CH 2 PDF
CH 2 PDF
2.1 Introduction
HVAC and HVDC of well exceeding several million volts are required
for testing power apparatus that is rated for operation at EHV or UHV
transmission level. High impulse voltage is required for testing purposes to
simulate not only the amplitude and shapes of voltage at which the equipment
operates, but also to determine the factors of safety for which even much higher
test parameters are necessary. There are always some interactions between the
HV generating circuits used and the test results required. Power system
engineers, therefore require high voltages, generally for the following tasks:
1. Testing the insulation of power apparatus which may require test voltage
of up to 1.2 MVAC (depending on their normal operating voltage).
High voltage testing is the final step in ensuring the dielectric quality of
the developed insulation material. Similarly, the complete HV system or device
is tested to ensure its integrity and performance. Chapter 11 deals with various
aspects of high voltage testing. This chapter discusses the basic circuits used for
generating the test voltages. These include HVDC, HVAC, very low frequency
(VLF) AC voltages, and various types of HV impulses. High voltage testing
normally requires only moderate (from few mA up to a few A) current. Thus,
the main emphasis is usually on achieving the required voltage level with
minimum possible cost.
-31-
2.2 High Voltage DC Generation
Fig. (2.1). Halfwave rectifier: (a) circuit; (b) output voltage for resistive load.
-32-
a
Fig. (2.2). Voltage doubler; (a) circuit, (b) source voltage, (c) voltage across C1,
(d) voltage across D1, (e) output voltage at no load, (f) output voltage
at load.
-33-
Ripple voltage (V) and voltage drop (V) are the two important
parameters to be considered when dealing with rectification of HVAC to HVDC.
In reference to Fig. (2.2f), V is defined as half of the difference between the
maximum and the minimum values of output voltage. Thus,
V = Vn.l - Vf .l (2.2)
V V
RF = (2.3)
(VfL )
where Vn.l and Vf.l are average values of no load and full load DC output
voltages, respectively.
The maximum voltage across the diodes as well as the capacitor is 2Vp.
Since the cost of these components increases at much higher rate than the
increase in their voltage rating, it is not economical to increase their voltage
rating for generation of high voltage. Instead, two or more doublers circuits are
connected in cascade to form a voltage multiplier circuit. Fig. (2.3) shows a
multiplier circuit consisting of three stages (n=3) with maximum output voltage
of 6Vp. For voltage multiplier circuit, V and V are given as [1]:
n n 1
I
V (2.4)
4fC
I 2 3 n2 n
V = n (2.5)
fC 3 2 6
-34-
equations that V is proportional to n2 whereas V is proportional to n3. Thus,
the number of stages in such a circuit is the limiting factor as it influences
adversely the values of V as well as V.
HVAC testing sources ranging from about 10 kV rms up to more than 1.5
MV rms are available due to the continuous development of AC transmission
voltages up to about 1200 kV. For routine testing, the voltage level for power-
-35-
frequency testing is always related to the highest rms phase-to-phase voltage
Vm of the power transmission system. This rated power-frequency short
duration withstand voltages, Vt is different for different apparatus within a
transmission system. For Vm < 300 kV, the ratio of Vt/Vm is up to about 1.9
while it decrease with higher values of Vm.
-36-
peak-to-rms value is within (2 5%), the rms value of total harmonics does
not exceed 5 % of the rms value of the fundamental.
-37-
resistor are between 10 k and 100 k and these will usually not influence
the test conditions.
There are three main methods for HVAC generation which are briefly
described next.
-38-
the currents in the first, the second and the third transformer's primary windings
are 3Ip, 2Ip and Ip, respectively. The net internal impedance of this circuit (Xeq)
can be derived as follows. In this derivation, it is assumed that the leakage
reactances of the primary, the secondary and the exciting (tertiary) windings of
unit i are xpi, xhi, and xei, respectively.
