CERTIFICATE OF ACCREDITATION

The ANSI National Accreditation Board

Hereby attests that

Calibration Laboratory Co., Ltd

2/10-11, 14, 55 Soi Prasertmanukit 29 Yeak 4, Prasertmanukit Road
Ladpharo, Bangkok 10230, Thailand

Fulfills the requirements of

ISO/IEC 17025:2017
In the fields of

CALIBRATION and DIMENSIONAL MEASUREMENT

This certificate is valid only when accompanied by a current scope of accreditation document.
The current scope of accreditation can be verified at www.anab.org.

______________________________
R. Douglas Leonard Jr., VP, PILR SBU
Expiry Date: 09 October 2021
Certificate Number: ACDM-2814

This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017.
This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory
quality management system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017).
 SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

Calibration Laboratory Co., Ltd.

2/10-11, 14, 55 Soi Prasertmanukit 29 Yeak 4, Prasertmanukit Road
Ladpharo, Bangkok 10230, Thailand
Mongkol Yotsoontorn
E-Mail: [email protected]
Tel: +662-5780353

CALIBRATION AND DIMENSIONAL MEASUREMENT

Valid to: October 9, 2021 Certificate Number: ACDM-2814

CALIBRATION
Acoustics and Vibration
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Displacement@80 Hz
(>0 to 3) µm 19 % of reading
(3 to 5) µm 6.3 % of reading
(5 to 10) µm 3.9 % of reading
(10 to 30) µm 2.1 % of reading In house Method:
(30 to 50) µm 1.2 % of reading CLC-CPEE-08 by
Vibration Meter
(50 to 100) µm 1 % of reading Comparison to a
Displacement@160 Hz reference transducer
(>0 to 3) µm 4.8 % of reading
(3 to 5) µm 1.9 % of reading
(5 to 10) µm 1.3 % of reading
(10 to 100) µm 1 % of reading
In house Method:
Frequency Response CLC-CPEE-08 by
Vibration Meter
10 m/s2 @ 50 Hz to 1 kHz 1 % of reading Comparison to a
reference transducer
Acceleration Measurement
In house Method:
(>0 to 3) m/s2 4.9 % of reading
Vibration Meter CLC-CPEE-08 by
(3 to 5) m/s2 1.9 % of reading
@ 50 Hz to 5 kHz Comparison to a
(5 to 10) m/s2 1.3 % of reading
reference transducer
(10 to 100) m/s2 1 % of reading
Velocity Measurement In house Method:
@ 50 Hz to 5 kHz CLC-CPEE-08 by
Vibration Meter
(>0 to 30) mm/s 1.8 % of reading Comparison to a
(30 to 100) mm/s 1 % of reading reference transducer

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Acoustics and Vibration
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Acceleration
@50 Hz to 5 kHz 7.6 % of reading
1 m/s2 2.7 % of reading
(1 to 3) m/s2 1.8 % of reading
(3 to 5) m/s2 1.3 % of reading
(5 to 10) m/s2 1.1 % of reading
(10 to 30) m/s2 1 % of reading
(30 to 100) m/s2
Velocity
@ (50 to 160) Hz
1 m/s 11 % of reading
(1 to 3) mm/s 3.8 % of reading
(3 to 5) mm/s 2.4 % of reading
(5 to 10) mm/s 1.4 % of reading In house method: CLC-
1 (10 to 100) mm/s 0.9 % of reading CPEE-25
Vibration Source
Displacement By Comparison to a
@ (50 to 160) Hz Reference Transducer
1 μm 19 % of reading
(1 to 3) μm 6.5 % of reading
(3 to 5) μm 4 % of reading
(5 to 10) μm 2.1 % of reading
(10 to 30) μm 1.1 % of reading
(30 to 100) μm 0.9 % of reading
Frequency
@ 50 Hz to 5 kHz
50 Hz 1.3 % of reading
(50 to 80) Hz 1 % of reading
(80 to 120) Hz 0.8 % of reading
(120 to 160) Hz 0.7 % of reading
160 Hz to 5 kHz 0.6 % of reading

Chemical Quantities
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
1.00 0.01 pH
1.68 0.01 pH In house method: CLC-
1
pH Meter 2.00 0.01 PH CPCH-01 by Comparison
4.01 0.01 pH with Standard Solutions
6.86 0.01 pH

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Chemical Quantities
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
7.01 0.01 pH
9.18 0.01 pH
In house method: CLC-
1 10.01 0.01 pH
pH Meter CPCH-01 by Comparison
11.00 0.01 pH
with Standard Solutions
12.00 0.01 pH
13.00 0.01 pH
84 µS/cm 1 µS/cm
100 µS/cm 5 µS/cm
1 500 µS/cm 10 µS/cm
Conductivity Meter In house method: CLC-
1 413 µS/cm 5 µS/cm
(approximate nominal CPCH-02 by Comparison
5 000 µS/cm 50 µS/cm
values) with Standard Solutions
12 880 µS/cm 50 µS/cm
80 000 µS/cm 200 µS/cm
111 800 µS/cm 400 µS/cm
In house method: CLC-
% Brix
CPCH-03 by Direct
1 (1 to 60) % Brix 0.11 % Brix
Refractometer Measurement with
Refractive Index
Certified Reference
(1.340 2 to 1.441 9) nD 0.000 22 nD
Material
In-house method: CLC-
1 CPCH-07 based on direct
Salinity Refractometer (0 to 26) % Salinity 0.08 % Salinity
measurement by NaCl Salt
Standard Solution
In house method: CLC-
CPCH-04 by Direct
1 240 mV 2.2 mV
ORP Meter Measurement with
470 mV 2.8 mV
Certified Reference
Material
In house method: CLC-
300 mg/L 6.5 mg/L
CPCH-05 by Direct
1 1 000 mg/L 12 mg/L
TDS Meter Measurement with
1 500 mg/L 17 mg/L
Certified Reference
3 000 mg/L 31 mg/L
Material
In house method: CLC-
CPCH-08 based on direct
1 100 NTU 6 NTU
Turbidity Meter measurement by using
200 NTU 12 NTU
Certificate of Analysis
(COA)

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Chemical Quantities
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house method: CLC-
CPCH-06 by Direct
1
Oxygen Meter 0 mg/L 0.22 mg/L Measurement with
Certified Reference
Material

Electrical – DC/Low Frequency

Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
1 kHz
Up to 10 nF 2.9 mF/F + 0.82 pF
(10 to 100) nF 2.9 mF/F + 8.2 pF
50 Hz to 1 kHz
(100 to 330) nF 2.9 mF/F + 0.35 nF
330 nF to 1.1 µF 2.9 mF/F + 1.2 nF In house Method: CLC-
1 (1.1 to 3.3) µF 4 mF/F + 3.5 nF CPEE-01
Measuring Instrument
(50 to 400) Hz by Direct Measurement
Capacitance Measurement
(3.3 to 11) µF 4 mF/F + 3.5 nF with Multi-Product
(11 to 33) µF 4.6 mF/F + 35 nF Calibrator
(50 to 200) Hz
(33 to 110) µF 5.8 mF/F + 0.12 µF
(50 to 100) Hz
(110 to 330) µF 8.1 mF/F + 0.35 µF
330 µF to 1.1 mF 12 mF/F + 0.36 µF
Up to 202 µA 92 µA/A + 12 nA
202 µA to 2.02 mA 46 µA/A + 35 nA
In house Method: CLC-
1 (2.02 to 20.2) mA 46 µA/A + 0.23 µA
Measuring Instrument CPEE-01 by Direct
(20.2 to 202) mA 46 µA/A + 2.3 µA
DC Current Measurement Measurement with Multi-
202 mA to 2.02 A 81 µA/A + 35 µA
Product Calibrator
(2.02 to 20.2) A 0.23 mA/A + 0.35 mA
(20.2 to 30) A 0.35 mA/A + 0.52 mA
In house Method: CLC-
Up to 10 A 0.058 mA/A + 5.8 mA
1 CPEE-15 by Direct
Digital Clamp Multimeter (10 to 100) A 0.15 mA/A + 6 mA
Measurement with
DC Current Measurement (100 to 1 000) A 0.35 mA/A + 18 mA
Multi-Product Calibrator
(1 000 to 1 500) A 0.87 mA/A + 27 mA
and Transmille Coils

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Up to 202 µA
(10 to 45) Hz 1.8 mA/A + 0.29 µA
45 Hz to 1 kHz 0.58 mA/A + 0.17 µA
(1 to 10) kHz 9.2 mA/A + 0.23 µA
(10 to 30) kHz 17 mA/A + 0.46 µA
202 µA to 2.02 mA
(10 to 45) Hz 1.7 mA/A + 0.29 µA
45 Hz to 1 kHz 0.46 mA/A + 0.23 µA
(1 to 10) kHz 4.6 mA/A + 0.35 µA
(10 to 30) kHz 9.2 mA/A + 0.69 µA
(2.02 to 20.2) mA
(10 to 45) Hz 1.7 mA/A + 3.5 µA
45 Hz to 1 kHz 0.4 mA/A + 2.3 µA
In house Method: CLC-
1 (1 to 10) kHz 2.3 mA/A + 3.5 µA
Measuring Instrument CPEE-01by Direct
(10 to 30) kHz 4.6 mA/A + 4.6 µA
AC Current Measurement Measurement with Multi-
(20.2 to 202) mA
Product Calibrator
(10 to 45) Hz 1.7 mA/A + 35 µA
45 Hz to 1 kHz 0.40 mA/A + 23 µA
(1 to 10) kHz 4.6 mA/A + 46 µA
(10 to 30) kHz 5.8 mA/A + 46 µA
202 mA to 2.02 A
(10 to 45) Hz 1.7 mA/A + 0.35 mA
45 Hz to 1 kHz 0.46 mA/A + 0.23 mA
(1 to 5) kHz 4.6 mA/A + 0.46 mA
(2.02 to 30) A
(30 to 45) Hz 1.7 mA/A + 3.5 mA
(45 to 100) Hz 0.46 mA/A + 2.3 mA
100 Hz to 1) kHz 4.6 mA/A + 4.6 mA
(1 to 5) kHz 5.8 mA/A + 4.6 mA
(45 to 65) Hz
Up to 10 A 0.46 mA/A + 5.9 mA In house Method: CLC-
1 (10 to 100) A 0.69 mA/A + 13 mA CPEE-15 by Direct
AC Current Measurement
(100 to 1 500) A 0.92 mA/A + 0.12 A Measurement with
Digital Clamp Multimeter
(65 to 400) Hz Multi-Product Calibrator
Up to 10 A 0.46 mA/A + 5.9 mA and Transmille Coils
(10 to 100) A 0.69 mA/A + 13 mA

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(45 to 100 Hz)
In house Method:
Up to 100 µA 0.69 mA/A + 35 nA
1 CLC-CPEE-12
Generating Instrument 100 µA to 1 mA 0.69 mA/A + 0.23 µA
by Direct Measurement
AC Current Source (1 to 10) mA 0.69 mA/A + 2.3 µA
with Digital Multimeter
(10 to 100) mA 0.69 mA/A + 23 µA
8½
100 mA to 1 A 0.92 mA/A + 0.23 mA
100 Hz to 5 kHz
In house Method:
Up to 100 µA 0.69 mA/A + 35 nA
1 CLC-CPEE-12
Generating Instrument 100 µA to 1 mA 0.35 mA/A + 0.23 µA
by Direct Measurement
AC Current Source (1 to 10) mA 0.35 mA/A + 2.3 µA
with Digital Multimeter
(10 to 100) mA 0.35 mA/A + 23 µA
8½
100 mA to 1 A 1.2 mA/A + 0.23 mA
Up to 100 nA 0.12 mA/A + 0.046 nA
100 nA to 1 µA 24 µA/A + 0.046 nA
In house Method:
(1 to 10) µA 24 µA/A + 0.12 nA
1 CLC-CPEE-12
Generating Instrument (10 to 100) µA 24 µA/A + 0.92 nA
by Direct Measurement
DC Current Source 100 µA to 1 mA 24 µA/A + 5.8 nA
with Digital Multimeter
(1 to 10) mA 24 µA/A + 58 nA
8½
(10 to 100) mA 41 µA/A + 0.58 µA
100 mA to 1 A 0.13 mA/A + 12 µA
1 (>0 to 1) kA 1.4 % of reading In house method: CLC-
Weld Machine
(1.0 to 199.9) kA 1.2 % of reading CPEE-21 by Comparison
Up to 1 kA 0.01 kA In house method: CLC-
(1 to 3) kA 0.02 kA CPEE-22 by Simulation
(3 to 5) kA 0.04 kA with Function/Arbitrary
Weld Tester
(5 to 10) kA 0.06 kA Waveform Generator +
(10 to 30) kA 0.18 kA Compare with Digital
(30 to 50) kA 0.29 kA Multimeter
Up to 2 mA 0.02 mA
(2 to 4) mA 0.04 mA
(4 to 6) mA 0.06 mA
(6 to 8) mA 0.07 mA In house method: CLC-
1 (8 to 10) mA 0.09 mA CPEE-24 by Direct
Leakage Current
(10 to 20) mA 0.19 mA Measurement with Decade
(20 to 40) mA 0.37 mA Resistor
(40 to 60) mA 0.56 mA
(60 to 80) mA 0.76 mA
(80 to 100) mA 0.93 mA

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Up to 2 mA 0.04 mA
(2 to 4) mA 0.07 mA
(4 to 6) mA 0.1 mA
(6 to 8) mA 0.14 mA In house method: CLC-
1
Leakage Current (8 to 10) mA 0.17 mA CPEE-24 by Direct
45 Hz to 65 Hz (10 to 20) mA 0.35 mA Measurement with Decade
(20 to 40) mA 0.65 mA Resistor
(40 to 60) mA 1 mA
(60 to 80) mA 1.4 mA
(80 to 100) mA 1.7 mA
1 In house method: CLC-
Temperature Indicator
CPTH-23 by Direct
with Electrical Input Signal (-200 to 1 400) °C 0.08 °C
Measurement with
Input Signal: (1 400 to 1 700) °C 0.12 °C
Documenting Process
4 mA to 20 mA
Calibrator
0Ω 5.8 mΩ
(>0 to 100) Ω 17 µΩ/Ω + 5.8 mΩ
100 Ω to 1 kΩ 18 µΩ/Ω + 5.8 mΩ In house Method: CLC-
1 (1 to 10) kΩ 6.9 µΩ/Ω + 58 mΩ CPEE-01
Measuring Instrument
(10 to 100) kΩ 14 µΩ/Ω + 0.58 Ω by Direct Measurement
Resistance Measurement
100 kΩ to 1 MΩ 21 µΩ/Ω + 5.8 Ω with Multi-Product
(1 to 10) MΩ 92 µΩ/Ω + 0.12 kΩ Calibrator
(10 to 100) MΩ 2 mΩ/Ω + 2.4 kΩ
(100 to 1 000) MΩ 10 mΩ/Ω + 36 kΩ
Up to 10 Ω 18 µΩ/Ω + 58 µΩ
(10 to 100) Ω 14 µΩ/Ω + 0.58 mΩ
100 Ω to 1 kΩ 12 µΩ/Ω + 0.58 mΩ In house Method:
1 (1 to 10) kΩ 12 µΩ/Ω + 5.8 mΩ CLC-CPEE-12
Generating Instrument
(10 to 100) kΩ 12 µΩ/Ω + 58 mΩ by Direct Measurement
Resistance Source
100 kΩ to 1 MΩ 18 µΩ/Ω + 2.3 Ω with Digital Multimeter
(1 to 10) MΩ 58 µΩ/Ω + 0.12 kΩ 8½
(10 to 100) MΩ 0.58 mΩ/Ω + 1.3 kΩ
100 MΩ to 1 GΩ 5.8 mΩ/Ω + 13 kΩ

