Implementation of Components

and Circuits
-Fundamental

concepts

-Examples

Outline

Floorplan
Layout vs. Schematic: origin of differences

Fabrication
Design

Design rules
Layout of large area components
Layout for matching
Effects of Layout on IC reliability
Layout for reliability

Floorplan

Sketch of the layout

Estimation of the IC area
Technology dependent

List of components
subcircuits

View
Library - models

Physical layers available

Pad limited vs. Core limited

designs

Floorplan of a communications SoC (left) and

microprocessor (right)
PAD RING

CORE

Scribe street

CORE

Pads

Provide surface for bond-wire soldering

Include I/O protection circuitry

Pad digital,
1.2 m CMOS

A/D converter, 6 bits, 175 Msamples/s

Layouts

Digital logic: automatic place&route,

use of standard cells
Analog & High Performance: aided
manual design
Components with multiple physical
implementations

Resistors
Capacitors
Bipolar transistors
Power components

Example of components: transistors

Single-gate NMOS, 0.35 m

Multiple-gate NMOS, 0.35 m

Vertical NPN BJT, 0.35 m

Lateral BJT, 0.35 m

Example of components: passives

N Diffusion resistor

Polysilicon resistor

Polysilicon capacitor

P-cells

NMOS transistor

Polysilicon capacitor

Designing a layout: CAD Tools

Layout design facilities in nowadays CAD
Tools:

Library of components layout (Design Kit)

Automatic layout generation (Place & route)
Layout vs. Schematic
Rules checking
Extractor and layout simulation

Is the proposed layout a good layout?

Manufacturing: subwavelength gap

10

ABOVE WAVELENGTH

SUB WAVELENGTH

3m
Silicon feature size
0.6m

1
436nm

365nm

Lithography Wavelength

0.25m

193nm

target layout

0.13m

0.1

0.05m
1980

1990

2000

2008

Increased diffraction effects!

from Massimo Conti, BCN 2006

result

Differences between layout and Circuit (I)

Fabrication process
limitations

Lateral diffusion
Etching under protection
Boundary dependent
etching
Three-dimensional effects

Chemical Mechanical
Polishing (CMP)
Surface topography

Differences between layout and Circuit (II)

Fabrication process
limitations
Narrowing after
annealing
Inherent grain variability
Proximity effects

Errors and limitations

Mask productions
Mask alignment

Oxide variations over a 20 nominal oxide thickness

Differences between layout and Circuit (III)

Absolute accuracy of physical

parameters
Controlled at technological level
Simulation: Process variation

2 ( ) A
=
+ S 2 D 2
2

WL
(VT ) =

AV2T

WL

+S D
2
VT

L
2

from Massimo Conti, BCN 2006

Differences between layout and Circuit (IV)

Relative inaccuracies of
physical parameters

Gradients, local variations

Compensated with suitable

layout techniques

Crystal orientation
variations

Components required to be
laid in a determined
orientation
Pressure gradients

Thermal gradients

Differences between layout and Circuit (III)

Example: normalized drain

current dispersions of 2
MOSFETs for different
geometries and distances

W=L= 0.5 m d= 5m

W=L= 10 m d= 5m

W=L= 0.5 m d= 100m

W=L= 10m d= 100m

Inaccuracy in absolute value,

but matched devices
Inaccuracy in absolute value,
and mismatched devices

from Massimo Conti, BCN 2006

Differences between layout and Circuit (V)

Parasitic coupling

Capacitive coupling
Couplings through the power supply
Couplings through the substrate

Parasitic resistances

Contacts
Interconnect

What you get is not what you draw!

Many of the systematic inaccuracies can be

avoided through good layout style.

But designers must understand the limitations

and apply design techniques to mitigate
these effects.

