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XPRT Msam PDH Sonet Testingmanual

Testing manual

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0% found this document useful (0 votes)

128 views292 pages

XPRT Msam PDH Sonet Testingmanual

Testing manual

Uploaded by

Shivbraham Singh Rajawat

We take content rights seriously. If you suspect this is your content, claim it here.

Available Formats

Download as PDF, TXT or read online on Scribd

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T-BERD MTS 8000 and T-BERD MTS 6000A

Transport Module, 40/100G Transport Module, and

Multiple Services Application Module
PDH, SONET, SDH, NextGen, and OTN Testing Manual

T-BERD MTS 8000 and T-BERD MTS 6000A

Transport Module, 40/100G Transport Module,
and Multiple Services Application Module
PDH, SONET, SDH, NextGen, and OTN Testing Manual

Communications Test and Measurement Solutions

One Milestone Center Court
Germantown, Maryland 20876-7100 USA
Toll Free 1-855-ASK-JDSU Tel +1-240-404-2999 Fax +1-240-404-2195
www.jdsu.com

Notice

Every effort was made to ensure that the information in this manual was accurate at the time of printing. However, information is subject to change without
notice, and JDS Uniphase reserves the right to provide an addendum to this
manual with information not available at the time that this manual was created.

Copyright 2012 JDS Uniphase Corporation. All rights reserved. JDSU, Communications Test and Measurement Solutions, and its logo are trademarks of
JDS Uniphase Corporation (JDS Uniphase). All other trademarks and registered trademarks are the property of their respective owners. No part of this
guide may be reproduced or transmitted electronically or otherwise without
written permission of the publisher.

Reproduction and distribution of this guide is authorized for Government purposes only.

Trademarks

JDS Uniphase, JDSU, MTS 6000A, T-BERD 6000A, MTS 8000, and
T-BERD 6000A are trademarks or registered trademarks of JDS Uniphase in
the United States and/or other countries.
Wireshark is a registered trademark of the Wireshark Foundation.
All trademarks and registered trademarks are the property of their respective
companies.

Terms and conditions

Specifications, terms, and conditions are subject to change without notice. The
provision of hardware, services, and/or software are subject to JDSUs standard terms and conditions, available at www.jdsu.com/terms.

FCC Notice

This equipment has been tested and found to comply with the limits for a Class
A digital device, pursuant to Part 15 of the FCC Rules. These limits are
designed to provide reasonable protection against harmful interference when
the equipment is operated in a commercial environment. This equipment generates, uses, and can radiate radio frequency energy and, if not installed and
used in accordance with the instruction manual, may cause harmful interference to radio communications. Operation of this equipment in a residential
area is likely to cause harmful interference in which case the user will be
required to correct the interference at their own expense.

Ordering information

The catalog number for a printed getting started manual is ML-21138652. The
catalog number for a printed testing manual is ML-21148871. The catalog number for electronic manuals on USB is CEML-21138299.

WEEE and Battery Directive

Compliance

JDSU has established processes in compliance with the Waste Electrical and
Electronic Equipment (WEEE) Directive, 2002/96/EC, and the Battery Directive, 2006/66/EC.
This product, and the batteries used to power the product, should not be disposed of as unsorted municipal waste and should be collected separately and
disposed of according to your national regulations. In the European Union, all
equipment and batteries purchased from JDSU after 2005-08-13 can be
returned for disposal at the end of its useful life. JDSU will ensure that all waste
equipment and batteries returned are reused, recycled, or disposed of in an
environmentally friendly manner, and in compliance with all applicable national
and international waste legislation.

PDH, SONET, SDH, NextGen, and OTN Testing Manual

It is the responsibility of the equipment owner to return equipment and batteries

to JDSU for appropriate disposal. If the equipment or battery was imported by
a reseller whose name or logo is marked on the equipment or battery, then the
owner should return the equipment or battery directly to the reseller.
Instructions for returning waste equipment and batteries to JDSU can be found
in the Environmental section of JDSUs web site at www.jdsu.com. If you have
questions concerning disposal of your equipment or batteries, contact JDSUs
WEEE Program Management team at [email protected].

PDH, SONET, SDH, NextGen, and OTN Testing Manual

iii

PDH, SONET, SDH, NextGen, and OTN Testing Manual

Contents

About this Manual

xiii
Assumptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xiv
Terminology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xiv
PDH, SONET, SDH, NextGen, and OTN Testing Manual . . . . . . . . . . . . . xvi
Conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xvii
Safety and compliance information . . . . . . . . . . . . . . . . . . . . . . . . . . . . xviii
Technical assistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xviii

Chapter 1

Chapter 2

Basic Testing

Step 2: Configuring a test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Step 3: Connecting the instrument to the circuit . . . . . . . . . . . . . . . . . . .
Step 4: Starting the test. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Step 5: Viewing test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Setting the result group and category . . . . . . . . . . . . . . . . . . . . . . . . . . .
Additional test result information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Running multiple tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

2
3
4
4
4
5
5

T-Carrier and PDH Testing

Features and capabilities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

Understanding the LED panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Understanding the graphical user interface. . . . . . . . . . . . . . . . . . . . . . . 9
Understanding T-Carrier and PDH test results . . . . . . . . . . . . . . . . . . . . 9
T-Carrier test applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
PDH test applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Fractional T1 testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11
Loopback testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11
Looping up MUX devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Defining custom loop codes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Verifying performance. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Measuring round trip delay. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17

PDH, SONET, SDH, NextGen, and OTN Testing Manual

Contents

Chapter 3

Measuring service disruption time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Monitoring the circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Analyzing PCM signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Test modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Trunk type signaling. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Standard E & M signaling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Loop start signaling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Ground start signaling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Connecting a headset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifying call settings. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Monitoring a call. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Placing or receiving calls . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Observing call results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Analyzing VF circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
VF tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Quiet tone test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Holding tone test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Three tone test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Single tone test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Frequency sweep test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Impulse noise test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
User-defined signaling bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Running VF analysis tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Observing VF results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
ISDN PRI testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Features and capabilities. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifying General settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifying Call settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifying Decode filter settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Placing calls. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Receiving calls. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Inserting voice traffic into a call . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Performing BER analysis of a call . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Transmitting DTMF tones . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Disconnecting a call. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Observing ISDN PRI results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

18
20
20
21
21
21
21
23
24
24
25
26
27
27
28
28
28
28
28
28
29
29
29
32
32
33
33
35
37
37
38
39
40
41
41
41

SONET and SDH Testing

Features and capabilities. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Understanding the LED panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Understanding the graphical user interface . . . . . . . . . . . . . . . . . . . . . .
Understanding SONET and SDH test results . . . . . . . . . . . . . . . . . . . .
SONET and SDH test modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SONET test applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SDH test applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STM-1e test applications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STM-1 test applications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STM-4 test applications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STM-16 test applications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STM-64 test applications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STM-256 test applications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Measuring optical power . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Running J-Scan . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Displaying a map of the signal structure . . . . . . . . . . . . . . . . . . . . . . . .
Sorting the channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

44
45
45
45
46
46
49
50
52
54
55
57
58
59
60
60
61

PDH, SONET, SDH, NextGen, and OTN Testing Manual

Contents

Chapter 4

Scanning the map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Testing a channel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Using Restart to reset the status . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Understanding J-Scan results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Re-scanning the circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
BER testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifying a BERT pattern . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Running a BER test. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Detecting the received BER pattern . . . . . . . . . . . . . . . . . . . . . . . . . . .
Drop and insert testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Inserting errors, anomalies, alarms, and defects . . . . . . . . . . . . . . . . . .
Inserting errors or anomalies. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Inserting alarms or defects . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Measuring round trip delay. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Measuring service disruption time . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Viewing a TOH group. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Manipulating overhead bytes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Capturing POH bytes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifying the J0 or J1 identifier . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Inserting the C2 Path signal label . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Manipulating K1 or K2 APS bytes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Manipulating the S1 byte . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Adjusting pointers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Adjusting pointers manually . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Adjusting pointers using pointer stress sequences . . . . . . . . . . . . . . . .
Verifying performance. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Monitoring the circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

61
62
63
63
63
63
63
64
65
66
68
69
69
70
71
72
73
74
75
77
79
80
81
81
82
84
85

Jitter and Wander Testing

Features and capabilities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88

Understanding the graphical user interface. . . . . . . . . . . . . . . . . . . . . . 89
Accessing jitter and wander test results . . . . . . . . . . . . . . . . . . . . . . . . 89
Jitter and wander test applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
Before testing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
Transmitting jitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
Manually measuring jitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
Automatic Measurement Sequences . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96
Measuring jitter tolerance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96
Measuring the jitter transfer function . . . . . . . . . . . . . . . . . . . . . . . . . . 101
Transmitting wander . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103
Measuring and analyzing wander . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104
Measuring TIE and calculating MTIE . . . . . . . . . . . . . . . . . . . . . . . . . 104
Analyzing wander . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105
Saving and exporting wander measurement data. . . . . . . . . . . . . . . . 108
1PPS Analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109

PDH, SONET, SDH, NextGen, and OTN Testing Manual

vii

Contents

Chapter 5

viii

NextGen Testing

113

Features and capabilities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Using LEDs as a guide when testing . . . . . . . . . . . . . . . . . . . . . . . . . . .
Test 1: SONET/SDH physical layer . . . . . . . . . . . . . . . . . . . . . . . .
Test 2: VCAT verification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Test 3: LCAS verification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Test 4: BER analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Test 5: GFP and Ethernet analysis . . . . . . . . . . . . . . . . . . . . . . . .
About the NextGen user interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Understanding the LED panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
BERT LEDs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
GFP LEDs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Understanding the graphical user interface . . . . . . . . . . . . . . . . . . . . .
Create VCG quick configuration button. . . . . . . . . . . . . . . . . . . . .
Edit VCG quick configuration button . . . . . . . . . . . . . . . . . . . . . . .
Rx VCG Member Selection field . . . . . . . . . . . . . . . . . . . . . . . . . .
Enable LCAS. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Add All buttons . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Signal Structure tab . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LED Panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
VCG Member Selection for Error Insertion . . . . . . . . . . . . . . . . . .
VCG Analysis soft key. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Understanding the NextGen test results . . . . . . . . . . . . . . . . . . . . . . .
About the NextGen test modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Monitor mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Terminate mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
NextGen SONET applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OC-3 applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OC-12 applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OC-48 applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OC-192 applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
NextGen SDH test applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STM-1 test applications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STM-4 test applications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STM-16 test applications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STM-64 test applications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Configuring NextGen tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Running classic SONET/SDH tests . . . . . . . . . . . . . . . . . . . . . . . . . . . .
VCG testing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Creating a VCG for analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifying VCG settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Adding or deleting VCG members . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Inserting SONET or SDH errors and alarms . . . . . . . . . . . . . . . . . . . .
Analyzing a VCG . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Manipulating overhead bytes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LCAS testing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Enabling LCAS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Monitoring the LCAS MST status for VCG members . . . . . . . . . . . . .
Adding or removing members . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
BER testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
GFP testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifying GFP settings. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifying Ethernet and IP settings . . . . . . . . . . . . . . . . . . . . . . . . . . .
Transmitting and analyzing GFP traffic . . . . . . . . . . . . . . . . . . . . . . . .
Inserting GFP errors or alarms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

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Chapter 6

Chapter 7

Monitoring NextGen circuits. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Monitoring the circuit for BERT errors . . . . . . . . . . . . . . . . . . . . . . . . .
Monitoring a circuit carrying GFP traffic . . . . . . . . . . . . . . . . . . . . . . .
Capturing POH bytes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

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147
148

OTN Testing

149

Features and capabilities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Understanding the LED panel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Understanding the graphical user interface. . . . . . . . . . . . . . . . . . . . .
Understanding OTN test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OTN test applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifying the Tx clock source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifying channels or timeslots. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
BER testing layer 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Configuring 1 GigE, 10 GigE, 100 GigE LAN traffic . . . . . . . . . . . . . . .
Configuring OTN with SONET or SDH Clients . . . . . . . . . . . . . . . . . . .
Measuring optical power. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Inserting errors, anomalies, alarms, and defects . . . . . . . . . . . . . . . . .
Inserting errors or anomalies. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Inserting alarms or defects . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Observing and manipulating overhead bytes. . . . . . . . . . . . . . . . . . . .
Scrambling the signal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
FEC testing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
GMP Mapping. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
GFP Mapping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifying SM, PM, and TCM trace identifiers . . . . . . . . . . . . . . . . . . .
Specifying the transmitted and expected payload type. . . . . . . . . . . .
BER testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Measuring service disruption time . . . . . . . . . . . . . . . . . . . . . . . . . . . .

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158
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160
160
161
161
163
163
164
165
166
170
171
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Test Results

175

Summary Status results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

T-Carrier and PDH results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LEDs (TestPad mode) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LEDs (ANT mode) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Interface test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Frame test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
BERT test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Channel test results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Traffic test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
ISDN test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stats . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Call states . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
VF results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SONET/SDH results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SONET and SDH LEDs (TestPad mode) . . . . . . . . . . . . . . . . . . . . . .
......................................................
SONET and SDH LEDs (ANT mode) . . . . . . . . . . . . . . . . . . . . . . . . .
CFP Auto-FIFO Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Interface test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STL Stat results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

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STL Per Lane results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Section/RSOH test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Line/MSOH test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Path/HP test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LP/VT test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Payload BERT test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Service Disruption Results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SD Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SD Details . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SD Statistics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
TCM test results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
T1.231 test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
ITU-T recommended performance test results . . . . . . . . . . . . . . . . . . .
HP, LP, RS, MS, ISM, and OOS designations . . . . . . . . . . . . . . . . . . .
NE and FE designations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Performance result descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Jitter results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
HB, WB, Ext Band, and User-band designations . . . . . . . . . . . . . . . .
Jitter results, Summary group . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Jitter results, Interface group. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Graphical and Tabular jitter results . . . . . . . . . . . . . . . . . . . . . . . . . . .
Jitter Graph . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MTJ Graph and Table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
JTF Graph . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Wander results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1PPS Analysis Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
NextGen results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Common NextGen results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
NextGen LEDs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
VCAT LEDs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LCAS LEDs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
GFP LEDs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
VCAT results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LCAS results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Member Status . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Errors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Group . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
GFP results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Error Stats . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Rx Traffic . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Tx Traffic . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OTN results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OTN LEDs (TestPad mode) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OTN LEDs (ANT mode). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Interface test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
FEC test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Framing test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OTL Stats results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OTL Per Lane results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OTU test results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
ODU test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
FTFL test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
TCM1 - TCM 6 test results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OPU results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
GMP results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
GFP-T results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

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Contents

Chapter 8

GFP results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Payload BERT results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Graphical results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Histogram results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Event Log results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Time test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

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Troubleshooting

237

Before testing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 238

The test application I need is not available. . . . . . . . . . . . . . . . . . 238
Can I hot-swap PIMs? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 238
How can I determine whether I need to swap a PIM or swap SFP transceivers? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 238
I am receiving unexpected errors when running optical applications .
238
Optical Overload Protection message . . . . . . . . . . . . . . . . . . . . . 239
User interface is not launching . . . . . . . . . . . . . . . . . . . . . . . . . . . 239
Inconsistent test results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 239
Result values are blank . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 239
Unit on far end will not loop up . . . . . . . . . . . . . . . . . . . . . . . . . . . 239
A receiving instrument is showing many bit errors . . . . . . . . . . . . 239
Which MSAM or application module is selected? . . . . . . . . . . . . . 240
VF testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 240
Voice frequency measurements are not available . . . . . . . . . . . . 240
Upgrades and options. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 240
How do I upgrade my instrument? . . . . . . . . . . . . . . . . . . . . . . . . 240
How do I install test options? . . . . . . . . . . . . . . . . . . . . . . . . . . . . 240
Do software and test options move with the MSAM or Transport Module? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 240

Appendix A

Principles of ISDN Testing

Understanding LAPD messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
LAPD Unnumbered frame messages . . . . . . . . . . . . . . . . . . . . . . . . .
LAPD Supervisory frame messages . . . . . . . . . . . . . . . . . . . . . . . . . .
Q.931 messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Understanding the Q.931 Cause Values . . . . . . . . . . . . . . . . . . . . . . . .

Appendix B

Principles of Jitter and Wander Testing

Jitter measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Intrinsic jitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output jitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Jitter over time. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Phase hits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Jitter tolerance. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
MTJ test sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Fast MTJ test sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Jitter Transfer Function (JTF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Test set calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
JTF measurement. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
About wander. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

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Wander measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Reference clock requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Wander over time. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
TIE and MTIE. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Time Deviation (TDEV) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Frequency offset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Drift rate. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

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252
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253
253
253
253

Glossary

255

Index

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About this Manual

This prefix explains how to use this manual. Topics discussed include the
following:
Purpose and scope on page xiv
Assumptions on page xiv
Terminology on page xiv
PDH, SONET, SDH, NextGen, and OTN Testing Manual on page xvi
Conventions on page xvii
Safety and compliance information on page xviii
Technical assistance on page xviii

PDH, SONET, SDH, NextGen, and OTN Testing Manual

xiii

About this Manual

Purpose and scope

The purpose of this manual is to help you successfully use the PDH, SONET,
NextGen, and OTN test capabilities of the MSAM and the Transport Module.

Assumptions
This manual is intended for novice, intermediate, and experienced users who
want to use the Transport Module or Multiple Services Application Module
effectively and efficiently. We are assuming that you have basic computer
experience and are familiar with basic telecommunication concepts, terminology, and safety.

Terminology
The T-BERD 8000 is branded as the MTS-8000 in Europe, and it is interchangeably referred to as the T-BERD 8000, MTS 8000, MTS-8000, MTS8000
and Media Test Set 8000 throughout supporting documentation.
The T-BERD 6000A is branded as the MTS-6000A in Europe, and it is interchangeably referred to as the T-BERD 6000A, MTS 6000A, MTS6000A and
Media Test Set 6000 throughout supporting documentation.
The following terms have a specific meaning when they are used in this
manual:
AssemblyUsed throughout this manual to refer to a complete set of
components assembled as an instrument and used for testing. This
manual supports three assemblies: The Transport Module assembly,
consisting of an T-BERD MTS 8000 base unit and Transport Module, the
MSAM assembly, consisting of a MSAM, Physical Interface Modules
(PIMs), and a T-BERD MTS 6000A base unit, and a DMC assembly,
consisting of up to two MSAMs, up to four PIMs, a Dual Module Carrier
(DMC), and a T-BERD MTS 8000 base unit.
Application moduleUsed throughout this manual to refer to the component that provides test functionality to the assembled instrument. This
manual supports two application modules: the Transport Module, and the
MSAM.
ComponentUsed throughout this manual to refer to an individual hardware component which is connected to the other components to build a
test instrument (assembly). This manual supports the following components: the Transport Module, the MSAM, and the DMC. The base units are
documented in separate manuals.
T-BERD MTS 8000 and T-BERD MTS 6000AThe family of products,
typically a combination of a base unit, a battery module, and one or more
application modules. The Dual Module Carrier (DMC) can be used on the
T-BERD / MTS 8000 platform to test using two MSAMs.
Base unitThe unit which connects to the application module and power
adapter, providing the user interface and a variety of connectivity and work
flow tools. If optioned to do so, the base unit also allows you to measure
emitted power, received power, and optical link loss on fiber optic
networks.

xiv

PDH, SONET, SDH, NextGen, and OTN Testing Manual

About this Manual

Terminology

DMCDual Module Carrier. The DMC is a two slot chassis which you can
connect to the T-BERD / MTS 8000 base unit to test using up to two
MSAM application modules and four Physical Interface Modules (PIMs).
MSAM Multiple Services Application ModuleReferred to generically
as the instrument when inserted in the T-BERD / MTS 6000A base unit or
the DMC with a PIM. The MSAM provides testing functionality for the base
unit.
PIMThe physical interface module inserted into one of up to two ports
provided on the MSAM chassis. PIMs supply the physical connectors
(interfaces) required to connect the MSAM to the circuit under test. A
variety of cables, SFPs, and XFPs are offered as options, and can used to
connect the PIMs to the circuit.
Transport ModuleReferred to generically as the instrument when
connected to the T-BERD / MTS 8000 base unit. The Transport Module
provides testing functionality for the base unit.
Battery ModuleThe module connected to the back of the T-BERD /
MTS 8000 base unit, which supplies power whenever it is not provided
using the power adapter.
OC-nUsed to refer to each of the optical SONET rates supported by the
instrument (OC-3, OC-12, OC-48, and OC-192), where n represents the
user-selected line rate.
STM-nUsed to refer to each of the optical SDH rates supported by the
instrument (STM-1, STM-4, STM-16, and STM-64), where n represents
the user-selected line rate.
STS-1Used to refer to the electrical equivalent of OC-1 (51.84 Mbps)
supported by the instrument.
STM-1eUsed to refer to the electrical equivalent of STM-1
(155.52 Mbps) supported by the MSAM.
OTNOptical Transport Network.
OTU1Optical Transport Unit 1. A 2.7G OTN signal designed to carry a
SONET OC-48 or SDH STM-16 client signal. OTU1 is used on the user
interface to identify the applications used for 2.7G OTN testing.
OTU2Optical Transport Unit 2. A 10.7G, 11.05G, or 11.1G OTN signal
designed to carry SONET OC-192, SDH STM-64, or 10GigE Ethernet
WAN and LAN client signals. OTU2 is used on the user interface to identify
the applications used for 10.7G, 11.05G, or 11.1G OTN testing.
OTU3 Optical transport Unit 3. A 43G OTN signal designed to carry
40Gig Bulk BERT payloads and ODU3 encoded signals. OTU3 is available
on the 40/100G High Speed Transport Module.
OTU4 Optical transport Unit 4. A 111.8G OTN signal designed to carry
100GigE Ethernet and Bulk BERT and ODU4 encoded signals. OTU4 is
available on the 40/100G High Speed Transport Module.
10/100/1000 EthernetUsed to represent 10/100/1000 Mbps Ethernet.
1GigEUsed to represent 1 Gigabit Ethernet.
10GigEUsed to represent 10 Gigabit Ethernet.
40GigEUsed to represent 40 Gigabit Ethernet.
100GigEUsed to represent 100 Gigabit Ethernet.
FCUsed to represent Fibre Channel.
JDSU Ethernet test setA test set marketed by JDSU and designed to
transmit an Acterna Test Packet (ATP) payload. ATP packets carry a time
stamp used to calculate a variety of test results. The FST-2802 TestPad,
the SmartClass Ethernet tester, the HST-3000 with an Ethernet SIM, the
PDH, SONET, SDH, NextGen, and OTN Testing Manual

About this Manual

PDH, SONET, SDH, NextGen, and OTN Testing Manual

T-BERD/MTS 8000 Transport Module, and the MSAM can all be configured to transmit and analyze ATP payloads, and can be used in
end-to-end and loopback configurations during testing.
SFPSmall form-factor pluggable module. Used throughout this manual
to represent pluggable optical modules.
XFP10 Gigabit small form-factor pluggable module. Used throughout
this manual to represent pluggable optical modules used to connect to the
family of 10 Gbps circuits (ranging from 9.95 Gbps to 11.3 Gbps).
QSFP+ 40Gigabit Quad Small Form-Factor Pluggable optical transceiver. A variety of optional QSFP+s are available for testing 40 Gigabit
fiber circuits.
CFP 100Gigabit Form-Factor Pluggable optical transceiver. A variety of
optional CFPs are available for testing 100Gigabit fiber circuits.
XvUsed as a suffix throughout the user interface for virtual channels
carried in a SONET or SDH container, where X serves as a placeholder for
the number of virtual channels, and v indicates that the concatenation is
virtual (rather than true concatenation). For example, if you are testing
virtual channels carried in a high order STS-3c, you would select an
STS-3c-Xv payload when you launched your application. You can then
specify the number of members (channels) when you create the virtual
channel group (VCG).

PDH, SONET, SDH, NextGen, and OTN Testing Manual

This is the PDH, SONET, SDH, NextGen, and OTN testing manual for the
MSAM and the Transport Module. The manual is application-oriented and
contains information about using these instruments to test service carried on
each of the listed networks. It includes an overview of testing features, instructions for using the instruments to generate and transmit traffic over a circuit,
and detailed test result descriptions. This manual also provides contact information for JDSUs Technical Assistance Center (TAC).
Use this manual in conjunction with the following manuals:
8000 Base Unit User Manual. This manual provides an overview, specifications, and instructions for proper operation of the base unit.
6000A Base Unit User Manual. This manual provides an overview, specifications, and instructions for proper operation of the base unit.
Dual Module Carrier, Transport Module, and MSAM Getting Started
Manual. This manual provides an overview of the connectors provided on
the hardware components, instructions for connecting to the circuit you are
testing, and specifications for the hardware components.
Ethernet, IP, TCP/UDP, Triple Play, Fibre Channel, and IP Video Testing
Manual. This manual provides instructions for testing each of the services
listed, and detailed test result descriptions. When using your instrument for
NextGen and OTN testing, details concerning Ethernet settings and test
results are provided in this manual.

xvi

PDH, SONET, SDH, NextGen, and OTN Testing Manual

About this Manual

Conventions

Remote Control Reference Manual. This manual provides the remote

control commands used when developing scripts to automate your testing.
This manual is provided electronically on jdsu.com.
NOTE:
Many applications also require you to purchase and install certain testing
options; others require specific hardware connectors to connect to circuits
for testing. For example, if your instrument does not have a connector or
PIM designed to support OC-3 testing, you can not transmit and analyze a
signal or traffic over an OC-3 circuit.
You can quickly determine whether or not your instrument supports certain
applications by exploring the technologies, rates, and test modes presented
on the Test menu and by reviewing the settings available when you configure a test.

Conventions
This manual uses conventions and symbols, as described in the following
tables.

Table 1

Typographical conventions

Description

Example

User interface actions and buttons or

switches you have to press appear in
this typeface.

Press the OK key.

Code and output messages appear in

this typeface.

All results okay

Text you must type exactly as shown

appears in this typeface.

Type: a:\set.exe in the dialog box.

Variables appear in this typeface.

Type the new hostname.

Book references appear in this typeface.

Refer to Newtons Telecom Dictionary

Table 2

Keyboard and menu conventions

Description

Example

A plus sign +indicates simultaneous

keystrokes.

Press Ctrl+s

A comma indicates consecutive key

strokes.

Press Alt+f,s

A slanted bracket indicates choosing a

submenu from menu.

On the menu bar, click

Start > Program Files.

Table 3

Symbol conventions

This symbol represents a general hazard.

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xvii

About this Manual

Safety and compliance information

This symbol represents a risk of electrical shock.

This symbol represents a risk of explosion.

This symbol represents a Note indicating related information or tip.

This symbol, located on the equipment, battery, or packaging indicates that

the equipment or battery must not be disposed of in a land-fill site or as
municipal waste, and should be disposed of according to your national regulations.

Safety and compliance information

Safety and compliance information for the instrument are provided in printed
form and ship with your instrument.

Technical assistance
Table 4 lists contact information for technical assistance. For the latest TAC
information, go to www.jdsu.com or contact your local sales office for assistance. Contact information for regional sales headquarters is listed on the back
cover of this manual.

Table 4

Technical assistance centers

Region

Phone Number

Americas

1-866-ACTERNA
(option #2)
301-353-1550

(1-866-228-3762, option #2)

[email protected]

Europe, Africa, and

Mid-East

+49 (0) 7121 86 1345

(JDSU Germany)

[email protected]

Asia and the Pacific

+852 2892 0990

(Hong Kong)
+86 10 6655 5988
(Beijing-China)

During off-hours, you can request assistance by doing one of the following:
leave a voice mail message at the Technical Assistance number, e-mail the
North American Technical Assistance Center, [email protected], or submit your
question using our online Technical Assistance Request form at
www.jdsu.com.

xviii

PDH, SONET, SDH, NextGen, and OTN Testing Manual

Chapter 1

Basic Testing

1
This chapter explains basic testing concepts and procedures common to each
PDH, SONET, SDH, NextGen, and OTN test. Detailed information about
concepts and procedures shared by all supported test applications are
provided in the Getting Started manual that shipped with your instrument or
upgrade.
Topics discussed in this chapter include the following:
Step 1: Selecting a test application on page 2
Step 2: Configuring a test on page 2
Step 3: Connecting the instrument to the circuit on page 3
Step 4: Starting the test on page 4
Step 5: Viewing test results on page 4
Running multiple tests on page 5

PDH, SONET, SDH, NextGen, and OTN Testing Manual

Chapter 1 Basic Testing

Step 1: Selecting a test application

The Test menu on the Main screen lists each of the available test applications.
If you are testing using an MSAM, the applications are listed for the PIM or
PIMs that are inserted in your MSAM chassis. If you have a dual port chassis,
by default, the first application you select will be for port 1 (P1).
To select an application
1 Select Test. The Test menu appears.
2 Select the technology (for example, SONET), signal, payload, and test
mode for your test application.
The instrument displays a message asking you to wait while it loads the
application.
3 Wait for the Main screen to appear, and then proceed to Step 2: Configuring a test on page 2.
The test application is selected.
NOTE:
When testing using an MSAM, only the applications for currently inserted
PIMs will appear on the Test menu. For example, if an SFP and XFP PIM
are inserted in the MSAM chassis, you will not see DS1 applications.
Other applications, such as the NextGen GFP applications only appear if
you purchased the associated testing options.

Step 2: Configuring a test

Before you configure a test, be certain to complete the information that you
want to include when you generate reports of your test results. For details, refer
to the Getting Started manual that shipped with your instrument.
Configuring a test involves displaying the setup screens, specifying test
settings, and optionally saving the test setup. Key settings are also available
on the Main screen, on the Quick Config tabs. Changing key settings while
running a test (for example, changing the pattern transmitted) triggers an automatic restart of the test.
To display the setup screens
1 Using the Test menu, select a test application (see Step 1: Selecting a test
application on page 2).
2 Select the Setup soft key.

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Chapter 1 Basic Testing

Step 3: Connecting the instrument to the circuit

A setup screen with a series of tabs appears. The tabs displayed vary
based on the test application you selected. See Figure 1.

Figure 1

Setup Screen (Ethernet Settings tab for GFP testing)

3 To navigate to a different setup screen, select the corresponding tab at the

top of the screen. For example, to display the Traffic setup screen, select
the Traffic tab.
4 After you finish specifying the test settings, select the Results soft key to
return to the Main screen.
For detailed instructions, refer to the Getting Started manual that shipped with
your instrument or upgrade, and to each of the testing chapters in this manual.

Step 3: Connecting the instrument to the circuit

For detailed instructions on connecting your instrument to the circuit, refer to
the Getting Started Manual.
When connecting the unit to optical circuits, bear in mind that applied power
must not exceed the power level specified on the panel for each optical
connector.

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Chapter 1 Basic Testing

Step 4: Starting the test

After you configure a test, connect the unit to the circuit, and, turn the laser ON,
the test starts automatically, and test results immediately accumulate.

NOTE: Temperature stabilized lasers

When testing 10 Gigabit, 40 Gigabit or 100 Gigabit optical circuits, some
lasers (particularly 1550 nm lasers) are temperature stabilized; therefore,
they need to reach a certain temperature before you can use them to transmit a signal. This is expected behavior, and does not indicate that there is
something wrong with the laser or test instrument.
It typically takes up to one minute for the temperature to stabilize. If you have
turned the laser on, but no signal is present on the receiving instrument or
device, simply wait for one minute.
After you start a test, use the buttons at the bottom of the screen to perform
actions such as turning the laser on and off, starting and stopping traffic,
starting and stopping a local loopback, and inserting errors, anomalies, alarms,
or defects.
Table 5 lists some common Action buttons.

Table 5

Action buttons

Button

Action

Laser On/Off

Turns the laser on or off when testing optical rates.

Insert Error/Anomaly

Inserts an error or anomaly into the transmitted traffic.

Insert Alarm/Defect

Inserts an alarm or defect into the transmitted traffic.

Step 5: Viewing test results

Test results appear in the Results Windows of the Main screen.

Setting the result group and

To set the result group and category

1 Using the Test menu, select a test application see Step 1: Selecting a test
application on page 2), and then configure your test (see Step 2: Configuring a test on page 2).
2 Select the Results soft key to return to the Main screen.
3 Connect your module to the circuit (see Step 3: Connecting the instrument
to the circuit on page 3).
4 If you are testing an optical interface, select the Laser button.
5 If you selected an Ethernet, Fibre Channel, or SONET/SDH GFP test
application, select the Start Traffic button to start generating and
analyzing traffic.
Results appear in the Results Windows.

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Chapter 1 Basic Testing

Running multiple tests

6 Optional. Insert errors or anomalies into the traffic stream, or use the
Action buttons to perform other actions. These buttons only appear if applicable to your test application.
7 Use the Group and Category buttons to specify the type of results you
want to observe. Figure 2 illustrates buttons for a standard SONET application.

Figure 2

Result Group and Category buttons

Results for the category you selected appear in the result window.
8 Optional. To observe results for a different group or category in another
result window, press the buttons at the top of the window to specify the
group and category.
For descriptions of each result, refer to Chapter 7 Test Results.
TIP:
If you want to provide a screen shot of key test results, on the Main screen,
select Tools > Capture Screenshot. A screen shot will be captured and
stored as a JPG file in the ../acterna/user/disk/bert/images
folder. You can include the screen shot when you create reports.

Additional test result

information

For detailed information on the following topics, refer to the Getting Started
manual that shipped with your instrument or upgrade.
Expanding and collapsing result measurements
Changing the result layout
Using the entire screen for results
About histogram results
Viewing a histogram
About the Event log
About result graphs
Clearing History results
Creating and maintaining Custom result groups
For descriptions of each result, refer to Chapter 7 Test Results.

Running multiple tests

You can significantly reduce your testing time by terminating traffic over
multiple circuits simultaneously.
For example, you can transmit traffic from the DS1 and DS3 PIMs to a network
element, and then loop the traffic back to your unit to analyze the signals and
verify that the network element is operating properly.
For details, refer to the Getting Started manual that shipped with your instrument or upgrade.

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Chapter 1 Basic Testing

Running multiple tests

PDH, SONET, SDH, NextGen, and OTN Testing Manual

Chapter 2

T-Carrier and PDH Testing

2
This chapter provides step-by-step instructions for testing T-Carrier and PDH
networks. Topics discussed in this chapter include the following:
About T-Carrier and PDH testing on page 8
Fractional T1 testing on page 11
Loopback testing on page 11
BER testing on page 14
Verifying performance on page 16
Measuring round trip delay on page 17
Measuring service disruption time on page 18
Monitoring the circuit on page 20
Analyzing PCM signals on page 20
Analyzing VF circuits on page 27
ISDN PRI testing on page 32

PDH, SONET, SDH, NextGen, and OTN Testing Manual

Chapter 2 T-Carrier and PDH Testing

About T-Carrier and PDH testing

If your instrument is configured and optioned to do so, you can use it to analyze
the performance of DS1 and DS3, and E1, E3, and E4 networks by performing
BER tests, and verifying that performance conforms to the industry test standards.
When you configure the instrument for T-Carrier or PDH testing, a number of
the test parameters vary depending on the protocol (T-Carrier or PDH), rate,
and payload you select.
NOTE:
You can also test muxed T-Carrier and PDH payloads when testing SONET
and SDH networks. For a list of payloads supported, see Chapter 3 SONET
and SDH Testing.

Features and capabilities

When testing T-Carrier and PDH service, you can generate and analyze
muxed and bulk payloads ranging from 1.544 Mbps to 139.264 Mbps for a
variety of transport rates. The module also allows supports the following:
BERT patternsYou can transmit and detect BERT patterns for each rate
available on the instrument.
Error/anomaly and alarm/defect insertionYou can insert a variety of
errors, anomalies, alarms, and defects into traffic, such as Bit/TSE errors
and REBE alarms.
Performance measurementYou can verify that performance complies
with ITU-T G.821, G.826, and M.2100, and ANSI T1.510.
Intrusive through mode testingYou can monitor a received signal in
through mode, and then pass the signal through the unit to the transmitter.
The instrument will resolve any received line code violations before transmitting the signal.
Drop and insert testing from a SONET/SDH access pointWhen testing
in through mode, you can insert one channel while non-intrusively passing
the remainder of the signal through unaffected. For example, you can
monitor an OC-48 signal, and then drop a DS3 signal and insert a BER
pattern into the DS3 signal, leaving the rest of the signal as it was
received. For details, see Drop and insert testing on page 66 of
Chapter 3 SONET and SDH Testing. (N/A 40/100G Transport Module)
Loop code insertionYou can loop up MUX devices using CSU, NIU,
HDSL (including generic device), and FEAC loop codes. You can also
optionally define up to ten user-programmable loop codes. For details, see
Looping up MUX devices on page 12
DS1 loop codes can be transmitted from within a channelized DS3 application.
Round trip delay measurementYou can verify that a circuit complies with
round trip delay requirements as specified in a customers service level
agreement.
Service disruption measurementsYou can measure service disruption
time resulting from signal loss or a variety of errors, anomalies, alarms, or
defects. For details, see Measuring service disruption time on page 18.

PDH, SONET, SDH, NextGen, and OTN Testing Manual

Chapter 2 T-Carrier and PDH Testing

About T-Carrier and PDH testing

DS1 jitter measurementsIf your MSAM is configured and optioned to do

so, you can measure jitter on a DS1 interface. The measurement is
provided in the Interface result group, under the Signal category. For
details, see Chapter 4 Jitter and Wander Testing.
PCM signal analysisIf your instrument is configured and optioned to do
so, you can analyze signals for the robbed-bit-in-band signaling standard
by testing against different trunk types. These tests are performed from a
DS1 (T1) access point. For details, see Analyzing PCM signals on
page 20.
VF call analysisIf your instrument is configured and optioned to do so,
you can establish a VF (voice frequency) call, then transmit or receive
voice or tones without dropping the call. These tests are performed from a
DS1 (T1) access point. For details, see Analyzing VF circuits on page 27.
Fractional T1 testingIf your instrument is configured and optioned to do
so, you can commission and maintain fractional T1 (FT1) transmission
circuits. Typically this involves out-of-service testing to ensure that the
physical layer is clean and there are no problems with network equipment
or improper provisioning. For details, see Analyzing PCM signals on
page 20.
ISDN PRI testingIf your instrument is configured and optioned to do so,
you can place and receive one ISDN call and decode/monitor the
D-Channel. For details, see ISDN PRI testing on page 32.

Understanding the LED panel

When you setup the instrument, you can specify whether the T-Carrier and
PDH LED panels should emulate the LEDs on the ANT platform or the TestPad
2000 platform. If the LEDs are not what you expect or are accustomed to
seeing, verify that the correct emulation mode is selected for your module.

Understanding the graphical

user interface

The names of various elements on the graphical user interface change

depending on whether you select a T-Carrier or PDH test application. For
example, the button that you use to insert errors or anomalies is labeled
Insert Error if you selected a T-Carrier application; the same button is labeled
Insert Anomaly if you selected a PDH application.

Understanding T-Carrier and

PDH test results

Many T-Carrier and PDH standards are identical; therefore, the instrument
provides similar results for both test applications. See T-Carrier and PDH
results on page 177 for a description of each test result.

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Chapter 2 T-Carrier and PDH Testing

About T-Carrier and PDH testing

T-Carrier test applications

Table 6 lists each of the T-Carrier test applications.

Table 6

T-Carrier test applications

Signal

Payload Rate

Test Modes

DS1

DS1 BERT

Terminate
Through
Dual Monitor

DS1 Signaling

Terminate
Dual Monitor

DS1 ISDN PRI

Terminate
Dual Monitor

DS1 VF

Terminate
Dual Monitor

DS3 BERT

Terminate
Through
Dual Monitor

E1 BERT

Terminate
Through
Dual Monitor

DS1 BERT

Terminate
Through
Dual Monitor

DS3

PDH test applications

Table 7 lists each of the PDH test applications.

Table 7
Signal

Payload Rate

Test Modes

E1 BERT

Terminate
Through
Dual Monitor

E3 BERT

Terminate
Through
Monitor

E1 BERT

Terminate
Through
Monitor

E4 BERT

Terminate
Through
Monitor

E3 BERT

Terminate
Through
Monitor

E1 BERT

Terminate
Through
Monitor

PDH test applications

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Chapter 2 T-Carrier and PDH Testing

Fractional T1 testing

Fractional T1 testing
If your instrument is optioned and configured to do so, you can analyze FT1
circuits for contiguous and non-contiguous channels in 56 kbps or 64 kbps
formats.
To configure a FT1 payload
1 Using the Test Menu, select the DS1 terminate test application for the
payload rate you are testing (refer to Table 6 on page 10).
2 Select the Setup soft key. A series of setup tabs appears.
3 Select the Payload tab, then specify the following settings:
Setting

Value

Payload Type

Select Fractional Rate.

Select DSO Channels

Select the displayed channels that you want

to analyze. When selected, a green check
mark appears to the left of the channel number.
To select all channels, select Select All.
To clear all channels, select Clear All.
At least one channel must be selected.

Idle Code

Enter the idle code in an 8 bit format.

Tx Bit Rate

Select N x 56 or N x 64.

The FT1 payload settings are specified. You can observe test results for each
channel in the Payload result group, under the Channel and Traffic categories.
For details, see Channel test results on page 183 and Traffic test results on
page 183.

Loopback testing
You can qualify DS1 and DS3 circuit performance by transmitting traffic from a
near-end unit, and then looping the traffic through a far end unit to test for
errors or anomalies.
To loop up a far end instrument
1 Using the Test Menu, select the terminate test application for the payload
and rate you are testing (refer to Table 6 on page 10).
2 Select Loop Up.
A message appears briefly in the message bar indicating that the loop up
of the network element on the far end was successful.
3 Select Restart.
The module on the far end is looped up, and traffic is passed from the
receiver through to the transmitter back to the near-end module.
To loop down the far end module
Select Loop Down.
A message appears briefly in the message bar indicating that the loop
down of the instrument on the far end was successful.

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Chapter 2 T-Carrier and PDH Testing

Loopback testing

Looping up MUX devices

When testing DS1 or DS3 circuits, you can use your unit to loop up MUX
devices by transmitting loop codes. If you are testing a DS1 payload, you can
also define and store up to ten custom loop codes (see Defining custom loop
codes on page 12).
To transmit a loop code
1 Using the Test Menu, select the DS1 or DS3 terminate test application for
the payload rate you are testing (refer to Table 6 on page 10 for a list of
applications).
2 Select the Setup soft key. A series of setup tabs appears.
3 Select the Loop tab, and then specify the following:
Payload Rate

DS1 Loop Type/ DS3 Tx

FEAC Loop Select

Settings

DS1 BERT

HDSL

NIU

CSU

DS3 BERT

HDSL Model. Select the

model for the HDSL device
or Generic HLU, HDU or
HRU if model not known.
Test Direction. Specify CO
to Customer or Customer to CO.
Code Type. Specify a
Short (required for
Generic) or Long loop
code.
NIU Code. Select the NIU
code for the device.
Auto Response. Specify
Respond On or Respond
Off.
CSU Code. Select the CSU
code for the device.
Auto Response. Specify
Respond On or Respond
Off.

User Defined

See Defining custom loop

codes on page 12.

NIU Loop

N/A

DS3 Loop

N/A

DS1 Codes

HDSL,NIU,CSIU - See above

4 To return to the Main screen, select the Results soft key.

5 Select Loop Up.
A message appears briefly in the message bar indicating that the loop up
of the device was successful.
The MUX device is looped up, and traffic is passed from its receiver through to
its transmitter back to the near-end module.

Defining custom loop codes

You can define and store up to ten custom loop codes for looping up DS1 MUX
devices.

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Loopback testing

To define a custom loop code

1 Using the Test Menu, select the DS1 terminate test application for the
payload rate you are testing (refer to Table 6 on page 10 for a list of applications).
2 Select the Setup soft key. A series of setup tabs appears.
3 Select the Loop tab, and then do the following:
a In Loop Type, specify User Defined.
A list of loop codes appears, allowing you to select a previously defined
loop code, or to define a new one. See Figure 3.

Figure 3

User Defined Loop Codes

b On the list, select the loop code you want to define.

c In Loop-Code name, use the keypad to type a unique name for the loop
code using up to twenty five characters.
d In Bit Pattern, use the keypad to type the bit pattern using up to 16
digits.
e Under Type, indicate whether you want to use the loop code to Loop
Up or Loop Down a MUX device, or select Other, and then manually
specify the loop code pattern.
f

Under Delivery, indicate whether you want to send the loop code
In Band, or Out of Band.

4 To return to the Main screen, select the Results soft key.

The loop code is defined.

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BER testing

BER testing
The following procedure illustrates a typical scenario for:
Setting up the MSAM to terminate a T-Carrier or PDH signal for BER
testing.
Inserting errors, anomalies, alarms, and defects.
NOTE: Changing BERT patterns
If you change a BERT pattern during the course of your test, be certain to
press the Restart soft key to ensure that you regain pattern sync.
To perform a T-Carrier or PDH BER test
1 Using the Test Menu, select the terminate test application for the signal
and payload rate you are testing (refer to Table 6 on page 10 and Table 7
on page 10 for a list of applications).
2 Select the Setup soft key. A series of setup tabs appears.
3 Select the Interface tab, and then specify the applicable settings for the
interface rate and payload you selected: specify the input sensitivity, line
coding method, clock source and offset, and the line build out (LBO).
4 If the Channel tab is available (muxed PDH rates), specify:
The channel or channels to analyze on the receiver.
The Tx=Rx setting. If you want to transmit traffic on the same channel
you specified for the receiver, select YES. If you want to transmit traffic
on a different channel, or all channels, select NO.
If you selected NO for the Tx=Rx setting, specify the channel you want
to transmit traffic on, or set the Tx ALL setting to YES to transmit traffic
over all available channels.
If you are running a PDH application, and want to specify timeslots for your
test, proceed to step 5, otherwise, proceed to step 7.
5 Select the Payload tab, select the arrow to the right of the Payload Type
field, and then specify one of the following:
Bulk. Proceed to step 7.
Fractional Rate. The Select Timeslot box appears. Proceed to step 6.

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6 To change the timeslots you want to test, do one of the following:

To...

Do...

Select individual timeslots

Select the timeslot(s). The check mark appears.

Clear individual timeslots

Select the timeslot(s). The check mark is

removed.

Select all the timeslots

Select the Select All button.

Clear all the timeslots

Select the Deselect All button.

7 Specify the framing and BERT pattern by doing one of the following:
a Manually specify the framing and pattern
Select the Framing tab, and then specify the framing settings for the
received and transmitted signals and, if applicable, the muxed
payloads dropped from the signals:
Rates
Muxed Payloads

Framing types

DS1

Unframed
ESF
SF
SLC-96

DS3

Unframed
M13
C-Bit

PCM31C
PCM31
PCM30C
PCM30
Unframed

Framed
Unframed

NOTE:
You can also specify frame settings using the Framing quick configuration
button provided on the Main screen.
Select the Pattern tab, and then select the Pattern Mode and specify a
BERT Pattern (for example, 2^23-1).
NOTE:
Patterns 2^20-1 ITU or 2^20-1 Inv ITU require that the far end unit be an
MSAM containing v13.0 or higher software in order to achieve pattern sync.
If the far end unit is an HST-3000 or MSAM containing software below
v13.0, patterns 2^20-1 ANSI or 2^20-1 Inv ANSI should be selected as an
acceptable substitute.

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Verifying performance

b Automatically detect the framing and the received BER pattern

On the Main screen, press the Auto button:

A window appears indicating that the module detected the input signal and
then detected the received pattern.
8 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
9 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
10 Using a hard loop or loop code, loop back the far-end of the network.
11 Verify the following LEDs:
If your module is in TestPad mode, verify that the following LEDs are
green:
T-Carrier

PDH

Signal Present

Frame Sync

MFAS Sync

Pattern Sync

If your module is in ANT mode, verify that the following LEDs are not
red:
T-Carrier and PDH
LOS
LOF
LSS

12 Verify that All Summary Results OK appears in the results window.

13 Optional. Insert five Bit / TSE errors (see Verifying performance on
page 16), and then verify that the five errors were received in the BERT
result category.
14 Run the test for an appropriate length of time.
The BER test is finished.

Verifying performance
You can use the MSAM to verifying that performance on a circuit conforms to
industry test recommendations.
To verify performance
1 Using the Test Menu, select the terminate test application for the signal
and payload you are testing (refer to Table 6 on page 10 and Table 7 on
page 10 for a list of applications).

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Measuring round trip delay

2 Select the Setup soft key. A series of setup tabs appears.

3 Select the Performance tab, and then do the following:
a In Path Allocation, enter the percentage of the circuit (path) you are
testing. For example, if the segment of the circuit you are testing constitutes 50% of the entire circuit, enter 50.000000.
b If you want to set a threshold (limit) after which the module will indicate
that the Verdict result is Rejected, do the following:
In Enable UAS Limit, select Yes.
In UAS Limit, specify the number of unavailable seconds after which
the module will display Rejected for the UAS result for the entire
duration of the test. For example, if you want the unit to display
Rejected after 10 unavailable seconds, specify 10.
c On the left side of the tab, select another test recommendation (G.821,
G.826, or M.2100) and then repeat step a and step b for each specification.
4 Display and observe Summary results in one window, and the test results
for the associated performance recommendation in a second window (see
Step 5: Viewing test results on page 4).
For example, if you configured the test for the G.826 recommendation, set
a result window to display G.826 results for the applicable receiver.
If key results do not conform to the associated recommendations, they
appear in the performance category with a Rejected value.
If all results in a performance category conform to the associated
recommendations, the Verdict result indicates: Accepted.
For additional information on performance results, see ITU-T recommended
performance test results on page 202.

Measuring round trip delay

You can use the instrument to measure round trip delay by transmitting a delay
pattern, and then looping the pattern back to the module. The module calculates the amount of time it took the pattern to traverse the loop, and then
reports the duration (delay) in milliseconds (ms).
To measure round trip delay
1 Using the Test Menu, select the test application for the signal and payload
you are testing (refer to Table 6 on page 10 and Table 7 on page 10 for a
list of applications).
2 Select the Setup soft key. A series of setup tabs appears.
3 Specify the Interface and Framing settings if the defaults are not acceptable (for details on the settings, refer to the associated steps in BER
testing on page 14).
4 Select the Pattern tab, and then select the Delay pattern.
5 To return to the Main screen, select the Results soft key.
6 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.

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Measuring service disruption time

7 Connect a cable from the appropriate TX connector to the networks

RECEIVE access connector.
8 Loop back the far-end of the network.
9 Verify the following LEDs:
If your module is in TestPad mode, verify that the following LEDs are
green:
T-Carrier

PDH

Signal Present

Frame Sync

MFAS Sync

Pattern Sync

If your module is in ANT mode, verify that the following LEDs are not
red:
T-Carrier and PDH
LOS
LOF
LSS

10 To observe the delay result, set one of the result windows to display the
Signal category.
Round trip delay is measured.

Measuring service disruption time

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Measuring service disruption time

3 Under Event Settings, do the following:

a Select Enable Service Disruption.
b Optional. To edit the displayed Separation Time, select the field, and
then type the new time in milliseconds (ms), or select Default to restore
the time to its default value (300.000 ms). This is the duration during
which each trigger of a specific type will be counted as a single disruption event.
c Optional. To edit the displayed Threshold Time, press the keypad icon,
and then type the new time in milliseconds (ms), or select Default to
restore the time to its default value (50.000 ms). Disruption measurements that exceed this duration will be interpreted as failed.
4 Under Event Triggers, do one of the following:
To measure disruption time for each of the triggers listed, select Set
ALL.
To measure disruption time for a specific trigger or group of triggers,
select Clear ALL, and then select each of the triggers for the measurements.
5 If you are measuring service disruption time from a DS1 or E1 interface, or
for a DS1 or E1 signal embedded in a higher rate (for example, a DS1
dropped from an OC-3 or an E1 dropped from an STM-4), select the
Framing tab, and then select Unframed.
NOTE:
You can not use a framed signal (for example, ESF) when measuring service disruption time for a DS1 or E1 signal from any interface. Be certain to
configure an unframed signal before starting your test.
You can use a framed signal (for example, M13 or C-Bit) when measuring
service disruption time for DS3, E3, and E4 signals from any interface.
6 If additional settings need to be modified to reflect the network configuration, select the appropriate tab, and then modify the settings as required.
7 To return to the Main screen, select the Results soft key.
8 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
9 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
10 To force the switch to a protect line, use one of the following methods:
Interrupt the signal. Physically interrupt the signal by pulling the signal
within the SONET/SDH ring.
Insert errors. Use another unit through mode to insert errors until the
network switches to the backup lines.
Use the network elements software to force a protection switch.
The network switches to a protect line, the instrument detects that service
has been disrupted, and then begins to measure the disruption time in
milliseconds until the condition returns to normal.