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(1, 10) mΩ 6 µΩ
100 mΩ 58 µΩ
1Ω 1 mΩ
10 Ω 6 mΩ
100 Ω 58 mΩ
1 kΩ 1Ω
In house Method: CLC-
Resistance Measurement (10, 100) kΩ 6Ω
CPEE-16 by Comparison
Instrument 1 MΩ 0.11 kΩ
with Standard Resistance
10 MΩ 6 kΩ
100 MΩ 19 kΩ
1 GΩ 6 MΩ
10 GΩ 8 MΩ
100 GΩ 0.7 GΩ
(1, 10) TΩ 0.6 TΩ
1 kΩ 0.02 Ω
10 kΩ 0.18 Ω
100 kΩ 2Ω
1 MΩ 0.26 kΩ In-House method: CLC-
10 MΩ 0.01 MΩ CPEE-28
1
Surface Resistance Tester 100 MΩ 0.09 MΩ by Comparison with
1 GΩ 0.5 MΩ Standard
10 GΩ 0.01 GΩ Resistance
100 GΩ 0.15 GΩ
1 TΩ 1.5 GΩ
10 TΩ 0.2 TΩ
Up to 202 mV 14 µV/V + 2.3 µV In house Method: CLC-
1 202 mV to 2.02 V 8.1 µV/V + 2.9 µV CPEE-01
Measuring Instrument
(2.02 to 20.2) V 6.9 µV/V + 28 µV by Direct Measurement
DCV Measurement
(20.2 to 202) V 12 µV/V + 0.28 mV with Multi-Product
(202 to 1 020) V 12 µV/V + 2.8 mV Calibrator

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Up to 202 mV
(10 to 45) Hz 0.69 mV/V + 17 µV
45 Hz to 1 kHz 0.12 mV/V + 17 µV
(1 to 20) kHz 0.14 mV/V + 32 µV
(20 to 100) kHz 1.1 mV/V + 46 µV
(100 to 500) kHz 3.5 mV/V + 0.12 mV
202 mV to 2.02 V
(10 to 45) Hz 0.52 mV/V + 0.21 mV
45 Hz to 1 kHz 0.16 mV/V + 0.14 mV
(1 to 20) kHz 0.18 mV/V + 0.21 mV
(20 to 100) kHz 0.67 mV/V + 0.35 mV
In house Method: CLC-
(100 to 500) kHz 2.9 mV/V + 0.52 mV
1 CPEE-01
Measuring Instrument (2.02 to 20.2) V
by Direct Measurement
ACV Measurement (10 to 45) Hz 0.5 mV/V + 1.8 mV
with Multi-Product
45 Hz to 1 kHz 0.15 mV/V + 1.2 mV
Calibrator
(1 to 20) kHz 0.18 mV/V + 1.8 mV
(20 to 100) kHz 0.6 mV/V + 3.5 mV
(20.2 to 202) V
(30 to 45) Hz 0.50 mV/V + 23 mV
45 Hz to 1 kHz 0.15 mV/V + 14 mV
(1 to 10) kHz 0.18 mV/V + 18 mV
(10 to 40) kHz 0.28 mV/V + 35 mV
(202 to 1 020) V
(30 to 45) Hz 0.58 mV/V + 0.23 V
45 Hz to 1 kHz 0.17 mV/V + 70 mV
(1 to 10) kHz 0.23 mV/V + 0.14 V
(0.5 to 10) kV In house Method: CLC-
1 @ 50 Hz 6V CPEE-09 by Direct
AC High Voltage Source
(0.5 to 10) kV Measurement with AC/DC
@ 60 Hz 6V High voltage meter
In house Method:
1 CLC-CPEE-13 by Direct
DC High Voltage Source (0.5 to 10) kV 2V
Measurement with AC/DC
High Voltage Meter
Up to 10 mV 0.23 mV/V + 1.3 µV
In house Method:
1 (10 to 100) mV 81 µV/V + 2.3 µV
Generating Instrument CLC-CPEE-12
100 mV to 1 V 81 µV/V + 24 µV
AC Voltage Source by Direct Measurement
(1 to 10) V 81 µV/V + 0.24 mV
40 Hz to 1 kHz with Digital Multimeter
(10 to 100) V 0.23 mV/V + 2.4 mV
8½
(100 to 700) V 0.46 mV/V + 24 mV

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Up to 100 mV 11 µV/V + 0.35 µV
100 mV to 1 V 9.5 µV/V + 0.35 µV
In house Method:
(1 to 10) V 9.5 µV/V + 0.82 µV
1 CLC-CPEE-12
Generating Instrument (10 to 100) V 12 µV/V + 35 µV
by Direct Measurement
DC Voltage Source (100 to 400) V 12 µV/V + 74 µV
with Digital Multimeter
(400 to 600) V 13 µV/V + 90 µV
8½
(600 to 800) V 15 µV/V + 0.11 mV
(800 to 1 000) V 18 µV/V + 0.13 mV
(1 to 20) V,
0.5 mA to 30 A, PF = 1
0.5 mW 1.2 mW/W + 0.82 nW
(0.5 to 300) mW 1.2 mW/W + 0.82 µW
300 mW to 40 W 0.18 mW/W + 0.82 mW
(40 to 600) W 0.46 mW/W + 0.82 mW
(20 to 200) V,
In house Method: CLC-
0.5 mA to 30 A, PF = 1
1 CPEE-02
DC Power Measuring (10 to 100) mW 1.2 mW/W + 0.82 µW
by Direct Measurement
Instrument 100 mW to 60 W 1.2 mW/W + 0.82 mW
with Multifunction
(60 to 400) W 0.18 mW/W + 0.82 mW
Calibrator
400 W to 6 kW 0.46 mW/W + 0.82 W
(200 to 1 000) V,
0.5 mA to 30 A, PF = 1
(100 to 500) mW 1.2 mW/W + 0.82 µW
500 mW to 300 W 1.2 mW/W + 0.82 mW
300 W to 2 kW 0.18 mW/W + 0.82 W
(2 to 30) kW 0.46 mW/W + 0.82 W
(1 to 20) V,
0.5 mA to 30 A, PF = 1
(0 to 0.5) mW 2.3 mW/W + 0.82 nW
(0.5 to 200) mW 2.3 mW/W + 0.82 µW
1 In house Method: CLC-
AC Power Measuring 200 mW to 600 W 0.7 mW/W + 0.82 mW
CPEE-03 by Direct
Instrument (Single-Phase) (20 to 200) V,
Measurement with
@40 Hz to 400 Hz 0.5 mA to 30 A, PF = 1
Multifunction Calibrator
(10 to 100) mW 2.4 mW/W + 0.82 µW
100 mW to 40 W 2.4 mW/W + 0.82 mW
(40 to 400) W 1.2 mW/W + 0.82 mW
400 W to 6 kW 0.74 mW/W + 0.82 W

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(200 to 1 000) V,
1 0.5 mA to 30 A, PF = 1 In house Method: CLC-
AC Power Measuring
(100 to 500) mW 2.4 mW/W + 0.82 µW CPEE-03 by Direct
Instrument (Single-Phase)
500 mW to 200 W 2.4 mW/W + 0.82 mW Measurement with
@40 Hz to 400 Hz
200 W to 2 kW 1.2 mW/W + 0.82 W Multifunction Calibrator
(2 to 30) kW 0.74 mW/W + 0.82 W
(0.5 to 560) V,
1 mA to 120 A, PF = 1
0.5 mW to 10 W 0.4 mW/W+ 8.2 µW
(10 to 100) W 0.4 mW/W+ 82 µW
(100 to 1 000) W 0.4 mW/W+ 0.82 mW
(1 000 to 10 000) W 0.4 mW/W+ 8.2 mW In house Method: CLC-
1
AC Power Measuring (10 000 to 67 200) W 0.4 mW/W+ 82 mW CPEE-03 by Direct
Instrument (Three-Phase) (0.5 to 560) V, Measurement with Power
1 mA to 120 A, PF = 0.5 Calibrator
0.25 mW to 10 W 1.8 mW/W+ 8.2 µW
(10 to 100) W 1.8 mW/W+ 82 µW
(100 to 1 000) W 1.8 mW/W+ 0.82 mW
(1 000 to 10 000) W 1.8 mW/W+ 8.2 mW
(10 000 to 33 600) W 1.8 mW/W+ 82 mW
1
Hybrid Recorder
(Functions including
temperature, relative Input DCV In house Method:
humidity, pressure, (0 to 50) V 28 µV/V of reading CLC-CPEE-10 by Direct
vacuum, flow rate, rpm, Resistance Measurement with Multi-
frequency, time interval, (0 to 400) Ω 28 µΩ/Ω of reading Product Calibrator
current, voltage, power,
etc.)
In house Method:
1 CLC-CPEE-11
Strain Indicator (0 to 10) mV/V 28 µV/V of reading
by Direct Measurement
with Precision Calibrator
1
pH Meter
± (0 to 414.12) mV 0.06 mV Millivolt simulation
(Display Unit Only)
DCV
In house method: CLC-
1 (0 to 10) kV 0.011 kV
Static Voltage Tester CPEE-29 by Comparison
ACV
with Standard
(0 to 10) kV 0.018 kV

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house method: CLC-
1
Phase Detector CPEE-30 by Comparison
(0 to 500) V 0.38 V
Voltage with Three Phase Power
Calibrator
1 In house method: CLC-
Temperature Indicator
CPTH-23 by Direct
with Electrical Input Signal (-200 to 1 400) °C 0.05 °C
Measurement with
Input Signal: (1 400 to 1 700) °C 0.07 °C Documenting Process
(0 to 10) VDC
Calibrator
0.2 mV 3.5 µV
0.5 mV 3.5 µV
1 mV 3.6 µV
In house Method: CLC-
1 2 mV 3.6 µV
Oscilloscope CPEE-19 by Direct
5 mV 3.8 µV
DCV (Volt/Division) Measurement with
12 mV 4.3 µV
Multifunction Calibrator
30 mV 6 µV
60 mV 8 µV
120 mV 12 µV
300 mV 24 µV
600 mV 40 µV
In house Method: CLC-
1 1.2 V 0.11 mV
Oscilloscope CPEE-19 by Direct
3V 0.2 mV
DCV (Volt/Division) Measurement with
6V 0.33 mV
Multifunction Calibrator
12 V 0.6 mV
30 V 1.4 mV
5 ns to 1 µs 0.06 ns
1 µs to 0.1 ms 0.7 ns In house Method: CLC-
1
Oscilloscope (0.1 to 1) ms 0.6 µs CPEE-19 by Direct
Timer (Time/Division) (1 to 50) ms 6 µs Measurement with Time
(50 to 100) ms 0.012 ms Marker Generator
(100 to 200) ms 0.08 ms
1Ω 0.9 mΩ In house method: CLC-
10 Ω 1 mΩ CPEE-27 by Direct with
100 Ω 4.0 mΩ Decade Resistor,
1
LCR Meter 1 kΩ 0.02 Ω Decade Capacitor, Standard
Resistance 10 kΩ 0.2 Ω Inductor
100 kΩ 1.9 Ω
1 MΩ 0.03 kΩ
10 MΩ 1 kΩ

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
100 pF 0.03 μF In house method: CLC-
1 nF 1.6 pF CPEE-27 by Direct with
1
LCR Meter 10 nF 0.012 nF Decade Resistor,
Capacitance 100 nF 0.03 nF Decade Capacitor, Standard
1 μF 0.3 nF Inductor
10 μF 4 nF
In house method: CLC-
1 100 μH 0.04 μH CPEE-27 by Direct with
LCR Meter
10 mH 2.5 μH Decade Resistor,
Inductance
1H 0.25 mH Decade Capacitor, Standard
Inductor
Type K
(-200 to -100) °C 0.4 °C
(-100 to -25) °C 0.23 °C
(-25 to 120) °C 0.21 °C
(120 to 1 000) °C 0.32 °C
(1 000 to 1 300) °C 0.47 °C
Type J
(-200 to -100) °C 0.33 °C
(-100 to -30) °C 0.21 °C
(-30 to 150) °C 0.19 °C
(150 to 760) °C 0.22 °C
(760 to 1 200) °C 0.28 °C
Type T In house Method: CLC-
CPEE-04 by Simulation
1
Measuring Instrument- (-250 to -150) °C 0.74 °C
with Multi-Product
Thermocouple Temp. (-150 to 0) °C 0.29 °C
Calibrator and TC Adapters
Indicator (0 to 120) °C 0.21 °C
(Transmille 4010A and
(120 to 400) °C 0.19 °C EA001A)
Type N
(-200 to -100) °C 0.49 °C
(-100 to -25) °C 0.21 °C
(-25 to 120) °C 0.19 °C
(120 to 410) °C 0.22 °C
(410 to 1 300) °C 0.28 °C
Type E
(-250 to -100) °C 0.58 °C
(-100 to -25) °C 0.12 °C
(-25 to 350) °C 0.11 °C
(350 to 650) °C 0.15 °C
(650 to 1 000) °C 0.18 °C

