Segmentation
Segmentation
https://doi.org/10.1007/s00138-021-01191-9
ORIGINAL PAPER
Abstract
High resolution electroluminescence (EL) images captured in the infrared spectrum allow to visually and non-destructively
inspect the quality of photovoltaic (PV) modules. Currently, however, such a visual inspection requires trained experts to
discern different kinds of defects, which is time-consuming and expensive. Automated segmentation of cells is therefore a
key step in automating the visual inspection workflow. In this work, we propose a robust automated segmentation method
for extraction of individual solar cells from EL images of PV modules. This enables controlled studies on large amounts of
data to understanding the effects of module degradation over time—a process not yet fully understood. The proposed method
infers in several steps a high-level solar module representation from low-level ridge edge features. An important step in the
algorithm is to formulate the segmentation problem in terms of lens calibration by exploiting the plumbline constraint. We
evaluate our method on a dataset of various solar modules types containing a total of 408 solar cells with various defects. Our
method robustly solves this task with a median weighted Jaccard index of 94.47% and an F1 score of 97.62%, both indicating
a high sensitivity and a high similarity between automatically segmented and ground truth solar cell masks.
Keywords PV modules · EL imaging · Visual inspection · Lens distortion · Solar cell extraction · Pixelwise classification
1 Introduction
B Sergiu Deitsch
[email protected] Visual inspection of solar modules using EL imaging allows
Claudia Buerhop-Lutz to easily identify damage inflicted to solar panels either by
[email protected] environmental influences such as hail, during the assem-
Evgenii Sovetkin bly process, or due to prior material defects or material
[email protected] aging [5,10,65,90,91,93]. The resulting defects can notably
Ansgar Steland decrease the photoelectric conversion efficiency of the mod-
[email protected] ules and thus their energy yield. This can be avoided by
Andreas Maier continuous inspection of solar modules and maintenance
[email protected] of defective units. For an introduction and review of non-
Florian Gallwitz
[email protected]
Christian Riess 4 Institute of Statistics, RWTH Aachen University,
[email protected] Wüllnerstr. 3, 52062 Aachen, Germany
1 5 Pattern Recognition Lab, Friedrich-Alexander University
Pattern Recognition Lab, Friedrich-Alexander University
Erlangen-Nürnberg, Martensstr. 3, 91058 Erlangen, Germany Erlangen-Nürnberg, Martensstr. 3, 91058 Erlangen, Germany
2 6 Faculty of Computer Science, Nuremberg Institute of
Helmholtz-Institut Erlangen-Nürnberg HI ERN,
Forschungszentrum Jülich GmbH, Immerwahrstr. 2, 91058 Technology, Keßlerplatz 12, 90489 Nürnberg, Germany
Erlangen, Germany 7 IT Security Infrastructures Lab, Friedrich-Alexander
3 IEK5-Photovoltaik, Forschungszentrum Jülich GmbH, 52425 University Erlangen-Nürnberg, Martensstr. 3, 91058
Jülich, Germany Erlangen, Germany
automatic processing tools for EL images, we refer to Mauk spective distortions. This distinguishes the manufacturing
[59]. setting from acquisitions in the field, where PV modules
An important step towards an automated visual inspection may be occluded by cables and parts of the rack, and the
is the segmentation of individual cells from the solar module. perspective may be strong enough to require careful cor-
An accurate segmentation allows to extract spatially normal- rection. However, perspective distortion also makes it more
ized solar cell images. We already used the proposed method difficult to identify defective areas (e.g., microcracks) due
to develop a public dataset of solar cells images [12], which to the foreshortening effect [4]. Therefore, capturing EL
are highly accurate training data for classifiers to predict images from an extreme perspective is generally not advis-
defects in solar modules [18,60]. In particular, the Convolu- able. Specifically for manufacturing environments, however,
tional Neural Network (CNN) training is greatly simplified the proposed method yields a robust, highly accurate, and
when using spatially normalized samples, because CNNs are completely automatic segmentation of solar modules into
generally able to learn representations that are only equiv- solar cells from high resolution EL images of PV modules.
ariant to small translations [35, pp. 335–336]. The learned Independently of the setting, our goal is to allow for some
representations, however, are not naturally invariant to other flexibility for the user to freely position the camera or use
spatial deformations such as rotation and scaling [35,44,52]. zoom lenses without the need to recalibrate the camera.
The identification of solar cells is additionally required With this goal in mind, a particular characteristic of the
by the international technical specification IEC TS 60904- proposed segmentation pipeline is that it does not require an
13 [42, Annex D] for further identification of defects on cell external calibration pattern. During the detection of the grid
level. Automated segmentation can also ease the develop- that identifies individual solar cells, the busbars and the inter
ment of models that predict the performance of a PV module solar cell borders are directly used to estimate lens distortion.
based on detected or identified failure modes, or by deter- Avoiding the use of a separate calibration pattern also avoids
mining the operating voltage of each cell [70]. The data the risk of an operator error during the calibration, e.g., due
describing the cell characteristics can be fed into an elec- to inexperienced personnel.
tric equivalent model that allows to estimate or simulate the A robust and fully automatic PV module segmentation
current-voltage characteristic (I-V) curve [13,46,72] or even can help understanding the influence of module degradation
the overall power output [47]. on module efficiency and power generation. Specifically, this
The appearance of PV modules in EL images depends on a allows to continuously and automatically monitor the degra-
number of different factors, which makes an automated seg- dation process, for instance, by observing the differences in
mentation challenging. The appearance varies with the type a series of solar cell images captured over a certain period of
of semiconducting material and with the shape of individual time. The segmentation also allows to automatically create
solar cell wafers. Also, cell cracks and other defects can intro- training data for learning-based algorithms for defect classi-
duce distracting streaks. A solar cell completely disconnected fication and failure prediction.
