ANSI/EIA-364-27B-1996

Approved: April 17, 1996

EIA
STANDARD
EIA-364-27B

TP-27B

Mechanical Shock (Specified Pulse)

Test Procedure for Electrical
Connectors

EIA-364-27B
(Revision of EIA-364-27A)

MAY 1996

ELECTRONIC INDUSTRIES ASSOCIATION

ENGINEERING DEPARTMENT
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 EIA-364-27B

ELECTRONIC INDUSTRIES ASSOCIATION

TEST PROCEDURE No. 27B

MECHANICAL SHOCK (SPECIFIED PULSE)

TEST PROCEDURE
FOR
ELECTRICAL CONNECTORS

This EIA Recommended Standard is based upon the technical content of International Electrotechnical
Commission, Recommendation -512-4, Test 6c, Shock, 1976. It conforms in all essential respects with
the IEC Recommendation.

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 EIA-364-27B

TEST PROCEDURE No. 27B

MECHANICAL SHOCK (SPECIFIED PULSE)

TEST PROCEDURE
FOR
ELECTRICAL CONNECTORS

CONTENTS

Clause Page

1 Object 1

2 General 1

3 Definitions 1

4 Preparation of test sample 2

5 Test method 3

5.1 Test equipment 3

5.2 Test procedure 4
5.3 Measurements 8

6 Details to be specified 8

7 Documentation 8

Table 1: Test condition value 7

Figure 1: Mounting axis definitions 2

Figure 2: Tolerances for half-sine shock pulse 9
Figure 3: Tolerances for terminal peak sawtooth shock pulse 10
Figure 4: Tolerance limits for measuring system frequency response 11

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 EIA-364-27B
Page 1

TEST PROCEDURE No. 27B

MECHANICAL SHOCK (SPECIFIED PULSE)

TEST PROCEDURE
FOR
ELECTRICAL CONNECTORS

(From EIA Standards Proposal No. 3411, formulated under the cognizance of EIA CE-2.0 National
Connector Standards Committee)

(This test procedure was previously published in EIA Recommended Standard RS-364 as TP-27A).

1 Object

The object of this test procedure is to detail a standard method to assess the ability of electrical
components to withstand specified severities of mechanical shock.

2 General
This test is conducted for the purpose of determining the suitability of connectors and connector
assemblies when subjected to shocks such as those that may be expected as a result of rough
handling, transportation and operational conditions., This test differs from other shock tests in that
the design of the shock machine is not specified, but the half-sine and sawtooth shock pulse
waveforms are specified with tolerances. The frequency response of the measuring systems is also
specified with tolerances.

3 Definitions
The following mounting axis definitions shall be employed during the performance of this test,
unless otherwise specified in the Detail Specification.

3.1 Axis
Figure 1 indicates a pictorial view of the axis definitions. The Detail Specification shall indicate the
fixturing required or the axis definitions if different than as stated in figure 1. Axis definitions for
symmetrical, square and “free” connectors shall be defined in the Detail Specification.
 EIA-364-27B
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3.1.1 X-axis
Along the longitudinal length of the test sample.

3.2.2 Y-axis
The axis perpendicular to the longitudinal length of the sample (transverse direction).

3.3.3 Z-axis
The axis perpendicular to the fixture seating plane attached to the test table.

Figure 1- Mounting axis definitions

4 Preparation of the test sample

4.1 Unless otherwise specified, the test sample shall be fully wired and mated.

4.2 The test sample shall be mounted as specified in the connector Specification. If the test specimen
is normally mounted on vibration isolator, the isolators shall be functional during the test. Whenever
possible, the test load shall be distributed uniformly on the test platform in order to minimize the
effects of unbalanced loads.

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5 Test method

5.1 Test Equipment

5.1.1 Shock machine

The shock machine utilized shall be capable of producing the specified input shock pulse as shown
in figure 2 or 3, as applicable. The shock machine may be of the free fall, resilient rebound,
nonresilient, hydraulic, compressed gas, or other activating types.

[Link] Shock machine calibration

The actual test item, or a dummy load that may be either a rejected item or a rigid
dummy mass, may be used to calibrate the shock machine. (When a rigid dummy
mass is used, it shall have the same center of gravity and the same mass as that of
the test item and shall be installed in a manner similar to that intended for the test
item.) The shock machine shall then be calibrated for conformance with the
specified waveform. Two consecutive shock applications to the calibration load
shall produce waveforms that fall within the tolerance envelope given in figure 2 or
3. The calibration load shall then be removed and the shock test performed on the
actual test item. If all conditions remain the same, other than the substitution of the
test item for the calibration load, the calibration shall then be considered to have
met the requirements of the waveform.

NOTE - It is not implied that the waveform generated by the shock machine will
be the same when the actual test item is used instead of the calibration load.
However, the resulting waveform is considered satisfactory if the waveform with
the calibration load was satisfactory.

5.1.2. Instrumentation
The monitoring transducer shall be calibrated against a standard transducer having
an accuracy of +_ 2%. In order to meet the tolerance requirements of the test
procedure, the instrumentation used to measure the input shock shall have the
characteristics specified in the following.