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Type R
(0 to 250) °C 0.66 °C
(250 to 400) °C 0.41 °C
(400 to 1 000) °C 0.39 °C
(1 000 to 1 767) °C 0.47 °C
Type S In house Method: CLC-
CPEE-04 by Simulation
1
Measuring Instrument- (0 to 250) °C 0.55 °C
with Multi-Product
Thermocouple Temp. (250 to 1 000) °C 0.42 °C
Calibrator and TC Adapters
Indicator (1 000 to 1 400) °C 0.43 °C
(Transmille 4010A and
(1 400 to 1 767) °C 0.54 °C EA001A)
Type B
(600 to 800) °C 0.51 °C
(800 to 1 000) °C 0.4 °C
(1 000 to 1 550) °C 0.35 °C
(1 550 to 1 820) °C 0.39 °C
Type K
(-200 to -101) °C 0.39 °C
(-101 to -26) °C 0.22 °C
(-26 to 120) °C 0.2 °C
(120 to 1 000) °C 0.31 °C
(1 000 to 1 300) °C 0.47 °C
Type J
(-210 to -101) °C 0.32 °C
(-101 to -30) °C 0.2 °C
(-30 to 150) °C 0.18 °C
In house method: CLC-
1 (150 to 760) °C 0.21 °C
Thermocouple CPEE-26 by Simulation
(760 to 1 200) °C 0.28 °C
Temperature Calibrator with Multi-Product
Type T
Calibrator
(-250 to -151) °C 0.73 °C
(-151 to -149) °C 0.29 °C
(-149 to 1) °C 0.2 °C
(1 to 400) °C 0.18 °C
Type E
(-250 to -101) °C 0.58 °C
(-101 to -99) °C 0.2 °C
(-99 to 350) °C 0.18 °C
(350 to 650) °C 0.2 °C
(650 to 1 000) °C 0.26 °C

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Type N
(-200 to -101) °C 0.47 °C
(-101 to -99) °C 0.27 °C
(-99 to -24) °C 0.23 °C
(-24 to 410) °C 0.22 °C
(410 to 1 300) °C 0.32 °C
Type R
(0 to 249) °C 0.66 °C
(249 to 251) °C 0.41 °C
In house method: CLC-
1 (251 to 1 000) °C 0.39 °C
Thermocouple CPEE-26 by Simulation
(1 000 to 1 767) °C 0.47 °C
Temperature Calibrator with Multi-Product
Type S
Calibrator
(0 to 249) °C 0.55 °C
(249 to 1 000) °C 0.42 °C
(1 000 to 1 400) °C 0.44 °C
(1 400 to 1 767) °C 0.54 °C
Type B
(600 to 799) °C 0.51 °C
(799 to 801) °C 0.4 °C
(801 to 1 550) °C 0.36 °C
(1 550 to 1 820) °C 0.39 °C
TC Type K
(-100 to 1 300) °C 0.64 °C
TC Type J
(-100 to 1 200) °C 0.64 °C
TC Type E
(-100 to 1 000) °C 0.64 °C In house method: CLC-
1 TC Type T CPTH-09 by Direct
Thermocouple
(-150 to 400) °C 0.54 °C Measurement with
Temperature Indicator
TC Type R Documenting Process
(0 to 100) °C 1.3 °C Calibrator
(100 to 1 700) °C 1.1 °C
TC Type S
(0 to 200) °C 1.3 °C
(200 to 1 400) °C 1.1 °C
(1 400 to 1 700) °C 1.2 °C

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Type K
(-100 to 400) °C 0.63 °C
(400 to 1 300) °C 0.65 °C
Type J
(-100 to 400) °C 0.63 °C
(400 to 1 200) °C 0.64 °C
Type E In house method: CLC-
(-100 to 400) °C 0.63 °C CPTH-20 based on EA-
1
Thermocouple (400 to 1 000) °C 0.64 °C 10/11 by Direct
Temperature Transmitter Type T Measurement
(-150 to 400) °C 0.53 °C With Documenting Process
Type R Calibrator
(0 to 100) °C 1.3 °C
(100 to 1 700) °C 1.1 °C
Type S
(0 to 200) °C 1.3 °C
(200 to 1 400) °C 1.1 °C
(1 400 to 1 700) °C 1.2 °C
In house method: CLC-
1
RTD Temperature Pt 100 Ω CPEE-26 by Simulation
Calibrator (-200 to 800) °C 0.07 °C with Multi-Product
Calibrator
Pt 385 100 Ω
(-200 to 0) °C 0.09 °C
In house Method: CLC-
1 (0 to 100) °C 0.1 °C
Measuring Instrument- CPEE-04 by Simulation
(100 to 300) °C 0.12 °C
RTD Temp. Indicator with Multi-Product
(300 to 400) °C 0.13 °C
Calibrator (Fluke 5500A)
(400 to 630) °C 0.16 °C
(630 to 800) °C 0.28 °C
Thermistor 5 kΩ @ 25 °C In house method: CLC-
1
Thermistor Temperature (-50 to 150) °C 0.002 °C CPEE-20 by Direct
Indicator Thermistor 10 kΩ @ 25 °C Measurement with Decade
(-50 to 150) °C 0.002 °C Resistance Box

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
100 Ω Pt (385) 4 wire
(-200 to 0) °C 0.15 °C
(0 to 400) °C 0.25 °C
(400 to 800) °C 0.47 °C
100 Ω Pt (385) 3 wire In house method: CLC-
CPTH-09 by Direct
1
RTD Temperature (-200 to 0) °C 0.15 °C
Measurement with
Indicator (0 to 400) °C 0.25 °C
Documenting Process
(400 to 800) °C 0.47 °C Calibrator
100 Ω Pt (385) 2 wire
(-200 to 0) °C 0.19 °C
(0 to 400) °C 0.28 °C
(400 to 800) °C 0.49 °C
100 Ω Pt (385) 4 wire
(-200 to 0) °C 0.13 °C
(0 to 400) °C 0.25 °C
(400 to 800) °C 0.47 °C In house method: CLC-
100 Ω Pt (385) 3 wire CPTH-20 based on EA-
1
RTD Temperature (-200 to 0) °C 0.13 °C 10/11 by Direct
Transmitter (0 to 400) °C 0.25 °C Measurement
(400 to 800) °C 0.47 °C With Documenting Process
100 Ω Pt (385) 2 wire Calibrator
(-200 to 0) °C 0.18 °C
(0 to 400) °C 0.27 °C
(400 to 800) °C 0.49 °C

Length – Dimensional Metrology

Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
0.1 mm ≤ l ≤25 mm 0.06 µm
In house method: CLC-
2 25 mm ≤ l ≤50 mm 0.07 µm
Gauge Block Set CPDG-01by Comparison
50 mm ≤ l ≤75 mm 0.08 µm
with Standard Gauge Block
75 mm ≤ l ≤100 mm 0.09 µm
In house method: CLC-
Optical Flat Flatness CPDG-03 by Comparison
Diameter: ≤ 60 mm (0 to 10) µm 0.03 µm with Flatness Tester
and Reference Optical Flat