from the electrical circuit will also appear much darker than a
functional cell. Additionally, solar modules vary in the num-
ber of solar cells and their layout, and solar cells themselves 1.1 Contributions
are oftentimes subdivided by busbars into multiple segments
of different sizes. Therefore, it is desirable for a fully auto- To the best of our knowledge, the proposed segmentation
mated segmentation to infer both the arrangement of solar pipeline is the first work to enable a fully automatic extraction
cells within the PV module and their subdivision from EL of solar cells from uncalibrated EL images of solar modules
images alone, in a way that is robust to various disturbances. (cf., Fig. 1b). Within the pipeline, we seek to obtain the exact
In particular, this may ease the inspection of heterogeneous segmentation mask of each solar cell through estimation of
batches of PV modules. nonlinear and linear transformations that warp the EL image
In this work, we assume that EL images are captured in into a canonical view. To this end, our contributions are three-
a manufacturing setting or under comparable conditions in a fold:
test laboratory where field-aged modules are analyzed either
regularly or after hazards like hailstorms. Such laboratories
oftentimes require agile work processes where the equip- 1. Joint camera lens distortion estimation and PV module
ment is frequently remounted. In these scenarios, the EL grid detection for precise solar cell region identification.
irradiation of the solar module predominates the background 2. A robust initialization scheme for the employed lens dis-
irradiation, and the solar modules are captured facing the EL tortion model.
camera without major perspective distortion. Thus, the geo- 3. A highly accurate pixelwise classification into active solar
metric distortions that are corrected by the proposed method cell area on monocrystalline and polycrystalline PV mod-
are radial lens distortion, in-plane rotation, and minor per- ules robust to various typical defects in solar modules.
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Row 1
Row 2
...
... ...
(a) (b)
Fig. 1 (a) An EL image of a PV module overlaid by a rectangular grid ( ) and parabolic curve grid ( ) including the busbars ( )
determined using our approach. The intersections of the rectangular grid were registered to curve grid intersections to accurately align both grids.
Notice how the rectangular grid is still not able to capture the curved surface of the solar module induced by the (weak) lens distortion that increases
especially towards the image border. Using the curve grid, we estimate the lens distortion, rectify the image and finally extract the individual cells
using the estimated module topology (b). The segmented solar cells can be used for further analysis, such as automatic defect classification or
failure prediction in PV modules. The solar cells are approximately 15.6 cm × 15.6 cm with a standard 60 cell PV module with overall dimensions
of 1 m × 1.65 m
Moreover, our method operates on arbitrary (unseen) module constraint exploits the fact that the projection of straight
layouts without prior knowledge on the layout. lines under radial and tangential distortion will not be truly
straight. For example, under radial distortion, straight lines
1.2 Outline are images as curves. For typical visual inspection tasks,
a single image is sufficient to estimate the lens distor-
The remainder of this work is organized as follows. Section tion parameters [2,16,17,20,25,78]. This can be achieved by
2 discusses the related work. In Sect. 3, the individual stages decoupling the intrinsic parameters of the camera from the
of the segmentation pipeline are presented. In Sect. 4, we parameters of the lens distortion model [20].
evaluate the presented segmentation approach on a number Novel methodologies employ CNNs for various segmen-
of different PV modules with respect to the segmentation tation tasks. Existing CNN-based segmentation tasks can
accuracy. Finally, the conclusions are given in Sect. 5. be categorized into (1) object detection, (2) semantic seg-
mentation, and (3) instance-aware segmentation. One of the
first CNN object detection architectures is Regions with
2 Related work CNN features (R-CNN) [32] to learn features that are subse-
quently classified using a class-specific linear Support Vector
The segmentation of PV modules into individual solar cells Machine (SVM) to generate region proposals. R-CNN learns
is related to the detection of calibration patterns, such as to simultaneously classify object proposals and refine their
checkerboard patterns commonly used for calibrating intrin- spatial locations. The predicted regions, however, provide
sic camera and lens parameters [29,36,41,69,79]. However, only a coarse estimation of object’s location in terms of
the appearance of calibration patterns is typically perfectly bounding boxes. Girshick [31] proposed Fast Region-based
known, whereas detection of solar cells is encumbered by Convolutional Neural Network (Fast R-CNN) by acceler-
various defects that are a priori unknown. Additionally, the ating training and testing times while also increasing the
number of solar cells in a PV module and their layout can detection accuracy. Ren et al. [75] introduced Region Pro-
vary. We also note that existing lens models generally assume posal Network (RPN) that shares full-image convolutional
wide angle lenses. However, their application to standard features with the detection network enabling nearly cost-
lenses is to our knowledge not widely studied. free region proposals. RPN is combined with Fast R-CNN
To estimate the parameters of a lens distortion model, into a single network that simultaneously predicts object
the plumbline constraint is typically employed [11]. The bounds and estimates the probability of an object for each
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proposal. For semantic segmentation, Long et al. [56] intro- estimate lens distortion parameters, we constrain the prob-
duced Fully Convolutional Networks (FCNs) allowing for lem using domain knowledge by operating on a coherent
pixelwise inference. The FCN is learned end-to-end and grid. This joint methodology allows to correct errors through
pixels-to-pixels requiring appropriately labeled training data. feedback from the optimization loop used for estimating lens
Particularly, in medical imaging the U-Net network architec- model parameters. The proposed approach conceptually dif-
ture by Ronneberger et al. [77] has been successfully applied fers from Sovetkin and Steland [86], where both steps are
for various segmentation tasks. In instance segmentation, Li decoupled and an external calibration is required.
et al. [51] combined segment proposal and object detection
for Fully Convolutional Instance Segmentation (FCIS) where
the general idea is to predict the locations in a fully convolu- 3 Methodology
tional network. He et al. [39] proposed a Mask R-CNN which
extends Faster R-CNN. The proposed framework uses a bottom-up pipeline to gradu-
The work by Mehta et al. [62] introduces a CNN for the ally infer a high-level representation of a solar module and its
prediction of power loss. Their system additionally localizes cells from low-level ridge edge features in an EL image. Cell
and classifies the type of soiling. Their work is based on RGB boundaries and busbars are represented as parabolic curves
images of whole PV modules and addresses the additional to robustly handle radial lens distortion which causes straight
geometric challenges of acquisitions in the field. In contrast, lines to appear curved in the image. Once we estimated
this work operates on EL images of individual cells of a PV the lens distortion parameters, the parabolas are rectified to
module, and in particular focuses on their precise segmenta- obtain a planar cell grid. This rectified representation is used
tion in a manufacturing setting. to segment the solar cells.