[Link] Frequency response

The frequency response of the complete measuring system, including the
transducer through the readout instrument, shall be as specified in figure 4.
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Page 4

[Link].1. Frequency response measurement of the complete instrumentation

The transducer-amplifier-recording system can be calibrated by subjecting the
transducer to sinusoidal vibrations of known frequencies and amplitudes for the
required ranges so that the overall sensitivity curve can be obtained. The
sensitivity curve, normalized to be equal to unity at 100 Hz, shall then fall within the
limits given in figure 4.

[Link].2. Frequency response measurement of auxiliary equipment

If the calibration factors given for the accelerometer are such that when used with
the associated equipment it will not affect the overall frequency response, then the
frequency response of only the amplifier-recording system may be determined.
This shall be determined in the following manner:

Disconnect the accelerometer from the input terminals of its amplifier. Connect a
signal voltage source to these terminals. The impedance of the signal voltage
source as seen by the amplifier shall be made the same as the impedance of the
accelerometer and associated circuitry as seen by the amplifier. With the
frequency of the signal voltage set at 100 Hz, adjust the magnitude of the voltage
to be equal to the product of the accelerometer sensitivity and the acceleration
magnitude expected during test conditions. Adjust the system gain to a convenient
value. Maintain a constant input voltage and sweep the input frequency over the
range from 1.0 to 9,000 Hz, or 4 to 25,000 Hz, as applicable, depending on
duration of pulse. The frequency response in terms of dB shall be within the limits
given in figure 4.

[Link] Transducer
The fundamental resonant frequency of the accelerometer shall be greater than
30,000 Hz, when the accelerometer is employed as the shock sensor.

[Link] Transducer calibration

The accuracy of the calibration method shall be maintained within a tolerance of
at least ±5% over the frequency range of 2 Hz to 5,000 Hz. The amplitude of the
transducer being calibrated shall be held to the same tolerance (±5%) over the
frequency range of 4 Hz to 5,000 Hz.

[Link] Transducer mounting

When conformance to 5.1.3 is required, the monitoring transducer shall be rigidly
secured and located as near as possible to an attachment point of the specimen,
but not on the specimen itself.

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[Link] Linearity
The signal level of the system shall be chosen so that the acceleration pulse
operates over the linear portion of the system.

5.1.3 Application of shock measuring instrumentation

Shock measuring instrumentation shall be utilized to determine whether the correct
input shock pulse is applied to the test specimen. This is particularly important
where a multispecimen test is made. Generally, the shock pulse shall be monitored
whenever there is a change in the test setup, such as a different test fixture,
different component (change in physical characteristics), different weight, different
shock pulse (change in pulse shape, intensity, or duration) or different shock
machine characteristics. It is not mandatory that each individual shock be
monitored, provided that the repeatability of the shock application as specified in
[Link] has been established.

5.1.4 Shock pulses

Two types of shock pulses, a half-sine shock pulse, and a sawtooth shock pulse,
are specified. The pulse shape and tolerances are shown in figures 2 and 3,
respectively. For single degree of freedom systems, a sawtooth shock pulse can
be assumed to have a damage potential at least as great as that of a half-sine pulse
if the shock spectrum of the sawtooth pulse is everywhere at least as great as that
of the half-sine pulse. This condition will exist for two such pulses of the same
duration, if over most of the spectrum the acceleration peak value of the sawtooth
pulse is 1.4 times the acceleration peak value of the half-sine pulse.

[Link] Half-sine shock pulse

The half-sine shock pulse shall be as indicated in figure 2. The velocity change of
the pulse shall be within ±10% of the velocity change of the desired shock pulse.
The velocity change may be determined either by direct measurement, indirectly,
or by integrating (graphically or electrically) the area (faired acceleration pulse may
be used for the graphical representation) under the measured acceleration pulse.
For half-sine acceleration pulses of less than 3 milliseconds duration, the following
tolerances shall apply:

The faired maximum value of the measured pulse shall be within ±20% of the
specified ideal pulse amplitude, its duration shall be within ±15% of the specified
ideal pulse duration, and the velocity change associated with the measured pulse
shall be within ±10% of Vi = 2AD/B; where A is the acceleration amplitude and
D is the pulse duration of the ideal pulse; see figure 2 .
 EIA-364-27B
Page 6

[Link] Half-sine shock pulse (continued)

The measured pulse will then be considered a nominal half-sine pulse with a
nominal amplitude and duration equal to respective values of the corresponding
ideal half-sine pulse. The duration of the measured pulse shall be taken as Dm =
D(0.1A)/0.94; where D(0.1A) is the time between points at 0.1A for the faired
measured acceleration pulse.

[Link] The ideal half-sine pulse

An ideal half-sine acceleration pulse is given by the solid curve; see figure 2. The
measured acceleration pulse shall lie within the boundaries given by the broken
lines. In addition, the actual velocity change of the shock shall be within 10% of
the ideal velocity change. The actual velocity change can be determined by direct
measurements, or from the area under the measured acceleration curve. The ideal
velocity change is equal to Vi = 2AD/B.

