compartment (with MCT detector)

SSU-8000MCT ( P/ N 206- 62306- 01) 305
(Not applicable to FTIR-8101)
Parallel beem, 40mm dia.
If a gas cell, a flow cell, a thermovac evaporation type diffuse

326
reflectance attachment, or another attachment that is to be installed

584

145
externally is mounted to, and removed from, the standard sample

408
297
compartment, high analytical productivity cannot be expected. The

192

30
second sample compartment is used to accept such an attachment,
460 214
so that measurement can be made by only switching the light beam.
622
This method dramatically enhances analytical productivity. 552

Also, the second sample compartment is designed to accept a

customer-developed attachment.

247
Features
The base plate of the FTIR main body is removed and the SSU-
8000MCT is installed in that place. mm
The front panel and the top lid may be separately opened. The
front panel may be removed by one-touch operation. Dimensions of FTIR-8000 Series and SSU-8000

A part (an acrylic resin plate) of the top lid may be removed.
Equipped with piping for purge gas (dry air or nitrogen).
For the type that accepts both the second compartment and the
infrared microscope, please contact us or your local distributor.
The MCT-8000 detector (supplied as standard) provides extremely
high sensitivity and covers a wavenumber region of 4600 cm-1 to
750 cm-1.
The glass dewar type MCT detector requires no reevacuation.
The liquid nitrogen monitoring system protects the MCT elements.

Second Sample Compartment

SSU-8000 (P/N 206-62306) 2-6 x 8 hole depth 5 Chassis base plate (not removable)
Window (removable)
A second sample compartment without MCT detector. 6 dia. x 8 H hole depth 5

M6 depth 5
M4 depth 5
(Window)

MCT Detector
MCTD-8000 (P/N 206-62307)
Focus position
A set of a second sample compartment, an MCT detector, a
M5 depth 5
preamplifier, and a condenser mirror.

(Window)
2-6 mm dia. pin length 3
Base fastening screw (3 places) Front cover (removable)
Handle

Second Sample Compartment (SSU-8000) External Dimensions

and Base Plate Dimensions

30
Tr ansm i ssi on M easur em ent

A ccesso ries f o r Transmission M easurement

Film samples can be measured easily if they are attached to the
standard cassette or optional film holder.

C asset t e ( Samp le H older) ( P/ N 2 0 6 - 1 7 3 8 4 )

A cassette (sample holder) provided as standard on the FTIR can be
used for options for attaching to cassettes for liquid and gas cells.
However, with some accessories, there may be clearance between
the cell and the cassette, which sometimes results in poor
attachment reproducibility.
Also, bending sometimes occurs when heavy accessories such as
the 10 cm gas cell are attached. Use this optional cassette when
performing measurement with such accessories with better
reproducibility.
This attachment cannot be used on the FTIR-8100/8100M/8100A/
8200/8200D/8200A/8500/8600 and FTIR-8200PC/8600PC.

F eat u res
Little clearance
Rigid

St an d ard C o n t ent
Description Quantity
Cassette ASSY 1

M ain t en an ce Part s
Description P/N
Cassette mounting screws 037-02820-18

M ag n et ic- T yp e Film Sample H older

( P/N 2 0 0 - 6 6 7 5 4 - 1 1 )
Film samples are held between the stainless backplate (SUS 430)
and rubber magnet for direct analysis.

St an d ard C o n t ent
Description Quantity
Backplate (SUS430) 1
Magnet sheet without hole 1
Magnet sheet with 13 mm dia. hole 1
Magnet sheet with 7 x 13 mm hole 1
Magnet sheet with 7 x 19 mm hole 1
Magnet sheet with 10 x 23 mm hole 1

Dimensions of Magnetic-Type Film

31
 Tr ansm i s s i o n M e a s u r e me n t

Universal Clip Holder ( P/ N 208- 97 2 0 7 )

Pressure nut
This holds a sample by one-touch operation through the use of a clip.
A silicone rubber o-ring is used for positive contact and sample Silicone rubber o-ring

protection.

Features
Applicable sample sizes range from 13 to 40 mm in diameter, and
up to 13 mm thick. Clip
Slide stopper
The pressure nut ensures easy measurement of mull samples.
The rubber magnet and o-ring are used for positive holding of
samples.
O rings for spare

Standard Content
Description Quantity
Universal clip holder 1
Magnet base, 22 mm dia. 1 Two types of magnet base,
Magnet base, 10 x 14 mm hole 1 22mmø and 10mmø
Spare O-ring 1

EZ-Clip13 ( P/ N 208- 97208)

This one-touch sample holder uses a clip exclusive for 13 mm dia.
samples. An O-ring is located on the surface of the holder that
contacts the sample to prevent damage to the sample.

Features
Thick samples (max. thickness 13 mm) also can be held.
Diameter of light passage hole: 10 mm

Standard Content
Description Quantity
EZ-Clip13 1
Universal Clip Holder

EZ-Clip25 ( P/ N 208- 97209)

This one-touch sample holder uses a clip exclusive for 25 mm dia.
samples. An O-ring is located on the surface of the holder that
contacts the sample to prevent damage to the sample.