Assuming that transformer turns ratios are such that the per unit value of
Ip = Is = Ie (i.e. Io = Ip = I). The total reactive power is given as:
If Xh1 = Xh2 = Xh3 = Xh, and Xe2 = Xe3 = Xe, and Xp1 = Xp2 = Xp3 = Xp, then;
Q = I2 Xeq = I2 [3 X h + 5 Xe + 14 X p] (2.9)
-39-
Thus,
Xeq = 3 Xh + 5 Xe + 14 Xp (2.10)
n
Xeq = [Xhv + (n - 1) Xev + (n + 1 - v ) Xpv]
2 2
(2.11)
v=1
-40-
Vs
VL = (2.12)
1 - LT CL
2
1. Less power requirement from the source (< 10% of kVA required for
testing).
5. More than one resonance circuit can be cascaded to obtain even higher
voltages.
-41-
frequency must be continuously variable to achieve conditions of resonance.
This set-up is shown in Fig. (2.7) where an exciter supply, connected to the
LV mains, excites the series resonance circuit with a variable frequency. The
reactor can be designed for high-quality factors, which increase with
frequency up to some 100 Hz. The inductance can be single unit or any
number of units in series and/or in parallel. Here, Ct represents the test object
and other shunt capacitances. For specified testing frequency, f the resonance
is achieved when:
1
f (2.13)
2 L n C t
Fig. (2.7). Schematic diagram of series resonance test circuit with variable test
frequency [1].
1
Ln (2.14)
22 f n2 C n
-42-
The choke's maximum or nominal current I , which overheats the coil
or saturates the iron core should be checked. As the losses are very small, R
<< Ln within the whole frequency range and In may directly be derived from
the voltage drop across Ln, which is nearly the full rated voltage Vn.
Vn Cn
In Vn (2.15)
2 f n L n Ln
f Cn 1
(2.16)
fn Ct Cn / Ct
For Ct Cn, the reactor Ln can be used up to the full rated voltage, Vn.
Although the frequency increases according to eqn (2.16), the load current will
always be lower than In. The relationship of the normalized current for Ct Cn
is as follows:
I fn Ct
(2.17)
In f Cn
For Ct > Cn this circuit may still be applied, if the testing voltage, V =
Vt, is reduced to keep the current at its nominal value, In. As the current, I is
always proportional to the testing voltage, then
I V Ct
t (2.18)
I n Vn Cn
-43-
and one can apply this equation to show the necessary reduction of the testing
voltage for Ct > Cn, if I is to be limited to In.
Vt 1
(2.19)
Vn Cn / Ct
-44-
2.3.4 Generation of high frequency high AC voltage
1. The absence of iron core in transformers results in saving in cost and size,
3. Voltage builds up slowly over a few cycles and hence no damage is caused
due to switching surges, and
The commonly used high frequency resonant transformer is the Tesla coil,
which is a doubly tuned resonant circuit shown schematically in Fig. (2.9). The
primary voltage rating is 10 kV and the secondary may be rated to as high as
500 to 1000 kV. The primary is fed from a DC supply through the capacitor C1.
A spark gap, G connected across the primary, is triggered at a desired voltage V1
which induces a high self-excitation in the secondary. The primary and the
secondary windings (L1 and L2) are wound on an insulated former with no core
(sir-cored) and are immersed in oil. The windings are tuned to a frequency of 10
to 100 kHz by means of capacitors, C1 and C2.
The output voltage V2 is a function of the parameters L1, L2, C1, C2, and
the mutual inductance M. Usually, the winding resistance will be small which
causes damping of the oscillations. Fig. (2.10) shows waveform of typical high
voltages with high frequency damped oscillations which are used for GIS testing
[3].
-45-
Fig. (2.9). Resonant transformer for the generation of high voltage with high
frequency damped oscillation.