The main limitation of learning-based approaches is
the requirement of a considerable number of appropriately 3.1 Overview
labeled images for training. However, pixelwise labeling is
time-consuming, and in absence of data not possible at all. The general framework for segmenting the solar cells in EL
Also, such learning-based approaches require training data images of PV modules is illustrated in Fig. 2 and consists of
that is statistically representative for the test data, which the following steps. First, we locate the busbars and the inter
oftentimes requires to re-train a model on data with different solar cell borders by extracting the ridge edges. The ridge
properties. In contrast, the proposed approach can be read- edges are extracted at subpixel accuracy and approximated
ily deployed to robustly segment EL images of PV modules by a set of smooth curves defined as second-degree polyno-
without notable requirements of labeled training data. mials. The parametric representation is used to construct an
The closest work related to the proposed method was pre- initial grid of perpendicularly arranged curves that identify
sented by Sovetkin and Steland [86]. This method proposes a the PV module. Using this curve grid, we estimate the initial
robust PV module grid alignment for the application on field lens distortion parameters and hypothesize the optimal set of
EL images, where radial and perspective distortion, motion curves by further excluding outliers in a RANdom SAmple
blur, and disturbing background may be present. The method Consensus (RANSAC) scheme. Then we refine the lens dis-
uses an external checkerboard calibration for radial distortion tortion parameters that we eventually use to rectify the EL
correction, and prior knowledge on the solar cell topology in image. From the final set of curves we infer the PV module
terms of the relative distances of the grid lines separating configuration and finally extract the size, perspective, and
the busbars and cell segments. In contrast, EL images taken orientation of solar cells.
under manufacturing conditions may be cropped or rotated,
and the camera is not always pre-calibrated. Hence, the pro- 3.2 Preprocessing
posed method performs an automated on-line calibration for
every EL image. This is particularly useful for EL images First, the contrast of an EL image is enhanced to account for
of PV modules from various sources, for which the camera possible underexposure. Then, low-level edge processing is
parameters may not be available, or when zoom lenses are applied to attenuate structural variations that might stem from
used. Additionally, the proposed method performs a pixel- cracks or silicon wafer texture, with the goal of preserving
wise classification of pixels belonging to the active cell area larger lines and curves.
and therefore is able to provide masks tailored to a specific
module type. Such masks allow to exclude unwanted back- 3.2.1 Contrast enhancement
ground information and to simplify further processing.
In this work, we unify lens distortion estimation and grid Here, we follow the approach by Franken et al. [28]. A
detection by building upon ideas of Devernay and Faugeras copy Ibg of the input EL image I is blurred with a Gaus-
[20]. However, instead of using independent line segments to sian kernel, and a morphological closing with a disk-shaped
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structure element is applied. Dividing each pixel of I by Ibg the angle β(u) provide initial cues for ridge edges in the EL
attenuates unwanted background noise while emphasizing image (see Fig. 5c).
high contrast regions. Then, histogram equalization [34,
pp. 134 sqq.] is applied to increase its overall contrast. Fig-
ure 5b shows the resulting image I .
3.2.3 Contextual enhancement via tensor voting
3.2.2 Gaussian scale-space ridgeness Ridgeness can be very noisy (cf., Fig. 5c). To discern noise
and high curvatures from actual line and curve features,
The high-level grid structure of a PV module is defined by R(u) is contextually enhanced using tensor voting [61].
inter-cell borders and busbars, which correspond to ridges in Tensor voting uses a stick tensor voting field to model the
the image. Ridge edges can be determined from second-order likelihood that a feature in the neighborhood belongs to the
partial derivatives summarized by a Hessian. To robustly same curve as the feature in the origin of the voting field [27].
extract line and curve ridges, we compute the second-order The parameter ς > 0 controls the proximity of the voting
derivative of the image at multiple scales [54,55]. The field, and ν determines the angular specificity that we set to
responses are computed in a Gaussian pyramid constructed ν = 2 in our experiments.
from an input EL image [53]. This results in several layers of Following Franken et al. [27], stickness R̃(u) = λ̃1 − λ̃2
the pyramid at varying resolutions commonly referred to as is computed as the difference between the two eigenval-
octaves. The eigendecomposition of the Hessian computed ues λ̃1 , λ̃2 of the tensor field, where λ̃1 > λ̃2 . β̃(u) = ẽ1
afterwards provides information about line-like structures. is the angle of the eigenvector ẽ1 ∈ R2 associated with the
More in detail, let u := (u, v) denote discrete pixel coor- largest eigenvalue λ̃1 , analogously to β(u).
dinates, O ∈ N the number of octaves in the pyramid, and We iterate tensor voting two times, since one pass is not
P ∈ N the number of sublevels in each octave. At the finest always sufficient [28]. Unlike Franken et al., however, we
√
resolution, we set σ to the golden ratio σ = 1 + 5/2 ≈ 1.6. At do not thin out the stickness immediately after the first pass
each octave o ∈ {0, . . . , O −1} and sublevel ∈ {0, . . . , P − to avoid too many disconnected edges. Given the high res-
1}, we compute the Hessian by convolving the image with olution of the EL images in our dataset of approximately
the derivatives of the Gaussian kernel. To obtain the eigenval- 2500 × 2000 pixels, we use a fairly large proximity of
ues, the symmetric Hessian is diagonalized by annihilating ς1 = 15 in the first tensor voting step, and ς2 = 10 in
the off-diagonal elements using the Jacobi method which the second.
iteratively applies Givens rotations to the matrix [33]. This Figure 5d shows a typical stickness R̃(u) output. The stick-
way, its eigenvalues and the corresponding eigenvectors can ness along the orientation β̃(u) is used to extract curves at
be simultaneously extracted in a numerically stable manner. subpixel accuracy in the next step of the pipeline.
Let H = VV denote the eigendecomposition of the Hes-
sian H, where := diag(λ1 , λ2 ) ∈ R2×2 is a diagonal matrix
of eigenvalues λ1 > λ2 and V := (v1 , v2 ) are the associ-
ated eigenvectors. Under a Gaussian assumption, the leading 3.3 Curve extraction
eigenvector dominates the likelihood if the associated lead-
ing eigenvalue is spiked. In this sense, the local ridgeness We seek to obtain a coherent grid which we define in terms
describes the likelihood of a line segment in the image at of second-degree curves. These curves are traced along the
position u, and the orientation of the associated eigenvector previously extracted ridges by grouping centerline points by
specifies the complementary angle β(u) of the most likely their curvature. We then fit second-degree polynomials to
line segment orientation at position u. The local ridgeness these points, which yields a compact high-level curve rep-
R(u) is obtained as the maximum positive eigenvalue λ1 (u) resentation while simultaneously allowing to discard point
across all octaves and sublevels. Both the ridgeness R(u) and outliers.