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Monitoring the circuit

11 To observe the service disruption results, set one of the result windows to
display the Service Disruption Log, and set another window to display the
Service Disruption Log Stats.
Service disruption is measured for each of the triggers you selected. For
details on the associated test results, see Service Disruption Results on
page 200.

Monitoring the circuit

You can use the instrument to monitor T-Carrier and PDH signals and muxed
payloads within the signals.
1 Using the Test Menu, select a monitor test application for the signal and
payload you are testing (refer to Table 6 on page 10 and Table 7 on
page 10 for a list of applications).
2 If the current test configuration needs to be modified to reflect the network
configuration, select the Setup soft key, and then modify the settings as
required.
3 To return to the Main screen, select the Results soft key.
4 Connect a cable from the appropriate RX 1 connector to the networks
TRANSMIT access connector.
If you are monitoring two signals, connect a second cable from the appropriate Rx 2 connector to the second network TRANSMIT access
connector.
5 Observe the test results (see Step 5: Viewing test results on page 4).
You are monitoring the circuit.

Analyzing PCM signals

If your instrument is configured and optioned to do so, you can use it to do the
following:
Monitor a callThe instrument can analyze both directions of a user-specified
DS0 channel on a T1 line for call activity. Call activity includes supervisory
events and DTMF, MF, and DP digit recognition. Each activity event is
displayed in the test results.
Place a callThe instrument can emulate the CPE (PBX) or CO side of a
network by originating a call over a user-specified DS0 channel on a duplex T1
circuit. Calls can incorporate DTMF digits, MF digits, DP digits, as well as other
signaling events.
Receive a call The instrument can emulate the CPE (PBX) or CO side of a
network by terminating a call over a specified DS0 channel on a duplex T1
circuit. Calls can incorporate DTMF digits, MF digits, DP digits, as well as other
signaling events.

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Analyzing PCM signals

Analyze digits or eventsThe instrument can display the characteristics of

each received DTMF, MF, DP digit, and signaling event. Analysis results
include digit/event delay and duration, digit address type (DTMF, MF, or DP).
You must use a headset for audio analysis.
Analyze voice frequencies (VF)After placing or receiving a standard PCM
call, you can perform VF analysis while maintaining the call. In addition to
signaling results, VF results, such as DC offset, frequency, and level measurements are available. For details, see Analyzing VF circuits on page 27.

Test modes

You can perform signaling analysis in the following modes:

Terminate In Terminate mode both sides of a T1 path are separated; the
input signal is terminated at the receive side; and a totally independent signal
is generated for the output.
Dual Monitor In Dual Monitor mode you can select a DS0 channel from a
duplex T1 circuit and monitor all channel activity. Channel activity includes all
originating and terminating supervisory events and originating digits. In Dual
Monitor mode, you cannot insert data on a T1 line.

Trunk type signaling

Trunk type signaling is used to define the On Hook and Off Hook status, and
other states of the A, B, C, and D signaling bits. All trunk types are available
regardless of the T1 Interface framing mode (for example, SLC trunk types can
be selected without SLC framing). The available trunk types are as follows:
Standard E&M (Ear and Mouthpiece)
Ground Start
Loop Start
Each type of trunk signaling is described in the following sections.

Standard E & M signaling

Standard E&M signaling is used on trunks between switches in the public

switched telephone network (PSTN). Table 8 describes Standard E&M
signaling. An X indicates a dont care condition.
Table 8
Direction

Transmit

Receive

Loop start signaling

Standard E&M signaling

Trunk Status

Signaling Bits

On Hook

A=0 B=0 (C=0 D=0)

Off Hook

A=1 B=1 (C=1 D=1)

On Hook

A=0 B=X (C=0 D=X)

Off Hook

A=1 B=X (C=1 D=X)

Loop start trunk signaling emulates standard signaling between a telephone

and a switch. This is the most common type of trunk found in residential installations. Signaling for the various types of loop start trunks is as follows:
FXS (foreign exchange station)
FXO (foreign exchange office)

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Analyzing PCM signals

SLC (subscriber line carrier) Station

SLC Office
Table 9 describes each type of loop start trunk signaling. An X indicates a
dont care condition.
Table 9

Loop start trunk signaling

Direction

Trunk Status

Signaling Bits

On Hook

A=0 B=1 (C=0 D=1)

Off Hook

A=1 B=1 (C=1 D=1) Loop

closed

On Hook

A=0 B=1 (C=0 D=1)

Off Hook

A=0 B=1 (C=0 D=1)

Ringing

A=X B=0 (C=X D=0)

On Hook

A=0 B=1 (C=0 D=1)

Off Hook

A=0 B=1 (C=0 D=1)

Ringing

A=0 B=0 (C=0 D=0)

On Hook

A=0 B=X (C=0 D=X) Loop Idle

Off Hook

A=1 B=X (C=1 D=X) Loop

closed

FXS Signaling

Transmit

Receive

FXO Signaling

Transmit

Receive

SLC Station Signaling - ESF Framing

Transmit

Receive

On Hook

A=0 B=0 (C=0 D=0)

Off Hook

A=1 B=0 (C=1 D=0)

On Hook

A=1 B=1 (C=1 D=1)

Off Hook

A=1 B=1 (C=1 D=1)

Ringing

A=1 B=1 (C=1 D=0)

SLC Station Signaling - D4/SF/SLC-96 Framing

Transmit

Receive

On Hook

A=0 B=0

Off Hook

A=1 B=0

On Hook

A=1 B=1

Off Hook

A=1 B=1

Ringing

A=1 B=0/1

SLC Office Signaling - ESF Framing

Transmit

Receive

On Hook

A=1 B=1 (C=1 D=1)

Off Hook

A=1 B=1 (C=1 D=1)

Ringing

A=1 B=1 (C=1 D=0)

On Hook

A=0 B=0 (C=0 D=0)

Off Hook

A=1 B=0 (C=1 D=0)

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Table 9

Loop start trunk signaling (Continued)

Direction

Trunk Status

Signaling Bits

SLC Office Signaling - D4/SF/SLC-96 Framing

Transmit

Receive

Ground start signaling

On Hook

A=1 B=1

Off Hook

A=1 B=1

Ringing

A=1 B=0/1

On Hook

A=0 B=0

Off Hook

A=1 B=0

Ground start trunk type circuits provide additional supervision to prevent

outgoing calls on circuits with incoming calls present. The signaling for the
various types of Ground Start trunks is as follows:
FXS (Foreign Exchange Station)
FXO (Foreign Exchange Office)
SLC (Subscriber Line Carrier) Station
SLC Office
Table 10 describes each type of ground start trunk signaling. An X indicates a
dont care condition.
Table 10

Ground start signaling

Direction

Trunk Status

Signaling Bits

On Hook

A=0 B=1 (C=0 D=1)

Ground

A=0 B=0 (C=0 D=0) Ground on Ring

Off Hook

A=1 B=1 (C=1 D=1) Loop closed after

the far end, FXO sends A=0 (Ground
on Tip)

On Hook

A=1 B=X (C=1 D=X) No Tip Ground

Off Hook

A=0 B=1 (C=0 D=1) Tip Ground

Ringing

A=X B=0 (C=X D=0)

On Hook

A=1 B=1 (C=1 D=1) No Ground on

Tip

Off Hook

A=0 B=1 (C=0 D=1) Tip Ground

Ringing

A=0 B=0 (C=0 D=0)

On Hook

A=0 B=1 (C=0 D=1) Loop Idle

Ground

A=0 B=0 (C=0 D=0) Ground on Ring

Off Hook

A=1 B=1 (C=1 D=1) Loop closed

FXS Signaling

Transmit

Receive

FXO Signaling

Transmit

Receive

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Table 10
Direction

Ground start signaling (Continued)

Trunk Status

Signaling Bits

SLC Station Signaling - ESF Framing

Transmit

Receive

On Hook

A=0 B=0 (C=0 D=0)

Ground

A=0 =1 (C=0 D=1)

Off Hook

A=1 B=0 (C=1 D=0)

On Hook

A=0 B=0 (C=0 D=0)

Off Hook

A=0 B=1 (C=0 D=0)

Ringing

A=1 B=1 (C=1 D=0)

SLC Station Signaling D4/SF/SLC-96 Framing

Transmit

Receive

On Hook

A=0 B=0

Ground

A=0 B=1

Off Hook

A=1 B=0

On Hook

A=0 B=0

Off Hook

A=0 B=0/1

Ringing

A=1 B=0/1

SLC Office Signaling - ESF Framing

Transmit

Receive

On Hook

A=0 B=0 (C=0 D=0)

Off Hook

A=0 B=1 (C=0 D=0)

Ringing

A=1 B=1 (C=1 D=0)

On Hook

A=0 B=0 (C=0 D=0)

Ground

A=0 =1 (C=0 D=1)

Off Hook

A=1 B=0 (C=1 D=0)

SLC Office Signaling D4/SF/SLC-96 Framing

Transmit

Receive

On Hook

A=0 B=0

Off Hook

A=0 B=0/1

Ringing

A=1 B=0/1

On Hook

A=0 B=0

Ground

A=0 B=1

Off Hook

A=1 B=0

Connecting a headset

Before monitoring or placing calls, you should connect a USB headset to listen
to the calls. To verify that your headset has been tested and recommended by
JDSU for use with your instrument, contact your local JDSU representative.

Specifying call settings

Before monitoring or placing calls, you must specify settings such as the trunk
type, equipment type (if applicable), and call mode.

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Analyzing PCM signals

To specify call settings

1 Using the Test Menu, select the DS1 Signaling application (refer to Table 6
on page 10 for a list of applications and test modes).
2 If the current test configuration needs to be modified to reflect the network
configuration, select the Setup soft key, and then modify the settings as
required.
3 Select the Call tab, then specify the following settings:
Setting

Value

Trunk Type

Select one of the following trunk types:

Standard E&M
Loop Start
Ground Start
For information about trunk types, see Trunk
type signaling on page 21.

Equipment
(Loop Start or Ground Start
only)

For loop start and ground start trunk types, if

you are monitoring calls, select the type of
equipment that will be connected to the primary receiver; otherwise, select the type of
equipment the instrument is emulating:
FXO
FXS
SLC Office
SLC Station
For additional information, see Loop start signaling on page 21 or Ground start signaling
on page 23.

Address
(Terminate Mode only)

Select one of the following address types:

DTMF
MF
DP

Response Mode

Select Auto or Manual. If you select Auto,

when testing in terminate mode the instrument will automatically respond to supervisory
events as applicable for the selected trunk
type.

Call Mode

Select Originate or Terminate.

The call settings are specified.

Monitoring a call

You can monitor call activity on a specified DS0 channel or scan specific channels for call activity. The instrument captures the call activity and displays the
results. The following procedure describes how to monitor a call on a DS0
channel from a T1.
To monitor a call
1 Using the Test Menu, select the DS1 Signaling application in Dual Monitor
mode (refer to Table 6 on page 10 for a list of applications and test
modes).

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Analyzing PCM signals

2 If the current test configuration needs to be modified to reflect the network

configuration, select the Setup soft key, and then modify the settings as
required.
3 Specify the calls settings (see Specifying call settings on page 24).
4 If you want to scan specific channels for originating and terminating
signaling events and digits, select the Call Scan tab, then specify the
following settings:
Setting

Value

Call Scanning

Select Enable.

Select Scan Channels

(Call Scanning must be
Enabled)

Select the displayed channels (timeslots) that

you want to analyze. When selected, a green
check mark appears to the left of the channel
number.
To select all channels, select Select All.
To clear all channels, select Clear All.
At least one channel must be selected.

Lock Time (sec)

Select the field to display a keypad, then enter

the lock time in seconds.

Release Time (msec)

Select the field to display a keypad, then enter

the release time in seconds.

The instrument will collect call activity results and display them in the
Payload result group, under the Call category for the selected receiver.
When the instrument is scanning for active channels, the speaker is
muted.
5 Select the Results soft key to return to the Main screen.
6 Select the Restart soft key, then observe the call results (see Observing
call results on page 27).
You are monitoring a call, and results associated with the call appear.

Placing or receiving calls

In Terminate mode, you can use the instrument to emulate a PBX, switch, or
telephone to place or receive calls, and perform voice frequency (VF) testing
on DS0 channels. You can place calls in either direction on a switched network.
To place or receive a call
1 Using the Test Menu, select the DS1 Signaling application in Terminate
mode (refer to Table 6 on page 10 for a list of applications and test
modes).
2 If the current test configuration needs to be modified to reflect the network
configuration, select the Setup soft key, and then modify the settings as
required.
3 Specify the calls settings (see Specifying call settings on page 24), then
select the Results soft key to return to the Main screen.
4 Connect the instrument to the line.
5 Select the Restart soft key, then observe the call results (see Observing
call results on page 27).

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Analyzing VF circuits

6 Select the Signaling Action tab, and then use the action keys to perform
the various signal events for the trunk type you selected. Available actions
will vary depending on whether you are placing or receiving a call.
Keys

Action

Signaling Events, such

as:
On Hook
Off Hook
Push To Talk
VF Testing
Ring
Idle
Additional keys may
appear as appropriate for
your call.

Performs the associated signaling event. Actions

vary depending on the selected trunk type and
whether you are placing or receiving a call.

VF Testing

Starts VF testing. For details, see Analyzing VF

circuits on page 27.

DTMF Dial
DP Dial
MF Dial

Displays a keypad so you can dial a call manually.

You placed or received a call.

Observing call results

When monitoring, placing, or receiving calls, you can observe more results if
you use a single result pane.
To observe call results
1 Select View > Result Windows > Single.
2 In the result window, select the receiver you want to observe calls for.
3 Set the result group to Payload, and the category to Call.

Analyzing VF circuits
If your instrument is configured and optioned to do so, you can use it to do the
following:
Measure Standard ToneAnalyze a DS0 channel for standard VF characteristics such as tone frequency, tone level, and DC offset.
Measure NoiseTest a DS0 channel for spectral noise analysis by filtering
the received signal using C-message, D-message, 3.4 kHz, and 1,010 Hz
notch filters.
Transmit Standard TonesInsert a single voice frequency tone over a
specified DS0 channel. Tone characteristics include pre-defined and userdefined frequencies and levels.
Transmit Loopback TonesInsert 2713 Hz loop up and loop down tones
at -10.0 dBm on the test channel.

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Insert Three-tone StepsInsert the repeated transmission of three tones

(404, 1004, and 2804 Hz) over a specified DS0 channel at a user-specified
level and duration.
Frequency SweepTransmit a user-defined range of tones (from 500 Hz
to 3500 Hz) over a specified DS0 channel. You can configure a block out
range (notch); the frequency separation between tones; the level, tone
duration, and sweep direction.
Measure Impulse NoiseMeasure impulse noise on a specified DS0
channel according to a user-defined threshold. You can also apply C- or Dmessage and notched filters.
Configure Signaling BitsYou can configure and transmit AB(CD)
signaling bits with either 2-bit or 4-bit binary values, depending on the
specified framing format.
Verify Path Continuity and Audible FaultsThe audible output from the
instruments speaker allows you to verify path continuity and identify
audible faults, such as low levels, noise, and echo.

VF tests

Using the instrument, you can perform the following types of tests: Quiet Tone,
Holding Tone, Three Tone, Single Tone, Frequency Sweep, and Impulse
Noise. You can also specify values for AB(CD) signaling bits. The following
sections provide an overview of each test type. For instructions on performing
tests, see Running VF analysis tests on page 29.

Quiet tone test

This test lets you measure noise on a PCM data circuit when no tones are
present and one end of the circuit has been terminated. This test simulates this
condition by inserting a code representing zero signal (0xFE) into the test
channel.

Holding tone test

This test lets you transmit a tone, with a frequency of 1004 Hz and a transmit
level of -16 dBm, on the test channel.

Three tone test

This test lets you measure the frequency response of the test channel when
three tones (404, 1004, and 2804 Hz) are transmitted. These tones are transmitted automatically and repetitively as a step. You can specify the transmission duration for each tone, and you can specify the transmit level. All three
tones are transmitted at the same level.

Single tone test

This test lets you transmit any one of five preset tone frequencies, or a userdefined frequency from 20 to 3904 Hz on the test channel. You can also specify
any one of five preset tone levels, or specify a user-defined level from -40.0 to
3.0 dBm.

Frequency sweep test

This test lets you transmit a specified range of tones on the test channel. You
can configure the upper and lower bounds of the range to be anywhere from
20 Hz to 3904 Hz. You can also set a blocked (notched) frequency range as
well as the step size, the amount of frequency separation between tones.

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Additionally, you can specify the point at which the instrument begins transmitting the tones, either from higher to the lower frequency or from lower to higher.
The range of tones is transmitted repeatedly at a user-specified level and duration.

Impulse noise test

This test lets you measure impulse noise on the test channel. You can specify
the threshold for detecting instances of impulse noise (impulse noise hits).
Additionally, you can apply C- or D-message and notched filters. When you
start the test, the instrument clears any previous results and starts a new count
of impulse noise hits.

User-defined signaling bits

Depending on the specified line framing format, you can assign 2- or 4-bit
values to the AB(CD) signaling bits. If the framing format is set to D4/SF or
SLC-96, you can configure a 2-bit value. If the framing format is set to ESF, you
can configure a 4-bit value. This feature is only available in Terminate mode.
Also, you cannot define signaling bits if you are accessing the VF settings from
the PCM Signaling application (see Analyzing PCM signals on page 20).

Running VF analysis tests

The following procedure describes how to run VF analysis tests when the
instrument is connected to a T1 line.
To run VF analysis tests
1 Using the Test Menu, select the DS1 VF application (refer to Table 6 on
page 10 for a list of applications and test modes).
2 If the current test configuration needs to be modified to reflect the network
configuration, select the Setup soft key, and then modify the settings as
required.
3 Specify the calls settings (see Specifying call settings on page 24), then
select the Results soft key to return to the Main screen.
4 If you want to scan specific channels for originating and terminating
signaling events and digits, select the Call Scan tab, then specify the
settings. For details, see step 4 on page 29 of Monitoring a call.

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5 Select the VF tab.

If you are running the Impulse Noise test, proceed directly to step 7 on
page 31.
If you are running the Quiet Tone or Holding Tone test, proceed directly
to step 8 on page 31.

Three Tone

Frequency Sweep

Setting

Value

Test Type

Select one of the following test types:

Single Tone
Holding Tone
Frequency Sweep
Impulse Noise

Frequency

Select one of the following frequencies:

404 Hz
1004 Hz
1804 Hz
2713 Hz
2804 Hz
User Frequency

User Frequency
(Hz)a

If you indicated that you want to specify

the frequency by selecting User Frequency, specify the frequency in Hz.

Level

Select the decibel level for the tones:

0 dBm
3 dBm
-10 dBm
-13 dBm
-16 dBm
User Level

User Level
(dBm)b

Specify the level the at which the tones

will be transmitted. You can enter a
value from -40.0 dBm to 3.0 dBm.

404Hz Duration
1004Hz Duration
2804Hz Duration

Enter the number of seconds for the

duration for each tone. The minimum is
2 seconds the maximum is 60 seconds.
The default duration is 5 seconds.

a. Frequency must be User Frequency

b. Level must be User Level

Single Tone

For all other tests, specify the following settings:

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6 If you are running the Frequency Sweep test, specify the following
settings; otherwise, proceed directly to step 8 on page 31.
Setting

Value

Tone Duration (sec)

Enter a value, from 2 to 10 seconds, to indicate how long each tone will be transmitted.

Step Size (Hz)

Enter a value, from 10 to 1000 Hz, to indicate

the amount of separation between tones.

Sweep Direction

Select one of the following:

Up, to begin the sweep from the start frequency.
Down, to begin the sweep from the stop
frequency.

Sweep Frequency Range

(Hz)

These settings specify the frequencies at

which the sweep starts and stops, based on
the direction specified. For Start and Stop,
specify a range from 10 to 3904 Hz.

Skip Frequency Range (Hz)

These settings indicate a range of frequencies that will not be transmitted as part of the
sweep. For Low and High, specify a range
from 10 to 3904 Hz. The default skip range is
2450 Hz to 2750 Hz.

7 If you are running the Impulse noise test, specify the following settings;
otherwise, proceed directly to step 8 on page 31:
Setting

Value

Test Type

Select Impulse Noise.

Impulse Noise

Enter a value, from 60 to 93 dBm, to indicate

when the instrument will detect impulse noise.

Filter Type

Apply one of the following filters:

No Filter
C Message
C Notched
D Message
D Notched

Select Scan Channels

(Call Scanning must be
Enabled)

Select the displayed channels (timeslots) that

you want to analyze. When selected, a green
check mark appears to the left of the channel
number.

To select all channels, select Select

All.
To clear all channels, select Clear All.
At least one channel must be selected.
Lock Time (sec)

Select the field to display a keypad, then enter

the lock time in seconds.

Release Time (msec)

Select the field to display a keypad, then enter

the release time in seconds.

8 Connect the instrument to the line.

9 Press the Results soft key.
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10 To start the test, press the Restart soft key.

You can hear received tones through the instruments speaker or your
headset.
11 Select the Signaling Action tab, and then select the VF Testing key.
12 Use the action keys to perform the various signal events for the trunk type
you selected. Available actions will vary depending on whether you are
placing or receiving a call. For details, see step 6 on page 27 of Placing or
receiving calls.
You are running a VF test, and can observe results in the VF category (see
Observing VF results.

Observing VF results

ISDN PRI testing

If your instrument is configured and optioned to do so, you can use it to install
and maintain ISDN PRI services over T1 interfaces. Using the instrument, you
can place, receive, and analyze calls, test data services using BERT analysis,
test voice services using a microphone/speaker audio headset, and monitor
physical (layer 1), LAPD (layer 2), and Q.931 (layer 3) results.
Before testing, review each of the following sections:
Features and capabilities on page 33
Specifying General settings on page 33
Specifying Call settings on page 35
Specifying Decode filter settings on page 37
Placing calls on page 37
Receiving calls on page 38
Inserting voice traffic into a call on page 39
Performing BER analysis of a call on page 40
Transmitting DTMF tones on page 41
Disconnecting a call on page 41
Observing ISDN PRI results on page 41

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Features and capabilities

Using your instrument, you can also do the following:

Place and receive calls using the standard transmit-receive DS1 interfaces. After a call is established, you can insert voice traffic into the associated B Channel, or perform BERT analysis on the B Channel.
Emulate a network termination device such as a PBX or terminal equipment device (for example, an ISDN phone) using Terminal equipment (TE)
mode.
Emulate a switch or network termination device using Network termination
(NT) mode.
Process calls for switches using the following call control protocols:
AT&T 5ESS
Nortel DMS 100
National ISDN-2 (NI-2)
Passively monitor and analyze ISDN PRI service while the network is inservice.
Isolate and locate problems by viewing D channel decode text for all
captured transmitted and received frames when you monitor or terminate
ISDN PRI service. After viewing the decode text, you can save the text to a
file on the instrument.
Perform BERT analysis of a B channel.

Specifying General settings

Before monitoring or placing ISDN PRI calls, you must specify settings such as
the emulation mode (TE or NT), call control, numbering plan, and the
D Channel number and rate.
To specify general settings
1 Using the Test Menu, select the DS1 ISDN PRI application (refer to
Table 6 on page 10 for a list of applications and test modes).
2 Select the Setup soft key, then select the ISDN tab. Select the General
subtab, then specify the following settings:
Setting

Value

Emulation

Select an emulation mode:

TE Emulation. If you select this setting,
the instrument places a call to the network
as if the call was originated from a PBX or
a TE device.
NT Emulation. If you select this setting,
the instrument places a call to a TE as if
the call was originated by another TE on
the network.

Call Control

Select one of the following:

N1-2 (National). For National ISDN-2
(NI-2) compliant switches.
5ESS. For AT&T 5ESS.
DMS 100. For Nortel DMS 100.
NOTE: The majority of ISDN providers use
the N1-2 call control protocol. 5ESS and
DMS 100 are typically used by providers who
have a custom or proprietary method for
implementing ISDN.

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Setting

Value

Numbering Type

Select one of the following:

National
Auto
International
Local
Unknown
NOTE: The numbering type refers to the format and number of digits used when a caller
dials a phone number. For example, National
indicates a 10 digit number is used; Local
indicates a 7 digit number is used.

Numbering Plan
(5ESS and DMS 100 only)

Select one of the following:

Unknown
ISDN
Private
NOTE: Calls using NATIONAL call control
always use an ISDN numbering plan.

D Channel

Enter the time slot number for the D channel.

The default is 24.

D Channel Rate

Set the D Channel Rate to one of the following:

56K
64K
NOTE: 64K is typically the rate for D channels.

HDLC Mode

Set the HDLC mode to one of the

following:
Normal
Inverted
NOTE: Normal is typically the correct mode.

Transit Network ID

Specify the transit network ID for the network

that the call will be routed to.

Operator System Access

Specify one of the following for the operator

system access:
Principal. If the default operator system
for the network is used, select Principal.
Alternate. If an alternate operator system
has been established by subscription,
select Alternate.
None. If no operator system is used,
select None.

The general settings for the call are specified.

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Specifying Call settings

Before monitoring or placing ISDN PRI calls, you must specify settings for the
calls such as the call type, bearer rate (for data calls), and the number to call.
1 Using the Test Menu, select the DS1 ISDN PRI application (refer to
Table 6 on page 10 for a list of applications and test modes).
2 Select the Setup soft key, then select the ISDN tab. Select the Call
subtab, then specify the following settings:
Setting

Value

Call Type

Select a call type:

Voice
3.1k Audio
Data

Bearer Rate
(Data calls only)

If you are placing a data call, select one of the

following rates:
64K
56K
Nx64K
H0

B Channel

Select a channel (1 - 24), or select Any to

place the call on any available channel.
NOTE: The Channel parameter is not applicable for Nx64K or H0 data calls. Use the Channel Map option to specify the FT1 channels
for Nx64K calls, and the H0 setting to select a
range of channels for H0 calls.

Channel Map

If you selected Nx56K for a data call, select

the FT1 channels. When selected, a green
check mark appears to the left of the channel
number.

H0 Channel

If you selected H0 as your bearer rate, specify

one of the following H0 Channel ranges:
1-6
7 - 12
13 - 18
19 - 24

Directory Number

Enter the number the instrument is using to

identify the line for the outgoing call using up
to 30 digits. Think of this as the caller ID of the
call placed from the instrument.

Number to Call

Enter the number to call using up to 30 digits,

*, and #.

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Setting

Value

Call Answer Mode

If you want to change the current call answer

mode for the instrument, select one of the following modes:
Prompt. Prompt mode sets up the instrument to prompt you to accept, reject, or
ignore each incoming call as it comes in. If
you ignore a call, you can answer or reject
the call later.
Accept. Accept mode sets up the instrument to automatically accept the first
incoming call, and then reject any additional calls. You can always check the
Summary Results screen to see if a call is
active on the instrument.
Reject. Reject mode sets up the instruments to automatically reject all incoming
calls.

Presentation Indicator Status

Select one of the following:

Enabled. When enabled, it provides the
ability to control the presentation indicator
when a directory number (DN) is provided.
This is necessary when making interLATA calls through certain switches.
Disabled.

Presentation Indicator
(Presentation Indicator Status must be Enabled)

This indicates whether the calling line identity

is allowed to be presented.
Presentation Allowed
Presentation Restricted
Number Not Available

Screening Indicator
(Presentation Indicator Status must be Enabled)

This provides information on the source and

the quality of the provided information.
Network Provided
User Provided Failed Screening
User Provided Passed Screening
User Provided Not Screened

The call settings are specified.

NOTE:
The call settings you specify only apply to the next outgoing call you make
using the instrument. The settings do not impact currently active calls or
incoming calls.

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Specifying Decode filter

settings

Before monitoring or placing ISDN PRI calls, you can optionally specify filter
settings for the calls such as the call type, bearer rate (for data calls), and the
number to call.
1 Using the Test Menu, select the DS1 ISDN PRI application (refer to
Table 6 on page 10 for a list of applications and test modes).
2 Select the Setup soft key, then select the ISDN tab. Select the Decode
subtab, then specify the following settings:
Setting

Value

Decode Filter

Select Enable.

L2 Filter

Enable this filter to capture and store only

layer 2 LAPD frames to the decode message
buffer. No additional criteria is required.

Called Number Filter

Enable this filter if you want to capture and

store messages for calls placed to a particular
number, then specify the called number.

Calling Number Filter

Enable this filter if you want to capture and

store messages for calls placed from a particular number, then specify the calling number.

Bearer Capability Filter

Enable this filter if you want to capture and

store messages for voice, 3.1k audio, or data
calls, then specify the type of call.

Channel Number Filter

Enable this filter if you want to capture and

store messages for calls placed on a particular channel, then specify the channel.

The decode filter settings are specified. The instrument will filter the D channel
decode messages and then store them in the decode message buffer.

Placing calls

You can use the instrument to place calls by emulating a PBX or TE device, or
by emulating a switch or NT device. When you configure the instrument to
place a call, you specify the settings required to activate the physical layer (the
Interface settings), and initialize ISDN service over the D Channel (ISDN
settings).
After service is initialized, the instrument establishes a data link and is ready to
carry out ISDN call processing using the settings you specified.
NOTE:
You will not hear a dial tone when you place calls from the instrument. This
is normal for devices placing ISDN calls.
To place an ISDN PRI call
1 Using the Test Menu, select the DS1 ISDN PRI application in Terminate
mode (refer to Table 6 on page 10 for a list of applications and test
modes).

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2 Select the Setup soft key, then select the Interface tab. Specify the applicable settings for the DS1 interface rate:
Receiver Settings: Specify the input sensitivity and, if applicable, the
line coding method for the receiver or receivers.
Transmitter Settings: Specify the clock source and offset, and the line
build out (LBO) and line coding method for the transmitter.
3 Specify the following settings:
Framing settings: ESF or D4(SF)
Pattern settings (if you intend to BER test the call)
ISDN settings (see Specifying General settings on page 33, Specifying Call settings on page 35, and Specifying Decode filter settings
on page 37).
4 Connect the instrument to the test access point.
5 Select the Results soft key to return to the Main screen, then verify the
following:
The Signal Present and Frame Sync LEDs are illuminated.
In the ISDN Stats result category, verify that the LAPD State result says
Mult. Frm. Est.
6 Select the Call Controls tab on the Action bar, then select the
Connect Call button.
7 Answer the call on the receiving device.
8 Verify that the call status is CONNECTED by observing the Call Status result
screen. If it is not connected, the cause value (indicating the reason the
call was not connected) appears on the screen. See Understanding the
Q.931 Cause Values on page 244 for descriptions of each code.
After the call is connected, additional action buttons appear on your instrument. For example, buttons appear that allow you to BERT, idle, and disconnect the call. You can also use a button to insert DTMF tones.
The call is placed.

Receiving calls

If you set up the instrument to prompt you whenever a call comes in, Action
buttons will appear prompting you to accept, reject, or ignore each incoming
call. If you choose to ignore a call, you can accept or reject it later using the
Answer Call or Reject Call button.
To receive an ISDN PRI call
1 Using the Test Menu, select the DS1 ISDN PRI application in Terminate or
Dual Monitor mode (refer to Table 6 on page 10 for a list of applications
and test modes).
2 Select the Setup soft key, then select the Interface tab. Specify the applicable settings for the DS1 interface rate:
Receiver Settings: Specify the input sensitivity and, if applicable, the
line coding method for the receiver or receivers.
Transmitter Settings: Specify the clock source and offset, and the line
build out (LBO) and line coding method for the transmitter.

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3 Specify the following settings:

Framing settings: ESF or D4(SF)
Pattern settings (if you intend to BER test the call)
ISDN settings (see Specifying General settings on page 33, Specifying Call settings on page 35, and Specifying Decode filter settings
on page 37).
4 Connect the instrument to the test access point.
5 Select the Results soft key to return to the Main screen, then verify the
following:
The Signal Present and Frame Sync LEDs are illuminated.
In the ISDN Stats result category, verify that the LAPD State result says
Mult. Frm. Est.
6 Place the call using the test instrument or device on the far end. A
message appears on your instrument indicating that a call is coming in.
7 Select the Call Controls tab on the Action bar, then do one of the following:
To answer the call, select the Answer Call.
To ignore the call, select Ignore Call.
To reject the call, select Reject Call.
8 Verify that the call status is CONNECTED by observing the Call Status result
screen. If it is not connected, the cause value (indicating the reason the
call was not connected) appears on the screen. See Understanding the
Q.931 Cause Values on page 244 for descriptions of each code.
The call is received and connected.

Inserting voice traffic into a

call

When you place or receive a voice call using the instrument, you can use a
USB headset to insert voice traffic into the calls B Channel. Be certain to use
a JDSU recommended headset with the instrument.
To insert voice traffic into a call
1 If you are using a headset, connect it to the instrument.
2 Do one of the following:
If you are placing a call, specify the required settings for the call (see
Placing calls on page 37).
If you are receiving a call, accept the call (see Receiving calls on
page 38).
3 Verify that the call status is CONNECTED by observing the Call Status result
screen. If it is not connected, the cause value (indicating the reason the
call was not connected) appears on the screen. See Understanding the
Q.931 Cause Values on page 244 for descriptions of each code.
4 If no other call is currently using the headset, the instrument automatically
connects the call.
5 Speak into the headset.
Voice traffic is inserted into the call.

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Performing BER analysis of a

call

When you place or receive calls using the instrument, you can perform BER
analysis of the B channel used after each call is connected. In addition to
providing T1 results, the instrument provides statistics collected on the
D Channel and results based on the BER analysis of the B Channel.
To BER test a B Channel
1 Select the Setup soft key, then select the Pattern tab.
2 Select a BERT pattern (for example, 2^23-1).
NOTE:
If a call is connected, both ends are configured for BER analysis (rather
than audio), and your interface settings are specified, you can automatically
detect the correct BERT pattern for the circuit by pressing the Auto button
on the Main screen.
3 Do one of the following:
If you are placing a call, see Placing calls on page 37.
If you are receiving a call, accept the call (see Receiving calls on
page 38).
4 On the Main screen, verify the following:
The Signal Present and Frame Sync LEDs are illuminated.
In the ISDN Stats result category, verify that the LAPD State result says
Mult. Frm. Est.
5 Verify that the call status is CONNECTED by observing the Call Status result
screen. If it is not connected, the cause value (indicating the reason the
call was not connected) appears on the screen. See Understanding the
Q.931 Cause Values on page 244 for descriptions of each code.
6 Select the Call Controls tab on the Action bar, then select BERT Call to
start transmitting the pattern.
7 Optional. Insert five Bit / TSE errors (see Verifying performance on
page 16), and then verify that the five errors were received in the BERT
result category.
The error or errors are inserted into the B Channel.
8 Check the Summary Results or BERT Results screen on the instruments
at each end of the circuit to verify that they received the inserted errors.
9 Optional. If you want to insert voice traffic into the B Channel, do the
following:
a Select Audio Call.
b Speak into the headset.
10 To disconnect the call, select Disconnect Call.
BER testing is complete.

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Transmitting DTMF tones

To insert DTMF tones into a connected call

1 On the Call Controls tab, select DTMF. A keypad appears.
2 Use the keypad to enter the tones.
3 Select Exit to return to the Main screen.
The tones are inserted, and can be heard on the receiving device.

Disconnecting a call

To disconnect a call, do the following

On the Call Controls tab, select Disconnect Call.

Observing ISDN PRI results

You can observe test results for during IDSN testing in the ISDN and Call result
groups. For details, see Channel test results on page 183 and Traffic test
results on page 183.

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Chapter 3

SONET and SDH Testing

3
This chapter provides step-by-step instructions to perform SONET and SDH
tests. Topics discussed in this chapter include the following:
About SONET and SDH testing on page 44
Specifying the Tx clock source on page 59
Measuring optical power on page 59
Running J-Scan on page 60
BER testing on page 63
Drop and insert testing on page 66
Inserting errors, anomalies, alarms, and defects on page 68
Measuring round trip delay on page 70
Measuring service disruption time on page 71
Viewing a TOH group on page 72
Manipulating overhead bytes on page 73
Capturing POH bytes on page 74
Specifying the J0 or J1 identifier on page 75
Inserting the C2 Path signal label on page 77
Manipulating K1 or K2 APS bytes on page 79
Manipulating the S1 byte on page 80
Adjusting pointers on page 81
Verifying performance on page 84
Monitoring the circuit on page 85

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About SONET and SDH testing

If your instrument is configured and optioned to do so, you can use it to analyze
the performance of SONET and SDH networks by performing BER tests,
manipulating and analyzing overhead bytes, adjusting pointers, and verifying
that performance conforms to the industry performance standards.
When you configure the instrument for SONET or SDH testing, a number of the
test parameters vary depending on the protocol (SONET or SDH), rate, and
payload you select.

Features and capabilities

When testing SONET and SDH service, you can generate and analyze muxed
and bulk payloads ranging from 51 Mbps to 100 Gbps for a variety of transport
rates. The instruments also support the following:
BER testingYou can transmit and detect BERT patterns for each rate
available on the instrument.
Error/anomaly and alarm/defect insertionYou can insert a variety of
errors, anomalies, alarms, and defects into traffic, such as frame, code,
and logic errors.
Overhead byte manipulation and analysisYou can manipulate the value
of selected overhead bytes, such as the K1, K2, S1,and Z1 bytes.
Performance measurementYou can verify that performance complies
with ITU-T G.826, G.828, G.829, M.2101, T1.231, and T1.514 recommendations, with the exception of the 40G/100G High Speed Transport
Module.
Round trip delay measurementYou can verify that a circuit complies with
round trip delay requirements as specified in a customers service level
agreement.
Tandem connection monitoringYou can monitor and compare performance of Path segments with the aid of the N bytes in the Path overhead.
Intrusive through mode testingYou can monitor a received signal in
through mode, and then pass the signal through the unit to the transmitter.
The unit will resolve any received line code violations before transmitting
the signal. You can also optionally insert errors or alarms into the transmitted signal (see Inserting errors, anomalies, alarms, and defects on
page 68).
Drop and insert testingWhen testing in through mode, you can insert
one channel while non-intrusively passing the remainder of the signal
through unaffected. For example, you can monitor an OC-48 signal, and
then drop a DS3 signal and insert a BER pattern into the DS3 signal,
leaving the rest of the signal as it was received. For details, see Drop and
insert testing on page 66. (N/A 40/100G Transport Module)
Service disruption measurementsYou can measure service disruption
time resulting from signal loss or a variety of errors, anomalies, alarms, or
defects. For details, see Measuring service disruption time on page 71.
Pointer Stress SequencesYou can adjust pointers using the Pointer
Stress Sequences. For details, see Adjusting pointers on page 81.
SDH alarm suppression.
Multiplexed SDH signal analysis from OTN interfaces. You now generate
and analyze bulk BERT payloads in multiplexed SDH signals down to
VC-3. For details, refer to Chapter 6 OTN Testing.

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About SONET and SDH testing

Multiplexed SONET signal analysis from OTN interfaces. You can

generate and analyze bulk BERT payloads in multiplexed SONET signals
down to STS-1. For details, refer to Chapter 6 OTN Testing.
NextGen testingIf your instrument is configured and optioned to do so,
you can verify and troubleshoot NextGen service on your network. For
details, refer to Chapter 5 NextGen Testing.
J-Scan (automatic tributary discovery)The J-Scan application helps you
discover the structure of a SONET or SDH circuit, and then displays a
navigable map of the circuit and its tributaries. You can then check the
status for each of the tributaries, and select them for detailed testing. For
details, refer to Running J-Scan on page 60.
Improved latency resolutionWhen transmitting high-order SDH or
SONET signals carrying Bulk BERT payloads, latency (delay) can now be
measured with a 100 s resolution for STS-1 and AU-3 or VC-3 signals,
and 10 s for signals up to VC-4-64c or STS-192c. All other signals and
mappings are measured with 1 ms resolution.
Path overhead capturesYou can capture high or low path overhead
bytes for a particular tributary for analysis. When configuring the capture,
you can indicate that you want to capture it manually, or specify a trigger to
automate the capture. For details, see Capturing POH bytes on page 74.
STL Layer Testingthe STL layer applies to the OC_768/STM-256 interfaces on the 40/100G Transport Module. With LR 4 optics (4 wavelengths), errors and alarms can be injected for testing. With serial (FR)
optics, the STL layer is used but a number of alarms/errors are non-deterministic.

Understanding the LED panel

When you setup the instrument, you can specify whether the SDH and SONET
LED panels should emulate the LEDs on the JDSU ANT platform or the JDSU
TestPad 2000 platform. If the LEDs are not what you expect or are accustomed
to seeing, verify that the correct emulation mode is selected for your module.
SONET and SDH LEDs are also available when running OTN, 10GigE WAN,
and NextGen applications.

Understanding the graphical

user interface

The names of various elements on the graphical user interface change

depending on whether you select a SONET or SDH test application. For
example, the button that you use to insert errors or anomalies is labeled
Insert Error if you selected a SONET application; the same button is labeled
Insert Anomaly if you selected a SDH application.
Additional elements are available when the instrument is used for NextGen
testing. For details, refer to About the NextGen user interface on page 116.

Understanding SONET and

SDH test results

Many SDH and SONET standards are identical; therefore, the instrument
provides similar results for SONET and SDH test applications. See SONET/
SDH results on page 187 for a description of each test result.
Additional test results are available when the instrument is used for NextGen
testing. For details, refer to Understanding the NextGen test results on
page 119.

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SONET and SDH test modes

Terminate and monitor test modes are supported for each of the SONET and
SDH applications:
Terminate modeSelect terminate mode to generate, transmit, and analyze
traffic. In terminate mode, the module generates traffic independent of the
received traffic, and allows you to select a tributary to analyze down to the
lowest level available depending on the framing and mapping. The specified
tributary will be used for carrying the data generated by the module. The same
mapping, tributary, and BERT pattern selections will apply to both transmitted
and received traffic.
The transmitter and receiver are set at the same rate using an internal, recovered, or 1.5/2M reference transmit clock.
Monitor modeSelect monitor mode to monitor and analyze traffic. When
monitoring traffic for optical rates a splitter may be required to connect to the
circuit under test.
Through modeSelect through mode if you want your unit to emulate section
terminating equipment or a repeater. When you test in through mode, the unit
can originate specific bytes in the section overhead, and then clean up any
errors detected in the received signal for those specific bytes.
When testing in through mode, all data from sub-rates is untouched, and is
passed through the unit as it was received. For example, if you drop a DS1
from a DS3 signal, no errors, anomalies, alarms, or defects can be inserted
into the DS1 signal.
Drop and insert modeSelect drop and insert mode if you want to insert one
channel of a dropped signal while non-intrusively passing the remainder of the
signal through unaffected. The inserted channel carries a BERT pattern which
allows you to analyze the payload for the dropped signal. For example, if you
drop a DS3 from an STS-1 signal, you can select a specific DS3 channel, and
then insert a BERT pattern as the payload before transmitting the signal for
analysis. (N/A 40/100G Transport Module)
In addition to inserting a BERT payload, you can also manipulate specific overhead bytes, including path layer errors, alarms, and path parameters (for
example, the path trace byte). For this reason, the unit will automatically recalculate SONET and SDH B1 and B2 overhead bytes.

SONET test applications

Table 11 lists each of the SONET test applications, In addition to these applications, a J-Scan application is available (in Monitor mode) for each interface
line rate except OC768.
NextGen (VCAT, LCAS, and GFP) test applications are listed and explained in
Chapter 5 NextGen Testing.

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Table 11 SONET test applications

Signal

Rate

STS-1

DS3

VT-1.5

OC-3

STS-1

DS3

VT-1.5

Payload

Test Mode

Bulk BERT

Terminate
Through
Monitor
Dual Monitor
Drop+Insert

DS3 BERT

Terminate
Through
Monitor
Drop+Insert

DS1 BERT
E1 BERT

Terminate
Through
Monitor

BULK BERT
DS1 BERT

Terminate
Through
Single Monitor

STS-3c Bulk BERT

Terminate
Through
Monitor
Drop+Insert

Bulk BERT

Terminate
Through
Monitor
Drop+Insert

DS3 BERT

Terminate
Through
Monitor
Drop+Insert

DS1 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT
DS1 BERT

Terminate
Through
Monitor

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Table 11 SONET test applications (Continued)

Signal

Rate

OC-12

STS-1

DS3

VT-1.5

OC-48

STS-1

DS3

VT-1.5

Payload

Test Mode

STS-12c Bulk BERT

STS-3c Bulk BERT

Terminate
Through
Monitor
Drop+Insert

Bulk BERT

Terminate
Through
Monitor
Drop+Insert

DS3 BERT

Terminate
Through
Monitor
Drop+Insert

DS1 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT
DS1 BERT

Terminate
Through
Monitor

STS-48c Bulk BERT

STS-12c Bulk BERT
STS-3c Bulk BERT

Terminate
Through
Monitor
Drop+Insert

Bulk BERT

Terminate
Through
Monitor
Drop+Insert

DS3 BERT

Terminate
Through
Monitor
Drop+Insert

DS1 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT
DS1 BERT

Terminate
Through
Monitor

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Table 11 SONET test applications (Continued)

Signal

Rate

OC-192

STS-1

DS3

VT-1.5

OC-768

STS-1

SDH test applications

Payload

Test Mode

STS-192c Bulk
BERT
STS-48c Bulk BERT
STS-12c Bulk BERT
STS-3c Bulk BERT

Terminate
Through
Monitor
Drop+Insert

Bulk BERT

Terminate
Through
Monitor
Drop+Insert

DS3 BERT

Terminate
Through
Monitor
Drop+Insert

DS1 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT
DS1 BERT

Terminate
Through
Monitor

STL BERT

Terminate
Monitor

STS-768c Bulk
BERT
STS-192c Bulk
BERT
STS-48c Bulk BERT
STS-12c Bulk BERT
STS-3c Bulk BERT

Terminate
Through
Monitor

Bulk BERT

Terminate
Through
Monitor

If your unit is configured and optioned to do so, you can test SDH interfaces
ranging from STM-1e to STM-256.
For STM-1e applications, see Table 12 on page 50.
For STM-1 applications, see Table 13 on page 52.
For STM-4 applications, see Table 14 on page 54.
For STM-16 applications, see Table 15 on page 55.
For STM-64 applications, see Table 16 on page 57.
For STM-256 applications, see Table 17 on page 58
In addition to the applications listed in Table 12 on page 50 through Table 17
on page 58, a J-Scan application is available (in Monitor mode) for all interface
line rates except STM-256.

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NextGen (VCAT, LCAS, and GFP) test applications are listed and explained in
Chapter 5 NextGen Testing.

STM-1e test applications

Table 12 lists each of the supported STM-1e terminate and monitor test applications.

Table 12 STM-1e test applications

Rate
AU-4

Payload

Test Mode

Bulk BERT

Terminate
Through
Monitor
Drop+Insert

E4 BERT

Terminate
Through
Monitor
Drop+Insert

E3 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT

Terminate
Through
Monitor

DS3

DS3 BERT
E1 BERT
DS1 BERT

Terminate
Through
Monitor

E3 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT
E1 BERT

Terminate
Through
Monitor

VC-4

VC-3

VC-12

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Table 12 STM-1e test applications (Continued)

Rate
AU-3

VC-3

DS3

VC-12

Payload

Test Mode

Bulk BERT

Terminate
Through
Monitor
Drop+Insert

DS3 BERT

Terminate
Through
Monitor
Drop+Insert

E1 BERT
DS1 BERT

Terminate
Through
Monitor

E3 BERT

Terminate
Through
Monitor
Drop+Insert

E1 BERT

Terminate
Through
Monitor

Bulk BERT
E1 BERT

Terminate
Through
Monitor

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STM-1 test applications

Table 13 lists each of the supported STM-1 terminate and monitor test applications.

Table 13 STM-1 test applications

Rate
AU-4

Payload

Test Mode

Bulk BERT

Terminate
Through
Monitor
Drop+Insert

E4 BERT

Terminate
Through
Monitor
Drop+Insert

E3 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT

Terminate
Through
Monitor

DS3

DS3 BERT
E1 BERT
DS1 BERT

Terminate
Through
Monitor

E3 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT
E1 BERT

Terminate
Through
Monitor

VC-4

VC-3

VC-12

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Table 13 STM-1 test applications (Continued)

Rate
AU-3

VC-3

DS3

VC-12

Payload

Test Mode

Bulk BERT

Terminate
Through
Monitor
Drop+Insert

DS3 BERT

Terminate
Through
Monitor
Drop+Insert

E1 BERT
DS1 BERT

Terminate
Through
Monitor

E3 BERT

Terminate
Through
Monitor
Drop+Insert

E1 BERT

Terminate
Through
Monitor

Bulk BERT
E1 BERT

Terminate
Through
Monitor

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STM-4 test applications

Table 14 lists each of the supported STM-4 terminate and monitor test applications.

Table 14 STM-4 test applications

Rate

Payload

Test Mode

AU-4

VC-4-4c Bulk BERT

Terminate
Through
Monitor
Drop+Insert

Bulk BERT

Terminate
Through
Monitor
Drop+Insert

E4 BERT

Terminate
Through
Monitor
Drop+Insert

E3 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT

Terminate
Through
Monitor

DS3

DS3 BERT
E1 BERT
DS1 BERT

Terminate
Through
Monitor

E3 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT
E1 BERT

Terminate
Through
Monitor

VC-4

VC-3

VC-12

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STM-16 test applications

Table 15 lists each of the supported STM-16 terminate and monitor test applications.

Table 15 STM-16 test applications

Rate

Payload

Test Mode

AU-4

VC-4-16c Bulk BERT

VC-4-4c Bulk BERT

Terminate
Through
Monitor
Drop+Insert

Bulk BERT

Terminate
Through
Monitor
Drop+Insert

E4 BERT

Terminate
Through
Monitor
Drop+Insert

E3 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT

Terminate
Through
Monitor

DS3

DS3 BERT
E1 BERT
DS1 BERT

Terminate
Through
Monitor

E3 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT
E1 BERT

Terminate
Through
Monitor

VC-4

VC-3

VC-12

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Table 15 STM-16 test applications (Continued)

Rate
AU-3

VC-3

DS3

VC-12

Payload

Test Mode

Bulk BERT

Terminate
Through
Monitor
Drop+Insert

DS3 BERT

Terminate
Through
Monitor
Drop+Insert

E1 BERT
DS1 BERT

Terminate
Through
Monitor

E3 BERT

Terminate
Through
Monitor
Drop+Insert

E1 BERT

Terminate
Through
Monitor

Bulk BERT
E1 BERT

Terminate
Through
Monitor

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STM-64 test applications

Table 16 lists each of the supported STM-64 terminate and monitor test applications.

Table 16 STM-64 test applications

Rate

Payload

Test Mode

AU-4

VC-4-64c Bulk BERT

VC-4-16c Bulk BERT
VC-4-4c Bulk BERT

Terminate
Through
Monitor
Drop+Insert

Bulk BERT

Terminate
Through
Monitor
Drop+Insert

E4 BERT

Terminate
Through
Monitor
Drop+Insert

E3 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT

Terminate
Through
Monitor

DS3

DS3 BERT
E1 BERT
DS1 BERT

Terminate
Through
Monitor

E3 BERT
E1 BERT

Terminate
Through
Monitor

Bulk BERT
E1 BERT

Terminate
Through
Monitor

VC-4

VC-3

VC-12

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Table 16 STM-64 test applications (Continued)

Rate
AU-3

VC-3

DS3

VC-12

STM-256 test applications

Payload

Test Mode

Bulk BERT

Terminate
Through
Monitor
Drop+Insert

DS3 BERT

Terminate
Through
Monitor
Drop+Insert

E1 BERT
DS1 BERT

Terminate
Through
Monitor

E3 BERT

Terminate
Through
Monitor
Drop+Insert

E1 BERT

Terminate
Through
Monitor

Bulk BERT
E1 BERT

Terminate
Through
Monitor

Table 17 lists each of the supported STM-256 terminate, through and monitor
test applications.

Table 17 STM-256 test applications

Rate

AU-4

AU-3

VC-4

VC-3

Payload

Test Mode

STL BERT

Terminate
Monitor

VC-4-256c Bulk BERT

VC-4-64c Bulk BERT
VC-4-16c Bulk BERT
VC-4-4c Bulk BERT

Terminate
Through
Monitor

Bulk BERT

Terminate
Through
Monitor

Bulk BERT

Terminate
Through
Monitor

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Specifying the Tx clock source

You specify the Tx clock (timing) source on the Interface setup screen.
To set the Tx clock source
1 Using the Test Menu, select the terminate test application for the signal,
rate, and payload you are testing (refer to Table 11 on page 47 through
Table 16 on page 57 for a list of applications).
2 Select the Setup soft key, and then select the Interface tab. Select the
arrows to the right of the Clock Source field, and then select one of the
following:
Internal. Select Internal to derive timing from the MSAMs clock, and
then specify any required frequency offset in PPM.
Recovered. Select Recovered to recover timing from the received
signal.
External - Bits/Sets. Select External - Bits/Sets timing to derive timing
from one of the following signals, in the following order: BITS, SETS, or
2.048 MHz clock.
3 Select the Results soft key to return to the Main screen, or select another
tab to specify additional test settings.
The Tx clock source is specified.