Then;
1 t di di
V1
C1 0
i1 dt L1 1 M 2
dt dt
(2.20.a)
and,
1 t di 2 di
0
C2 0
i 2 dt L 2
dt
M 1
dt
(2.20.b)
Converting the above two equations into s-domain by Laplace transform, we get:
V1 1
L1s I1 MsI 2 (2.21.a)
s C1s
and
-46-
1
0 (Ms)I1 L 2 s I2 (2.21.b)
C 2s
Fig. (2.10). High voltage waveform with high frequency damped oscillations
used for GIS testing [3].
Where, I1 and I2 are the Lapace transformed values, of i1 and i2. The output
voltage V2 across the capacitor, C2 is
t
1
C 2 0
V2 = i 2 dt (2.22a)
-47-
I2
V2 s (2.22b)
C 2s
V2
MV1 1
cos 1 t cos 2 t (2.23a)
L1 L 2 C1 2 12
2
where,
M2
2 1 1 K c2 (2.23b)
L1L 2
2
1,2
2 22
1
2
2 22
1
2
12 22 1 K c2
(2.23c)
1 1
1 and 2 (2.23d)
L1C1 L 2C 2
L2
V2 max V1e (2.24a)
L1
where,
2 1
e , and (2.24b)
1 a 2
4a
L 2 C 2 12
a (2.24c)
L1C1 22
-48-
A more simplified analysis for the Telsa coil may be presented by
considering that the energy stored in the primary circuit i.e. in the capacitance, C1
is transferred to C2 via the magnetic coupling. If W1 is the energy stored in C1
and W2 is the energy transferred to C2 and if the efficiency of the transformer is
, then W2 = W1 or
1 1
C1V12 C 2 V22 (2.25)
2 2
which gives
C1
V2 V1 (2.26)
C2
-49-
while the 0.1 Hz pulse wave may develop into a breakthrough channel. Due to
sinusoidal transitions between HV pulses, traveling waves are not generated. Due
to continuous polarity change, dangerous space charge build up cannot occur.
Cables can be tested with an AC voltage up to three times conductor-to-ground
voltage with a device comparable in size, weight, and power requirements to a
DC test set.
A schematic circuit diagram of a typical VLF (0.1 Hz) test set is shown in
Fig. (2.11). The high voltage DC is converted to a high voltage having a
frequency of 0.1 Hz. A rotating rectifier in conjunction with a high voltage choke
converts the DC signal into an alternating AC signal. Fig. (2.12) shows typical
voltage wave shape produced by the VLF generator. The maximum 0.1 Hz
alternating voltage output of the very low frequency (VLF) test set is typically 36
kV rms into a maximum capacitive load of 3 F. Low frequency voltage
withstand test is also employed to assess aging of polymeric cables while in
service. They are frequently employed in lieu of the high voltage DC test, which
is believed to cause damage to aged polymeric cable insulating system, under
some conditions that may still have some remaining useful life under normal
operating AC voltage conditions [4].
-50-
Fig. (2.11). Schematic of a very low frequency (VLF) high voltage test set with
cable specimen under test [4].
-51-
2.4.1 Single stage impulse generator
where and are time constants of the circuit and control the wave decay and
rise rates, respectively.
-52-
impulses, the tolerance allowed in peak value is 3%. For front time, the
tolerances allowed are 30% and 20% for lightning and switching impulses
respectively. On the other hand, the allowed tolerances for tail time are 20%
for lightning and 60% for switching impulses [5].
-53-
Equation (2.27) can be derived for the circuit of Fig. (2.13c) using either
time or frequency domain circuit analysis and can be written as:
V
V(t) = [exp(-t) - exp(-t)] (2.28)
k( - )
where
a a
, = ( )2 - b (2.29)
2 2
where for circuits of Fig. (2.13c) and (2.13d), the constants b and k are the same
for both circuits and are given as:
1
b= , k = R1C 2 (2.30.a)
R 1 R 2 C1 C 2
However, for high voltage efficiency circuit of Fig. 2.13d, a, is given as:
1 1 1
a = + + (2.30.b)
1 1
R C R C
1 2 R 2 1
C
and for low voltage efficiency circuit of Fig. 2.13c, a, is given as:
1 1 1
a = + + (2.30.c)
R 1 C1 R1 C 2 R 2 C 2
-54-
Fig. (2.14). Impulse waveshape parameters, (tf)L = front time for lightning
impulses, (tf)s = front time for switching impulses and tf = time to
half value for both cases and V = initial voltage across C1.