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(a) (b)
Fig. 3 Extraction of ridge edges from stickness at subpixel accuracy. (a) shows a stickness patch with its initial centerline ( ) at discrete
coordinates obtained by skeletonization. The refined ridge centerline at subpixel accuracy is estimated by fitting a Gaussian function ( ) to the
cross-section profile of the ridge edge in (b) to equidistantly sampled stickness values within a predefined sampling window ( )
3
3.3.1 Extraction of ridges at subpixel accuracy
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3.3.3 Parametric curve representation the projection on the image plane) followed by shifting the
center of distortion c := (cx , c y ) to the origin and nor-
Projected lines are represented as second-degree polyno- malizing the resulting 2-D point to the unit range using the
mials to model radial distortion. The curve parameters are dimensions M × N of the image of width M and height N .
computed via linear regression on the curve points. More Homogeneous coordinates allow to express the normaliza-
specifically, let tion conveniently using a matrix product. By defining the
upper-triangular matrix
f (x) = a2 x 2 + a1 x + a0 (1)
⎡ ⎤
sx M 0 cx
denote a second-degree polynomial in horizontal or vertical K = ⎣ 0 N cy ⎦ (3)
direction. The curve is fitted to line segment points q̂ j ∈ 0 0 1
{(x j , y j ) | j = 1, . . . , n i } ⊆ Q̂(i) of the i-th curve Q̂(i) by
minimizing the Mean Squared Error (MSE) the normalizing mapping n : Ω → [−1, 1]2 is
1
ni
n(x) = π K −1 π −1 (x) , (4)
MSE( f ) = ( f (x j ) − y j )2 (2)
ni
j=1
where π : R3 → R2 projects homogeneous to inhomoge-
using RANSAC iterations [24]. In one iteration, we ran- neous coordinates,
domly sample three points to fit Eq. (1), and then determine
which of the remaining points support this curve model via 1
π : (x, y, z) → (x, y) , for z = 0 (5)
MSE. Outlier points are discarded if the squared difference z
between the point and the parabolic curve value at its posi-
tion exceeds ρ = 1.5. To keep the computational time low, and the inverse operation π −1 : R2 → R3 backprojects inho-
RANSAC is limited to 100 iterations, and stopped early once mogeneous to homogeneous coordinates:
sufficiently many inliers at a 99 % confidence level are found
[38, ch. 4.7]. After discarding the outliers, each curve is refit- π −1 : (x, y) → (x, y, 1) . (6)
ted to supporting candidate points using linear least squares
[33]. To ensure a numerically stable and statistically robust Note that the inverse mapping n−1 converts normalized
fit, the 2-D coordinates are additionally normalized [37]. image coordinates to image plane coordinates.
3.4 Curve grid model estimation 3.4.2 The field-of-view lens distortion model
The individual curves are used to jointly form a grid, which To describe the radial lens distortion, we use the first-order
allows to further discard outliers, and to estimate lens distor- Field-of-View (FOV) lens model by Devernay and Faugeras
tion. To estimate the lens distortion, we employ the plumbline that has a single distortion parameter ω. While images can
constraint [11]. The constraint models the assumption that also suffer from tangential distortion, this type of distortion
curves in the image correspond to straight lines in real world. is often negligible [92]. The sole parameter 0 < ω ≤ π
In this way, it becomes possible to estimate distortion effi- denotes the opening angle of the lens. The corresponding
ciently from a single image, which allows to use this approach radial displacement function L is defined in terms of the
also post hoc on cropped, zoomed or similarly processed distortion radius r ≥ 0 as
images.
1 ω
3.4.1 Representation of lens distortion L(r ) = arctan 2r tan , for ω = 0 . (7)
ω 2
Analogously to Devernay and Faugeras [20], we represent One advantage of the model is that its inversion has a closed-
the radial lens distortion by a function L : R≥0 → R≥0 that form solution with respect to the distortion radius r .
maps the distance of a pixel from the distortion center to a Similar to Devernay and Faugeras, we decouple the distor-
distortion factor. This factor can be used to radially displace tion from the projection onto the image plane, avoiding the
each normalized image coordinate x̃. need to calibrate for intrinsic camera parameters. Instead, the
Image coordinates are normalized by scaling down coor- distortion parameter ω is combined with the distortion cen-
dinates x := (x, y) horizontally by the distortion aspect ter c ∈ Ω and distortion aspect ratio sx which are collected
ratio sx (corresponding to image aspect ratio decoupled from in a vector θ := (c, sx , ω).
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(c) Ridgeness image ( ) from the filter responses at multiple scales (d) Stickness of ridgeness contextually enhanced using tensor voting
(e) Extracted line segments grouped by their curvature (f) Horizontal ( ) and vertical ( ) parabolic curves filtered using
the intersection constraint
Fig. 5 Visualization of the preprocessing, curve extraction, and model estimation stages for the PV module from Fig. 1
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Normalized undistorted image coordinates x̃u = δ −1 (x̃d ) The real roots of the quartic (12) can be found with the
can be directly computed from distorted coordinates x̃d as Jenkins-Traub Rpoly algorithm [45] or a specialized quartic
solver [26]. The corresponding values f (x) are determined
L −1 (rd ) by inserting the roots back into Eq. (1).
δ −1 (x̃d ) = x̃d , for rd = 0 (8) Distortion Coefficient Estimation of the distortion coeffi-
rd
cient ω from a set of distorted image points is not straightfor-
where rd = x̃d 2 is the distance of x̃d from the origin. ward because the distortion function L(r ) is nonlinear. One
L −1 (r ) is the inverse of the lens distortion function in Eq. way to overcome this problem is to linearize L(r ) with Taylor
(7), namely polynomials, and to estimate ω with linear least squares.
