"Security refresh: prevent malicious wear-out and increase durability for ..."

Nak Hee Seong, Dong Hyuk Woo, Hsien-Hsin S. Lee (2010)

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DOI: 10.1145/1815961.1816014

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Nak Hee Seong, Dong Hyuk Woo, Hsien-Hsin S. Lee:
Security refresh: prevent malicious wear-out and increase durability for phase-change memory with dynamically randomized address mapping. ISCA 2010: 383-394

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