C1 C2
t f = 3 R1 (2.31)
C1 + C2
-55-
specified such that C2 << C1. C2 can also be used as the voltage divider for
measuring and recording the output voltage. The values of R1 and R2 can be
found accurately by substituting the values of tf and tt in equation (2.28) and
finding and ß using numerical techniques. Then the values of R1 and R2 can
be evaluated by using equations (2.29) and (2.30) and the assumed values of C1
and C2. The values of and ß and consequently R1 and R2 can also be estimate
by using the following approximate formulae [2].
1 1
= , = (2.33)
R 2 C1 C 2 R1
The single stage impulse generator circuit shown in Fig. (2.13) is one of
the several circuits in which either the position of R2 is changed, or it includes
some additional resistors or inductors [2]. Figure (2.15) shows examples of
these circuits.
tf/tt
(s/s)
1
s 1 1
s 1
Vp
Vo
1.2/5 3.48 0.8 0.77
1.2/50 68 0.4 0.96
1.2/200 284 0.38 0.99
170/1700 2200 43.5 0.91
250/2500 3160 62.5 0.9
650/2600 2500 250 0.75
400/3000 3590 112 0.87
500/3000 3380 155 0.82
-56-
2.4.2 Multistage impulse generator
-57-
Fig. (2.16). Multistage impulse generation; (a) main circuit, (b) stage capacitor
charging period, (c) capacitor discharging period, (d) equivalent
single stage circuit.
-58-
shows the same circuit during the stage capacitor charging period, while
Fig.(2.16c) shows the same circuit during the discharge period. Fig.(2.16d)
shows the equivalent single-stage circuit which can be used to analyze the
multistage circuit. In this circuit, only C1 is distributed throughout all the stages.
Generally in multistage impulse circuits, R1 and R2 can also be distributed
throughout the different stages. However, C2 is normally left as a single unit
which also works as a voltage divider or represents the load capacitance. Figure
(2.17) shows a multistage generator circuit where C1, R1 and R2 are distributed
throughout the stages.
The peak output impulse value Vp can not exceed nV since the initially
available charge Vo(C1)eq will be distributed between (C1)eq and C2. The voltage
efficiency of such generators is therefore, given by:
Vp
(2.34)
nV
-59-
Fig. (2.17). Multistage impulse generator circuit incorporating the wave-shaping
resistors within the generator stages.
-60-
(c) Generator capacitors and spark gaps
1
W C1 Vp2 (kJ/stage) (2.35)
2
-61-
lightning and switching impulse voltages can be covered using these resistors
either in series or in parallel combinations [6].
The shunting of load must be taken into account. Capacitive load, such as
cables will effectively increase C2 and hence increase tf. On the other hand,
inductive load such as reactors and transformers may distort the wave shape.
The influence of the load inductance on the impulse output voltage is illustrated
in Fig. (2.18).
Vo V(t)
V(t)
Vmax
0.5 Vmax
Fig. (2.18). Effect of varying the inductance across the output terminals on the
generated impulse voltage wave shape V(t).
-62-
(e) Voltage dividers
-63-
Fig. (2.19). Impulse generator triggering circuit using a Trigatron spark gap.
Fig. (2.20). Block diagram of triggering unit with its interface connections with
impulse generator system.
Recently the triggering has become faster and easier to control using
thyristors and transistors for switching where the delay times are only in the
range of nanoseconds. Also these new systems can be easily linked to digital
-64-
measuring system for better coordination with other measurements and operation
of the impulse generator [6]. Fig. (2.20) shows the interfacing of triggering unit
to the impulse generator system.