To this end, we define the distortion factor
tan r ω
L −1 (r ) = , for ω = 0 . (9) L(r )
2 tan ω2 k := , for k ∈ R>0 (13)
r
The function that undistorts a point x ∈ Ω is thus
which maps undistorted image points {p j }nj=1 lying on the
straight lines to distorted image points {q j }nj=1 lying on the
u(x) = n−1 δ −1 (n(x)) . (10) parabolic curves. Both point sets are then related by
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1 2 (i)
n
θ := argmin χ (P , θ ) . (21)
θ 2
i=1
we can estimate ω from four roots of the resulting polyno- The layout of the curves is constrained to a grid in order to
mial Q(ω). These roots can be found by substituting z = ω2 eliminate outlier curves. Ideally, each horizontally oriented
into Eq. (19), solving the quadratic equation with respect to z, parabola should intersect each vertically oriented parabola
and substituting back to obtain ω. This eventually results in exactly once. This intersection can be found using Eq.
√
the four solutions ± z 1,2 . The solution exists only if k ≥ 1, (12). Also, every parabolic curve should not intersect other
as complex solutions are not meaningful, and thus corre- parabolic curves of same orientation within the image plane.
sponds to the largest positive real root. This set of rules eliminates most of the outliers.
We evaluated the accuracy of the approximation (19) with Robust Outlier Elimination Locally Optimized RANdom
the results shown in Fig. 6. For large radii, the approximation SAmple Consensus (LO-RANSAC) [15] is used to remove
significantly deviates from the exact solution. Consequently, outlier curves. In every LO-RANSAC iteration, the grid con-
this means that the selected points for the estimation must straints are imposed by randomly selecting two horizontal
ideally be well distributed across the image. Otherwise, the and two vertical curves to build a minimal grid model. Inliers
lens distortion parameter will be underestimated. In practice, are all curves that (1) exactly once intersect the model grid
however, this constraint does not pose an issue due to the lines of perpendicular orientation, (2) not intersect the model
spatial distribution of the solar cells across the captured EL grid lines of parallel orientation, and (3) whose MSE of the
image. reprojected undistorted points is not larger than one pixel.
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the fraction of points in the synthetic planar grid and the total since the estimated curve grid already provides a global con-
number of intersections in the curve grid. text, we tackle the pixelwise classification as a combination
To ensure CPD convergence, initial positions of the syn- of adaptive thresholding and prior knowledge with regard
thetic planar grid should be sufficiently close to the curve to the straight shape of solar cells. Compared to CRFs, this
grid intersections. We therefore estimate the translation and approach does not require a training step and is easy to imple-
rotation of the planar grid to closely pre-align it with the ment.
grid we are registering against. The initial translation can be To this end, we use solar cells extracted from a PV module
estimated as the curve grid intersection point closest to the to compute a mean solar cell (see Figs. 8a, b). Since intensi-
image plane origin. The 2-D in-plane rotation is estimated ties within a mean solar cell image can exhibit a large range,
from the average differences of two consecutive intersection we apply locally adaptive thresholding [68] on 25×25 pixels
points along each curve grid row and column. This results in patches using their mean intensity, followed by a 15×15 mor-
two 2-D vectors which are approximately orthogonal to each phological opening and flood filling to close any remaining
other. The 2-D vector with the larger absolute angle is rotated holes. This leads to an initial binary mask.
by 90 % such that both vectors become roughly parallel. The Ragged edges at the contour are removed using vertical
estimated rotation is finally obtained as the average angle of and horizontal cell profiles (Fig. 8b). The profiles are com-
both vectors. puted as pixelwise median of the initial mask along each
image row or column, respectively. We combine the back-
3.5.3 Undistortion and rectification projection of these profiles with the convex hull of the binary
mask determined with the method of Barber et al. [6] to
The PV module configuration is used to undistort the whole account for cut-off corners using bitwise AND (cf., Fig. 8c).
image using Eq. (10). After eliminating the lens distortion, To further exclude repetitive patterns in the EL image of a
we use Direct Linear Transform (DLT) [38] to estimate the solar cell, e.g., due to low passivation efficiency in the con-
planar 2-D homography using the four corners of the curve tact region (see Fig. 8d), we combine the initial binary mask
grid with respect to the corners of the synthetic planar grid. and the augmented mask via bitwise XOR.
The homography is used to remove perspective distortion We note that solar cells are usually symmetric about both
from the undistorted curve grid. axes. Thus, the active solar cell area mask estimation can be
The intersections of the perspective corrected curve grid restricted to only on quadrant of the average solar cell image
may not align exactly with respect to the synthetic planar to enforce mask symmetry. Additionally, the convex hull of
grid because individual solar cells are not always accurately the solar cell and its extra geometry can approximated by
placed in a perfect grid but rather with a margin of error. polygons [1] for a more compact representation.
The remaining misalignment is therefore corrected via affine
Moving Least Squares (MLS) [81], which warps the image 3.7 Parameter tuning
using the planar grid intersections as control points distorted
using the estimated lens parameters, and curve grid intersec- The proposed solar cell segmentation pipeline relies on a
tions are used as their target positions. set of hyperparameters that directly affect the segmentation
robustness and accuracy. Table 1 provides an overview of all
3.6 Estimation of the active solar cell area parameters with their values used in this work.
We use solar cell images extracted from individual PV mod- 3.7.1 Manual search
ules to generate a mask that represents the active solar cell
area. Such masks allow to exclude the background and the Since the parameters of the proposed segmentation are intu-
busbars of a solar cell (see Fig. 8). In particular, active cell itive and easily interpretable, it is straightforward to select
area masks are useful for detection of cell cracks since they them based on the setup used for EL image acquisition.
allow to mask out the busbars, which can be incorrectly iden- Main influence factors that must be considered when
tified as cell cracks due to high similarity of their appearance choosing the parameters are image resolution and physical
[87,89]. properties of the camera lens.