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Flatness
In house method: CLC-
(0 to 10) µm 0.03 µm
CPDG-04 by Comparison
Optical Parallel Parallel
with Flatness Tester, Gauge
Diameter: ≤ 60 mm (0 to 10) µm 0.04 µm
Block Comparator and
Thickness
ULM
(12 to 25.37) mm 0.5 µm
(1 to 25( mm 0.3 µm
(25 to 50( mm 0.4 µm
(50 to 75( mm 0.5 µm In house method: CLC-
(75 to 100( mm 0.5 µm CPDU-01 Comparison
Plain Ring Gauge
(100 to125( mm 0.7 µm Measurement by using
(125 to 150( mm 0.8 µm Gauge Block and ULM
(150 to 200( mm 0.9 µm
(200 to 250( mm 1.1 µm
(1 to 30( mm 0.3 µm
(30 to 40( mm 0.3 µm
(40 to 50( mm 0.3 µm
(50 to 70( mm 0.5 µm
(70 to 80( mm 0.5 µm
(80 to 90( mm 0.5 µm
(90 to 100( mm 0.6 µm
In house method: CLC-
(100 to 125( mm 0.6 µm
CPDU-02 Comparison
Plain Snap Gauge/Gap Gauge (125 to 135( mm 0.6 µm
Measurement by using
(135 to 150( mm 0.7 µm
Gauge Block and ULM
(150 to 165( mm 0.7 µm
(165 to 175( mm 0.7 µm
(175 to 190( mm 0.8 µm
(190 to 200( mm 0.8 µm
(200 to 220( mm 0.9 µm
(220 to 235( mm 0.9 µm
(235 to 250( mm 1 µm
Up to 50 mm 0.38 µm
(50 to 70( mm 0.47 µm
(70 to 85( mm 0.55 µm
In house method: CLC-
Plain Plug Gauge, Pin Gauge (85 to 100( mm 0.57 µm
CPDU-03 Comparison
& 1Wire (Outer / Outside (100 to 115( mm 0.69 µm
Measurement by using
Diameter) (115 to 125( mm 0.7 µm
Gauge Block and ULM
(125 to 140( mm 0.76 µm
(140 to 155( mm 0.85 µm
(155 to 165( mm 0.87 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(165 to 175( mm 0.91 µm
(175 to 190( mm 0.93 µm
In house method: CLC-
Plain Plug Gauge, Pin Gauge (190 to 200( mm 0.98 µm
CPDU-03 Comparison
& 1Wire (Outer / Outside (200 to 215( mm 1.1 µm
Measurement by using
Diameter) (215 to 225( mm 1.2 µm
Gauge Block and ULM
(225 to 235( mm 1.2 µm
(235 to 250( mm 1.2 µm
(2.5 to 24( mm 0.3 µm
(24 to 70) mm 0.4 µm In house method: CLC-
Thread Ring Gauge (70 to 90) mm 0.4 µm CPDU-04 Comparison
Pitch Diameter (90 to 100( mm 0.5 µm Measurement by using
(100 to 125( mm 0.5 µm Gauge Block and ULM
(125 to 150( mm 0.5 µm
(2.5 to 24( mm 0.3 µm
(24 to 70) mm 0.5 µm In house method: CLC-
Thread Ring Gauge (70 to 90) mm 0.5 µm CPDU-04 Comparison
Minor Diameter (90 to 100( mm 0.5 µm Measurement by using
(100 to 125( mm 0.7 µm Gauge Block and ULM
(125 to 150( mm 0.8 µm
(1 to 50) mm 0.7 µm
(50 to 85) mm 0.8 µm In house method: CLC-
Thread Plug Gauge (85 to 100) mm 0.8 µm CPDU-05 Comparison
(Pitch Diameter) (100 to 110) mm 0.8 µm Measurement by using
(110 to 130) mm 0.9 µm Gauge Block and ULM
(130 to 150) mm 1 µm
(1 to 50) mm 0.38 µm
(50 to 85) mm 0.55 µm In house method: CLC-
Thread Plug Gauge (85 to 100) mm 0.57 µm CPDU-05 Comparison
(Major Diameter) (100 to 110) mm 0.69 µm Measurement by using
(110 to 130) mm 0.76 µm Gauge Block and ULM
(130 to 150) mm 0.85 µm
Up to 10 mm 0.4 µm
(10 to 25) mm 0.4 µm
(25 to 50) mm 0.4 µm
In house method: CLC-
(50 to 75) mm 0.4 µm
Standard Micrometer CPDU-06 by Comparison
(75 to 100) mm 0.4 µm
/Setting Rod/Length Bar with Gauge Block and
(100 to 125) mm 0.4 µm
ULM
(125 to 150) mm 0.5 µm
(150 to 175) mm 0.5 µm
(175 to 200) mm 0.5 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(200 to 225) mm 0.5 µm
(225 to 250) mm 0.5 µm
(250 to 275) mm 0.6 µm
(275 to 300) mm 0.6 µm
(300 to 325) mm 0.6 µm In house method: CLC-
Standard Micrometer (325 to 350) mm 0.6 µm CPDU-06 by Comparison
/Setting Rod/Length Bar (350 to 375) mm 0.6 µm with Gauge Block and
(375 to 400) mm 0.7 µm ULM
(400 to 425) mm 0.7 µm
(425 to 450) mm 0.7 µm
(450 to 475) mm 0.7 µm
(475 to 500) mm 0.8 µm
In house method: CLC-
CPDU-07 by Comparison
Feeler Gauge/Thickness Plate Up to 3 mm 0.6 µm
with Gauge Block and
ULM
Up to 10 mm 0.09 µm
(10 mm to 25) mm 0.1 µm
(25 mm to 50) mm 0.15 µm
(50 mm to 75) mm 0.2 µm
(75 mm to 100) mm 0.25 µm
(100 mm to 125) mm 0.31 µm In house method: CLC-
1
Universal Length Measuring (125 mm to 150) mm 0.37 µm CPDU-08 using Standard
(150 mm to 175) mm 0.43 µm Gauge Block
(175 mm to 200) mm 0.48 µm
(200 mm to 250) mm 0.6 µm
(250 mm to 300) mm 0.72 µm
(300 mm to 400) mm 0.95 µm
(400 mm to 500) mm 1.2 µm
(2 to 6) mm 1.2 µm
(6 to 50) mm 1.3 µm
(50 to 75) mm 1.4 µm
(75 to 88) mm 1.5 µm
1 In house method: CLC-
Three-Point Internal (88 to 100) mm 1.6 µm
CPDU-09 by Comparison
Micrometer (Diameter) (100 to 125) mm 1.8 µm
with Setting Ring Gauge
(125 to 150) mm 2 µm
(150 to 175) mm 2.2 µm
(175 to 200) mm 2.4 µm
(200 to 225) mm 2.7 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Finger Probe In house method: CLC-
-Diameter (0 to 100) mm 1.2 µm CPDU-10 by Direct
-Thickness (0 to 30) mm 1.2 µm Measurement with Vision
-Length (0 to 250) mm 4.2 µm Auto Measuring
-Radius (0 to 10) mm 3 µm Instrument, Universal
-Angle (0 to 40) ° 0.04 ° Length Measuring Machine
In house method: CLC-
2
Radius Gauge CPDU-11 by Direct
(Concave and Convex)
(0 to 1 500) mm �(3)2 + (1.3 × 10 −2 𝑙𝑙)2 μm Measurement with Vision
Auto Measuring Instrument
In house method: CLC-
CPDU-12 by Direct
Taper Gauge (0 to 60) mm 4 µm
Measurement with Vision
Auto Measuring Instrument
In house method: CLC-
Screw Pitch Gauge & CPDU-13 by Direct
(0.20 to 8.5) mm 5 µm
Pitch Gauge Measurement with Vision
Auto Measuring Instrument
In house method: CLC-
CPDU-14 by Direct
Angle Gauge Up to 90 ° 0.04 °
Measurement with Vision
Auto Measuring Instrument
ABS, Plastics, Acrylic
(0 to 6.17) mm 0.2 µm
Copper In house method: CLC-
(0 to 6.17) mm 0.2 µm CPDU-15 Direct
Standard Foils
Aluminum Measurement by ULM
(0 to 6.17) mm 0.2 µm using anvils and Ball Probe
Brass
(0 to 6.17) mm 0.2 µm
(0.02 to 19) mm 3.2 µm
(19 to 31.5) mm 3.3 µm
(31.5 to 50) mm 3.4 µm In house method: CLC-
Testing Sieve (Opening (50 to 63) mm 3.5 µm CPDU-16 Direct
Dimension) (63 to 75) mm 3.6 µm Measurement by Auto
(75 to 90) mm 3.7 µm Vision Measuring Machine
(90 to 106) mm 3.8 µm
(106 to 125) mm 3.9 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house method: CLC-
(7.142 to 25.279) mm 0.3 µm
Taper Thread Ring Gauge CPDU-17 Comparison
(25.279 to 58.135) mm 0.4 µm
Pitch Diameter Measurement by using
(58.135 to 87.889) mm 0.5 µm
Gauge Block and ULM
In house method: CLC-
(7.142 to 25.279) mm 0.3 µm
Taper Thread Plug Gauge CPDU-18 Comparison
(25.279 to 58.135) mm 0.4 µm
Pitch Diameter Measurement by using
(58.135 to 86.405) mm 0.5 µm
Gauge Block and ULM
Up to 30 mm 0.5 µm
(30 to 40) mm 0.5 µm
(40 to 50) mm 0.5 µm In house method: CLC-
(50 to 60) mm 0.5 µm CPDU-19 Comparison
Steel Ball
(60 to 70) mm 0.5 µm Measurement by using
(70 to 80) mm 0.6 µm Gauge Block and ULM
(80 to 90) mm 0.6 µm
(90 to 100) mm 0.6 µm
125 mm 0.13 µm
150 mm 0.14 µm
175 mm 0.16 µm In house method: CLC-
200 mm 0.17 µm CPDU-20 by Comparison
Long Gauge Block
250 mm 0.2 µm with Long Gauge Block
300 mm 0.23 µm and ULM
400 mm 0.29 µm
500 mm 0.35 µm
In house method: CLC-
CPDU-25 by Direct
Steel Ruler (0 to 300) mm 0.013 mm
Measurement with Vision
Auto Measuring Instrument
In house method: CLC-
CPDS-01by Direct
Steel Ruler (0 to 2 000) mm 0.06 mm
Measurement with
Electronic Scale
(0 to 150) mm 2 µm
(0 to 300) mm 4 µm
1 (0 to 450) mm 6 µm In house method: CLC-
Vernier Caliper
(0 to 600) mm 8 µm CPDS-02 by Comparison
- Inside, Outside, Depth
(0 to 1 000) mm 13 µm with Gauge Block
(0 to 1 500) mm 20 µm
(0 to 2 000) mm 27 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(0 to 450) mm 9 µm
1 (0 to 600) mm 10 µm In house method: CLC-
Vernier Caliper
(0 to 1000) mm 15 µm CPDS-02 by Comparison
-Inside, Outside
(0 to 1500) mm 21 µm with Gauge Block
(0 to 2000) mm 28 µm
1 (0 to 5) mm 0.4 µm
Dial Gauge In house method: CLC-
(5 to 100) mm 3 µm
CPDS-03 by Comparison
(0 to 50) mm 1 µm
Digital Indicator with Dial Gauge Tester
(50 to 100) mm 1.6 µm
In house method: CLC-
1
Dial Test Indicator (0 to 1.6) mm 0.3 µm CPDS-04 by Comparison
with Calibration Tester
(0 to 25) mm 0.7 µm
(25 to 50) mm 1 µm
(50 to 75) mm 1.2 µm
(75 to 100) mm 1.5 µm
(100 to 125) mm 1.8 µm
In house method: CLC-
1 (125 to 150) mm 2.1 µm
Depth Micrometer CPDS-05 by Comparison
(150 to 175) mm 2.4 µm
with Gauge Block
(175 to 200) mm 2.8 µm
(200 to 225) mm 3.1 µm
(225 to 250) mm 3.4 µm
(250 to 275) mm 3.7 µm
(275 to 300) mm 4.1 µm
(5 to 50) mm 1.2 µm
(50 to 75) mm 1.4 µm
(75 to 100) mm 1.7 µm
(100 to 125) mm 2 µm
(125 to 150) mm 2.3 µm
(150 to 175) mm 2.6 µm
(175 to 200) mm 3 µm
(200 to 225) mm 3.2 µm In house method: CLC-
1
Inside Micrometer (225 to 250) mm 3.5 µm CPDS-06 by Comparison
(250 to 275) mm 3.8 µm with Gauge Block
(275 to 300) mm 4.2 µm
(300 to 325) mm 4.5 µm
(325 to 350) mm 4.8 µm
(350 to 375) mm 5.1 µm
(375 to 400) mm 5.5 µm
(400 to 425) mm 5.8 µm
(425 to 450) mm 6.1 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(450 to 475) mm 6.5 µm
(475 to 500) mm 6.8 µm
(500 to 525) mm 7.2 µm
(525 to 550) mm 7.5 µm
(550 to 575) mm 7.8 µm
(575 to 600) mm 8.2 µm
(600 to 625) mm 8.5 µm
(625 to 650) mm 8.8 µm
(650 to 675) mm 9.2 µm
(675 to 700) mm 9.5 µm
(700 to 725) mm 9.8 µm
In house method: CLC-
1 (725 to 750) mm 10 µm
Inside Micrometer CPDS-06 by Comparison
(750 to 775) mm 11 µm
with Gauge Block
(775 to 800) mm 11 µm
(800 to 825) mm 11 µm
(825 to 850) mm 12 µm
(850 to 875) mm 12 µm
(875 to 900) mm 12 µm
(900 to 925) mm 13 µm
(925 to 950) mm 13 µm
(950 to 975) mm 13 µm
(975 to 1 000) mm 14 µm
(1 000 to 1 025) mm 14 µm
(1 025 to 1 050) mm 14 µm
(0 to 25) mm 0.5 µm
(25 to 50) mm 0.8 µm
(50 to 75) mm 1.1 µm
(75 to 100) mm 1.4 µm
(100 to 125) mm 1.7 µm
(125 to 150) mm 2.1 µm
(150 to 175) mm 2.4 µm
In house method: CLC-
1 (175 to 200) mm 2.7 µm
Outside Micrometer CPDS-07 by Comparison
(200 to 225) mm 3 µm
with Gauge Block
(225 to 250) mm 3.4 µm
(250 to 275) mm 3.7 µm
(275 to 300) mm 4 µm
(300 to 325) mm 4.4 µm
(325 to 350) mm 4.7 µm
(350 to 375) mm 5.1 µm
(375 to 400) mm 5.4 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(400 to 425) mm 5.7 µm
(425 to 450) mm 6.1 µm
(450 to 475) mm 6.4 µm
(475 to 500) mm 6.7 µm
(500 to 525) mm 7 µm
(525 to 550) mm 7.4 µm
(550 to 575) mm 7.7 µm
(575 to 600) mm 8 µm In house method: CLC-
1
Outside Micrometer (600 to 625) mm 8.3 µm CPDS-07 by Comparison
(625 to 650) mm 8.7 µm with Gauge Block
(650 to 675) mm 9 µm
(675 to 700) mm 9.3 µm
(700 to 725) mm 9.7 µm
(725 to 775) mm 10 µm
(775 to 850) mm 11 µm
(850 to 925) mm 12 µm
(925 to 1 000) mm 13 µm
(0 to 5) mm 0.7 µm In house method: CLC-
1
Thickness Gauge (5 to 25) mm 1.3 µm CPDS-08 by Direct
(Digital/Dial) (25 to 50) mm 2.4 µm Measurement with Gauge
(50 to 100) mm 4.7 µm Block
(0 to 300) mm 4 µm
1 In house method: CLC-
Vernier, Dial and Digital (300 to 450) mm 6 µm
CPDS-09 by Comparison
Depth Gauge (450 to 600) mm 8 µm
with Gauge Block
(600 to 1 000) mm 13 µm
(0 to 300) mm 4 µm
In house method: CLC-
1 (300 to 450) mm 6 µm
Height Gauge CPDS-10 by Comparison
(450 to 600) mm 8 µm
with Gauge Block
(600 to 1 000) mm 13 µm
(0 to 2) m 0.07 mm
(2 to 4) m 0.14 mm
(4 to 6) m 0.21 mm
(6 to 8) m 0.28 mm
In house method: CLC-
(8 to 10) m 0.35 mm
CPDS-11by Direct
Steel Tape (10 to 12) m 0.42 mm
Measurement with
(12 to 14) m 0.49 mm
Electronic Scale
(14 to 16) m 0.56 mm
(16 to 18) m 0.63 mm
(18 to 20) m 0.7 mm
(20 to 22) m 0.77 mm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(22 to 24) m 0.84 mm
(24 to 26) m 0.91 mm
(26 to 28) m 0.98 mm
(28 to 30) m 1.1 mm
(30 to 32) m 1.1 mm
(32 to 34) m 1.2 mm In house method: CLC-
(34 to 36) m 1.3 mm CPDS-11by Direct
Steel Tape
(36 to 38) m 1.3 mm Measurement with
(38 to 40) m 1.4 mm Electronic Scale
(40 to 42) m 1.5 mm
(42 to 44) m 1.5 mm
(44 to 46) m 1.6 mm
(46 to 48) m 1.7 mm
(48 to 50) m 1.8 mm
In house method: CLC-
1
Digital/Dial Depth Gauge (0 to 50) mm 6 µm CPDS-12 by Comparison
with Gauge Block
In-house method: CLC-
CPDS-13 by Comparison
1
Bore Gauge (All Range) (0 to 1.50) mm 0.4 µm with Bore Gauge Tester or
Dial Gauge Testing
machining
1 (2.5 to 15) mm 3 µm In house method: CLC-
Digital Caliper Gauge
(15 to 90) mm 6 µm CPDS-14 by Comparison
(Internal)
(90 to 120) mm 12 µm with Gauge Block
1 In house method: CLC-
Dial Caliper Gauge (2.5 to 15) mm 3 µm
CPDS-14 by Comparison
(Internal) (15 to 180) mm 6 µm
with Gauge Block
1 (0 to 10) mm 3 µm In house method: CLC-
Digital Caliper Gauge
(10 to 20) mm 6 µm CPDS-14 by Comparison
(External)
(20 to 50) mm 12 µm with Gauge Block
(0 to 10) mm 3 µm
1 In house method: CLC-
Dial Caliper Gauge (10 to 20) mm 6 µm
CPDS-14 by Comparison
(External) (20 to 50) mm 0.03 mm
with Gauge Block
(50 to 130) mm 0.06 mm
200 mm × 150 mm 0.5 µm
1 In house method: CLC-
Rectangular Shape 300 mm × 250 mm 0.7 µm
CPDA-01 based on JIS B
Granite/Cast Iron Surface 400 mm × 250 mm 0.8 µm
7513: 1992 by Engineer-
Plate (Overall Flatness) 450 mm × 300 mm 0.9 µm
Set 20 (Electronic Level)
600 mm × 450 mm 1.3 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
630 mm × 400 mm 1.3 µm
750 mm × 500 mm 1.6 µm
900 mm × 600 mm 2 µm
1 000 mm × 630 mm 2.1 µm
1 In house method: CLC-
Rectangular Shape 1 000 mm × 750 mm 2.3 µm
CPDA-01 based on JIS B
Granite/Cast Iron Surface 1 500 mm × 1 000 mm 3.4 µm
7513: 1992 by Engineer-
Plate (Overall Flatness) 1 600 mm × 1 000 mm 3.5 µm
Set 20 (Electronic Level)
2 000 mm × 1 000 mm 4.3 µm
2 000 mm × 1 500 mm 4.9 µm
3 000 mm × 1 500 mm 6.4 µm
3 000 mm × 2 000 mm 7.2 µm
100 mm × 100 mm 0.4 µm
150 mm × 150 mm 0.4 µm
1 In house method: CLC-
Square Shape 300 mm × 300 mm 0.7 µm
CPDA-01 based on JIS B
Granite/Cast Iron Surface 400 mm × 400 mm 0.9 µm
7513: 1992 by Engineer-
Plate (Overall Flatness) 600 mm × 600 mm 1.4 µm
Set 20 (Electronic Level)
1 000 mm × 1 000 mm 2.7 µm
2 000 mm × 2 000 mm 5.7 µm
1 In house method: CLC-
Calibration Tester /Dial (0 to 5) mm 0.15 µm
CPDA-02 by Comparison
Gauge Tester (0 to 25) mm 0.53 µm
with Digital Length Gauge
In house method: CLC-
1,2 CPDA-02 by Comparison
Dial Gauge Testing
(0 to 100) mm 0.22 µm + (2×10-6⋅l) with Laser Doppler
Machine
Displacement Meter
(LDDM)
Block Pitch
(5 to 90) mm 0.3 µm
(90 to 150) mm 0.5 µm In house method: CLC-
Height Master (150 to 250) mm 0.7 µm CPDA-03 by Comparison
(250 to 310) mm 0.9 µm with Gauge Blocks
(310 to 460) mm 1.2 µm
(460 to 610) mm 1.5 µm
In house method: CLC-
Block Feeding
Height Master CPDA-03 by Comparison
(0 to 20) mm 0.7 µm
with Digital Length Gauge
In house method: CLC-
(0 to 300) mm 0.8 µm
Caliper Checker CPDA-04 by Comparison
(300 to 600) mm 1.5 µm
with Gauge Block

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
0.01 mm/m 2.4 µm/m
In house method: CLC-
1 0.02 mm/m 3.3 µm/m
Precision Level/Level of CPDA-05 based on JIS B
0.05 mm/m 0.006 mm/m
Theodolite 7510: 1993 by Engineer-
0.10 mm/m 0.014 mm/m
Set 20 (Electronic Level)
0.30 mm/m 0.035 mm/m
Angle
In house method: CLC-
1 (0 to 90) ° 1′
Profile Projector CPDA-06 by Standard
Linear
Glass Scale
(0 to 300) mm 1.2 µm
1 In house method: CLC-
Measuring Microscope
(0 to 300) mm 0.7 µm CPDA-07 based on JIS B
- Position Measurement
7153: 1995 Clause 4
In house method: CLC-
1 (0 to 25) mm 0.5 µm
Micrometer Head CPDA-08 by Comparison
(0 to 50) mm 0.7 µm
with Digital Length Gauge
Granite
(200 to 1 000) mm 2.6 µm
In house method: CLC-
1 (1 000 to 2 000) mm 5.2 µm
Straight Edge CPDA-09 by Engineer-Set
Iron
20 (Electronic Level)
(200 to 1 000) mm 2.6 µm
(1 000 to 2 000) mm 5.2 µm
In house method: CLC-
1
Bevel Protractor (0 to 90) ° 2′ CPDA-10 by Comparison
with Angle Block
In house method: CLC-
1,2
Universal Length CPDL-01 by Direct
(0 to 500) mm 0.24 µm +(3 ×10-4× l) µm
Measuring Machine by Laser Measurement with Laser
Interferometer (LSI)
In house method: CLC-
CPDL-02 by Direct
Measurement with Laser
2
Standard Scale (0 to 300) mm 0.000 3 mm +(4×10-7 ×l) mm
Interferometer (LSI) based
on
JIS B 7541: 1973
In house method: CLC-
1,2
Coordinate Measuring CPDL-03 by Direct
(0 to 3 000) mm 0.0007 mm +(5×10-7×l) mm
Machine Measurement with
Laser Interferometer (LSI)

