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Goldscope SD 550 - 520 DPP+ - FIAE

The document discusses X-ray fluorescence spectrometers for precious metal analysis and coating thickness measurement. It describes the features and benefits of the Fischer XRF devices Goldscope SD 520 and Goldscope SD 550, which have been optimized with a new digital pulse processor to achieve higher precision in shorter measurement times.

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د.محمد العصار
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295 views4 pages

Goldscope SD 550 - 520 DPP+ - FIAE

The document discusses X-ray fluorescence spectrometers for precious metal analysis and coating thickness measurement. It describes the features and benefits of the Fischer XRF devices Goldscope SD 520 and Goldscope SD 550, which have been optimized with a new digital pulse processor to achieve higher precision in shorter measurement times.

Uploaded by

د.محمد العصار
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PDF, TXT or read online on Scribd
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Fischer X-Ray Fluorescence (XRF)

Precious Metal Analysis


Coating Thickness Material Analysis

GOLDSCOPE® SD 520 / 550 - DPP+


Measure even faster and more precisely
The New Digital Pulse Processor (DPP+)
All-in-One solutions for precious
metal analysis and coating thickness
measurement
Precious Metal Analysis | Multi-Layer Thickness Measurement |
Solution Analysis | Alloy composition | Silver Testing

Features
Ready for the future - FISCHERSCOPE® X-RAY
∙ Modern Silicon Drift Detector (SDD) for high accuracy and a
good detection sensitivity.
Fischer X-ray Fluorescence (XRF) measuring devices are
continuously optimized to achieve higher precision in ∙ Fitted with the new Digital Pulse Processor (DPP+)
shorter measurement times. That is why we have
developed our new digital pulse processor DPP+ ∙ High-resolution colour video camera for precise determination
of the measurement spot.
completely in-house. The DPP+ is one of the central
elements of an X-ray fluorescence spectrometer
∙ Bench-top unit with upward opening hood.
which processes high count rates.
∙∙ 2
Detector: new SDD detector with 20 mm ( 160 eV )

Micro-focus tungsten tube with beryllium window


Benefits:
Application

∙
Achieve up to 45% reduction in absolute
standard deviation with same measuring time Jewellery, precious metals and dental alloys

Reduce your measurement time by a factor of 3


with the same absolute standard deviation ∙ Precious Metal Analysis eg. Gold, Silver and Platinum group
elements such as Iridium, Ruthenium, Osmium, Rhenium.

Secure your Silicon Drift Detector (SDD) detector


with a Grid protection ∙ Measuring coating thickness on sterling silver, rhodium
finishes or gold alloys

∙ Determination of complex multi layer-coating system

Gold Refinery Gold Manufacturing Tunch and Assaying

GOLDSCOPE® SD 520 / 550 - DPP+


2
Solution for
Hallmarking Centre

Start benefitting now

The following devices are equipped with the


new digital pulse processor DPP+ as a
standard option:

GOLDSCOPE SD® 520


GOLDSCOPE SD® 550

950 gold (23 carat): Absolute standard deviation


(precision) against measurement time

585 gold (14 carat): Absolute standard deviation


Higher count rates with very good energy resolution: (precision) against measurement time
New SDD Detector with DPP+
Old DPP
New SDD Detector with DPP+
®
GOLDSCOPE SD 520 / 550 - DPP+
General Specification
Intended Use Energy Dispersive X-Ray Fluorescence measuring instrument (EDXRF) for precious metal, alloy
analysis and coating thickness measurement in hallmarking, testing, tunch assaying offices,
refineries and gold manufacturing.
Design Bench top unit with upwards opening hood
Measuring Direction From bottom to top
X-ray tube Micro-focus tube with beryllium window
Measurement spot Depending on the measuring distance and on the aperture, the actual measurement is shown in
video image.
® ®
GOLDSCOPE SD 520 - DPP+ GOLDSCOPE SD 550 - DPP+
High voltage (three steps [kV]) 30, 40, 50 10, 30, 50
6x changeable: Ni 10, no filter,
Filter Fixed Al 500
Al 1000, Al 500, Al 100, Mylar ® 100
Apertures (Collimators) Ø [mm] Fixed, Standard 1.0 mm Option 0.6 / 2.0 mm 4x changeable: 0.2, 0.6, 1.0, 2.0 mm

Environmental Conditions
Operating temperature 10 °C – 40 °C
Storage / Transport temperature 0 °C – 50 °C
Relative humidity 95 %
X-Ray Detector Standard (20 mm²) Optional (50 mm²)
X-ray detector Silicon Drift detector with peltier cooling Silicon Drift detector with peltier cooling
Resolution (fwhm for Mn-Kα) 160 eV 140 eV
Element range Aluminum Al (13) – Uranium U (92)
Measuring distance 0 – 25 mm
Distance compensation with patented DCM method for simplified measurements at varying
distances. For particular applications or for higher demands on accuracy an additional calibration
might be necessary.
Sample Alignment
Video microscope High-resolution CCD colour camera for optical monitoring of the measurement location along the
primary beam axis, Crosshair with a calibrated scale (ruler) and spot-indicator, Adjustable
LED illumination
Zoom factor Digital 1x, 2x, 3x, 4x
Electrical Data
Power source AC 115 V or AC 230 V 50 / 60 Hz
Power consumption max. 120 W, without evaluation PC
Protection class IP 40
Target Dimensions
External dimensions 403 x 588 x 365 mm (Width x depth x height [mm] )
Usable Sample Placement Area 310 x 320 / 12.2 x 12.6 [mm]
Max. sample height [mm/in] 90 [mm]
Weight approx 45 Kg
Evaluation Unit
Computer Windows based PC
Software Standard Fischer WinFTM®
Standards
X-Ray standards DIN ISO 3497 and ASTM B 568

Order

GOLDSCOPE® SD 520 / 550 DPP+


Part No.
GOLDSCOPE® SD 520 - DPP+ 1002811
GOLDSCOPE® SD 550 - DPP+ 1003073
www.helmut-fischer.com

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