Estimation of solar cell masks is related to the image label- Provided parameter values were found to work particu-
ing problem, where the goal is to classify every pixel into larly well for high resolution EL images and standard camera
several predefined classes (in our case, the background and lenses, as in our dataset (cf., Sect. 4.1). For low resolution
the active cell area). Existing approaches solve this problem EL images, however, the number of pyramid octaves and sub-
using probabilistic graphical models, such as a Conditional levels will need to be increased to avoid missing important
Random Field (CRF) which learns the mapping in a super- image details. Whereas, tensor voting proximity, on contrary,
vised manner through contextual information [40]. However, will need to be lowered, since the width of ridge edges in low
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Table 1 Overview of segmentation pipeline parameters and their values used in this work
§ Symbol Description Used value
resolution images tends to be proportional to the image reso- Sovetkin and Steland [86] on simplified masks, provide qual-
lution. This immediately affects the size of the 1-D sampling itative results and runtimes, and discuss limitations.
window for determining the Gaussian-based subpixel posi-
tion of curve points.
4.1 Dataset
Curve extraction parameters correlate with the field-of-
view of the EL camera lens. In particular for wide angle
We use a dataset consisting of 44 unique PV modules with
lenses, the merge angle ϑ must be increased.
various degrees of defects to manually select the parame-
Parabolic curve fit error ρ balances between robustness
ters for the segmentation pipeline and validate the results.
and accuracy of the segmentation result. The window size
These images served as a reference during the development
for locally adaptive thresholding used for estimation of solar
of the proposed method. The PV modules were captured in a
cell masks correlates both with the resolution of EL images,
testing laboratory setting at different orientations and using
but also with the amount of noise and texture variety in solar
varying camera settings, such as exposure time. Some of EL
cells, e.g.due to cell cracks.
images were post-processed by cropping, scaling, or rotation.
This dataset consists of 26 monocrystalline and 18 polycrys-
3.7.2 Automatic search talline solar cells. In total, these 44 solar modules consist
of 2,624 solar cells out of which 715 are definitely defec-
The parameters can also be automatically optimized in an tive with defects ranging from microcracks to completely
efficient manner using random search [7,58,74,82,83,85] or disconnected cells and mechanically induced cracks (e.g.,
Bayesian optimization [3,8,9,49,63,84] class of algorithms. electrically insulated or conducting cracks, or cell cracks due
Since this step involves supervision, pixelwise PV module to soldering [88]). 106 solar cells exhibit smaller defects that
annotations are needed. In certain cases, however, it may be are not with certainty identifiable as completely defective,
not be possible to provide such annotations because individ- and 295 solar cells feature miscellaneous surface abnormal-
ual defective PV cells can be hard to delineate, e.g., they ities that are no defects. The remaining 1,508 solar cells
appear completely dark. Also, the active solar cell area of are categorized as functional without any perceivable sur-
defective cells is not always well-defined. Therefore, we face abnormalities. The solar cells in imaged PV modules
refrained from automatically optimizing the hyperparame- have a square aspect ratio (i.e., are quadratic).
ters in this work. The average resolution of the EL images is 2779.63 ×
2087.35 pixels with a standard deviation of image width and
height of 576.42 and 198.30 pixels, respectively. The median
resolution is 3152 × 2046 pixels.
4 Evaluation Additional eight test EL images (i.e., about 15% of
the dataset) are used for the evaluation. Four modules are
We evaluate the robustness and accuracy of our approach monocrystalline and the remaining four are polycrystalline.
against manually annotated ground truth masks. Further, Their ground truth segmentation masks consist of hand-
we compare the proposed approach against the method by labeled solar cell segments. The ground truth additionally
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specifies both the rows and columns of the solar cells, and antialiasing or interpolation during mask construction, we
their subdivisions. These images show various PV modules define importance of pixels by their intensity. Given two non-
with a total of 408 solar cells. The resolution of the test EL binary masks A and B, the weighted Jaccard similarity is
images varies around 2649.50 ± 643.20 × 2074 ± 339.12
with a median image resolution of 2581.50 × 2046. min{A(u), B(u)}
Jw = u∈Ω . (22)
Three out of four monocrystalline modules consist of 4 × u∈Ω max{A(u), B(u)}
9 cells and the remaining monocrystalline module consists
of 6 × 10 cells. All of their cells are subdivided by busbars The performance metric is computed on pairs of segmented
into 3 × 1 segments. cells and ground truth masks. A ground truth cell mask is
The polycrystalline modules consist of 6 × 10 solar cells matched to the segmented cell with the largest intersection
each. In two of the modules, every cell is subdivided into 3 × area, thus taking structural coherence into account.
1 segments. The cells of the other two modules are subdivided We additionally compute the Jaccard index of the back-
into 4 × 1 segments. ground, which corresponds to the accuracy of the method to
segment the whole solar module. Solar cell misalignment or
4.2 Evaluation metrics missed cells will therefore penalize the segmentation accu-
racy to a high degree. Therefore, the solar module Jaccard
We use two different metrics, pixelwise scores and the index provides a summary of how well the segmentation per-
weighted Jaccard index to evaluate both the robustness and forms per EL image.
the accuracy of the proposed method and to compare our
method against related work. In the latter case, we addition- 4.3 Quantitative results
ally use a third metric, the Root Mean Square Error (RMSE),
to compute the segmentation error on simplified masks. We evaluate the segmentation accuracy and the robustness of
our approach using a fixed set of parameters as specified in
4.2.1 Root mean square error Table 1 on EL images of PV modules acquired in a material
testing laboratory.
The first performance metric is the RMSE given in pixels
between the corners of the quadrilateral mask computed from 4.3.1 Comparison to related work with simplified cell masks
the ground truth annotations and the corners estimated by the
individual modalities. The metric provides a summary of the The method by Sovetkin and Steland focuses on the esti-
method’s accuracy in absolute terms across all experiments. mation of the perspective transformation of the solar module
and the extraction of solar cells. Radial distortion is corrected
4.2.2 Pixelwise classification with a lens model of an external checkerboard calibration.
The grid structure is fitted using a priori knowledge of the
The second set of performance metrics are precision, recall, module topology. For this reason, we refer to the method as
and the F1 score [76]. These metrics are computed by Perspective-corrected Grid Alignment (PGA). The method
considering cell segmentation as a multiclass pixelwise clas- makes no specific proposal for mask generation and there-
sification into background and active area of individual solar fore yields rectangular solar cells.
cells. A typical 60 cell PV module will therefore contain up In order to perform a comparison, the exact masks (cf.,
to 61 class labels. A correctly segmented active area pixel is Fig. 9a) are restricted to quadrilateral shapes (cf., Fig. 9b).