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Up to 100 mm 0.4 µm
(100 to 200) mm 0.7 µm
(200 to 300) mm 1 µm
(300 to 400) mm 1.2 µm In house method: CLC-
1
Coordinate Measuring (400 to 500) mm 1.5 µm CPCMM-02 by
Machine (500 to 600) mm 1.7 µm Comparison with
(600 to 700) mm 2 µm Standard Gauge Block
(700 to 800) mm 2.3 µm
(800 to 900) mm 2.5 µm
(900 to 1 000) mm 2.7µm
1,2 In house method: CLC-
Computer Numerical
CPDL-04 by Direct
Control (0 to 6 000) mm 0.000 7 mm +(5×10-7×l) mm
Measurement with
(Linear Measurement)
Laser Interferometer (LSI)
In house method: CLC-
1,2
Dimensional Measurement- CPDL-05 by Direct
(0 to 12 000) mm 0.000 7 mm +(2×10-6×l) mm
1D Measurement with
Laser Interferometer (LSI)
In house method: CLC-
CPDL-06 by Comparison
with Standard Glass Scale
2
Scale Loupe (0 to 20) mm 0.000 6 mm + (2.5 ×10-6× l) mm and Laser Interferometer
(LSI)
JIS B 7541: 1973 Standard
Glass Scale
In house method: CLC-
1 CPCMM-05 by
Calibration Tracker Up to 1 450 mm 10 µm
Comparison with
Calibration Length
In house method: CLC-
Diameter
CPCMM-06 by
1 Up to 30 mm 0.7 µm
Calibration Arm Comparison with
Volumetric
Reference Sphere and
Up to 1 450 mm 14 µm
Calibration Length
Diameter In house method: CLC-
(1 to 15) mm 0.2 µm CPDU-21
Taper Ring Gauge
(15 to 45) mm 0.3 µm Comparison Measurement
Diameter
(45 to 75) mm 0.4 µm by using
(75 to 100) mm 0.5 µm Gauge Block and ULM

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house method: CLC-
Length CPDU-21
Taper Ring Gauge
Up to 25 mm 0.2 µm Comparison Measurement
Length
(25 to 50) mm 0.3 µm by using
Gauge Block and ULM
Diameter
In house method: CLC-
(1 to 15) mm 0.2 µm
Taper Plug Gauge CPDU-22 Comparison
(15 to 45) mm 0.3 µm
Diameter Measurement by using
(45 to 75) mm 0.4 µm
Gauge Block and ULM
(75 to 100) mm 0.5 µm
In house method: CLC-
Length
Taper Plug Gauge CPDU-22 Comparison
Up to 25 mm
Length 0.2 µm Measurement by using
(25 to 50) mm
0.3 µm Gauge Block and ULM
In house method: CLC-
Ra Up to 12.7 µm 0.05 µm
CPDA-12 by Comparison
Roughness Specimen Rz Up to 50 µm 0.5 µm
with Surface & Contour
Ry Up to 11.3 µm 0.07 µm
Measurement
Horizontal
(0, 45, 90, 270, 315, 360)
24 arcsec In house method: CLC-
°
CPDA-14 by Comparison
Automatic Level & Theodolite Vertical
24 arcsec with Optical Standard
90 °
Collimator
Elevation and Depression
24 arcsec
(15, 30) °
In house method: CLC-
CPDA-15 by Comparison
1
Digital Level Up to 90 ° 0.01 °
with Angle Gauge Block
and Electronic Level
Accuracy of Probe
At zero 0.03 µm
Roughness
Ra 0.37 0.05 µm In house method: CLC-
1
Roughness Tester Ra 0.43 0.04 µm CPDA-16 by Roughness
Ra 2.99 0.06 µm Specimen
Rz 1.35 0.08 µm
Rz 2.28 0.2 µm
Rz 9.20 0.42 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(0 to 10) µm 0.6 µm
In house method: CLC-
(10 to 20) µm 0.6 µm
1 CPDA-21 by Direct
Air Micrometer (20 to 50) µm 0.6 µm
Measurement with
(50 to 100) µm 0.8 µm
Calibration Tester
(100 to 200) µm 1.3 µm
In house method: CLC-
1
Gauge Block Comparator Up to 100 mm 0.027 µm CPDG-02 by Comparison
with Standard Gauge Block
(0 to 2( m 0.07 mm
(2 to 4( m 0.14 mm
(4 to 6( m 0.21 mm
(6 to 8( m 0.28 mm
(8 to 10( m 0.35 mm
(10 to 12( m 0.42 mm
(12 to 14( m 0.49 mm
(14 to 16( m 0.56 mm
(16 to 18( m 0.63 mm
(18 to 20( m 0.7 mm
(20 to 22( m 0.77 mm
In house method: CLC-
(22 to 24( m 0.84 mm
CPDS-15 by Direct
Textile Tape (24 to 26( m 0.91 mm
Measurement with
(26 to 28( m 0.98 mm
Electronic Scale
(28 to 30( m 1.1 mm
(30 to 32( m 1.1 mm
(32 to 34( m 1.2 mm
(34 to 36( m 1.3 mm
(36 to 38( m 1.3 mm
(38 to 40( m 1.4 mm
(40 to 42( m 1.5 mm
(42 to 44( m 1.5 mm
(44 to 46( m 1.6 mm
(46 to 48( m 1.7 mm
(48 to 50( m 1.8 mm
In house method: CLC-
CPDA-23 by Comparison
2
Check Master (0 to 600) mm 1.6 μm + (1.1 × 10 × l )
-3
with Gauge Block and
Electronic Comparator

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house method: CLC-
Straightness (0 to 50) mm 0.07 μm
CPDA-24 by Comparison
1 X-Axis (0 to 100) mm 0.5 μm
Contour Tester method with Glass
Z-Axis (0 to 50) mm 0.3 μm
Hemisphere and Gauge
Radius (0 to 100) mm 0.38 μm
Blocks.
(0 to 12) mm 0.2 μm
In house method: CLC-
1 (12 to 20) mm 0.4 μm
Dial and Digital indicator / CPDA-26 based on JIS B
(20 to 35) mm 0.6 μm
Length Gauge by Gauge block 7503 by Comparison with
(35 to 60) mm 1 μm
Gauge Block
(60 to 100) mm 1.6 μm
Diagonal Volumetric
1 m3 0.45 μm+(1.96× 10-6× l) In house method: CLC-
1,2 2m 0.45 μm+(1.96× 10-6× l) CPDL-07
Coordinate Measuring
4 m2 0.45 μm+(1.96× 10-6× l) by Direct comparison with
Machine
8 m3 0.45 μm+(1.96× 10-6× l) Laser Interferometer (LSI)
Squareness ISO 10360:2005
90 ° 0.04 °
In house method: CLC-
CPDL-08 based on JIS B
1,2
Laser Distance Meter (0 to 10) m ±0.058+(2.81×10-6×l) mm
7450 by Comparison with
Laser Interferometer (LSI)
In-house method: CLC-
(0.5 to 50) mm 0.06 μm CPDG-05 based on ISO
Square Gauge Block (50 to 75) mm 0.07 μm 3650 by Comparison with
(75 to 100) mm 0.11 μm Gauge Block Comparator
and Gauge Block
Outside
(0 to 25) mm 0.002 4 mm
(25 to 50) mm 0.002 5 mm
(50 to 75) mm 0.002 6 mm In house method: CLC-
1 (75 to 100) mm 0.002 7 mm CPDS-16 based on JIS B
Groove Micrometer Inside 7502 by Comparison with
(1.6 to 26.5) mm 0.002 5 mm Gauge Block
(26.5 to 51.5) mm 0.002 6 mm
(51.5 to 76.5) mm 0.002 7 mm
(76.5 to 101.5) mm 0.002 8 mm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Up to 20 mm 0.000 6 mm
(20 to 30) mm 0.000 7 mm
(30 to 40) mm 0.000 8 mm
(40 to 50) mm 0.000 9 mm
(50 to 60) mm 0.001 mm
(60 to 70) mm 0.001 1 mm
(70 to 80) mm 0.001 2 mm
(80 to 90) mm 0.001 3 mm In house method: CLC-
1 (90 to 100) mm 0.001 4 mm CPDS-17 by Comparison
Ultrasonic Thickness Gauge
(100 to 125) mm 0.001 7 mm with Gauge Block
(125 to 150) mm 0.002 mm
(150 to 175) mm 0.002 3 mm
(175 to 200) mm 0.002 6 mm
(200 to 250) mm 0.003 2 mm
(250 to 300) mm 0.003 9 mm
(300 to 400) mm 0.005 1 mm
(400 to 500) mm 0.006 4 mm
Scale
(0 to 25) mm 0.001 3 mm
In house method: CLC-
1 (25 to 50) mm 0.001 4 mm
Dial Snap & Indicating CPDS-18 based on JIS B
(50 to 75) mm 0.001 6 mm
Micrometer 7520 by Comparison with
(75 to 100) mm 0.001 8 mm
Gauge Block
Dial
± 0.060 mm 0.001 2 mm
In house method: CLC-
1 ± 30 mm 0.006 mm CPDS-19 by Comparison
Level Gauge
with Gauge Block
In house method: CLC-
Dial Test Indicator by Dial CPDS-20 based on JIS B
(0 to 1.60) mm 0.4 μm
Testing Machine 7533 by Comparison with
Dial Testing Machine
In house method: CLC-
1 CPDS-21 based on JIS B
Can Seam Micrometer (0 to 13) mm 0.0006 mm
7502 by Comparison with
Gauge Block
In house method: CLC-
1
Coating Thickness Gauge Up to 6.17 mm 0.7 μm CPDS-22 by Comparison
with Standard Foil

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Chamfer In house method: CLC-
(0 to 30) mm 0.003 3 mm CPDU-26 Direct
Chamfer Gauge
Angle of Chamfer Measurement with Vision
(1 to 90) ° 0.04 ° Auto Measuring Instrument
Angle
(0 to 90) ° 0.04 °
Linear
-ABS, Plastics, Acrylic
Up to 300 mm 0.011 mm
-Glass, Steel
Up to 300 mm 0.006 mm In house method: CLC-
Diameter CPDU-27 Direct
Protractor, Overlay Chart -ABS, Plastic, Acrylic Up Measurement by Vision
to 300 mm 0.010 mm Auto Measuring
-Glass, Steel Instrument.
Up to 300 mm 0.005 mm
Radius
-ABS, Plastic, Acrylic
Up to 150 mm 0.006 mm
-Glass, Steel
Up to 150 mm 0.005 mm
Position Measurement In house method: CLC-
1
Image Micro Scope Up to 250 mm 0.32 μm CPDU-28 based on JIS B
250 mm to 300 mm 0.54 μm 7153 Clause 4
Up to 1.55 mm 0.5 μm
(1.55 to 4) mm 0.5 μm
(4 to 7.3) mm 0.5 μm
(7.3 to 10) mm 0.5 μm
(10 to 18.5) mm 0.5 μm In house method: CLC-
Bore Gauge By Universal (18.5 to 35) mm 0.5 μm CPDU-30 Comparison with
Length Machine (35 to 60) mm 0.5 μm Gauge Block and Universal
(60 to 100) mm 0.5 μm Length Machine
(100 to 150) mm 0.5 μm
(150 to 250) mm 0.6 μm
(250 to 400) mm 0.7 μm
(400 to 500) mm 0.7 μm
In house Method CLC-
Diameter Over Pin CPDU-31
2
Internal Spline Gauge (3 to 100) mm �(0.65)2 + (1.2 × 10−3 × 𝑙𝑙)2 𝜇𝜇𝜇𝜇 Comparison with Gauge
(100 to 250) mm �(0.7)2 + (1.5 × 10−3 × 𝑙𝑙)2 𝜇𝜇𝜇𝜇 Block and Universal
Length Machine

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house Method CLC-
Diameter Over Pin
CPDU-32 Comparison with
2
External Spline Gauge Up to 100 mm �(0.65)2 + (1.2 × 10−3 × l)2 μm
Gauge Block and Universal
(100 to 250) mm �(0.7)2 + (1.5 × 10−3 × l)2 μm
Length Machine
In house method: CLC-
1 Up to 1 000 m 0.002 m + 0.07 % of reading CPDA-25 by Direct
Roller Counter
(1 000 to 99 999) m 0.002 m + 0.05 % of reading Measurement with Digital
Tachometer

Mass and Mass Related

Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(0 to 34.5( kPa 0.009 kPa
1
Pressure Measuring (34.5 to 103.4( kPa 0.022 kPa
Instrument (103.4 to 206.8( kPa 0.03 kPa In house method: CLC-
Pneumatic Type (206.8 to 689.5) kPa 0.15 kPa CPPP-01 by Comparison
- Bourdon Pressure Gauge (689.5 to 2068) kPa 0.47 kPa with Pressure Module
- Electrical Pressure Gauge (2 068 to 3 447( kPa 0.77 kPa
(3 447 to 10 342( kPa 1.7 kPa
The larger of
(3.5 to 34.5) kPa
2
Pressure Measuring 2.3 × 10-4 × Pe, or 1.2 Pa In - house method: CLC-
Instrument Pneumatic Type (34.5 to 345) kPa 1.5 × 10-4 × Pe CPPP-02 by Comparison
-Bourdon pressure gauge (345 to 3 450) kPa 2 × 10-4 × Pe with standard pneumatic
-Electrical pressure gauge (3 450 to 6 900) kPa 1.6 × 10-4× Pe dead weight tester
(6 900 to 34 500) kPa 1.1 × 10-4× Pe
(3.5 to 34.5) kPa 0.11 % of reading
In - house method: CLC-
Pressure Measuring (34.5 to 345) kPa 0.11 % of reading
CPPP-02 by Comparison
Instrument Pneumatic Type (345 to 3 450) kPa 0.11 % of reading
with standard pneumatic
-Electrical output, transmitter (3 450 to 6 900) kPa 0.11 % of reading
dead weight tester
(6 900 to 34 500) kPa 0.11 % of reading
2 The larger of
Pressure Measuring (1.7 to 17) MPa In house method: CLC-
Instrument Hydraulic Type 1.1 × 10-4×Pe or 0.22 kPa CPPP-03 by Comparison
-Bourdon pressure gauge (8.4 to 84) MPa 9.9 × 10-5×Pe with standard Hydraulic
-Electrical pressure gauge (8.4 to 137.5) MPa 9.9 × 10-5×Pe dead weight tester
In house method: CLC-
Pressure Measuring (1.7 to 17) MPa 0.12 % of reading
CPPP-03 by Comparison
Instrument Hydraulic Type (8.4 to 84) MPa 0.12 % of reading
with standard Hydraulic
-Electrical output, transmitter (84 to 137.5) MPa 0.12 % of reading
dead weight tester

