rn遍历map

时间: 2025-05-20 22:34:26 AIGC 浏览: 16
### 如何在 React Native 中遍历 Map 数据结构 在 JavaScript 中,`Map` 是一种键值对集合的数据结构。它允许任何类型的键和值,并提供了多种方法用于操作其内容。以下是几种常见的遍历 `Map` 的方式及其对应的代码示例。 #### 使用 `for...of` 循环遍历 `for...of` 可以直接迭代 `Map` 的 `[key, value]` 对。这是最简单直观的方式之一。 ```javascript const myMap = new Map([ ['name', 'John'], ['age', 30], ['city', 'New York'] ]); function iterateWithForOf(map) { for (let [key, value] of map) { console.log(`${key}: ${value}`); } } iterateWithForOf(myMap); ``` 此方法适用于需要逐项处理键值的情况[^1]。 --- #### 使用 `forEach` 方法遍历 `Map.prototype.forEach` 提供了一种函数式的遍历方式,适合于不需要中断循环的操作场景。 ```javascript myMap.forEach((value, key) => { console.log(`${key} -> ${value}`); }); ``` 这种方法更加简洁,尤其当只需要执行简单的回调逻辑时非常有用[^2]。 --- #### 转换为数组并使用高阶函数 如果希望利用更强大的数组操作方法(如 `map`, `filter`, 或 `reduce`),可以先将 `Map` 转换为数组形式: ```javascript Array.from(myMap).forEach(([key, value]) => { console.log(`Key: ${key}, Value: ${value}`); }); // 或者结合其他高阶函数 const keys = Array.from(myMap.keys()); console.log('Keys:', keys); const values = Array.from(myMap.values()); console.log('Values:', values); ``` 这种方式特别灵活,尤其是在复杂数据转换需求下显得尤为重要[^3]。 --- #### 性能注意事项 虽然以上三种方法都可以有效完成任务,在大规模数据集上的表现可能略有差异。通常情况下,`for...of` 和 `forEach` 的性能接近;但如果涉及复杂的中间计算,则推荐优先考虑基于数组的方法配合缓存策略优化性能[^4]。 ```javascript // 示例:过滤年龄大于等于30岁的条目 const filteredEntries = Array.from(myMap.entries()).filter(([_, age]) => age >= 30); filteredEntries.forEach(([key, value]) => { console.log(`Filtered Entry: ${key}:${value}`); }); ``` --- ### 结论 无论采用哪种方式实现 `Map` 遍历,都应依据具体业务需求权衡可读性与效率之间的关系。对于大多数日常应用场景而言,上述任一方案均能满足实际开发所需。
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DEVICE.SUMMARY.TAB_FILTER with tlist as( select nvl(c.device_name,a.cell_name) as item, b.vt_type || ' ' || nvl(c.para,a.test_item) as parameterStr from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA a join YES_USER.T_WAP_DOE_INFO b on a.item = b.item and a.cell_name = b.cellname and b.delete_status = 0 left join IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG c on a.item = c.item and a.cell_name = c.cellname and a.test_item = c.test_item left join YES_USER.T_WAP_TARGET_INFO d on b.item = d.item and a.cell_name = d.cellname and d.delete_status = 0 and b.vdd = d.vdd and b.TEMPERATURE = d.TEMPERATURE and a.test_item = d.CONFIG_KEY and d.config_type = 'targetConfig' where a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1 ? ? ? ? ? ? ? ? ? ? ? ? ? ) SELECT distinct item,parameterStr from tlist where 1=1 ? DEVICE.SUMMARY.SPLIT_TAB_FILTER select loopName,stepName from( select loop_name as loopName, step_name as stepName from TDWB_T_PLM_DEVICE_SPLIT_TAB_CONFIG where 1=1 ? ? group by loop_name,step_name ) limit 100 DEVICE.DOE.SELECT_DATA_LIST select distinct ? as ? from YES_USER.T_WAP_DOE_INFO where delete_status = 0 and item = ? ? limit 100 DEVICE.TARGET.SELECT_DATA_LIST select distinct ? as ? from YES_USER.T_WAP_TARGET_INFO where delete_status = 0 and ITEM = ? ? limit 100 DEVICE.SUMMARY.MAP_ANALYSIS select b.vt_type as vtType, b.channel_type as channelType, a.source_lot as lotId, a.wafer_id as waferId, a.die_x as dieX, a.die_y as dieY, a.raw_value as rawValue from YES_USER.T_WAP_RAW_DATA_PARSING a join YES_USER.T_WAP_DOE_INFO b on a.item = b.item and a.cell_name = b.cellname and b.delete_status = 0 where a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1 and upper(a.test_item) = 'VTSAT' ? ? ? ? ? ? ? ? ? ? ? ? ? DEVICE.SUMMARY.SPLIT_TAB select loop_name as loopName, step_name as stepName, lot_id as lotId, wafer_id as waferId, config_value as configValue, null as targetValue from TDWB_T_PLM_DEVICE_SPLIT_TAB_CONFIG where lot_id in (?) and wafer_id in (?) DEVICE.SUMMARY.DASHBOARD select nvl(c.device_name,a.cell_name) as item, b.vt_type || ' ' || nvl(c.para,a.test_item) as parameterStr, a.source_lot as lotId, a.wafer_id as waferId, a.CONVERT_FILTER_MEDIAN as rawMedian, b.vt_type as vt, d.config_value as target, case when (upper(a.test_item) in ('VTSAT')) then 1 else 0 end as degFlag from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA a join YES_USER.T_WAP_DOE_INFO b on a.item = b.item and a.cell_name = b.cellname and b.delete_status = 0 left join IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG c on a.item = c.item and a.cell_name = c.cellname and a.test_item = c.test_item left join YES_USER.T_WAP_TARGET_INFO d on b.item = d.item and a.cell_name = d.cellname and d.delete_status = 0 and b.vdd = d.vdd and b.TEMPERATURE = d.TEMPERATURE and a.test_item = d.CONFIG_KEY and d.config_type = 'targetConfig' where a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1 ? ? ? ? ? ? ? ? ? ? ? ? ? DEVICE.SUMMARY.FABS SELECT fab, recipeId, testItem FROM ( SELECT fab AS fab, TEST_RECIPE AS recipeId, test_item AS testItem FROM YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA WHERE LOT_METROLOGY_END_TIME BETWEEN to_date('?', 'YYYY/MM/DD') AND to_date('?', 'YYYY/MM/DD') + 1 GROUP BY fab , TEST_RECIPE, test_item ) DEVICE.SUMMARY.VTSAT_ANALYSIS SELECT a.lot_id AS lotId, a.WAFER_ID AS waferId, CASE WHEN b.channel_type = 'P' THEN a.CONVERT_FILTER_MEDIAN END AS pVtsatY, CASE WHEN b.channel_type = 'N' THEN a.CONVERT_FILTER_MEDIAN END AS nVtsatX from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA a join YES_USER.T_WAP_DOE_INFO b on a.item = b.item and a.cell_name = b.cellname and b.delete_status = 0 left join IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG c on a.item = c.item and a.cell_name = c.cellname and a.test_item = c.test_item left join YES_USER.T_WAP_TARGET_INFO d on b.item = d.item and a.cell_name = d.cellname and d.delete_status = 0 and b.vdd = d.vdd and b.TEMPERATURE = d.TEMPERATURE and a.test_item = d.CONFIG_KEY and d.config_type = 'targetConfig' WHERE a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1 and upper(a.test_item) = 'VTSAT' ? ? ? ? ? ? ? ? ? ? ? ? ? DEVICE.DOE.IMPORT_PAGE select project, createDate, operator, updateTime, qty from ( select item as project, CREATE_TIME as createDate, create_user as operator, update_time as updateTime, update_user as updataUser, row_number() over(partition by item order by CREATE_TIME asc) rn , count(1) over(partition by item) as qty from YES_USER.T_WAP_DOE_INFO where delete_status=0) where rn=1 DEVICE.TARGET.IMPORT_PAGE SELECT project, createDate, operator, updateTime, qty FROM ( SELECT item AS project, CREATE_TIME AS createDate, create_user AS createUser, update_time AS