Measuring optical power

You can use your instrument to measure the optical power of a received signal.
To measure optical power
1 Using the Test Menu, select the terminate test application for the signal,
rate, and payload you are testing (refer to Table 11 on page 47 through
Table 16 on page 57 for a list of applications).
2 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
3 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
4 Select the Laser button.
5 Loop back the far-end of the network.

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Running J-Scan

6 Verify the following LEDs

If your module is in TestPad mode, verify that the following LEDs are
green:
SONET

SDH

Signal Present

Frame Sync

Path Ptr Present

AU Ptr Present

Concat Payloada

Pattern Sync

a. If you selected a concatenated payload when you configured your test.

If your module is in ANT mode, verify that the following LEDs are not
red:
SONET and SDH
LOS
LOF
LSS

7 Display the Interface result group, and then observe the Optical Rx Level
(dBm) test result.
Optical power is measured.

Running J-Scan
The J-Scan application helps you discover the structure of a SONET or SDH
circuit, and displays a list and a map of the containers and channels detected.
You can then use the list or map to select a particular channel for further
testing. (N/A 40/100G Transport Module)
For the purpose of clarity, the term channel is used throughout this section to
refer to the various channels, paths, or tributaries detected in SONET or SDH
container signals.

Displaying a map of the

signal structure

To display a map showing the SONET or SDH signal structure

1 Connect the instrument to the interface for the circuit you are testing (refer
to the Getting Started Manual for your instrument).
2 Using the Test Menu, select the J-Scan application for the interface the
instrument is connected to (refer to Table 11 on page 47 through Table 16
on page 57 for a list of applications).
3 Verify that a signal is present, and that you have frame synchronization.

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Running J-Scan

4 Select the J-Scan softkey. The instrument automatically displays a map

showing the high path structure of the detected containers and channels
(see Figure 4).

Figure 4

Signal Map Page

If you want to see the Path Trace (J1) for a particular SONET circuit, it is
provided in the standard SONET Path results on the Main screen.
5 If you want to display a map of the low path tributaries (SONET VT-1.5 or
SDH VC-12), select the Low Path button.
A map of the signal structure is displayed, and the first channel is monitored.

Sorting the channels

After displaying the channels, you can sort them by Container ID or Channel
ID. This may be useful before scanning the channels to check their status,
especially if there are multiple containers.
To sort the displayed containers and channels
1 In Sort by, select the criteria (Container or Channel).
2 Select Sort.
The containers and channels are sorted using the criteria you selected. After
scanning the mapped channels for their labels and status, you can also optionally sort the containers and channels by Signal label or Status.

Scanning the map

After the instrument displays a map of the containers and channels, you can
do the following:
Scan the map using the High Path Scan or Low Path Scan button to
quickly determine the signal label and status for each monitored channel.
Select a particular channel to observe detailed test results on the Main
screen.

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Running J-Scan

Test a particular channel thoroughly using the Start Test button.

Sort Options

Interface LEDs

Signal
Structure
View

Channel List

Scan Button
Channel Details

Start Test

Figure 5

High Path Low Path Navigation

Scanned Monitored, Errored, and Ok Channels

To scan the mapped channels
1 Display the signal map (see Displaying a map of the signal structure on
page 60). Remember to use the Low Path button if you want to observe
VT-1.5 or VC-12 tributaries.
2 Do one of the following:
If you want to scan high path tributaries, select High Path Scan.
If you want to scan low path tributaries, select Low Path Scan.
The instrument scans the channels, and then displays the Signal Label and
Status for each channel sequentially. In Figure 5, all displayed channels have
been scanned. The STS-12c channel is errored due to an Alarm condition, and
the instrument is actively monitoring the STS-9c channel.
NOTE:
STS-6c, STS-9c, and STS-24c channels are not standard and therefore are
rarely encountered; however, the instrument can detect and monitor them.

Testing a channel

You can test a particular channel by selecting it on the map, and then launching
the test using the Start Test button.
To test a channel
1 Select the channel on the list or map.
2 Select Start Test, and then select the test for the channel.
The instrument selects the channel, launches the test, and takes you automatically to the Main screen where you can observe results for the tested channel.

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BER testing

Using Restart to reset the

status

When running the J-Scan application, pressing the Restart soft key clears the
Signal Label and Status for each channel. It does not re-scan the circuit for
currently active channels. You can then actively re-scan the circuit using the
High Path Scan or Low Path Scan button.

Understanding J-Scan results

When you run the J-Scan application, the list and map of the channels is color
coded.
Errored channels appear in red with an X to the left of the Container ID.
Unerrored channels appear on a white background with a blue check mark
to the left of the Container ID.
Monitored channels appear in yellow, with a circular arrow to the left of the
Container ID.
Detailed test results for the currently selected channel are available on the
Main screen. For example, if you ran the application from a SONET interface,
the standard Section, Line, Path, and VT results are all provided for the
channel that you selected from the list or map of the circuit.
For details, see Step 5: Viewing test results on page 4 of Chapter 1 Basic
Testing, and SONET/SDH results on page 187 of Chapter 7 Test Results.

Re-scanning the circuit

To re-scan the circuit after launching the J-Scan application

Press Low Path Scan or High Path Scan.
The instrument re-scans the circuit to provide the Signal Label and Status for
each channel.

BER testing
The following procedure illustrates a typical scenario for:
Setting up an instrument to terminate a SONET or SDH signal for BER
testing.
Inserting errors, anomalies, alarms, and defects on concatenated signals.
NOTE: Changing BERT patterns
If you change a BERT pattern during the course of your test, be certain to
press the Restart soft key to ensure that you regain pattern sync.

Specifying a BERT pattern

You can configure your instrument to transmit a variety of ITU or ANSI patterns
when performing BER tests.
To specify a BER pattern
1 Using the Test Menu, select an application with a BERT payload for the
interface, administrative unit (if applicable), and virtual container you are
testing (refer to Table 11 on page 47 through Table 17 on page 58 for a list
of applications).

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2 Select the Setup soft key, then the Pattern tab. Select from the following
TX and RX patterns (except where noted):
PRBS 31
PRBS 31 Inv
PRBS 23
PRBS 23 Inv
PRBS 9
PRBS 9 Inv
Delay
Live (RX only)
NOTE:
You can automatically detect and transmit the correct BERT pattern for the
circuit by pressing the Auto button on the Main screen after you specify you
interface settings. See Detecting the received BER pattern on page 65.
3 Select the Results soft key to return to the Main screen.
The pattern is specified.

Running a BER test

To run a SONET or SDH BER test

1 Using the Test Menu, select the terminate test application for the signal,
rate, and payload you are testing (refer to Table 11 on page 47 through
Table 17 on page 58 for a list of applications).
2 If you selected a E1 BERT payload, and you want to specify timeslots for
your test, proceed to step 3, otherwise, proceed to step 8.
3 Select the PDH tab, and then select the N x 64 Setup tab.
4 Select the arrow to the right of the Payload Type field, and then specify
one of the following:
Bulk. Proceed to step 8.
Fractional 2M. The Timeslot configuration appears. Proceed to step 5.
5 You can view the currently selected timeslots in the Timeslot screen. To
change the timeslots you want to test, select the Configure button.
The Configure Timeslot screen appears.
6 To configure the timeslot
To...

Do...

Select all the timeslots

Select the Select All button.

Deselect all the timeslots

Select the Clear All button.

Select a timeslot

Select the checkbox to the right of the timeslot

number.

Clear a timeslot

Clear the checkbox to the right of the timeslot

number.

7 Do one of the following:

To confirm and finish the timeslot configuration, select OK.
To cancel configuring the timeslot, select Cancel.
64

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8 Specify the BERT pattern (see Specifying a BERT pattern on page 63).
9 Select the Results soft key to return to the Main screen.
10 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
11 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
12 If you are testing an optical signal, select the Laser button.
13 Loop back the far-end of the network.
14 Verify the following LEDs
If your module is in TestPad mode, verify that the following LEDs are
green:
SONET

SDH

Signal Present

Frame Sync

Path Ptr Present

AU Ptr Present

Concat

Payloada

Pattern Sync

Concat Payloada
Pattern Sync

a. If you selected a concatenated payload when you configured your test.

If your module is in ANT mode, verify that the following LEDs are not
red:
SONET and SDH
LOS
LOF
LSS

15 Verify that All Results OK appears in the results display.

16 Optional. Insert five Bit / TSE errors (see Inserting errors, anomalies,
alarms, and defects on page 68), and then verify that the five errors were
received in the BERT result category.
17 Run the test for an appropriate length of time.
The BER test is finished.

Detecting the received BER

pattern

The instrument can also automatically detect the BER pattern on the received
signal.
To detect the received BER pattern
1 On the Main screen, press the Auto button:

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Drop and insert testing

A window appears indicating that the module detected the input signal and
then detected the received pattern.
2 Select Results to return to the Main screen, or Setup to configure additional test parameters.
The pattern is detected.

Drop and insert testing

The following procedure (N/A 40/100G Transport Module) illustrates a typical
scenario for:
Setting up the instrument to drop a received signal for analysis, and then
BERT test the signal or a particular channel on the signal.
Manipulating overhead bytes for the transmitted signal.
Inserting errors, anomalies, alarms, and defects into the transmitted
signal.
To drop a signal and then insert a BERT payload, error, anomaly, alarm, or defect
1 Using the Test Menu, select the drop and insert test application for the
signal, rate, and payload you are testing (refer to Table 11 on page 47
through Table 16 on page 57 for a list of applications).
2 Select the Setup soft key, and then select the SONET or SDH tab.
3 If you are testing a particular channel for the dropped signal, in the panel
on the left side of the tab, select Channel, and then do the following:
a Select the keypad next to the channel field, and then type the number
corresponding to the channel you are testing. The labels that appear
for the channel fields vary depending on the signal you are dropping for
testing. For example, if you are dropping a DS3 signal from an STS-1,
you can specify an STS-N channel for testing. If you are dropping a
VC-3 from an AU-3, you can specify an STM-N channel and an AU-3
channel for testing.
b If you want to transmit the BERT pattern in the same channel that you
are analyzing on the receiver, in the corresponding Tx=Rx field, select
Yes; otherwise, select No, and then specify the channel to transmit with
the BERT pattern.
If you selected the E1 BERT payload, and you want to specify timeslots for
your test, proceed to step 4, otherwise, proceed to step 9.
4 Select the PDH tab, and then select the N x 64 Setup tab.
5 Select the arrow to the right of the Payload Type field, and then specify
one of the following:
Bulk. Proceed to step 9.
Fractional 2M. The Timeslot configuration appears. Proceed to step 6.
6 You can view the currently selected timeslots in the Timeslot screen. To
change the timeslots you want to test, select the Configure button.
The Configure Timeslot screen appears.

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Drop and insert testing

7 To configure the timeslot

To...

Do...

Select all the timeslots

Select the Select All button.

Deselect all the timeslots

Select the Clear All button.

Select a timeslot

Select the checkbox to the right of the timeslot

number.

Clear a timeslot

Clear the checkbox to the right of the timeslot

number.

8 Do one of the following:

To confirm and finish the timeslot configuration, select OK.
To cancel configuring the timeslot, select Cancel.
9 To specify the BERT pattern to insert into the payload, select the Pattern
tab, and then from following Tx and Rx patterns (except as indicated):
PRBS 31
PRBS 31 Inv
PRBS 23
PRBS 23 Inv
PRBS 9
PRBS 9 Inv
Delay
Live (Rx only
10 Select the Results soft key to return to the Main screen.
11 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
12 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
13 Select the Laser button.
14 Loop back the far-end of the network.

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Inserting errors, anomalies, alarms, and defects

15 Verify the following LEDs

If your module is in TestPad mode, verify that the following LEDs are
green:
SONET

SDH

PDH

Signal Present

Frame Sync

C-Bit Synca

Path Ptr Present

AU Ptr Present

Pattern Sync

Concat Payloadb

Concat Payloada

Pattern Sync

a. If you specified C-Bit framing for a dropped PDH signal

b. If you selected a concatenated payload when you configured your test.

If your module is in ANT mode, verify that the following LEDs are not
red:
SONET and SDH

PDH

LOS

LOF

FTM

LSS

16 Verify that All Results OK appears in the results display.

17 Select DI On to generate and transmit the signal with the BERT pattern
you specified.
18 Optional. Manipulate overhead bytes for the transmitted signal (see
Manipulating overhead bytes on page 73).
19 Optional. Use the buttons provided on the Main screen to insert errors,
anomalies, alarms, or defects (see Inserting errors, anomalies, alarms,
and defects on page 68).
20 Run the test for an appropriate length of time.
The drop and insert test is finished.

Inserting errors, anomalies, alarms, and defects

You can insert multiple types of errors or anomalies and alarms or defects
simultaneously.
NOTE:
Synchronous Transport Lane (STL) specification requires 32-byte lane
spacing but some serial CFP hardware exists that does not conform to this
specification. The 40/100G Transport Module is being shipped with a CFP
Skew value at 0. If, at a later time, hardware changes require a skew value
of 32, that can be set via the Expert Optics selections accessed via the
Setup soft key and then the Interface and Connection tabs.

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Inserting errors, anomalies, alarms, and defects

Inserting errors or anomalies

To insert errors or anomalies

1 Using the Test Menu, select the test application for the signal, rate, and
payload you are testing (refer to Table 11 on page 47 through Table 17 on
page 58 for a list of applications).
2 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
3 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
4 Select the Laser button.
5 On the Main screen, select the error or anomaly tab and then select the
error or anomaly to be inserted from the list.
6 Do the following:
For STL applications, select the Lane tab and then select the lanes into
which the Error is to be inserted.
If you selected a Frame/FAS Word error, select the keypad icon, type
the number of errors you want to insert (ranging from 1 to 32, or 1to
128 for STL), and then select OK.
If you selected any other type of error, specify the insert type (Single,
Burst (or Multiple) or Rate).
If you specified Burst (or Multiple), select the keypad icon, type the
number of errors or anomalies you want to insert, and then select OK.
If you specified Rate, select one of the error or anomaly rates for the
signal you selected when you configured your test
7 Press the Error Insert or Anomaly Insert button.
Error or anomaly insertion starts, and the associated button turns yellow.
Test results associated with the error or anomaly appear in the Status result
category.
To stop insertion
Press the Error Insert or Anomaly Insert button again.
Error or anomaly insertion stops, and the associated button turns grey.

Inserting alarms or defects

To insert alarms or defects

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Measuring round trip delay

8 Press the Alarm Insert or Defect Insert button.

The module inserts an alarm or defect, and the button turns yellow.
Test results associated with the alarm or defect appear in the Status result
category.
To stop insertion
Press the Alarm Insert or Defect Insert button again.
Alarm or defect insertion stops, and the button turns grey.

Measuring round trip delay

You can use the instrument to measure round trip delay by transmitting a delay
pattern, and then looping the pattern back to the module. The module calculates the amount of time it took the pattern to traverse the loop, and then
reports the duration (delay) in milliseconds (ms).
To measure round trip delay
1 Using the Test Menu, select the terminate test application for the signal,
rate, and payload you are testing (refer to Table 11 on page 47 through
Table 17 on page 58 for a list of applications).
2 Select the Setup soft key. A series of setup tabs appears.
3 Specify the Interface settings if the defaults are not acceptable.
4 Select the Pattern tab, and then select the Delay pattern.
5 To return to the Main screen, select the Results soft key.
6 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
7 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
8 If you are testing an optical signal, select the Laser button.
9 Loop back the far-end of the network.
10 Verify the following LEDs:
If your module is in TestPad mode, verify that the following LEDs are
green:
SONET

SDH

Signal Present

Frame Sync

Path Ptr Present

AU Ptr Present

Concat

Payloada

Pattern Sync

Concat Payloada
Pattern Sync

a. If you selected a concatenated payload when you configured your test.

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Measuring service disruption time

If your module is in ANT mode, verify that the following LEDs are not
red:
SONET and SDH
LOS
LOF
LSS

11 To observe the delay result, set one of the result windows to display the
Signal category.
Round trip delay is measured.

Measuring service disruption time

You can use the instrument to measure the service disruption time resulting
from a switch in service to a protect line. Before measuring the disruption time,
you can:
Indicate which events to measure (such as a Signal Loss or LOF).
Establish an acceptable length of time for the measurements by specifying
a Threshold Time. Measured times for an event that are less than or equal
to the Threshold Time pass the test, measured times that exceed the
Threshold Time fail the test.
Specify a Separation Time to indicate that the unit should count separate
events that occur within a very brief period of time as a single event. For
example, if you specify a Separation time of 300.000 ms and select AIS-L
as an event trigger, if more than one AIS-L occurs during a 300.000 ms
period, the unit will interpret the events as a single AIS-L disruption. The
count will not increase when another AIS-L occurs until at least
300.000 ms has transpired since the previous AIS-L.
To measure service disruption time
1 Using the Test Menu, select the terminate test application for the signal,
rate, and payload you are testing (refer to Table 11 on page 47 through
Table 17 on page 58 for a list of applications).
2 Select the Setup soft key. A series of setup tabs appears.
3 Select the Service Disruption tab.
4 Under Event Settings, do the following:
a Select Enable Service Disruption.
b Optional. To edit the displayed Separation Time, press the keypad
icon, and then type the new time in milliseconds (ms), or select Default
to restore the time to its default value (300.0 ms). This is the duration
during which each trigger of a specific type will be counted as a single
disruption event.
c Optional. To edit the displayed Threshold Time, press the keypad icon,
and then type the new time in milliseconds (ms), or select Default to
restore the time to its default value (50.0 ms). Disruption measurements that exceed this duration will be interpreted as failed.

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Viewing a TOH group

5 Under Event Triggers, do one of the following:

To measure disruption time for each of the triggers listed, select Set
ALL.
To measure disruption time for a specific trigger or group of triggers,
select Clear ALL, and then select each of the triggers for measurements.
NOTE: The available triggers vary depending on the test application you
selected. For example, DS3 triggers do not appear if you selected an
OC-3 > STS-1 > Bulk BERT > Terminate application; however, they do
appear if you selected an OC-3 > STS-1 > DS3 > DS3 BERT > Terminate
application.
6 If additional settings need to be modified to reflect the network configuration, select the appropriate tab, and then modify the settings as required.
7 To return to the Main screen, select the Results soft key.
8 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
9 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
10 To force the switch to a protect line, use one of the following methods:
Interrupt the signal. Physically interrupt the signal by pulling the signal
from the add-drop multiplexer (ADM).
Insert errors. Use another unit in through mode to insert errors until the
network switches to the backup lines.
The network switches to a protect line, the MSAM detects that service has
been disrupted, and then the module begins to measure the disruption
time in milliseconds until the condition returns to normal.
11 To observe the service disruption results, set one of the result windows to
display the Service Disruption Log, and set another window to display the
Service Disruption Log Stats.
Service disruption is measured for each of the triggers you selected. For
details on the associated test results, see Service Disruption Results on
page 200.

Viewing a TOH group

You can specify the TOH (Transport Overhead) group you want to view when
testing using the instrument.
To view a TOH group
1 Using the Test Menu, select the test application for the signal, rate, and
payload you are testing (refer to Table 11 on page 47 through Table 17 on
page 58 for a list of applications).
2 Select the Setup soft key, and then select the SONET or SDH tab.
3 In the panel on the left side of the tab, select Overhead.
A graphical display of the overhead bytes appears.

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Manipulating overhead bytes

4 Under Overhead Bytes, select the field to the right of the Analysis
Channel, type the TOH group number, and then select OK.
The selected TOH channel group appears in the Sonet Overhead result
display.

Manipulating overhead bytes

The following procedure describes how to manipulate the value of selected
overhead bytes, and then view the byte values in the Overhead result category.
To manipulate an overhead byte
1 Using the Test Menu, select the test application for the signal, rate, and
payload you are testing (refer to Table 11 on page 47 through Table 17 on
page 58 for a list of applications).
2 Select the SONET or SDH Overhead soft key.
Figure 4 shows the display for a classic SONET application.

Figure 6

Overhead byte display - Classic SONET application

The Line/Multiplexor Section bytes appear in green; the Section/Regenerator Section bytes appear in grey. Path/High Path overhead bytes appear
in blue.
Bytes labeled using a black font can be manipulated.
Bytes labeled using a white font cannot be manipulated.
The Default button restores any bytes you changed to their default
value.
3 To change the value of a byte, do the following:
a Select the byte you want to manipulate.
b Select the Overhead Byte Editor field, type the new byte value, and
then select OK.
The new value appears in the field and will be transmitted in the overhead when you start your test.
4 Select the Results soft key to return to the Main screen.
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Capturing POH bytes

5 Connect a cable from the appropriate RX connector to the networks

TRANSMIT access connector.
6 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
7 If you are testing an optical signal, select the Laser button.
8 Loop back the far-end of the network.
9 Verify the following LEDs:
If your module is in TestPad mode, verify that the following LEDs are
green:
SONET

SDH

Signal Present

Frame Sync

Path Ptr Present

AU Ptr Present

Concat Payloada

Pattern Sync

a. If you selected a concatenated payload when you configured your test.

If your module is in ANT mode, verify that the following LEDs are not
red:
SONET and SDH
LOS
LOF
LSS

10 To view overhead byte values on the Main screen, select the SONET or
SDH result group, and then select the Overhead result category.
The overhead byte is manipulated.

Capturing POH bytes

You can now capture high and low path overhead bytes. When configuring the
capture, you can indicate that you want to capture it manually, or specify a
trigger to automate the capture. Path capture is currently supported on the
MSAM only.
To capture a POH byte
1 If you havent already done so, use the Test Menu to select the BERT test
application for the interface you are testing.
Refer to Table 11 on page 47 through Table 17 on page 58 for a list of
SONET and SDH applications.
Refer to Table 22 on page 122 through Table 29 on page 132 for a list
of NextGen applications.

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Specifying the J0 or J1 identifier

2 Select the SONET Overhead soft key, and then select the
POH Byte Capture tab.
3 Specify values for the following settings:
Setting

Value

Tributary Settings

When running classic SONET or SDH tests,

specify the settings that identify the tributary
you are capturing the byte for in the associated fields.

Rx VCG Member
(NextGen applications only)

Select the member you want to capture the

byte for.

Trigger

Select one of the following:

Manual (only method available for 40/
100G Transport Module).
Alarm.
Compare Byte.
Compare Not Byte.

Alarm Type
(only appears if Trigger is
Alarm)

Select the type of alarm that will trigger an

automatic capture:
AIS-L
RDI-L
AIS-P
LOP-P

Compare (Binary)
(only appears if Trigger is
Compare Byte or Compare
Not Byte).

Specify the received byte value that you want

matched, or the value that should not be
matched to force an automatic capture. For
example, if you want the instrument to capture the byte if it receives 01100110, enter
01100110. You can also enter X using the
Dont Care button to wildcard the match (or
dont match) value.

Select Byte

In the blue panel, select the byte to capture.

4 Select the Start button to the right of the Capture Settings, then observe
the capture log at the bottom right of the screen.
The POH byte is captured.

Specifying the J0 or J1 identifier

You can specify the J0 (Section or RSOH trace) or J1 (Path HP trace) identifier
using a variety of formats.
To specify the J0 or J1 trace identifier
1 Using the Test Menu, select the test application for the signal, rate, and
payload you are testing (refer to Table 11 on page 47 through Table 17 on
page 58 for a list of applications).
2 Select the Setup soft key, and then select the SONET or SDH tab.

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Specifying the J0 or J1 identifier

3 In the panel on the left side of the tab, select one of the following:
Section or RS, if you want to edit the J0 trace identifier.
Path or HP, if you want to edit the J1 trace identifier.
Settings appear for the traces.

4 To change a trace, do the following:

a Select a trace format (for example, Single Byte).
b If you selected the Single Byte format, select the keypad icon to the
right of the Trace Identifier field, type the byte value, and then select
OK.
c If you selected any format other than Single Byte, select the keypad
icon to the right of the Trace Identifier field, type the identifier, and then
select OK.
The new identifier will be transmitted in the overhead when you start your
test.
NOTE:
You can reset the trace and expected trace format or identifier at any time
using the Default buttons.
5 Optional. If you want the unit to display a TIM-P alarm if the expected and
incoming trace values do not match, select Yes; otherwise, select No.
6 Repeat step 2 on page 75 for the Outgoing Path Trace format and identifier.
7 Select the Results soft key to return to the Main screen.
8 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
9 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
10 If you are testing an optical signal, select the Laser button.
11 Loop up the far-end of the network.

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Inserting the C2 Path signal label

12 Verify the following LEDs

If your module is in TestPad mode, verify that the following LEDs are
green:
SONET

SDH

Signal Present

Frame Sync

Path Ptr Present

AU Ptr Present

Concat Payloada

Pattern Sync

a. If you selected a concatenated payload when you configured your test.

If your module is in ANT mode, verify that the following LEDs are not
red:
SONET and SDH
LOS
LOF
LSS

13 To view the J0 or J1 trace values, select the SONET or SDH result group,
and then select the Section/RSOH and Path/HP result categories.
The trace byte or identifier is inserted into the overhead.

Inserting the C2 Path signal label

You can insert the C2 Path signal label using a variety of formats.
To insert the C2 Path signal label
1 Using the Test Menu, select the test application for the signal, rate, and
payload you are testing (refer to Table 11 on page 47 through Table 17 on
page 58 for a list of applications).
2 Select the Setup soft key, and then select the SONET or SDH tab.
3 In the panel on the left side of the tab, select Signal Label.
Settings appear for the label.

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Inserting the C2 Path signal label

4 Select the Signal Label and Expected Signal Label.

The new label will be transmitted in the overhead when you start your test.
5 Optional. If you want the unit to display an HP-PLM alarm if the labels in
received payloads do not match the expected label, select Yes; otherwise,
select No.
NOTE:
You can reset the label and expected label at any time using the Default
buttons.
6 Select the Results soft key to return to the Main screen.
7 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
8 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
9 If you are testing an optical signal, select the Laser button.
10 Loop back the far-end of the network.
11 Verify the following LEDs:
If your module is in TestPad mode, verify that the following LEDs are
green:
SONET

SDH

Signal Present

Frame Sync

Path Ptr Present

AU Ptr Present

Concat

Payloada

Pattern Sync

Concat Payloada
Pattern Sync

a. If you selected a concatenated payload when you configured your test.

If your module is in ANT mode, verify that the following LEDs are not
red:
SONET and SDH
LOS
LOF
LSS

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Manipulating K1 or K2 APS bytes

12 To view the C2 label, select and display the SONET or SDH result group,
and then select the Overhead and Path/MSOH result categories.
The C2 Path signal label is inserted into the overhead.

Manipulating K1 or K2 APS bytes

You can manipulate the K1 or K2 APS bytes for ring or linear network topologies.
To manipulate K1 or K2 bytes
1 Using the Test Menu, select the test application for the signal, rate, and
payload you are testing (refer to Table 11 on page 47 through Table 17 on
page 58 for a list of applications).
2 Select the Setup soft key, and then select the SONET or SDH tab.
3 In the panel on the left side of the tab, select APS (K1/K2).
Settings appear for the bytes.

4 In APS Network Topology, specify Ring or Linear as the topology.

5 If you selected a linear topology, skip this step, and proceed to step 6 on
page 79. If you selected a Ring topology, do the following:
a For the K1 byte, specify a Bridge Request Code (for example, 0001
RR-R) and a Destination Node ID (for example, 0001 1),
b For the K2 byte, specify a Source Node ID (for example, 0001 1), Path
Code (for example, 0 Short), and Status code (for example, 001 Br).
6 If you selected a linear topology, do the following:
a For the K1 byte, specify a Request Code (for example, 0001 DnR) and
a Channel Number (for example, 0001 1).
b For the K2 byte, specify a Bridge Channel (for example, 0010 2), MSP
Architecture (for example, 0 1+1), and Status (for example,
001 Unknown).
7 Select the Results soft key to return to the Main screen.
8 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
9 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
10 If you are testing an optical signal, select the Laser button.
11 Loop back the far-end of the network.

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Manipulating the S1 byte

12 Verify the following LEDs:

If your module is in TestPad mode, verify that the following LEDs are
green:
SONET

SDH

Signal Present

Frame Sync

Path Ptr Present

AU Ptr Present

Concat Payloada

Pattern Sync

a. If you selected a concatenated payload when you configured your test.

If your module is in ANT mode, verify that the following LEDs are not
red:
SONET and SDH
LOS
LOF
LSS

13 To view the K1 or K2 byte transitions, select the K1/K2 Linear or K1/K2

Ring result category.
The K1 and K2 bytes are manipulated. You can view them in the K1/K2 Log
provided in the SONET or SDH result group.

Manipulating the S1 byte

You can modify the S1 byte (used to indicate the synchronization status of the
network) before transmitting traffic when testing SONET or SDH interfaces.
To manipulate the S1 byte
1 Using the Test Menu, select the test application for the signal, rate, and
payload you are testing (refer to Table 11 on page 47 through Table 17 on
page 58 for a list of applications).
2 Select the Setup soft key, and then select the SONET or SDH tab.
3 In the panel on the left side of the tab, select Sync Status.
Settings appear for the bytes.

4 Select a sync status byte (for example, (1100 SONET Clock Trace).
5 Select the Results soft key to return to the Main screen.
6 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
80

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Adjusting pointers

7 Connect a cable from the appropriate TX connector to the networks

RECEIVE access connector.
8 If you are testing an optical signal, select the Laser button.
9 Loop back the far-end of the network.
10 Verify the following LEDs:
If your module is in TestPad mode, verify that the following LEDs are
green:
SONET

SDH

Signal Present

Frame Sync

Path Ptr Present

AU Ptr Present

Concat

Payloada

Pattern Sync

Concat Payloada
Pattern Sync

a. If you selected a concatenated payload when you configured your test.

If your module is in ANT mode, verify that the following LEDs are not
red:
SONET and SDH
LOS
LOF
LSS

11 To view the transmitted Sync Status (S1) byte, select the Line result category.
The S1 byte is manipulated. You can observe it in the Line/MSOH result category provided in the SONET or SDH result group

Adjusting pointers
You can adjust pointers manually or by using the Pointer Stress Sequences,
and then optionally measure induced jitter on a dropped T-Carrier or PDH
signal.

Adjusting pointers manually

The following procedure describes how to manually adjust pointers.

To adjust pointers manually
1 Using the Test Menu, select the test application for the signal, rate, and
payload you are testing (refer to Table 11 on page 47 through Table 17 on
page 58 for a list of applications).
2 Configure your test settings (refer to the applicable test procedure in this
chapter), and then start the test.

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Adjusting pointers

3 On the Main screen, on the Pointer toolbar, select one of the following:
Increment: Increases the pointer value by one.
Decrement: Decreases the pointer value by one.
+2 NDF: Sets the new data flag, and increases the pointer value by
two.
-2 NDF: Sets the new data flag, and decreases the pointer value by
two.
4 Select the Path/VT Pointer Adjust (for SONET), or AU/TU Pointer
Adjust (for SDH) action button to adjust the appropriate pointer.
5 To observe the pointer value, number of adjustments, and pointer increments and decrements, do one of the following:
If you are testing a SONET circuit, select the Path or VT result categories provided in the SONET result group.
If you are testing a SDH circuit, select the HP or LP results categories
provided in the SDH result group.
The pointer is manually adjusted.

Adjusting pointers using

pointer stress sequences

You can adjust the pointers using the Pointer Stress Sequences to induce jitter
in PDH signals demuxed from SONET and SDH signals. The Pointer Stress
Sequence test combined with a PDH jitter test allow you to determine if a
network element produces excessive jitter when stressful pointer operations
occur. This test uses the pointer sequences specified in G.783 recommendations. For details, refer to the ITU-T Recommendation G.783.
The following procedure describes how to adjust pointers using a pointer
stress sequence.
To adjust pointers with a pointer sequence
1 Using the Test Menu, select the test application for the signal, rate, and
payload you are testing (refer to Table 11 on page 47 through Table 17 on
page 58 for a list of applications).
2 Configure your test settings (refer to the applicable test procedure in this
chapter), and then start the test.
3 Select the Setup soft key, and then select the SONET or SDH tab.
4 In the panel on the left side of the tab, do one of the following:
If you are testing a SONET circuit, select Path Pointer or VT Pointer.
If you are testing a SDH circuit, select AU Pointer or TU Pointer.

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Adjusting pointers

Settings appear for the pointer test sequences. Figure 7 illustrates the
settings that appear when you select one of the H sequences for SONET
tests.

Figure 7

Pointer Stress Sequence Settings

5 In G.783 Section, select the pointer sequence you want to apply to the
test. For details on each test pattern, refer to the ITU-T Recommendation
G.783.
6 Specify the time variables in seconds for the test sequence you selected
by doing the following:
a Select the keypad icon to the right of the T field.
b Type the value in seconds, and then select OK. The value you specified appears in the corresponding field.
For details on the adjustable values, refer to the ITU-T Recommendation
G.783.
7 Select the Results soft key to return to the Main screen.
8 On the Main screen, do one of the following:
If you are testing a SONET circuit, in the Path or VT Pointer field, select
Sequence.
If you are testing a SDH circuit, in the AU or TU Pointer fields, select
Sequence.
9 Do one of the following:
If you are testing a SONET circuit, select the Path Pointer Adjust or
VT Pointer Adjust action button to adjust the pointer.
If you are testing a SDH circuit, select the AU Pointer Adjust or TU
Pointer Adjust action button to adjust the pointer.
The pointer is adjusted by the test sequence.

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Verifying performance

Verifying performance
You can verify that performance complies with the ITU-T and ANSI recommendations for error and anomaly performance.
To verify performance
1 Using the Test Menu, select the test application for the signal, rate, and
payload you are testing (refer to Table 11 on page 47 through Table 17 on
page 58 for a list of applications).
2 Select the Setup soft key, and then select the Performance tab.

3 Select a recommendation (specification).

4 Specify the Path allocation percentage by doing the following:
a Select the Path Allocation% field.
b Type the percentage or threshold, and then select OK. The percentage
or threshold appears in the corresponding field.
5 If you want to enable the UAS limit, select Yes.
6 To view the performance measurements, press the Results soft key to
return to the Main screen.
7 Verify the following LEDs:
If your module is in TestPad mode, verify that the following LEDs are
green:
SONET

SDH

Signal Present

Frame Sync

Path Ptr Present

AU Ptr Present

Concat Payloada

Pattern Sync

a. If you selected a concatenated payload when you configured your test.

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Monitoring the circuit

If your module is in ANT mode, verify that the following LEDs are not
red:
SONET and SDH
LOS
LOF
LSS
Ptr Justifications

8 To observe performance results, select the SONET or SDH result group,

and then select the result category for the specification you specified.
Performance measurements are verified.

Monitoring the circuit

Use the monitor applications whenever you want to analyze the received signal
and pass the signal unchanged through to the units transmitter.
To monitor a circuit
1 Using the Test Menu, select the monitor test application for the signal,
rate, and payload you are testing (refer to Table 11 on page 47 through
Table 17 on page 58 for a list of applications).
2 Connect the module to the circuit.
3 Observe the test results.
The circuit is monitored.

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Monitoring the circuit

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Chapter 4

Jitter and Wander Testing

4
This chapter provides step-by-step instructions for measuring jitter and wander
on T-Carrier, PDH, SONET, SDH, or OTN networks using the instrument.
Topics discussed in this chapter include the following:
About jitter and wander testing on page 88
Before testing on page 93
Transmitting jitter on page 93
Manually measuring jitter on page 95
Automatic Measurement Sequences on page 96
Transmitting wander on page 103
Measuring and analyzing wander on page 104
1PPS Analysis on page 109

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About jitter and wander testing

If your Transport Module is configured and optioned to do so, you can use it to
measure jitter and wander on a DS1, E1, E3, DS3, or E4 interface. If you
purchase the optical jitter and wander testing option, you can measure jitter
and wander on a OC-3, OC-12, OC-48, STM-1, STM-4, STM-16 or OTU1 2.7G
interface. For details on the device and interface standards for measuring jitter
and wander, refer to ITU-T Recommendations O.172 and O.173.
The Transport Modules jitter option allows you to measure jitter manually or
using automatic sequences to measure Maximum Tolerable Jitter (MTJ), Fast
MTJ, and the Jitter Transfer Function (JTF). The wander option allows you to
analyze system wander performance.
NOTE:
The Transport Module has a maximum jitter or wander test duration of 48
days 23 hours 59 minutes and 56 seconds. When running a test, you can
observe the remaining test time in the Time category of the Summary result
group.

Multiple Services Application Module (MSAM):

Using the MSAM, you can measure jitter on PDH and electrical SONET interfaces: DS1, DS3, E1, E3, E4, STS-1, and STM1e. Wander measurements
and jitter measurements on other circuits are not supported.
A jitter-capable PIM is required. To verify whether the PIM is jitter-capable,
view the Help>About menu and note the serial number. The serial number
of a jitter-capable PIM starts with P2.
For information about jitter and wander principles and specifications, see Principles of Jitter and Wander Testing on page 247.

Features and capabilities

The Transport Module supports the following:

Jitter modulationYou can generate jitter with a specific amplitude and
frequency, and then modulate the transmitted signal using the generated
jitter.
Automatic Measurement SequencesYou can configure the Transport
Module to run test sequences automatically and measure MTJ, Fast MTJ,
and JTF. You can then view graphical or tabular jitter results by selecting
the Jitter Graph or Jitter Table category in the Interface result group.
Wander modulationIf you purchased the optical or electrical wander test
option, you can generate wander with a specific amplitude and frequency,
and then modulate the transmitted signal using the generated wander.
Wander measurementIf you purchased the optical or electrical wander
test option, the Transport Module allows you to test and analyze the
wander results in a graphical manner. You can also export the wander TIE
result to be analyzed on a remote PC using the O.172 MTIE/TDEV Offline
Analysis software shipped with your unit. For details, see Saving and
exporting wander measurement data on page 108.

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About jitter and wander testing

1PPS Analysis and WanderIf your instrument is configured and optioned

to do so, you can now use it to conduct wander measurements at a test
interface against an external 1PPS reference signal. An optional GPS
1PPS signal is used as the reference signal.

Understanding the graphical

user interface

The names of various elements on the graphical user interface change

depending on the interface you select. For example, the button that you use to
insert errors or anomalies is labeled Insert Error if you selected a T-Carrier
application; the same button is labeled Insert Anomaly if you selected a PDH
application.
The buttons or soft keys also change depending on the test you select. For
example, the Calibration button only appears when you are measuring JTF;
and the Wander Analysis soft key only appears when you select the wander
testing applications.
When you are testing jitter or wander, you need to use the buttons on the
following action bars:
Action Bar

Used to...

Jitter Tx

Transmit jitter

Wander Tx

Transmit wander

Jitter AMS

Measure jitter with Automatic Measurement Sequences

If a particular toolbar is not available on the Main screen, select

View > Actions Panel, and then select the action bar that you need.

Accessing jitter and wander

test results

Jitter and wander test

applications

When you configure your unit to measure jitter or wander, measurement

results are available in the Interface result group.

Table 18 to 21 list each of the jitter and wander test applications for T-Carrier,
PDH, SONET, SDH, and OTN interfaces.
Interface

Applications...

T-Carrier/PDH

See Table 18 on page 89

SONET

See Table 19 on page 90

SDH

See Table 20 on page 91

OTN

See Table 21 on page 93

Table 18 lists each of the jitter and wander test applications for the T-Carrier
and PDH interfaces.

Table 18 T-Carrier and PDH jitter and wander test applications

Signal

Payload

Test Mode

DS1 Jitter
DS1 Wander

DS1 BERT

Terminate

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Chapter 4 Jitter and Wander Testing

About jitter and wander testing

Table 18 T-Carrier and PDH jitter and wander test applications

Signal

Payload

Test Mode

DS3 Jitter
DS3 Wander

DS3 BERT
E1 BERT
DS1 BERT

Terminate

E1 Jitter
E1 Wander

E1 BERT

Terminate

E3 Jitter
E3 Wander

E3 BERT
E1 BERT

Terminate

E4 Jitter
E4 Wander

E4 BERT
E3 BERT
E1 BERT

Terminate

Table 19 lists each of the jitter and wander test applications for the SONET
interface.

Table 19 SONET jitter and wander test applications

Signal

Payload

Test Mode

STS-1 Jitter
STS-1 Wander

Bulk BERT

Terminate

DS3

DS3 BERT
DS1 BERT
E1 BERT

Terminate

VT-1.5

Bulk BERT
DS1 BERT

Terminate

STS-3c Bulk BERT

Terminate

Bulk BERT

Terminate

DS3 BERT
E1 BERT
DS1 BERT

Terminate

Bulk BERT
DS1 BERT

Terminate

STS-12c Bulk
BERT

Terminate

STS-3c Bulk BERT

Terminate

Bulk BERT

Terminate

DS3 BERT
E1 BERT
DS1 BERT

Terminate

Bulk BERT
DS1 BERT

Terminate

OC-3 Jitter
OC-3 Wander
STS-1
DS3

VT-1.5

OC-12 Jitter
OC-12 Wander

STS-1
DS3

VT-1.5

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Chapter 4 Jitter and Wander Testing

About jitter and wander testing

Table 19 SONET jitter and wander test applications (Continued)

Signal

Payload

Test Mode

OC-48 Jitter
OC-48 Wander

STS-1
DS3

VT-1.5

STS-48c Bulk
BERT

Terminate

STS-12c Bulk
BERT

Terminate

STS-3c Bulk BERT

Terminate

Bulk BERT

Terminate

DS3 BERT
E1 BERT
DS1 BERT

Terminate

Bulk BERT
DS1 BERT

Terminate

Table 20 lists each of the jitter and wander test applications for the SDH interface.

Table 20 SDH jitter and wander test applications

Signal

Payload

STM-1 Jitter
STM-1 Wander
STM-1e Jitter
STM-1e Wander

AU-4

Test Mode
VC-4

Bulk BERT

Terminate

E4 BERT
E3 BERT
E1 BERT

Terminate

Bulk BERT

Terminate

DS3

DS3 BERT
E1 BERT
DS1 BERT

Terminate

E3 BERT
E1 BERT

Terminate

VC-12

Bulk BERT
E1 BERT

Terminate

VC-3

Bulk BERT

Terminate

DS3

DS3 BERT
E1 BERT
DS1 BERT

Terminate

E3 BERT

Terminate

E1 BERT

Terminate

Bulk BERT
E1 BERT

Terminate

VC-4-4c Bulk
BERT

Terminate

Bulk BERT

Terminate

E4 BERT
E3 BERT
E1 BERT

Terminate

VC-3

AU-3

VC-12

STM-4 Jitter
STM-4 Wander

AU-4

VC-4
E4

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Chapter 4 Jitter and Wander Testing

About jitter and wander testing

Table 20 SDH jitter and wander test applications (Continued)

Signal

Payload

Test Mode
VC-3

AU-3

Bulk BERT

Terminate

DS3

DS3 BERT
E1 BERT
DS1 BERT

Terminate

E3 BERT
E1 BERT

Terminate

VC-12

Bulk BERT
E1 BERT

Terminate

VC-3

Bulk BERT

Terminate

DS3

DS3 BERT
E1 BERT
DS1 BERT

Terminate

E3 BERT

Terminate

E1 BERT

Terminate

Bulk BERT
E1 BERT

Terminate

VC-4-16c Bulk
BERT

Terminate

VC-4-4c Bulk
BERT

Terminate

Bulk BERT

Terminate

E4 BERT
E3 BERT
E1 BERT

Terminate

Bulk BERT

Terminate

DS3

DS3 BERT
E1 BERT
DS1 BERT

Terminate

E3 BERT
E1 BERT

Terminate

Bulk BERT

Terminate

E1 BERT

Terminate

Bulk BERT

Terminate

DS3

DS3 BERT
E1 BERT
DS1 BERT

Terminate

E3 BERT
E1 BERT

Terminate

Bulk BERT
E1 BERT

Terminate

VC-12

STM-16 Jitter
STM-16 Wander

AU-4

VC-4
E4

VC-3

VC-12

AU-3

VC-3

VC-12

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Chapter 4 Jitter and Wander Testing

Before testing

Table 21 lists each of the jitter and wander test applications for the OTN interface.

Table 21 OTN Jitter and Wander Test Applications

Signal

Payload

Test Mode

OTU1 2.7G

STM-16

AU-4

Bulk Jitter BERT

Bulk Wander BERT

Terminate

STS-48c Bulk Jitter BERT

STS-48c Bulk Wander BERT

Terminate

VC-4-16c Bulk Jitter BERT

VC-4-16c Bulk Wander BERT

Terminate

Before testing
If you want to test optical jitter or wander, before selecting a test application, be
certain to do the following:
Connect the power adapter before launching the optical jitter/wander function.
Verify that you have turned on the jitter/wander function by pressing the
System button. If the Jitter icon is not highlighted in yellow, turn it on.

Transmitting jitter
You can use your unit to manually generate and transmit a jittered signal.
To generate and transmit a jittered signal manually
1 Using the Test Menu, select the jitter test application for the signal and
payload you are testing (see Table 18 on page 89 through Table 21 on
page 93).
2 Do one of the following:
If you are testing on a T-Carrier or PDH interface, follow step 2 on
page 14 through step 7 on page 15 in Chapter 2 T-Carrier and PDH
Testing.
If you are testing on a SONET or SDH interface, select the Setup soft
key, and then follow step 2 on page 64 to step 8 on page 65 in
Chapter 3 SONET and SDH Testing.
If you are testing on an OTN interface, follow step 2 on page 171 in
Chapter 6 OTN Testing.
3 Select the Jitter tab, and then, in the panel on the left side of the tab, select
General.
4 Under Tx Frequency, specify the following:
Current (Hz) Specify the jitter frequency.
Step Size (Hz) Specify how much to increase or decrease the jitter
modulation frequency using the up or down buttons provided on the
Jitter Tx toolbar on the main screen.

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Transmitting jitter

5 Under Tx Amplitude, specify the following:

Current (UI) Specify the jitter amplitude.
Step Size (UI) Specify how much to increase or decrease the jitter
modulation amplitude using the up or down buttons provided on the
Jitter Tx toolbar on the main screen.
The graphic under the settings illustrates the relationship between the
maximum jitter modulation amplitude for a given jitter modulation
frequency.

6 To return to the Main screen, select the Results soft key.

7 Connect a cable from the appropriate TX connector to the RX access
connector on the device under test (DUT) or the network.
8 If you are testing an optical signal, select the Laser button.
The button label becomes Laser On.
9 Verify the LEDs.
If you are testing on a T-Carrier or PDH interface, see step 11 on
page 16.
If you are testing on a SONET or SDH interface, see step 14 on
page 65.
If you are testing on an OTN interface, see step 8 on page 172.
10 To start transmitting the jittered signal, select the Modulation button on
the Jitter Tx action bar.

11 You can optionally increase or decrease the frequency or amplitude of the

jittered signal using the corresponding up and down arrows.
The Transport Module starts to modulate the transmitted signal with the specified jitter.

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Chapter 4 Jitter and Wander Testing

Manually measuring jitter

You can use the Transport Module to detect jitter in high-band, wide-band,
extended-band, or user-defined band ranges on received signals. You can also
measure RMS jitter to determine the average amount of jitter for a specific
period of time. Before measuring jitter, you must specify the jitter analysis
frequency range on the received signal that you are analyzing for jitter. You can
also optionally specify the thresholds for declaring phase hits.
Results for manual jitter measurement include:
Peak measurements, expressed in UIp (unit intervals peak).
Peak-to-peak measurements, expressed in UIpp (unit intervals peak-topeak).
Jitter percent mask (the ratio of measured jitter to the ANSI/ITU-T tolerance mask for each range and rate).
The maximum positive and negative jitter peaks and the maximum peakto-peak.
A count of phase hits. For details about how this count is derived, see
Phase hits on page 249.
RMS Jitter result.
To measure jitter manually
1 Using the Test Menu, select the jitter test application for the signal and
payload you are testing (refer to Table 18 on page 89 through Table 21 on
page 93).
2 Do one of the following:
If you are testing on a T-Carrier or PDH interface, follow step 2 on
page 14 through step 7 on page 15 in Chapter 2 T-Carrier and PDH
Testing.
If you are testing on a SONET or SDH interface, select the Setup soft
key, and then follow step 2 to step 8 on page 65 in Chapter 3 SONET
and SDH Testing.
If you are testing on an OTN interface, follow step 2 on page 171 in
Chapter 6 OTN Testing.
3 Select the Jitter tab, and then, in the panel on the left side of the tab, select
General.

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Automatic Measurement Sequences

4 To specify the frequency range over which to capture the results, under
Rx, specify one of the following in the Bandwidth Selection field:
Wide-Band, and then specify whether to display both High-Band and
Wide-Band Results (ON) or only Wide-Band Results (Off).
High-Band
Extended-Band
User-Band, and then specify the High Pass and Low Pass filter as
applicable.
RMS-Band

5 To specify thresholds for detecting jitter phase hits, use the keypad to type
the threshold in UI in the Peak Hit Threshold field, and then select OK. For
details about phase hits, see Phase hits on page 249.
6 To return to the Main screen, select the Results soft key.
7 Connect a cable from the appropriate RX connector to the networks TX
access connector.
8 Verify the LEDs.
If you are testing on a T-Carrier or PDH interface, see step 11 on
page 16.
If you are testing on a SONET or SDH interface, see step 14 on
page 65.
If you are testing on an OTN interface, see step 8 on page 172.
9 Select Restart.
10 To observe the jitter results, set one of the result windows to display the
Summary group, set another results window to display the Interface group,
and then select one of the Jitter categories (see Jitter results on
page 204).
Jitter is measured.

Automatic Measurement Sequences

You can configure the Transport Module to run test sequences that automatically measure Maximum Tolerable Jitter (MTJ), Fast MTJ, and the Jitter
Transfer Function (JTF). You can use the default mask and scan points or
customize the mask and scan points for your tests.

Measuring jitter tolerance

Two automated test sequences are available that help you determine a NEs
ability to tolerate jitter:
The automated MTJ sequence measures the Maximum Tolerable Jitter by
transmitting a jittered test signal to the receiver of the NE. The sequence
uses an algorithm to automatically increase the jittered signals amplitude
at various frequencies (in search steps specified as mask points and scan

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Chapter 4 Jitter and Wander Testing

Automatic Measurement Sequences

points) until the NE transmits errors exceeding the value specified on your
unit as the sensor threshold. For a detailed explanation of this sequence,
see MTJ test sequence on page 250.
The automated Fast MTJ sequence uses a subset of mask points and
scan points to quickly measure MTJ. For a detailed explanation of this
sequence, see Fast MTJ test sequence on page 250.
Measuring MTJ / Fast MTJ involves specifying the settling time for the device
under test, the gate time and recovery time for the measurement, the error
source, the sensor threshold, the mask (MTJ tests only), and scan points.
To measure MTJ or test Fast MTJ
1 Using the Test Menu, select the jitter test application for the signal and
payload you are testing (refer to Table 18 on page 89 through Table 21 on
page 93).
2 Configure the transmit parameters. See step 2 of Transmitting jitter on
page 93.
3 Configure the receive parameters. See step 2 of Manually measuring
jitter on page 95.
4 In the panel on the left side of the Jitter tab, select AMS Settings.
The AMS settings appear.

5 In AMS Mode, indicate whether you want to measure MTJ or Fast MTJ,
and then specify the following parameters:
Settling Time (in seconds). See Settling time on page 262.
Gate Time (in seconds). See Gate time on page 257.
Recovery Time (in seconds).
Sensor Threshold, see Sensor threshold on page 262.
If you selected MTJ mode in step 4, proceed to step 6.
If you selected Fast MTJ mode in step 4, proceed to step 9 on page 98.
6 To configure mask settings, in the panel on the left side of the tab, select
AMS Mask.

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Automatic Measurement Sequences

The mask settings appear.

7 In Mask Selection, indicate whether you want to use the standard mask
defined by ANSI or ITU-T, or defined your own mask (User).
If you selected a standard mask, proceed to step 9.
If you selected User, proceed to step 8.
8 To define your own mask, do the following:
To...

Add a mask point

Do...

1 Select an empty row in the table.

2 Select Add Row.
3 Specify the frequency and amplitude for the
new mask point.
4 Select OK.

Modify a mask point

Select an existing row in the table.

Select Modify Row.
Specify the frequency and amplitude for the
modified mask point.
Select OK.

Delete a mask point

Select an existing row in the table.

Select Delete Row.
Select OK.

Use the standard

mask setting as the
basis of the userdefined mask

In Mask Selection, select a standard mask, and

then select Copy to User to copy the standard
mask settings to the user-defined mask field.
Under Mask Selection, select User.
Edit the User mask by adding, modifying, or
deleting the mask points copied from the standard mask.
Select OK.

9 To configure scan points, in the panel on the left side of the tab, select
AMS Scan.

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The scan settings appear.

10 Under Scan, select the arrows to the right of the Type field, and then select
one of the following:
Coarse Provides a pre-defined lists of scan points
Fine Provides a pre-defined lists of 20 scan points
The Fine setting provides more frequencies than the Coarse setting. If
you selected Fine or Coarse, proceed to step 12.
User Allows you to define up to 20 scan points. Proceed to step 11.
11 To define your own scan points, do the following:
To...
Add a scan point

Do...