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(0 to 2 068) kPa 0.25 kPa
1
Pressure Measuring (2 068 to 3 400) kPa 0.4 kPa
In house method: CLC-
Instrument Hydraulic Type (3.4 to 6.9) MPa 0.77 kPa
CPPP-04 by Comparison
-Bourdon Pressure Gauge (6.9 to 10.3) MPa 1.3 kPa
with Pressure Module
-Electrical Pressure Gauge (10.3 to 20.5) MPa 2.7 kPa
(20.5 to 68.9) MPa 10 kPa
1
Negative Gauge Pressure
Instrument In house method: CLC-
-Bourdon Vacuum Gauge (-100 to 0) kPa 0.016 kPa CPPP-05 by Comparison
-Capsule Vacuum Gauge with Pressure Module
-Diaphragm Vacuum Gauge
The larger of In house method: CLC-
2
Hydraulic Pressure Balance (609 to 6 095) kPa CPPP-06
1.2 × 10-4 × Pe, or 0.07 kPa
Dead Weight Tester Oil
2 The larger of Method Cross Floating
Hydraulic Pressure Balance 6095 kPa to 69.8 MPa Calibration using Master
9.9 × 10-5 × Pe, or 0.69 kPa
Hydraulic Pressure
The larger of Balance, Piston Cylinders,
2
Hydraulic Pressure Balance (69.8 to 100) MPa Weight Sets
9.6 × 10-5 × Pe, or 0.95 kPa
(10 mg to 100 kg)
In house method: CLC-
1
Gauge Pressure Measuring CPPP-07
Instrument Pneumatic Type based on DKD –R6-1 by
(0 to 100) kPa 0.003 kPa
-Bourdon comparison technique with
-Electrical Reference Pressure
Monitor
In house method: CLC-
1
Absolute Pressure Measuring CPPP-07
(3.5 to 34) kPa 0.7 Pa
Instrument based on DKD –R6-1 by
(6.9 to 69) kPa 0.7 Pa
-Bourdon comparison technique with
(21 to 206) kPa 1 Pa
-Electrical Reference Pressure
Monitor
In house method: CLC-
1
Negative Pressure Measuring CPPP-07
Instrument Pneumatic Type based on DKD –R6-1 by
(0 to -35.5) kPa 1.1 Pa
-Bourdon comparison technique with
-Electrical Reference Pressure
Monitor

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
1 In house method: CLC-
Gauge Pressure Measuring
(0 to 0.125) kPa 0.12 Pa CPPP-08
Instrument Pneumatic Type
(0.125 to 1.25) kPa 0.6 Pa base on DKD –R6-1 by
-Bourdon
(1.25 to 100) kPa 20 Pa comparison technique with
-Electrical
pressure module
1 In house method: CLC-
Absolute Pressure Measuring
CPPP-08
Instrument
(0 to 103.4) kPa 11 Pa base on DKD –R6-1 by
-Bourdon
comparison technique with
-Electrical
pressure module
1 In house method: CLC-
Negative Pressure Measuring
CPPP-08
Instrument Pneumatic Type
(-100 to 0) kPa 0.016 kPa base on DKD –R6-1 by
-Bourdon
comparison technique with
-Electrical
pressure module
2 The larger of In house method: CLC-
Gas Pressure Balance (3.45 to 17.25) kPa
1.7 × 10-4 × Pe, or 0.58 Pa CPPP-09
Dead Weight Tester Air
2 The larger of
Gas Pressure Balance Method B Cross Floating
(17.25 to 34.5) kPa 1.5 × 10-4 × Pe, or 4.2 Pa
Calibration
The larger of
(34.5 to 965) kPa
1.3 × 10-4 × Pe, or 0.05 kPa
2 The larger of Piston Cylinders, Weight
Gas Pressure Balance (965 to 3 447) kPa
1 × 10-4 × Pe, or 0.07 kPa Sets (10 mg to 50 kg)
The larger of
(3 447 to 34 386) kPa
7.5 × 10-5 × Pe, or 0.24 kPa
(1.3 x 10-2 to 1.3) mbar 1.8 % of reading In house method: CLC-
1
Pirani Vacuum Gauge (1.3 to 13) mbar 0.5 % of reading CPPP-10 using portable
(13 to 1.3 x103) mbar 0.3 % of reading calibration system
1 (0 to 34.5) kPa 0.05 % of reading + 0.021 kPa In house method: CLC-
Calibration of Pressure
(34.5 to 103.4) kPa 0.05 % of reading + 0.052 kPa CPPP-11 based on DKD –
Measuring Instrument
(103.4 to 2 068) kPa 0.05 % of reading + 1.0 kPa R6-1 by Comparison
Pneumatic Type
(2 068 o 3 447) kPa 0.05 % of reading + 1.7 kPa technique with Pressure
[Electrical Output]
(3 447 to 10 342) kPa 0.05 % of reading + 5.2 kPa Module
In house method: CLC-
1 (0 to 2 068) kPa 0.05 % of reading + 1 kPa
Pressure Measuring CPPP-12 based on DKD –
(2 068 to 3447) kPa 0.05 % of reading + 3.5 kPa
Instrument Hydraulic Type R 6-1 by Comparison
(3 447 to 20.5) MPa 0.05 % of reading + 21 kPa
[Electrical Output] Technique with Pressure
(20.5 to 68.9) MPa 0.05 % of reading + 50 kPa
Module

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Leak Master Tester
Instruments
Test Pressure @
In house method: CLC-
(1 to 12.5 kPa (0.1 to 20) mL/min 0.01 mL/min
CPPP-13 by Indirect
(12.5 to 34 kPa (0.1 to 300) mL/min 0.01 mL/min
Measurement with Pressure
(34 to 100 kPa (0.1 to 500) mL/min 0.01 mL/min
Module
(100 to 200 kPa (0.1 to 500) mL/min 0.01 mL/min
(200 to 340 kPa (0.1 to 500) mL/min 0.011 mL/min
(340 to 1000 kPa (0.1 to 500) mL/min 0.025 mL/min
(0 to 34.5) kPa 0.008 kPa
(34.5 to 103.4) kPa 0.019 kPa In house method: CLC-
(103.4 to 206.8) kPa 0.03 kPa CPPP-14 based on DKD –
1
Safety Valve (206.8 to 689.5) kPa 0.15 kPa R6-1 by Comparison
(689.5 to 2 068) kPa 0.43 kPa technique with Pressure
(2 068 to 3 447) kPa 0.7 kPa Module
(3 447 to 10 342) kPa 1.4 kPa
Tension
(0.05 to 0.5) kN 0.11 % of reading
(0.5 to 5) kN 0.05 % of reading
(5 to 50) kN 0.15 % of reading In house method: CLC-
(50 to 220) kN 0.15 % of reading CPFF-01 by comparison
Force Proving Instrument
Compression with force measurement
(0.05 to 0.5) kN 0.11 % of reading system, force transducer
(0.5 to 5) kN 0.05 % of reading
(5 to 50) kN 0.15 % of reading
(50 to 220) kN 0.15 % of reading
Tension
(0.05 to 0.5) kN 0.11 % of reading
(0.5 to 5) kN 0.05 % of reading
In house method: CLC-
(5 to 220) kN 0.15 % of reading
1 CPFF-02 by Comparison
Force - Measuring System Compression
with force measurement
(0.05 to 0.5) kN 0.11 % of reading
system, force transducer
(0.5 to 5) kN 0.05 % of reading
(5 to 220) kN 0.15 % of reading
(220 to 500) kN 0.2 % of reading
1 Up to 50 N 0.006 N In house method: CLC-
Push – Pull Gauge and
(50 to 500) N 0.07 N CPFF-03 by Comparison
Force Gauge
(500 to 1 000) N 0.2 N with weight standard

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Up to 100 N 0.000 8 N
In house method: CLC-
1 (100 to 200) N 0.012 N
Force Machines CPFF-04 by Comparison
(200 to 500) N 0.025 N
with weight standard
(500 to 1 000) N 0.049 N
Up to 0.05 N 0.01 N
(0.05 to 0.1) N 0.02 N In house method: CLC-
1
Tension Gauge (0.1 to 0.3) N 0.03 N CPFF-05 by Comparison
(0.3 to 0.5) N 0.05 N with Weight Standard
(0.5 to 50) N 0.06 N
In house method: CLC-
1 (0.2 to 9) kN 0.15 % of reading
Weld Force Gauge CPFF-06 based on BS EN
(9 to 99) kN 0.21 % of reading
Compression ISO 7500-1 by Comparison
(99 to 220) kN 0.2 % of reading
with Force Transfer
Up to 500 cN 1 cN In house method: CLC-
1
Tension meter (500 to 5 000) cN 1.5 cN CPFF-07 by Comparison
(5 000 to 10 000) cN 6 cN with Weight Standard
Up to 2.80 N⋅m
(2.80 to 5.60) N⋅m 0.66 % of reading
(5.60 to 11.3) N⋅m 0.26 % of reading
(11.3 to 20) N⋅m 0.15 % of reading
0.38 % of reading
(20 to 42) N⋅m In house method: CLC-
1 0.32 % of reading
Torque Tools (42 to 84) N⋅m CPFT-01 by Comparison
0.32 % of reading
(84 to 170) N⋅m with Torque Standard
0.26 % of reading
(170 to 340) N⋅m 0.26 % of reading
(340 to 550) N⋅m 0.32 % of reading
(550 to 1 000) N⋅m 0.29 % of reading
(1 000 to 2 000) N⋅m 0.82 % of reading
In house method: CLC-
1
Torque Tester and Torque CPFT-02 by Direct
Up to 1 000 N⋅m 0.3 % of reading
Transducer Measurement with Torque
Transfer Wrench
In house method: CLC-
1 (0.1 to 2) N·m 0.6 % of reading CPFT-03 by Compararison
Nut Runner
(2 to 65) N·m 0.5 % of reading with Torque Measurement
System

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house method: CLC-
CPFT-04 based on BS
1 7882 and ASTM-D 3474
Torque Calibrator Up to 1 000 N·m 1.4 mN·m + 2.5 mN·m/N·m
by Comparison with
Calibration Arm and
Weight
In house method: CLC-
Up to 9 000 ft/min 1.2 % of reading
Anemometer CPPF-01 by Comparison
Up to 45 m/s 1.2 % of reading
with a known Velocity
1
Liquid Flow Meter In house method: CLC-
-Electronic Output CPPF-02 by Comparison
(>0 to 2 500) L/min 0.12 % of reading
(0 to 10) V with Flow Meter
(4 to 20) mA Calibration System
In house method: CLC-
1
Liquid Flow Meter with CPPF-02 by Comparison
(>0 to 2 500) L/min 0.12 % of reading
Indicator with Flow Meter
Calibration System
(0 to 0.01) L/min 0.09 mL/min
(0.01 to 0.1) L/min 0.9 mL/min
(0.1 to 0.25) L/min 0.002 2 L/min
(0.25 to 0.5) L/min 0.004 4 L/min In house method: CLC-
1
Gas Flow Meter (0.25 to 1) L/min 0.009 L/min CPPF-03 by Comparison
(1 to 6.0) L/min 0.052 L/min with Flow Calibrator
(6.0 to 10.0) L/min 0.087 L/min
(10.0 to 30.0) L/min 0.27 L/min
(30.0 to 75.0) L/min 0.87 L/min
1 In house method: CLC-
Flow Meter by Ultrasonic
CPPF-04
Flow Meter (>0 to 600) L/min 1.4 % of reading
by comparison with
[Clamp Type]
Ultrasonic Flow Meter
In house method: CLC-
1
Silo by Mass Flow Calibrator (>0 to 5 000) kg 0.12 % of reading CPPF-06 by comparison
with Weight Set
In house method: CLC-
1
Oxygen Flow Meter CPMD-02 by Direct
(>0 to 15) L/min 0.3 L/min
Flow Rate Measurement with Gas
Flow Analyzer
Up to 10 m 0.001 4 + (1.2×10-5×l) l in m In house method: CLC-
1 CPPF-05 by comparison
Level and Level Transmitter
(4 to 20) mA 0.03 % of reading technique with Laser
(>0 to 10) VDC Interferometer (LSI)

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(1 to 100) mg 2.6 µg
(0.1 to 1) g 5 µg
(1 to 2) g 6.6 µg
(2 to 5) g 9.8 µg
(5 to 10) g 16 µg
(10 to 20) g 27 µg
(20 to 30) g 42 µg
(30 to 50) g 60 µg
(50 to 100) g 0.12 mg
(100 to 200) g 0.24 mg
(200 to 300) g 0.35 mg
(300 to 500) g 0.59 mg
(500 to 600) g 0.71 mg
(600 to 800) g 0.95 mg
(0.8 to 1) kg 1.2 mg
(1 to 2) kg 2.8 mg
(2 to 2.5) kg 3.4 mg
(2.5 to 3) kg 4 mg
(3 to 5) kg 13 mg
In house method: CLC-
(5 to 8) kg 23 mg
1,3 CPMB-01 based on
Electronic / Scale Balance (8 to 15) kg 72 mg
Comparison with Standard
(15 to 20) kg 80 mg
Weight Set
(20 to 30) kg 0.1 g
(30 to 40) kg 0.33 g
(40 to 50) kg 0.41 g
(50 to 100) kg 1g
(100 to 150) kg 1.4 g
(150 to 250) kg 6.2 g
(250 to 300) kg 7.4 g
(300 to 450) kg 12 g
(450 to 600) kg 15 g
(600 to 750) kg 19 g
(750 to 900) kg 22 g
(900 to 1 000) kg 25 g
(1 000 to 1 500) kg 37 g
(1 500 to 2 000) kg 49 g
(2 000 to 2 500) kg 62 g
(2 500 to 3 000) kg 74 g
(3 000 to 3 500) kg 0.09 kg
(3 500 to 4 000) kg 0.1 kg
(4 000 to 4 500) kg 0.12 kg