Features
Thick samples (max. thickness 13 mm) also can be held.
Diameter of light passage hole: 10 mm

Standard Content
Description Quantity
EZ-Clip25 1
EZ-Clip13 EZ-Clip25

32
Tr ansm i ssi on M easur em ent

Gas C ell
Gas cells are used when measuring gas samples. Select the optical
pathlength to suit the concentration of the component.

Sh o rt Pat h len g t h Gas C ells

5 cm Gas C ell ( P/ N 2 0 2 - 3 2 0 0 6 - )
10 cm Gas C ell ( P/ N 2 0 2 - 3 2 0 0 7 - )
Used for measurement of gas samples or liquid samples of low
boiling points. The cells are designed conic to make the inner volume
smaller.
The inner volumes of the 5 cm and 10 cm gas cells are 42mL and
98mL, respectively. The last two digits of the catalog numbers show
the material of the window plate, as listed below.

C ell W in d o w Plat es
Type of Window Plate NaCl KBr KRS-5
Last two digits of P/N -10 -20 -30

Spectrum of HCl Gas

L o n g Pat h len g t h Gas C ell

A gas cell with a long pathlength is used when measuring low
concentration gas samples. Inside a long pathlength gas cell, light
repeatedly doubles back, which results in a long pathlength.
There are two types of long pathlength gas cells, one with a sample
compartment and the other with a second sample compartment. A
regular MCT detector is used as the detector.
The pathlength of long pathlength gas cells, gas cell material,
window plate material, and detector must be selected according to
the gas component, concentration, temperature, capacity, and other
factors to be measured. When selecting a long pathlength gas cell,
contact us so that you can select the appropriate cell.

Dimensions of Long Pathlength Gas Cell

to detector
Pressure
gauge

Sample inlet / outlet pipe

Window

Optics of Long Path Cell

33
 Pel l et Me a s u r e m e n t

KBr Pellet Method

With this method, powder samples are diluted with KBr powder to produce pellets for transmission measurement. On the FTIR, the light
intensity is large, so measurement is possible using pellets made easily with the Mini Hand Press. When making regular 13 mm dia. pellets, the
evacuable die for KBr pellets, hydraulic press and vacuum pump are used.

Mini Hand Press

MHP-1 (P/N 200-66747-91)
This is a compact, inexpensive hand-driven press used to produce
KBr pellets.
A pellet produced in the frame is directly measured using the
dedicated holder; this ensures exceptional simplicity of operation.
No dies or vacuum pump are required.

Standard Content
Description P/N Quantity
1 Mini Hand Press 200-66747-01 1
2 Pellet holder 202-35258 1
3 Upper and lower cylinder 1 set
206-73717-91
4 Briquetting frame, 4 mm dia. 10
5 Pellet remover 200-66747-03 1
6 Pellet remover base 200-66747-04 1
* Parts other than Mini Hand Press 1 are provided as maintenance parts. 2,
5 and 6 are shared for 4 and 3 mm dia. parts.

Options and Maintenance Parts Supplies

Description P/N Description P/N
4 mm dia. briquetting frame, 20 pieces 206-73718-91 10 briquetting frames, 3 mm dia., and
200-66748
3 mm dia. briquetting frame, 10 pieces upper and lower cylinders
200-66748
Upper/lower cylinder set
3 mm dia. briquetting frame, 20 pieces 200-66749-01

Evacuable Die for KBr Pellets (P/N 202-32010) 4

Used to prepare KBr pellets, 13 mm dia. The amount of KBr crystal
necessary for one pellet is about 200 mg and the sample 1 to 2 mg. 8 9 !0 !1 3
2
Standard Content
Description P/N Quantity
1 Base 202-35247 1
2 Barrel 202-35251 1
3 Spring 202-35252 1
4 Plunger 204-21049 1
5 Mandrel 202-35248* 2 1
6 Die frame 202-35250* 4
7 Pellet holder 202-35258* 4
7
8 Punching rod 202-35256 1
9 Punching base 202-35255 1
6 5
!0 Plug 202-35257 1
!1 Sieve 202-35261 1 The following items are recommended for producing pellets of high
!2 Exhaust port 202-35254 1 transmittance:
Description Quantity
* Packet of one when ordering by this P/N.
SSP-10A Hydraulic Press 1
SA18-3M Vacuum Pump 1
KBr Crystal 100g
Agate Mortar and Pestle 1 each
Micro spatula 1

34
M icro D ie f o r 2 mm dia. K B r Pellet s
( P/ N 2 0 2 - 3 2 0 1 1 ) 4
M icro D ie f o r 5 mm dia. K B r Pellet s
( P/ N 2 0 2 - 3 2 0 1 2 ) 1
Used in combination with the KBr die (P/N 202-32010), which is for 13
mm dia. pellets, to produce smaller pellets, 5 mm or 2 mm in diameter.
Specify the diameter you require or the Cat. No. when placing an order.

