0% found this document useful (0 votes)
85 views93 pages

Unit 1 - 18EC61

The document discusses CMOS VLSI design and provides information on various topics related to MOS transistors and CMOS fabrication. It begins with an overview of MOS transistor operation and the enhancement and depletion modes. It then covers the CMOS fabrication process and discusses topics like the P-well process, N-well process, and twin tub process. The document also summarizes second order effects in MOS transistors, static CMOS inverter characteristics, noise margins, and scaling of MOS circuits. It provides scaling factors for device parameters and discusses the limitations of scaling at smaller dimensions.

Uploaded by

Pritam Sarkar
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
0% found this document useful (0 votes)
85 views93 pages

Unit 1 - 18EC61

The document discusses CMOS VLSI design and provides information on various topics related to MOS transistors and CMOS fabrication. It begins with an overview of MOS transistor operation and the enhancement and depletion modes. It then covers the CMOS fabrication process and discusses topics like the P-well process, N-well process, and twin tub process. The document also summarizes second order effects in MOS transistors, static CMOS inverter characteristics, noise margins, and scaling of MOS circuits. It provides scaling factors for device parameters and discusses the limitations of scaling at smaller dimensions.

Uploaded by

Pritam Sarkar
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 93

Faculty:

Subject: CMOS VLSI Design Swamy T N


Assistant Professor
Code: 18EC61 ECE Department
Dr. AIT
Semester: VI , ‘B’ section Email: [email protected]
TNSWAMY, Assistant Professor, DR.AIT 1
Contents

• Enhancement and Depletion mode operation MOS transistors (p & n type),


• MOS fabrication (p & n type),
• CMOS fabrication.
• MOS device design equations,
• Second order effects of MOS,
• Static CMOS Inverter DC Characteristics,
• Beta Ratio Effect, Noise Margin, Pass Transistor, Transmission Gate, Tristate Inverter.
• Scaling of MOS Circuits: Scaling models and scaling factors,
• Scaling factors for device parameters,
• Limitation of Scaling (Points).

TNSWAMY, Assistant Professor, DR.AIT 2


Integrated Circuit Era:

• Transistor was first invented by William.B.Shockley, Walter Brattain


and John Bardeen of Bell laboratories.
• In 1961, first IC was introduced.

TNSWAMY, Assistant Professor, DR.AIT 3


Levels of Integration:
Levels Number of Transistors Examples
Small Scale Integration(SSI) 10-100 Planar devices, Logic Gates. Flip-Flops

Medium Scale Integration (MSI) 100-1000 Counters, Multiplexers, Adders

Large Scale Integration (LSI) 1000-20,000 8 bit Microprocessors, ROM, RAM

Very Large Scale Integration (VLSI) 20,000-1,000,000 16 and 32 bit microprocessors, DRAM

Ultra Large Scale Integration (ULSI) 1,000,000-10,000,000 Special Processors, Virtual Reality
Machines, Smart Sensors

Giant Scale Integration (GSI) >10,000,000

TNSWAMY, Assistant Professor, DR.AIT 4


Moore’s Law:
The number of transistors embedded on the chip doubles after every one and a half years.
The number of transistors is taken on the y-axis and the years in taken on the x-axis. The diagram also shows the
speed in MHz.

TNSWAMY, Assistant Professor, DR.AIT 5


Various Technologies:

Gallium arsenide (GaAs)


Emitter-Coupled Logic (ECL)
Bipolar Complementary Metal Oxide Semiconductor(BiCMOS)
TNSWAMY, Assistant Professor, DR.AIT 6
MOS (METAL OXIDE SEMICONDUCTOR)

TNSWAMY, Assistant Professor, DR.AIT 7


Basic MOS Transistors
• nMOS(Enhancement and depletion)
• pMOS (Enhancement and depletion)