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house method: CLC-
1,3 Up to 20 kg 0.15 g
Spring Balance CPMB-02 by Comparison
(20 to 300) kg 7.4 g
with Standard Weight
Up to 500 kg 0.08 kg In house method: CLC-
1,3
Crane Scale (500 to 1 000) kg 0.09 kg CPMB-03 by Comparison
(1 000 to 2 000) kg 0.1 kg with Standard Weight
Up to 500 kg 0.06 kg In house method: CLC-
1,3
Silo Scale (500 to 1 000) kg 0.07 kg CPMB-04 by Comparison
(1 000 to 2 500) kg 0.08 kg with Weight Set
In house method: CLC-
1,3
Handy Scale Up to 1 000 kg 0.09 kg CPMB-05 by Comparison
with Standard Weight
1 mg 6 µg
2 mg 6 µg
5 mg 6 µg
10 mg 8 µg
20 mg 10 µg
50 mg 12 µg
100 mg 16 µg
200 mg 20 µg
500 mg 25 µg In house method: CLC-
Conventional Mass 1g 30 µg CPMM-01 using ABBA
[Class F1, F2, M1, M2, M3] 2g 40 µg Method by Standard
5g 50 µg Weight
10 g 60 µg
20 g 80 µg
50 g 0.1 mg
100 g 0.16 mg
200 g 0.3 mg
500 g 0.8 mg
1 kg 1.6 mg
2 kg 3 mg
1 mg to 100 g 0.16 mg
In house method: CLC-
(100 to 200) g 0.3 mg
CPMM-01 using ABBA
Conventional Mass (200 to 500) g 0.8 mg
Method by Standard
(500 to 1 000) g 1.6 mg
Weight
(1 000 to 2 000) g 3 mg
2 kg 3 mg In house method: CLC-
Conventional Mass 5 kg 8 mg CPMM-02 using ABA
[Class F1, F2, M1, M2, M3] 10 kg 16 mg Method by Standard
20 kg 30 mg Weight

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house method: CLC-
(2 to 5) kg 8 mg
CPMM-02 using ABA
Conventional Mass (5 to 10) kg 16 mg
Method by Standard
(10 to 20) kg 30 mg
Weight
Hardness Tester (Durometer)
(Force only)
Type A 13 mN
Type D 29 mN
Type AO 50 mN
Type AM 50 mN In house method: CLC-
Type C (0 to 45) N 29 mN CPMF-01 based on
Type B 13 mN ISO18898, ASTM D2240
Type O 13 mN
Type OO 12 mN
Type DO 29 mN
Type OOO 12 mN
Type OOO-S 16 mN
35 HRA 0.41 HRA
60 HRA 0.41 HRA
85 HRA 0.41 HRA

40 HRBS 0.41 HRBS

70 HRBS 0.41 HRBS
90 HRBS 0.41 HRBS
In house method: CLC-
1 40 HRBW 0.41 HRBW CPMF-02 by comparison
Hardness Tester
70 HRBW 0.41 HRBW with Reference Hardness
90 HRBW 0.41 HRBW Block

20 HRC 0.41 HRC

30 HRC 0.41 HRC
40 HRC 0.41 HRC
50 HRC 0.41 HRC
60 HRC 0.41 HRC
65 HRC 0.41 HRC

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
(0.1 to 5) ml 12 µl
(5 to 10) ml 12 µl
(10 to 25) ml 12 µl
In house method: CLC-
(25 to 50) ml 18 µl
Graduated Cylinder CPGW-01 by Comparison
(50 to 100) ml 29 µl
with Electronic Balance
(100 to 250) ml 49 µl
(250 to 500) ml 79 µl
(500 to 1 000) ml 0.16 ml
(0.1 to 10) µl 0.02 µl
(10 to 50) µl 0.02 µl
(50 to 100) µl 0.021 µl In house method: CLC-
Piston Pipette (100 to 200) µl 0.023 µl CPGW-02 by Comparison
(200 to 1 000) µl 0.35 µl with Electronic Balance
(1 000 to 5 000) µl 0.45 µl
(5 000 to 10 000) µl 0.65 µl
(0.1 to 5) cm3 0.003 6 cm3
(5 to 10) cm3 0.003 7 cm3
In house method: CLC-
(10 to 20) cm3 0.006 3 cm3
Burets CPGW-03 by Comparison
(20 to 25) cm3 0.006 5 cm3
with Electronic Balance
(25 to 50) cm3 0.01 cm3
(50 to 100) cm3 0.018 cm3
10 ml 0.001 6 ml
20 ml 0.002 6 ml
30 ml 0.003 7 ml
50 ml 0.006 ml
100 ml 0.015 ml
150 ml 0.02 ml In house method: CLC-
Beaker 250 ml 0.031 ml CPGW-04 by Comparison
400 ml 0.048 ml with Electronic Balance
600 ml 0.071 ml
800 ml 0.11 ml
1 000 ml 0.13 ml
1 500 ml 0.18 ml
2 000 ml 0.24 ml

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
5 cm3 0.006 cm3
10 cm3 0.006 cm3
20 cm3 0.006 3 cm3
25 cm3 0.006 5 cm3
In house method: CLC-
50 cm3 0.01 cm3
Volumetric Flask CPGW-05 by Comparison
100 cm3 0.017 cm3
with Electronic Balance
200 cm3 0.029 cm3
250 cm3 0.035 cm3
500 cm3 0.066 cm3
1 000 cm3 0.13 cm3
1 ml 2.4 µl
2 ml 2.4 µl
3 ml 2.4 µl
4 ml 2.4 µl
5 ml 2.4 µl
6 ml 2.5 µl
In house method: CLC-
7 ml 2.5 µl
Volumetric Pipettes CPGW-06 by Comparison
8 ml 3.6 µl
with Electronic Balance
10 ml 3.7 µl
15 ml 6 µl
20 ml 6.2 µl
25 ml 6.5 µl
50 ml 10 µl
100 ml 16 µl
(0.1 to 1) ml 2.4 µl
(1 to 2) ml 2.4 µl
In house method: CLC-
(2 to 5) ml 2.4 µl
Measuring Pipettes CPGW-06 by Comparison
(5 to 10) ml 3.7 µl
with Electronic Balance
(10 to 25) ml 6.5 µl
(25 to 50) ml 10 µl
(0.1 to 1) ml 0.5 µl
(1 to 5) ml 0.6 µl
In house method: CLC-
(5 to 10) ml 0.8 µl
Dispenser CPGW-07 by Comparison
(10 to 25) ml 4.8 µl
with Electronic Balance
(25 to 50) ml 5.5 µl
(50 to 100) ml 7.7 µl
In house method: CLC-
CPGW-08 by Comparison
Hydrometer (0.625 to 1.790) g/cm3 0.5 mg/cm3
with Specific Gravity
Hydrometer

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Photometry and Radiometry
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house Method: CLC-
1 (1 to 99 990) lux CPEE-17 by
Color Light Box 2.5 % of reading
(2 300 to 20 000) K direct measurement with
Chrome Meter
In house Method: CLC-
CPEE-18 by Comparison
Illuminance Meter / Lux
(1 to 20 000) lux 2.6 % of reading with Lux Cal 150 Lux
Meter
and Luminance Meter
Calibration
In house Method: CLC-
CPEE-18 by Comparison
Illuminance Meter / Lux
(1 to 20 000) cd/m2 2.6 % of reading with Lux Cal 150 Lux
Meter
and Luminance Meter
Calibration

Thermodynamic
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Liquid in Glass Thermometer In house method: CLC-
(-70 to 90) °C 0.042 °C
Partial Immersion CPTH-02 by Comparison
(90 to 250) °C 0.038 °C
Thermometer Type with IPRT
Liquid in Glass Thermometer In house method: CLC-
(-70 to -30) °C 0.042 °C
Total Immersion CPTH-02 by Comparison
(-30 to 250) °C 0.038 °C
Thermometer Type with IPRT
In house method:
1 (-70 to 90) °C 0.047 °C
Thermometer with PRT CLC-CPTH-03, CLC-
(90 to 250) °C 0.062 °C
Sensor CPTH-04 by Comparison
(250 to 450) °C 0.068 °C
with IPRT
In house method:
1
Thermometer with (-70 to 90) °C 0.047 °C CLC-CPTH-03, CLC-
Thermistor Sensor (90 to 250) °C 0.062 °C CPTH-04 by Comparison
with IPRT
Type E
1 In house method: CLC-
Thermometer with (-70 to 420) °C 0.08 °C
CPTH-06 by Comparison
Thermocouple Sensor (420 to 650) °C 2.6 °C
with IPRT
(650 to 900) °C 3 °C

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Thermodynamic
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Types K, N, J
(-70 to 420) °C 0.08 °C
(420 to 650) °C 2.6 °C
(650 to 1 200) °C 3.1 °C
Type T In house method: CLC-
1
Thermometer with (-70 to 400) °C 0.08 °C
CPTH-06 by Comparison
Thermocouple Sensor Types R, S
with IPRT
(0 to 420) °C 0.08 °C
(420 to 650) °C 2.6 °C
(650 to 1 200) °C 3.1 °C
Type B
(600 to 1 200) °C 3.1 °C
Type E
(-80 to 250) °C 0.64 °C
(250 to 420) °C 0.67 °C
(420 to 650) °C 3.8 °C
(650 to 900) °C 3.9 °C
(900 to 1 000) °C 4.1 °C
Type K, J
(-80 to 250) °C 0.64 °C
(250 to 420) °C 0.67 °C
(420 to 650) °C 3.8 °C
(650 to 900) °C 3.9 °C
(900 to 1 200) °C 4.1 °C
In house method: CLC-
Type T
CPTH-30 based on ASTM:
1 (-80 to 0) °C 0.75 °C
Thermocouple Sensor E220-86 by Comparison
(0 to 250) °C 0.54 °C
Technique with IPRT and
(250 to 400) °C 0.58 °C
Standard Thermocouple
Type R
(0 to 100) °C 1.8 °C
(100 to 420) °C 1.2 °C
(420 to 650) °C 3.9 °C
(650 to 900) °C 4 °C
(900 to 1 200) °C 4.3 °C
Type S
(0 to 200) °C 1.8 °C
(200 to 420) °C 1.1 °C
(450 to 650) °C 3.9 °C
(650 to 900) °C 4 °C
(900 to 1 200) °C 4.2 °C

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Thermodynamic
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Type R, S
(0 to 150) °C 0.27 °C
(150 to 300) °C 0.28 °C
(300 to 420) °C 0.29 °C
(420 to 1 200) °C 2.6 °C
Types K, N, J
(-40 to 150) °C 0.28 °C
(150 to 300) °C 0.3 °C
In house method: CLC-
1 (300 to 420) °C 0.31 °C
Temperature Transmitter CPTH-05 by Comparison
(420 to 1 200) °C 4 °C
with IPRT
Type E
(-40 to 150) °C 0.29 °C
(150 to 300) °C 0.31 °C
(300 to 420) °C 0.32 °C
(420 to 1 000) °C 4 °C
Type T
(-40 to 250) °C 0.21 °C
(150 to 400) °C 0.22 °C
In house method: CLC-
1 (-70 to -30) °C 1 °C CPTH-07 by Comparison
Temperature Chamber
(-30 to 250) °C 0.48 °C with Data Logger (Type of
Wire: TC Type T)
In house method: CLC-
(-70 to -30) °C 0.46 °C
1 CPTH-07 by Comparison
Temperature Chamber (-30 to 100) °C 0.21 °C
with Data Logger (Type of
(100 to 250) °C 0.4 °C
Wire: RTD 4 Wire)
In house method: CLC-
1 CPTH-08
Autoclave (105 to 135) °C 0.2 °C
by Comparison with Data
Logger
In house method: CLC-
Liquid Bath (-70 to 250) °C 0.06 °C CPTH-10 by Comparison
with IPRT
Temperature
(15 to 45) °C 0.26 °C In house method: CLC-
Humidity @25 °C CPTH-11 by Comparison
Thermo-Hygrometer
(30 to 90) %RH 0.6 %RH with Standard Thermo-
Humidity @20 °C Hygrometer
(35 to 90) %RH 0.6 %RH

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Thermodynamic
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Temperature
(15 to 45) °C 0.7 °C In house method: CLC-
Humidity @25 °C CPTH-12 by Comparison
Thermo-Hygrograph
(30 to 90) %RH 1.2 %RH with Standard Thermo-
Humidity @20 °C Hygrometer
(35 to 90) %RH 1.2 %RH
(50 to 100) °C 1.1 °C In house method: CLC-
(100 to 200) °C 1.3 °C CPTH-01 by Comparison
(200 to 300) °C 1.9 °C with Infrared Thermometer
(300 to 400) °C 2.5 °C Calibrator
(400 to 500) °C 2.8 °C ε = 0.95, λ = (8 to 14) µm
1
Infrared Thermometer (50 to 100) °C 1.2 °C
In house method: CLC-
(100 to 200) °C 1.5 °C
CPTH-01 by Comparison
(200 to 300) °C 2 °C
with Infrared Thermometer
(300 to 400) °C 2.5 °C Calibrator
(400 to 500) °C 3.2 °C ε = 0.97, λ = (8 to 14) µm
(500 to 600) °C 3.5 °C
In house method: CLC-
(-40 to 50) °C 0.4 °C
CPTH-13 by Comparison
(50 to 100) °C 0.5 °C
with Temperature
(100 to 150) °C 0.6 °C
Calibrator
(150 to 220) °C 0.8 °C
ε = 0.98, λ = (8 to 14) µm
1
High Temperature Infrared (-40 to 140) °C 0.6 °C
Thermometer (140 to 200) °C 1.2 °C
In house method: CLC-
(200 to 300) °C 1.5 °C
CPTH-13 by Comparison
(300 to 400) °C 2.2 °C
with Temperature
(400 to 500) °C 3.3 °C
Calibrator
(500 to 700) °C 4.3 °C
ε = 0.95, λ = (8 to 14) µm
(700 to 900) °C 5.1 °C
(900 to 1 200) °C 6.0 °C
In house method: CLC-
1 (-70 to 250) °C 0.08 °C
Temperature Gauge CPTH-14 by Comparison
(250 to 420) °C 0.13 °C
with IPRT
In house method: CLC-
1 (-30 to 50) °C 0.14 °C
Liquid Bath 5 Profiles CPTH-15 by Comparison
(50 to 250) °C 0.17 °C
with Data Logger
(50 to 100) °C 1.4 °C In house method: CLC-
Temperature Indicator with
(100 to 300) °C 1.7 °C CPTH-16 by Comparison
Surface Sensor
(300 to 450) °C 2.3 °C with Surface Probe Tester