St an d ard C o n t ent
Description P/N Quantity
1 Mandrel for 2mm dia. pellets 202-35262
2
Mandrel for 5 mm dia. pellets 202-35264
2 Die frame for 2 mm dia. pellets 202-35263 2
4
Die frame for 5 mm dia. pellets 202-35265
3
3 Tool 202-35266 2
4 Pellet holder 202-35258 4

H yd rau lic Press

SSP- 10A ( P/N 2 0 0 - 6 4 1 7 5 )
Used for producing KBr pellets. The maximum pressure is 10 tf/cm2.
A high-precision pressure gauge is provided.

Vacu u m Pu mp
SA 18- 3M ( P/N 261-79017)
This is a compact rotary vacuum pump, having a displacement
capacity of 10 to 30 L/min., used for vacuum dehydration in
production of KBr pellets. (100 VAC power is required.)

35
 Pel l et Me a s u r e m e n t

Magnetic-Type Pellet Holder

(P/N 2 00 -66 753- 11)
13 mm diameter pellets are held between the stainless backplate
(SUS430) and rubber magnet for direct analysis.

Agate Mortar and Pestle (P/N 200-93508)

Used to prepare KBr pellets or samples for diffuse reflectance
method.

KBr Crystal (100 g) (P/N 202-34141)

Used to prepare KBr pellets. Features a long storage life, thanks to
its low hygroscopicity.

36
C el l s for Li qui d S am pl es

M easu r em en t U sin g
D em o u n t able C ells
Demountable cells, sealed liquid cells, fixed thickness cells, etc. are
useful for measurement of liquid samples. In quantitative analyses, it
is necessary to know the thickness of the cell accurately.
Interference patterns are often used for the thickness measurement.

In transmission/reflection FTIR of thin films, an interference pattern

as shown above is overlaid on the spectrum. The film thickness, t, is
given by the next equation:

M
n=
2√n -sin2θ(ν1-ν2)
2

where ν1 and ν2 are the wavelengths of peaks or valleys, M is the

degree of interference (number of the waves) between ν1 and ν2.

When the refractive index (n) of the film is known and is uniform
between the ν1 and ν2, the cell thickness may be obtained from the
above equation. In practice, the cell is measured without any sample
in it, and its thickness is obtained by substituting n = 1 and θ = 0°.

37
 C el l s for L i q u i d S a m p l e s

Demountable Cell ( P/ N 202- 32000- )

This type of cell is used for qualitative analysis of less volatile liquid
samples, Nujol mulls, or film samples. The cell is assembled and
disassembled in each analysis run.

P/N 202-32000-10 202-32000-20 202-32000-30

NaCl Demountable Cell KBr Demountable Cell KRS-5 Demountable Cell

Type
A pair of NaCl plates (201-97942) A pair of KBr plates (201-97977) A pair of KRS-5 plates (201-97943)

Metal holder (201-77662) 1set 0.025 mm lead spacer (204-04900-13) 10 sheets

Contents
0.05 mm lead spacer (204-04900-14) 10sheets 0.1 mm lead spacer (204-04900-15) 10 sheets

Sealed Liquid Cell ( P/ N 202- 32001- )

This type of cell is used for measurement of volatile liquid samples.
The cell is assembled sandwiching a spacer of the desired thickness,
a sample is injected into the cell, and then drawn out with a syringe.
When it is necessary to prevent leaks of samples, the use of the
fixed thickness cell is recommended.

P/N 202-32001-10 202-32001-20 202-32001-30

NaCI Sealed Liquid Cell KBr Sealed Liquid Cell KRS-5 Sealed Liquid Cell
Type
A pair of NaCl plates, with and A pair of KBr plates, with and A pair of KRS-5 plates, with and
without hole (201-77160-10) without hole (201-77160-20) without hole (201-77160-30)
Metal holder (201-77661) 1 set. 0.025 mm lead spacer (204-04901-13) 4 sheets
Contents
Gasket (202-35425) 2 pcs. 0.05 mm lead spacer (204-04901-14) 4 sheets
Lead cushion (202-35426) 2 pcs. (204-04901-34) for KRS-5
Rubber cushion (202-35427) 2 pcs. 0.1 mm lead spacer (204-04901-15) 4 sheets
Teflon stopper (201-75546) 2 pcs. (204-04901-35) for KRS-5
Syringe (200-34835) 1 pc. 0.5 mm lead spacer (204-04901-18) 4 sheets
(204-04901-38) for KRS-5

Fixed Thickness Cell ( P/ N 202- 320 0 2 - )

This type of cell is used for quantitative measurement of liquid or volatile samples. The cell is assembled in the Shimadzu factory to have the
customer-specified cell thickness.
Matched pair of fixed thickness cells are also available.
The last two digits of catalog numbers indicate the type of cell window plates, as shown in the table below:
Example: The catalog number of the fixed thickness cell, 0.1 mm in thickness, KBr window plate, is 202-32002-25
Cell Window and Thickness
Thickness NaCl KBr KRS-5
0.025 mm -13 -23 Not available
0.05 mm -14 -24 -34
0.1 mm -15 -25 -35
0.2 mm -16 -26 -36
0.5 mm -18 -28 -38
1.0 mm -19 -29 -39
2.0 mm -11 -21 -31
5.0 mm -12 -22 -32

38
Samp le C ell f o r Oil C ont ent D et erminat ion
This cell is used to quantitatively determine the concentration of oils
extracted into carbon tetrachloride.