1 Select an empty row in the table.

2 Select Add Item.
3 For testing MTJ, specify the frequency for the
new scan point.
For testing Fast MTJ, specify the frequency
and amplitude for the new scan point.
4 Select OK.

Modify a scan point

1 Select an existing row in the table.

2 Select Modify Item.
3 For testing MTJ, specify the frequency for the
modified scan point.
For testing Fast MTJ, specify the frequency
and amplitude for the modified scan point.
4 Select OK.

Delete a scan point

1 Select an existing row in the table.

2 Select Delete Item.
3 Select OK.

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To...
Use the standard
scan points as the
basis of the userdefined mask

Do...

1 Under Scan Selection, select the arrows to

the right of the Scan field, select Fine or
Coarse, and then select Copy to User to
copy the standard scan points to the userdefined Scan Points.
2 Under Scan Selection, select User.
3 Edit the User scan points by adding, modifying, or deleting the scan points copied from
the standard scan points.
4 Select OK.

12 To return to the Main screen, select the Results soft key.

13 Connect a cable from the appropriate RX connector to the networks TX
access connector.
14 Connect a cable from the appropriate TX connector to the networks RX
access connector. See Figure 40 on page 250.
15 Configure the devices on the network as needed.
16 If you are testing an optical signal, select the Laser button.
17 Verify the LEDs.
If you are testing on a T-Carrier or PDH interface, see step 11 on
page 16.
If you are testing on a SONET or SDH interface, see step 14 on
page 65.
If you are testing on an OTN interface, see step 8 on page 172.
18 Do one of the following:
To measure MTJ, select the Jitter AMS action bar, and then select the
Start MTJ button.

To test Fast MTJ, select the Start FMTJ button.

NOTE:
You cannot change settings or select any button on the Main screen while
the automatic test sequence is running. To change settings when the test
sequence is running, you must first stop the test by selecting the
Stop MTJ / FMTJ button.
After you change the settings, select the Start MTJ / FMTJ button again to
restart the test sequence.
Selecting the Restart soft key will abort the test. To reactivate the test
sequence, you must select the Start MTJ / FMTJ button.

100

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19 Wait for the test to end or do one of the following:

Manually stop the test by selecting the Stop MTJ or FMTJ button
again.
Restart the test by selecting the Restart soft key.
NOTE:
Restarting the test will abort the current test, clear the test results, and then
restart the underlying test application.
The MTJ / Fast MTJ measurement is finished. You can observe the results by
selecting MTJ Graph/ Fast MTJ Graph or MTJ Table/ Fast MTJ Table category
in the Interface result group. For details about graphical and tabular jitter
results, see Graphical and Tabular jitter results on page 206.

Measuring the jitter transfer

function

Measuring JTF involves specifying transmit and receive parameters, the

settling time for the device under test, and the recovery time for the measurement. To ensure optimum accuracy, the transmitter/receiver of the Transport
Module must be calibrated before making JTF measurements.
To measure JTF
1 Using the Test Menu, select the jitter test application for the signal and
payload you are testing (see Table 18 on page 89).
2 Configure the transmit parameters. See step 2 of the Transmitting jitter
on page 93.
3 Configure the receive parameters. See step 2 of the Manually measuring
jitter on page 95.
4 In the panel on the left side of the tab, select AMS Settings.
5 In AMS Mode, select JTF.
The settings appear.

NOTE:
You cannot view extended-band results in JTF mode. If you selected
extended-band in step 3, when you select JTF in the AMS Mode field, the
Transport Module will automatically change the bandwidth to wide-band.
6 Specify the following parameters:
Settling Time (in seconds). See Settling time on page 262.
Recovery Time (in seconds).
7 To configure mask settings, see step 6 to 8 of Measuring jitter tolerance
on page 96.
8 To configure scan points, see step 9 to 11 of Measuring jitter tolerance on
page 96.
9 To return to the Main screen, select the Results soft key.

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10 To calibrate the test set, do the following:

a Loop the transmitter back to the receiver.
b Select the Start Calibration button.

A message appears in the message bar indicating that the calibration is

in progress.
11 After the test set is calibrated, connect a cable from the appropriate RX
connector to the networks Tx access connector.
12 Connect a cable from the appropriate TX connector to the networks Rx
access connector.
13 Configure the devices on the network as needed.
14 If you are testing an optical signal, select the Laser button.
The button label becomes Laser On.
15 Verify the LEDs.
If you are testing on a T-Carrier or PDH interface, see step 11 on
page 16.
If you are testing on a SONET or SDH interface, see step 14 on
page 65.
If you are testing on an OTN interface, see step 8 on page 172.
16 Select the Start JTF button.

NOTE:
If you did not calibrate the test set before selecting the Start JTF button, a
warning appears informing you that calibration is required. Calibrate the test
set (see step 10 on page 102), and then proceed to step 16.

NOTE:
You cannot change settings or select any button on the Main screen while
the automatic test sequence is running. To change settings when the test
sequence is activated, you must first stop the test by selecting the
Stop JTF button.
After you change the settings, select the Start JTF button again to reactivate the test sequence.
Selecting the Restart soft key will abort the test. To reactivate the test
sequence, you must select the Start JTF button.

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Transmitting wander

17 Wait for the test to end by viewing the message displayed in the Message
Bar or do one of the following:
Manually stop the test by selecting the Stop JTF button again.
Restart the test by selecting the Restart soft key.
NOTE:
Restarting the test will abort the current test, clear the test results, and then
restart the underlying test application.
After the JTF measurement sequence starts, you can observe the results by
selecting the JTF Graph or JTF Table category in the Interface result group.

Transmitting wander
You can use your unit to generate and transmit a wandered signal.
To generate and transmit a wandered signal manually
1 Using the Test Menu, select the wander test application for the signal and
payload you are testing (refer to Table 18 on page 89).
2 Do one of the following:
If you are testing on a T-Carrier or PDH interface, follow step 2 on
page 14 through step 7 on page 15 in Chapter 2 T-Carrier and PDH
Testing.
If you are testing on a SONET or SDH interface, select the Setup soft
key, and then follow step 2 to step 8 on page 65 in Chapter 3 SONET
and SDH Testing.
If you are testing on an OTN interface, follow step 2 on page 171 in
Chapter 6 OTN Testing.
3 Select the Wander tab.
Setups appear for the wander test.

4 Under Tx Frequency, specify the following:

Current (Hz) Specify the wander frequency.
Step Size (Hz) Specify how much to increase or decrease the
wander modulation frequency using the up or down buttons provided
on the Wander Tx toolbar on the main screen.
5 Under Tx Amplitude, specify the following:
Current (UI) Specify the wander amplitude.
Step Size (UI) Specify how much to increase or decrease the
wander modulation amplitude using the up or down buttons provided
on the Wander Tx toolbar on the main screen.
6 To return to the Main screen, select the Results soft key.
7 Connect a cable from the appropriate TX connector to the networks Rx
access connector.

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8 If you are testing an optical signal, select the Laser button.

The button label becomes Laser On.
9 Verify the LEDs.
If you are testing on a T-Carrier or PDH interface, see step 11 on
page 16.
If you are testing on a SONET or SDH interface, see step 14 on
page 65.
If you are testing on an OTN interface, see step 8 on page 172.
10 To start transmitting the wandered signal, select the Modulation button on
the wander toolbar.

11 You can optionally increase or decrease the frequency or amplitude of the

wandered signal using the corresponding up and down arrows.
The Transport Module starts to generate and transmit wandered signals.

Measuring and analyzing wander

If you purchased the optical or electrical wander testing option, you can
measure Time Interval Error (TIE) and calculate MTIE/TDEV (Maximum Time
Interval Error/Time Deviation) to evaluate the condition of your network
elements.
NOTE:
The time it takes to update the TIE data or calculate MTIE/TDEV depends
on the amount of data collected. For faster processing, it is recommended
that you export the wander data for offline analysis using the O.172 MTIE/
TDEV Offline Analysis software that ships with the electrical wander or optical jitter and wander test option. For details about exporting wander data,
see Saving and exporting wander measurement data on page 108.

Measuring TIE and

calculating MTIE

Measuring TIE and calculating MTIE involves specifying the settings for the
test interface you selected and the Tx and Rx parameters. After the test starts,
you can observe the TIE and MTIE results in the Wander category.
To measure TIE and MTIE
1 Using the Test Menu, select the wander test application for the signal and
payload you are testing (refer to Table 18 on page 89).

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2 Do one of the following:

If you are testing on a T-Carrier or PDH interface, follow step 2 on
page 14 through step 7 on page 15 in Chapter 2 T-Carrier and PDH
Testing.
If you are testing on a SONET or SDH interface, select the Setup soft
key, and then follow step 2 to step 8 on page 65 in Chapter 3 SONET
and SDH Testing.
If you are testing on an OTN interface, follow step 2 on page 171 in
Chapter 6 OTN Testing.
3 Select the Wander tab.
Setups appear for the wander test.
4 Select the arrows to the right of the Low-Pass Filter field, and then specify
the Rx filter.
The filter you specify automatically determines the sampling rate for the
wander measurement.

5 Select Restart.
6 Run the test for an appropriate length of time. To ensure accuracy of your
results, let the test run for at least one minute.
7 To view the wander results, set one of the result windows to display the
Summary group, set another results window to display the Interface group,
and then select the Wander category.
To view the wander results in a graphical format, select the Wander Graph
category. For details, see Wander results on page 207.
TIE and MTIE results are measured.

Analyzing wander

After you have measured TIE, the Transport Module can calculate MTIE and
TDEV and display the results in a graphical format.
1 To analyze wander, follow step 1 through step 7 of Measuring TIE and
calculating MTIE.
2 Select the Wander Analysis soft key.

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The graphical wander analysis screen appears with the TIE tab selected.
NOTE:
You can run Wander Analysis while the test is in progress, however, if
you modify the settings and restart the test, the wander data collected
previously will be cleared. If you want to preserve the wander data for the
previous measurement, export the data before restarting a test.
The Wander Analysis requires that the base unit have at least 256 MB of
memory. If your base unit does not have enough memory, you must
export the wander data for offline analysis. For information about the
Transport Module memory options, refer to the 8000 Base Unit User
Manual.
Wander analysis is restricted to the first 8.64 million samples. If your
measurement contains more samples, you must export the wander data
for offline analysis.
Wander analysis is a memory intensive operation. Therefore, you can
only process wander data while running a single application.
For detailed information about saving and exporting wander data, see Saving and exporting wander measurement data on page 108.
3 Select the Update TIE Data soft key.
The TIE graph appears. The Wander Analyzer automatically displays the
last block of continuous valid data.

4 To observe another block of data, select the Current Block field, type the
block number, and then select OK.
The data block you specified appears.
5 If you want to observe the frequency offset curve, clear the Remove
Offset checkbox.

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6 To select the data curve to observe, under Curve Selection, do one of the
following:
To observe both TIE and frequency offset data curves, select Both
Curves.
To observe only the frequency offset data curve, select Offs.rem.only.
7 To refresh the graph, select the Update TIE Data soft key again.
8 To observe the MTIE/TDEV result graph, select the MTIE/TDEV tab.
The MTIE/TDEV graph screen appears.
9 Select Calculate MTIE/TDEV to start calculating MTIE and TDEV results.
The MTIE/TDEV graphs appear.

10 To customize the graph, do the following:

a To select the data curves you want to observe, select MTIE only, TDEV
only, or MTIE+TDEV.
b To select the curve style, select the arrows to the right of the Curve
Style field, and then select Line+Dots, or Dots only.
11 If you want to select a mask to compare the data against, do the following:
a In the Mask Type field, specify a mask type.
b In the Mask field, specify a mask to compare the data to.
The mask curve appears on the result graph.
If you do not want to compare the data against a mask, in the Mask field,
select None.

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12 Do one of the following:

To stop calculating MTIE/TDEV before the calculation is complete,
select the Stop Calculation soft key.
To refresh the graph, select Calculate MTIE/TDEV again.
To return to the Main screen, select the Results soft key.
To stop wander analysis and return to the Main screen, select the
Close Analysis soft key.
NOTE:
Selecting the Close Analysis soft key stops analyzing the data and clears
test results. You can then analyze wander data by running a new test application. To return to the Main screen without ending the current analysis, use
the Results soft key.

Saving and exporting wander

measurement data

You can save the TIE result data to a .hrd file on the Base units hard drive,
export the saved file to a USB memory key, and then do further analysis of
MTIE and TDEV by loading the file on a remote PC using the O.172 MTIE/
TDEV Offline Analysis software application that shipped with your unit.
NOTE:
Restarting a test clears the wander history data. If you want to preserve the
wander data for the current measurement, you must export the data before
restarting a test.
To save the TIE data
1 Select the Save TIE Data soft key.
The wander data is saved into a .hrd file in the following folder on your
unit:
../acterna/user/harddisk/bert/reports
The file name is automatically assigned with a TIE_ prefix followed by
date, time, test mode, and interface information as shown in the following
example:
TIE_2007-08-16T15.59.19_TermDs1WanderTieEvalMsec.hrd
The TIE data is saved.
To export the TIE data to a USB memory key
1 Insert a USB memory key into one of the two slots provided on the top
panel of the base unit.
2 Select the Export TIE Data soft key.
The Wander Data Files screen appears, listing the wander data files in:
../acterna/user/harddisk/bert/reports
3 Select the wander data file you want to export, and then press the Export
to USB soft key.
The File Export dialog box appears, indicating that the unit is copying the
selected report file to the USB memory key.
The TIE data is exported.

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1PPS Analysis

1PPS Analysis
If your instrument is optioned to do so, analysis measurements using a 1PPS
reference from an optional GPS receiver can be taken to determine whether
the 1PPS service provided by a PTP slave device is accurately traceable to
external reference equipment.
To analyze 1PPS signals
2 Depending on which instrument you are using, refer to Figure 8 through
Figure 10 to connect the cables.
a Connect the BNC to SMA cable between the GPS receiver 1PPS
output connector (OUT B) and the SMA reference input (EXT REF)
on the MSAMv2 connector panel.
b Depending on the PTS Slave, do one of the following:
If connecting to a RJ45 jack on the PTP Slave, connect the RJ45 to
USB cable from the MSAMs USB port to the RJ45 jack on the PTP
Slave device under test.
If connecting to a SMA jack on the PTP Slave, connect the USB to
SMA from the MSAMs USB port to the SMA jack on the PTP Slave
device under test.
If connecting to a BNC jack on the PTP Slave, connect the BNC to
SMA cable to the SMA to USB cable, and then plug the USB connector
into the MSAMs USB port and the BNC connector into the BNC jack on
the PTP Slave device under test.
c Optional. Connect the DB9 to USB serial cable from the Control Port on
the GPS receiver to a PC.

Figure 8

GPS Connections- MTS-6000A with MSAMv2

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Figure 9

GPS Connections- MSAMv2 with MTS-8000v2

Figure 10 GPS Connections- MSAMv2 with MTS-8000v1

3 Using the Test Menu, select the 1PPS Analysis application.

4 Before beginning the test, verify that the GPS receiver and instrument are
synchronized and ready.
a Verify that the appropriate LEDs on the GPS receiver are flashing or
steadily on (refer to the instructions included with the GPS receiver).
b Verify that the TOD Sync and 1PPS LEDs on the instrument are on.

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5 Select the Setup soft key, and then do the following:

a On the 1PPS Analysis tab, set the Maximum allowable time offset (ns).
The Offset threshold can be set for any value between 100ns and
100,000ns, in 100ns increments. The default value is 1000ns.
b On the Timed Test tab, set the test to either Not Timed, Timed Test or
Delayed Timed Test.
c Set the test duration and start time parameters for the Timed Test and
Delay, if selected.
6 Select the Return soft key to return to the Results page.
The 1PPS Analysis test has been initiated.

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Chapter 5

NextGen Testing

5
This chapter provides step-by-step instructions to perform NextGen tests using
the instrument. Topics discussed in this chapter include the following:
About NextGen testing on page 114
Using LEDs as a guide when testing on page 115
About the NextGen user interface on page 116
Configuring NextGen tests on page 133
Running classic SONET/SDH tests on page 133
VCG testing on page 134
LCAS testing on page 142
BER testing on page 143
GFP testing on page 144
Monitoring NextGen circuits on page 147
Capturing POH bytes on page 148

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About NextGen testing

If your instrument is configured and optioned to do so (N/A 40/100G Transport
Module), you can use it to analyze the performance of NextGen networks by
performing standard SONET and SDH tests to verify the physical layer,
analyzing virtual concatenation groups (VCGs) in the SONET or SDH pipe,
and running BER tests. After performance is verified at each of these layers,
you can transmit and analyze generic framing procedure (GFP) traffic carrying
Ethernet frames, and then run layer 2 and layer 3 Ethernet tests to verify that
network performance conforms to all applicable ITU-T and IEEE standards.
NOTE:
The term NextGen is used throughout this chapter to represent Next Generation, New Generation, and MSTP networks.
It should not be confused with the dedicated NewGen applications on the
instrument, which are designed for testing using an MSAM on one end of
the circuit, and a NewGen module on the other end.
The NextGen test applications are resource-intensive; therefore, when running
them using an MSAM:
It must be a dual port MSAM to run the applications.
Only one NexGen application can be run at a time. If you have an
MSAMv2, applications can be run from either Port 1 or Port 2. If you have
an MSAMv1, tests can be run from Port 1 only.

Features and capabilities

When optioned to do so, the instrument supports the following:
VCG generation and analysisYou can now actively create and transmit
virtual concatenation groups (VCGs). You can populate the VCG payload
with a BERT pattern to verify that a minimum of bit errors occur during
transmission, detect errors for a VCG, and insert errors and alarms for a
particular member of the group. Finally, you can verify the path for specific
members, add or remove members, and determine whether pointer adjustments occurred within a 100 ms latch period.
High and low order virtual concatenationFor SONET networks, VCG
and GFP analysis is supported for high order STS-1c and STS-3c, and low
order VT-1.5 paths. For SDH networks, high order VC-4, high and low
order VC-3, and low order VC-12 paths are supported.
LCAS capabilityYou can determine the link capacity adjustment scheme
(LCAS) MST status of VCG members, and the last LCAS command issued
remotely. LCAS results appear in the LCAS result group. You can also now
control LCAS members on both the source and sink sides when testing in
Terminate mode.
GFP trafficYou can configure, transmit, and analyze GFP-F traffic
carrying Ethernet frames. Frame and error counts and statistics are
provided in the GFP result category.
GFP and SONET alarm insertion. You can insert and observe CSF (client
signal fail) and LFD (loss of frame delineation) alarms, and SONET alarms
when testing GFP traffic. For details, see Inserting GFP errors or alarms
on page 146.
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Using LEDs as a guide when testing

Differential delay measurement. You can measure differential delay for

each VCG, and each member in a group. The measurements appear in
the Diff. Delay category under the VCAT result group. For details, see
Specifying VCG settings on page 135.
Expanded LCAS support and protocol capture. You can manually add or
remove members from a VCG, and insert and detect LCAS errors and
alarms. You can also specify PLTC (partial loss of transport capacity)
thresholds that indicate when your instrument will declare a PTLC for the
sink and source devices. For details, see LCAS testing on page 142.
Path overhead captures. You can capture high or low path overhead bytes
for a particular VCG member for analysis. When configuring the capture,
you can indicate that you want to capture it manually, or specify a trigger to
automate the capture. For details, see Capturing POH bytes on page 74
of Chapter 3 SONET and SDH Testing.

Using LEDs as a guide when testing

At a basic level, you can use the LEDs as a guide to the various layers that
need to be tested on the NextGen network.

Test 1: SONET/SDH physical layer

The SONET/SDH LEDs are used when testing the physical layer. For more
detailed information, you can also observe results in the Interface group, under
the Signal category, and in the SONET or SDH group, under a variety of categories.
The Path LEDs are used when verifying that no errors occurred associated
with the payload mapping of the SONET/SDH overhead. For more detailed
information, you can also observe results in the SONET or SDH group, under
the Line/MSOH, Section/RSOH, Path or HP category. LP and VT result categories are also available.
Throughout this chapter these are referred to as classic SONET/SDH tests,
and procedures for the tests are provided in Chapter 3 SONET and SDH
Testing.

Test 2: VCAT verification

The VCAT LEDs are used to verify that virtual concatenation group (VCG)
members are reassembled quickly and accurately by the far end MSPP or test
instrument. LEDs let you know if there was a loss of sequence (SQM), or loss
of framing due to an incorrect MFI (OOM or OOM2). For more detailed information, you can also observe results in the SONET or SDH group, in the VCAT
category. The VCG Analysis soft key provided on the Main screen also allows
you to observe results for individual members of a VCG.

Test 3: LCAS verification

If Link Capacity Adjustment Scheme (LCAS) testing is enabled, LEDs are

provided for the sink and source devices that indicate whether a loss of
capacity (LOC), a partial loss of transport capacity (PTLC), or total loss of
transport capacity (TLTC) occurred for the group. An LED is also provided
which indicates that the sink device is not using LCAS. In addition to the LEDS,
you can monitor the status of each sink or source member in the LCAS result
group, and observe errored members.

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Test 4: BER analysis

When you transmit a BERT payload, the Pointer and Payload LEDs are used
to determine whether pointers were incremented or decremented for the VCG,
and whether or not the instrument obtained pattern sync. For more detailed
information, you can also observe results in the Payload group, in the BERT
category.

Test 5: GFP and Ethernet analysis

When you transmit GFP encapsulated Ethernet traffic, the GFP LEDs are used
to determine whether there was a loss of framing pattern (LOF), and to verify
that no client signal fail (CSF) alarms were detected due to issues with the
Ethernet interface or link. For more detailed information, you can also observe
results in the GFP group, in the Error Stats, Traffic, and Tx Results categories.
The Ethernet LEDs are used to verify that Ethernet traffic is handled correctly,
and received accurately by the far end MSPP or test instrument. For more
detailed information, you can also observe link statistics, link counts, errors,
and more in the Ethernet group, in a variety of result categories.
When analyzing Ethernet traffic, you can run the standard layer 2 and layer 3
traffic applications, and the layer 3 Ping and Traceroute applications.
Throughout this chapter these are referred to as classic Ethernet tests, and
procedures for the tests are provided in the Ethernet testing manual that
shipped with your instrument or upgrade.
For descriptions of each individual NextGen LED, refer to:
SONET and SDH LEDs (TestPad mode) on page 188
on page 189
NextGen LEDs on page 210
Ethernet LEDs are described in the Ethernet testing manual that shipped
with your instrument or upgrade.

About the NextGen user interface

The elements described in this section are unique to the MSAM when the
instrument is running NextGen applications.

Understanding the LED panel

The LED panel provides LED categories that are appropriate for the NextGen
application that you selected. A Summary LED also appears at the top of the
panel indicating whether or not any Summary Status errors occurred. If it is red,
you can observe the errored results in the Summary result group, in the Status
category.
The LED categories can be expanded by selecting the plus sign next to the
category name, and collapsed by selecting the category name again. A red X
next to a category indicates that errored results have been detected; if no X
appears, no errored results occurred for the category.

BERT LEDs

116

When you configure your unit to transmit a BERT payload over an SDH or
SONET circuit, SONET or SDH, Path, VCAT, Pointer, and Payload LED categories appear on the Main screen. The LED names reflect the emulation mode
(TestPad or ANT) that you selected when you set up your instrument.

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Figure 11 illustrates the LED categories that appear when you are transmitting
a BERT payload over a SONET circuit with LCAS enabled, and the instrument
is operating in TestPad mode.

Figure 11 NextGen SONET LED Categories (BERT payload)

GFP LEDs

When you configure your unit to transmit and analyze GFP traffic over an SDH
or SONET circuit, GFP and Ethernet LEDs also appear. Figure 12 illustrates
the LED categories that appear when the instrument is operating in ANT mode
with LCAS enabled.

Figure 12 NextGen SDH LED categories (GFP Ethernet payload)

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Understanding the graphical

user interface

When you launch a NextGen application, the user interface is similar to the
interface used for classic SONET and SDH applications, with additional
features that are useful when testing NextGen networks. Figure 13 highlights
some of the key elements that are used for NextGen testing.
Edit VCG
Button

Enable LCAS
Rx VCG Member

Signal Structure
Tab

Add All
Buttons

Create
VCG
Button

LED
Panel

VCG Member Selection

for Error Insertion

VCG Analysis
Soft key

Figure 13 Main screen (NextGen GFP Application)

Create VCG quick configuration

button

The Create VCG button allows you to define the VCAT pipe for the members
that you want to analyze. Selecting the button presents the Define VCAT pipe
dialog box, where you can specify the number of transmitted and received
members for analysis, or you can specify the payload bandwidth you want to
analyze. The instrument then automatically calculates the number of members
or the payload bandwidth for you (based on the criteria that you specified).
For details, see Creating a VCG for analysis on page 134.

Edit VCG quick configuration

button

118

The Edit VCG button allows you to add or remove members from defined
VCGs. For details, see Adding or deleting VCG members on page 136.

Rx VCG Member Selection field

The Rx VCG Member Selection field allows you to specify a particular member
for more detailed analysis. For example, if you are analyzing 3 members, specifying 2 in this field highlights test results for member 2 in the VCAT results
group.

Enable LCAS

Select this option to enable LCAS on the Main screen rather than on the LCAS
setup tab. To observe LCAS LEDs, be certain to press Restart to refresh the
screen.

Add All buttons

If you enable LCAS, you can add sink and source members using the Add All
buttons on the Main screen.
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Signal Structure tab

The Signal Structure tab provides a picture of the signal structure you selected
when you launched the application. Figure 14 illustrates the tab when you run
a STM-64 > AU-4 > VC-12-Xv > BERT > Terminate application.

VCG:n, where n represents the

number of members in the group

Figure 14 Signal Structure tab

LED Panel

VCG Member Selection for Error

Insertion

The LED panel provides VCAT LEDs, in addition to the classic SONET or SDH
LEDs. If you are transmitting GFP traffic, GFP and Ethernet LEDs are also
provided. If LCAS is enabled, LCAS LEDs are provided.

The VCG Member Selection field on the Error toolbar allow you to select a
specific member for error or alarm insertion. If the fields do not appear, the
error or alarm is inserted for the entire VCG, or is not related to the group.

VCG Analysis soft key

The VCG Analysis soft key allows you to observe key results for both transmitted and received VCG members. You can also observe the results as a
histogram. For details on VCG analysis, see Analyzing a VCG on page 139.

Understanding the NextGen

test results

When you run NextGen applications, in addition to the classic SONET or SDH
test results, results associated with the VCG are provided in the VCAT result
group. If you are running an application with GFP traffic, GFP and classic
Ethernet test results are also available.
For details, refer to NextGen results on page 209.

About the NextGen test

modes

You can run NextGen applications in Terminate or Monitor mode. The classic
layer 3 Ping and Traceroute applications can only be run in Terminate mode.

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Monitor mode

Select monitor mode to monitor and analyze received traffic.Typically the

instrument is positioned between an MSPP and a SONET/SDH network (as
illustrated in Figure 15), and test traffic is monitored before turning up the new
NextGen network.

Figure 15 NextGen SONET/SDH Monitor Application

Terminate mode

Select terminate mode to generate, transmit, and analyze traffic over the
NextGen network. In terminate mode, the instrument generates traffic independent of the received traffic, and allows you to select a virtual concatenation
group to analyze. The specified VCG will be used to carry the data generated
by the instrument. You can also define the number of members or the type of
payload carried in the group (for example, 10M Ethernet).
The transmitter and receiver are set at the same rate using an internal, recovered, or external 1.5/2M reference transmit clock
When verifying Ethernet service at a NextGen interface, one test instrument is
typically connected to the near end MSPP, and one is connected to the far end
MSPP (as illustrated in Figure 16). The near end instrument then transmits
GFP traffic upstream to the far end instrument, and the far end instrument

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transmits traffic downstream to the near end instrument. Classic Ethernet tests
are performed, and results are observed to verify that the traffic is reassembled
properly and no errors occurred.

Figure 16 NextGen SONET/SDH Terminate Application

NextGen SONET applications

Table 22 on page 122 through Table 25 on page 125 list each of the NextGen
SONET applications. Supported Ethernet rates are also listed for each interface.

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OC-3 applications

Table 22 lists each of the applications for the OC-3 interface. .

Table 22 NextGen SONET OC-3 test applications

Signal

Container

Payload

Carryinga

Applications

Test Modes

OC-3

STS-3c-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

STS-1-Xv

VT-1.5-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

a. GFP Ethernet payload rates represent the upper limit for the signal and container.

122

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OC-12 applications

Table 23 lists each of the applications for the OC-12 interface.

Table 23 NextGen SONET OC-12 test applications

Signal

Container

Payload

Carryinga

Applications

Test Modes

OC-12

STS-3c-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

STS-1-Xv

VT-1.5-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

a. GFP Ethernet payload rates represent the upper limit for the signal and container.

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OC-48 applications

Table 24 lists each of the applications for the OC-48 interface.

Table 24 NextGen SONET OC-48 test applications

Signal

Container

Payload

Carryinga

Applications

Test Modes

OC-48

STS-3c-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

STS-1-Xv

VT-1.5-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

a. GFP Ethernet payload rates represent the upper limit for the signal and container.

OC-192 applications

124

Table 25 lists each of the applications for the OC-192 interface.

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About the NextGen user interface

Table 25 NextGen SONET OC-192 test applications

Signal

Container

Payload

Carryinga

Applications

Test Modes

OC-192

STS-3c-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

STS-1-Xv

VT-1.5-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

a. GFP Ethernet payload rates represent the upper limit for the signal and container.

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About the NextGen user interface

NextGen SDH test

applications
STM-1 test applications

Table 26 on page 126 through Table 29 on page 132 list each of the NextGen
SDH applications. Supported Ethernet rates are also listed for each interface.

Table 26 lists each of the applications for the STM-1 interface.

Table 26 NextGen SDH STM-1 test applications

Signal

Administrative
Unit

Container

Payload

Carryinga

Applications

Test Modes

STM-1

AU-4

VC-4-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps
Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

VC-3-Xv

VC-12-Xv

AU-3

126

VC-3-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

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About the NextGen user interface

Table 26 NextGen SDH STM-1 test applications (Continued)

Signal

Administrative
Unit

Container

Payload

Carryinga

Applications

Test Modes

AU-3 continued

VC-12-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

a. GFP Ethernet payload rates represent the upper limit for the signal and container.

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STM-4 test applications

Table 27 lists each of the applications for the STM-4 interface..

Table 27 NextGen SDH STM-4 test applications

Signal

Administrative
Unit

Container

Payload

Carryinga

Applications

Test Modes

STM-4

AU-4

VC-4-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps
Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

VC-3-Xv

VC-12-Xv

AU-3

128

VC-3-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

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Chapter 5 NextGen Testing

About the NextGen user interface

Table 27 NextGen SDH STM-4 test applications (Continued)

Signal

Administrative
Unit

Container

Payload

Carryinga

Applications

Test Modes

AU-3 continued

VC-12-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

a. GFP Ethernet payload rates represent the upper limit for the signal and container.

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STM-16 test applications

Table 28 lists each of the applications for the STM-16 interface..

Table 28 NextGen SDH STM-16 test applications

Signal

Administrative
Unit

Container

Payload

Carryinga

Applications

Test Modes

STM-16

AU-4

VC-4-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

VC-3-Xv

VC-12-Xv

AU-3

130

VC-3-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

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About the NextGen user interface

Table 28 NextGen SDH STM-16 test applications (Continued)

Signal

Administrative
Unit

Container

Payload

Carryinga

Applications

Test Modes

AU-3 continued

VC-12-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

a. GFP Ethernet payload rates represent the upper limit for the signal and container.

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STM-64 test applications

Table 29 lists each of the applications for the STM-84 interface..

Table 29 NextGen SDH STM-64 test applications

Signal

Administrative
Unit

Container

Payload

Carryinga

Applications

Test Modes

STM-64

AU-4

VC-4-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

VC-3-Xv

VC-12-Xv

AU-3

132

VC-3-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

1000 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

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Configuring NextGen tests

Table 29 NextGen SDH STM-64 test applications (Continued)

Signal

Administrative
Unit

Container

Payload

Carryinga

Applications

Test Modes

AU-3 continued

VC-12-Xv

BERT

BER pattern

BERT

Terminate
Monitor

GFP Ethernet

100 Mbps Ethernet

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Ping

Terminate

Traceroute

Terminate

a. GFP Ethernet payload rates represent the upper limit for the signal and container.

Configuring NextGen tests

Configuring a NextGen test involves specifying settings for the following:
Settings

Refer to

Tx clock source

Specifying the Tx clock source on page 59 of

Chapter 3 SONET and SDH Testing.

SONET or SDH

Running classic SONET/SDH tests on page 133

VCAT

VCG testing on page 134

LCAS
(if used on network)

LCAS testing on page 142

BERT

BER testing on page 143

GFP

GFP testing on page 144

Ethernet

Layer 2 and Layer 3 Ethernet settings. For details, see

the Ethernet testing manual that shipped with your
instrument or upgrade.

In many cases, the steps involved in specifying these settings are similar to
those followed when configuring classic SONET, SDH, and Ethernet tests.
After the settings are specified, you are ready to test various aspects of the
NextGen network.

Running classic SONET/SDH tests

Before you test the NextGen network, you should verify that the legacy SONET
or SDH network is operating properly by running the classic SONET/SDH
tests, including:
Measuring optical power on page 59
BER testing on page 63
Drop and insert testing on page 66
Inserting errors, anomalies, alarms, and defects on page 68
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Measuring round trip delay on page 70

Measuring service disruption time on page 71
Viewing a TOH group on page 72
Manipulating overhead bytes on page 73
Specifying the J0 or J1 identifier on page 75
Manipulating K1 or K2 APS bytes on page 79
Inserting the C2 Path signal label on page 77
Manipulating the S1 byte on page 80
Adjusting pointers on page 81
Verifying performance on page 84
Monitoring the circuit on page 85
For a thorough overview of SONET/SDH testing, refer to Chapter 3 SONET
and SDH Testing.

VCG testing
After verifying that the legacy SONET or SDH network is operating properly,
you can create, transmit, and analyze virtual concatenation groups and
members to determine whether the elements on the NextGen network process
traffic properly, and reassemble the members correctly at the far end.

Creating a VCG for analysis

You can define a VCG to be transmitted by the instrument (the Tx VCG), and
a VCG to be analyzed by the instrument (the Rx VCG). When you create a
VCG, the instrument numbers the channels sequentially beginning with 1
(one). You can optionally edit the sequence and channel numbers for the
members after you create the VCG (see Specifying VCG settings on
page 135).
The maximum bandwidth supported for any given group is 1.2 Gigabits
(without GFP overhead).
To create a VCG
1 On the Quick Config tab of the Main screen, select the Create VCG
button.
The Create VCG dialog box appears.
2 The settings for both the transmitted VCG and the received (and analyzed)
VCG are identical. To specify the settings, do the following:

134

Setting

Value

Define Tx VCG

Select this checkbox if you intend to define a

VCG to be transmitted by the instrument.

Define Rx VCG

Select this checkbox if you intend to define a

VCG to analyze.

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Setting

Value

Payload Bandwidth
(Mbps)

To define the VCG by specifying the bandwidth

for the group (for example, 449 Mbps), select this
radio button, then specify the bandwidth in Mbps.
After you specify the bandwidth, the instrument
then calculates the number of members the
structure can support for the bandwidth. If necessary, the instrument automatically adjusts the
bandwidth upwards to support the next highest
number of members for the group.
For example, if you specify a 300 Mbps bandwidth for a VC-4-Xv group, the instrument will
automatically increase the bandwidth to
449 Mbps, create 3 members, and display the
structure as VC-4-3v.

Number of Members

To define the VCG by specifying the number of

members in the group, select this radio button,
then enter the number of members in the adjacent field.
After you specify the number of members, the
instrument calculates the corresponding bandwidth and structure for you. For example, if you
specify 6 members for a VC-4-Xv group, the
instrument will calculate the required bandwidth
for the group as 898.6 Mbps, and will display the
structure as VC-4-6v.

Tx = Rx

If you want to apply the transmit settings to the

received VCG to be analyzed, select this button.

Rx = Tx

If you want to apply the receive settings to the

VCG to be transmitted, select this button.

3 Select OK to create the VCGs and return to the Main screen.

The VCGs are created.

Specifying VCG settings

After creating the VCGs, you can edit the sequence and channel numbers for
the members, and add or remove members from the group.
To specify VCG settings
1 If you havent already done so, use the Test Menu to select the NextGen
test application for the interface you are testing. Refer to Table 22 on
page 122 through Table 29 on page 132 for a list of applications.
2 Select the Setup soft key, and then select the SONET or SDH tab.
3 In the panel on the left side of the tab, select VCG.
Settings appear for the transmitted and received VCG members.
4 Specify the following settings for the group:
a In Result Scale (us), specify the scale for differential delay measurements in microseconds.
b If you intend to test LCAS for the group, select Enable LCAS.

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5 If you want to edit information for individual members of a group, do the

following:
a Select Edit VCG Members.
The Edit VCG Members dialog box appears. Two boxes appear listing
each of the Tx members and each of the Rx members.
A trash can icon appears to the left of each member, and the
sequence number and channel number is also listed.
b Do the following:
Setting

Value

Address Format (low

order path only)

Select one of the following:

KLM
Timeslot
Logical

Seq.

If you want to change the default sequence

number for a member, select the field to display a keypad. A range of valid sequence numbers appears at the top of the keypad.
Type the new sequence number, and then
select OK.
NOTE: The sequence number is used to determine whether a sequence mismatch occurred
for the member during testing.

OC-N or STM-N

If you want to change the default channel number for a member, select the OC-N or STM-N
field to display a keypad. A range of valid channel numbers appears at the top of the keypad.
Type the new channel number, and then select
OK.

Default

If you want to restore the default settings to the

transmit or receive VCG, select the Default
button under the corresponding list of channels.

Tx = Rx

If you want to apply the edited transmit settings

to the received VCG to be analyzed, select this
button (located under the list of Tx channels).

Rx = Tx

If you want to apply the edited receive settings

to the VCG to be transmitted, select this button
(located under the list of Rx channels.

6 Select OK to store the settings and return to the SONET or SDH setup tab.
Select OK again to return to the Main screen.
The VCG settings are specified.

Adding or deleting VCG

members

You can add new members, or delete current members from a group.
To add or delete VCG members
1 If you havent already done so, use the Test Menu to select the NextGen
test application for the interface you are testing. Refer to Table 22 on
page 122 through Table 29 on page 132 for a list of applications.

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2 Select the Setup soft key, and then select the SONET or SDH tab.
3 In the panel on the left side of the tab, select VCG.
Settings appear for the group.
4 Select Edit VCG Members.
The Edit VCG Members dialog box appears.
5 Do one of the following:
To

Do this

Add a member

Under the Tx or Rx member list, the

New member settings are listed. Type the
sequence number and channel number for
the new member (under the appropriate list),
and then select the plus (+) sign.
The bandwidth required for the group, and the
VC structure are automatically adjusted.

Delete a member

Select the trash can icon to the left of the

member. The bandwidth required for the
group, and the VC structure are automatically
adjusted.

6 Select OK to store the settings and return to the SONET or SDH setup tab.
Select OK again to return to the Main screen.
The members are added or deleted.

Inserting SONET or SDH

errors and alarms

You can insert errors (anomalies) and alarms (defects) simultaneously. When
running NextGen applications, the terms errors and alarms are used on the
user interface (rather than anomalies and defects).
To insert errors or alarms
1 If you havent already done so, use the Test Menu to select the NextGen
test application for the interface you are testing. Refer to Table 22 on
page 122 through Table 29 on page 132 for a list of applications.
2 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
3 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
4 Select the Laser button.
5 On the Main screen, select the Errors or Alarms toolbar, and then select
an error or alarm type.
The LOF, AIS-L, and RDI-L alarms will impact all members of the transmitted VCG. All other alarms will impact the currently selected VCG
member.
The Frame Word, B1, B2, REI-L, and Bit/TSE errors will impact all
members of the transmitted VCG. All other errors will impact the
currently selected VCG member.

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6 Specify the following for the alarm or error you selected:

Alarm or
Error Type

Inserted
into
transmitted

Additional Settings

High Order Path Alarms and Errors

LOF
AIS-L (MS-AIS)
RDI-L (MS-RDI)

SOH

None

Frame Word
(FAS Word)

SOH

Quantity. Select the field, type the number of errors you want to insert (ranging
from 1 to 32), and then select OK.

B1
B2
REI-L (MS-REI)

SOH

Insertion Type. Select Single or Rate. If

you select Rate, specify the rate for
insertion.

AIS-P
LOP-P
RDI-P
LOM-P
LOM2
REI-P
B3

Member

VCG Member. Select the field to display

the currently transmitted members, and
then select the member the alarm will be
inserted into.

LOF
MS-AIS
MS-RDI
Bit/TSE

VCG

N/A

Low Order Alarms and Errors

Frame Word
(FAS Word)

SOH

Quantity. Select the field, type the number of errors you want to insert (ranging
from 1 to 32), and then select OK.

B1
B2
REI-L (MS-REI)

SOH

Insertion Type. Select Single or Rate. If

you select Rate, specify the rate for
insertion.

B3
LP-BIP
LP-REI
AU-AIS
AU-LOP
TU-AIS
TU-LOP
LOM2
LP-RDI

Member

VCG Member. Select the field to display

the currently transmitted members, and
then select the member the alarm or
error will be inserted into.

7 Press the Alarm Insert or Error Insert button.

Alarm or error insertion starts, and the associated button turns yellow.
Test results associated with the error or anomaly appear in the Status result
category. You can also use the VCG Analysis soft key to observe errors and
alarms for the received group and individual members within the group. See
Analyzing a VCG on page 139.

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To stop insertion
Press the Alarm Insert or Error Insert button again.
Alarm or error insertion stops, and the associated button turns grey.

Analyzing a VCG

Pressing the VCG Analysis soft key displays the VCG Analysis screen, which
provides error and alarm LEDs for each member and for the VCG as a whole.
To analyze a VCG
On the Main screen, select the VCG Analysis soft key.
The VCG Analysis screen appears, with tabs that allow you to observe test
results for the received VCG, transmitted VCG, and results in a histogram
format.
The default view is of the received VCG, and the Rx tab is selected (see
Figure 17).

Figure 17 VCG Analysis screen - Results for received member 1

with errored VC-12
Red indicates that a member or channel is errored. You can also use the
graphics of the members and channels to select the member and channel that
you want to observe results for.

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Selecting the Tx tab displays the same layout for the transmitted VCG
members, without the test results (because the transmitted members are not
being analyzed). For an example, see Figure 18).

Figure 18 VCG Analysis screen - Tx tab view

If you select the Histogram tab, results appear for the VCG in a histogram
format (see Figure 19).

Figure 19 VCG Analysis screen - Histogram results for entire group

Results are also provided in the VCAT result group. For descriptions, see
VCAT results on page 211.

Manipulating overhead bytes

140

Pressing the SONET Overhead or SDH Overhead soft key displays the
Overhead Byte screen, which allows you to manipulate the value of selected
overhead bytes, and then view the transmitted and received byte values.

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VCG testing

To manipulate an overhead byte

Figure 20 Overhead Byte screen - NextGen SONET application

The Line/Multiplexor Section bytes appear in green; the Section/Regenerator Section bytes appear in grey. Path/High Path overhead bytes appear
in blue.
Byte values on the top are the transmitted values, values on the bottom
are the received values.
Bytes labeled using a black font can be manipulated.
Bytes labeled using a grey font cannot be manipulated.
High order overhead bytes can not be modified if you are running a low
order application.
The Defaults button restores any byte you changed to its default
values.
3 To change the value of a byte, do the following:
a Select the byte you want to manipulate.
b Select the Selected Byte field, type the new byte value, and then select
OK.
The new value appears in the field.
4 If you are manipulating TOH or SOH bytes, specify the Tx and Rx channels for the byte.
5 If you are manipulating POH bytes, specify the Tx and Rx channels for the
byte.
6 Select the Tx and Rx VCG member for the overhead byte.

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7 Select the Results soft key to return to the Main screen.

SDH

Signal Present

Frame Sync

Pattern Sync

If your module is in ANT mode, verify that the following LEDs are not
red:
SONET and SDH
LOS
LOF
LSS

13 Observe the byte values.

The overhead byte is manipulated.

LCAS testing
After creating and analyzing virtual concatenation groups and members, you
can optionally enable LCAS testing, and then add or remove members for each
VCG. You can also control when your instrument declares PLTC for both
source and sink devices.

Enabling LCAS

To enable LCAS and specify PLTC thresholds

1 If you havent already done so, use the Test Menu to select the NextGen
test application for the interface you are testing. Refer to Table 22 on
page 122 through Table 29 on page 132 for a list of applications.
2 Select the Setup soft key, and then select the LCAS tab.
3 Select Enable LCAS.
4 For both source and sink devices, in PLTC Threshold (members), specify
the number of members that must be lost on either side for the instrument
to declare a PLTC error.
LCAS is enabled; use the Results soft key to return to the Main screen.

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BER testing

Monitoring the LCAS MST

status for VCG members

To observe the MST status for each member

1 Set the Result group to LCAS, and the category to Member Status (Sink)
or Member Status (Source).
2 Display the results in a full window by selecting
View > Results > Full Size.
3 Observe the LCAS results for each member. The MST status, and the last
LCAS command issued remotely for each member is provided.
You are monitoring the LCAS status of the VCG members.

Adding or removing
members

When LCAS is enabled, you can manually add or remove members from the
source or sink groups. You can also use the DNU (Do Not Use) action key to
indicate that a particular member should not be used in the group.
To add or remove members
1 If you havent already done so, use the Test Menu to select the NextGen
test application for the interface you are testing. Refer to Table 22 on
page 122 through Table 29 on page 132 for a list of applications.
2 Verify that the laser is on, and that traffic has been started.
3 Verify that LCAS is enabled (see Enabling LCAS on page 142), then
press Restart.
4 On the Main screen, select the LCAS tab on the Action bar, then do one of
the following:
To add a member, specify the member number for the source or sink
group, then select Add. Members must be available to see the Add
button; if all members in the group are already used, a Remove button
is provided instead.
To remove a member, specify the member number for the source or
sink side, then select Remove. Members must be in a group to see the
Remove button; if no members are used, an Add button is provided
instead.
To indicate that a particular member should not be used in the group,
specify the member number, then select Force DNU. The member will
not be used on the source or sink side.
Members are added or removed.

BER testing
After verifying that the elements on the NextGen network process VCAT traffic
properly, and if applicable, monitoring LCAS members, you should transmit a
BER pattern in the VCG payload to verify that data carried in the VCAT
payloads is accurate.
NOTE: Changing BERT patterns
If you change a BERT pattern during the course of your test, be certain to
press the Restart soft key to ensure that you regain pattern sync.

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GFP testing

To run a VCAT BER test

1 If you havent already done so, use the Test Menu to select the NextGen
BER test application for the interface you are testing. Refer to Table 22 on
page 122 through Table 29 on page 132 for a list of applications.
2 Select the Setup soft key, and then select the Pattern tab.
3 Specify the pattern for the test (see Specifying a BERT pattern on
page 63 of Chapter 3 SONET and SDH Testing.
The instrument can also automatically detect the BER pattern on the
received signal. For details, see Detecting the received BER pattern on
page 65.
4 Select the Results soft key to return to the Main screen.
5 Do one of the following:
If your instrument is in TestPad mode, verify that the Payload Pattern
Sync LED is illuminated.
If your instrument is in ANT mode, verify that the LSS LED is not illuminated.
6 Verify that All Results OK appears in the results display.
7 Optional. Insert five Bit / TSE errors (see Inserting errors, anomalies,
alarms, and defects on page 68), and then verify that the five errors were
received in the BERT result category.
8 Run the test for an appropriate length of time.
The BER test is finished.

GFP testing
After verifying that the network is handling VCAT members and the data carried
in the payloads properly, you should verify that the network can support GFP
encapsulated Ethernet traffic.

Specifying GFP settings

Before analyzing GFP encapsulated Ethernet traffic, you must specify settings
that characterize the traffic on the GFP setup tab. You also specify filter
settings to analyze only received GFP traffic that satisfies the criteria.
To specify GFP settings
1 If you havent already done so, use the Test Menu to select the NextGen
GFP Ethernet test application for the interface you are testing. Refer to
Table 22 on page 122 through Table 29 on page 132 for a list of applications.
2 Select the Setup soft key, and then select the GFP tab.

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3 Use the graphical display of a GFP frame to specify the following:

Frame Label

Setting

Value

PFI

Enable or disable the Payload FCS

Indicator (PFI).
When enabled, GFP traffic will use
the optional payload FCS.
When disabled, the traffic will not
use the payload FCS.

EXI

Select the type of Extension Header

Identifier (EXI) used:
No Extension Header
Linear Frame
Ring Frame

CID

If you selected Linear Frame as the

EXI, enter the Channel ID (CID) in a
hexidecimal format.

4 Under Rx Filter, specify the following settings to filter results for received
traffic:
Setting

Value

Filter on CID

CID Filter Value

If you want to analyze received traffic for a particular channel, select Enabled.
If you want to analyze received traffic for any
channel, select Disabled.

If you enabled the CID filter, specify the channel ID

carried in the traffic that you want to analyze.

5 If you need to specify other settings for the test, select the appropriate tab;
otherwise, press Results to return to the Main screen.
The GFP settings are specified.

Specifying Ethernet and IP

settings

After you specify the GFP settings, you should specify the classic Ethernet and
IP settings. For step-by-step instructions, refer to the Ethernet testing manual
that shipped with your instrument or upgrade. Required settings include:
Ethernet frame settings
Ethernet filter settings
Traffic load settings
IPv4 packet settings
IPv4 filter setting

Transmitting and analyzing

GFP traffic

For step-by-step instructions on running the tests, see the Ethernet testing
manual that shipped with your instrument or upgrade. In addition to the layer 2
and layer 3 tests, you can also run an automated RFC 2544 test to verify the
Ethernet and IP service.

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GFP testing

Inserting GFP errors or

alarms

In addition to the classic SONET, SDH, Ethernet, and IP errors and alarms,
action buttons on the Main screen allow you to insert a variety of GFP errors
and alarms into the traffic stream. If you insert errors at a specific rate (for
example, 1E-3), the errors are inserted even after you restart a test or change
the test configuration.
To insert GFP errors or alarms
1 On the Main screen, select the Error tab or the Alarm tab on the Action bar.
2 If you are inserting errors, select the GFP Error type, and then select the
appropriate settings for the following errors:
Errors

Insert
Style

Rate

Number of Bits

Idle Frame Error

Single

N/A

Short Frame Error

Single

N/A

PFCS Error

Single

N/A

Rate

N/A

Core Header
Error

Single

N/A

Rate

Ext Header Error

Single

N/A

Rate

Type Header
Error

Single

N/A

Rate

Single
Multiple

EXI Error

N/A

Single
Multiple

PFI Error

N/A

PLI Error

N/A

Cont (Continuous)
1E-1 through 1E-9

Single
Multiple

3 Do one of the following:

If you are inserting GFP alarms, select the GFP Alarm Type, then
select CSF Alarm, or LFD Alarm.
If you are inserting SONET alarms, select the appropriate alarm type,
and then specify any additional settings. For details on SONET or SDH
alarm insertion, see Inserting SONET or SDH errors and alarms on
page 137.
4 Press the Error Insert or Alarm Insert button.
If you are inserting errors at a particular rate, the button turns yellow. To
stop insertion, press the button again. Error insertion stops, and the
button turns grey.
If you are inserting alarms, the button turns yellow, and the alarm is
inserted continuously until you turn it off.
Errors or alarms are inserted into the traffic stream.
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Monitoring NextGen circuits

You can monitor received signals for BERT errors, or you can monitor received
signals carrying GFP traffic.

Monitoring the circuit for

BERT errors

Use the Monitor BERT application whenever you want to analyze the received
signal for BERT errors.
To monitor NextGen circuits
1 If you havent already done so, use the Test Menu to select the NextGen
BERT test application in Monitor mode for the interface you are testing.
Refer to Table 22 on page 122 through Table 29 on page 132 for a list of
applications.
2 Connect the module to the circuit.
3 Verify that the green Signal Present, and Frame Sync LEDs are illuminated.
4 At a minimum, observe the results in the Summary group, VCAT group,
and Payload group.
The circuit is monitored.