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Thermodynamic
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house method: CLC-
Dry Block (-40 to 420) °C 0.05 °C CPTH-18 by Comparison
with IPRT
Temperature
Temperature & Humidity
(15 to 45) °C 0.25 °C In house method: CLC-
Transmitter
Humidity @25 °C CPTH-19 by Comparison
(30 to 90) %RH 0.5 %RH with Standard Thermo-
Output Signal:
Humidity @20 °C Hygrometer
4 mA to 20 mA
(35 to 90) %RH 0.5 %RH
Temperature
Temperature & Humidity
(15 to 45) °C 0.25 °C In house method: CLC-
Transmitter
Humidity @25 °C CPTH-19 by Comparison
(30 to 90) %RH 0.5 %RH with Standard Thermo-
Output Signal:
Humidity @20 °C Hygrometer
0 VDC to 10 VDC
(35 to 90) %RH 0.5 %RH
1
Temperature Transmitter In house method: CLC-
(-70 to 90) °C 0.1 °C
with Resistance Thermometer CPTH-21, 25 by
(90 to 420) °C 0.16 °C
Sensor Comparison with IPRT
Type E
(-70 to 250) °C 0.28 °C
Types K, N, J
(-70 to 50) °C 0.34 °C
(50 to 90) °C 0.36 °C
(90 to 250) °C 0.43 °C
In house method: CLC-
Temperature Transmitter Type T
CPTH-22 by Comparison
With Thermocouple (-70 to 90) °C 0.32 °C
with IPRT
(90 to 120) °C 0.33 °C
(120 to 200) °C 0.34 °C
(200 to 250) °C 0.35 °C
Types R, S
(0 to 90) °C 0.32 °C
(90 to 250) °C 0.35 °C
Straight
(-70 to 40) °C 0.08 °C
(40 to 250) °C 0.09 °C
1 90° Back Angle In house method: CLC-
Liquid in Glass Thermometer
(-70 to 40) °C 0.08 °C CPTH-24 by Comparison
for Retort and Pipe
(40 to 250) °C 0.09 °C with IPRT
135° Oblique Angle
(-70 to 40) °C 0.08 °C
(40 to 250) °C 0.09 °C

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Thermodynamic
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
Data Logger with (-70 to 50) °C 0.04 °C In house method: CLC-
Resistance Thermometer (50 to 90) °C 0.04 °C CPTH-26 by Comparison
Sensor (90 to 250) °C 0.06 °C with IPRT
Temperature
1 (15 to 45) °C 0.9 °C In house method: CLC-
Temperature/Humidity
Humidity CPTH-27 by Comparison
Chamber
(30 to 50) %RH 1.6 %RH with Data Logger
(50 to 90) %RH 2.9 %RH
Type E
(-70 to 90) °C 0.07 °C
(90 to 250) °C 0.08 °C
Type K
(-70 to 90) °C 0.07 °C
(90 to 250) °C 0.08 °C
Type N
(-70 to 90) °C 0.07 °C
(90 to 250) °C 0.08 °C
1 Type T In house method: CLC-
Data Logger with
(-70 to 120) °C 0.07 °C CPTH-28 by Comparison
Thermocouple
(120 to 250) °C 0.08 °C with IPRT
Type J
(-70 to 90) °C 0.07 °C
(90 to 250) °C 0.08 °C
Type S
(0 to 250) °C 0.04 °C
Type R
(0 to 250) °C 0.04 °C
Type B
(0 to 250) °C 0.04 °C
(200 to 400) °C 1 °C In house method: CLC-
1
Muffle Furnace (400 to 600) °C 2.7 °C CPTH-17 by Comparison
(600 to 1 200) °C 2.9 °C with Thermocouple Sensor
In house method: CLC-
Industrial Platinum Resistance
(-38 to 420) °C 0.009 °C CPTH-29 by Comparison
Thermometer
with IPRT
In house method: CLC-
CPTH-31 Multiple Point
1
Salt Spray Tester (-30 to 70) °C 0.53 °C Measurement
by Hydra Data Logger with
TC Type T

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Thermodynamic
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house method: CLC-
1
Resistance Temperature (-40 to 220) °C 0.11 °C CPTH-36 based on ASTM:
Detector (RTD PT100Ω) (220 to 420) °C 0.22 °C E644 – 04
By Comparison with IPRT
In house method: CLC-
1 (-70 to -40) °C 0.046 °C CPTH-37 based on ASTM:
Temperature with Resistance
(-40 to 250) °C 0.041 °C E 644-04
Temperature Detector (RTD)
(250 to 420) °C 0.06 °C by Comparison Technique
with IPRT

Time and Frequency

Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
1 (1 to 99.99( rpm 0.005 8 rpm
Tachometer
(100 to 1 000( rpm 0.058 rpm by Simulation
Contact Type-
(1 000 to 99 999( rpm 0.58 rpm
In house Method: CLC-
1 (0.01 to 120) Hz 29 µHz/Hz + 8.2 mHz CPEE-01
Measuring Instrument
120 Hz to 1.2 kHz 29 µHz/Hz + 82 mHz by Direct Measurement
Frequency Measurement
1.2 kHz to 10 MHz 1.2 µHz/Hz + 0.82 Hz with Multi-Product
Calibrator
In house Method: CLC-
1 (1 to 99.99( rpm 0.006 7 rpm CPEE-05 by Direct
Tachometer
(100 to 1 000( rpm 0.058 rpm Measurement with
(Non-Contact Type)
(1 000 to 99 999( rpm 0.59 rpm Synthesized function
generator
1 In house Method: CLC-
Stop Watch- 0.03 Hz
(512 to 32 768) Hz CPEE-06 by Programmable
Frequency Accuracy
Timer/Counter
In house Method: CLC-
1 CPEE-07 by Direct
Timer 1 second to 24 hours 23 µs/s of reading
Measurement with
Universal Counter
In house Method:
1 CLC-CPEE-14
Generating Instrument
10 Hz to 225 MHz 8.1 µHz/Hz Direct Measurement by
Frequency
Programmable
Timer / Counter

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Time and Frequency
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house method: CLC-
1 (10 to 10 000) rpm 0.1 % of reading CPEE-23 by Direct
Speed Measurement
(10 000 to 99 999) rpm 0.05 % of reading Measurement with Digital
Tachometer
In house method: CLC-
1 CPMD-01 by Direct
Centrifuge (1 000 to 13 000) rpm 1.2 rpm
Measurement with Digital
Tachometer

DIMENSIONAL MEASUREMENT
1 Dimensional
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
1,2
Gap 1 000 mm 0.002 1 mm + (4.7×10-6×l)
1,2
Length 1 000 mm 0.002 1 mm + (4.7×10-6× l) In house Method:
CLC-CPCMM-01 by
1,2
Heigth 600 mm 0.002 1 mm + (4.7×10-6× l) comparison with CMM
1,2
Width 700 mm 0.002 1 mm + (4.7×10-6×l)
1
Gap 2 500 mm 18 µm
1
Diameter 2 500 mm 18 µm In house Method:
CLC-CPCMM-03 by
1
Length 2 500 mm 18 µm
comparison with CMM
1
Heigth 2 500 mm 18 µm Arm
1
Width 2 500 mm 18 µm
1,2
Gap 35 000 mm 0.0185 mm + (0.93×10-6 × l)
1,2
Diameter 35 000 mm 0.0185 mm + (0.93×10-6 × l) In house Method:
CLC-CPCMM-04 by
1,2
Length 35 000 mm 0.0185 mm + (0.93×10-6 × l)
comparison with Laser
1,2
Heigth 35 000 mm 0.0185 mm + (0.93×10-6 × l) Tracker
1,2
Width 35 000 mm 0.0185 mm + (0.93×10-6 × l)

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1 Dimensional
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
In house methjod:
Size
CLC-CPDU-29 by Direct
Distance, Diameter, Gap, X, Y Axis to 300 mm 0.006 mm
Measurement with Vision
Radius
System
Diameter
(0 to 77.5) mm 0.8 μm In house method: CLC-
Length, Height, Width CPDA-22 by Direct
Contour Measurement
(0 to 50) mm 0.8 μm measurement with
Radius Contracer (Contour)
(0 to 38.75) mm 0.8 μm

2 Dimensional
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
1,2
Straightness 1 000 mm 0.002 5 mm + (4.7×10-6×l)

1,2
Circularity (Roundness) 700 mm diameter 0.002 5 mm + (4.7×10-6×l)

1,2
Profile of a Line (1 000 × 700) mm 0.002 5 mm + (4.7×10-6×l)

1,2
Parallelism (1 000 × 700) mm 0.002 5 mm + (4.7×10-6×l)

1,2
Position (1 000 × 700) mm 0.002 5 mm + (4.7×10-6×l) In house Method:
CLC-CPCMM-01 by
1,2
Concentricity 700 mm diameter 0.002 5 mm + (4.7×10-6×l) comparison with CMM

1,2
Symmetry (1 000 × 700 × 600) mm 0.002 5 mm + (4.7×10-6×l)

1,2
Cirular Runout 700 mm diameter 0.002 5 mm + (4.7×10-6×l)

1,2
Angularity (1 000 × 700) mm 0.002 5 mm + (4.7×10-6×l)

1,2
Perpendiculanty (1 000 × 700) mm 0.002 5 mm + (4.7×10-6×l)

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2 Dimensional
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
1
Straightness 2 500 mm 18 µm

1
Circularity (Roundness) 2 500 mm 18 µm In house Method:
CLC-CPCMM-03 by
comparison with CMM
1
Profile of a Line 2 500 mm 18 µm Arm
1
Parallelism 2 500 mm 18 µm

1
Position 2 500 mm 18 µm

1
Concentricity 2 500 mm 18 µm

1
Symmetry 2 500 mm 18 µm In house Method:
CLC-CPCMM-03 by
comparison with CMM
1
Cirular Runout 2 500 mm 18 µm Arm
1
Angularity 2 500 mm 18 µm

1
Perpendiculanty 2 500 mm 18 µm
1,2
Straightness 35 000 mm 0.018 5 mm + (0.93×10-6×l)
1,2
Circularity (Roundness) 35 000 mm 0.018 5 mm + (0.93×10-6×l)
1,2
Profile of a Line 35 000 mm 0.018 5 mm + (0.93×10-6×l)
1,2
Parallelism 35 000 mm 0.018 5 mm + (0.93×10-6×l)
In house Method:
1,2
Position 35 000 mm 0.018 5 mm + (0.93×10-6×l) CLC-CPCMM-04 by
1,2
Concentricity 35 000 mm 0.018 5 mm + (0.93×10-6×l) comparison with Laser
Tracker
1,2
Symmetry 35 000 mm 0.018 5 mm + (0.93×10-6×l)
1,2
Cirular Runout 35 000 mm 0.018 5 mm + (0.93×10-6×l)
1,2
Angularity 35 000 mm 0.018 5 mm + (0.93×10-6×l)
1,2
Perpendiculanty 35 000 mm 0.018 5 mm + (0.93×10-6×l)

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2 Dimensional
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
X, Y Axis to 300 mm
In house methjod:
Perpendicularity 0.006 mm
CLC-CPDU-29 by Direct
Orientation Parallelism 0.006 mm
Measurement with Vision
Angle (0 to 90) ° 0.04 °
System
Angularity (0 to 90) ° 0.04 °
X, Y Axis to 300 mm
In house methjod:
Straightness 0.006 mm
CLC-CPDU-29 by Direct
Form Flatness 0.006 mm
Measurement with Vision
Circularity 0.006 mm
System
Profile of a Line 0.006 mm
Angle In house method: CLC-
(0 to 180) ° 0.001 ° CPDA-22 by Direct
Contour Measurement
Straightness measurement with
(0.1 to 50) mm 0.8 μm Contracer (Contour)

3 Dimensional
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
1,2
Cylindricity 700 mm diameter 0.002 8 mm+ (4.7×10-6×l)

1,2
Profile of a Surface (1000 × 700 × 600) mm 0.002 8 mm+ (4.7×10-6×l)
In house Method:
1,2
Position (1000 × 700 × 600) mm 0.002 8 mm+ (4.7×10-6×l) CLC-CPCMM-01 by
comparison with CMM
1,2
Concentricity (700 × 600) mm diameter 0.002 8 mm+ (4.7×10-6×l)

1,2
Symmetry (1000 × 700 × 600) mm 0.002 8 mm+ (4.7×10-6×l)
1
Cylindricity 2 500 mm 18 µm
1
Profile of a Surface 2 500 mm 18 µm
In house Method:
1
Position 2 500 mm 18 µm CLC-CPCMM-03 by
comparison with CMM
1
Concentricity 2 500 mm 18 µm Arm

1
Symmetry 2 500 mm 18 µm

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3 Dimensional
Reference Standard,
Expanded Uncertainty of
Parameter/Equipment Range Method, and/or
Measurement (+/-)
Equipment
1,2
Cylindricity 35 000 mm 0.018 5 mm + (0.93×10-6×l)

1,2
Profile of a Surface 35 000 mm 0.018 5 mm + (0.93×10-6×l)
In house Method:
CLC-CPCMM-04 by
1,2
Position 35 000 mm 0.018 5 mm + (0.93×10-6×l)
comparison with Laser
Tracker
1,2
Concentricity 35 000 mm 0.018 5 mm + (0.93×10-6×l)

1,2
Symmetry 35 000 mm 0.018 5 mm + (0.93×10-6×l)
In house method:
X, Y Axis to 300 mm CLC-CPDU-29 by Direct
Location
Position 0.006 mm Measurement with Vision
System
Calibration and Measurement Capability (CMC) is expressed in terms of the measurement parameter, measurement range, expanded uncertainty of measurement and
reference standard, method, and/or equipment. The expanded uncertainty of measurement is expressed as the standard uncertainty of the measurement multiplied by a
coverage factor of 2 (k=2), corresponding to a confidence level of approximately 95%.
Notes:
1. On-site calibration service is available for this parameter, since on-site conditions are typically more variable than those in the laboratory, larger measurement
uncertainties are expected on-site than what is reported on the accredited scope
2. l = length in millimeters, Pe = gauge pressure at reference level.
3. The CMC for scales and balances is highly dependent upon the resolution of the unit under test. The uncertainties presented here does not include the resolution of the
unit under test. The resolution will be included in the reported measurement uncertainty at the time of calibration.
4. This scope is formatted as part of a single document including Certificate of Accreditation No. ACDM-2814.

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