Type of cell KRS-5

100 mm quartz cell (P/N 200-34473-02) Oil content cell holder
50 mm quartz cell (P/N 200-34473-01) Type 1 (P/N 202-39897)
Square cell holder
10 mm quartz cell (P/N 201-98716)
(P/N 204-51216)

C ryst al Po lish ing K it ( P/ N 2 0 2 - 3 2 0 2 4 )

This kit is used for polishing an NaCl and KBr window plate. The kit
contains a polishing plate, abrasive, chamois and rubber gloves.

39
 Others

Far Infrared Kit ( P/ N 206- 72016- 91)

In the far infrared region up to 240 cm-1, peaks of inorganic
compounds and organometallic complexes are observed. The Far
Infrared Kit is a Csl beam splitter mounted on the IRPrestige-21 for
measuring spectra in the far infrared region. Using the Csl beam
splitter enables spectra in the far infrared region up to 240 cm-1 to be
measured.
A standard light source and detector are used.
Since the 400 cm-1 to 240 cm-1 region absorbs lots of moisture in air,
purge the instrument with desiccated air, for example, before
performing measurement. Also, store the Csl beam splitter in a
desiccator when it is not in use since it is extremely sensitive to
moisture.

Feature Far Infrared Spectrum of Bismuth Oxide

Measurement wavelength range 5000 cm-1 to 240 cm-1

Standard Content
Description Quantity
Csl beam splitter 1

40
N I R M easur em ent

N IR M easu r em en t A ccesso r ies fo r

t h e IR Pr est ig e- 21
Accessories are available for easier and higher-sensitivity NIR When the accessory is fitted to the sample compartment, the
measurement of a wide range of samples. Each accessory is accessory type and its serial number are recognized automatically
equipped with the Automatic Accessory Recognition function. and the optimal measurement parameters are set.

In t ro d u ct io n t o N ear- Inf rared ( N IR ) A nalysis

In the near IR regions, absorption due to molecular vibration high wavelength precision, is optimal for identifying substances by
appears. Therefore, substances can be identified by comparing comparing spectral patterns. Samples contained in glass or thin
spectral patterns, and quantitatively determined from the peak plastic containers can be measured directly. It is also possible to
intensity. analyze a sample using a probe. Thus, sample pretreatment is easy,
Absorbance is lower in the near IR region than in the mid IR region, and the near IR measurement is also suitable for measuring samples
so samples can be measured without dilution. The IRPrestige-21, that cannot be easily unpacked.
which employs the Fourier transform method and offers spectra with

N ear- In f rared A pplicat ions

Near-Infrared is used for qualitative and quantitative analysis, just as
with the mid-infrared. Its applications include quality inspections of
raw materials received, and endpoint quantitations for reaction
processes.

A p p licat io n s an d A ccessories
Multicomponent Quantitation of Liquid Samples
The quantities of various components in liquid pharmaceuticals and of each component peak will depend on temperature. Therefore,
foods are measured and controlled. For example, quantitation can be measurement is conducted at a constant temperature using a heating
made of the quantities of components such as sugar and proteins transmission cell system. Here, the IRSolution PLS Quantitation
when manufacturing soft drinks. In this case, the location and shape Program will be required to create the calibration curves.

Acceptance Inspections for Raw Materials (Qualitative)

When determining whether the correct raw materials have been For diffuse reflection equipment UpIR A and near-infrared integrating
delivered based on the spectral shape, select accessories in sphere IntegratIR A, the sample is prepared, and the prepared
accordance with the form of the raw materials. After measurement, sample is then placed in the measurement window for measurement.
pass/fail determinations and library searches can be conducted using Measurement can be conducted as is with the sample placed in the
the PharmaReport program (Macro Platform required). test tube included, or left in a plastic bag. In the latter case, however,
If the sample is a powder, use either diffuse reflection equipment there may be a significant impact from the bag's interference fringe.
UpIR A, near-infrared integrating sphere IntegratIR A, or a reflection- If the reflection-type fiber probe is used, measurement is possible
type fiber probe. without sampling. The probe can be inserted directly into the sample,
For liquid samples, pastes, pellets, and cloths, use near-infrared or measurement can be taken directly of a sample placed in a glass
integrating sphere IntegratIR A. bottle or plastic bag. In the latter case, however, there may be a
For tablet samples (pharmaceuticals), use either near-infrared significant impact from the bag's interference fringe.
integrating sphere IntegratIR A or a reflection-type fiber probe.

D if f eren ce B et ween U pIR A and Int egrat IR A

Diffuse reflection equipment UpIR A and near-infrared integrating
sphere IntegratIR A differ as shown below. The selection should be
made on the basis of the experimental objective.

Benefits of IntegratIR A Benefits of UpIR A

1. The peak strength is several times stronger than for UpIR A, and 1. Cost
the obtained spectrum has a superior S/N ratio. 2. Specialized for powdered sample analysis.
2. Good data is obtained when measuring powdered samples in
plastic bags.
3. Measurements can be conducted of pellets, pastes, tablets, liquids
and cloth samples.