Circuit # 1
Circuit # 2
-65-
parallel to a load capacitance, C2 of the test object. Through autotransformer
action, switching impulses of proper waveform can be generated across the test
object. The disadvantage of this technique is the considerable amount of high-
frequency distortion caused in the output waveform. Furthermore, the size of the
capacitor, C1 for producing a reasonable output voltage may be large. Variations
of the front of the generated impulse are achieved by adding inductances of
different magnitudes in series with C1.
Circuit # 3
In this circuit, the wave front and the wave tail times are controlled by
changing the values of R and L simultaneously. With a given generator
capacitance, C and upon choosing a suitable value for L, the wave front time or
the value of is determined. The wave tail time or the value of is controlled
by the value of R in the circuit. The advantage of this circuit is its simplicity.
But the waveshape control is not flexible and independent. Another
disadvantage is that the basic circuit is altered when a test object which will be
mainly capacitive or inductive, is connected across the output. Hence, the
waveshape gets changed with the change of the test object.
In table (2.2) the output voltages are expressed in s-domain. To get the
voltage in time domain, numerical solutions should be used for circuits (1) and
(2). For circuit (3) an analytical solution can be obtained.
-66-
Table (2.2) Special impulse generating circuits and their output voltage
waveforms [9].
When a full wave surge occurs on a power network and a flashover takes
place across a bushing or an insulator etc., the voltage instantaneously falls to
zero resulting in a chopped impulse wave. The voltage chopping can take place
either on the front, at the peak or on the tail of a surge. To simulate such a
chopped surge wave, a rod-rod chopping gap is normally placed in parallel with
the test object across the impulse generator. The distance of the chopping gaps
can be adjusted to control the width of the applied chopped wave during the
-67-
chopped impulse testing. Triggered chopping gaps are often used to control the
chopping time. Chopped impulse testing is required in some applications as
discussed in Chapter 11.
The circuit of Fig. (2.22) can be used to produce one of the standard
current waveforms. The basic difference between this circuit and those
generating impulse voltages is the location of sphere gaps and the capacitors.
-68-
In addition, the capacitances are much larger and the resistors are much
smaller in magnitude in the current generating circuit.
V
i(t) = exp (-t) sin t (2.36)
L
and 1 / LC R 2 / 4 L2 . (2.38)
1
T1 sin 1 LC (2.39)
If the test object is an ideal surge arrester, the following approximate expressions
are used for determining the waveforms of the impulse current [10].
-69-
V Vr
Peak current = (2.40)
L/C
n 1
T90% 2 L/C (2.43)
n
-70-
Fig. (2.23). Circuit for producing rectangular current waveform.
2 r
t (2.44)
c
where r is the relative permittivity of line insulant and c is the speed of light.
-71-
a simple circuit to generate ns voltage pulses. A capacitor is rapidly charged and
discharged utilizing a rotary spark gap switch. Rea [14] analyzed the
characteristics of ns pulse generator circuit of Fig. (2.24) which is based on
Masuada's idea. In this case, the pulse rise-rate can be controlled by R and Li
while the pulse repetition rate is controlled by the rotation speed of the spark
gap. To improve the circuit performance, a DC supply, VDC, is added as a bias
and coupled to the circuit through C 10 Cp. It is found that the intensity of the
corona discharge produced by voltage pulses of this circuit depends on total
voltage magnitude, pulse voltage rise-rate, value of Cp and the shape of corona
electrode. Bajew et al [15] used a four stage Marx generator with rotating spark
gaps to generate ns voltage pulses. The main problems encountered in this
circuit are relatively longer rise-time (tens to hundreds of ns), the energy loss in
the sparking of the rotary gaps and the erosion of the spark gap. Alternatively,
HV semiconductor switching arrangement is introduced to overcome the
problems of mechanical switching where the pulse repetition rate can be
increased to very high values [16]. A typical waveshape produced by this circuit
is shown in Fig. (2.25) where the rise-time is around 35 ns.