TNSWAMY, Assistant Professor, DR.AIT 8


Basic MOS Transistors

nMOS Enhancement nMOS Depletion

TNSWAMY, Assistant Professor, DR.AIT 9


Basic MOS Transistors

TNSWAMY, Assistant Professor, DR.AIT 10


Enhancement Mode Transistor Action

TNSWAMY, Assistant Professor, DR.AIT 11


nMOS Fabrication
• Thermal Oxidation,
• Diffusion,
• Rapid Thermal Processing,
• Ion implantation,
• chemical vapor deposition,
• photolithography,
• Etching,
• Metallization.
• Integrated Circuits: Evolution of ICs: CMOS Process Integration, Integration
of Other Circuit Elements.
TNSWAMY, Assistant Professor, DR.AIT 12
Fabrication Process(nmos)

TNSWAMY, Assistant Professor, DR.AIT 13


TNSWAMY, Assistant Professor, DR.AIT 14
TNSWAMY, Assistant Professor, DR.AIT 15
TNSWAMY, Assistant Professor, DR.AIT 16
TNSWAMY, Assistant Professor, DR.AIT 17
TNSWAMY, Assistant Professor, DR.AIT 18
TNSWAMY, Assistant Professor, DR.AIT 19
TNSWAMY, Assistant Professor, DR.AIT 20
TNSWAMY, Assistant Professor, DR.AIT 21
TNSWAMY, Assistant Professor, DR.AIT 22
TNSWAMY, Assistant Professor, DR.AIT 23
TNSWAMY, Assistant Professor, DR.AIT 24
TNSWAMY, Assistant Professor, DR.AIT 25
TNSWAMY, Assistant Professor, DR.AIT 26
TNSWAMY, Assistant Professor, DR.AIT 27
TNSWAMY, Assistant Professor, DR.AIT 28
TNSWAMY, Assistant Professor, DR.AIT 29
TNSWAMY, Assistant Professor, DR.AIT 30
TNSWAMY, Assistant Professor, DR.AIT 31
TNSWAMY, Assistant Professor, DR.AIT 32
TNSWAMY, Assistant Professor, DR.AIT 33
TNSWAMY, Assistant Professor, DR.AIT 34
CMOS Fabrication
• The P-well Process
• The N-well Process

TNSWAMY, Assistant Professor, DR.AIT 35


The P-well Process

TNSWAMY, Assistant Professor, DR.AIT 36


The P-well Process

TNSWAMY, Assistant Professor, DR.AIT 37


N-WELL Process

TNSWAMY, Assistant Professor, DR.AIT 38


N well process

TNSWAMY, Assistant Professor, DR.AIT 39


The Berkeley n-well process

TNSWAMY, Assistant Professor, DR.AIT 40


The Twin-Tub Process

TNSWAMY, Assistant Professor, DR.AIT 41


TNSWAMY, Assistant Professor, DR.AIT 42
TNSWAMY, Assistant Professor, DR.AIT 43
TNSWAMY, Assistant Professor, DR.AIT 44
TNSWAMY, Assistant Professor, DR.AIT 45
TNSWAMY, Assistant Professor, DR.AIT 46
TNSWAMY, Assistant Professor, DR.AIT 47
TNSWAMY, Assistant Professor, DR.AIT 48
TNSWAMY, Assistant Professor, DR.AIT 49
Second Order Effects
• Threshold voltage – Body Effect
• Subthreshold Region
• Channel-Length Modulation
• Mobility Variation
• Drain Punch-through
• Impact Ionization – Hot Electrons

TNSWAMY, Assistant Professor, DR.AIT 50


Threshold Voltage-Body Effect
The Threshold Voltage Vt is not constant with respect to the
voltage difference between the substrate and the source of the
MOS transistor. This is know as Substrate-bias effect or body
effect.

TNSWAMY, Assistant Professor, DR.AIT 51


Numerical (to find gamma, bulk potential, Vt at
Vsb = 2.5V)

TNSWAMY, Assistant Professor, DR.AIT 52


TNSWAMY, Assistant Professor, DR.AIT 53
TNSWAMY, Assistant Professor, DR.AIT 54
TNSWAMY, Assistant Professor, DR.AIT 55
TNSWAMY, Assistant Professor, DR.AIT 56
TNSWAMY, Assistant Professor, DR.AIT 57
TNSWAMY, Assistant Professor, DR.AIT 58
TNSWAMY, Assistant Professor, DR.AIT 59
The CMOS Inverter-DC characteristics