41
 N I R M eas u r e m e n t

NIR Set ( P/ N 206- 72015- 91)

This option is attached to the IRPrestige-21, enabling near-infrared
measurement. Experiments are conducted via software that switches
between the mid-infrared and the near-infrared. (Cannot be used with
the FTIR-8000 series.)

Specifications Standard Contents

Measurement Range: 12,500 cm-1 to 3,800 cm-1 Product Name Quantity
Beam Splitter: Silicon-coated CaF2 Beam Splitter Storage Box 1
Light Source: Tungsten iodine lamp CaF2 Beam Splitter 1
Detector: InGaAs detector

Upload Type Diffuse Reflectance Attachment UpIR A (P/N 208-97271-91)

Powder samples can be placed on the sample stage for measurement.
Pretreatment such as KBr dilution is unnecessary.
Powders can be measured directly. Alternatively, directly set the sample contained in a
plastic bag or glass bottle.
Applications include qualitative or verification tests in acceptance inspections and
quantitative analysis of components contained within samples.

Specifications
Measurement range: 10,000 to 3,800 cm-1
Accessory recognition function: Included

Standard Accessories Options

Product Name P/N Quantity Product Name P/N
UpIR A Main Unit 1 Test tube with screw cap (pack of 200) 208-97271-20
Gold-coated mirror for reference 208-97271-13 1 25 x 2 mm sapphire window 208-97271-21
Test tube (pack of 6) 1
Test tube holder 208-97271-17 1
Sample holder with sapphire window 208-97271-18 1

NIR Integrating Sphere IntegratIR A (P/N 208-97272-91)

Pretreatment such as KBr dilution is unnecessary. Samples contained in a plastic bag or
glass bottle can be measured.
Applications include qualitative or verification tests in acceptance inspections and
quantitative analysis of components contained within samples.
Powders, tablets, liquids, pastes, fibers, plastic pellets and molded samples can be placed
on the sample stage for measurement (reflectance measurement).
A highly sensitive InGaAs detector is built-in.
The IntegratIR installation kit (P/N 206-72715-92 for IRPrestige-21 CE model, or
P/N 206-72715-91 for other IRPresige-21 model) must be purchased separately.

Specifications
Measurement range: 10,000 to 3,800 cm-1
Accessory recognition function: Included

Standard Accessories
Product Name P/N Quantity
IntegratIR A Main Unit 1 Spectrum of a tablet (antipyretic)
Options
Gold diffusion mirror with protective cap 208-97272-12 1
Test tube (pack of 6) 1 Product Name P/N
Test tube holder 208-97271-17 1 Test tube (pack of 6) 208-97272-14

42
N I R M easur em ent

F ib er C o u p ler ( P/ N 2 0 6 - 7 2 7 5 1 - 9 1 )
The fiber coupler comes with two SMA connectors. Various fiber probes with SMA
connectors can therefore be connected.
The fiber coupler and fiber probe are separate items. Please purchase both of them.
Contact Shimadzu when using fiber probes other than the recommended probe.

Sp ecif icat io n s
Measurement range: 10,000 to 3,800 cm-1
(However, this varies depending on the probe used.)
Connector shape: 2 x SMA
Accessory recognition function: Included

St an d ard A ccessories Opt ions

Product Name Quantity Product Name P/N
Fiber Coupler 1 Fiber cable for adjustment 206-72758-91
Storage Box 1

R ef lect ive F ib er Probe ( P/ N 2 0 6 - 7 2 7 6 0 - 9 1 )

Near IR rays emitted from the probe head are directed to the sample, and the reflected
light is collected for measurement.
Pretreatment such as KBr dilution is unnecessary.
Just insert the probe into the sample powders, or samples can be analyzed while they
are contained in bags or glass bottles.

Sp ecif icat io n s
Measurement range: 10,000 to 3,800 cm-1
Connector shape: 2 x SMA
Probe shape: Probe head 6.4 mm dia. x 50 mm, SUS303
Handle 18 mm dia. x 100 mm, aluminum
Operating temperature: Room temperature
Permissible bending radius: 100 mm
Length: 1 m from the probe head to connector

St an d ard A ccessories
Product Name Quantity
Fiber Probe 1
Mini Stand 1
Reference Mirror 1

Op t io n s
Product Name P/N
Gold Diffusion Mirror 208-97272-12
Black: L-Ala
Gold-coated Mirror 208-97271-13 Blue: L-Arg
Flexible Stand 046-05514-01 Red: L-(Cys)2
Mini Stand 046-05514-02 Spectra of drugs contained in a glass bottle

43
 N I R M eas u r e m e n t

Heating Transmission Cell

Liquid samples contained in the 6-mm diameter test tube can be measured while they are
being heated, or maintained at a constant temperature.
Applications include multi-component quantitative analysis of liquid samples and tracing
reactions and changes in the sample under heating.
The temperature can be set from room temperature to 120°C.
The set comprises a transmission cell for measurement under heating and a temperature controller.