-72-
Fig. (2.25). Voltage pulse generated by ns pulse circuit using semiconductor
switching. (Y-axis=5 kV/div and X-axis=20 ns/div).
There are several commercially available pulse generators which can give
pulses with rise time as low as 50 ps and output voltage as high as 200 kV [17].
Generators are generally categorized according to primary switch type. Some of
these switches are spark, Reed, semiconductor opening switch (SOS) drift step
recovery device (DSRD), GaAs thyristor and inverse recovery diode (IRD).
Solution
i) Ripple voltage
-73-
From equation (2.4) and for n = 1 (doubler circuit)
10 2 * 2
n n 1
I
V
4fC 4 * 60 * 2 *10 8
4.17 kV
I 2 3 n2 n 10 2 2 1 1
V n
fC 3 2 6 60 * 2 * 10 8 3 2 6
8.33 kV
V V 12.5
6.25%
2V 200
Example # 2.2
HVDC multiplier circuit has ten stages (n=10) with C = 0.12 F at each
stage. Supply voltage = 150 kV (peak), f = 60 Hz. When the load current is =
6 mA find (i) ripple voltage ii) voltage drop iii) optimum number of stages
from output voltage point of view; and iv) the ripple factor.
Solution
i) Ripple voltage
-74-
ii) Voltage drop
595 22.92
20.6%
2 *150 *10
Example # 2.3
A 220 V/345 kV, 200 kVA testing transformer to be used for cable
testing has 10% leakage reactance and 2% resistance. The cable has to be
tested at 600 kV, 60 Hz while charging current is 0.5A. Find the required
value of the series inductor to be connected with the transformer to achieve
resonance. Assume (Rind = 1.8% of Xind). Find the primary voltage of the
transformer during this test. Also calculate rated current of this transformer
and the input power.
Solution
-75-
Transformer reactance Xt is given as
X L kV 2 10 3452
Xt * *103 * *103 59.5 k
100 kVA 100 200
2
Transformer resistance Rt = (59.5) = 11.90 k
10
Vc 600
Xc 1200 k
Ic 0.5
1140.5 * 103
L 3025 H
2 * 60
1.8
Inductor resistance *1140.5 = 20.5 k
100
200
Transformer rated current = 0.58 A
345
220 * 103
Thus, the input primary voltage = * 18.8 = 12 V
345 * 103
-76-
Example # 2.4
Solution
1 1 1
a
R 1C1 R 1C 2 C1R 2
1 1 1
6
9
6 2.556 *10
6
0.12 *10 * 200 2 *10 * 200 0.12 *10 * 600
1
b 3.47 *1010
R1R 2 C1C 2
k = R1C2 = 4 * 10-7
2
a a
, b
2 2
2
2.556 2.556 *103
*103 3.47 *1010
2 2
-77-
vt
Vo
exp t exp t
k
vt
4 *10
7
100
2.54 *10 6
1.4 *10
4
exp 1.4 *10 t exp 2.54 *10
4 6
where t is in s.
Fig. (e2.4) shows the plot of v(t) against t. From this figure
t 0.9 t 0.3
tf = = 1.17 s,
0.6
tt 51.8 s
and Vp = 96.63 kV
Fig. (e2.4)
-78-
Another method to find tpeak is to differentiate v(t) with respect to t and
equate it to zero.
2.54
= exp [tp (2.54 - 0.014)]
0.014
5.222 = 2.5263 tp
tp = 2.07 s.
n
Note tp =
To find tt find Vp
Vp = V(tp) = 96.6 kV
Vp
Then when v(t) is , t = tt
2
C1
(for high efficiency circuit)
C1 C 2
-79-
Example # 2.5
Using the same data in example # 2.4 repeat the calculation for the
circuit of Fig. (2.15.d).
