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KGD (Known Good Die) testing is a crucial quality control step for SiC devices, offering major advantages but also unique challenges. The process involves three main categories of tests to identify and screen out potential defects: ➡️ Static Testing ➡️ Dynamic Testing ➡️ Short Circuit Testing The implementation of these tests with a one-stop, integrated machine is key for manufacturers to boost the efficiency and effectiveness of their SiC KGD strategy. Learn more about building a comprehensive KGD testing strategy here: https://lnkd.in/dxxzKUDZ #IngegnoItalico 💡 #SPEA #Testing

Chris Wu

Hiwin Mikrosystem 大銀微系統股份有限公司 deputy manager

2mo

Thanks for sharing, Daniele

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