Corrections performed by the foundry

Some manufacturing
distortions can be
predicted and fixed
by introducing
modifications to the
mask

OPC: Optical
Proximity Correction

From Nano-CMOS Circuit and Physical Design,

Wong et al, IEEE Press

Corrections performed by the foundry

Examples of
corrections
automatically
introduced by a OPC
algorithm to the
shapes in the mask

From Nano-CMOS Circuit and Physical

Design, Wong et al, IEEE Press

Design for manufacturability: design rules:

Example: Poly 1

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Example of design rules for POLY 1

PO.W.1a
Minimum gate length of PMOS
PO.W-2a
Minimum gate length of NMOS
PO.W.3
Minimum POLY1 width for interconnect
PO.S.1
Minimum POLY1 spacing
PO.C.1
Minimum POLY 1 to DIFF spacing
PO.C.2
Minimum DIFF extension of GATE
PO.O.1
Minimum POLY1 extension of GATE

Design of large area components

MOS Transistors

Multiple gates to minimize

serial resistance
Multiple contacts to minimize
serial resistance

No big contacts!!!

stacked structures
Lower parasitic capacitances
Lower area

Analogue applications

Avoid minimum size

Automatically generated layouts

AMS, 0.35 microns, 10/0.35

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Design of large area components

Resistances

Bended structures
Dummy structures
45 degrees (avoid non
laminar current flow)
Contacts

Resistor: 5K, 275x3 sq microns.

Example of good and bad layout

Current in the same

direction
Multiple contacts

Piezoresistive effect

Optimized layouts:

Bad layout

Optimized layout

Insufficient via opening

Effective L larger than drawn

Effective W larger than drawn
From Nano-CMOS Circuit and Physical
Design, Wong et al, IEEE Press

12

Optimized layouts:
Optimize efficiency of vias/contacts

Maximize number of vias/contacts

Optimized layout
All transistors in the same
orientation

Better control of manufacturing

Easier lithography (mask)

corrections

From Nano-CMOS Circuit and Physical

Design, Wong et al, IEEE Press

Optimized layouts:
Possible shortcircuit of nodes A and
B due to diffussion flaring and mask
misalingment
Possible shortcircuit due to
poly flaring
Possible shortcircuit due to
diffussion flaring

From Nano-CMOS Circuit and Physical

Design, Wong et al, IEEE Press

13

Layout for matching

Dissipating
device
T1

Current in the same

direction

Gradients increase with

distance
Same orientation
towards physical
gradients

Device 1

T2

Device 2

Dissipating
device
T1
Device 2

Devices with the same

orientation

Device 1

T2

Layout for matching

Interdigitated structures

MOS transistors M1 and M2

Resistors R1 and R2

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Layout for matching

Common centroid:

Layout for matching: Common centroid

Coincidence

Symmetry

Array symmetric around both X and Y axis

Dispersion

Centroids of matched devices should coincide

Segment of each device distributed throughout

the array as uniformly as possible

Compactness

Ideally: array should be square

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Layout for matching: Use of dummies

Dummies

Use dummy devices to provide the same contour

conditions. Ground dummies (do not let them float)

Reference cell

Use multiple basic transistors instead of different sizes

Layout for matching: interconnects

CMP:

Erosion effect: denser interconnects will have higher R

From Nano-CMOS Circuit and Physical

Design, Wong et al, IEEE Press

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Rules for matching

Same W and L: Vary M

Capacitors

Ms: Even (factors of 4!!)

Clean and balanced routing

Multiple M of a capacitance reference CR

IR drops
Parasitic capacitance and couplings
Kelvin connections

Avoid minimum sizing and overlapping

Use dummy structures
Same spacing in interconnects

Layout Strategies for circuit reliability (I)

Electromigration

Electromigration is the transport of material caused by

the gradual movement of the ions in a conductor due to
the momentum transfer between conducting electrons
and diffusing metal atoms
Dependent on:

Temperature
Current density
Conductor Shape
Material

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Layout for reliability: Electromigration

Exist technological preventive measures

Width of interconnections: M m/mA

Type of metal layer (Cu better than Al)