updateTime, update_user AS operator, ROW_NUMBER() OVER(PARTITION BY item ORDER BY CREATE_TIME ASC) rn , count(1) OVER(PARTITION BY item) AS qty FROM YES_USER.T_WAP_TARGET_INFO WHERE delete_status = 0) WHERE rn = 1 DEVICE.DEVICE_NAME.SELECT_DATA_LIST select distinct ? as ? from IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG where delete_status = 0 and ITEM = ? ? limit 100 DEVICE.DEVICE_NAME.IMPORT_PAGE SELECT project, createDate, operator, updateTime, qty FROM ( SELECT item AS project, CREATE_DATE AS createDate, CREATE_BY AS createUser, LAST_UPDATE_DATE AS updateTime, LAST_UPDATE_BY AS operator, ROW_NUMBER() OVER(PARTITION BY item ORDER BY CREATE_DATE ASC) rn , count(1) OVER(PARTITION BY item) AS qty FROM IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG WHERE delete_status = 0) WHERE rn = 1 DEVICE.TREND_CHART SELECT a.ID AS id, a.ITEM AS item, a.DEPARTMENT AS department, a.TEST_LAYER AS testLayer, a.SOURCE_LOT AS sourceLot, a.LOT_ID AS lotId, a.WAFER_ID AS waferId, '#'||substr(a.WAFER_ID,-2,2) as waferNum, a.SLOT_ID AS slotId, a.TEST_RECIPE AS testRecipe, a.CELL_NAME AS cellName, a.TEST_ITEM AS testItem, a.PARAMETER_NAME AS parameterName, a.SITE AS site, a.DIE_X AS dieX, a.DIE_Y AS dieY, a.POS AS pos, a.RAW_VALUE AS rawValue, a.CONVERT_VALUE AS convertValue, a.FILTER_FLAG AS filterFlag, a.TARGET_DUT AS targetDut, a.DOE_DUT AS doeDut, a.LOT_METROLOGY_START_TIME AS lotMetrologyStartTime, a.LOT_METROLOGY_END_TIME AS lotMetrologyEndTime, a.CREATE_TIME AS createTime, a.UPDATE_TIME AS updateTime, b.channel_type as channelType, b.nfin as nfin, b.tsk_metal as tskMetal, b.cell_type as cellType, b.cellname as cellName, b.vt_type as vt, b.CHANNEL_LENGTH AS lg, d.CONFIG_VALUE AS target FROM YES_USER.T_WAP_RAW_DATA_PARSING a JOIN YES_USER.T_WAP_DOE_INFO b ON a.item = b.item AND a.cell_name = b.cellname left join YES_USER.T_WAP_TARGET_INFO d on b.item = d.item and a.cell_name = d.cellname and b.vdd = d.vdd and b.TEMPERATURE = d.TEMPERATURE and a.test_item = d.CONFIG_KEY and d.config_type = 'targetConfig' --targetȱһ¸ö²ⁿϮ where a.LOT_METROLOGY_END_TIME between to_date('?','YYYY/MM/DD') and to_date('?','YYYY/MM/DD') +1 DEVICE.TREND_CHART.DEFAULT_PROJECT select projectName from ( select item as projectName, row_number() over( order by create_time desc ) rn from YES_USER.T_WAP_DOE_INFO ) where rn = 1 limit 1 DEVICE.TREND_CHART.PROJECT_LIST select item as projectName from YES_USER.T_WAP_DOE_INFO where 1=1 ? group by item DEVICE.TREND_CHART_RAW_FILTER_LIST select fab as fab,TEST_RECIPE as recipeId,test_item as testItem from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA where 1=1 ? group by fab ,TEST_RECIPE,test_item DEVICE.SUMMARY.BOX_PLOT_ANALYSIS select b.vt_type as vtType, b.channel_type as channelType, a.source_lot as lotId, a.wafer_id as waferId, a.die_x as dieX, a.die_y as dieY, a.raw_value as rawValue from YES_USER.T_WAP_RAW_DATA_PARSING a join YES_USER.T_WAP_DOE_INFO b on a.item = b.item and a.cell_name = b.cellname and b.delete_status = 0 where a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1 and upper(a.test_item) = 'VTSAT' ? ? ? ? ? ? ? ? ? ? ? ? ? DEVICE.TREND_CHART.FILTER_LIST select channel_type as