FDP 150 N 10
FDP 150 N 10
July 2008
FDP150N10 tm
®
N-Channel PowerTrench MOSFET
100V, 57A, 15mΩ
Features General Description
• RDS(on) = 12mΩ ( Typ.) @ VGS = 10V, ID = 49A This N-Channel MOSFET is produced using Fairchild
Semiconductor’s advanced PowerTrench process that has been
• Fast switching speed
especially tailored to minimize the on-state resistance and yet
• Low gate charge maintain superior switching performance.
G
TO-220
G DS
FDP Series
S
Thermal Characteristics
Symbol Parameter Ratings Units
RθJC Thermal Resistance, Junction to Case 1.13
o
RθCS Thermal Resistance, Case to Sink Typ. 0.5 C/W
RθJA Thermal Resistance, Junction to Ambient 62.5
Electrical Characteristics
Symbol Parameter Test Conditions Min. Typ. Max. Units
Off Characteristics
BVDSS Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V, TC= 25oC 100 - - V
∆BVDSS Breakdown Voltage Temperature o
ID = 250µA, Referenced to 25 C - 0.1 - V/oC
∆TJ Coefficient
VDS = 100V, VGS = 0V - - 1
IDSS Zero Gate Voltage Drain Current µA
VDS = 100V, VGS = 0V, TC = 150oC - - 500
IGSS Gate to Body Leakage Current VGS = ±20V, VDS = 0V - - ±100 nA
On Characteristics
VGS(th) Gate Threshold Voltage VGS = VDS, ID = 250µA 2.5 - 4.5 V
RDS(on) Static Drain to Source On Resistance VGS = 10V, ID = 49A - 12 15 mΩ
gFS Forward Transconductance VDS = 20V, ID = 49A (Note 4) - 156 - S
Dynamic Characteristics
Ciss Input Capacitance - 3580 4760 pF
VDS = 25V, VGS = 0V
Coss Output Capacitance - 340 450 pF
f = 1MHz
Crss Reverse Transfer Capacitance - 140 210 pF
Switching Characteristics
td(on) Turn-On Delay Time - 47 104 ns
tr Turn-On Rise Time VDD = 50V, ID = 49A - 164 338 ns
td(off) Turn-Off Delay Time VGS = 10V, RGEN = 25Ω - 86 182 ns
tf Turn-Off Fall Time (Note 4, 5) - 83 176 ns
Qg(tot) Total Gate Charge at 10V VDS = 80V, ID = 49A - 53 69 nC
Qgs Gate to Source Gate Charge VGS = 10V - 19 - nC
Qgd Gate to Drain “Miller” Charge (Note 4, 5) - 15 - nC
Notes:
1: Repetitive Rating: Pulse width limited by maximum junction temperature
2: L = 0.11mH, IAS = 49A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C
3: ISD ≤ 49A, di/dt ≤ 200A/µs, VDD ≤ BVDSS, Starting TJ = 25°C
4: Pulse Test: Pulse width ≤ 300µs, Duty Cycle ≤ 2%
5: Essentially Independent of Operating Temperature Typical Characteristics
7.0 V
ID,Drain Current[A]
100 6.5 V
6.0 V 100
5.5 V o
150 C
o
25 C
10 10
*Notes:
1. 250µs Pulse Test o
o -55 C
2. TC = 25 C
2
0.02 0.1 1 10 1
3 4 5 6 7 8
VDS,Drain-Source Voltage[V]
VGS,Gate-Source Voltage[V]
25 o
Drain-Source On-Resistance
150 C
100
RDS(ON) [mΩ],
20
VGS = 10V o
25 C
15
VGS = 20V 10
10 *Notes:
o 1. VGS = 0V
*Note: TC = 25 C
2. 250µs Pulse Test
5 1
0 100 200 300 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
ID, Drain Current [A] VSD, Body Diode Forward Voltage [V]
VDS = 50V
4000 2. f = 1MHz 8
VDS = 80V
Capacitances [pF]
3000 6
Coss
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
2000 Crss = Cgd 4
Crss
1000 2
*Note: ID = 49A
0 0
0.1 1 10 30 0 10 20 30 40 50 60
VDS, Drain-Source Voltage [V] Qg, Total Gate Charge [nC]
Drain-Source On-Resistance
2.0
1.10
RDS(on), [Normalized]
BVDSS, [Normalized]
1.6
1.05
1.2
1.00
*Notes:
1. VGS = 0V 0.8 *Notes:
0.95 2. ID = 250uA 1. VGS = 10V
2. ID = 49A
0.4
0.90 -100 -50 0 50 100 150 200
-100 -50 0 50 100 o 150 200 o
TJ, Junction Temperature [ C] TJ, Junction Temperature [ C]
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current
vs. Case Temperature
500
70
10µs
100
60
100µs
ID, Drain Current [A]
1ms
10ms 50
ID, Drain Current [A]
10 DC
Operation in This Area 40
is Limited by R DS(on)
1
30
*Notes:
1. TC = 25 C
o 20
0.1
o
2. TJ = 150 C
10
3. Single Pulse
0.01
1 10 100 200 0
VDS, Drain-Source Voltage [V] 25 50 75 100 o 125 150
TC, Case Temperature [ C]
1
Thermal Response [ZθJC]
0.5
0.2
PDM
0.1
0.1 t1
0.05 t2
*Notes:
0.02 o
0.01
1. ZθJC(t) = 1.13 C/W Max.
2. Duty Factor, D= t1/t2
Single pulse
3. TJM - TC = PDM * ZθJC(t)
0.01
-5 -4 -3 -2 -1
10 10 10 10 10 1 10
Rectangular Pulse Duration [sec]
DUT +
VDS
I SD
L
Driver
RG
Same Type
as DUT VDD
IRM
VSD VDD
Body Diode
Forward Voltage Drop
TO-220
Dimensions in Millimeters
* EZSWITCH™ and FlashWriter® are trademarks of System General Corporation, used under license by Fairchild Semiconductor.
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS
HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE
APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER
ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S
WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
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in the labeling, can be reasonably expected to result in a
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