Oxidation (better over field oxide)
Use of protective overcoats
Typical M: between 1 and 0.5

Maximum current per contact and vias

Layout Strategies for circuit reliability (II)

Latch-up

A latchup is the inadvertent

creation of a low-impedance
path between the power
supply rails of an electronic
component, triggering a
parasitic device, which then
acts as a short circuit,
leading to malfunctioning of
the part and perhaps even
its destruction with the
overcurrent

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Layout for reliability: Latch-up

Activation if voltages:

Elimination of minority carriers

Higher than VDD

Lower than GND
I/O Circuitry more sensitive
Guard rings
Biased with low resistances

Reduce beta parasitic transistors. Reduce forward

bias resistance

Layout for reliability: Latch-up

Reduce forward bias resistance:

Rules:

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Layout for reliability: Latch-up

X
X
X
X
X

Layout Strategies for circuit reliability (III)

CMP

Chemical Mechanical
Polishing or Chemical
Mechanical Planarization
Removal any irregular
topography
Surface within the depth
of field of a
photolithography system.

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Layout for reliability: CMP

Example: MOSIS 0.25

(TSMC)

Design rules:

Minimum % coverage of
Metal layers
Polysilicon layers
Capacitor Layers

Layout for reliability: CMP

5
2

Dummy patterns are distributed

over the chip as uniformly as
possible in order to reach the
required coverage for each
material (Metal 1, 2, 3, 4, 5, Poly 1
and CTM (capacitor top metal) )

All Metal Fill pattern

(staked M1, M2, M3, M4 )

Poly 1 Fill pattern as

metal metals

21

Layout for reliability: CMP

Dummy patterns are distributed
over the chip as uniformly as
possible in order to reach the
required coverage for each
material (Metal 1, 2, 3, 4, 5, Poly 1
and CTM (capacitor top metal) )
Example in a 0,18 m technology:

Layout for reliability: CMP

Slots

Act both as stress

releasers and to
minimize dishing
Slots in metals W>
Value (tech. dependent)
Possible library of
components

Corners
Pads

dishing

22

Layout Strategies for circuit reliability (IV)

Antenna Effects or Plasma-Induced damage

The "Antenna Rules" deal with process induced gate oxide

damage. Reactive ion-etching may induce charges to
exposed polysilicon and metal structures. If these
structures are connected to gates (and not to diffusion),
they may develop potentials sufficiently large to cause
Fowler Nordheim current to flow through the thin oxide

Layout for reliability: Antenna

Vulnerability depends on ratio

between periphery/area of
trapping material to gate area
Fab. 1: Rules Poly and metal
layers (including contacts)

Max perimeter ratio of field poly

to active poly
Max perimeter ratio of floating
metals to active poly
Max drawn area of CO vs.
Active Poly

Poly and Metal ratio definition

ratio =

2[(L1 + W 1) Z1]
W 2 L2

Contact and via ratio definition

ratio =

Contact(Via) area
W 2 L2

23

Layout for reliability: Antenna

Fab. 2

Maximum floating (Poly,Metal) Edge area ratio to

active area ratio.

Use of leakers and metal jumpers

Layout Strategies for circuit reliability (V)

ESD

Electrostatic Discharge
Damage in dielectrics due to IC manipulation (mainly gate
oxide)

24

Layout for reliability: Analog PAD

Diodes and resistors for ESD protection

Reverse diodes: Parasitic capacitance!!!

Example of RF PAD without diodes

25

References

The art of Analog Layout, 2nd Edition. Alan Hastings. Ed. Prentice Hall
Nano-CMOS Circuit and Physical Design. B.P. Wong et al. WileyInterscience, IEEE Press
CMOS Circuit Design, Layout and Simulation. R. J. Baker. Wiley IEEE
Press
Layout of Analog and Mixed Analog-Digital Circuits. Franco Maloberti.
http://www.wikipedia.org/

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