Solution
1 1 1
a
R 1C1 R 1C 2 R 2 C 2
1 1 1
6 9
0.12 *10 * 200 2 *10 * 200 600 * 2 *10 9
3.375 *10 6
2
3.375 *10 6 3.75 *10 6
3.47 *1010
2 2
3.364 *10 6
v t
100
4 *10 7
3.364 *10 6 1*10 4
[exp (-1 * 104 t) - exp (3.364 * 106 t)]
where t is in s
ln / 5.8
tp 1.73 .s
3.354 * 106
-80-
Fig. (e2.5) shows the plot of V(t). From this figure
can be found to be
C1 R2 600
. 0.983 * 73.73%
C1 C 2 R1 R 2 200 600
As can be seen that the main difference between the low and high
circuit is the value of Vp. There is a small difference in the value of tf and
some differences in the values of tt and tp.
Fig. (e2.5)
Example # 2.6
-81-
Solution
C1C 2
t f 3R 1
C1 C 2
R1 400
R1 + R2 = 2268,
1
284 *10 6 and
1
0.38 *10 6
1
,
R 2 C1
1
,
C 2 R1
-82-
Thus
284 *10 6
R2 2272 2.8 k
0.125 *10 6
0.38 *10 6
R1 380
1*10 6 9
V t
Vo
exp 1t exp t
k
-83-
Example # 2.7
A ten stage impulse generator have C1 = 0.2 F per stage and external
load capacitor C2 = 1 nF. Using two methods, find the values of shaping
resistors at each stage to generate standard lightning impulse (1.2/50 s). Also
find the circuit efficiency. When DC charging voltage is 100 kV what is
generator energy rating.
Solution
Fig. (e2.7).
n = 10,
Thus, nVo = 1000 kV, C1/n = 0.02 F, C2 = 1 nF and the front and tail
resistors are 10R1 and 10R2.
0.2
*10 6 *10 9
tf = 1.2 *10 6 3 10R 1 10
0.2 *10 6 10 9
10
-84-
R1 = 42 . Also
0.2
tt = 50 * 10-6 = 0.7 * 10 (R1 + R2) *10 6 10 9
10
R2 = 300
1 1
68 *10 6 and 0.4 *10 6
10 R2 C1 = 68 * 10-6
68 *10 6
R2 = = 340
0.2 *10 6
10 R1 C2 = 0.4 * 10-6
0.4 *10 6
R1 = = 40
10 *10 6
1 C1 2
The generator energy rating = Vp
2 10
1 0.2 *10 6
2 10
(952) 2 * 103
2
= 9.06 kJ
Example # 8
-85-
V(t) = 150 (e-316t - e-16000t) kV
Solution
We first find tf & tt. For this purpose plot V(t) as function of t. The
plot is shown in Fig. (e2.8). From such a plot we can find tf and t0.5
Fig. (e2.8).
16000
n / 316
tf = tp = 250 s
16000 316
Alternatively
Vp = V(tf)
= 150 e 316*250*10
6
e 16000*250*106
= 131.7 kV
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Thus,
Vp
2
= 65.85 = 150 e 316 t f e 16000 t f
From the above equation tf is found to be 2500 s
Example # 9
V
I(t) = exp. (-t) sin t
L
1
T1 = sin-1 / LC
1
10-5 = sin-1 10-5
1 R2
LC 4L2
R = 1.99 k 2 k
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Thus from Equation (2.37)
Fig. (e2.9).
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Questions / Problems
4. Derive the formula for the optimal number of stages from output
voltage point of view in a HVDC voltage multiplier circuit.
11. Define the meaning of the front time and time to half value for standard
lightning and switching impulses. Also specify values of these times for
standard lightning and standard switching impulses. Write the
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mathematical equation for an impulse voltage and explain how this
equation can be used to define a standard lightning impulse and a
standard switching impulse.
12. Why are impulse voltages used for testing high voltage equipment?
What are the reasons for the use of standard voltage waveforms?
13. Discuss the two types of high voltage impulses that are generated in the
laboratory for the purpose of testing.
15. Define the front and tail times for lightning and switching impulses.
Give the tolerances as given by IEC specifications for standard
impulses.