TNSWAMY, Assistant Professor, DR.AIT 60


TNSWAMY, Assistant Professor, DR.AIT 61
TNSWAMY, Assistant Professor, DR.AIT 62
TNSWAMY, Assistant Professor, DR.AIT 63
βn/βp Ratio β(MOS transistor Gain Factor)

βn/βp = 1

It is desirable since it allows a


capacitive load to
charge and discharge in equal times

TNSWAMY, Assistant Professor, DR.AIT 64


Noise Margin:
-----defined as allowable noise voltage at the input of
a gate so that output is not affected.

TNSWAMY, Assistant Professor, DR.AIT 65


Pass Transistors

TNSWAMY, Assistant Professor, DR.AIT 66


Pass transistor Working

TNSWAMY, Assistant Professor, DR.AIT 67


Transmission Gate(TG)

TNSWAMY, Assistant Professor, DR.AIT 68


Transmission Gate

TNSWAMY, Assistant Professor, DR.AIT 69


Tristate Inverter

TNSWAMY, Assistant Professor, DR.AIT 70


Scaling of MOS circuits
• The process of reducing vertical and horizontal dimensions of
MOSFET is called scaling.
• Scaling factors
• W, L, tox, junction depth,

TNSWAMY, Assistant Professor, DR.AIT 71


Benefits of scaling
• Increased component density
• Increased speed
• Reduction in power consumption
• Less cost per chip

TNSWAMY, Assistant Professor, DR.AIT 72


Types of scaling
• Constant voltage scaling
• Constant field scaling

TNSWAMY, Assistant Professor, DR.AIT 73


Constant Field Scaling
• Here MOSFET dimensions as well as supply voltages are scaled by the
same factor S(greater than 1)
• Full scaling: Scaling of supply voltages and terminal voltages
maintains the same electric field, hence the name.
• Benefits of constant field scaling
• Increased component density
• Increased speed
• Decreased cost

TNSWAMY, Assistant Professor, DR.AIT 74


Constant Voltage Scaling
• Here geometrical dimension of the MOSFET are scaled by scaling
factor S while the supply and terminal voltage remain constant.
• Also called as Partial scaling
• Advantages of constant voltage scaling
• Less delay
• Decreased cost
• More reliable

TNSWAMY, Assistant Professor, DR.AIT 75


TNSWAMY, Assistant Professor, DR.AIT 76
TNSWAMY, Assistant Professor, DR.AIT 77
TNSWAMY, Assistant Professor, DR.AIT 78
TNSWAMY, Assistant Professor, DR.AIT 79
Scaling factors for device Parameters

TNSWAMY, Assistant Professor, DR.AIT 80


Scaling factors for device Parameters

TNSWAMY, Assistant Professor, DR.AIT 81


Scaling factors for device Parameters

TNSWAMY, Assistant Professor, DR.AIT 82


Scaling factors for device Parameters

TNSWAMY, Assistant Professor, DR.AIT 83


Scaling factors for device Parameters

TNSWAMY, Assistant Professor, DR.AIT 84


Scaling factors for device Parameters

TNSWAMY, Assistant Professor, DR.AIT 85


Scaling factors for device Parameters

TNSWAMY, Assistant Professor, DR.AIT 86


Scaling factors for device Parameters

TNSWAMY, Assistant Professor, DR.AIT 87


Scaling factors for device Parameters

TNSWAMY, Assistant Professor, DR.AIT 88


Scaling factors for device Parameters

TNSWAMY, Assistant Professor, DR.AIT 89


Scaling factors for device Parameters

TNSWAMY, Assistant Professor, DR.AIT 90


TNSWAMY, Assistant Professor, DR.AIT 91
TNSWAMY, Assistant Professor, DR.AIT 92
Limitations of Scaling
• Substrate doping
• Depletion width
• Limits of miniaturization
• Limits of interconnect and contact resistance
• Limits due to sub threshold currents
• Limits on logic levels and supply voltage due to noise
• Limits due to current density

TNSWAMY, Assistant Professor, DR.AIT 93

You might also like