Specifications
Measurement range: 12,500 to 3,800 cm-1
Accessory recognition function: Included
Temperature range: Room temperature to 120°C (heater temperature)
Applicable test tube: 6 mm dia. x 50 mm
Output: 5A Max.
Power supply: 120/220 V selectable Results of measuring
octanoic acid under
heating (measured at
Standard Accessories 10°C intervals from 30
Product Name P/N Quantity to 120°C).
Heating Transmission Cell Holder 208-97273-92 1 Increase in liberated
Temperature Controller 208-97274-92 1 OH (6,920 cm-1)
6 x 50 mm test tube (pack of 500) 1 caused by heating can
be verified.

Options
Product Name P/N
6 x 50 mm test tube (pack of 500) 208-97273-11

Infrared Microscope AIM-8800 (P/N 206-72500-92/96/34/35)

NIR measurements of microscopic parts of the sample can be made.
By fitting the AIM-8800 to an IRPrestige-21 unit with the NIR set installed and using the high-
sensitivity MCT detector, measurements can be conducted in the 10,000 to 3,800 cm-1 region.
In order to use this accessory, the Light Beam Switching Kit (206-70125-92), AIM
Connection Kit (206-72019-92) and Video Capture Board (088-50648-01) are required
separately. The AIM-8800 will not work with notebook PCs.

Specifications
Measurement range(Note) : 10,000 to 3,800 cm-1
Equipped with an electrically powered aperture and stage
PC control (measurement position memory function/ auto-centering/
auto focus etc). Can also be operated from the keyboard
Note) If combined with an IRPrestige-21 unit with the NIR set installed.
Reflection spectrum of an
electronic part.
Options The thickness of the coating film
Product Name P/N was calculated to be 2.28 μm
IRsolution Mapping Program 206-72332-91 from the interference fringe.
(refractive index 1.5)

50

%T
25
10000 9000 8000 7000 6000 5000 4000
1/cm

44
O pt i onal S of t w ar e

W id e Variet y o f Opt ional Programs

A variety of optional software is available for IRsolution, the Windows-based IRPrestige-21 control software that offers outstanding ease-of-
operation and functionality. IRsolution features standard functionality that includes data processing functions, such as subtraction spectra and
Kubelka-Munk transform functions, quantitative analysis functions, such as multi-point calibration curve and multi-regression methods, and
spectral search functions. Adding optional software programs allows extending the range of applications even further.

IR so lu t io n A g ent ( P/ N 2 0 6 - 2 1 6 0 0 - 9 2 )
IRsolution Agent is a tool for managing data from IRsolution results in a
database. This allows managing analytical data records over their entire
life cycle, from creation (measurement), review, approval, storage,
viewing, backup, and disposal.
Compliant with FDA 21 CFR Part 11 (electronic records and electronic
signatures), this program provides security management and electronic
signature functions for data stored and recorded in a database.
Measurement data is automatically saved in a database to allow easy
searching of target data at a later time.
Spectral waveform data, peak detection tables, and other information
stored in the database can be view directly.

Note:
Not compatible with data measured or analyzed using the mapping program.

M ap p in g Pro g ram ( P/ N 2 0 6 - 7 3 7 3 8 - 9 1 )
The mapping program captures microscope images and synthesizes them
to create a visual image for large areas. It allows specifying the range,
measurement interval, background position, and other mapping
parameters on the synthesized image. Icons are provided for switching
between transmittance and reflectance modes, and other microscope and
mapping operations. Mapping modes include area mapping, linear
mapping, and random mapping (a feature that automatically maps
multiple desired measurement points specified in advance). In addition to
normal mapping using transmittance or reflectance modes, microscope
ATR mapping measurement is possible (ATR object mirror is optional).
From the mapping data obtained, spectra can be extracted and functional
group maps can be calculated for specific peaks.
Data can be rendered in 3D, with contour lines,
or as an overlay of spectra.

Measurement Example of Area Mapping

(area map of flux on a circuit board)

45
 Opti onal S o f t w a r e

Macro Platform ( P/ N 206- 72330- 91)

Macro Platform is a module to run Macro programs provided by Shimadzu on IRsolution software. Please contact your Shimadzu representative
when you need an automatic measurement system with an automatic sample changer or to perform routine operation with repeated specified
operations.

3D Display Program ( P/ N 206- 7373 7 - 9 1 )

The 3D display program offers the following functionality.
Changes the method of displaying dataData can be displayed in bird’s
eye view (3D), as an intensity distribution or using contour lines, as a
spectral overlay, or rotated.
3D data processingChanges at specific wavenumbers can be isolated.
Functions include data extraction, data points thinning, smoothing,
zero-baseline, background correction, normalization, log conversion,
first- or second-order derivative, and ATR correction.
Creation of 3D data from spectraSpectra measured at fixed intervals,
such as by repeated measurements, can be arranged consecutively to
create 3D data.
Note:
The 3D display program cannot control mapping measurements or AIM-8800
series infrared microscopes.

PLS Quantitation Software ( P/ N 2 0 6 - 7 2 3 3 1 - 9 1 )

PLS (Partial Least Squares) quantitation is a widely used
Chemometrics method like the Multiple Linear Regression (MLR)
method for quantitation of multicomponents.IRsolution has PLS I and
PLS II methods for PLS quantitation. IRsolution analyzes PLS
calibration curves by calculating "Influence", "Residuals", "Scores",
"Loadings", "Press Values", etc.