Monitoring a circuit carrying

GFP traffic

Use a GFP monitor application whenever you want to analyze a received

signal carrying GFP traffic. When you configure your test, you can specify
settings that indicate the expected received payload and determine which
frames will pass through the receive filter and be counted in the test result categories for filtered traffic. The settings may also impact other results.
NOTE:
You must turn the laser on using the associated button to pass the signal
through the units transmitter.
To monitor GFP traffic
1 If you havent already done so, use the Test Menu to select the
NextGen GFP test application in Monitor mode for the interface you are
testing. Refer to Table 22 on page 122 through Table 29 on page 132 for a
list of applications.
2 Connect the module to the circuit.
3 Select the Setup soft key, select the GFP tab, and then specify the GFP
filter settings (see step 4 on page 145 of Specifying GFP settings).
4 Select the Filters tab, and then specify the Ethernet, and if applicable, the
IP filter settings. For detailed instructions, see the Ethernet testing manual
that shipped with your instrument or upgrade.
5 Press Results to return to the Main screen.
6 If you are testing an optical interface, select the Laser button.
7 Verify that the green Signal Present, Sync Acquired, and Link Active LEDs
are illuminated.

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Capturing POH bytes

8 At a minimum, observe the Summary, VCAT, and GFP results.

The GFP traffic is monitored.

Capturing POH bytes

You can now capture path overhead bytes during NextGen testing. When
configuring the capture, you can indicate that you want to capture it manually,
or specify a trigger to automate the capture.
For details, see Capturing POH bytes on page 74 of Chapter 3 SONET and
SDH Testing.

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Chapter 6

OTN Testing

6
This chapter provides step-by-step instructions for performing OTN tests.
Topics discussed in this chapter include the following:
About OTN testing on page 150
Specifying the Tx clock source on page 156
Specifying channels or timeslots on page 157
BER testing layer 1 on page 158
Configuring 1 GigE, 10 GigE, 100 GigE LAN traffic on page 158
Measuring optical power on page 159
Inserting errors, anomalies, alarms, and defects on page 160
Observing and manipulating overhead bytes on page 161
Scrambling the signal on page 163
FEC testing on page 163
GMP Mapping on page 164
GFP Mapping on page 165
Specifying SM, PM, and TCM trace identifiers on page 166
Specifying FTFL identifiers on page 169
Specifying the transmitted and expected payload type on page 170
BER testing on page 171
Measuring service disruption time on page 172
Monitoring the circuit on page 173

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About OTN testing

If your instrument is configured and optioned to do so, you can use it to analyze
the performance of OTU1 (2.7G), OTU2 (10.7G, 11.05G, and 11.1G), OTU3
(43.02G) and OTU4 (111.8G) networks by performing FEC tests, BER tests,
and inserting errors and alarms to verify that network performance conforms to
G.709 standards.
When you configure the instrument for OTN testing, a number of the test
parameters vary depending on the line rate (SONET, SDH, or Ethernet), and
payload (SONET, SDH, bulk BERT, or Layer 1 BERT) you select.
The OTN test applications are resource-intensive; therefore, if you are using
an MSAM:
For MSAMv1, you must have a dual port MSAM (C0404 or C1004) to run
the OTN applications.
For MSAMv2 (C0404-v2 or C1010-v2)), OTN applications can be run from
either port, although only one application may be run at a time.

Features and capabilities

When testing OTN circuits, you can generate and analyze bulk BERT payloads
at SONET, SDH, and 10 Gigabit Ethernet line rates. You can also generate and
analyze SONET and SDH payloads encapsulated in an OTN wrapper at OTU1
(2.7G), OTU2 (10.7G), OTU1e(11.05G), OTU2e (11.1G) and OTU3 (43.02G)
line rates, and Ethernet client signals at OTU2 line rates (11.05 and
11.095 Gbps) on 10 GigE LAN circuits. High-speed OTN circuits can be
analyzed using BERT payloads at OTU3 (43.02G) rates and BERT and
Ethernet payloads at OTU4 (111.8G) rates using the 40G/100G High-Speed
Transport Module. The following are also supported:
FEC testingYou can use the module to verify that network elements on
an OTN network are configured to handle errors properly.
BERT patternsYou can transmit and detect BERT patterns for each rate
available on the MSAM.
Error/anomaly and alarm/defect insertionYou can insert a variety of
errors, anomalies, alarms, and defects into traffic, such as FAS and logic
errors.
Section Monitoring (SM), Path Monitoring (PM), and TCM identifiersYou
can specify outgoing and expected identifiers, and indicate whether or not
you want the module to show a trace identifier mismatch (TIM) whenever
the expected and received identifiers do not match.
FTFL identifiersYou can specify outgoing FTFL identifiers.
Payload typesYou can specify transmitted and expected payload types,
and indicate whether the module should show test results associated with
payload type mismatches in the OPU result category.
1GigE_LAN trafficYou can configure a 1GigE payload in an ODU client.
10 GigE LAN trafficYou can configure VLAN and Q-in-Q encapsulated
traffic, and transmit a constant or flooded load of traffic over the circuit. You
can also filter received traffic to analyze only VLAN or Q-in-Q traffic. For
details on configuring Ethernet traffic, see the Ethernet testing manual that
shipped with your instrument.
10GigE traffic You can configure VLAN and Q-in-Q encapsulated traffic
and map it into OTU4 via GMP.

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About OTN testing

ODU MultiplexingA variety of ODU multiplexed signals are available for

transport and/or analysis.
- ODU1 payload carried in an OTU2 signal at a 10.7G line rate.
- ODU0 payload carried in an OTU1 signal at 2.7G line rate or OTU2
signal at a 10.7G line rate.
- ODUflex with up to eight 1.25G timeslots in OTU2 signal at 10.7G line
rate.
- GMP-mapped ODU4 multiplexed payloads for high-speed L2 and L3
circuits.
OTU1, OTU2, OTU1e/2e, OTU3 and OTU4 scramblingYou can
scramble signals carried at the line rate for the interface you are testing.
Scrambling of multiplexed signals is not supported.
SDH client signal analysisYou can analyze multiplexed SDH signals
carried in an OTN signal down to VC-3. This applies to STM-16 in OTU1,
STM-64 in OTU2 and STM-256 in OTU3.
SONET client signal analysisYou can analyze multiplexed SONET
signals carried in an OTN signal down to STS-1. This applies to STS-48 in
OTU1, STS-192 in OTU2 and STS-768 in OTU3.
Service disruption measurementsYou can measure service disruption
time resulting from signal loss or a variety of errors, anomalies, alarms, or
defects. For details, see Measuring service disruption time on page 172.
OTL layer testing the OTL layer applies to the OTU3 and OTU4 interfaces on the 40/100G Transport Module. With LR4 optics (4 wavelengths)
errors and alarms can be injected/analyzed for testing.

Understanding the LED panel

When you configure your unit to transmit a bulk BERT payload, Summary and
OTN LEDs appear on the Main screen. Figure 21 illustrates the OTN LEDs that
appear when your unit is operating in TestPad mode.

Figure 21 OTN LEDs (bulk BERT payloads)

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About OTN testing

When you configure your unit to transmit a SONET or SDH client signal in an
OTN wrapper, Summary, OTN, and SONET or SDH LEDs also appear.
Figure 22 illustrates the OTN and SDH LEDs that appear when your unit is
operating in TestPad mode.

Figure 22 OTN LEDs (SDH payload)

When you configure your instrument to transmit an Ethernet client signal in an
OTN wrapper, Summary, OTN, and Ethernet LEDs appear. Figure 23 illustrates the OTN and Ethernet LEDs that appear when your unit is operating in
TestPad mode.

Figure 23 OTN LEDs (Ethernet payloads)

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About OTN testing

When you configure your unit to transmit an ODU1 bulk BERT payload in a
10.7G OTU2 wrapper, Frame Sync LEDs are provided for the OTU2 wrapper
and the ODU1 payload as illustrated in Figure 24.

Figure 24 OTN LEDs (ODU1 in OTU2)

When you configure your unit to transmit an ODU0 payload in an OTU1
wrapper, Frame Sync LEDs are provided for the ODU0 payload and the OTU1
wrapper as illustrated in Figure 25.

Figure 25 OTN LEDs (ODU0 in OTU1)

When you configure your unit to transmit an ODUflex payload in an OTU2
wrapper, ODU Frame Sync LEDs are provided for the ODUflex payload and
the OTU2 wrapper as illustrated in Figure 26.

Figure 26 OTN LEDs (ODUflex payload)

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About OTN testing

Understanding the graphical

user interface

Understanding OTN test

results

The names of various elements on the graphical user interface change

depending on whether you are testing at a SONET, SDH or Ethernet line rate.
For example, the button that you use to insert SONET or Ethernet errors is
labeled Insert Error; the same button is labeled Insert Anomaly if you are
inserting SDH anomalies.

When you configure your unit to transmit or monitor a bulk BERT payload
over an OTN circuit, test result associated with the interface, FEC, framing,
OTU/ODU/OPU, FTFL, TCM1 through TCM6, and the payload are provided
in the OTN result group. For details, refer to OTN results on page 216.
When you configure your unit to transmit or monitor an OTU1 Bulk BERT payload carried in an OTU2 wrapper, test groups and results are provided for
both the OTU1 signal and the OTU2 wrapper.
When you configure your unit to transmit or monitor a SONET or SDH client
signal over an OTN circuit, streamlined SONET and SDH test results are also
available in the SONET or SDH result groups. For details, refer to SONET/
SDH results on page 187.
When you configure your unit to transmit or monitor an Ethernet client signal
over an OTN circuit, streamlined Ethernet test results are also available in the
Ethernet result group. For details, refer to the Ethernet testing manual that
shipped with your instrument or upgrade.

OTN test applications

Table 30 lists each of the OTN test applications.

Table 30 OTN test applications

Signal

Rate

OTU1

2.7Gig

Client

Test Mode

Bulk BERT

Terminate
Monitor

STS-48

STS-48c - STS-1

Bulk BERT

Terminate
Monitor

STM-16

AU-4

VC-4 VC-16c

Bulk BERT

Terminate
Monitor

AU-3

VC-3

Bulk BERT

Terminate
Monitor

Bulk BERT

Terminate
Monitor

Layer 2 Traffic

Terminate
Monitor

Layer3 Traffic

Terminate
Monitor

ODU0

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Table 30 OTN test applications (Continued)

Signal

Rate

OTU2

10.7Gig

Client

OTU2,
OTU2e

11.05 Gig

11.1 Gig

Test Mode

Bulk BERT

Terminate
Monitor

STS-192

STS-192c - STS-1

Bulk BERT

Terminate
Monitor

STM-64

AU-4

VC-4 VC-64c

Bulk BERT

Terminate
Monitor

AU-3

VC-3

Bulk BERT

Terminate
Monitor

ODU1

Bulk BERT

Terminate
Monitor

ODU0

Bulk BERT

Terminate
Monitor

Layer 2 Traffic

Terminate
Monitor

Layer 3 Traffic

Terminate
Monitor

Bulk Bert

Terminate
Monitor

Layer 2 Traffic

Terminate

Bulk BERT

Terminate
Monitor

Layer 1 BERT

Terminate
Monitor

Layer 2 Traffic

Terminate
Monitor

Bulk BERT

Terminate
Monitor

Layer 1 BERT

Terminate
Monitor

Layer 2 Traffic

Terminate
Monitor

ODUflex

OTU2,
OTU1e

Payload

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Specifying the Tx clock source

Table 30 OTN test applications (Continued)

Signal

Rate

OTU3

43.02Gig

Client

Payload

Test Mode

Bulk BERT

Terminate
Monitor

OTL3.4

OTL BERT

Terminate
Monitor

STS-768

STS-768c Bulk BERT

STS-192c Bulk BERT
STS-48c Bulk BERT
STS-12c Bulk BERT
STS-3c Bulk BERT

Terminate
Monitor

STS-1 Bulk BERT

Terminate
Monitor

VC-4-256c Bulk BERT

VC-4-64c Bulk BERT
VC-4-16c Bulk BERT
VC-4-4c Bulk BERT

Terminate
Monitor

VC-4 Bulk BERT

Terminate
Monitor

VC-3 Bulk BERT

Terminate
Monitor

Bulk BERT

Terminate
Monitor

OTL BERT

Terminate
Monitor

Layer 2 Traffic

Terminate
Monitor

Layer 2 Traffic Multistreams

Terminate

Layer 3 Pinga

Terminate

Layer 3 Traceroutea

Terminate

STM-256

AU4

AU3

OTU4

111.8

OTL4.10

Layer 3

Traffica

Layer 3 Traffic Multistreams

Terminate
Monitor
Terminate

a. IPv4 and IPv6 applications are available. IPv4 and IPv6 applications are also available when running layer 3 multiple stream applications.

Specifying the Tx clock source

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Specifying channels or timeslots

2 Select the Setup soft key, select the Interface tab, and then select the
Signal tab. Select the arrows to the right of the Clock Source field, and
then select one of the following:
Internal. Select Internal to derive timing from the MSAMs clock, and
then specify any required frequency offset in PPM.
Recovered. Select Recovered to recover timing from the received
signal.
External. Select External - Bits/Sets timing to derive timing from one of
the following signals, in the following order: BITS, SETS, or a
2.048 MHz clock.
3 Select the Results soft key to return to the Main screen, or select another
tab to specify additional test settings.
The Tx clock source is specified.

Specifying channels or timeslots

When running an OTN application from a 2.7G or 10.7G interface and
analyzing a multiplexed signal (for example, an 0TU1 carried in an OTU2, or a
VC-3 carried in an STM-64), you can specify the timeslot or channel you would
like to analyze, and the timeslot or channel you would like to use for the transmitted signal. You can also indicate that the timeslot or channel for the transmitted signal should automatically be set to the same timeslot or channel that
you are analyzing.
To specify the channels or timeslots
1 Using the Test Menu, select the interface and test application for the
signal, rate, and payload you are testing (refer to Table 30 on page 154 for
a list of applications).
2 Select the Setup soft key, and then do the following:
Multiplexed signal

Do this ..

SONET or SDH

Select the SONET or SDH setup tab.

Select Channel from the list of settings on
the left.
In STS-N Rx or STM-N Rx, specify the
timeslot you want to analyze for the received
signal.
If you want to use the same timeslot for the
transmitted signal, set STS-N Tx=Rx or
STM-N Tx=Rx to Yes.
If you want to use a different timeslot for the
transmitted signal, set STS-N Tx=Rx or
STM-N Tx=Rx to No.
If you want to use all available timeslots for
the transmitted signal, set STS-N Tx All or
STM-N Tx All to Yes.
If you want to use a single timeslot for the
transmitted signal, specify the timeslot in
STS-N Tx or STM-N Tx.

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BER testing layer 1

Multiplexed signal

Do this ..

OTU1 or OTU2

ODUflex

Select the OTU1 or OTU2 setup tab (depending on whether an SFP or XFP is being configured).
Select Timeslot from the list of settings on
the left.
In OTU1 Rx, specify the timeslot you want to
analyze for the received signal.
If you want to use the same timeslot for the
transmitted signal, set ODU1 Tx=Rxo to Yes.
If you want to use a different timeslot for the
transmitted signal, set ODU1 Tx=Rx to No,
and then specify the transmitted timeslot in
ODU1 Tx.
Select the OTU2 setup tab.
Select Timeslot from the list of settings on
the left.
If you want to use the same timeslot(s) for the
transmitted signal, set ODUflex Rx=Tx to
Yes.
If you want to use different timeslot for the
transmitted signal, set ODUflex Rx=Tx to No,
and then select the received timeslot(s) in
ODUflex Tributary Ports.
Define the Tx ODUflex Port by entering the
port number. Deselect timeslots that are not
to be used by clicking on any of the eight
ODUflex Tributary Ports.

3 Select the Results soft key to return to the Main screen, or select another
tab to specify additional test settings.
The channels or timeslots are specified.

BER testing layer 1

If you are transmitting or analyzing an Ethernet client signal over an OTN
circuit, you can generate and receive layer 1 test patterns, and monitor and
analyze received signals. For detailed instructions, refer to the Ethernet testing
manual that shipped with your instrument or upgrade.
NOTE: Changing BERT patterns
If you change a BERT pattern during the course of your test, be certain to
press the Restart soft key to ensure that you regain pattern sync.

Configuring 1 GigE, 10 GigE, 100 GigE LAN traffic

If you are transmitting or analyzing an Ethernet client signal over an OTN
circuit, you can configure settings for transmitted traffic and specify filter
settings to analyze a particular type of traffic. For detailed configuration instructions, see the Ethernet testing manual that shipped with your instrument.

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Configuring OTN with SONET or SDH Clients

To configure 1 GigE, 10 GigE or 100 GigE LAN traffic

1 Using the Test Menu, select the interface and test application for the
signal, rate, and payload you are testing (refer to Table 30 on page 154 for
a list of applications).
2 Select the Setup soft key, and then do the following to configure (or filter)
the traffic:
a To characterize transmitted Ethernet traffic, select Ethernet, and then
specify the frame settings.
b To specify settings that filter received traffic, select Ethernet Filter, and
then characterize the traffic you want to analyze.
c To configure the traffic load, select Traffic, and then specify the
constant or flooded load settings. For details, see the Ethernet testing
manual that shipped with your instrument.
You can not transmit a burst or ramped load of traffic over an OTN
circuit.
3 Select the Results soft key to return to the Main screen, or select another
tab to specify additional test settings.
1 GigE, 10 GigE or 100 GigE LAN traffic is configured.

Configuring OTN with SONET or SDH Clients

If you are transmitting or analyzing a SONET or SDH client over an OTN circuit,
you can configure settings for the transmitted traffic within the OTN signal.
To configure SONET or SDH traffic
1 Using the Test Menu, select the interface and test application for the
signal, rate, and payload you are testing (refer to Table 30 on page 154 for
a list of applications).
2 Select the Setup soft key, and then configure transmitted SONET or SDH
traffic by selecting SONET or SDH tab. For detailed configuration instructions of the SONET or SDH signal, see SONET and SDH Testing on
page 43.
3 Select the Results soft key to return to the Main screen, or select another
tab to specify additional test settings.
SONET or SDH traffic is configured.

Measuring optical power

You can use the instrument to measure the optical power of a received signal.
To measure optical power
1 Using the Test Menu, select the terminate test application for the signal,
rate, and payload you are testing (refer to Table 30 on page 154 for a list of
applications).
2 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.

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3 Connect a cable from the appropriate TX connector to the networks

RECEIVE access connector.
4 Verify the following LEDs:
If your module is in TestPad mode, verify that the Signal Present,
Frame Sync, and Pattern Sync LEDs are green.
If your module is in ANT mode, verify that the LOS, LOF, and LSS
LEDs are not red.
5 Display the Interface result group, and then observe the Optical Rx Level
(dBm) test result. For OTL applications with compatible optics, the Interface result group provides values that are the sum of the individual lanes.
6 Optional: For QSFP+ and CFP optics that support individual OTL lane
measurements, the Interface:Lambda result group will display the results
for each of the lanes in the OTL signal (4 lanes for OTL3.4 and ten lanes
for OTL4.10).
Optical power is measured.

Inserting errors, anomalies, alarms, and defects

You can insert multiple types of errors or anomalies and alarms or defects
simultaneously into the traffic stream.

Inserting errors or anomalies

To insert errors or anomalies

1 Using the Test Menu, select the terminate test application for the signal,
rate, and payload you are testing (refer to Table 30 on page 154 for a list of
applications).
2 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
3 Select the Laser button.
4 Display the Alarms/Errors action bar, then select an error or anomaly type
(for example, correctable or uncorrectable FEC word errors, bit errors,
FAS, or MFAS errors, or SM, PM, or TCM errors).
5 Do the following:
For OTU3 or OTU4 (OTL FAS, OTL MFAS, OTL LLM, Code, Alignment Marker, or Bip-8) or STL (FAS or LLM) lane errors, select the
lane into which the error is to be inserted.
If you selected a FAS or MFAS Word (non-OTL), specify the number of
errors you want to insert, and then select OK.
If you selected any other type of error, specify the insert type (Single,
Burst or Rate).
If you specified Rate or Burst, select one of the available rates or burst
counts.
6 Press the Error Insert or Anomaly Insert button.
Error or anomaly insertion starts, and the associated button turns yellow.
Test results associated with the error or anomaly appear in the Summary
Status result category, and in the categories provided for each type of error or
anomaly. For example, test results associated with bit error insertion are

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provided in the Payload BERT category; results associated with FEC testing
are provided in the OTN FEC category. Refer to OTN results on page 216 for
descriptions of each OTN test result.
To stop insertion
Press the Error Insert or Anomaly Insert button again.
Error or anomaly insertion stops, and the associated button turns grey.

Inserting alarms or defects

To insert alarms or defects

Observing and manipulating overhead bytes

The following procedure describes how to observe the value of OTN overhead
bytes, and manipulate the values for key bytes.
To observe and manipulate OTN overhead bytes
1 Using the Test Menu, select the test application for the signal, rate, and
payload you are testing (refer to Table 30 on page 154 for a list of applications).
2 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
3 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
4 Select the Laser button.

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5 Press the OTN Overhead soft key.

The OTN Overhead screen appears:

Figure 27 OTN Overhead screen (SONET Client in an OTU2 signal)

Figure 27 illustrates the screen when your unit is configured to analyze
SONET bulk BERT payload carried in an OTU2 signal. Tabs are provided
that allow you to observe and manipulate the bytes for both signals.
The Overhead tabs allow you to manipulate bytes. The values at the top of
each byte on the Overhead tabs indicate the transmitted value; the values
at the bottom of each byte indicate the received value.
The Rx PSI tabs allow you to observe the Payload Structure Identifier
(PSI) bytes carried in received traffic. These byte can not be changed.
6 Optional. Bytes with values in black on the Overhead tab(s) can be manipulated; bytes with values in grey can not. If you want to manipulate a byte
value, do the following:
a Select the byte on the graphical display.
b In the Selected Byte field, type the new value, then press OK.
You can restore the values to their defaults at any time using the Defaults
button.
The bytes are displayed and can be manipulated.

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Scrambling the signal

You can scramble the signal at the line rate for the interface you are testing.
For example, if you are analyzing an OTN signal carrying an STS-48c bulk
BERT payload from a 2.7G interface, you can scramble the 2.7G OTN signal.
The STS-48c bulk BERT payload will not be scrambled.
To scramble the signal
1 Using the Test Menu, select the test application for the signal, rate, and
payload you are testing (refer to Table 30 on page 154 for a list of applications).
2 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
3 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
4 Select the Laser button.
5 Select the Setup soft key. A series of setup tabs appears.
6 Select the Interface tab, and then do the following:
a If more than one sub-tab is available, select the Signal sub-tab.
b If you want to descramble the received signal, in Rx - Descramble,
select the Descramble setting.
c If you want to scramble the transmitted signal, in Tx - Scramble, select
the Scramble setting.
The signals are scrambled and descrambled as specified.

FEC testing
Using the instrument, you can verify that network elements on an OTN network
are configured to handle errors properly. FEC (forward error correction) testing
involves:
Stressing network elements by transmitting the maximum number of errors
(to ensure that they are corrected as expected).
Verifying that alarms are triggered as expected on network elements when
errors exceeding the maximum are transmitted.
When you configure your unit for FEC testing, you can control how FEC is
handled for outgoing and incoming traffic.
To verify the FEC capabilities of your network elements
1 Using the Test Menu, select the terminate test application for the signal,
rate, and payload you are testing (refer to Table 30 on page 154 for a list of
applications).
2 Select the Setup soft key. A series of setup tabs appears.
3 On the Interface tab, specify the transmit clock settings if the defaults are
not acceptable (see Specifying the Tx clock source on page 156).

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4 Select the OTN tab, and then select FEC from the pane on the left of the
tab.
5 In Outgoing FEC, if you want your unit to include valid FEC bytes in
outgoing traffic, select Turn On. If you select Turn Off (send zeros),
zeros are transmitted in place of the FEC bytes.
6 If you are determining how a network element handles correctable FEC
errors, in Incoming FEC, select the following:
To:

Select this:

Identify any correctable FEC errors that unexpectedly have not been corrected by the network element, but warrant additional attention
with a yellow Summary pane.

Find and fix errors

Identify any correctable FEC errors that unexpectedly have not been corrected by the network element, and indicate that a problem
requiring correction has occurred with a red
Summary pane.

Find, but dont fix errors

Ignore all FEC errors. FEC results will not be

available.

Ignore

7 If you selected a SONET or SDH line rate and payload in step 1, select the
SONET or SDH tab, and then specify the applicable SONET or SDH
settings. For details on specifying these settings refer to
Chapter 3 SONET and SDH Testing.
8 To return to the Main screen, select the Results soft key.
9 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
10 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
11 Select the Laser button.
12 Insert FEC errors (see Inserting errors, anomalies, alarms, and defects
on page 160), and then observe the behavior of the Summary pane as
described in step 6.
Test results associated with FEC testing appear in the Status and FEC result
categories. For descriptions of each of the results, refer to FEC test results
on page 221.

GMP Mapping
Depending upon the application loaded, Generic Mapping Procedure (GMP)
may be offered as a payload mapping option. The Cm values (Nominal and
Effective) and Payload Offset are accessible from the Mapping menu item on
the OTUn Setup page.
Set Mapping Parameters
1 Using the Test Menu, select the terminate test application for the ODU
rate, and payload you are testing (refer to Table 30 on page 154 for a list of
applications).

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GFP Mapping

2 Select the Setup soft key. A series of setup tabs appears.

3 On the ODUn tab, select the Mapping submenu.
4 The three GMP parameters appear on the screen
a Nominal Cm Value - displays the programmed nominal Cm value of
the loaded application (not able to be modified) in payload bytes per
frame.
b Effective Cm Value - initial value will equal Nominal Value of payload
bytes per frame resulting in a Payload Offset value of 0.0ppm. Entry of
a new value in this field will result in a recalculation of the Payload
Offset.
c Payload Offset - initial value will be 0ppm. Entry of a new value in this
field will result in a recalculation of the Effective Cm Value.

GFP Mapping
Depending upon the OTN application selected, Generic Framing Procedure
(GFP) may be offered as a payload framing option. The identification of
Payload FCS (PFI) and Extension Header (EXI) as well as incoming filter definitions are made on the GFP tab of the Setup page for any multiplexed OTN
signal.
Set Framing parameters
1 Using the Test Menu, select the terminate test application for the OTN
rate, and payload you are testing (refer to Table 30 on page 154 for a list of
applications).
2 Select the Setup soft key. A series of setup tabs appears.
3 Select the GFP tab.
4 On the frame diagram, select and define the following identifiers, as
necessary:
a PFI - Enabled/Disabled

Figure 28 GFP PFI Enabling

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b EXI - select Linear Frame or Ring Frame. For Linear Frame, select CID
on the diagram, then specify the CID value.

Figure 29 GFP EXI Options

5 To filter the incoming results, in the Rx Filter window pane:
a Toggle Filter on CID (channel identifier) to enable, then enter the CID
value (between 0 and 255).
b Toggle Filter on UPI (User Payload Identifier) to enable, then specify
the UPI Filter value from the drop-down list.

Figure 30 GFP Filter on UPI Options

Generic Frame Procedure mapping has been configured.

Specifying SM, PM, and TCM trace identifiers

You can specify the SM, PM, and TCM source and destination trace identifiers
for transmitted traffic, and you can also specify the identifiers that you expect
in received traffic. After specifying the identifiers, you can indicate whether
your unit should show a Trace Identifier Mismatch (TIM) when expected and
received identifiers do not match.
To specify the SM, PM, and TCM trace identifiers
1 Using the Test Menu, select the terminate test application for the signal,
rate, and payload you are testing (refer to Table 30 on page 154 for a list of
applications).

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2 Select the Setup soft key. A series of setup tabs appears.

3 To define the trace identifiers for OTU, select the OTUn tab or for ODU
trace identifiers, select ODUn tab and then select one of the following from
the pane on the left side of the tab:
SM Traces, if you want to edit the expected or outgoing (transmitted)
SM trace identifier.
PM Traces, if you want to edit the expected or outgoing (transmitted)
PM trace identifier.
TCM1 - TCM6, if you want to edit the expected or outgoing (transmitted
TCM trace identifiers.
Settings appear for the traces. Figure 31 illustrates the SM trace settings.

Figure 31 SM Trace Identifier settings

4 Do one of the following:
If you are specifying SM or PM identifiers, skip this step and proceed to
proceed to step 5.
If you are specifying TCM trace identifiers, in Incoming (Rx) TCM,
specify Analyze to analyze received signals for TCM trace identifiers,
or Dont Care if you do not want to analyze the signals.

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5 For the Expected Traces, do the following:

If you want to manually specify the identifiers, select the SAPI or DAPI
field, type the corresponding identifier, and then select OK.
Use the = Rx button if you want the expected SAPI and DAPI to be the
same as the received SAPI and DAPI, or use the = Tx button if you
want the expected SAPI and DAPI to be the same as the transmitted
SAPI and DAPI. The currently received SAPI and DAPI are displayed
in the Incoming (Rx) Traces SM area at the top of the tab.
Optional. If you want the unit to display a SM-TIM, PM-TIM, or TIM
alarm if the expected and incoming trace values do not match, select
on SAPI mismatch, on DAPI mismatch, or on SAPI or DAPI
mismatch; otherwise, select No.
NOTE:
You can reset the expected trace and outgoing trace identifiers at any time
using the Default buttons.
6 Do one of the following:
If you are specifying SM or PM identifiers, specify the Outgoing (Tx)
Trace identifiers.
If you are specifying TCM trace identifiers, and you want to transmit
identifiers, in Outgoing (Tx) TCM, specify Enable, and then specify the
identifiers.
If you are specifying TCM trace identifiers, and you do not want to
transmit TCM identifiers, in Outgoing (Tx) TCM, specify Dont Care.
7 Select the Results soft key to return to the Main screen.
8 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
9 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
10 Select the Laser button.
11 Loop up the far-end of the network.
12 Verify the following LEDs:
If your module is in TestPad mode, verify that the Signal Present,
Frame Sync, and Pattern Sync LEDs are green.
If your module is in ANT mode, verify that the LOS, LOF, and LSS
LEDs are not red.
13 To view the trace identifier results, select the OTN result group, and then
select the OTU, ODU, or TCM result categories. If mismatches occurs, the
results also appear in the Summary Status result category.
The SM, PM, or TCM trace identifiers are specified.

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Specifying FTFL identifiers

You can specify the FTFL (fault type fault location) identifiers for Forward/
Downstream and Backward/Upstream signals using up to nine characters, or
118 characters for operator specific identifiers.
To specify the FTFL identifiers
1 Using the Test Menu, select the terminate test application for the signal,
rate, and payload you are testing (refer to Table 30 on page 154 for a list of
applications).
2 Select the Setup soft key. A series of setup tabs appears.
3 Select the OTN tab, and then select FTFL from the pane on the left side of
the tab.
Settings appear for the identifiers.

4 For the Forward/Downstream and Backward/Upstream signals, select

each identifier field, type the corresponding identifier, and then select OK.
NOTE:
You can reset the identifiers at any time using the Default buttons.
5 Select the Results soft key to return to the Main screen.
6 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
7 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
8 Select the Laser button.
9 Loop up the far-end of the network.

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10 Verify the following LEDs:

If your module is in TestPad mode, verify that the Signal Present,
Frame Sync, and Pattern Sync LEDs are green.
If your module is in ANT mode, verify that the LOS, LOF, and LSS
LEDs are not red.
11 To view the FTFL identifier results, select the OTN result group, and then
select the FTFL result category.
The FTFL identifiers are specified.

Specifying the transmitted and expected payload type

You can specify the payload type for transmitted traffic, and an expected
payload type for received traffic.
To specify the payload type
1 Using the Test Menu, select the terminate test application for the signal,
rate, and payload you are testing (refer to Table 30 on page 154 for a list of
applications).
2 Select the Setup soft key. A series of setup tabs appears.
3 Select the OTN, OTUn, or the ODUn tab (depending upon the application
and the SFP or XFP installed) and then select PT Byte from the pane on
the left side of the tab.
Settings appear for the payload type.

4 In Tx Payload Type, specify the payload type for transmitted traffic.

5 In Expected Payload type, specify the payload expected in received traffic.
6 If you want the unit to show test results associated with a mismatched
received and expected payload type, in Show Payload Type mismatch,
select Yes; otherwise, select No.
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7 Select the Results soft key to return to the Main screen.

8 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
9 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
10 Select the Laser button.
11 Loop up the far-end of the network.
12 Verify the following LEDs:
If your module is in TestPad mode, verify that the Signal Present,
Frame Sync, and Pattern Sync LEDs are green.
If your module is in ANT mode, verify that the LOS, LOF, and LSS
LEDs are not red.
13 To view results associated with mismatched payloads, select the OTN
result group, and then select the OPU result category. If a mismatch
occurs, the results also appear in the Summary group.
The payload types are specified.

BER testing
The following procedure illustrates a typical scenario for setting up the instrument to terminate an OTN signal for BER testing.
To perform an OTN BER test
1 Using the Test Menu, select the test application for the signal, rate, and
payload you are testing (refer to Table 30 on page 154 for a list of applications).
2 Select the Setup soft key, and then select the Pattern tab.

a For OTU3 or OTU4 applications, select whether the received BERT

pattern should be the same as the transmitted pattern (Rx<=Tx).
b Select the pattern mode (ANSI or ITU), if applicable to the application
selected.
c Select a BERT Tx pattern (for example, 2^23-1).
d Select a BERT RX pattern (if Rx<=Tx was set to NO).
NOTE:
You can automatically detect and transmit the correct BERT pattern for the
circuit by pressing the Auto button on the Main screen after you specify your
interface settings. See Detecting the received BER pattern on page 65.

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3 Select the Results soft key to return to the Main screen.

4 Connect a cable from the appropriate RX connector to the networks
TRANSMIT access connector.
5 Connect a cable from the appropriate TX connector to the networks
RECEIVE access connector.
6 Select the Laser button.
7 Loop back the far-end of the network.
8 Verify the following LEDs:
If your module is in TestPad mode, verify that the Signal Present,
Frame Sync, and Pattern Sync OTN LEDs are green.
If your module is in ANT mode, verify that the LOS, LOF, and LSS OTN
LEDs are not red.
9 Verify that All Results OK appears in the results display.
10 Optional. Insert five Bit / TSE errors (see Inserting errors, anomalies,
alarms, and defects on page 160), and then verify that the five errors were
received in the BERT Payload result category.
11 Run the test for an appropriate length of time.
The BER test is finished.

Measuring service disruption time

You can use the instrument to measure the service disruption time resulting
from a switch in service to a protect line. For a detailed description of this application, see Measuring service disruption time on page 71 of
Chapter 3 SONET and SDH Testing.
To measure service disruption time
1 Using the Test Menu, select the terminate test application for the signal,
rate, and payload you are testing (refer to Table 30 on page 154) for a list
of applications).
2 Follow step 2 on page 71 through step 11 on page 72 of Measuring
service disruption time in Chapter 3 SONET and SDH Testing.
Service disruption is measured for each of the triggers you selected. For
details on the associated test results, see Service Disruption Results on
page 200.

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Monitoring the circuit

Use the monitor applications whenever you want to analyze the received
signal.
To monitor a circuit
1 Using the Test Menu, select the monitor test application for the signal, rate,
and payload you are testing (refer to Table 30 on page 154 for a list of
applications).
2 Connect the module to the circuit.
3 Observe the test results.
You are monitoring the circuit.

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Test Results

7
This chapter describes the categories and test results that are available when
performing T-Carrier, PDH, SONET, SDH, NextGen, and OTN tests. Topics
discussed in this chapter include the following:
About test results on page 176
Summary Status results on page 176
T-Carrier and PDH results on page 177
SONET/SDH results on page 187
ITU-T recommended performance test results on page 202
Jitter results on page 204
Wander results on page 207
1PPS Analysis Results on page 208
NextGen results on page 209
OTN results on page 216
Graphical results on page 233
Histogram results on page 234
Event Log results on page 234
Time test results on page 235

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About test results

After you connect the instrument to the circuit and press the START/STOP
button, results for the configured test accumulate and appear in the Result
Windows in the center of the screen. The result groups and categories available depend on their applicability to the test you configured. For example, if
you select, configure, and start a SONET test application,
10 Gigabit Ethernet LAN categories are not available because they are not
applicable when running a SONET application.
A number of enhancements have been made to the test result layout; for
details, see Step 5: Viewing test results on page 4.
The following sections describe the test results for each of the categories.

Summary Status results

When running most applications, the Summary Status category displays a
large ALL SUMMARY RESULTS OK message on a green background if no
errors, anomalies, alarms, or defects have been detected (see Figure 32).

Figure 32 ALL SUMMARY RESULTS OK message

If errors, anomalies, alarms, or defects have been detected, the background is
red, and the errored results are displayed (see Figure 33).

Figure 33 Errored Summary Status results (NextGen application)

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This allows you to immediately view errored results without searching through
each category. The errored results are listed by group and category. To see all
results for the group/category, select the arrow key to the right of the group/
category name. You can also collapse or expand the results by selecting the
box to the left of the name.
If OoS (out of sequence) Layer 3 Packets, B8ZS Detect, Path Pointer Adjustment, or correctable FEC conditions occur, and no other errors occurred, the
background is yellow, indicating you should research each condition displayed.
In some instances, the conditions constitute errors; in other instances, the
conditions are expected and should not be interpreted as errors.
If Pattern Invert On appears, this indicates either the unit is receiving an
inverted BERT pattern while expecting an upright pattern or it is receiving an
upright BERT pattern while expecting an inverted pattern.

T-Carrier and PDH results

Signal, Frame, BER, and performance results are available when performing
T-Carrier and PDH testing. Categories discussed in this section include the
following:
LEDs (TestPad mode) on page 177
LEDs (ANT mode) on page 178
Interface test results on page 179
Frame test results on page 180
BERT test results on page 183
ISDN test results on page 183
VF results on page 185
ITU-T recommended performance test results on page 202

LEDs (TestPad mode)

Table 31 describes each of the T-Carrier and PDH LEDs in TestPad mode. If
the instrument loses an LED event, the green Status LED extinguishes, and
the red Alarm LED in the history column illuminates indicating an error condition has occurred.
If an error occurs at a higher level, LEDs at lower levels do not indicate alarms.
For example, if there is no signal present (indicated by a red Signal Present
LED), the Frame Sync and Pattern Sync LEDs do not indicate that there is an
alarm because you can not attain frame or pattern synchronization without a
signal.

Table 31 T-Carrier and PDH LEDs (TestPad Mode)

LED

Rates

Description

B8ZS Detect

DS1

Yellow
B8ZS clear channel coding is detected in the
received signal.
Red
B8ZS was detected, then lost since the last
test start or restart.

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Table 31 T-Carrier and PDH LEDs (TestPad Mode) (Continued)

LEDs (ANT mode)

LED

Rates

Description

C-Bit Sync

DS3

Green
C-Bit synchronization is detected.
Red
C-Bit synchronization was detected, then lost
since the last test start or restart.

CRC-4 Sync

Green
CRC-4 synchronization is detected.
Red
CRC-4 synchronization was detected, then
lost since the last test start or restart.

Frame Sync

DS1, DS3,
E1, E3, E4

Green
Frame synchronization is detected.
Red
Frame synchronization was not detected.

MFAS Sync

Green
MFAS synchronization is detected.
Red
MFAS synchronization was detected, then
lost since the last test start or restart.

Pattern Sync

DS1, DS3,
E1, E3, E4

Green
Synchronization is established with BERT
pattern.
Red
Synchronization with the received BERT pattern has been lost since the last test restart.

Signal Present

DS1, DS3,
E1, E3, E4

Green
A signal is present.
Red
Received signal has been lost since the last
test start or restart.

Table 32 describes each of the T-Carrier and PDH LEDs in ANT mode. If an
error occurs at a higher level, LEDs at lower levels do not indicate alarms. For
example, if there is no signal present (indicated by a red LOS LED), the LOF
and LSS LEDs do not indicate that there is an alarm because you can not
detect framing patterns attain sequence synchronization without a signal.

Table 32 T-Carrier and PDH LEDs (ANT mode)

178

LED

Description

LOS

Illuminates Red if no signal is detected. Extinguishes when signal is

detected.

LOF

Illuminates Red if no framing pattern is detected. Extinguishes when

framing pattern is detected.

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Table 32 T-Carrier and PDH LEDs (ANT mode) (Continued)

Interface test results

LED

Description

FTM

Illuminates Yellow if the received framing does not match the

expected framing (for example, if M13 framing is expected, but C-Bit
framing is detected). Extinguishes when the received and expected
framing types match.

LSS

Illuminates Red if loss of sequence synchronization is detected.

Extinguishes when sequence synchronization is detected.

Table 33 describes each of the results available in the Interface result group.
In instances where the result name varies for T-Carrier and PDH test applications, the T-Carrier name appears first, followed by the PDH name.
Table 33

T-Carrier/PDH Interface test results

Test Result

Description

BPV Error Seconds

The number of seconds during which BPVs occurred

since the last test start or restart.

BPVs

Number of bipolar violations (BPVs) detected in the

received signal (that are not BPVs embedded in valid
B8ZS sequences) since the last test start or restart.

BPV Rate

The ratio of BPVs to received bits since detecting a

signal.

Line Code Error Rate

The ratio of line codes to received bits since detecting

a signal.

Line Code Error Seconds

The number of seconds during which line codes

occurred since the last test start or restart.

Line Code Errors

Number of line codes detected in the received signal

(that are not line codes embedded in valid B8ZS
sequences) since the last test start or restart.

LOS Count

Count of the number of times LOS was present since

the last test start or restart.

LOS Seconds

Number of seconds during which an LOS was present since the last test start or restart.

Negative timing slips

Number of bit slips counted when the DS1 test signal

slips behind the DS1 reference signal after both signals are present simultaneously. (Only appears in
Dual Monitor mode an donly on Rx2)

Positive timing slips

Number of bit slips counted when the DS1 test signal

slips ahead of the DS1 reference signal after both
signals are present simultaneously. (Only appears in
Dual Monitor mode an donly on Rx2)

Round Trip Delay (ms)

The round trip delay for the last delay pattern sent
and successfully received by the MSAM. Calculated
in milliseconds.

Rx Freq Max Deviation

(ppm)

Maximum received frequency deviation.

Rx Frequency (Hz)

Frequency of the clock recovered from the received

signal, expressed in Hz.

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Table 33

Frame test results

T-Carrier/PDH Interface test results (Continued)

Test Result

Description

Rx Frequency Deviation
(ppm)

Current received frequency deviation. Displayed in

PPM.

Rx Level (dBdsx)

Power level of the received signal, expressed in

dBdsx.

Rx Level (dBm)

Power level of the received signal, expressed in dBm.

Rx Level (Vpp)

Power level of the received signal, expressed in Vpp.

Signal Loss Seconds

Number of seconds during which a signal was not

present.

Signal Losses

Count of the number of times signal was not present.

Tx Clock Source

Displays the timing source (INTERNAL, RECOVERED, or BITS).

Tx Freq Max Deviation

(ppm)

Maximum transmitted frequency deviation.

Tx Frequency (Hz)

Current transmitter clock frequency, expressed in Hz.

Tx Frequency Deviation
(ppm)

Current transmitted frequency deviation. Displayed in

PPM.

Table 34 describes each of the results available in the Frame category. Only
those results that apply to the interface you are testing appear in the category.
The results begin accumulating after initial frame synchronization on the
incoming signal.

Table 34 T-Carrier/PDH Frame results

180

Test Result

Description

AIS Alarm Count

Count of AIS alarms detected since initial frame synchronization.

AIS Seconds

Count of asynchronous test seconds in which AIS

was present for any portion of the test second.

C-Bit Parity Errors

Count of C-Bit parity errors detected since initial DS3

frame synchronization.

C-Bit Parity Error Bit Rate

The ratio of C-bit parity errors to the number of bits

over which C-bit parity was calculated.

C-Bit Parity Error Seconds

The number of seconds during which one or more

C-bit parity error occurred since initial DS3 frame
synchronization.

C-Bit Sync Loss Seconds

The number of seconds during which sync loss

occurred due to C-Bit parity errors since initial DS3
frame synchronization.

CRC Error Rate

The ratio of CRC errors to the number of extended

superframes received.

CRC Errors

The number of CRC errors detected since initial

frame synchronization. CRC errors are counted only
when ESF framing is present in the received data.

CRC Error Seconds

The number of seconds during which one or more

CRC errors occurred.

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Table 34 T-Carrier/PDH Frame results (Continued)

Test Result

Description

CRC Sync Losses

Count of the number of times sync loss occurred due

to CRC errors.

CRC Sync Loss Seconds

The number of seconds during which sync loss

occurred due to CRC errors since initial frame synchronization.

Far End OOF Seconds

The number of seconds during which the received

X-bits are zero within the 1 second interval.

FAS Bit Error Rate

The ratio of FAS bit errors to the number of bits over

which FAS was calculated.

FAS Bit Error Seconds

Count of seconds during which FAS bit errors were

detected since initial frame synchronization.

FAS Bit Errors

Count of FAS bit errors since initial frame synchronization.

FAS Word Error Rate

The ratio of FAS word errors to received framing bits

since initially acquiring frame synchronization.

FAS Word Error Seconds

Count of seconds during which FAS word errors

were detected since initial frame synchronization.

FAS Word Errors

Count of FAS word errors received since initial frame

synchronization.

FEAC Word

Display of the FEAC message carried in the C-bit

FEAC channel.

FEBEs

Count of FEBEs detected since initial frame synchronization.

FEBE Rate

The ratio of FEBEs to the number of bits over which

C-bit parity was calculated.

FEBE Seconds

The number of seconds during which at least one

FEBE occurred since initial DS3 C-bit frame synchronization.

Frame Error Rate

The ratio of frame errors to received framing bits

since initially acquiring frame synchronization.

Frame Error Seconds

The number of seconds during which one or more

frame errors occurred since initial frame synchronization.

Frame Errors

The number of frame errors detected since initial

frame synchronization.

Frame Sync Loss Seconds

The number of seconds during which one or more

frame synchronization losses occurred or during
which frame synchronization could not be achieved,
since initial frame synchronization.

Frame Sync Losses

A count of discrete losses of frame synchronization

since initial frame synchronization or last test restart.

LOFs

Count of the number of times LOF was present since

initial frame synchronization.

LOF Seconds

Number of seconds during which an LOF was present since initial frame synchronization.

MF-AIS Seconds

Number of seconds during with MF-AIS was

detected.

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Table 34 T-Carrier/PDH Frame results (Continued)

Test Result

Description

MF-RDI Seconds

Number of seconds during which MF-RDI was

detected.

MFAS Sync Losses

Count of the number of MFAS synchronization

losses since initial frame synchronization.

MFAS Sync Loss Seconds

Count of the number of seconds during which one or

more MFAS synchronization losses occurred or during which frame synchronization could not be
achieved, since initial frame synchronization.

MFAS Word Error Rate

The ratio of MFAS word errors to received framing

bits since initially acquiring frame synchronization.

MFAS Word Errors

Count of MFAS word errors since initial frame synchronization.

National Bit

182

near-end OOF Seconds

The number of seconds during which an out-offrame condition or an AIS is detected.

Non-Frame Alignment
Word

Display of the Non-Frame Alignment word carried in

the C-bit FEAC channel.

Parity Error Bit Rate

The ratio of parity errors to the number of bits over

which parity was calculated.

Parity Error Seconds

The number of seconds during which one or more

parity errors occurred since initial DS3 frame synchronization.

Parity Errors

Count of M-Frames that contain a mismatch

between either parity bit (P-bits) and the parity calculated from the information bits in the previous Mframe.

RAI Seconds

The number of seconds during which one or more

RAI errors occurred since initial frame synchronization.

RDI Alarm Count

Count of RDI alarms detected since initial frame synchronization.

RDI Seconds

The number of seconds during which one or more

RDI errors occurred since initial frame synchronization.

REBEs

Count of the number of REBEs (Remote End Block

Errors) detected in the E bits since initial frame synchronization.

Rx X-Bits

The current status of the received X-bits when in a

framed mode. The result is available after receiving
DS3 frame synchronization.

Sa4
Sa5
Sa6
Sa7
Sa8

Displays the value of the associated bit (Sa 4

through Sa 8) over the previous 8 received frames.

Tx X-Bits

The current setting of the transmitted X-bits when in

a framed mode.

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BERT test results

Table 35 describes each of the results available under the Payload group, in
the BERT category.
Table 35

T-Carrier/PDH BERT test results

Test Result

Description

Bit/TSE Error Rate

Ratio of bit or Test Sequence Error (TSE) errors to

received pattern data bits since initial frame synchronization.

Bit/TSE Errors

Count of the number of bit or Test Sequence Error (TSE)

errors that occurred after initial pattern synchronization.

Pattern Slip Seconds

Count of the number of seconds during which one or

more pattern slips occurred after initial pattern synchronization.

Pattern Sync Loss

Seconds

Number of seconds during which pattern synchronization was lost after initial pattern synchronization.

Pattern Sync Losses

Count of the number of times synchronization is lost after

initial pattern synchronization.

Channel test results

In addition to the standard result groups, when your instrument is configured

for fractional T1 testing, the Payload result group provides a Channel category.
The Rx Byte for each channel appears in the category.

Traffic test results

In addition to the standard result groups, when your instrument is configured

for fractional T1 testing, the Payload result group provides a Traffic category.
The ABCD signaling bit value for each channel appears in the category.

ISDN test results

In addition to the standard result groups, when your instrument is configured

for ISDN testing, statistics, decodes, and information concerning the call status
are provided under the ISDN and Call result groups.

Stats

The ISDN Stats category shows layer 2 results such as the frame count and
D channel service state for the primary, and if applicable, secondary line.
Results in this category accumulate after test restart. Table 36 describes the
results that appear in the ISDN category.D-Chan Decodes
Table 36

Stats test results

Result

Description

Average % Utilization

The average bandwidth utilized by the received traffic

since the last test restart, expressed as a percentage of
the line rate of available bandwidth. The average is calculated over the time period elapsed since the last test
restart.

Call Clearing Count

Total number of cleared calls for the primary, and if applicable, secondary line. Count appears in the Primary result
column.

Call Connect Count

Number of calls connected for the primary, and if applicable, secondary line. Count appears in the Primary result
column.

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Table 36

184

Stats test results (Continued)

Result

Description

Call Failure Count

Number of failed incoming and outgoing calls for the primary, and if applicable, secondary line. Count appears in
the Primary result column.

Call Placement
Count

Number of outgoing calls placed for the primary, and if

applicable, secondary line. Count appears in the Primary
result column.

CRC Errored
Frames

Counts the number of CRC errored frames on the

D channel.

Errored Frame
Count

Number of valid frames with one or more of the following

error conditions:
undefined control field
S or U frames with incorrect length
I frame with a long information field.

Frame Reject
Frames

Number of frame-reject (FRMR) frames that indicate an

improper frame has arrived.

Frame Sync

T1 frame synchronization was not detected.

Invalid SAPI Count

Number of frames received with an invalid SAPI (service

access point identifier).

LAPD State

Displays one of the following messages about the process

of establishing the data link:
TEI Unassigned
Assign Await. TEI
Est. Await. TEI
TEI Assigned
Await. Est.
Await. Rel.
Mult. Frm. Est.
Timer Recovery
Link Unknown

Maximum %
Utilization

The maximum percent of link utilization in any one second

since the start of the test.

Reject Frame Count

Number of reject (REJ) supervisory frames used by a data

link layer entity to request retransmission of I frames
starting with the frame numbered N(R).

Rx Frame Count

Number of LAPD frames received since the start of the

test.

Short Frames

Number of short ISDN frames (frames with less than 3

octets plus an FCS) detected.

Valid Frame Count

Number of valid LAPD frames received since the start of

the test.

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Call states

Table 37 lists the valid call states that may appear for a call in the Status result
category.
Table 37

Call states

State

Indicates

Alerting

An outgoing call has been routed to the destination

ISDN device or phone, and is in the process of ringing.
NOTE: Some ISDN devices (for example, the HST3000), do not literally ring.

Connected

An incoming or outgoing call is established.

Idle

The instrument is ready to place or receive the call.

Incoming

An incoming call is waiting to be accepted, rejected, or

ignored.

Outgoing

The instrument is in the process of initializing an outgoing call.

Proceeding

A switch has recognized and is processing the outgoing

call.

Releasing

The instrument is in the process of releasing the call.

In addition to the call states listed in Table 37, Q.931 cause values indicating
the reason a call is disconnected are displayed in the Status category. For
details, see Understanding the Q.931 Cause Values on page 244. A history
of all call activity is also provided in the History category.

VF results

Table 38

In addition to the standard result groups, when your instrument is configured

for VF testing, VF results are provided under the Payload result group.
Table 38 describes each of the results available.

VF test results

Result

Description

Operating Mode

Test

1004Hz Frequency

Frequency measurement of the 1004 Hz

test tone.

Dual Monitor
Terminate

Three Tone

1004Hz Level

Level measures of the 1004 Hz test tone.

Dual Monitor
Terminate

Three Tone

2804Hz Frequency

Frequency measurement of the 2804 Hz

test tone.

Dual Monitor
Terminate

Three Tone

2804Hz Level

Level measurement of the 2804 Hz test

tone.

Dual Monitor
Terminate

Three Tone

2804Hz Gain Slope

The difference between the levels at

1004 Hz and 2804 Hz.

Dual Monitor
Terminate

Three Tone

3.4Hz Flat Notched dBrnC

Measurement, using a 1010 Hz notch filter,

of the noise level on a channel with a holding tone at the transmitted end, expressed
in dBrn.
The measurement range is 22 to 90 dBrn
with 1 dBrn resolution.