a true positive, the remaining quantities are defined accord- The quadrilateral mask is computed as the minimum circum-
ingly. Pixelwise scores are computed globally with respect scribing polygon with four sides, i.e., a quadrilateral, using
to all the pixels. Therefore, the differences between the indi- the approach of Aggarwal et al. [1]. The quadrilateral exactly
vidual results for these scores are naturally smaller than for circumscribes the convex hull of the solar cell mask with all
metrics that are computed with respect to individual solar the quadrilateral sides flush to the convex hull.
cells, such as the Jaccard index. PGA assumes that radial distortion is corrected by an
external checkerboard calibration. This can be a limiting fac-
4.2.3 Weighted Jaccard Index tor in practice. Hence, the comparison below considers both
practical situations by running PGA on distorted images and
The third performance metric is the weighted Jaccard index on undistorted images using the distortion correction of this
[14,43], a variant of the metric widely known as Intersection- work.
over-Union (IoU). This metric extends the common Jaccard Root Mean Square Error Table 2 provides the RMSE in pix-
index by an importance weighting of the input pixels. As els between the corners of the quadrilaterals computed by
the compared masks are not strictly binary either due to the respective modality and the quadrilateral mask estimated
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Fig. 9 Example of an exact mask (a) of solar cells estimated using the proposed approach and a quadrilateral mask (b) determined from the exact
mask. The latter is used for comparison against the method of Sovetkin and Steland [86]. Both masks are shown as color overlays. Different colors
denote different instances of solar cells
from the ground truth. The metric is provided for monocrys- 4.3.2 Ablation study
talline and polycrystalline solar wafers separately, and for
both types combined. In all cases, the proposed approach out- We ablate the lens distortion parameters and the post hoc
performs both PGA variants. We particularly notice that PGA application of affine MLS to investigate their effect on the
greatly benefits from lens distortion estimation. This under- accuracy and the success rate of the segmentation process.
lines our observation that the latter is essential for highly The ablation is performed both on original (i.e., distorted)
accurate segmentation. EL images and undistorted ones.
Pixelwise Classification Pixelwise scores for the simplified Distorted vs. Undistorted EL Images For the ablation study,
masks of both methods are given in Table 3. For monocrys- we consider two main cases. In the undistorted case, both
talline PV modules, PGA generally achieves higher scores. reference and predicted masks are unwarped using estimated
However, highest scores are achieved only for images for lens distortion parameters. Then, quadrilaterals are fitted to
which the lens distortion has been removed. The proposed individual cell masks to allow a comparison against PGA
method fails to segment a row of cells in a solar mod- which always yields such quadrilateral cell masks. For a fair
ule resulting in a lower recall. However, for polycrystalline comparison, PGA is also applied to undistorted images.
PV modules, the proposed method consistently outperforms In the distorted case, however, the comparison is per-
PGA. In the overall score, the proposed method also out- formed in the original image space. Since the proposed
performs the best-case evaluation for PGA on undistorted method yields a curved grid after applying the inverse of
images. However, PGA has highest recall, which is due to lens distortion, we synthesize a regular grid from backwarped
the lower number of parameters of PGA. cell masks. Specifically, we extract the contours of estimated
Weighted Jaccard Index The Jaccard scores summarized solar cell masks to obtain the coordinates of the quadri-
as boxplots in Fig. 10 support the pixelwise classification lateral in the unwarped image, and then apply the inverse
scores, showing that the proposed method is more accurate of estimated geometric transformations to rectangle coordi-
than PGA. The latter, however, is slightly more robust. For nates. Afterwards, we fit lines to each side of the backwarped
complete modules, the considerable spread of PGA is par- quadrilaterals along grid rows and columns. From their inter-
tially attributed to one major outlier. Overall, the proposed sections we finally obtain the corner coordinates of each solar
segmentation pipeline is highly accurate. Particularly once cells in the distorted image which we can use for comparison
a cell is detected, the cell outline is accurately and robustly against distorted PGA results.
segmented. Parameterization First, we reduce the lens distortion model
to a single radial distortion parameter ω and assume both
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(a) Monocrystalline
Precision 97.55% 97.77% 99.18% 98.98% 98.43% 98.34% 99.67% 99.53%
Recall 98.37% 82.08% 97.53% 97.71% 98.87% 81.56% 96.94% 97.14%
F1 score 97.95% 86.57% 98.24% 98.24% 98.65% 86.46% 98.18% 98.21%
Accuracy 98.19% 88.43% 98.34% 98.32% 98.82% 88.55% 98.33% 98.38%
(b) Polycrystalline
Precision 97.22% 97.70% 98.82% 98.77% 98.36% 97.40% 99.52% 99.59%
Recall 97.70% 88.35% 99.29% 99.36% 99.29% 87.08% 99.17% 99.35%
F1 score 97.45% 91.32% 99.05% 99.06% 98.82% 90.42% 99.35% 99.47%
Accuracy 97.13% 92.44% 98.89% 98.90% 98.66% 92.06% 99.25% 99.39%
(c) Overall
Precision 97.37% 97.30% 99.00% 98.88% 98.38% 97.09% 99.58% 99.56%
Recall 97.78% 82.36% 98.27% 98.39% 99.01% 81.15% 97.97% 98.18%
F1 score 97.57% 87.45% 98.60% 98.60% 98.69% 86.60% 98.73% 98.83%
Accuracy 97.74% 90.15% 98.58% 98.57% 98.75% 90.06% 98.72% 98.81%
Bold face denotes the best performing method
100 100
98
90
Jaccard index >%@
Jaccard index >%@
96
80
94
92 70
90
60
88
Mono- Poly- Overall Mono- Poly- Overall
crystalline crystalline crystalline crystalline
Fig. 10 Boxplots of Jaccard scores for the three evaluated modalities. The Jaccard scores are computed against hand-labeled ground truth masks.