[Link] Sawtooth shock pulse

The sawtooth pulse shall be as indicated in figure 3. The velocity change of the
faired measured pulse shall be within ±10% of the velocity change of the ideal
pulse.

[Link] The ideal terminal peak sawtooth

An ideal terminal peak sawtooth acceleration pulse is given by the solid line; see
figure 3. The measured acceleration pulse shall be within the boundaries given by
the broken lines. In addition, the actual velocity change of the shock pulse shall
be within 10% of the ideal value. The actual velocity change can be determined
from direct measurements, or from the area under the measured acceleration
curve. The ideal velocity change is equal to Vi = PD/2, where P is the peak value
of acceleration, and D is the pulse duration.

5.2 Test procedure

Three shocks in each direction shall be applied along the three mutually perpendicular axes of the
test specimen (18 shocks). The specified test pulse (half-sine or sawtooth pulse) shall be in
accordance with figure 2 or 3, respectively, and shall have a duration and peak value in accordance
with one of the test conditions shown in table 1.

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Table 1 - Test condition value

Peak acceleration Normal duration Velocity change (Vi)

Test condition (D) (m/s : ft/s)
(ms)
(m/s2) (g’s) Sawtooth Half-Sine

H 294 30 11 2.07 : 6.8

I 294 30 11 1.62 : 5.3
A 490 50 11 3.44 : 11.3
E 490 50 11 2.68 : 8.8
B 735 75 6 2.81 : 9.2
F 735 75 6 2.20 : 7.2
C 980 100 6 3.75 : 12.3
G 980 100 6 2.96 : 9.7
D 2941 300 3 5.61 : 18.4
J 4903 500 1 3.11 : 10.2
K 9806 1000 0.5 3.11 : 10.2
L 14709 1500 0.5 4.69 : 15.4
NOTE - For test conditions D, J, K and L, where the weight of multi-specimen and fixtures exceeds
68 kg (150 lb), there is a question as to whether the shock pulse is properly transmitted to all
specimens. Due consideration shall be given to the design of the test fixture to assure the proper
shock input to each specimen.
 EIA-364-27B
Page 8

5.3 Measurements
Measurements are to be made on mated connectors before and after the required number of
shocks unless otherwise specified, and during the test, if specified.

5.3.1 Unless otherwise specified in the Detail Specification, the electrical load conditions shall be 100
milliamperes maximum for all contacts.

5.3.2 Unless otherwise specified in the Detail Specification, no discontinuities of one microsecond or
greater duration are allowed. A detector capable of detecting the specified discontinuity shall be
used.

6 Details to be specified
The following details shall be specified in the Detail Specification:

6.1 Mounting method and accessories, location of wire clamps (see 4.2).
6.2 Test specimens (mated unless otherwise specified).
6.3 Test condition letter (see table 1).
6.4 Electrical load conditions (see 5.3).
6.5 Event requirement if other than 1 microsecond.
6.6 Measurement of discontinuity during shocks (see 5.3).
6.7 Tests or measurements before and after shocks (see 5.3).
6.8 Monitoring instrumentation, if applicable (see 5.1.3).
6.9 Location of monitoring transducers, if applicable (see [Link] ).
6.10 Mounting axis (see clause 3).

7 Documentation
The data sheets should contain:

7.1 Title of test.

7.2 Sample description - include fixture, if applicable.
7.3 Test equipment used, date of latest calibration and calibration interval.
7.4 Test condition letter.
7.5 Photographs, plots, values and observations necessary for proof of conformance.
7.6 Mounting axis (see clause 3)
7.7 Date of test and name of operator.

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NOTE - The oscillogram should include a time about 3D long with the pulse located approximately
in the center. The integration to determine velocity change should extend from 0.4D before the pulse
to 0.1D beyond the pulse. The acceleration amplitude of the ideal half since pulse is A and its
duration is D. Any measured acceleration pulse that can be contained between the broken line
boundaries is a nominal half sine pulse of nominal amplitude A and nominal duration D. The velocity-
change associated with the measured acceleration pulse is V.

Figure 2 - Tolerances for half-sine shock pulse

 EIA-364-27B
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NOTE - The oscillogram should include a time about 3D long with the pulse approximately in the
center. The integration to determine the velocity change should extend from 0.4D before the pulse to
0.1D beyond the pulse. The peak acceleration magnitude of the sawtooth pulse is P and its duration
is D. Any measured acceleration pulse that can be contained between the broken line boundaries is
a nominal terminal-peak sawtooth pulse of nominal peak value, P, and nominal duration, D. The
velocity-change associated with the measured acceleration pulse is V.

Figure 3 - Tolerances for terminal peak sawtooth shock pulse

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Low-frequency High- Frequency beyond which the

cut-off frequency response may rise
Duration of pulse (Hz) cut-off above +1 dB
(ms) (kHz) (kHz)
-1 dB -10 dB
-1 dB

<3 16 4 15 40

3 16 4 5 25

>3 4 1 5 25

Figure 4 - Tolerance limits for measuring system frequency response

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