Dual Monitor
Terminate

Quiet
Holding Tone

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Table 38

VF test results (Continued)

Result

Description

Operating Mode

Test

3.4kHz Flat dBrnC

Measurement of the low frequency noise

present on the test channel, expressed in
dBrn.
The measurement range is 22 to 90 dBrn
with 1 dBrn resolution.

Dual Monitor
Terminate

Quiet Tone
Holding Tone

3.4kHz Flat Notched SNR

Ratio of the test tone signal level to the

level of the background noise using the
1010 Hz notch filter.
Generally, higher ratios indicate lower noise
and better quality while lower ratios indicate
more noise and poor quality.

Dual Monitor
Terminate

Quiet
Holding Tone

3.4kHz Flat SNR

Ratio of the test tone signal level to the

level of the background noise on the test
channel. Accuracy is 1 dB, from 0 to 45 dB.
For this measurement a 1004 Hz tone is
transmitted or 0xFE is inserted in the channel under test.

Dual Monitor
Terminate

Quiet Tone
Holding Tone

404Hz Frequency

Frequency measurement of the 404 Hz test

tone.

Dual Monitor
Terminate

Three Tone

404Hz Gain Slope

The difference between the levels at

404 Hz and 1004 Hz.

Dual Monitor
Terminate

Three Tone

404Hz Level

Level measurement of the 404 Hz test

tone.

Dual Monitor
Terminate

Three Tone

Cmsg dBrnC

Measurement, using C- or D-Message

weighting, of the noise on an idle channel
or circuit (a channel or circuit with a termination at one end and no holding tone at
the transmitting end), expressed in dBrnC.
Measurement range is 22 to 90 dBrnC with
1 dBrnC resolution.

Dual Monitor
Terminate

Quiet Tone
Holding Tone

Measurement, using C- or D-Message

weighting and a 1010 Hz notch filter, of the
noise level on a channel with a holding tone
at the transmitted end, expressed in dBrnC.
The measurement range is 22 to 90 dBrnC
with 1 dBrnC resolution.

Dual Monitor
Terminate

Quiet Tone
Holding Tone

Ratio, in dB, (using C- or D-Message

weighting) of the test tones level to the
level of the background noise on the test
channel using the 1010 Hz notch filter.

Dual Monitor
Terminate

Quiet Tone

Ratio, in dB, (using C- or D-Message

weighting) of the test tones level to the
level of the background noise on the test
channel (accuracy is 1 dB, from 0 to 45
dB).
For this measurement, a 1004 Hz tone is
transmitted or 0xFE is inserted in the channel under test.

Dual Monitor
Terminate

Quiet Tone
Holding Tone

Dmsg dBrnC

Cmsg Notched dBrnC

Dmsg Notched dBrnC

Cmsg Notched SNR

Dmsg Notched SNR
Cmsg SNR
Dmsg SNR

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Table 38

VF test results (Continued)

Result

Description

Operating Mode

Test

DC Offset mV

Measurement of DC offset from -128 mV to

128 mV with a resolution of 1 mV.

Dual Monitor
Terminate

Quiet Tone
Holding Tone
Three Tone
Single Tone
Frequency Sweep

Frequency Hz

Measurement of the VF frequency in Hertz

from 20 to 3904 Hz with an accuracy of
1 Hz.

Dual Monitor
Terminate

Quiet Tone
Holding Tone
Three Tone
Single Tone
Frequency Sweep

Holding Tone Pres.

Measurement of the 1004 Hz tone transmitted over a circuit for performing noise-withtone, jitter, and transient measurements.

Dual Monitor
Terminate

Quiet Tone
Holding Tone

Impulse Noise Count

Number of times the impulse noise level

has exceeded the specified threshold.

Dual Monitor
Terminate

Impulse Noise

Level dBm

Measurement of the VF level in dBm, with

an accuracy of 0.2 dB from 200 Hz to 3900
Hz (+3 dBm to -40.0 dBm) and 0.1 dB from
1002 Hz to 1022 Hz (0 to -19 dBm).

Dual Monitor
Terminate

Quiet Tone
Holding Tone
Three Tone
Single Tone
Frequency Sweep

SONET/SDH results
Interface, BER, and performance results are available when performing
SONET, SDH, and 10 Gigabit Ethernet WAN testing. Categories discussed in
this section include the following:
SONET and SDH LEDs (TestPad mode) on page 188
SONET and SDH LEDs (ANT mode) on page 190
CFP Auto-FIFO Reset on page 191
Interface test results on page 192
STL Stat results on page 192
STL Per Lane results on page 193
Section/RSOH test results on page 194
Line/MSOH test results on page 195
Path/HP test results on page 196
LP/VT test results on page 198
Payload BERT test results on page 199
Service Disruption Results on page 200
TCM test results on page 200
T1.231 test results on page 201

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NOTE:
When you configure your unit to transmit or monitor a SONET or SDH client
signal over an OTN circuit, SONET and SDH LED behavior and test results
are streamlined. For example, if your unit is operating in TestPad mode and
the signal is lost, the Signal Present History LED turns red, and Signal Present and Signal Loss Seconds results are provided in the SONET/SDH Summary Status category.

SONET and SDH LEDs

(TestPad mode)

Table 39 describes each of the SONET and SDH LEDs in TestPad mode for
the lower rate applications. If the instrument loses an LED event, the green
Status LED extinguishes, and the red Alarm LED in the history column illuminates indicating an error condition has occurred.
If an error occurs at a higher level, LEDs at lower levels do not indicate alarms.
For example, if there is no signal present (indicated by a red Signal Present
LED), the Frame Sync and Pattern Sync LEDs do not indicate that there is an
alarm because you can not attain frame or pattern synchronization without a
signal

Table 39 SONET and SDH LEDs (TestPad Mode)

188

SONET LED

SDH LED

Description

Signal Present

Green
A signal is present.
Red
No signal is present.

Frame Sync

Green
Synchronization is established with
framing of signal.
Red
Frame synchronization has not been
established.

Path Ptr Present

AU Ptr Present

Green
Valid SONET or SDH pointer value is
present.
Red
An invalid Path pointer has been
received on the selected receive
channel since the last test start or
restart.

Concat Payload

Green
A concatenated payload has been
detected.
Red
A concatenated payload was
detected, but has been lost since the
last test start or restart.

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Table 39 SONET and SDH LEDs (TestPad Mode) (Continued)

SONET LED

SDH LED

Description

Pattern Sync

Green
Synchronization is established with
BERT pattern.
Red
Synchronization with the received
BERT pattern has not been established.

Table 40 describes each of the SONET and SDH STL LEDs in TestPad mode
for the highest rate applications. If the instrument loses an LED event, the
green Status LED extinguishes, and the red Alarm LED in the history column
illuminates indicating an error condition has occurred.
If an error occurs at a higher level, LEDs at lower levels do not indicate alarms.
For example, if there is no signal present (indicated by a red Signal Present
LED), the Frame Sync and Pattern Sync LEDs do not indicate that there is an
alarm because you can not attain frame or pattern synchronization without a
signal

Table 40 SONET and SDH STL LEDs (TestPad Mode)

SONET LED

SDH LED

Description

Signal Present

Green
A signal is present.
Red
No signal is present.

STL Frame Sync

STL Frame
Sync

Green
Synchronization is established with
framing of signal.
Red
Frame synchronization has not been
established.

STL Marker Lock

STL Marker
Lock

Green
Synchronization is established with
Marker Lock signal.
Red
Synchronization has not been established with Marker Lock signal.

STL Lanes
Aligned

Green
Synchronization has been established within acceptable parameters
between lanes.
Red
Synchronization has not been established within acceptable parameters
between lanes.

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Table 40 SONET and SDH STL LEDs (TestPad Mode) (Continued)

SONET and SDH LEDs (ANT

mode)

SONET LED

SDH LED

Description

Path Ptr Present

AU Ptr Present

Green
Valid SONET or SDH pointer value is
present.
Red
An invalid Path pointer has been
received on the selected receive
channel since the last test start or
restart.

Pattern Sync

Green
Synchronization is established with
BERT pattern.
Red
Synchronization with the received
BERT pattern has not been established.

Table 42 describes each of the SONET and SDH LEDs in ANT mode for the
lower rate applications. If an error occurs at a higher level, LEDs at lower levels
do not indicate alarms. For example, if there is no signal present (indicated by
a red LOS LED), the LOF and LSS LEDs do not indicate that there is an alarm
because you can not detect framing patterns or attain sequence synchronization without a signal.

Table 41 SONET and SDH LEDs (ANT mode)

LED

Description

LOS

Illuminates Red if no signal or an invalid signal is detected. Extinguishes when a valid signal is detected.

LOF

Illuminates Red if no framing pattern is detected. Extinguishes

when framing pattern is detected.

LOP-P

Illuminates Red if no payload position pointer is detected in the signal overhead. Extinguishes when payload position pointer is
detected.

LSS

Illuminates Red if synchronization is not established with the

received BERT pattern. Extinguishes when pattern sync is established.

Table 42 describes each of the SONET and SDH STL LEDs in ANT mode for
the highest rate applications. If an error occurs at a higher level, LEDs at lower
levels do not indicate alarms. For example, if there is no signal present (indicated by a red LOS LED), the STL LOF and LSS LEDs do not indicate that
there is an alarm because you can not detect framing patterns or attain
sequence synchronization without a signal.

Table 42 SONET and SDH STL LEDs (ANT mode)

190

SONET LED

SDH LED

Description

LOS

Illuminates Red if no signal or an invalid signal is

detected. Extinguishes when a valid signal is
detected.

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Table 42 SONET and SDH STL LEDs (ANT mode)

CFP Auto-FIFO Reset

SONET LED

SDH LED

Description

STL LOF

Illuminates Red if no framing pattern is detected.

Extinguishes when framing pattern is detected.

STL LOR

Illuminates Red if marker recovery error is in outof-recovery state. Extinguishes when recovery
state is reestablished.

STL LOL

Illuminates Red if no marker lock loss is detected

or if inter-lane skew is beyond the threshold.
Extinguishes when marker lock is detected.

LOP-P

AU-LOP

Illuminates Red if no payload position pointer is

detected in the signal overhead. Extinguishes
when payload position pointer is detected.

LSS

Illuminates Red if synchronization is not established with the received BERT pattern. Extinguishes when pattern sync is established.

Some CFP are equipped with a feature that automatically schedules a transmit
(Tx) or Receive (RX) FIFO Reset upon detection of a Los of Lane (LOL) Alignment. As FIFO resets will have a significant effect on the reported results of
currently running applications, they are asynchronous involving delays on the
order of several hundred microseconds.
Specific to the OpNext 100G LR4 CFP, and as per the manufacturers recommendation, the 40G/100G High Speed Transport Module will execute software
monitored and assisted transmit and receive FIFO resets.
A FIFO will be reset any time it has regained synchronization (lock) after
having lost it:
For the Tx FIFO, this typically occurs just as the optics gets activated
(i.e. as it starts receiving data from host).
For the Rx FIFO, this typically occurs any time network data is lost and
regained (e.g. during LOS transition from on to off).
This automatic FIFO-resetting mechanism will be gated (blocked) if:
SONET/SDH service disruption is enabled for service disruption
measurement accuracy (see Measuring service disruption time on
page 71); or
OTN service disruption is enabled for service disruption measurement
accuracy (see Measuring service disruption time on page 172); or
Ethernet service disruption has decoupled TX from RX for service
disruption measurement accuracy (refer toT-BERD / MTS-8000 and TBERD / MTS-6000A Ethernet, IP, TCP/EUDP, Fibre Channel, VOIP
and IP Video Testing Manual).
The manual FIFO reset on the expert configuration page will not be blocked or
gated (refer toT-BERD / MTS-8000 and T-BERD / MTS-6000A Getting Started
Manual).

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Interface test results

Table 43 lists and describes each of the test results available in the Interface
result group. All results are displayed under the Signal tab, except as noted.
Result names are identical for SONET and SDH test applications.
Table 43

STL Stat results

Interface test results

Test Result

Description

Signal Losses

Count of the number of times signal was not present.

Signal Loss Seconds

Number of seconds during which a signal was not

present.

CFP Optical Rx Overload

The value of the received optical power in dBm. Will

display under the Lambda heading for optics accommodating reporting of individual parallel lasers.

LOS Count

Count of the number of times LOS was present since

the last test start or restart.

LOS Seconds

Number of seconds during which an LOS was present since the last test start or restart.

Optical Rx Level (dBm)

Displays the receive level for optical signals in dBm.

Optical Rx Level (dBm)

[component}

Displays the receive level for each laser of a multilaser optical signals in dBm (optic dependent)
(Lambda tab)

Round Trip Delay (ms)

The round trip delay for the last delay pattern sent
and successfully received by the MSAM. Calculated
in milliseconds, with a resolution of 1 ms.

Rx Frequency (Hz)

Frequency of the clock recovered from the received

signal, expressed in Hz.

Rx Frequency Deviation
(ppm)

Current received frequency deviation, expressed in

ppm.

Rx Freq Max Deviation

(ppm)

Maximum received frequency deviation, expressed in

ppm.

Invalid Rx Signal Seconds

Number of seconds during which an invalid signal

was received.

Tx Clock Source

Displays the timing source (INTERNAL, RECOVERED, or BITS).

Tx Freq Max Deviation

(ppm)

Maximum transmitted frequency deviation,

expressed in ppm.

Tx Frequency (Hz)

Current transmitter clock frequency, expressed in Hz.

Tx Frequency Deviation
(ppm)

Current transmitted frequency deviation, expressed

in ppm.

Table 44 lists and describes each of the test results available in the STL Stats
category when performing STL testing.

Table 44 STL Stats

192

STL Stat Result

Description

SEF Seconds

Count of asynchronous test seconds in which an OOF

was counted since the last test start or restart.

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SONET/SDH results

Table 44 STL Stats (Continued)

STL Per Lane results

STL Stat Result

Description

AIS Seconds

Count of the number of seconds containing at least one

AIS error in any logical lane.

Marker Lock Loss Seconds

The number of seconds during which a Marker Loss

was detected since the last test start or restart.

OOR Seconds

The number of seconds during which an OOR was

detected since the last test start or restart.

Lane Aligned Loss

Seconds

The number of seconds during which an LOL was

detected since the last test start or restart.(ANT Mode)

OOL Seconds

The number of seconds during which an OOL was

detected since the last test start or restart.

FAS Errors

Count of the total number of FAS errors across all logical lanes (sum).

FAS Error Rate

Ratio of the total number of FAS errors across all logical lanes (sum) to total number of frames.

FAS Error Seconds

Count of the number of seconds containing at least one

FAS error in any logical lane.

(Logical) Lane Marker

(LLM) Errors

Count of the total number of LLM errors across all logical lanes (sum).

(Logical) Lane Marker

(LLM) Error Rate

Ratio of the total number of LLM errors across all logical lanes (sum) to total number of Lane Markers.

(Logical) Lane Marker

(LLM) Error Seconds

Count of the number of seconds containing at least one

LLM error in any logical lane.

Frame Sync Loss

Seconds

Number of seconds frame synchronization was not

present since the last test start or restart.

Max Skew (bits)

Shows maximum skew value, in bits, for any logical

lane since the start of the test.

Cur Max Skew (bits)

Shows current maximum skew value, in bits, for any

logical lane.

Max Skew (ns)

Shows maximum skew value, in nsecs, for any logical

lane since the start of the test.

Cur Max Skew (ns)

Shows current maximum skew value, in nsecs, for any

logical lane.

Max Logical Lane

Skew

Shows ID for logical lane having the highest skew.

Min Logical Lane Skew

Shows Logical Lane ID for logical lane having the least

skew.

Table 45 lists and describes each of the test results shown in the STL Per Lane
display when performing STL testing.

Table 45 STL Per Lane results

STL Stat Result

Description

Max Skew LL ID

Shows Logical Lane ID for logical lane having the

greatest skew.

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Table 45 STL Per Lane results (Continued)

STL Stat Result

Description

Min Skew LL ID

Shows Logical Lane ID for logical lane having the least

skew.

Max Skew (ns)

Shows skew value in nsecs for logical lane having the

greatest skew.

Max Skew (bits)

Shows skew value in bits for logical lane having the

greatest skew.

Lane #

Shows the Logical Lanes in the signal, #0 - #3.

Logical ID

Shows Lane ID for each logical lane.

Skew (bits)

Shows skew value in bits for each logical lane.

Skew (ns)

Shows skew value in nsecs for each logical lane.

Frame Sync

Display of sync status for each logical lane.

STL OOF

Display of OOF status for each logical lane.

STL AIS

Display of AIS status for each logical lane.

Marker Lock

Display of marker lock status for each logical lane.

STL OOR

Display of OOR status for each logical lane.

FAS

Count of FAS errors for each logical lane since the start
of the test.

(Logical) Lane Marker

(LLM) Errors

Count of the total number of LLM errors in each logical

lane since the start of the test.

Figure 34 STL Per Lane results table

Section/RSOH test results

Table 46

Table 46 lists and describes each of the test results available in the Section and
RSOH categories.

Section/RSOH results

SONET Result

SDH Result

Description

B1 Error Rate

The ratio of Section BIP errors to the total number of received

bits.

B1 Errors

Count of errors in the even parity BIP-8 (B1) byte used as a

parity check against the preceding frame. Up to eight B1 errors
may be counted per frame.

Frame Sync Loss

Seconds

LOF Seconds

Number of seconds frame synchronization was not present

since the last test start or restart.

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Table 46

Section/RSOH results (Continued)

SONET Result

SDH Result

Description

Frame Sync Losses

LOF Count

Count of frame synchronization losses since the last test start

or restart.

Frame Word Error Rate

FAS Word Error Rate

The ratio of frame word errors to the total number of received

frame words.

Frame Word Errors

FAS Word Errors

Count of errored frame alignment signal (FAS) subsets (subset

of bytes A1 and A2) received since gaining initial frame synchronization.

Section Trace (J0)

RS Trace (J0)

Displays the 16 or 64-byte Section trace ASCII message that is

carried in the Section overhead byte (J0).

SEF Count

OOF Count

Count of four contiguous errored frame alignment words (A1/

A2 pair) detected since the last test start or restart.

SEF Seconds

OOF Seconds

Count of asynchronous test seconds in which an OOF was

counted since the last test start or restart.

Line/MSOH test results

Table 47

Table 47 lists and describes each of the test results available in the Line and
MSOH categories.

Line/MSOH results

SONET Result

SDH Result

Description

AIS-L Seconds

MS-AIS Seconds

The number of seconds during which a Line AIS is detected

since the last test start or restart.

APS K1 Bridged Request

Code (Ring)

APS K1 Bridged Requested

Code (Ring)

The number of the channel bridged bits 1-4 on the protection

line. If 0, then no line is bridged to the APS line.

APS K1 Channel Number

(Linear)

APS K1 Channel Number

(Linear)

Displays the value of the destination node bit field carried in

the K1 byte. It is typically set when APS events occur in the
network.

APS K1 Destination Node

ID (Ring)

APS K1 Destination Node

ID (Ring)

Displays the value of the destination node bit field carried in

the K1 byte. It is typically set when APS events occur in the
network.

APS K1 Request Code

(Linear)

APS K1 Request Code

(Linear)

The number of the channel bridged bits 1-4 on the protection

line. If 0, then no line is bridged to the APS line.

APS K2 Bridge Channel

(Linear)

APS K2 Bridge Channel

(Linear)

Displays the value of the source node bit field carried in the
K2 byte. It is typically set when APS events occur in the network.

APS K2 MSP Architecture (Linear)

APS K2 MSP Architecture

(Linear)

Displays the value of the Path code bit field carried in the K2
byte. It is typically set when APS events occur in the network.

APS K2 Path Code (Ring)

Displays the value of the Path code bit field carried in the K2
byte. It is typically set when APS events occur in the network.

APS K2 Source Node ID

(Ring)

APS K2 Source Node

(Ring)

Displays the value of the source node bit field carried in the
K2 byte. It is typically set when APS events occur in the network.

APS K2 Status (Linear)

Displays the status code carried in bits 6-8 of the K2 byte. It

is typically set when APS events occur in the network.

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Table 47

Line/MSOH results (Continued)

SONET Result

SDH Result

Description

APS K2 Status (Ring)

Displays the status code carried in bits 6-8 of the K2 byte. It

is typically set when APS events occur in the network.

APS Message Count

Count of the number of APS messages since the last test

start or restart.

B2 Error Rate

The B2 Errors/Total number of received bits, less the SOH.

The denominator of the message is the total number of nonSection received bits instead of the number of B2 so that the
result is used to approximate overall received bit error rate.
This approximation works on the assumption that only one
bit error occurs per SOH frame per bit position.

B2 Errors

Count of errors in the even parity Line B2 byte used as a

parity check against the preceding frame less the regenerator or section overhead. Up to eight B2 errors may be
counted per STS.

RDI-L Seconds

MS-RDI Seconds

The number of seconds in which the RDI alarm has been

active since the last test start or restart. The second is Incremented each time the instrument detects a 110 pattern in the
Line overhead APS byte (K2), bits 6 to 8, for five consecutive
frames. Line RDI is removed after detecting a pattern other
than 110 in bits 6-8 of byte K2 for five consecutive frames.

REI-L Rate

MS-REI Rate

The ratio of Line REIs to the total number of received bits in

the previous frame, less the SOH overhead.

REI-L Errors

MS-REI Errors

Count of the number of REI errors present. Up to 8 REI

errors may be counted per frame.

Sync Status (S1)

Displays the S1 byte message, carried in bits 5 through 8,

after frame synchronization and signal presence are
detected.

Path/HP test results

Table 48

Table 48 lists and describes each of the test results available in the Path and
HP categories.

Path/HP results

SONET Result

SDH Result

Description

AIS-P Seconds

AU-AIS Seconds

Count of asynchronous test seconds in which Path AIS

was present for any portion of the test second.

B3 Error Rate

Rate of Path BIP byte (B3) errors divided by the total number of received bits less the SOH and LOH.

B3 Errors

Count of B3 errors (indicating an error in the previous

frame since initial SONET frame synchronization) since the
last test start or restart.

Concat Payload Losses

Concat Losses

Count of the number of times the concatenated pointer

was invalid when testing a concatenated payload.

Concat Payload Loss Seconds

Concat Loss Seconds

Count of the number of seconds that the concatenated

pointer was invalid when testing a concatenated payload.

LOP-P Seconds

AU-LOP Seconds

Count of the number of seconds that Path LOP was present since the last test start or restart.

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Table 48

Path/HP results (Continued)

SONET Result

SDH Result

Description

NDF-P Count

N/A

Count of the number of new data flags (NDF) since the last
test start or restart.

Path Pointer Decrements

AU Pointer Decrements

Count of the number of times the pointer bytes (H1 and

H2) indicated a decrement to the Path payload pointer
since initial frame synchronization.

Path Pointer Increments

AU Pointer Increments

Count of the number of times the pointer bytes (H1 and

H2) indicated an increment to the Path payload pointer
since initial frame synchronization.

Path Pointer Adjustments

AU Pointer Adjustments

Count of the number of negative and positive Path pointer

adjustments on the selected receive channel since the last
test start or restart.

Path Pointer Size

AU Pointer Size (SS Bits)

The binary setting of the size bits in the H1 byte. The normal setting for the pointer size bits is 00 to indicate a
SONET payload, or 10 to indicate a SDH payload.

Path Pointer Value

AU Pointer Value

The current Path pointer value from 0 to 782. UNAVAILABLE appears under a number of error conditions, such as
Line AIS, etc. OUT OF RANGE appears if the pointer value
is outside 0 to 782.

Path Trace (J1)

Displays the 16 or 64-byte Path trace ASCII message

which is carried in the Path overhead byte (J1).

PLM-P Seconds (C2)

The number of seconds in which payload mismatch Path

errors occurred since the last test start or restart.
NOTE: You can disable PLM-P Alarm results on the Overhead setup screen. See Inserting the C2 Path signal label
on page 77.

RDI-P Seconds

HP-RDI Seconds

The number of seconds in which the RDI alarm is active

since the last test start or restart.

REI-P Rate

HP-REI Rate

The ratio of Path REIs to the total number of received bits,

less the SOH and the LOH overhead.

REI-P Errors

HP-REI Errors

Count of the number of REI errors present. Up to 8 REI

errors may be counted per frame.

Signal Label (C2)

Displays the value of the signal label (C2) byte, indicating

the type of data in the Path.

TIM-P Seconds (J1)

HP-TIM Seconds

Count of the number of seconds in which the Path trace

identifier (J1) is different than the expected value since the
last test start or restart.

Tx Path Pointer Size

Tx AU Pointer Size (SS Bits)

The binary setting of the size bits in the transmitted H1

byte.

Tx Path Pointer Value

Tx AU Pointer Value

The transmitted Path pointer value from 0 to 782.

UNEQ-P Seconds

Number of seconds the Path Label was Unequipped.

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LP/VT test results

Table 49

Table 49 lists and describes each of the test results available in the LP and VT
categories.

LP/VT results

SONET Result

SDH Result

Description

AIS-VT Seconds

LP-AIS Seconds

Count of asynchronous test seconds in which VT/LP-AIS

was present for any portion of the test second.

BIP-VT Error Rate

LP-BIP Error Rate

Rate of VT/LP BIP byte (V5) errors divided by the total

number of received bits less the SOH and LOH, and POH.

BIP-VT Errors

LP-BIP

Count of BIP-VT errors (indicating an error in the previous

frame since initial SONET frame synchronization) since the
last test start or restart.

LOP-VT Seconds

TU-LOP Seconds

Count of the number of seconds that VT LOP was present

since the last test start or restart.

NDF-VT Count

TU-NDF

Count of the number of new data flags (NDF) since the last
test start or restart.

VT Pointer Decrements

TU Pointer Decrements

Count of the number of times the pointer bytes indicated a

decrement to the VT payload pointer since initial frame
synchronization.

VT Pointer Increments

TU Pointer Increments

Count of the number of times the pointer bytes indicated

an increment to the VT payload pointer since initial frame
synchronization.

VT Pointer Adjustments

TU Pointer Adjustments

Count of the number of negative and positive VT pointer

adjustments on the selected receive channel since the last
test start or restart.

VT Pointer Size

TU Pointer Size

The binary setting of the size bits in the H1 byte. The normal setting for the pointer size bits is 00 to indicate a
SONET payload, or 10 to indicate a SDH payload.

VT Pointer Value

TU Pointer Value

The current VT pointer value from 0 to 103 or 139.

UNAVAILABLE appears under a number of error conditions, such as Line AIS, etc. OUT OF RANGE appears if
the pointer value is outside the range.

VT Trace (J2)

LP Trace (J2)

Displays the 16 or 64-byte VT trace ASCII message which

is carried in the VT overhead byte (J2).

PLM-VT Seconds (V5)

LP-PLM Seconds (V5)

The number of seconds in which payload mismatch VT

errors occurred since the last test start or restart.
NOTE: You can disable PLM-P Alarm results on the Overhead setup screen. See Inserting the C2 Path signal label
on page 77.

RFI-VT Seconds

LP-RFI Seconds

The number of seconds in which the VT-RFI alarm is active

since the last test start or restart.

REI-VT Rate

LP-REI Rate

The ratio of VT REIs to the total number of received bits,

less the SOH, LOH and the POH overhead.

REI-VT Errors

LP-REI Errors

Count of the number of REI errors present. Up to 2 REI

errors may be counted per multi-frame.

VT Signal Label (V5)

LP Signal Label (V5)

Displays the value of the signal label (V5) byte, indicating

the type of data in the VT.

TIM-VT Seconds (J2)

LP-TIM (J2) Seconds

Count of the number of seconds in which the Path trace

identifier (J2) is different than the expected value since the
last test start or restart.

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Table 49

LP/VT results (Continued)

SONET Result

SDH Result

Description

Tx VT Pointer Size

Tx TU Pointer Size

The binary setting of the size bits in the transmitted H1

byte.

Tx VT Pointer Value

Tx TU Pointer Value

The transmitted Path pointer value from 0 to 103 or 139.

VT-LOM Seconds

TU-LOM Seconds

Number of seconds a Loss of Multiframe alignment

occurred.

UNEQ-VT Seconds

UNEQ-LP Seconds

Number of seconds the Path Label was Unequipped.

Payload BERT test results

Table 50 lists and describes each of the test results available in the BERT category.

Table 50 BERT results

SONET Result

SDH Result

Description

Bit / TSE Error Rate

TSE/Bit Error Rate

Rate of BIT or TSE errors divided by the total number of

received bits in the path payload.

BIT / TSE Errors

TSE/Bit Errors

Count of the number of BIT or TSE Errors since the last

test start or restart.

BIT / TSE Error Seconds

(40G)

BIT / TSE Error Seconds

(40G)

Count of the number of seconds containing pattern bit

errors since the beginning of the test.

BIT / TSE Error Free Seconds

Count of the number of seconds containing no pattern bit

errors since the beginning of the test.

BIT / TSE Error Free Seconds %

The ratio of seconds containing no pattern bit errors to the

total test time.

Pattern Sync Loss Seconds

Count of the number of seconds during which the receiver

has lost pattern synchronization, even momentarily, since
initial pattern synchronization.(Test Pad Mode)

Pattern Sync Losses

Count of the number of times pattern synchronization is

lost since the last test start or restart.(Test Pad Mode)

LSS Count

Count of the total number of LSS Errors since the last test
start or restart.(ANT Mode)

LSS Seconds

Count of the number of seconds during which the LSS

appeared.(ANT Mode)

Round Trip Delay (ms) (Current)

The minimum round trip delay calculated in microseconds,

with the resolution as follows:
10 s resolution for concatenated mappings of STS-3c
or VC-4 or above carrying Bulk BERT payloads.
100 s resolution for STS-1, AU-3, and VC-3 mappings
carrying Bulk BERT payloads.
1 ms resolution for all other mappings or payloads.
NOTE:
You must originate transmit a DELAY pattern to measure
round trip delay. If a unit is in loopback mode, or if the far
end unit is not looped back, invalid results appear because
the unit is not originating the traffic.

Round Trip Delay, Min (ms)

The minimum round trip delay calculated in microseconds,

with the resolution calculated as it is for the current measurement.

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Table 50 BERT results (Continued)

SONET Result

SDH Result

Description

Round Trip Delay, Max (ms)

The maximum round trip delay calculated in microseconds,

with the resolution calculated as it is for the current measurement.

Round Trip Delay (ms),

Average

Round Trip Delay (ms),

Average

The average round-trip delay calculated from all round-trip

delay results reported since the start of the test.

Service Disruption Results

To observe results associated with service disruption measurements, you

must enable service disruption when you configure your test (see Measuring
service disruption time on page 71).

SD Summary

The SD - Summary category provides the service disruption number, the start
time, and the duration for the disruption.

SD Details

The SD - Details category displays a log providing the time a disruption event
(such as a Bit/TSE error) occurred, and its duration in milliseconds. The
MSAM alerts you when the log becomes full and prompts you to clear it.

SD Statistics

The SD - Statistics category displays the longest, shortest, last (most recent),
and average disruptions logged during the course of your test. It also provides
a total count of disruptions.

TCM test results

Table 51 lists and describes each of the test results available in the TCM (Rx
Forward) and TCM (Rx Backward) categories. Result names are identical for
SONET and SDH test applications.

Rx Forward

Rx Backward

Table 51 TCM (Rx Forward) and TCM (Rx Backward) results

B3 Errors

Count of B3 errors indicating local network errors since the last test start or
restart.

TC-LTC

Indicates the receive side has lost frame sync with the TCM multiframe contained in the TCM byte (N1 or N2), resulting in Loss of Tandem connection
(LTC).(N/A 40/100G Transport Module)

TC-LTC History

Indicates the receive side has lost frame sync with the TCM multiframe
since the last test start or restart.

TC-AIS

N/A

Current value of the High Path or Low Path Alarm Indicator Signal, depending on which Section is being monitored.(N/A 40/100G Transport Module)

TC-AIS History

N/A

Displays the previous value of the High Path or Low Path Alarm Indicator
Signal, depending on which Section is being monitored.(N/A 40/100G
Transport Module)

TC-APId Label

Result

200

Description

Text string of the Tandem Connection Access Point Identifier.

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Result

Rx Backward

Rx Forward

Table 51 TCM (Rx Forward) and TCM (Rx Backward) results (Continued)

Description

TC-DIFF

N/A

Displays the difference between the incoming BIP value and the IEC value
in the TCM multiframe.

TC-IEC

N/A

Cumulative value of the Incoming Error Count since the last test start or
restart.

TC-ODI

N/A

Displays the Outgoing Defect Indication (ODI) status carried in the TCM
Multi-frame.(N/A 40/100G Transport Module)

TC-OEI

N/A

Displays the Outgoing Error Indication (OEI) count carried in the TCM Multiframe.(N/A 40/100G Transport Module)

TC-RDI

N/A

Displays the Remote Defect Indication (RDI) status carried in the TCM
Multi-frame.(N/A 40/100G Transport Module)

TC-REI

N/A

Displays the Remote Error Indication (REI) status carried in the TCM Multiframe.(N/A 40/100G Transport Module)

TC-UNEQ

N/A

Indicates there is no TCM information carried in the TCM byte; the byte
value is zero.

TC-UNEQ History

N/A

Indicates there was no TCM information carried in the TCM byte at some
point since the last test start or restart.

T1.231 test results

Table 45 lists and describes each of the test results available in the T1.231
category when performing SONET testing.

Table 52 T1.231 results

SONET Result

Description

Line AIS Seconds

Count of the number of seconds during which AIS

occurred since the last test start or restart.

Line ES

Count of the number of Line or Multiplex SOH errored

seconds since the last test start or restart.

Line SES

Count of the number of Line or Multiplex SOH severely

errored seconds since the last test start or restart.

Line UAS

Count of the number of Line or Multiplex SOH unavailable seconds since the last test start or restart.

Path ES

Count of the number of Path or HP POH errored seconds since the last test start or restart.

Path SES

Count of the number of Path or HP POH severely

errored seconds since the last test start or restart.

Path UAS

Count of the number of Path or HP POH unavailable

seconds since the last test start or restart.

Section ES

Count of the number of Section or Regenerator SOH

errored seconds since the last test start or restart.

Section SES

Count of the number of Section or Regenerator SOH

severely errored seconds since the last test start or
restart.

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ITU-T recommended performance test results

Table 52 T1.231 results (Continued)

SONET Result

Description

Section UAS

Count of the number of Section or Regenerator SOH

unavailable seconds since the last test start or restart.

ITU-T recommended performance test results

When configured for T-Carrier, PDH, SONET, and SDH tests, the MSAM
provides performance analysis results in accordance with ITU-T recommendations. If all results in a category conform to the associated recommendation,
the Verdict result indicates: ACCEPT.
You can view performance results for multiple categories simultaneously. For
example, you can display the G.821 Errored Seconds and the G.826 Errored
Block results simultaneously in separate results windows.
ITU-T performance results are not supported on the 40/100G High Speed
Transport Module.

HP, LP, RS, MS, ISM, and OOS

designations

HP (high path), LP (low path) RS (regeneration section), MS (multiplex

section), ISM (in service measurement), and OOS (out of service measurement) designations are captured in the result category name. For example, the
G.826 HP ISM category provides performance results associated with in
service measurements on the high path.

NE and FE designations

NE (near-end) and FE (far end) designations are captured in each of the

performance result names. For example, the ES (NE) result provides the
number of available seconds during which one or more relevant anomalies or
defects were present on the near-end of the circuit under test.

Performance result
descriptions

202

Table 53 lists and describes each of the performance test results.

Table 53 ITU-T and ANSI recommended performance test results

Test Result

Description

% ES

The ratio of errored seconds to the number of available seconds.

% SES

The ratio of severely errored seconds to the number of available

seconds.

BBE

The number of errored blocks not occurring as part of an SES.

BBER

The ratio of Background Block Errors (BBE) to total blocks in available time during a fixed measurement interval. The count of total
blocks excludes all blocks during SESs.

Number of blocks containing one or more errored bits.

The number of available seconds during which one or more relevant anomalies or defects were present.

ESR

The ratio of errored seconds to the number of available seconds.

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ITU-T recommended performance test results

Table 53 ITU-T and ANSI recommended performance test results

Test Result

Description

SEP

A count of severely errored periods, defined as a sequence of

between 3 to 9 consecutive severely errored seconds.

SEPI

The number of SEP events in available time, divided by the total

available time in seconds.

SES

Seconds during which one or more defects were present or the

anomaly rate exceeded the ITU-T recommended threshold.

SESR

The ratio of severely errored seconds to the number of available

seconds.

UAS

A count of the number of test seconds which met the associated

ITU-T recommendations definition of unavailable time.

Verdict

ACCEPT indicates that the test results have met the ITU-T recommendations performance objectives.
REJECT indicates that the test results did not meet the performance objectives.
UNCERTAIN only appears for M.2101 and indicates that the test
results fall between the S1 and S2 thresholds.

Table 54 indicates which test results are available in each result category.
Some results only appear if you are testing a particular interface. For example,
the BBE and BBER results are only available when testing a DS1, E1, SONET,
or SDH interface.

T1.514 ISM
T1.514 OOS

T1.231

G.828 ISM
G.828 OOS
M.2101 ISM
M.2101 OOS

G.829 ISM

G.826 ISM
G.826 OOS

Test
Result

G.821 OOS
M.2100 ISM
M.2100 OOS

Table 54 ITU-T recommended performance test results

% ES

% SES

BBE
BBER1

ESR

SEP

SEPI

SES

SESR

UAS

Verdict

1. BBE and BBER results only appear when testing E1, DS1, SONET and SDH interfaces.
They are not applicable when testing DS3, E3, or E4 interfaces.

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Jitter results

Jitter results
When configured for jitter tests on a T-Carrier, PDH, SONET, SDH, or OTN
interface, the MSAM provides jitter results in the Summary and Interface result
groups. The module also allows you to view the jitter results in a graphical or
tabular format.
You can view jitter results for multiple categories simultaneously. For example,
you can display the Jitter and the Jitter Graph results simultaneously in separate results windows. You can also change the layout of the test results on the
Main screen to use the entire result window when viewing graphical result. See
Changing the result layout on page 5.

HB, WB, Ext Band, and Userband designations

HB (high-band), WB (wide-band), Ext Band (extended-band), and User-Band

designations are captured in each of the Jitter result names. For example, the
WB Jitter (UIpp) result provides the current amount of peak-to-peak jitter
measured in the wide-band, expressed in UIPP (unit intervals peak-to-peak).

Jitter results, Summary group

Table 55 lists and describes each of the test results in the Jitter category under
the Summary result group. These results only appear if the associated error
condition occurs during the course of your test.

Table 55 Jitter test results in the Summary result group

Test Result

Description

AMS Test Status

Displays Fail if a MTJ, FMTJ, or JTF test fails.

Ext Band Jitter Phase Hits

A count of the total number of phase hits detected in the extended-band since the last test
start or restart.

HB Jitter Phase Hits

A count of the total number of phase hits detected in the high-band since the last test start
or restart.

HB Max % Mask

Displays the maximum percentage of jitter detected in the high-band when the limit of tolerable jitter specified in ANSI and ITU-T specifications for the line rate was exceeded since
the last test start or restart.
For example, if the limit was exceeded by three percent, 103% appears.

HB % Mask

Displays the current percentage of jitter detected in the high-band if the limit of tolerable jitter specified in ANSI and ITU-T specifications for the line rate is exceeded.
For example, if the limit is currently exceeded by one percent, 101% appears.

Jitter Rx Status

Displays Searching while the unit attempts to lock the PLL (Phase Locked Loop). After
the PLL is locked, the Searching result disappears from the Summary result group, and
valid jitter results accumulate.

User Band Jitter Phase Hits

A count of the total number of phase hits detected in the user-band since the last test start
or restart.

WB Jitter Phase Hits

A count of the total number of phase hits detected in the wide-band since the last test start
or restart.

WB Max % Mask

Displays the maximum percentage of jitter detected in the wide-band when the limit of tolerable jitter specified in ANSI and ITU-T specifications for the line rate was exceeded since
the last test start or restart.
For example, if the limit was exceeded by three percent, 103% appears.

WB % Mask

Displays the current percentage of jitter detected in the wide-band if the limit of tolerable jitter specified in ANSI and ITU-T specifications for the line rate is exceeded.
For example, if the limit is currently exceeded by one percent, 101% appears.

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Jitter results, Interface group

Table 56 lists and describes each of the test results in the Jitter category available in the Interface result group.

Table 56 Jitter test results in the Interface result group

Test Result

Description

Ext Band Jitter - Peak (UI)

The negative peak jitter measured in the extended-band over the last second, expressed in
UI.

Ext Band Jitter (UIpp)

The peak-to-peak jitter measured in the extended-band over the last second, expressed in
UIpp.

Ext Band Jitter + Peak (UI)

The positive peak jitter measured in the extended-band over the last second, expressed in
UI.

Ext Band Jitter Phase Hits

A count of the total number of phase hits detected in the extended-band since starting or
restarting the test.

Ext Band Max Jitter - Peak

(UI)

The maximum negative peak jitter measured in the extended-band since starting or restarting the test, expressed in UI.

Ext Band Max Jitter (UIpp)

The maximum peak-to-peak jitter measured in the extended-band since starting or restarting the test, expressed in UIpp.

Ext Band Max Jitter + Peak

(UI)

The maximum positive peak jitter measured in the extended-band since starting or restarting the test, expressed in UI.

HB % Mask

Percentage indicating how close the current level of jitter detected in the high-band is to
exceeding the limit of tolerable jitter specified in ANSI and ITU-T specifications for the line
rate.
For example, if the current level of jitter measured in the high-band is 80% of that specified
as the tolerable level, 80 % appears.

HB Jitter - Peak (UI)

The negative peak jitter measured in the high-band over the last second, expressed in UI.

HB Jitter (UIpp)

The peak-to-peak jitter, measured in the high-band over the last second, expressed in UIpp.

HB Jitter + Peak (UI)

The positive peak jitter measured in the high-band over the last second, expressed in UI.

HB Jitter Phase Hits

A count of the total number of phase hits detected in the high-band since starting or restarting the test.

HB Max % Mask

The maximum value of the HB % Mask percentage detected since starting or restarting the
test.
For example, if the maximum level of jitter measured in the high-band was 95% of that
specified as the tolerable level, 95 % appears.

HB Max Jitter - Peak (UI)

The maximum negative peak jitter measured in the high-band since starting or restarting
the test, expressed in UI.

HB Max Jitter (UIpp)

The maximum peak-to-peak jitter, measured in the high-band since starting or restarting the
test, expressed in UIpp.

HB Max Jitter + Peak (UI)

The maximum positive peak jitter measured in the high-band since starting or restarting the
test, expressed in UI.

JTF Rx Jitter (UIpp)

The peak-to-peak jitter measured over the last seconds when testing JTF, expressed in
UIpp.

Rms Jitter (UI)

Root mean squared jitter, or the value of one standard deviation of the normal distribution
expressed in UI.

User Band Jitter - Peak (UI)

The negative peak jitter measured in the user-band over the last second, expressed in UI.

User Band Jitter (UIpp)

The peak-to-peak jitter, measured in the user-band over the last test second, expressed in
UIpp.

User Band Jitter + Peak (UI)

The positive peak jitter measured in the user-band over the last second, expressed in UI.

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Table 56 Jitter test results in the Interface result group (Continued)

Test Result

Description

User Band Jitter Phase Hits

Count of the total number of phase hits detected in the user-band since the last test start or
restart.

User Band Max Jitter - Peak

(UI)

The maximum negative peak jitter measured in the user-band since starting or restarting
the test, expressed in UI.

User Band Max Jitter (UIpp)

The maximum peak-to-peak jitter measured in the user-band since starting or restarting the
test, expressed in UIpp.

User Band Max Jitter +

Peak (UI)

The maximum positive peak jitter measured in the user-band since starting or restarting the
test, expressed in UI.

WB % Mask

Percentage indicating how close the current level of jitter detected in the wide-band is to
exceeding the limit of tolerable jitter specified in ANSI and ITU-T specifications for the line
rate.
For example, if the current level of jitter measured in the wide-band is 80% of that specified
as the tolerable level, 80 % appears.

WB Jitter - Peak (UI)

The negative peak jitter measured in the wide-band over the last second, expressed in UI.

WB Jitter (UIpp)

The peak-to-peak jitter measured in the wide-band over the last second, expressed in UIpp.

WB Jitter + Peak (UI)

The positive peak jitter measured in the wide-band over the last second, expressed in UI.

WB Jitter Phase Hits

Count of the total number of phase hits detected in the wide-band since starting or restarting the test.

WB Max % Mask

The maximum value of the WB % Mask percentage detected since starting or restarting the
test.
For example, if the maximum level of jitter measured in the wide-band was 95% of that
specified as the tolerable level, 95 % appears.

WB Max Jitter - Peak (UI)

The maximum negative peak jitter measured in the wide-band since starting or restarting
the test, expressed in UI.

WB Max Jitter (UIpp)

The maximum peak-to-peak jitter measured in the wide-band since starting or restarting the
test, expressed in UIpp.

WB Max Jitter + Peak (UI)

The maximum positive peak jitter measured in the wide-band since starting or restarting the
test, expressed in UI.

Graphical and Tabular jitter

results

When testing jitter, you can view results in a graphical or tabular format by
selecting the corresponding result categories in the Interface group.
A sample Jitter Graph result is provided in Figure 35.

Figure 35 Jitter Graph result

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Wander results

Jitter Graph

MTJ Graph and Table

JTF Graph

The jitter graph is available when manually testing jitter, and when measuring
MTJ and Fast MTJ.

The MTJ graph and table are available when measuring MTJ and Fast MTJ.

The JTF graph is available when measuring JTF.

Wander results
When configured for wander tests on a T-Carrier, PDH, SONET, SDH, or OTN
interface, the Transport Module provides wander results in the Interface result
group. Table 57 lists and describes each of the test results available in the
Wander result category.

Table 57 Wander test results

Test Result

Description

TIE

The aggregate variation in time delay of the received signal with respect to the reference since the
last test start or restart.

Max. TIE

The maximum aggregated Time Interval Error measured since the last test start or restart.

Min. TIE

The minimum aggregated Time interval error measured since the last test start or restart.

In addition, the Wander Analysis provides the following results:

MTIE Maximum Time Interval Error. Per ITU-T O.172, MTIE is a
measure of wander that characterizes frequency offsets and phase transients. It is a function of parameter called the Observation Interval.
MTIE( ) can be said to be the largest peak-to-peak TIE in any observation
interval of length .
TDEV Time Deviation. Per ITU-T O.172, TDEV is a measure of wander
that characterizes its spectral content. It is also a function of parameter
(the Observation Interval). TDEV( ) can be said to be the RMS of filtered
TIE, where a band-pass filter is centered on a frequency of 0.42/ .
For detailed information about MTIE and TDEV analysis, see Wander
measurements on page 252.

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1PPS Analysis Results

When testing wander, you can view results in a graphical format by selecting
the Wander Graph result categories in the Interface group (see Figure 36).

Figure 36 Wander Graph result

1PPS Analysis Results

Test results from the 1pps Analysis indicate the offset between the reference
1PPS signal received from the GPS and the test units 1PPS signal. The variation in the period of the received 1pps GPS signal over long time periods of
many hours to several days, is often recorded.
The status of the Reference and Input clocks signals is reported in both the
LED panel and the Summary window. The LED panel shows current and past
status. The current status is indicated by an LED (GREEN) in the right column
and the past status by an LED (RED) in the right column. The Summary Status
window indicates whether the Input and Reference clocks are being presented
with a valid signal.
The 1PPS Analysis Summary results show the Status parameters, an Event
Log, a Histogram or a display of the current time on the unit.
The 1PPS minimum pulse width that can be detected is 20uS.

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The 1PPS Analysis results are shown in Table 58.

Table 58

1PPS Analysis results

Parameter
Measured

Result

Description

Offset (ns)

Offset between reference and units 1PPS

signal

Current
Minimum
Maximum

MTIE (s)

Maximum Peak-to-Peak Time Interval

Error (MTIE)

Maximum

TIE (s)

Time Interval Error

Current
Minimum
Maximum

A TIE graph is also able to be displayed that shows the current time interval
error.

NextGen results
Test results associated with the SONET or SDH interface, VCAT (analyzed
VCGs and their members), LCAS, and GFP traffic are available when testing
NextGen networks. Layer 2 and layer 3 Ethernet results are also available.
Results discussed in this section include the following:
NextGen LEDs on page 210
VCAT results on page 211
LCAS results on page 212
GFP results on page 213
In addition to the NextGen results, classic SONET and SDH results are available when running NextGen BERT and GFP applications, and layer 2 and
layer 3 Ethernet results are available when running NextGen GFP applications. For descriptions of these results refer to:
SONET/SDH results on page 187
Layer 2 and layer 3 test results are described in the Ethernet testing
manual that shipped with your instrument or upgrade.

Common NextGen results

OOM1, OOM2, LOM, and LOM2 results are derived per ITU-T recommendation G.783. Explanations of each of the results are provided in Table 59.

Table 59 ITU-T G.783 NextGen results

Result

HO mapping VC-4 / VC-3 or HO mapping STS3-c / STS-1-Xv

LO mapping VC-3

HP-OOM1 or
LP-OOM1

Indicates an error occurred in the MFI1 (multiframe indicator) located in bits 5, 6, 7, or 8 of the
H4 byte.

LO mapping VC-11 / VC-12 or VT1.5-Xv

HP-OOM1 Indicates an error occurred in the
multi-frame counter (0, 1, 2, 3) of the H4 byte.
LP-OOM1 indicates an error occurred in the
extended overhead multi-frame located in bit 1 of
the K4 byte.

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Table 59 ITU-T G.783 NextGen results (Continued)

HO mapping VC-4 / VC-3 or HO mapping STS3-c / STS-1-Xv
LO mapping VC-3

LO mapping VC-11 / VC-12 or VT1.5-Xv

OOM2

Indicates an error occurred in the MFI2 located in

the first multi-frame numbers 0 or 1, in bits 1, 2, 3,
or 4 of the H4 byte.

Indicates an error occurred in the virtual concatenation frame counter multi-frame located in bit 2
of the K4 byte.

LOM

N/A

Declared if HP-OOM1 occurs, and the frame

realignment process is not recovered in 8 VC-3 /
VC-4 frames.

LOM2

Declared if HP-OOM1 or OOM2, or LP-OOM1 or

OOM2 occurs, and the H4 two-stage frame
realignment process is not recovered in 40 to 80
VC-3/VC-4 frames.

Declared if LP-OOM1 or OOM2 occurs, and the

K4 (bit 1 and 2) two-stage frame realignment process is not recovered in 200 to 400 VC-12
frames.

Result

NextGen LEDs

In addition to the VCAT and GFP LEDs, classic SONET and SDH LEDs are
available when running NextGEn BERT and GFP applications, and layer 2 and
layer 3 LEDs are available when running GFP applications.
For descriptions of these LEDs, refer to:
SONET and SDH LEDs (TestPad mode) on page 188
on page 189
Layer 2 and layer 3 LEDs are described in the Ethernet testing manual that
shipped with your instrument or upgrade.

VCAT LEDs

Table 60 describes each of the VCAT LEDs

Table 60 VCAT LEDs

LCAS LEDs

LED

Description

LOA-GP

Illuminates Red if a low order alarm (LOA) was detected for the
group since the last test start or restart.

OOM2-GP

Illuminates Red if an out of multi-framing error (OOA) was

detected for the group since the last test start or restart.

SQM-GP

Illuminates Red if a sequence mismatch indicator (SQM) was

detected since the last test start or restart.

Table 61 describes each of the LCAS LEDs

Table 61 LCAS LEDs

210

LED

Description

LOC Source
LOC Sink

Illuminates Red if a LOC was detected for the source or sink

group since the last test start or restart.

PLTC Source
PLTC Sink

Illuminates Red if a PLTC was detected for the source or sink

group since the last test start or restart. When you enable LCAS
on your instrument, you can specify the source and sink PLTC
thresholds (see Enabling LCAS on page 142).

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Table 61 LCAS LEDs (Continued)

GFP LEDs

LED

Description

TLTC Source
TLTC Sink

Illuminates Red if a TLTC was detected for the source or sink

group since the last test start or restart.

Non-LCAS
Sink

Illuminates Red if the sink device does not support LCAS (or
LCAS is not enabled).

Table 62 describes each of the GFP LEDs.

Table 62 GFP LEDs

VCAT results

LED

Description

LOF Alarm

Illuminates Red if a loss of frame (LOF) alarm was detected for

the group since the last test start or restart.

CSF Alarm

Illuminates Red if a client signal fail (CSF) alarm was detected

for the group since the last test start or restart.

Payload FCS

Illuminates Red if a payload FCS error was detected for the

group since the last test start or restart.

LFD Alarm

Illuminates Red if an LFD alarm was detected since the last test
start or restart.