Screen of
PLS quantitation

Curvefitting (Peak split) Software (P/N 206-72333-91)

Usually, an IR band can consist of several overlapping peaks. Curvefitting
(Peak split) software separates IR bands into individual component peaks.
This software is good for many applications, such as analysis of a peak
with hydrogen bond influences and analysis of hidden peaks overlapped
with other peaks.Curvefitting (Peak split) software separates the band
with suitable curves from 6 types of curves such as Gaussian, Lorentian,
Gaussian+Lorentian. Component peaks and a synthesized peak are
displayed to evaluate the separation.

Curvefitting (Peak split) result of peak (3150-2750 cm-1) of ABS resin spectrum.
Top : Target peak and specified peaks
Bottom : Component peaks and a synthesized peak

46
M at er i al s for C el l Wi ndow P l at e

2. Materials for Cell Window Plate

Sample cells have a window made of various materials to meet the requirements of your analyses, such as wavenumber range and physical and
chemical characteristics of the sample.
The characteristics and features of the materials popularly used for the window of sample cells are described below. Some of the materials are used
only rarely due to the difficulty of processing and high costs.

M at erials o f Sample C ell W indows

Wavenumber Refractive Water solubility % transmission Max.Temp.
MateriaI range, index at 20˚C Knoop hardness
cm-1 (μm) (1000cm-1) (g/100 g H2O) (thickness) (Melting point)

40,000~340 90% 300

KBr 1.52 65 7.0<100>
(0.25~29.4) (5mm) (700)
50,000~600 90% 400
NaCl 1.49 36 18.2<100>
(0.2~16.6) (5mm) (801)
40,000~500 90%
KCl 1.46 34 (776) 9.3<100>
(0.25~20.2) (10mm)
33,000~200 90% 200
Csl 1.74 44(0°C) —
(0.3~50.0) (5mm) (621)
16,600~250 70% 200
KRS-5(TIBr+Tll) 2.37 0.05 40.2
(0.6~40.0) (2mm) (414)
20,000~330 75%
KRS-6(TIBr+TICI) 2.17 0.32 (423) 29.9
(0.5~30.0) (1.5mm)
25,000~450 80%
AgCl 1.98 1.5 x10-4 (457) —
(0.4~22.2) (5mm)
22,000~300
AgBr 2.2 12 x10-6 — 200 —
(0.45~33.3)
10,000~550 70% 300
ZnS(Irtran-2) 2.2 Insoluble 354
(1.0~13.3) (1mm) (1180 Sublimate)
10,000~550 65% 350
ZnSe(Irtran-4) 2.4 Insoluble 250
(1.0~18.1) (1mm) (1700)
10,000~600 60% 180
As 2 Se 3 2.6 Insoluble —
(1.0~16.6) (0.63mm) (Softening poinit)
50,000~770 90% 500
BaF 2 1.42 0.004 82(500g)
(0.2~12.9) (1mm) (1280)
50,000~1,100 1.39 95% 900
CaF 2 (Irtran-3) Insoluble 158(500g)
(0.2~9.9) (2000cm-1) (3.6mm) (1402)
20,000~320 40% 300 43.5
CdTe(Irtran-6) 2.69 Insoluble
(0.5~31.2) (5mm) (1041) Vickers hardness
8,000~660 55% 300
Si 3.4 Insoluble 1150
(1.25~15.1) (2.5mm) (1420)
5,500~660 50% 270
Ge 4.0 Insoluble —
(1.8~16.6) (2mm) (936)
40,000~12.5 70% 10
Diamond,type 2.38 Insoluble (400)
(0.25~800) (1mm) Mohs scale
50,000~2,500 1.42 85% 1710
SiO 2 (Fused Silica) Insoluble 500
(0.20~4.0) (3000cm-1) (1mm) Softens

%Transmission values given are typical ones, in the wavenumber range applicable to the respective materials, including the loss due to surface reflection.

47
 M ater i als fo r C e l l Wi n d ow Pla t e

Characteristics of Cell Window Materials

KRS-5 "Clean-up": chloroform, carbon
Only the main characteristics of the cell window materials are tetrachloride, xylene.
(Thallium bromide-iodide)
described below.
The "Clean-up" lists present only the representative solvents used
Wide wavenumber range. "Harm":
to wash the cell windows. Even if a solvent is listed as "Clean-up",
High refractive index. • Lower alcohol.
confirm that the solvent does not react with the samples. Ammonium salt solution,
Most widely used for ATR prisms.
The "Harm" solvents can destroy the window plate through sulfuric acid, ammonia,
Almost insoluble in water. EDTA, a solution of a
corrosion or dissolving. compound that reacts with
Toxic; must be processed at an
Some solvents not listed as "Harm" can be harmful to the material. thallium to form a complex.
authorized manufacturer's site.

KBr "Clean-up": chloroform, carbon tetrachloride. KRS-6 "Clean-up": xylene, methanol.

(Potassium bromide) (Thallium Bromide-Iodide)

Low cost and wide wavenumber Similar characteristics as KRS-5.