channelType, nFin as nFin, tsk_metal AS metal, cell_type as bitCellType, cellname as cellName, vt_type as vt, item as project from YES_USER.T_WAP_DOE_INFO where 1=1 ? GROUP BY channel_type ,nFin ,tsk_metal ,cell_type ,cellname ,vt_type ,item DEVICE.TREND_CHART.LOT_OR_WAFER select lotId,waferId from ( select source_lot as lotId ,wafer_id as waferId from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA group by source_lot,wafer_id ) where 1=1 ? ? DEVICE.DETAIL_TARGET_DATA SELECT * FROM ( SELECT ID AS id, ITEM AS item, DEPARTMENT AS department, TARGET_DUT AS targetDut, CONFIG_TYPE AS configType, CONFIG_KEY AS configKey, --test_item CONFIG_VALUE AS configValue, TARGET_FILE_NAME AS targetFileName, CREATE_TIME AS createTime, UPDATE_TIME AS updateTime, CREATE_USER AS createUser, UPDATE_USER AS updateUser, CELLNAME AS cellName, TEMPERATURE AS temperature, VDD AS vdd, DELETE_STATUS AS deleteStatus FROM YES_USER.T_WAP_TARGET_INFO WHERE DELETE_STATUS = 0 ) WHERE 1=1 DEVICE.DETAIL_RAW_DATA select * from ( SELECT a.ID AS id, a.ITEM AS item, a.DEPARTMENT AS department, a.TEST_LAYER AS testLayer, a.SOURCE_LOT AS sourceLot, a.LOT_ID AS lotId, a.WAFER_ID AS waferId, '#'||substr(a.WAFER_ID,-2,2) as waferNum, a.SLOT_ID AS slotId, a.TEST_RECIPE AS testRecipe, a.CELL_NAME AS cellName, a.TEST_ITEM AS testItem, a.PARAMETER_NAME AS parameterName, a.SITE AS site, a.DIE_X AS dieX, a.DIE_Y AS dieY, a.POS AS pos, a.RAW_VALUE AS rawValue, a.CONVERT_VALUE AS convertValue, a.FILTER_FLAG AS filterFlag, a.TARGET_DUT AS targetDut, a.DOE_DUT AS doeDut, a.LOT_METROLOGY_START_TIME AS lotMetrologyStartTime, a.LOT_METROLOGY_END_TIME AS lotMetrologyEndTime, a.CREATE_TIME AS createTime, a.UPDATE_TIME AS updateTime, a.UPDATE_TIME AS updateTime, a.FAB AS fab, b.channel_type as channelType, b.nfin as nfin, b.tsk_metal as tskMetal, b.cell_type as cellType, b.cellname as cellName, b.vt_type as vt FROM YES_USER.T_WAP_RAW_DATA_PARSING a JOIN YES_USER.T_WAP_DOE_INFO b ON a.item = b.item AND a.cell_name = b.cellname AND a.FAB = b.FAB ) WHERE 1=1 DEVICE.DETAIL_DOE_DATA SELECT * FROM ( SELECT b.ID AS id, b.DEPARTMENT AS department, b.ITEM AS item, b.TSK_METAL AS tskMetal, b.CELL_TYPE AS cellType, b.CHANNEL_TYPE AS channelType, b.VT_TYPE AS vtType, b.NFIN AS nfin, b.CHANNEL_LENGTH AS channelLength, b.POLY_PITCH AS polyPitch, b.VDD AS vdd, b.TEMPERATURE AS temperature, b.WITH_DNW AS withDnw, b.BLOCK_NUM AS blockNum, b.DECOUPLE AS decouple, b.TSK_NAME AS tskName, b.FINGER_TYPE AS fingerType, b.DIFFUSION_BREAK AS diffusionBreak, b.STAGE AS stage, b.DIVIDER AS divider, b.M0WIDTH AS m0Width, b.AA AS aa, b.M0GWIDTH AS m0gWidth, b.M0GLENGTH AS m0gLength, b.HIR_LENGTH AS hirLength, b.V0WIDTH AS v0Width, b.V0LENGTH AS v0Length, b.MEASUREMENT AS measurement, b.TYPE_NAME AS typeName, b.FLAG AS flag, b.HIR_WIDTH AS hirWidth, b.CELLNAME AS cellName, b.DOE_DUT AS doeDut, b.TARGET_DUT AS targetDut, b.DOE_FILE_NAME AS doeFileName, b.CREATE_TIME AS createTime, b.UPDATE_TIME AS updateTime, b.CREATE_USER AS createUser, b.UPDATE_USER AS updateUser, b.FAB AS fab FROM YES_USER.T_WAP_DOE_INFO b WHERE b.DELETE_STATUS = 0 ) WHERE 1=1

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