Pattern Loss

Illuminates Red if pattern loss was detected since the last test
start or restart.

LPAC

Illuminates Red if LPAC was detected since the last test start or
restart.

The VCAT results (in the VCAT result group) are provided for each member in
an analyzed VCG. At the top of the result pane, LEDs indicate whether or not
HP OOM1, LP OOM1, OOM 2, LOM2, SQM, or LOA errors or alarms occurred
for the group since the last restart. Additional LEDs indicate whether errors or
alarms occurred for each member in the group.
You can also observe detailed test results for each VCG and VCG member
using the VCG Analysis soft key. For details, see Analyzing a VCG on
page 139.
Table 63 lists each of the VCAT results provided under the SONET or SDH
result group.

Table 63 VCAT results

Result

Description

SEQ

Displays the sequence number for each analyzed member.

N KLM

Displays the KLM mapping number for the analyzed member.

LOA

Illuminates Red if a low order alarm (LOA) was detected for the
member since the last test start or restart.

HP-OOM1

Illuminates Red if a high path out of multi-framing error (OOA)

was detected for the member since the last test start or restart.

LP-OOM1

Illuminates Red if a low path out of multi-framing error (OOA)

was detected for the member since the last test start or restart.

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Table 63 VCAT results (Continued)

Result

Description

OOM2

Illuminates Red if an out of multi-framing error (OOA) was

detected for the member since the last test start or restart.

SQM

Illuminates Red if a sequence mismatch indicator (SQM) was

detected for the member since the last test start or restart.

LCAS results

If LCAS is enabled, test results associated with LCAS controlled VCG groups
and members appear in the LCAS group, in the Member Status (Sink),
Member Status (Source), Errors, and Group categories.

Member Status

Information for each member is provided in the Member Status (Source) and
Member Status (Sink) result categories (see Table 64).

Table 64 Member Status (Source and Sink) results

Result

Source

Sink

Description

N KLM

Displays the KLM mapping number for the

analyzed member.

Seq

Displays the sequence number for the analyzed member.

Illuminates red if a SSF (service signal failure)

is detected for the analyzed member

Invalid
State

Displays the LCAS MST status for each member (Ok, or Fail).

Control

Displays the last command received for each

analyzed member. Values include the following:
FIXED, IDLE, ADD, NORM, EOS or DNU

Rec MST

Tx MST

Errors

Displays the received member status for the

analyzed member.

Displays the transmit member status for the

analyzed member.

In addition to the N KLM, Seq, and Invalid results, the Error result category
provides a count of received control packets and CRC error statistics for the
received members (see Table 65).

Table 65 Error results

212

Result

Description

N KLM

Displays the KLM mapping number for the analyzed member.

Seq

Displays the sequence number for the analyzed member.

Invalid

Illuminates red if a SSF (service signal failure) is detected for the

analyzed member

Rx Control
Packets

Displays a count of the control packets received for each analyzed member.

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Table 65 Error results (Continued)

Group

Result

Description

CRC-8
Errors

Count of the number of CRC-8 errors detected for the analyzed

member since the last test start or restart.

CRC-8 Error
Seconds

Count of the number of seconds CRC-8 errors were detected

since the last test start or restart.

CRC-8 Error
Ratio

The ratio of frames with CRC-8 errors to the total number of

frames received since the last test start or restart.

Statistics for all members in a group are provided in the Group result category
(see Table 66).

Table 66 Group results

Result

Source

Sink

Description

Non-LCAS Alarm Seconds

Count of the number of seconds in which LCAS packets do not

appear even though LCAS is enabled on the instrument.

FOP-CRC Seconds

Count of the number of seconds during which an FOP-CRC occurred

since the last test start or restart.

LOC Seconds

Count of the number of seconds during which an LOC occurred since

the last test start or restart.

PLTC Seconds

Count of the number of seconds during which a PLTC occurred since

the last test start or restart.

TLTC Seconds

Count of the number of seconds during which a TLTC occurred since

the last test start or restart.

Count of resequence acknowledgements transmitted by the sink

group analyzed.

Tx Resequence Ack

Rx Resequence Ack

Count of resequence acknowledgements received by the source

group analyzed.

GFP results

Test results associated with GFP encapsulated traffic appear in the GFP result
group, in the Error Stats, Rx Traffic, and Tx Traffic categories.

Error Stats

Statistics and counts of errored GFP traffic appear in the Error Stats category
(see Table 67).

Table 67 GFP Error Stats results

Sub-category

Result

Description

Payload

FCS Errors

Count of the number of payload FCS errors detected since the last test
start or restart.

FCS Error Seconds

Count of the number of seconds payload FCS errors were detected

since the last test start or restart.

FCS Error Ratio

The ratio of frames with payload FCS errors to the total number of GFP
frames received since the last test start or restart.

FCS Error Rate

The rate of frames with payload FCS errors since the last test start or
restart expressed in frames per second.

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Table 67 GFP Error Stats results (Continued)

Sub-category

Result

Description

Core Header
Type Header
Extension Header

Single Bit Errors

Count of GFP frames with a single bit error in the corresponding header
section (Core, Type, or Extension).

Single Bit Error Seconds

Count of the seconds during which GFP frames were received with a
single bit error in the header since the last test start or restart.

Single Bit Error Ratio

Ratio of GFP frames with single bit errors in the header to the total number of frames received since the last test start or restart.

Single Bit Error Rate

The rate of GFP frames with single bit errors in the header since the last
test start or restart expressed in frames per second.

Multi Bit Errors

Count of GFP frames with multiple bit errors in the corresponding

header section (Core, Type, or Extension).

Multi Bit Error Seconds

Count of the seconds during which GFP frames were received with a
multiple bit errors in the header since the last test start or restart.

Multi Bit Error Ratio

Ratio of GFP frames with multiple bit errors in the header to the total
number of frames received since the last test start or restart.

Multi Bit Error Rate

The rate of GFP frames with multiple bit errors in the header since the
last test start or restart expressed in frames per second.

Rx Traffic

Statistics and counts of GFP frames appear in the Rx Traffic category (see
Table 68).

Table 68 GFP Traffic results

214

Result

Description

CID
Mismatches

Count of the number of GFP frames with channel identifiers

that do not match the CID specified in the receive filter since
the last test start or restart.

Client Data
Frame Rate
(fps)

Rate calculated by dividing the number of client data frames

frames received by the total number of frames received during
the last test second. Expressed in frames per second (fps).

Client Data
Frame Ratio

The ratio of client data frames to the total frames received

since initial frame synchronization.

Client Data
Frames

Count of client data frames received since the last test start or
restart.

Client Mgmt
Frame Rate
(fps)

Rate calculated by dividing the number of client management

frames received by the total number of frames received during
the last test second. Expressed in frames per second (fps).

Client Mgmt
Frame Ratio

The ratio of client management frames to the total frames

received since initial frame synchronization.

Client Mgmt
Frames

Count of client management frames received since the last

test start or restart.

Discarded
Frames

Count of GFP frames received that are discarded due to chore

header errors, type header errors, or extension header errors
since the last test start or restart.

Idle Frame Rate

(fps)

Rate calculated by dividing the number of idle frames received

by the total number of frames received during the last test second. Expressed in frames per second (fps).

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Table 68 GFP Traffic results (Continued)

Tx Traffic

Result

Description

Idle Frame
Ratio

Ratio of idle frames to the total number of frames received

since the last test start or restart.

Idle Frames

Count of idle frames received since the last test start or

restart.

Invalid Frames

Count of the number of invalid frames received since the last

test start or restart.

Total Frames

Count of the total number of frames received since the last

test start or restart.

Total Rx Bandwidth (bps)

The current bandwidth utilized by the received traffic

expressed in bps. This measurement is an average taken over
the prior second of test time.

Total Rx Util %

The current bandwidth utilized by the received traffic

expressed as a percentage of the line rate of available bandwidth. This measurement is an average taken over the prior
second of test time.

UPI Mismatches

Count of the number of GFP frames with user payload indicator that do not match the UPI specified in the receive filter
since the last test start or restart.

Statistics and counts of transmitted GFP frames appear in the Tx Traffic category (see Table 69).

Table 69 Tx Results results

Result

Description

Total Tx Bandwidth (bps)

The current bandwidth utilized by transmitted traffic expressed

in bps. This measurement is an average taken over the prior
second of test time.

Total Tx Util %

The current bandwidth utilized by transmitted traffic expressed

as a percentage of the line rate of available bandwidth. This
measurement is an average taken over the prior second of test
time.

Transmit Octet
Count

Count of the number of bytes transmitted since the last test start
or restart excluding idle frames.

Tx Errored
Frame Count

Count of the total number of errored frames transmitted since

the last test start or restart.

Tx Errored
Frame Count

Count of the total number of errored frames transmitted since

the last test start or restart.

Tx Errored
Frame Rate

Rate of errored frames transmitted since the last test start or

restart. Expressed in frames per second (fps).

Tx Frame
Count

Count of the total number of frames transmitted since the last

test start or restart.

Tx Idle Frame
Count

Count of idle frames transmitted since the last test start or

restart.

Tx Idle Frame
Rate

Rate of idle frames transmitted since the last test start or restart.
Expressed in frames per second (fps).

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OTN results

OTN results
Test results associated with the test interface, FEC, and framing are available
when testing OTN networks. Categories discussed in this section include the
following:
OTN LEDs (TestPad mode) on page 216
OTN LEDs (ANT mode) on page 219
Interface test results on page 220
FEC test results on page 221
Framing test results on page 222
OTL Stats results on page 223
OTL Per Lane results on page 224
OTU test results on page 225
ODU test results on page 226
FTFL test results on page 227
FTFL test results on page 227
TCM1 - TCM 6 test results on page 227
OPU results on page 228
GMP results on page 228
GFP-T results on page 230
GFP results on page 231
Payload BERT results on page 233

NOTE:
When you configure your unit to transmit a SONET or SDH client signal
over an OTN circuit, streamlined SONET and SDH test results are also
available. For details, refer to SONET/SDH results on page 187.

OTN LEDs (TestPad mode)

Table 70 describes each of the OTN LEDs in TestPad mode when you
configure your unit to transmit a SONET or SDH payload in an OTN (OTU1 or
OTU2) wrapper. SONET or SDH LEDs (such as the Path Ptr Present or AU Ptr
Present LED) also appear in the SONET or SDH LED group (see SONET and
SDH LEDs (TestPad mode) on page 188).
If the instrument loses an LED event, the green Status LED extinguishes, and
the red Alarm LED in the history column illuminates indicating an error condition has occurred.

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If an error occurs at a higher level, LEDs at lower levels do not indicate alarms.
For example, if there is no signal present (indicated by a red Signal Present
LED), the Frame Sync and Pattern Sync LEDs do not indicate that there is an
alarm because you can not attain frame or pattern synchronization without a
signal.

Table 70 OTN/SONET and SDH LEDs (TestPad Mode)

SONET LED

SDH LED

Description

Signal Present

Green
A signal is present.
Red
No signal is present.

Frame Sync

Green
Synchronization is established with
framing of signal.
Red
Frame synchronization has not been
established.

Pattern Sync

Green
Synchronization is established with
BERT pattern.
Red
Synchronization with the received
BERT pattern has not been established.

Table 71 describes each of the OTN LEDs in TestPad mode when you
configure your unit to transmit a SONET or SDH STL payload in an OTU3
wrapper. SONET or SDH LEDs (such as the Path Ptr Present or AU Ptr
Present LED) also appear in the SONET or SDH LED group (see SONET and
SDH LEDs (TestPad mode) on page 188).
If the instrument loses an LED event, the green Status LED extinguishes, and
the red Alarm LED in the history column illuminates indicating an error condition has occurred.
If an error occurs at a higher level, LEDs at lower levels do not indicate alarms.
For example, if there is no signal present (indicated by a red Signal Present
LED), the Frame Sync and Pattern Sync LEDs do not indicate that there is an
alarm because you can not attain frame or pattern synchronization without a
signal.

Table 71 OTN/SONET and SDH STL LEDs (TestPad Mode)

SONET LED

SDH LED

Description

Signal Present

Green
A signal is present.
Red
No signal is present.

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Table 71 OTN/SONET and SDH STL LEDs (TestPad Mode)

SONET LED

SDH LED

Description

OTL Frame Sync

OTL Frame
Sync

Green
Synchronization is established with
framing of signal.
Red
Frame synchronization has not been
established.

OTL Marker Lock

OTL Marker
Lock

Green
Synchronization is established with
Marker Lock signal.
Red
Synchronization has not been established with Marker Lock signal.

OTL Lanes
Aligned

Green
Synchronization has been established within acceptable parameters
between lanes.
Red
Synchronization has not been established within acceptable parameters
between lanes.

Table 72 describes each of the OTN LEDs in TestPad mode when you
configure your unit to transmit an OTU3 or OTU4 payload in an OTN wrapper.
Marker Lock and Frame Alignment are only
If the instrument loses an LED event, the green Status LED extinguishes, and
the red Alarm LED in the history column illuminates indicating an error condition has occurred.
If an error occurs at a higher level, LEDs at lower levels do not indicate alarms.
For example, if there is no signal present (indicated by extinguished Signal
Present LED), the Frame Sync LED does not indicate that there is an alarm
because you can not attain frame synchronization without a signal.

Table 72 OTN/OTU3 or OTU4 LEDs (Test Pad Mode)

218

OTU LED

Description

Signal Present

Green
A signal is present.
Red
A signal was present in the past but is no longer
present.

Frame Sync

Green
Synchronization is established with framing of signal.
Red
Frame synchronization was established in the past
but is no longer established.

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Table 72 OTN/OTU3 or OTU4 LEDs (Test Pad Mode) (Continued)

OTN LEDs (ANT mode)

OTU LED

Description

Marker Lock

Green
Synchronization is established with Marker Lock of
signal.
Red
Marker Lock synchronization was established in
the past but is no longer established.

Lanes Aligned

Green
Alignment of signals between lanes is currently
occurring.
Red
Lanes are no longer aligned.

Pattern Sync

Green
Synchronization is established with BERT pattern.
Red
Synchronization with the received BERT pattern
was established in the past but is no longer established.

Table 73 describes each of the SONET and SDH LEDs in ANT mode.If an error
occurs at a higher level, LEDs at lower levels do not indicate alarms. For
example, if there is no signal present (indicated by a red LOS LED), the LOF
and LSS LEDs do not indicate that there is an alarm because you can not
detect framing patterns or attain sequence synchronization without a signal.

Table 73 OTN/SONET and SDH LEDs (ANT mode)

LED

Description

LOS

Illuminates Red if no signal or an invalid signal is detected. Extinguishes when a valid signal is detected.

LOF

Illuminates Red if no framing pattern is detected. Extinguishes

when framing pattern is detected.

LSS

Illuminates Red if synchronization is not established with the

received BERT pattern. Extinguishes when pattern sync is established.

Table 74 describes each of the SONET and SDH OTL LEDs in ANT mode
when you configure your unit to transmit a SONET or SDH STL payload in an
OTU3 wrapper. If an error occurs at a higher level, LEDs at lower levels do not
indicate alarms. For example, if there is no signal present (indicated by a red
LOS LED), the OTL LOF and OTL LOL LEDs do not indicate that there is an
alarm because you can not detect framing patterns or attain lane synchronization without a signal.

Table 74 OTN/SONET and SDH OTL LEDs (ANT mode)

LED

Description

LOS

Illuminates Red if no signal or an invalid signal is detected. Extinguishes when a valid signal is detected.

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Table 74 OTN/SONET and SDH OTL LEDs (ANT mode) (Continued)

LED

Description

OTL LOF

Illuminates Red if OTL Loss of Frame is detected. Extinguishes

when OTL framing has been established.

OTL LOR

Illuminates Red if Loss of Recovery signal is detected. Extinguishes when Recovery has been regained.

OTL LOL

Illuminates Red if Loss of Lane Alignment is detected. Extinguishes

when lanes have achieved proper alignment.

Table 75 describes each of the OTN/OTU LEDs in ANT mode.If an error occurs
at a higher level, LEDs at lower levels do not indicate alarms. For example, if
there is no signal present (indicated by a red LOS LED), the LOF and LSS
LEDs do not indicate that there is an alarm because you can not detect framing
patterns or attain sequence synchronization without a signal.

Table 75 OTN/OTU LEDs (ANT Mode)

Interface test results

LED

Description

LOS

Illuminates Red if no signal or an invalid signal is detected. Extinguishes when a valid signal is detected.

LOF

Illuminates Red if no framing pattern is detected. Extinguishes

when framing pattern is detected.

LSS

Illuminates Red if synchronization is not established with the

received BERT pattern. Extinguishes when pattern sync is established.

LOML

Illuminates Red if no Marker Lock (any lane) is detected. Extinguishes when Marker Lock has been reestablished (OTU3 and
OTU4 only).

LOL

Illuminates Red if no Lane Alignment (any lane) is detected. Extinguishes when Lane Alignment has been reestablished (OTU3 and
OTU4 only).

Table 76 lists and describes each of the test results available in the OTN Interface result group.
Table 76

220

Interface test results

Test Result

Description

(CFP) Optical Rx Overload

Displays ON if the received optical power level is

greater than the receiver shutdown specification as
stated in the specifications appendix of the Getting
Started guide that shipped with your instrument, or as
stated in the vendor specifications for the SFP, XFP,
QSFP+ or CFP you have inserted.

Invalid Rx Signal Seconds

Count of the number of seconds during which an

invalid signal was received since the last test start or
restart.

Link Loss Seconds

Count of the number of seconds during which the link

was not detected since initial frame synchronization.

Local Fault Seconds

Count of the number of seconds during which a Local

Fault was detected.

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Table 76

FEC test results

Interface test results (Continued)

Test Result

Description

Optical Rx Level (dBm)

Displays the receive level (average power for all

lasers) for optical signals in dBm. For some optics,
the Interface Lambda results detail the received
value for each laser.

Reference Frequency

Displays the external timing for the received signal.

Remote Fault Seconds

Count of the number of seconds during which a

Remote Fault was detected since initial signal detection.

Round Trip Delay (ms)

The round trip delay for the last delay pattern sent
and successfully received by the instrument. Calculated in milliseconds. Your unit must be configured to
transmit a SONET or SDH payload carrying a Delay
pattern to observe this result.

Rx Freq Max Deviation

(ppm)

Maximum received frequency deviation, expressed in

ppm.

Rx Frequency (Hz)

Frequency of the clock recovered from the received

signal, expressed in Hz.

Rx Frequency Deviation
(ppm)

Current received frequency deviation, from nominal,

expressed in ppm.

Signal Loss Seconds

Number of seconds during which the signal was not

detected since the last test start or restart.

Signal Losses

The number of times the signal has not been

detected since the last test start or restart.

Sync Loss Seconds

Number of seconds during which synchronization

was not achieved since the last test start or restart.

Tx Clock Source

Displays the timing source (INTERNAL, RECOVERED, or BITS).

Tx Freq Max Deviation

(ppm)

Maximum transmitted frequency deviation,

expressed in ppm.

Tx Frequency (Hz)

Current transmitter clock frequency, expressed in Hz.

Tx Frequency Deviation
(ppm)

Current transmitted frequency deviation, expressed

in ppm.

Table 77 lists and describes each of the test results available in the OTN FEC
result category. If you set up your instrument to ignore FEC errors, these
results are not available.
Table 77

FEC test results

Test Result

Description

Uncorrected Word Errors

Count of uncorrectable word errors received since

initial frame synchronization.

Uncorrected Word Error

Rate

The current ratio of uncorrectable word errors, to the

total bits received since initial frame synchronization.

Corrected Word Errors1

Correctable Word Errors

Count of corrected or correctable word errors

received since initial frame synchronization.

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Table 77

FEC test results (Continued)

Test Result

Description

Corrected Word Error

Rate
Correctable Word Error
Rate

The current ratio of corrected or correctable word

errors to the total bits received since initial frame synchronization.

Corrected Bit Errors

Correctable Bit Errors

Count of corrected or correctable bit errors received

since initial frame synchronization.

Corrected Bit Error Rate

Correctable Bit Error
Rate

The current ratio of corrected or correctable bit errors

to the total bits received since initial frame synchronization.

1. Corrected results appear if your unit is configured to fix FEC errors; Correctable results
appear if it is configured to find, but not fix received FEC errors.

Framing test results

Table 78 lists and describes each of the test results available in the OTN
Framing result category.
Table 78

222

Framing test results

Test Result

Description

FAS Error Rate

The ratio of FAS errors to the total number of frames

received since initial frame synchronization.

FAS Error Seconds

A count of the number of seconds during which FAS

errors occurred, since initial frame synchronization.

FAS Errors

A count of FAS errors since initial frame synchronization.

Frame Sync Loss Seconds

Count of the number of seconds during which one or

more frame synchronization losses occurred or during which frame synchronization could not be
achieved, since initial frame synchronization.

Frame Sync Losses

A count of discrete losses of frame synchronization

since initial frame synchronization.

LOF

A count of LOFs since initial frame synchronization.

LOF Seconds

Count of the number of seconds during which one or

more LOFs occurred, since initial frame synchronization.

MFAS Error Rate

The ratio of MFAS errors to the total number of

frames received since initial frame synchronization.

MFAS Errors

A count of MFAS errors since initial frame synchronization.

Multiframe Sync Loss

Seconds

Count of the number of seconds during which one or

more MFAS synchronization losses occurred or during which MFAS synchronization could not be
achieved, since initial frame synchronization.

OOF Seconds

Count of asynchronous test seconds in which an

OOF was detected since initial frame synchronization. OOF is declared if the unit fails to find an FAS
sub-pattern for five consecutive frames.

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Table 78

OTL Stats results

Framing test results (Continued)

Test Result

Description

OOM Seconds

Count of asynchronous test seconds in which an

OOM was detected since initial frame synchronization. OOM is declared if the received MFAS is out of
sequence for five consecutive frames.

Table 79 lists and describes each of the test results available in the OTL Stats
result category.

Table 79 OTL Stats Results

Test Result

Description

Current Maximum Skew

(bits)

A count of the Maximum skew (measured in bits)

detected between any two lanes since marker lock
during the current period.

Current Maximum Skew

(ns)

A count of the Maximum skew (measured in ns)

detected between any two lanes since marker lock
during the current period.

FAS Error Rate

The ratio of FAS errors to the total number of frames

(across all lanes) received since initial frame synchronization.

FAS Error Seconds

A count of the number of seconds during which FAS

errors occurred (across all lanes) since initial frame
synchronization.

FAS Errors

A count of FAS errors (across all lanes) since initial

frame synchronization.

Frame Sync Loss Seconds

Count of the number of seconds during which one or

more frame synchronization losses occurred or during which frame synchronization could not be
achieved, since initial frame synchronization.

Lanes Aligned Loss Seconds (Test Pad mode)

A count of the number of seconds during which

LOML, or other factors indicating improper lane alignment, was detected.

Logical Lane Marker

(LLM) Error Rate

The ratio of LLM errors to the total number of lane

markers received since initial Marker Lock.

Logical Lane Marker

(LLM) Error Seconds

A count of the number of seconds during which LLM

errors occurred, since initial Marker Lock.

Logical Lane Marker

(LLM) Errors

Count of the number of Logical Lane Marker errors

(all lanes combined)

Loss of Frame (LOF)

Seconds

Count of the number of seconds during which one or

more LOFs occurred, since initial frame synchronization.

Loss of Lane (LOL)

Alignment Seconds
(ANT Mode)

A count of the number of seconds during which

LOML, or other factors indicating improper lane alignment, was detected.

Loss of Marker Lock

(LOML) Seconds (ANT
Mode)

Count of the number of seconds during which one or

more Marker Lock losses occurred, since signal
presence was detected.

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Table 79 OTL Stats Results (Continued)

OTL Per Lane results

Test Result

Description

Marker Lock (ML) Loss

Seconds (Test Pad
mode)

Count of the number of seconds during which one or

more Marker Lock losses occurred, since signal
presence was detected.

Maximum Skew (bits)

A count of the Maximum skew (measured in bits)

detected between any two lanes since marker lock
during the test.

Maximum Skew (ns)

A count of the Maximum skew (measured in ns)

detected between any two lanes since marker lock
during the test.

MFAS Error Rate

The ratio of MFAS errors to the total number of

frames received since initial frame synchronization.

MFAS Error Seconds

A count of the number of seconds during which

MFAS errors occurred since initial frame synchronization.

MFAS Errors

A count of MFAS errors since initial frame synchronization.

Out of Frame (OOF)

Seconds (ANT Mode)

Count of asynchronous test seconds in which an

OOF was detected since initial frame synchronization. OOF is declared if the unit fails to find an FAS
sub-pattern for five consecutive frames.

Table 80 lists and describes each of the test results shown in the OTL Per Lane
display when performing OTL testing.

Table 80 OTL Per Lane results

224

STL Stat Result

Description

Max Skew LL ID

Shows Logical Lane ID for logical lane having the

greatest skew.

Min Skew LL ID

Shows Logical Lane ID for logical lane having the least

skew.

Max Skew (ns)

Shows skew value in nsecs for logical lane having the

greatest skew.

Max Skew (bits)

Shows skew value in bits for logical lane having the

greatest skew.

Lane #

Shows the Logical Lanes in the signal; 43G- #0 - #3,

112G- #0 - #19.

Logical Lane ID

Shows Lane ID for each logical lane.

Skew (bits)

Shows skew value in bits for each logical lane.

Skew (ns)

Shows skew value in nsecs for each logical lane.

Frame Sync

Display of sync status for each logical lane.(TestPad)

OTL LOF

Display of LOF status for each logical lane.(ANT)

OTL OOF

Display of OTL OOF status for each logical lane.

OOMFAS

Display of OOMFAS status for each logical lane.

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Table 80 OTL Per Lane results (Continued)

STL Stat Result

Description

Marker Lock

Display of marker lock status for each logical

lane.(TestPad)

OTL LOR

Display of LOR status for each logical lane. (ANT

mode)

OTL OOR

Display of OTL OOR status for each logical lane.

FAS

Count of FAS errors for each logical lane since the start
of the test.

MFAS

Count of MFAS errors for each logical lane since the

start of the test.

OOLLM (112G)

Display of OOLLM status for each logical lane.

Logical Lane Marker

Errors (112G)

Count of LLM errors for each logical lane since the start
of the test.

Figure 37 OTL Per Lane Result Table

OTU test results

Table 81 lists and describes each of the test results available in the OTN OTU
result category.
Table 81

OTU test results

Test Result

Description

OTU-AIS Seconds

Count of asynchronous test seconds in which

OTU-AIS was present for any portion of the test second since initial frame synchronization.

SM-IAE Seconds

Count of asynchronous test seconds in which

SM-IAE was present for any portion of the test second since initial frame synchronization.

SM-BIP Errors

Count of SM-BIP errors since initial frame synchronization.

SM-BIP Error Rate

The ratio of SM-BIP errors to the total number of bits

received since initial frame synchronization.

SM-BDI Seconds

Count of asynchronous test seconds in which

SM-BDI was present for any portion of the test second since initial frame synchronization.

SM-BIAE Seconds

Count of asynchronous test seconds in which

SM-BIAE was present for any portion of the test second since initial frame synchronization.

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Table 81

ODU test results

Test Result

Description

SM-BEI Errors

Count of SM-BEI errors since initial frame synchronization.

SM-BEI Error Rate

The ratio of SM-BEI errors to the total number of bits

received since initial frame synchronization.

SM-TIM Seconds

Count of asynchronous test seconds in which

SM-TIM was present for any portion of the test second since initial frame synchronization.

SM-SAPI

Displays the SM-SAPI identifier after multi-frame synchronization is gained.

SM-DAPI

Displays the SM-DAPI identifier after multi-frame

synchronization is gained.

SM-Operator Specific

Displays the operator specific identifier after multiframe synchronization is gained.

Table 82 lists and describes each of the test results available in the OTN ODU
result category.
Table 82

226

OTU test results (Continued)

ODU test results

Test Result

Description

ODU-AIS Seconds

Count of asynchronous test seconds in which

ODU-AIS was present for any portion of the test second since initial frame synchronization.

ODU-LCK Seconds

Count of asynchronous test seconds in which

ODU-LCK was present for any portion of the test second since initial frame synchronization.

ODU-OCI Seconds

Count of asynchronous test seconds in which

ODU-OCI was present for any portion of the test second since initial frame synchronization.

PM-BIP Errors

Count of PM-BIP errors since initial frame synchronization.

PM-BIP Error Rate

The ratio of PM-BIP errors to the total number of bits

received since initial frame synchronization.

PM-BDI Seconds

Count of asynchronous test seconds in which

PM-BDI was present for any portion of the test second since initial frame synchronization.

PM-BEI Errors

Count of PM-BEI errors since initial frame synchronization.

PM-BEI Error Rate

The ratio of PM-BEI errors to the total number of bits

received since initial frame synchronization.

PM-TIM Seconds

Count of asynchronous test seconds in which

PM-TIM was present for any portion of the test second since initial frame synchronization.

PM-SAPI

Displays the PM-SAPI identifier after multi-frame synchronization is gained.

PM-DAPI

Displays the PM-DAPI identifier after multi-frame

synchronization is gained.

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Table 82

FTFL test results

Test Result

Description

PM-Operator Specific

Displays the operator specific identifier after multiframe synchronization is gained.

Table 83 lists and describes each of the test results available in the OTN FTFL
result category.
Table 83

TCM1 - TCM 6 test results

ODU test results (Continued)

FTFL test results

Test Result

Description

Forward-Fault Type

Indicates whether there is no signal, the signal failed,

or the signal is degraded for the forward/downstream
signal. Appears after multi-frame synchronization is
gained.

Forward-SD Seconds

Count of asynchronous test seconds in which the forward/downstream signal was degraded after multiframe synchronization was gained

Forward-SF Seconds

Count of asynchronous test seconds in which the forward/downstream signal failed after multi-frame synchronization was gained.

Forward-Operator Identifier

Displays the received forward/downstream operator

identifier after multi-frame synchronization was
gained.

Forward-Operator Specific

Displays the forward/downstream operator identifier

after multi-frame synchronization was gained.

Backward-Fault Type

Indicates whether there is no signal, the signal failed,

or the signal is degraded for the backward/upstream
signal. Appears after multi-frame synchronization is
gained.

Backward-SF Seconds

Count of asynchronous test seconds in which the

backward/upstream signal failed after multi-frame
synchronization was gained.

Backward-SD Seconds

Count of asynchronous test seconds in which the

backward/upstream signal was degraded after multiframe synchronization was gained.

Backward-Operator Identifier

Displays the backward/upstream operator identifier

after multi-frame synchronization was gained.

Backward-Operator Specific

Displays the backward/upstream operator identifier

after multi-frame synchronization was gained.

Table 84 lists and describes each of the test results available in each of the
OTN TCM result categories.
Table 84

TCM test results

Test Result

Description

IAE Seconds

Count of asynchronous test seconds in which IAE

was present for any portion of the test second since
initial frame synchronization.

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Table 84

OPU results

Test Result

Description

BIP Errors

Count of BIP errors since initial frame synchronization.

BIP Error Rate

The ratio of BIP errors to the total number of bits

received since initial frame synchronization.

BDI Seconds

Count of asynchronous test seconds in which BDI

was present for any portion of the test second since
initial frame synchronization.

BIAE Seconds

Count of asynchronous test seconds in which BIAE

was present for any portion of the test second since
initial frame synchronization.

BEI Errors

Count of BEI errors since initial frame synchronization.

BEI Error Rate

The ratio of BEI errors to the total number of bits

received since initial frame synchronization.

TIM Seconds

Count of asynchronous test seconds in which TIM

was present for any portion of the test second since
initial frame synchronization.

SAPI

Displays the SAPI identifier after multi-frame synchronization is gained.

DAPI

Displays the DAPI identifier after multi-frame synchronization is gained.

Operator Specific

Displays the operator specific identifier after multiframe synchronization is gained.

Table 85 lists and describes each of the test results available in each of the
OTN OPU result category.
Table 85

GMP results

OPU test results

Test Result

Description

Payload Type Mismatch

Seconds

Count of asynchronous test seconds in which the

expected and received payload types do not match
after multi-frame synchronization was gained.

Payload Type

Displays the received payload type after multiframe

synchronization was gained.

Table 86 lists and describes each of the test results available in each of the
ODU GMP result category.
Table 86

228

TCM test results (Continued)

ODU-GMP test results

Test Result

Description

Sync Status

Displays the condition of the GMP sync signal.

OoS Status

Displays the condition of the OTM Overhead Signal.

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Table 86

ODU-GMP test results (Continued)

Test Result

Description

CM parameters

Displays the following parameters of the GMP CM

value Effective- GMP Effective value
Minimum- value of lowest CM value since the
start
Maximum- value of highest CM value since the
start
Unchanged- number of CM values since the start
which were unchanged from the previous value
+1- number of CM values since the start which
were incremented by one from the previous value
+2- number of CM values since the start which
were incremented by two from the previous value
-1- number of CM values since the start which
were decremented by one from the previous
value
-2- number of CM values since the start which
were decremented by two from the previous
value
New- number of CM values since the last test
start or restart that were previously not recorded

CM=0 Alarm

Displays the condition that CM=0 and received signal

may not be GMP mapped.

CRC-5 Errors

Displays the following parameters of CRC-5 Errors

Bit Errors- number of CRC-5 error bits detected
Bit Error Rate- ratio of CRC-5 error bits to total
bits

CRC-8 Errors

Displays the following CRC-8 Error results

Bit- Errors- number of CRC-8 error bits detected
Bit Error Rate- ratio of CRC-8 error bits to total
bits received

Table 87 lists and describes each of the test results available in the OTU4 GMP
result category.

Table 87 OTU4-GMP results

Test Result

Description

Sync Status

Displays the condition of the GMP sync signal.

Sync Loss Seconds

Count of the number of seconds in which a GMP

Loss of Sync was detected since the last test start or
restart.

OoS Status

Displays the condition of the OoS signal.

OoS Seconds

Count of the number of seconds in which an OoS

signal was detected since the last test start or
restart.

GMP Alarm (CM=0)

Displays the condition that CM=0 indicating received

signal may not be GMP mapped.

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Table 87 OTU4-GMP results (Continued)

Test Result

Description

CM value parameters

Displays the following parameters of the GMP CM Rx

Payload value Effective- GMP CM Server value.
Deviation- Payload rate deviation from nominal in
ppm since GMP sync was attained.
Minimum- lowest CM value of payload offset
since the last test start or restart.
Maximum- highest CM value of payload offset
payload offset since the last test start or restart.
Unchanged- number of CM values of payload offset which were unchanged since the last test start
or restart.
+1- number of CM values of payload offset since
the last test start or restart which were incremented by one from the previous value.
+2- number of CM values of payload offset since
the last test start or restart which were incremented by two from the previous value.
-1- number of CM values of payload offset since
the last test start or restart which were decremented by one from the previous value.
-2- number of CM values since the last test start
or restart which were decremented by two from
the previous value.
New- number of CM values since the last test
start or restart that were previously not recorded.

CRC-5 Errors

CRC-8 Errors

GFP-T results

Displays the following CRC-8 Error results

Bit- Errors- number of CRC-8 error bits detected
Bit Error Rate- ratio of CRC-8 error bits to total
bits received
Bit Error Seconds- Count of the number of seconds containing a CRC-8 Bit Error

Table 88 lists and describes each of the test results available in the GFP-T
result category.
Table 88

230

Bit Errors- number of CRC-5 error bits detected

Bit Error Rate- ratio of CRC-5 error bits to total
bits
Bit Error Seconds- Count of the number of seconds containing a CRC-5 Bit Error

GFP-T test results

Test Result

Description

CRC-16 Errors

Displays the following CRC-16 Error results

Correctable Errors- the number of correctable
errors occurring since the last test restart.
Uncorrectable Errors- the number of uncorrectable errors occurring since the last test restart.

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Table 88

GFP results

GFP-T test results (Continued)

Test Result

Description

10B_ERR

Display the following parameters of 10B_ERR errors Errors

Error Seconds
Error Ratio Error Rate

Rx Traffic

Displays the following parameters of the GFP-T Rx

Traffic.
Superblocks- number received since last restart
Superblocks Per Frame- number received

Table 89 lists and describes each of the test results available in the GFP result
category.
Table 89

GFP test results

Test Result

Description

Core Header

Displays the following Core Header error results

Single Bit Errors- the number of Single Bit errors
occurring since the last test restart.
Single Bit Error Seconds- how many seconds of
Single Bit errors have occurred since the last test
restart.
Single Bit Error Ratio- the ratio of Single Bit errors
occurring since the last test restart.
Single Bit Error Rate- the frequency of Single Bit
error occurrence
Multi-Bit Errors- the number of Multi-Bit errors
occurring since the last test restart.
Multi-Bit Error Seconds- how many seconds of
Multi-Bit errors have occurred since the last test
restart.
Multi-Bit Error Ratio- the ratio of Multi-Bit errors
occurring since the last test restart.
Multi-Bit Error Rate- the frequency of Multi-Bit
error occurrence

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Chapter 7 Test Results

OTN results

Table 89

232

GFP test results (Continued)

Test Result

Description

Type Header

Displays the following Type Header error results

Extension Header

Displays the following Extension Header error results

Single Bit Errors- the number of Single Bit errors
occurring since the last test restart.
Single Bit Error Seconds- how many seconds of
Single Bit errors have occurred since the last test
restart.
Single Bit Error Ratio- the ratio of frames containing Single Bit errors to error-free frames occurring
since the last test restart.
Single Bit Error Rate- the frequency of Single Bit
error occurrence
Multi-Bit Errors- the number of Multi-Bit errors
occurring since the last test restart.
Multi-Bit Error Seconds- how many seconds of
Multi-Bit errors have occurred since the last test
restart.
Multi-Bit Error Ratio- the ratio of Multi-Bit errors
occurring since the last test restart.
Multi-Bit Error Rate- the frequency of Multi-Bit
error occurrence

Payload FCS

Displays the following Extension Header error results

Single Bit Errors- the number of Payload FCS
errors occurring since the last test restart.
Single Bit Error Seconds- the number of seconds
since the last test restart during which one or
more Payload FCS errors have occurred.
Single Bit Error Ratio- the ratio of frames containing Payload FCS errors to the total number of
frames since the last test restart.
Single Bit Error Rate- the rate at which Payload
FCS errors are being detected.

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Chapter 7 Test Results

Graphical results

Payload BERT results

Table 90 lists and describes each of the test results available in the Payload
BERT result category.
Table 90

BERT test results

Test Result

Description

Bit/TSE Errors

Count of Pattern Bit Errors since initial pattern synchronization.

Bit/TSE Error Rate

Ratio of Pattern Bit Errors to total number of Pattern

bits since initial pattern synchronization.

Bit/TSE Error-Free Seconds

Count of number of seconds where no Pattern Bit

Errors occurred since initial pattern synchronization.

Bit/TSE Error-Free Seconds %

Ratio of number of seconds where no Pattern Bit

Errors occurred to total number of seconds since initial pattern synchronization.

LSS Seconds

Count of seconds during which OTL BERT pattern is

detected as missing.(ANT Mode)

LSS

Count of number of times OTL BERT pattern is

detected as missing.(ANT Mode)

Pattern Sync Loss Seconds

Number of seconds during which pattern synchronization was lost after initial pattern synchronization.(TestPad Mode)

Pattern Sync Losses

Count of the number of times synchronization is lost

after initial pattern synchronization.(TestPad Mode)

Graphical results
The Graphs result group provides test results such as Latency (RTD),
Throughput, Packet Jitter, and Errors graphically. When viewing results graphically, a legend is provided under the graph with colors indicating what each
color represents on the graph.
You can customize the graphs to suit your needs by doing the following:
To simplify the graph, you can select the legend, and then choose the data
that you want to observe, and hide the rest.
If you are running a multiple streams application, you can select the
legend, and then choose the data that you want to observe for each
analyzed stream and hide the rest.
Graphs require significant system resources; therefore, you can optionally
disable automatic graph generation if you intend to run other resource intense
applications.
To disable graph generation
1 On the Main screen, select Tools > Customize ....
The Customize User Interface Look and Feel screen appears.
2 Clear the Generate Graphs setting, and then select Close to return to the
Main screen.
The MSAM will not automatically generate graphs. You can select the
Generate Graphs setting at any time to resume automatic graph generation.

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Chapter 7 Test Results

Histogram results

Histogram results
The Histogram result category provides a display of test results in a bar graph
format. Histograms enable you to quickly identify spikes and patterns of errors
over a specific interval of time (seconds, minutes, or hours).
A sample histogram is provided in Figure 38.

Figure 38 Sample histogram

Results are updated once per second.
NOTE:
Histograms are best viewed using full-sized result window. See Changing
the result layout on page 5.

Event Log results

The event log result category provides a display listing any significant events,
errors or alarms that occur during the course of your test. The log displays the
value for each error or alarm, and provides the date and time that the error or
alarm occurred.
Events are updated once per second. For instructions on customizing your
event log display, see About the Event log on page 5.
NOTE:
Event logs are best viewed using full-sized result window. See Changing
the result layout on page 5.

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Chapter 7 Test Results

Time test results

The Time category provides the current date, time, and the time elapsed since
the last test start or restart. Table 91 describes each of the Time results.
Table 91

Time results

Result

Description

Current Date

Current day and month.

Current Time

Current time of day in hours, minutes, and seconds

(hh:mm:ss).

Test Elapsed Time

Amount of time in hours, minutes, and seconds

(hh:mm:ss) since the last test restart.

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Chapter 7 Test Results

Time test results

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Chapter 8

Troubleshooting

8
This chapter describes how to identify and correct issues encountered when
testing using the instrument. Topics discussed in this chapter include the
following:
About troubleshooting on page 238
Before testing on page 238
Basic testing on page 239
VF testing on page 240
Upgrades and options on page 240

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Chapter 8 Troubleshooting
About troubleshooting

About troubleshooting
If you experience problems when testing using your instrument, you may be
able to solve these problems on your own after referring to this section. If you
experience significant problems with the module, call the Technical Assistance
Center (see Technical assistance on page xviii).

Before testing
The following section addresses questions that may be asked about assembling the various components before testing.

The test application I need is not

available

Resolution

Can I hot-swap PIMs?

Resolution

How can I determine whether I need

to swap a PIM or swap SFP
transceivers?

I am receiving unexpected errors

when running optical applications

Resolution

238

Only the applications for currently inserted PIMs will appear on the Test menu.
For example, if an SFP and XFP PIM are inserted in the MSAM chassis, you
will not see DS1 applications. Other applications only appear if you purchased
the associated testing option.

Insert the appropriate PIM for the application.

No, PIMs are not hot-swappable.

You must turn the BERT module OFF before inserting or swapping PIMs.

Tables listing the line rates supported by each PIM are provided in the Getting
Started Manual that shipped with your instrument or upgrade. Details
concerning each of the JDSU recommended optics (transceivers) are available on the instrument itself (by selecting the corresponding option from the
Help menu). You can also observe details for the currently inserted SFP or XFP
on the Interface setup tab of the MSAM user interface.

SFP transceivers are designed for specific interfaces and line rates.

Verify that the SFP you inserted into the PIM is designed to support the interface you are connected to for testing. This information is provided on the Interface setup tab of the MSAM user interface.

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Chapter 8 Troubleshooting
Basic testing

Basic testing
The following section addresses questions that may be asked about
performing tests using the instrument.

Optical Overload Protection

message

When in optical mode, the instrument displays a warning that the Optical Overload Protection is activated, or the instrument does not detect a signal.

Resolution

Applied power must not exceed the power level specified in the vendor specifications provided for your SFP or XFP.

User interface is not launching

The BERT icon is highlighted in yellow, but the user interface is not launching.

Resolution

Inconsistent test results

Resolution

Press the Results or the Start/Stop key to display the user interface.

I am getting inconsistent test results.

Verify the following:

Verify that your test leads are good and are connected properly for the test
you are performing.
Verify that the correct timing source is selected on the Interface setup
screen.
Verify that the correct line interface is selected.
Verify that the correct mapping, tributaries, and analysis rates are
selected.

Result values are blank

Resolution

Unit on far end will not loop up

Resolution

Why are the result values blank?

Results are blank if gating criteria have not been met. Criteria examples
include Signal Present, Frame Sync Present, Pointer Present, and BERT
Pattern Sync Present.

The unit on the far end will not respond to a Loop Up command.

Verify that the application running on the far end is not configured to automatically transmit traffic when the laser is turned on. If so, it can not respond to a
Loop Up command. Turn the setting off.

A receiving instrument is showing

many bit errors

I am transmitting an ATP payload carrying a BERT pattern, and the receiving

instrument is showing a large number of bit errors.

Resolution

Verify that the receiving instrument is not using a Version 1 Transport Module.
You can determine this by checking the serial number for the module. If there
is no V2 or V3 prefix for the serial number, you are using a version 1 module.
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Chapter 8 Troubleshooting
VF testing

Even when running software version 8.x, version 1 Transport Modules will not
support ATP payloads carrying BERT patterns. Version 2 and Version 3 Transport Modules do support the payloads.

Which MSAM or application module

is selected?

When testing using an 8000 and two MSAMs (via a DMC), or an 8000 using
multiple application modules, which test is in the foreground, and which is
running in the background?

Resolution

On the Main screen, a button appears in the menu bar indicating which DMC
slot and port, or which 8000 application module and port is currently selected.

Voice frequency measurements are

not available

My instrument is configured for VF testing, and I selected the VF testing action

key. No results appear.

VF testing

Resolution

If any of the following DS1 or DS3 alarms are present, all VF measurements
will be disabled until the alarm condition ends: LOS, AIS, LOF, Yellow alarm,
Blue alarm.
When the line is error and alarm free, the instrument will clear the VF measurements and automatically restart the test.

Upgrades and options

The following section addresses questions that may be asked about upgrading
or installing test options for the instrument.

How do I upgrade my instrument?

How do I install test options?

Do software and test options move

with the MSAM or Transport
Module?

240

Upgrades are installed from a USB key. Instructions are provided with each
software upgrade.

Test options are enabled by entering a JDSU provided challenge code. Instructions are provided when you order test options.

Test options are available when you connect the MSAM or Transport Module
to a different base unit; however, the base unit software and BERT (MSAM/
Transport Module) software reside on the base unit.

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Appendix A

Principles of ISDN Testing

A
This appendix explains basic ISDN principles, and describes the messages
displayed when testing using the instrument.
Topics discussed in this appendix include the following:
About ISDN on page 242
Understanding LAPD messages on page 242
Understanding the Q.931 Cause Values on page 244
For step-by-step instructions on ISDN testing, refer to Chapter 2 T-Carrier
and PDH Testing. For descriptions of each of the available ISDN test results,
refer to Chapter 7 Test Results.

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Appendix A Principles of ISDN Testing

About ISDN

About ISDN
If your instrument is optioned and configured to do so, you can use it to install
and maintain ISDN PRI services over T1 interfaces. Using the instrument you
can place, receive, and analyze calls, test data services using BERT analysis,
test voice services using a microphone/speaker audio headset, and monitor
physical (layer 1), LAPD (layer 2), and Q.931 (layer 3) results.

Understanding LAPD messages

LAPD Unnumbered frame
messages

242

Table 92 lists each of the LAPD unnumbered frame decode messages.

Table 92

LAPD unnumbered frame decodes

Message

Sent to

DISC
(Disconnect)

Disconnect or terminate the D channel link. This message

should not be confused with the Q.931 DISCONNECT message which is used to disconnect a call.

DM
(Disconnect
Mode)

Indicate one of the following:

The link partner is not ready to establish a D channel link
with the device sending a SABME message.
The link partner cannot terminate the link (in response to
a DISC message), typically because communications
have already been disconnected.

FRMR
(Frame Reject)

Indicate that an unrecoverable link-level problem has

occurred. This message is transmitted when re-transmitting
a frame will not correct the problem, and indicates a potential
high level protocol issue between the link partners.

SABME
(Set
Asynchronous
Balanced Mode
with Extended
Sequence
Numbering)

Establish initial D channel communications.

An affirmative response from the link partner is a UA
message.
A negative response (indicating the link partner is not
ready to establish a link) is a DM message.

UA
(Unnumbered
Acknowledgement)

Acknowledge one of the following:

A SABME message from the device initiating D channel
communications.
A DISC message from the device terminating the
D channel link.

UI
(Unnumbered
Information)

Request an exchange of information between the link partners.

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Appendix A Principles of ISDN Testing

Understanding LAPD messages

LAPD Supervisory frame

messages

Q.931 messages

Table 93 lists each of the LAPD supervisory frame decode messages.

Table 93

LAPD supervisory frame decodes

Message

Sent to

REJ
(Reject)

Force re-transmission of bad frames. Frequent REJ frames

indicate miscommunication on the D channel, typically due
to errored frames during transmission.

RNR
(Receiver Not
Ready)

Indicate that a link partner is experiencing difficulty (such as

buffer depletion), and cannot accept any additional information frames (call related messages) at this time. RNR messages should occur rarely, and should be investigated
immediately when they occur.

RR
(Receiver Ready)

Keep the signal alive between the link partners, and

acknowledge receipt of frames. RR messages are the most
common messages observed in D channel decodes. When
there are no call-related messages to send, the link partners
transmit RR frames to make sure the link stays in service.
NOTE: When you are viewing a large number of decode
messages to troubleshoot call processing, you can typically
ignore the RR messages since they are simply used to keep
the D channel signal alive.

Table 94 lists common Q.931 decode messages.

Table 94

Q.931 decodes

Message

Sent to

ALERTING

Indicate that a SETUP message has been received by an ISDN

device or phone, and that the device or phone is in the process
of ringing.
NOTE: Some ISDN devices (for example, the HST-3000), do
not literally ring.

CALL
PROCEEDING

Indicate that a SETUP message has been received by a switch,

and that the switch is attempting to process the call.

CONNECT

Indicate that the call has been completed and that the calling
party is connected with the called party.

CONNECT ACK

Acknowledge that the CONNECT message has been received.

DISCONNECT

Disconnect the call. Can be sent from the calling device or the
called device.
NOTE: DISCONNECT messages report the cause for the disconnection.

RELEASE

Release the call in response to a

DISCONNECT message, or because a call cannot be connected.
NOTE: If a call cannot be connected, and as a result a
RELEASE message is issued in response to a SETUP request,
the RELEASE message will report the cause for the disconnection.

RELEASE
COMPLETE

Acknowledge that a RELEASE message has been received, and

disconnect the call.
NOTE: A call is not disconnected until the RELEASE COMPLETE
message is observed.

SETUP

Originate a call.

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Appendix A Principles of ISDN Testing

Understanding the Q.931 Cause Values

In addition to the messages listed in Table 94, additional messages concerning

the call (such as the operator system access used), and Q.931 cause values
indicating the reason a call is disconnected appear on the D Channel Decode
screen. For details, see Understanding the Q.931 Cause Values on
page 244.

Understanding the Q.931 Cause Values

Cause values indicating the reason a call is disconnected are displayed on the
D Chan Decode results screen and the Call Status result screen.
For each disconnected call, the D Channel Decode Results screen displays
the following cause information in either the DISCONNECT or RELEASE
message:
A location code, indicating where the disconnect originated (for example,
on a private network or a transit network).
A class code, indicating the type of disconnect (for example, due to a
protocol error).
The cause value issued by the ISDN Network. This value corresponds to a
Q.931 cause code (see the cause codes listed in Table 95 on page 244).
An abbreviated description indicating the reason the call was disconnected.
The Call Status screen simply provides the cause value and an abbreviated
description of the cause of the disconnect.
NOTE:
The cause codes listed in Table 95 on page 244 do not appear on the D
Channel Decode or Call Status result screens. The codes correspond to
those listed in the International Telecommunications Union (ITU) Q.931
standards.
Table 95 lists and explains the most commonly encountered cause codes for
ISDN PRI calls.
Table 95

Common Q.931 Cause Codes

Cause
Code

D Channel Decode
Description

Call 1/Call 2
Description

Typically
Indicates

Normal clearing

NORMAL CALL
CLEARING

No fault is detected; the call is finished.

No user responding

NO USER RESPONSE

The receiving equipment did not respond to the call

attempt within the allowed time.

Invalid number
format

INVALID NUMBER
FORMAT

The receiving equipment considers the number to be

incomplete or in an incorrect format.
For example, numbers sent as a subscriber plan are
expected to be 7 digits or less; numbers sent as national
dialing plans are expected to be more than 7 digits.

Normal
unspecified

NORMAL
UNSPECIFIED

Any number of unspecified conditions, but may indicate

the call is terminating into a fast busy (all trunks are
busy).

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Appendix A Principles of ISDN Testing

Understanding the Q.931 Cause Values

Table 95

Common Q.931 Cause Codes (Continued)

Cause
Code

D Channel Decode
Description

Call 1/Call 2
Description

Typically
Indicates

Bearer
capability not
authorized

BEARCAP NOT
AUTHORIZED

The calling party has requested a call type or service that

is not implemented on the receiving equipment for the
line. Often seen when trying to place voice calls on data
only lines or data calls on voice only lines.

Incompatible
destination

INCOMPATIBLE
DESTINATION

The destination device is not capable of supporting the

type of call requested. Usually seen when trying to place
data calls to a voice phone.