"Harm": "Harm":
range. • Aqueous solution. Not so popular as KRS-5. • A solution of a compound
Easy to process with alcohol Lower alcohol. that reacts with thallium to
form a complex.
anhydride.
Most popularly used.
High mechanical strength.
Store under humidity conditions lower than 50%.
Some solvents not listed as "Harm" can be harmful to the AgCI "Clean-up": acetone, CH2Cl2.
material.
(Silver chloride)

Almost insoluble in water. "Harm":

Darkens when hit by • Ammonia salt solution,
NaCl "Clean-up": chloroform, carbon tetrachloride. EDTA, a solution of a
ultraviolet rays.
compound that reacts with
(Sodium chloride) Corrodes metals other than silver to form a complex.
stainless steel.
Most inexpensive.
"Harm": Fragile.
Wide wavenumber range. • Aqueous solution.
Store under humidity conditions Lower alcohol.

lower than 50%.

AgBr "Clean-up": with acetone, CH2Cl2.

(Silver bromide)
KCI
Similar characteristics as AgCl. "Harm":
(Potassium chloride) • Ammonia salt solution,
EDTA, a solution of a
Similar characteristics as NaCl compound that reacts with
silver to form a complex.
and KBr.
Not popularly used.

ZnS "Clean-up": acetone, alcohol.

Csl "Clean-up": chloroform, carbon tetrachloride. (Zinc sulfide)
(Cesium iodide)
Non-water soluble. "Harm":
Soft and hence liable to injure. Resistant against mechanical • Acidic solution.
"Harm":
Applicable to analysis in • Aqueous solution. and thermal shocks.
far-infrared region. Lower alcohol. High refractive index.
Highly deliquescent. Effectively used for evaporation depositing.
Store under humidity conditions lower than 40%, and handle Pulverized and briquetted ZnS is called lrtran-2
with care.

48
Z n Se "Clean-up": acetone, H2O. Si "Clean-up": acetone, H2O.
(Zinc selenide) (Silicon)

Non-water soluble. Widely used as the material

"Harm": "Harm":
Resistant against weakly acidic • Strongly acidic or for semiconductors. • HF-NO3 mixture.
or alkaline solution. alkaline solution. Rarely used as cell window
High refractive index. material.
Used for ATR prisms. Ge can substitute Si as cell window material.
Pulverized and briquetted ZnSe is called lrtran-4.
Applicable pH range: 6.5-9.5

Ge "Clean-up": toluene, H2O.

(Germanium)
A s 2 Se 3 "Clean-up": acetone, H2O.
(Arsenic tri-selenide) Widely used as the material
"Harm":
for semiconductors. • Hot sulfuric acid.
Insoluble in water. Easily processed to
Brittle. be lenses.
High refractive index, suitable as the material for ATR
prism used in analysis of highly refractive samples.
Non-watersoluble.
B aF 2 "Clean-up": acetone, H2O.
(Barium fluoride)

Soluble in acidic solution and Diamond Type II "CIean-up": ethanol, acetone.

"Harm":
ammonia. • Ammonium salt (Diamond)
Usable up to 500°C. solution, acidic
solution.
Almost insoluble in water. Harder than any other material.
Applicable to wavelength range from ultraviolet to far
infrared, though a gradual absorption is seen in the
range from 3000cm-1 to 1500cm-1.
C aF 2 "Clean-up": acetone, H2O. Natural diamond is classified as Type I and Type II, and
(Calcium fluoride) only the Type II is used as the material for cell window.
Extremely expensive.
Soluble in ammonium salt solution. Recommended for the window of high-pressure cell.
"Harm":
Resistant against acidic or • Ammonium salt
alkaline solution. solution, acidic
solution.
Hard, high mechanical strength.
Suitable for high-pressure cell. SiO 2 "CIean-up": ethanol, acetone.
CaF2 that occurs in nature is called fluorite. (Fused silica)
CaF2 which is pulverized and briquetted is called lrtran-3.
Effective for analysis in the ultraviolet and
visible regions.
Though useful up to 4 nm in the lR region, this material
CdTe "CIean-up": acetone, alcohol. ensures high stability and is easy to process.
(Cadmium telluride)

Material for mercury cadmium

"Harm":
telluride (MCT) detector. • Acidic solution.
Expensive.
Used for cell window only in
special cases.
CdTe which is pulverized and briquetted is
called Irtran-6.

49
 M ater i als fo r C e l l Wi n d ow Pla t e

Transmittance Characteristics of Representative Cell Window Materials

Transmittance (%)

Wavenumber (cm-1)

Transmittance of Alkali Halide Pellet (1mm thick)

Transmittance (%)

Wavenumber (cm-1)

50
U sab le W aven u mber R ange f or Various Solvent s

Carbon disulfide
(0.1mm)
Carbon
tetrachloride
(0.1mm)

Chloroform
(0.1mm)

Dichloroethane
(0.1mm)
Ethylene
tetrachloride
(0.1mm)

Wavenumber (cm-1)

51
 JQA-0376

Founded in 1875, Shimadzu Corporation, a leader in the

development of advanced technologies, has a distinguished
history of innovation built on the foundation of contributing to
society through science and technology. We maintain a global
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contact your local office, please visit our Web site at
www.shimadzu.com

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Phone: 81(3)3219-5641 Fax. 81(3)3219-5710
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