In (a), the scores are computed for the individual solar cells. In (b), the scores are evaluated against the whole solar modules. The two left-most
groups in each figure correspond to boxplots with respect to different solar wafers. Whereas the right-most group summarizes the performance of
both solar wafer types combined
square aspect ratio (i.e., sx = 1) and the center of distortion high, the recall and therefore the F1 score drops consider-
to be located in the image center. During optimization, these ably (cf., Table 3). The reason for this is that such a lens
two parameters are kept constant. In this experiment, we also parametrization is too rigid. As a consequence, this weakens
do not correct the curve grid using affine MLS. The compar- the grid detection: correctly detected curves are erroneously
ison against PGA shows that such a simplistic lens model is discarded because of inaccuracies of the lens model with only
still more accurate than PGA both in the distorted and undis- a single parameter ω instead of four parameters (ω, sx , c).
torted cases (cf., Table 2). However, while the precision is
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Table 4 Pixelwise classification scores for exact masks estimated using Solar cells Modules
the proposed approach 100
Metric Monocrystalline Polycrystalline Overall
95
Precision 97.47% 97.49% 97.53%
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are on average cheapest. The standard deviation of the model Monocrystalline Polycrystalline
estimation step is highest (see Fig. 13), which is mostly due
30.08 s
to dependency upon the total number of ridge edges and the Pre-
28.85 s
number of resulting curves combined with the probabilistic processing
29.36 s
nature of LO-RANSAC. 8.92 s
Interestingly, processing EL images of monocrystalline Curve 9.23 s
Extraction
solar modules takes slightly longer on average than process- 9.11 s
between ridges caused by cut-off corners that produce many Model 18.83 s
Estimation
disconnected curve segments which must be merged first. 20.93 s
6.43 s
ments are combined early on.
An average processing time of 1 min and 6 s is substan- 0 10 20 30 40 50
tially faster than manual processing, which takes at least Processing time >s@
several minutes. For on-site EL measurements with in-situ
Fig. 13 Average time taken by individual steps of the segmentation
imaging of PV modules, the processing times must be fur- pipeline, in seconds. The error bars denote the upper range of the stan-
ther optimized, likely by at least a factor of ten. However, dard deviation
in other imaging environments, for example material test-
ing laboratories, the runtime is fully sufficient, given that the
handling of each module for EL measurements and the per-
formance evaluation impose much more severe scheduling
bottlenecks.
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https://doi.org/10.2478/v10006-010-0024-4 ing, sensor fusion, and machine learning.
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C.J.C., Bottou, L., Weinberger, K.Q. (eds.) Advances in Neural is working in IEK-5, Institute of Photovoltaics at Forschungszentrum
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Associates Inc, New York (2012) dimensional data analysis and statistical modeling for physics.
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niques. Math. Oper. Res. 6(1), 19–30 (1981). https://doi.org/10.
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86. Sovetkin, E., Steland, A.: Automatic processing and solar cell from the Georg-August University of Göttingen, Germany. He held
detection in photovoltaic electroluminescence images. Integr. positions as an assistant at the Technical University of Berlin, Berlin,
Comput. Aided Eng. 26(2), 123–137 (2019). https://doi.org/10. Germany, as a consultant in industry, as a postdoc at the European
3233/ICA-180588 University Viadrina of Frankfurt/Oder, Germany, and as a lecturer at
87. Spataru, S., Hacke, P., Sera, D.: Automatic detection and evalua- the Faculty of Mathematics at the Ruhr-University Bochum. Since
tion of solar cell micro-cracks in electroluminescence images using 2006, he is Full Professor at RWTH Aachen University, Germany,
matched filters. In: 2016 IEEE 43rd Photovoltaic Specialists Con- where he holds the Chair of Stochastics at the Institute of Statis-
ference (PVSC), pp. 1602–1607 (2016). https://doi.org/10.1109/ tics. He is an Elected Member of the International Statistical Insti-
PVSC.2016.7749891 tute (ISI), acts as the speaker of the Society for Reliability, Quality
88. Spertino, F., Ciocia, A., Leo, P.D., Tommasini, R., Berardone, I., and Safety, and chairs the Section on Statistics in Natural Sciences
Corrado, M., Infuso, A., Paggi, M.: A power and energy procedure and Technology of the German Statistical Society (DStatG). He orga-
in operating photovoltaic systems to quantify the losses according nized and co-organized several international workshops and invited
to the causes. Sol. Energy 118, 313–326 (2015). https://doi.org/10. sessions, edited several proceedings and special journal issues, and
1016/j.solener.2015.05.033 serves the community as associate editor. His current research interests
89. Stromer, D., Vetter, A., Oezkan, H.C., Probst, C., Maier, A.: are in nonparametric statistics and high-dimensional inference, statis-
Enhanced crack segmentation (eCS): a reference algorithm for seg- tical and machine learning, neural networks, change-point detection
menting cracks in multicrystalline silicon solar cells. IEEE J. Pho- and sequential analysis, image processing, and applications in photo-
tovolt. 9(3), 752–758 (2019). https://doi.org/10.1109/JPHOTOV. voltaics, quality control and econometrics.
2019.2895808
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Andreas Maier received his Ph.D. in 2009. From 2005 to 2009, he Christian Riess received the Ph.D. degree in computer science from
was working at the Pattern Recognition Lab at the Computer Sci- the Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlan-
ence Department of the University of Erlangen-Nuremberg. His major gen, Germany, in 2012. From 2013 to 2015, he was a Postdoc at
research subject was medical signal processing in speech data. From the Radiological Sciences Laboratory, Stanford University, Stanford,
2009 to 2010, he started working on flat-panel C-arm CT as post- CA, USA. Since 2015, he is the head of the Phase-Contrast X-ray
doctoral fellow at the Radiological Sciences Laboratory in the Depart- Group at the Pattern Recognition Laboratory at FAU. Since 2016, he is
ment of Radiology at the Stanford University. From 2011 to 2012, senior researcher and head of the Multimedia Security Group at the IT
he joined Siemens Healthcare as innovation project manager and was Infrastructures Lab at FAU, and he received his habilitation from FAU
responsible for reconstruction topics in the Angiography and X-ray in 2020. He served on the IEEE Information Forensics and Security
Business Unit. In 2012, he returned the University of Erlangen- Technical Committee 2017-2019 and received the IEEE Signal Pro-
Nuremberg as head of the Medical Reconstruction Group at the Pat- cessing Award in 2017. His research interests include all aspects of
tern Recognition Lab. In 2015, he became professor and head of the image processing and imaging, particularly with applications in image
Pattern Recognition Lab. and video forensics, X-ray phase contrast, and computer vision.
123