16. Sketch two circuits used to generate HV impulses. Explain the basic
difference between these circuits.
17. Derive the impulse output voltage in time domain (equation 2.28).
18. How can we control the front-time and tail-time in an impulse circuit?
How is the peak amplitude of an impulse controlled?
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22. Sketch various circuits used to generate switching impulse voltage.
23. Discuss the effects of inductance of the impulse circuit on the output
voltage waveform.
24. Explain how an impulse current is generated. Sketch the circuit, and
derive the output formula. How is the current wave shape controlled?
28. For HVDC voltage multiplier, draw the voltage drop and ripple voltage
as functions of:
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be represented by a resistance of 15 M, what are the values of voltage
ripple and voltage drop? Calculate the output DC voltage for this
system.
31. A 25-M resistor is the load of a HVDC voltage doubler circuit. The
output capacitance is 1500 nF and the source voltage is 250 kV (rms),
60 Hz. Calculate the output voltage, the voltage ripple and the voltage
drop.
32. Repeat problem 30 above by assuming that the circuit has 4 stages and
the external load resistance is 100 M.
a) No load. b) 50 M load.
34. Establish a table relating the reactive loading of the primary and the
total pu reactance of a cascaded transformer and the number of stages
n. Let Xp = 0.02 pu, Xh = 0.04 pu, and Xe = 0.05 pu. Comment on the
results. How many stages will you recommend in this case?
35. A 250 kVA, 400 V/345 kV testing transformer has 10% leakage
reactance and 2% resistance on 250 kVA base. A cable has to be tested
at 500 kV using the above transformer as a resonant transformer at 60
Hz. If the charging current of the cable at 500 kV is 0.45A, find the
series inductance required. Assume that the inductor used has a
resistance equal to 2% of its reactance. What will be the primary
voltage of the transformer?
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36. Sketch the output voltage for the circuits shown in Fig. (p2.36). In each
case first find the charging and/or discharging time constants (s).
Fig. (p2.36).
37. Derive the voltage efficiency for the impulse generating circuits shown
in Fig. (p2.37).
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Fig. (p2.37).
Hint, first find tf, tt and Vp. Then assume C1 and C2 and calculate the
required R1 and R2.
40. Draw the output voltage for a multistage generator circuit having the
following data: DC charging voltage = 125 kV, C1 = 30 F/stage, R1 =
40 /stage, R2 = 4.5 k/stage, C2 = 0.2 nF and n = 12 stages. From the
voltage wave find tf and tt. Also find the generator energy, and its
voltage efficiency.
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/stage, R2 = 5 k/stage, C2 = 0.5 nF and n = 6 stages. Assume
external front resistor = 50 ohms. Find tf and tt, Vp and .
43. The charging voltage for impulse current generator is 100 kV. Find the
value of a capacitance which will give t2 (time to half value) 1300 s
when L = 2 mH and R = 1 . Find the output current formula and draw
the current waveform.
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References
[3] A. Alessa and M. Nuaena, "High Voltage Tests for GIS at Site", 1st
Applied Symp an O & M of Power Networks, March 1999, Riyadh,
Saudi Arabia.
[9] N.H. Malik, A.A. Al-Arainy, and M.I. Qureshi, "Electrical Insulation in
Power Systems", Marcel Dekker Inc., New York, USA, 1998.
[10] IEC 60099-1, "Non-Linear Resistor Type Gapped Surge Arrestors for AC
Systems. IEC, Geneva, Switzerland, 1999.
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[12] J.M. Meek and J.D. Cruggs, "Electrical Breakdown of Gases", John
Wiley & Sons, New York, USA, 1978.
[16] A. Al-Arainy, S. Jayaram and J.D. Cross, "Pulsed Corona for Removing
Volatile Impurities from Drinking Water", Proc. of 12th Int. Conf. on
Cond. and Breakdown in Diel. Liquids (12-ICDL 96), Rome, Italy, pp.
427-431, July 1996.
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