100

Invalid
information
element contents

INVALID INFO
ELEMENT CONTENT

A protocol problem where the receiving equipment does

not understand one of the fields inside of the call setup
message. If you receive this message, do the following:
Verify that the call control is correct for the call.
Contact a Tier 2 or Tier 3 technician or switch vendor
to isolate and resolve the problem.

102

Recovery on timer
expiry

RECOVERY ON TIMER
EXPIRY

No response received to generated messages. Often

seen on PRI NFAS circuits when equipment is trying to
generate call activity on the backup D channel and not on
the currently active D channel.

Table 95 lists less frequently encountered cause codes for ISDN PRI calls.
Table 96

Q.931 Cause Codes

Cause
Code

D Channel Decode Description

Call 1/Call 2 Description

Unassigned Number

UNASSIGNED NUMBER

No route to specified network

NO ROUTE TO TRANSIT NETWORK

No route to
destination

NO ROUTE TO DESTINATION

Channel unacceptable

CHANNEL IS UNACCEPTABLE

Call awarded
delivered in est. ch.

CALL AWARDED

User busy

USER BUSY

User alerting no answer

ALERTING BUT NO ANSWER

Number changed

NUMBER CHANGED

Non-selected user clearing

NON-SELECTED USER CLEARING

Destination out of order

DESTINATION OUT OF ORDER

Requested facility rejected

REQUEST FACILITY REJECTED

Response to STATUS ENQuiry

RESPONSE TO STATUS ENQUIRY

No channel available

NO CIRCUIT/CHAN AVAILABLE

Queued

QUEUED

Temporary failure

TEMPORARY FAILURE

Network congestion

NETWORK CONGESTION

Access information discarded

ACCESS INFO DISCARDED

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Appendix A Principles of ISDN Testing

Understanding the Q.931 Cause Values

Table 96
Cause
Code

Q.931 Cause Codes (Continued)

D Channel Decode Description

Call 1/Call 2 Description

Requested
circ/channel not avail.

REQ. CHANNEL NOT AVAILABLE

Resources unavailableunspecified

RESOURCE UNAVAILABLE

Requested facility not subscribed

REQ FACILITY NOT SUBSCRIBED

Outgoing calls barred

OUTGOING CALLS BARRED

Incoming calls barred

INCOMING CALLS BARRED

Bearer capability not presently

available

BEARCAP NOT AVAILABLE

Service or option not available

SERVICE NOT AVAILABLE

Bearer service not implemented

BEARER SERVICE NOT IMPLEMENTED

Channel type not implemented

CHANNEL TYPE NOT IMPLEMENTED

Requested facility not implemented

REQ FACILITY NOT IMPLEMENTED

Only restricted dig. info. bearer

RESTRICTED DIGITAL ONLY

Service/option not implemented

unspecified

SERVICE NOT IMPLEMENTED

Invalid Call
Reference value

INVALID CALL REFERENCE VALUE

Identified channel does not exist

CHANNEL DOES NOT EXIST

Destination address missing

NO DESTINATION ADDRESS

Transit network does not exist

TRANSIT NETWORK NOT EXIST

Invalid messageunspecified

INVALID MESSAGE

Mandatory information element missing

INFO ELEMENT MISSING

Message type nonexistant or not

implemented

MESSAGE TYPE NON-EXISTENT

Message not
compatible with call state

MESSAGE NOT COMPATIBLE

Info element
nonexistant or not implemented

INFO ELEMENT NON-EXISTENT

101

Message not
compatible with call state

MESSAGE NOT COMPATIBLE

111

Protocol error
unspecified

PROTOCOL ERROR

127

Interworking
unspecified

INTERWORKING

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Appendix B

Principles of Jitter and

Wander Testing

B
This appendix explains basic jitter and wander principles, and describes the
measurements available when testing using the MSAM.
Topics discussed in this appendix include the following:
About jitter on page 248
Jitter measurements on page 248
About wander on page 251
Wander measurements on page 252
For step-by-step instructions on measuring jitter or wander, refer to
Chapter 4 Jitter and Wander Testing. For descriptions of each of the available
jitter and wander test results, refer to Jitter results on page 204 and Wander
results on page 207.

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Appendix B Principles of Jitter and Wander Testing

About jitter

About jitter
Jitter is defined as any phase modulation with a frequency above 10 Hz in a
digital signal. This unwanted phase modulation is always present in devices,
systems and networks. In order to ensure interoperability between devices,
and to minimize signal degradation due to jitter accumulation, the ANSI and
ITU-T have established limits for:
The maximum acceptable level of jitter transmitted by a device.
The level of received jitter that must be tolerated by a device.
These limits have been published in a variety of standards for different devices
and interfaces. The MSAM generates and analyzes jitter in accordance with
the following standards:
ITU-T Recommendations G.823, G.825, O.172 (04/2005) and O.173 (03/
2003)
Telcordia GR-499-CORE Issue 2-1998, GR-253-CORE Issue 4-2005
ANSI Standards T1.102 - 1993, Table 9, T1.404-1994 section 5.10

Jitter measurements
Per ITU-T Recommendation O.172 (04/2005), Section 9 and 0.173 (03/2003),
Section 8, jitter analysis involves measuring output jitter, jitter over time, jitter
tolerance, phase hits, and the amount of jitter transferred from the receiver to
the transmitter of a network element. This section provides an overview of
each of the key jitter measurements.

Intrinsic jitter

Even if a network element (NE) receives a jitter-free digital signal or clock, a

certain amount of jitter always occurs when the NE transmits the received
signal to the next NE on the circuit. This jitter is produced by the NE itself as a
result of clock thermal noise, drift in clock oscillators, or drift in clock data
recovery circuits. This effect is known as intrinsic jitter.

Output jitter

Output jitter is the overall jitter measured at a NEs transmitter, and is specified
in unit intervals (UI). An amplitude of one UI corresponds to one clock period
at the transmitted line rate, and is independent of bit rate and signal coding.
The result is displayed as a peak-to-peak value or as an RMS (root mean
square) value over a specific frequency range. Peak-to-peak measurements
provide a better indication of the effect of jitter on network performance,
because extreme fluctuations trigger more errors on the circuit. RMS measurements help you determine the average amount of jitter.
When measuring output jitter, typically a live traffic signal or a rate-based standard traffic pattern is transmitted to the device under test (DUT). This involves
demodulating the jitter from the live traffic at the transmitter of a network
element (NE), filtering the jittered signal through high-pass and low-pass filters,
and then measuring the peak-to-peak and the RMS amplitude of the jitter over
the specified measurement time interval, for example, 60 seconds. Output jitter
results are strongly influenced by the data transmitted by the signal. For

248

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Appendix B Principles of Jitter and Wander Testing

Jitter measurements

example, jitter measurements for a signal transmitting a 1010 pattern can vary
significantly from those obtained for a signal transmitting a PRBS (Pseudo
Random Binary Sequence).
To detect rare violations of the permitted jitter level, the received jitter amplitude is compared with a selected jitter amplitude mask, and then is observed
to determine the number of events that exceed the user-specified sensor
threshold. Test results then provide the number of events exceeding the
threshold (such as phase hits).

Jitter over time

You can record the positive and negative peak values, peak-to-peak values, or
the root mean square (RMS) value of jitter over a period of time. Peak values
are momentary values, whereas RMS values represent the average amount of
jitter during a certain integration period. Measured values have a resolution of
one second. This presentation format is particularly useful for long-term inservice monitoring and for troubleshooting. The MSAM offers a number of
possibilities for in-service analysis. For example, anomalies and defects can
be recorded with a time-stamp during a long-term jitter measurement. This
helps to correlate increased jitter and transmission errors.

Phase hits

The MSAM declares a phase hit if a demodulated jitter signal exceeds a preset
positive or negative threshold value.
When analyzing jitter on an electrical circuit, subsequent phase hits are
only counted if the amplitude drops below or rises above the hysteresis for
the analysis rate (equal to 100% of the threshold), and then exceeds the
positive or negative threshold again.
When analyzing jitter on an optical circuit, subsequent phase hits are only
counted if the amplitude drops below or rises above the hysteresis
(25 mUI), and then exceeds the positive or negative threshold again.
Figure 39 illustrates jitter phase hits in a demodulated jitter signal.

Figure 39 Phase hits in a demodulated jitter signal

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249

Appendix B Principles of Jitter and Wander Testing

Jitter measurements

Jitter tolerance

Jitter tolerance is a measurement used to verify the resilience of equipment to

input jitter. The measurement allows you to determine the maximum level of
jitter that network elements (NE) on a circuit can tolerate without transmitting
errors. Figure 40 illustrates the connections required to measure jitter tolerance.

Figure 40 Jitter Tolerance Measurement Connections

Two automated test sequences are available that help you determine a NEs
ability to tolerate jitter.

MTJ test sequence

The automated MTJ sequence measures the Maximum Tolerable Jitter by

transmitting a jittered test signal to the receiver of the NE. The sequence uses
an algorithm to automatically increase the jittered signals amplitude at various
frequencies (in search steps specified as mask points and scan points) until the
NE transmits errors exceeding the value specified on your unit as the sensor
threshold. The MTJ value is the value for the search step immediately
preceding the step that caused the threshold error.
The unit begins the sequence by transmitting a jittered signal with an amplitude
of 50% of the tolerance value. Depending on the result, it then increases or
decreases the amplitude by half of the set value until reaching the finest resolution, while allowing the network element a programmable recovery time
between measurements. The unit records the measurement curve, allowing
you to observe the entire measurement in the MTJ Graph result category.

Fast MTJ test sequence

Jitter Transfer Function (JTF)

The automated Fast MTJ sequence uses a subset of mask points and scan
points to quickly measure MTJ. If the NE tolerates jitter without transmitting
errors exceeding the number specified for the sensor threshold, the measurement indicates that the NE passed the test. If the NE transmits errors
exceeding the number specified for the threshold, the measurement indicates
that the NE failed. This test sequence provides no information about the tolerance reserve of the network elements receiver.

Jitter transfer indicates how much jitter is transferred from the receiver to the
transmitter of the network element you are testing. Jitter may increase or
decrease when passing through an NE.
Most often, if a received signal is jittered, some residual jitter will remain when
the signal is transmitted. As the signal passes through the NE, high-frequency
jitter is generally suppressed. Low-frequency jitter components normally
appear unchanged. The received jitter may even be amplified slightly by the
NE. This can cause problems if several similar network elements, such as
regenerators, are connected consecutively. Even a slight jitter gain can accumulate as the signal progresses through the circuit to produce high jitter
values. The jitter tolerance for the next network element on the circuit could
then potentially be exceeded, resulting in an increased bit error rate.

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Appendix B Principles of Jitter and Wander Testing

About wander

Test set calibration

To ensure optimum accuracy when measuring JTF, the transmitter and

receiver of your unit must be normalized by performing a loop-back calibration.
The transmitter is looped to the receiver, and then the unit determines the
intrinsic error of the analyzer at every selected scan frequency. The unit then
corrects the intrinsic error and applies it to the test results for the device under
test when you measure JTF. Figure 41 illustrates the connection required to
calibrate the unit.

Figure 41 Connection For Test Set Calibration

JTF measurement

After the unit is calibrated, you can reconnect the Transport Module to the DUT
to start measuring JTF. Figure 42 illustrates the connections required to
measure JTF.

Figure 42 Jitter Transfer Function measurement connections

When measuring JTF, the unit transmits a signal modulated with sinusoidal
jitter to the receiver of the device under test. A signal with the highest possible
jitter amplitude tolerable at the receiver should be transmitted, since a high
amplitude results in a better signal-to-noise ratio and therefore provides a more
accurate measurement by reducing the occurrence of spurious jitter. The jitter
amplitude at the DUTs transmitter is measured, and then the unit calculates
the JTF. The unit continues to measures JTF at a number of pre-selected
frequencies.
The jitter is measured selectively using a band-pass filter that is tuned to the
modulation frequency. This ensures that interference frequencies outside the
pass band of the filter do not affect the result.
The Jitter Transfer Function is calculated from the logarithmic ratio of output
jitter to input jitter on a point by point basis, per ITU-T Recommendation O.172
(04/2005), Section 9.5, and O.173 (03/2003), Section 8.6.

About wander
Slow, periodic and non-periodic phase changes in the 0 Hz to 10 Hz frequency
range are known as wander. Because phase changes can take place at any
speed, a reference clock must always be used when measuring wander.
Wander can also be described as the phase difference between a very precise
reference clock and the signal under test. The phase difference is sampled
over time and is expressed in nanoseconds.
Most wander measurements are taken over a significant period of time, spanning an entire day or even more than one day. To ensure accuracy of your
wander measurements, let each wander test run for at least one minute.
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Appendix B Principles of Jitter and Wander Testing

Wander measurements

Wander measurements
Per ITU-T Recommendation O.172, Section 10 wander analysis involves
measuring the Time Interval Error (TIE), calculating the Maximum Time
Interval Error (MTIE), and calculating the Time Deviation (TDEV).
The Time Interval Error (TIE) for a series of measurements is then used to
calculate the Maximum Time Interval Error (MTIE) and the Time Deviation
(TDEV). The calculated MTIE and TDEV are then compared the standard ITUT or ANSI masks.

Reference clock
requirements

When measuring wander using the Transport Module, the external reference
signal must conform to the clock frequencies and input levels specified below:
If a valid BITS signal is present on the Rx 2 BITS/REF receiver, the BITS
signal is selected as the wander reference.
If a valid BITS reference signal is not present on the Rx 2 BITS/REF
receiver, the unit will examine the Rx 2/SETS/REF receiver.
If a valid SETS signal is present on the Rx 2/SETS/REF receiver, the
SETS signal is selected as the wander reference.
If a valid SETS signal is not present, the unit will examine the
Rx 2 SETS/REF receiver for a 2.048 MHz clock signal.
If a valid 2.048 MHz clock signal is not present on the Rx 2 SETS/REF
receiver, the unit will check for a 10 MHz clock signal to use as the wander
reference.
If none of the above signals are present, the internal reference is selected as
the wander reference.
NOTE:
If the unit loses the reference clock signal, a message appears in the
Message Bar and Message Log indicating that the reference clock was lost.

Wander over time

252

Wander can accumulate in a network, causing incorrect synchronization or

even a total loss of synchronization. The accumulated phase changes in the
node clock result in a frequency offset, which ideally should be zero over long
observation periods. This is true for a node clock that is properly locked to the
nearest higher level in the hierarchy. An unlocked clock, running in hold-over
mode, may have a substantial frequency offset and a frequency drift that could
be high. However, a locked clock can also have a measurable frequency offset
over shorter observation times.

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Appendix B Principles of Jitter and Wander Testing

Wander measurements

You can view the frequency offset in the TIE graph (see Analyzing wander on
page 105). The higher the frequency offset for a certain observation time, the
higher the TIE value for the same time. Figure 43 provides a sample TIE graph
illustrating wander measurement over time.

Figure 43 Example: Wander measurement over time

TIE and MTIE

The TIE value represents the time deviation of the signal under test relative to
a reference source. MTIE is the maximum time interval error (peak-to-peak
value) in the clock signal being measured that occurs within a specified observation interval in seconds. The MSAM measures TIE and MTIE per Per ITU-T
Recommendation O.172, [10.2] and [10.4] respectively.

Time Deviation (TDEV)

The TDEV value is a measure of the expected time variation of a signal as a

function of integration time. It is calculated from the TIE sample. The TDEV
value can provide information about the spectral content of the phase or the
time noise of a signal. The MSAM measures TDEV per Per ITU-T Recommendation O.172, [10.5].

Frequency offset

Drift rate

Frequency offset is calculated per ANSI T1. 101-199X / T1X1.3/98-002.

Drift rate is calculated per ANSI T1.101-199X /T1X1.3/98-002.

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Appendix B Principles of Jitter and Wander Testing

Wander measurements

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Glossary

Symbols/Numerics
1PPS 1 Pulse per Second. A signal
used as a timing reference, commonly a
part of a GPS signal.
10G Used to represent
10 Gigabit Ethernet.
10GigE Used throughout this manual
to represent 10 Gigabit Ethernet.
2M See E1. The E1 PIMs are used
when testing 2M interfaces.
802.11b IEEE standard for wireless
LANs. You can establish wireless LAN
connections to the T-BERD MTS 6000A
using an 802.11 PCMCIA card.
802.3 The IEEE specification for
Ethernet. 802.3 also specifies a frame
type that places the frame length in the
Length/Type field of the Ethernet header,
as opposed to the DIX Type II frame type
which utilizes the Length/Type field to
identify the payload Ethertype.

A
AC Alternating Current. An AC power
adapter is supplied with the
T-BERD MTS 6000A.
ADM Add-drop multiplexer. A multiplexer capable of extracting and inserting
lower-rate signals from a higher-rate

multiplexed signal without completely de

multiplexing the signal. In SONET, a
device which can either insert or drop
DS1, DS2, and DS3 channels or SONET
signals into/from a SONET bit stream.
AIS Alarm Indication Signal. A continuous stream of unframed 1's sent to indicate that the terminal equipment has
failed, has lost its signal source or has
been temporarily removed from service.
AMI Alternate Mark Inversion. A line
code which inverts the polarity of alternate 1s.
AMS Automatic measurement
sequence.
Analysis Rate The bit rate of the data
stream being analyzed by the BERT
engine. The analyzed data stream can be
the full payload or a demultiplexed tributary from the line interface signal.
APS Automatic protection switching.
In SONET/SDH, the protocols which
ensure a transition from working to
standby lines in the event of equipment or
facility failure. APS is controlled via the K1
and K2 bytes in the Section Overhead.
ARP Address Resolution Protocol.
Method for determining a hosts hardware
address if only the IP address is known.
The instrument automatically sends ARP
requests during layer 3 IP testing.

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Glossary

ATM Asynchronous transfer mode. A

communications transport technology
that formats, multiplexes, cross-connects,
and switches voice, video, and data
traffic.

CID Channel Identifier. Field used to

identify the virtual channel carrying GFP
traffic. The CID resides in the GFP header
for each frame.
Concat Concatenated.

ATP Acterna test packet. A test packet

that contains a time stamp and sequence
number for measuring round trip delay
and counting out-of-sequence frames.
AU Administrative unit.

CSF Client signal fail. A GFP alarm.

CSU Channel service unit. A device to
terminate a digital channel on a
customers premises.
Curr Current.

B
BBE Background Block Error. An
errored block (EB) not part of a severely
errored second (SES).

BBER Background block error ratio.

Ratio of BBE to total blocks received not
part of an SES.

DALY A stress pattern consisting of a

framed 55 octet hex pattern used with
framed DS1 circuits without causing
excess zeros.

B channel Channel which carries the

payload of ISDN call.

DA Destination address.

DB-9 Standard 9-pin RS-232 serial

port or connector.

BDI Backward Defect Indication.

BEI Backward Error Indication.
BER Bit Error Rate.
BERT Bit error rate test. A known
pattern of bits is transmitted, and errors
received are counted to figure the BER.
The Bit Error Rate test is used to measure
transmission quality.
BIP Bit interleaved parity. A field used
to perform a parity check between
network elements for error checking.
Bridge A high impedance tap into an
E-1 or T-1 circuit (where no monitor point
access is provided) that does not disrupt
the existing communication line.

DB-25 25-pin RS-232 serial port or

connector.
D channel Channel used in ISDN for
signaling and supervisory functions.
DDS Digital data system. An all digital
service that provides terminal-tocomputer and computer-to-computer
data transmission.
Dec Decrement.
DHCP Dynamic Host Configuration
Protocol. A communications protocol that
assigns IP addresses dynamically as
needed. Also supports static IP address
assignment.
DIX Digital, Intel, and Xerox. Ethernet
Type II frame format.

C
CCM Continuity Check Message.
CDP Cisco Discovery Protocol.
CE Customer Edge.

DNU Do Not Use. During LCAS

testing, you can indicate that a particular
VCG member on the source or sink sides
should not be used.
DSX Digital System Crossconnect
frame.

CFM Connectivity Fault Management.

DS1 Digital signal level 1. 1.544 Mbps.
CFP 1C Form-factor Pluggable
module.

256

DS3 Digital signal level 3. 44.736

Mbps.

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Glossary

DTMF Dual-Tone Multi-Frequency.

Combination of two tones, one high
frequency and one low frequency used in
touch-tone dialing. You can enter DTMF
tones when you process ISDN PRI calls
using the instrument.

E
E1 Electrical data signal level 1. 2.048
Mbps.
E3 Electrical data signal level 3.
34.3688 Mbps.
E4 Electrical data signal level 4.
139.264 Mbps.

values dont match (suggesting the frame

is errored), an FCS error is declared.
Switching devices will discard the frame.
FDX Full Duplex.
FE Far End. Used by the ITU performance measures to indicate which end of
the network is being tested.
FEBE Far end block error. An alarm
signal transmitted from a network element
receiving a signal containing framing or
parity errors to the network element
sending the errored signal.
FEC Forward Error Correction.
FT1 Fractional T1.

EB Errored blocks.
FTFL Fault Type Fault Location.
EDD Ethernet demarcation device.
EFM Ethernet First Mile.

FTP File transfer protocol. Protocol

used on LANs and the Internet to transfer
files.

Err Error.
Erred Errored.
ES Errored Second. A second during
which at least one error or alarm
occurred.
ESR Errored seconds ratio.
Ethernet A LAN protocol. Using the
instrument, you can test and verify
Ethernet network elements and services.
Ethernet link partner The nearest
Ethernet device on a link. The instrument
auto-negotiates its capabilities with this
device when you initialize a link.

Frame Loss Loss of frame synchronization.

G
GARP Generic Attribute Registration
Protocol.
Gate time Time duration for error
measurement. During this period the error
source is accumulated if it is an error or
recorded if it is an alarm.
GigE Used throughout this manual to
represent Gigabit Ethernet.

EXI Extension Header Identifier. Field

used to identify the type of extension
header used by GFP traffic.

Global Addresses Second IPv6

source address assigned to an interface.
The global address is not used locally,
and is broader in scope, typically to get
past a router. If you use auto-configuration to establish a link, the global address
is provided automatically.

GMRP GARP Multicast Registration

Protocol.

ETSI European Telecommunications

Standards Institute.

FAS Frame Alignment Signal.

FCS Frame check sequence. A value
calculated by an originating device and
inserted into an Ethernet frame. The
receiving device performs the same
calculation, and compares its FCS value
with the FCS value in the frame. If the

GP Group. Suffix used on the GUI to

indicate that a result or setting applies to
a VCG rather than a particular member of
the group.
GUI Graphical User Interface. Layout
of commands in a user-friendly environment. See also UI (user interface).

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Glossary

GVRP GARP VLAN Registration

Protocol.

ISO International Organization for

Standardization.

ISP Internet service provider. A vendor

who provides access to the Internet and
the World Wide Web.

HBER High bit error ratio.

HEC Header Error Check. Cyclic
Redundancy Check (CRC) carried in the
core, type, or extension header of a GFP
frame.

ITU International Telecommunications Union based in Geneva, Switzerland.

HDX Half duplex.

High order path For SONET circuits,
virtual STS-1c and STS-3c paths are
considered high order paths. For SDH
circuits, VC-3 and VC-4 paths are considered high order paths.
Histogram Print output of specific
results in a bar graph format.
HP High Path. The SDH equivalent of
Path for SONET.

Jabber An Ethernet frame that

exceeds the IEEE 802.3 maximum length
of 1518 bytes (or 1522 bytes with a VLAN
tag) and contains an errored FCS.
J-Connect Utility that allows you to
detect other JDSU test instruments on a
particular subnet, and use a detected
instruments addresses to automatically
populate key traffic settings. Also known
as JDSU-Discovery.
JDSU Discovery See J-Connect.

Hz Hertz (cycles per second).

J-Mentor Utility provided on the instrument that allows you to capture data for
analysis when testing from an Ethernet
interface.

IAE Incoming Alignment Error.

IGMP Internet Group Management
Protocol.
Inc Increment.
Internet Protocol Commonly referred
to as IP. Protocol specifying the format
and address scheme of packets transmitted over the Internet. Typically used
with TCP.
IP See Internet Protocol.
IPoE Internet Protocol over Ethernet.
Used on the GUI and through this guide to
see the applications used to establish a
standard layer 3 (IP) connection.

J-Proof Application used to verify

Ethernet Layer 2 Transparency.
J-Scan Utility used to scan and detect
the signal structure and mappings from a
SONET or SDH interface. Also referred to
in other documents as the Auto-Discovery
feature.
Jumbo frame An Ethernet frame that
exceeds the IEEE 802.3 maximum length
of 1518 bytes (or 1522 bytes with a VLAN
tag). You can transmit jumbo frames
using the T-BERD MTS 6000A.
Just Justification.

IPv4 Internet Protocol Version 4.

IPv6 Internet Protocol Version 6.
ISDN Integrated Services Digital
Network. A set of communications standards allowing a single wire or optical
fiber to carry voice, digital network
services and video. See PRI.
ISM In-Service Monitoring.

258

KLM An STM-N frame comprises N x

270 columns (numbered 1 to N x 270).
The first N x 9 columns contain the SOH
and AU-4/AU-4-Xc pointer(s). The
remaining N x 261 columns contain the
higher order data payload (tributaries). In
an AU-4 structured frame, the payload
columns may be addressed by a three
figure address (K, L, M), where K represents the TUG-3 number, L the TUG-2

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Glossary

number, and M the TU-1 number. In an

AU-3 structured frame, only L and M are
used.

LOAML Loss of Alignment Marker

Lock
LOC Loss of Continuity or Capacity.

L
LAN Local Access Network.
LACP Link Aggregation Control
Protocol.

LOF Loss of Frame. A condition indicating that the receiving equipment has
lost frame synchronization.
LOL Los of Lane Alignment
LOM Loss of Multi framing.

LBM Loopback Message.

LBR Loopback Reply.
LCAS Link Capacity Adjustment
Scheme. Used in combination with virtual
concatenation (VC) on NextGen networks
to dynamically increase or decrease
bandwidth.
LCD Liquid Crystal Display.
LCK Locked defect.
LED Light emitting diode.
LFD Loss of frame delineation. A
GFP alarm.
LL Logical Lane
LLB Line Loopback.

LOP Loss of pointer. A condition indicating loss of a pointer to a virtual tributary or path.
LOR Loss of Recovery
LOS Loss Of Signal (Red Alarm). A
condition when no pulses of positive or
negative polarity are received for more
than 175 pulse counts.
Low order path For SONET circuits,
virtual VT-1.5 paths are considered low
order paths. For SDH circuits, VC-12
paths are considered low order paths.
LPAC Loss of performance assessment capability. A condition indicating that
cells that can be analyzed by the MSAM
havent been received for a period of 10
seconds. This condition is typically due to
receipt of errored or non-masked cells.

LLC Logical link control. Three bytes

carried in 802.3 frames which specify the
memory buffer the data frame is placed
in.

LLM Logical Lane Marker

M13 A frame format used for multiplexing 28 DS1 signals into a single DS3.
The multiplexer equivalent of T-1.

Medium Dependent Interface port. RJ-45

interface used by Ethernet NICs and
routers that does not require use of a
crossover cable (MDI ports do not cross
the transmit and receive lines). An MDI
port on one device connects to an MDI-X
port on another device. MDI interfaces
transmit using pins 1 and 2, and receive
using pins 3 and 6. The MSAM supports
cable diagnostics of MDI interfaces. See
also MDI-X port.
MDI Media Delivery Index (video
applications).
MDI-X port Medium Dependent Interface Crossover port. RJ-45 interface used
by Ethernet NICs and routers that
requires use of a cross-over cable (MDI-X
ports cross transmit and receive lines. An
MDI-X port on one device connects to an

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259

Glossary

MDI port on another device. MDI-X interfaces transmit using pins 3 and 6, and
receive using pins 1 and 2. The MSAM
supports cable diagnostics of MDI-X interfaces.

Multiplexer Electronic equipment

which allows two or more signals to pass
over one communication circuit.
MUX See Multiplex.

MEG Maintenance Entity Group.

N
MFAS Multi Frame Alignment Signal.
NDF New data flag.
MPEG Set of standards for compression of audio and video and multimedia
delivery developed by the Moving
Pictures Expert Group.

NE Near-end. Used by ITU performance measurements to indicate which

end of the network is being tested.

MPLS Multiple Path Label Switching.

A mechanism using labels rather than
routing tables to transmit layer 3 IP traffic
over a layer 2 Ethernet network.

NFAS Non-facility-associated
signaling. Signaling that is separated from
the channel carrying the information. Also
known as out-of-band signaling.

MS Multiplex Section. The SDH equivalent of line in SONET.

NIU Network Interface Unit. Electronic

device at the point of interconnection
between the service provider communications facilities and terminal equipment
at a subscribers premises.

Msg Message.
MPLS Multiprotocol Label
Switching. A form of frame encapsulation
that uses labels rather than routing tables
to transmit layer 3 traffic over a
layer 2 Ethernet network.
MPTS Multiple program transport
stream.
MSAM Multiple Services Application
Module. Application module used in
combination with the T-BERD /
MTS 6000A base unit or a T-BERD /
MTS 8000 and DMC for testing from a
variety of interfaces.

MSOH Multiplexer Section Overhead.

MSPP MSPP. Multi-service provisioning platform. Typically next generation SONET multiplexors capable of
aggregating multiple access technologies
such as Ethernet, TDM, and ATM onto a
SONET ring.
MSTP Multiple Spanning Tree
Protocol.
Multipat Multiple patterns. An automated sequence of 5 BERT patterns for
three minutes each. The Multipat
sequence consists of ALL ONES, 1:7, 2 in
8, 3 in 24, and QRSS.
Multiplex MUX. To transmit two or
more signals over a single channel.

OAM Operations, Administration, and

Maintenance. The instrument allows you
to run link and service layer OAM applications.
OC-12 Optical carrier 12. A SONET
channel of 622.08 Mbps.
OC-3 Optical carrier 3. A SONET
channel equal to three DS3s (155.52
Mbps).
OC-48 Optical Carrier 48. SONET
channel of 2.488 Gbps.
OC-192 Optical Carrier 192. SONET
channel of 9.953 Gbps.
ODU Optical channel data unit.
OOF Out of framing.

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Glossary

OOL Out of Lane Alignment

PCAP File format used for packet

captures on the instrument.

OOLLM Out of Logical Lane Marker

PCM Pulse Code Modulation.
OOM Out of multi framing.
PCR Program Clock Reference.
OOR Out of Recovery
OOS Out of sequence.

Peak-to-peak The difference between

the maximum positive and the maximum
negative amplitudes of a waveform.

P
Packet Bundle of data, configured for
transmission. Consists of data to be
transmitted and control information.
Packet Delay Variation The difference in one-way-delay as experienced by
a series of packets.
Path The layer in SONET network that
describes the region between two Pathterminating pieces of equipment, typically
terminal multiplexers.
Pattern sync The condition occurring
when the data received matches the data
that is expected for a period of time
defined by the pattern selected.
PBX Private Branch Exchange. A telephone exchange owned by the customer
who uses telephone services, located on
the customer premises. You can use the
HST-3000 to emulate a PBX when testing
ISDN PRI service.

PFI Payload FCS Indicator. Field used

in GFP frames that indicates use of an
optional payload FCS.
Phase hit Instance where a demodulated signal exceeds a pre-set positive or
negative threshold value.
PLM-P Payload mismatch Path.
PLTC Partial loss of transport
capacity. Indicates that one or more
members were not correctly added to a
VCG when using LCAS.
PM Path monitoring.
PMT Program Map Table.
Pointer A value that alerts SONET
equipment of the starting point of a
floating synchronous payload envelope
within a SONET frame.
PPS Pulses Per Second (used for DP
digits).
Primary Rate Interface ISDN service
carried on a T1 line. PRI service provides
23 B (bearer) channels, which carry voice
and data call payloads, and a single
D channel, which handles signaling for
the circuit.
Pseudo wires Point-to-point connections used to carry each type of service
between two PE routers in a VPLS
network.
PSTN Public switched telephone
network.
PTI Payload Type Indicator. Field used
in GFP frames to indicate whether the
frame is a management frame or a data
frame. The instrument allows you to
configure data frames only.
PTP
Ptr See Pointer.

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Glossary

Q-in-Q Also known as VLAN stacking,

enables service providers to use a single
VLAN to support customers who have
multiple VLANs. Q-in-Q VLANs can also
be used to provide virtual access and
connections to multiple services available
over the ISPs, ASPs, and storage
services.

SA 1. Source address. 2. Service

affecting.

QoS Quality of Service.

Sect See Section.

QRSS Quasi-Random Signal

Sequence. A modified 2^20-1 pseudo
random test signal, modified for use in
AMI circuits

Section The layer in a SONET

network that describes the region
between two Section-terminated pieces
of equipment, typically regenerators, adddrop multiplexers, or terminal multiplexers.

QSFP+ Quad Small Form-Factor

Pluggable module.
RDI Remote Defect Indication. A
terminal will transmit an RDI when it loses
its incoming signal.

SD Signal degradation.
SDH Synchronous Data Hierarchy.
Secs Seconds.

Sensor threshold The number of

alarms or errors allowed by the MTJ/Fast
MTJ sensor that will result in a pass
status for a particular transmit amplitude
and frequency point.

REI Remote Error Indicator.

RFI Remote Failure Indicator.
RJ 48-11 Modular telephone jack, typically used for telephones, modems, and
fax machines.
RS Regenerator Section. The SDH
equivalent of Section for SONET.

Service disruption time The time

between Ethernet (maximum inter-frame
gap) when service switches to a protect
line. The Svc Disruption (us) result in the
Link Stats category displays the service
disruption time.
SEF Severely errored frames.
SEP Severely errored periods.

RSOH Regenerator section overhead.

SEPI Severely errored period intensity.
RSTP Rapid Spanning Tree Protocol.
SES Severely errored seconds.
RS-232 Set of standards specifying
electrical, functional and mechanical
interfaces used for communicating
between computers, terminals and
modems.
RTP Real-time Transport Protocol.
Standardized packet format for delivering
audio and video over the Internet. MPEG
video streams are often encapsulated in
RTP packets.
Runt An Ethernet frame that is shorter
than the IEEE 802.3 minimum frame
length of 64 bytes and contains an
errored FCS, or a Fibre Channel frame
that is shorter than the minimum 28 byte
frame length containing an errored CRC.
Rx Receive or receiver or input.

262

SESR Severely erred seconds ratio.

Settling time The amount of time a
DUT is allowed to settle and adjust to a
change in the frequency or amplitude of a
received signal. You can specify the
settling time for modulated signals transmitted from the instrument when configuring the automated measurement
sequences (AMS). The module resumes
error measurement after the specified
time elapses.
SF Signal fail.
SFD Start of frame delimiter. Part of an
Ethernet frame preamble that indicates
that the destination address frame is
about to begin.

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Glossary

SFP Small form-factor pluggable

module. Used throughout this guide to
represent pluggable optical transceivers
(modules).

TCP Transmission Control Protocol.

Layer 4 protocol that allows two devices
to establish a connection and exchange
streams of data.

Sk LCAS sink (receiver).

TDEV Time Deviation. A measure of

the phase error variation versus the integration time. It is calculated based on the
TIE. See also TIE and MTIE.

SLA Service Level Agreement.

SM Section monitoring.
So LCAS source (transmitter).
SNAP SubNetwork Access Protocol.
Protocol used in 802.3 frames which
specifies a vendor code and an
Ethertype. When you transmit pings using
the instrument, you can transmit 802.3
frames with logical link control (LLC) and
SNAP.
SOH Section overhead.

TE1 Terminal equipment type 1.

Terminal equipment that supports ISDN
standards and can be connected directly
to an ISDN network (for example, an
ISDN phone, a PC or laptop with ISDN
capabilities, etc.). You can use the instrument to emulate a TE1 device when
testing ISDN PRI service.
TNS Transit network select. A code
representing the network that calls are
routed to. You can specify the TNS when
processing calls on the instrument.

SONET Synchronous optical network.

Term See Terminate.
SPE Synchronous Payload Envelope.
SSF Service Signal Failure.
STL Synchronous Transport Lane
STM-1 A SDH signal of 155.52 Mbps.
STM-1e Electrical SDH signal of
155.52 Mbps.

Terminate An application where the

test set is terminating the circuit. In these
applications, the test set sends and
receives traffic.
Through An application where the test
set is used in series with a network circuit
to monitor the traffic on that circuit.

STM-16 A SDH signal of 2.488 Gbps.

TIE Time Interval Error. Represents

the time deviation of the signal under test
relative to a reference source. Used to
calculate MTIE and TDEV.

STM-64 A SDH signal of 9.953 Gbps.

TIM Trail trace identifier mismatch.

STP Spanning Tree Protocol.

TLTC Total Loss of Transport

Capacity. Indicates that no VCG member
was added when using LCAS.

STM-4 A SDH signal of 622 Mbps.

STS-1 Synchronous transmit signal of

51.84 Mbps.

TNV Telephone-network voltage.

SVLAN Stacked VLAN. Used in
Q-in-Q traffic to provide a second encapsulation tag, expanding the number of
VLANs available. Often considered the
VLAN assigned to the service provider
(as opposed to the customer).

TOH Transport Overhead.

Transit network ID A code representing the network that calls are routed
to. You can specify the ID when
processing calls on the instrument.

Sync Synchronization.
TU Tributary unit.

T
TCM Tandem connection monitoring.

Tx Transmit or transmitter or output.

U
UAS Unavailable seconds.

PDH, SONET, SDH, NextGen, and OTN Testing Manual

263

Glossary

UI Unit Interval. One bit period at the

data rate being measured.
us Microseconds (also expressed
as s).
USB Universal Serial Bus. A bus
designed to handle a broad range of
devices, such as keyboards, mouses,
printers, modems, and hubs.

V
VBR Variable bit rate. An ATM service
which supports a variable rate to transport
services such as voice.
VC Virtual container.
VCI Virtual channel identifier. In an
ATM cell header, the address assigned to
a virtual channel. Multiple virtual channels
can be bundled in a virtual Path.

workstation, and you can run remote

applications from the T-BERD MTS
6000A.
VPI Virtual Path identifier. An in ATM
cell header, the address assigned to a
virtual Path. A virtual Path consists of a
bundle of virtual channels.
VPLS Virtual Private LAN Service. An
MPLS application which provides multipoint to multi-point layer 2 VPN services,
allowing geographically dispersed sites to
share an ethernet broadcast domain by
connecting each site to an MPLS-based
network.
VT A signal grouping used to transport
signals smaller than DS3 within a SONET
frame.
VTP VLAN Trunk Protocol.
VT 1.5 Virtual tributary. 1.5 equals
1.544 Mbps.

VDC Volts Direct Current.

VF Voice Frequency.

VLAN Virtual LAN.

WAN Wide area network.

VNC Virtual Network Computing. A

thin client system that enables you to run
applications on a VNC server from any
other computer connected to the Internet.
Using VNC, you can run the
T-BERD MTS 6000A from a remote

264

X
XFP 10 Gigabit Small Form Factor
Pluggable Module.

PDH, SONET, SDH, NextGen, and OTN Testing Manual

Index

A
Action buttons, using 4
Adjusting pointers 81
Alarms
inserting in NextGen traffic 137
inserting OTN 160
inserting SONET 69
AMS
mask 97
scan 98
settings 97, 101
Analyzing wander 105
Anomalies
inserting in NextGen traffic 137
inserting OTN 160
inserting SDH 69
ANT LEDs
SONET and SDH 190, 219
T-Carrier and PDH 178
Applications
Jitter and Wander 8993
NextGen SDH 126
NextGen SONET 121
OTN 154
PDH 10
SDH 49
selecting 2
SONET 46
T-Carrier 10
APS bytes, manipulating 79
Automatic jitter testing, JTF 101

B
B channels, inserting voice traffic 39
BER testing
detecting received pattern 65
ISDN PRI calls 40

NextGen 116, 143, 147

OTN 171
PDH 14
SDH 63
SONET 63
T-Carrier 14
BERT results
SONET and SDH 199
T-Carrier and PDH 183

C
C2 path signal label, inserting 77
Calibration 102
Calls
BER testing ISDN PRI 40
disconnecting ISDN PRI 41
monitoring PCM 25
placing and receiving PCM 26
placing ISDN PRI 37
receiving ISDN PRI 38
specifying ISDN PRI settings 35
specifying PCM settings 24
transmitting DTMF tones 41
Capturing POH bytes 74
Cause codes
described 244
Collapsing measurements 5
Compliance information xviii
Configuring tests 2
Connecting the instrument to circuit 3
Conventions xvii
CSF alarms, inserting 146
Custom test results 5
Customer services, technical assistance
xviii

PDH, SONET, SDH, NextGen, and OTN Testing Manual

265

Index

G.783 NextGen results 209

Gate time 97
GFP testing
inserting CSF or LFD alarms 146
inserting errors 146
monitoring NextGen circuits 147
NextGen circuits 144
overview 116
specifying Ethernet and IP settings 145
specifying settings 144
test results 213
transmitting and analyzing traffic 145
Graphs, about 5
Ground start signaling 23
FXO 23
FXS 23
SLC office, D4/SF/SLC-96 24
SLC office, ESF 24
SLC station, D4/SF/SLC-96 24
SLC station, ESF 24

E
Errors
inserting in NextGen traffic 137
inserting OTN 160
inserting SONET 69
Ethernet testing
NextGen circuits 116
Event logs, about 5
Expanding measurements 5
Exporting wander data 108

F
Features and capabilities
Jitter and Wander 88
NextGen 114
PCM 20
PDH 8, 88
SDH 44
SONET 44
T-Carrier 8, 88
VF analysis 27
FEC testing 163
Fractional T1 testing 11
Frame results 180
FTFL identifiers 169
FXO signaling
ground start 23
loop start 22
FXS signaling
ground start 23
loop start 22

266

H
Help, technical assistance xviii
Histograms
about 5
viewing 5
Holding tone test 28
HP results 196

I
Idle calls, BERT 40
Inserting
alarms or defects 69, 137, 160
C2 path signal label 77
errors or anomalies 69, 137, 160
J0 or J1 byte or identifier 75
IP testing, NextGen circuits 116
ISDN PRI testing
BER analysis 40
inserting voice traffic 39
placing calls 37
receiving calls 38
specifying call settings 35
specifying decode filter settings 37
specifying general settings 33
test results 183
transmitting DTMF tones 41
ITU-T results 202

J
J0 or J1 byte, inserting 75
jitter and wander 89
Jitter testing
about 88
applications 89, 8993
features and capabilities 88
transmitting jitter 93
J-Scan
about results 63
discovering SONET/SDH structure 60

PDH, SONET, SDH, NextGen, and OTN Testing Manual

Index

testing a channel 62
using Restart 63
JTF 101

K
K1/K2 bytes, manipulating 79

L
LAPD frames
supervisory messages
unnumbered messages 242
Laser, turning ON or OFF 4
Layout, changing result 5
LCAS testing
about 142
adding or removing members 143
enabling 142
monitoring MST status 143
overview 115
specifying PLTC thresholds 142
LEDs
NextGen 115
OTN 216, 219
SONET and SDH 188, 190
T-Carrier and PDH 177, 178
LFD alarms, inserting 146
Line results 195
Logs, about event 5
Loop start signaling 21
FXO 22
FXS 22
SLC office, D4/SF/SLC-96 23
SLC office, ESF 22
SLC station, D4/SF/SLC-96 22
SLC station, ESF 22
LP results 198

M
Manipulating
K1 or K2 APS bytes 79
overhead bytes, NextGen 140
overhead bytes, OTN 161
overhead bytes, SONET/SDH 73
S1 byte 80
Measurements, expanding and collapsing
5
Measuring
Fast MTJ 97
jitter, automatically 96
jitter, manually 95
JTF 101
MTJ 97
optical power for OTN 159
optical power for SONET/SDH 59
service disruption, T-Carrier and PDH
18
Members, adding or removing LCAS 143
Messages, D channel decode
LAPD supervisory frames
LAPD unnumbered frames 242
Q.931 messages 243
Messages, interpreting 238
Monitor mode, PCM signaling 21

Monitoring
NextGen circuits 120
OTN circuits 173
SONET and SDH traffic 46, 120
T-Carrier and PDH circuits 20
Monitoring a call, PCM signaling 25
Multiple tests, running 5
Multiplex SOH results 195

N
NextGen test results
about 209
G.783 results, explained 209
GFP 213
LCAS 211
LEDs 210
VCAT 211
See also Ethernet test results, SONET
test results, and SDH test results
NextGen testing
about 114
adding VCG members 136
analyzing a VCG 139
BER analysis 116, 143
configuring tests 133
creating a VCG 134
deleting VCG members 136
enabling LCAS 142
features and capabilities 114
GFP analysis 116
GFP verification 144
inserting errors or alarms 137
inserting GFP errors 146
LCAS verification 115, 142
LEDs 116
Main screen elements 118
Manipulating overhead bytes 140
monitor mode 120
monitoring for BER errors 147
monitoring GFP traffic 147
monitoring LCAS MST status 143
NewGen and MSTP networks 114
overview 115
physical layer 115
running classic SONET/SDH tests 133
SDH applications 126
SONET applications 121
specifying Ethernet and IP settings 145
specifying GFP settings 144
specifying VCG settings 135
terminate mode 120
test results, about 119
transmitting GFP traffic 145
using LEDs as a guide 115
VCAT verification 115
VCG analysis, about 134

O
Optical power, measuring 59
OTN test results
about 216
FEC 221
Framing 222
FTFL 227
Interface 220
LEDs 216
ODU 226
OPU 228
OTU 225
Payload 230, 231, 233
TCM 227

PDH, SONET, SDH, NextGen, and OTN Testing Manual

267

Index

OTN testing
about 150
applications 154
BER testing 171
features and capabilities 150
FEC testing 163
inserting anomalies 160
inserting defects 161
LED panel 151
LEDs 216, 219
measuring optical power 159
monitoring the circuit 173
specifying FTFL identifiers 169
specifying payload types 170
specifying SM, PM, and TCM trace IDs
166
specifying the tx clock source 156
test applications 154
test results, about 154
Overhead bytes
manipulating NextGen 140
manipulating OTN 161
manipulating SONET/SDH 73

P
Parameters, specifying test 2
Path results 196
Patterns, detecting BER 65
Payload types, OTN 170
PCM signaling
call results 27
call settings 24
monitor mode 21
monitoring calls 25
placing and receiving calls 26
terminate mode 21
test modes 21
trunk types 21
PDH test results
BERT 183
Frame 180
LEDs 177, 178
Performance 202
Signal 179
PDH testing
about test results 9
applications 10
BER testing 14
features and capabilities 8, 88
LEDs 177, 178
measuring round trip delay 17
measuring service disruption 18
monitoring the circuit 20
verifying performance 16
Performance
verifying SONET and SDH 84
verifying T-Carrier and PDH 16
PLTC thresholds, specifying 142
PM trace identifiers 166
POH bytes, capturing 74
Pointers
about adjustments 81
adjusting manually 82
adjusting using PTS 82
stress sequences 82
Populating custom results 5

268

Q
Q.931 frames
cause codes 244
decode message descriptions 243
Quiet tone test 28

R
Recovery time 97
Results See Test results
RSOH results 194
Running multiple tests 5

S
S1 byte, manipulating 80
Safety information xviii
SDH test results 198
HP 196
ITU-T 202
MSOH 195
Performance 202
RSOH 194
Signal 192
TCM 200
SDH testing
about test results 45
adjusting pointers 81
BER testing 63
detecting BER pattern 65
drop and insert mode, explained 46
features and capabilities 44
inserting anomalies 69
inserting C2 label 77
inserting defects 69
inserting J0 or J1 byte 75
LEDs 188, 190, 216
manipulating K1/K2 bytes 79
manipulating overhead bytes 73
manipulating S1 byte 80
measuring delay 70
measuring optical power 59
monitor mode, explained 46, 120
NextGen circuits 126
specifying transmit timing source 59
terminate mode, explained 46
test applications 49
verifying performance 84
viewing a TOH group 72
Section results 194
Sensor 97
Sensor threshold 97
Service disruption time
measuring PDH 18
verifying T-Carrier 18
Setting result group and category 4
Settling time 97
Signal results
SONET/SDH 192
T-Carrier/PDH 179
Signaling
monitor mode 21
terminate mode 21
trunk types 21
Signaling bits, user defined 29

PDH, SONET, SDH, NextGen, and OTN Testing Manual

Index

Single tone test 28

SLC office, ground start
D4/SF/SLC-96 framing 24
ESF framing 24
SLC office, loop start
D4/SF/SLC-96 framing 23
ESF framing 22
SLC station, ground start
D4/SF/SLC-96 framing 24
ESF framing 24
SLC station, loop start
D4/SF and SCL-96 framing 22
ESF framing 22
SM trace identifiers 166
SONET test results
BERT 199
ITU-T 202
Line 195
LP 198
Path 196
Performance 202
Section 194
Signal 192
T1.231 192, 193, 201, 224
TCM 200
SONET testing
about test results 45
adjusting pointers 81
applications 46
BER testing 63
detecting BER pattern 65
drop and insert mode, explained 46
features and capabilities 44
inserting alarms 69
inserting C2 label 77
inserting errors 69
inserting J0 or J1 byte 75
LEDs 188, 190
manipulating K1/K2 bytes 79
manipulating overhead bytes 73
manipulating S1 byte 80
measuring delay 70
measuring optical power 59
monitor mode, explained 46, 120
NextGen circuits 121
specifying transmit timing source 59
terminate mode, explained 46
verifying performance 84
viewing a TOH group 72
Specifying
test parameters 2
trace identifiers 166
transmit timing source 59
Standard E&M signaling 21
Starting and stopping tests 4
Summary results 176
Supervisory frames
decode message descriptions
Support xviii

T
T1.231 results 192, 193, 201, 224
T-Carrier test results
BERT 183
Frame 180
LEDs 177, 178
Performance 202
Signal 179

T-Carrier testing
about test results 9
applications 10
BER testing 14
features and capabilities 8, 88
fractional T1 11
LEDs 177, 178
measuring round trip delay 17
measuring service disruption 18
monitoring the circuit 20
verifying performance 16
TCM
results 200
trace identifiers 166
Technical assistance xviii
Terminate mode
NextGen testing 120
PCM signaling 21
SONET and SDH 46
Test applications
Jitter 89
NextGen 121
OTN 154
PDH 10
SDH 49
selecting 2
SONET 46
specifying parameters 2
Wander 89
Test modes, PCM signaling 21
Test results
about graphs 5
about ITU-T performance 202
about Jitter 204
about NextGen 209
about OTN 216
about SDH 45
about SONET 45
about T-Carrier and PDH 9
about Wander 207
changing layout 5
collapsing 5
event logs 5
expanding 5
fractional T1 183
GFP 213
histograms 5
ISDN 183
Jitter 204
populating custom 5
setting category 4
setting group 4
setting the group and category 4
Summary 176
Time 235
using entire screen 5
VF analysis 185
viewing 4
Wander 207
Testing
configuring parameters 2
connecting instrument to circuit 3
jitter and wander 88
selecting an application 2
starting a test 4
turning laser ON or OFF 4
using action buttons 4
viewing results 4, 5
TestPad LEDs
SONET and SDH 188, 216
T-Carrier and PDH 177
Three tone test 28
Time results 235

PDH, SONET, SDH, NextGen, and OTN Testing Manual

269

Index

Timeslot, configuring 14
Timing source, specifying tx 59
TOH group, viewing 72
Transmit clock source
specifying for OTN 156
specifying for SONET/SDH 59
Transmitting
jitter 93
wander 103
Troubleshooting
general 239
tests 239
Trunk types 21
ground start 23
loop start 21
standard ear and mouthpiece 21
Trunk types, PCM 21
Turning ON or OFF, laser 4

U
Unnumbered frames
decode message descriptions 242

V
VCAT testing, overview 115
VCG analysis
about 134
adding members 136
analyzing the VCG 139

270

creating a VCG 134

deleting members 136
inserting errors or alarms 137
specifying settings 135
test results 211
Verifying
SONET and SDH performance 84
T-Carrier and PDH performance 16
VF analysis
frequency sweep test 28
holding tone test 28
impulse noise test 29
performing analysis 29
quiet tone test 28
running tests 29
signaling bits, user-defined 29
single tone test 28
test results 32, 185
three tone test 28
Viewing
histograms 5
test results 4
TOH group 72
Voice traffic, inserting 39
VT results 198

W
Wander testing
about 88
analysis 105
applications 89
exporting data 108
features and capabilities 88

PDH, SONET, SDH, NextGen, and OTN Testing Manual

Communications Test and Measurement Regional Sales

North America
Toll Free: 1 855 ASK JDSU
Tel: +1 240 404 2999
Fax:+1 240 404 2195

Latin America
Tel: +55 11 5503 3800
Fax:+55 11 5505 1598

Asia Pacific
Tel: +852 2892 0990
Fax:+852 2892 0770

EMEA
Tel: +49 7121 86 2222
Fax:+49 7121 86 1222

21148871
Rev. 007, 11/2012
English

www.jdsu.com

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