HEF4521B
HEF4521B
1. General description
The HEF4521B consists of a chain of 24 toggle flip-flops with an overriding asynchronous master
reset input (MR), and an input circuit that allows three modes of operation. The single inverting
stage (A2 to Y2) functions as: a crystal oscillator, an input buffer for an external oscillator or in
combination with A1 as an RC oscillator. The crystal oscillator operates in Low-power mode when
pins VSS1 and VDD1 are supplied via external resistors.
Each flip-flop divides the frequency of the previous flip-flop by two, consequently the HEF4521B
24
counts up to 2 = 16777216. The counting advances on the HIGH-to-LOW transition of the
18 24
clock (A2). The outputs from each of the last seven stages (2 to 2 ) are available for additional
flexibility.
It operates over a recommended VDD power supply range of 3 V to 15 V referenced to VSS (usually
ground). Unused inputs must be connected to VDD, VSS, or another input.
3. Ordering information
Table 1. Ordering information
Type number Package
Temperature range Name Description Version
HEF4521BT -40 °C to +85 °C SO16 plastic small outline package; 16 leads; SOT109-1
body width 3.9 mm
Nexperia HEF4521B
24-stage frequency divider and oscillator
4. Functional diagram
5 4 2 9
VDD1 Y2 MR A1
A2
6 CP
STAGES 1 to 8
VSS1 CD Q8
3
CP
STAGES 9 to 16
CD Q16
CP
STAGES 17 to 24
CD
1 10 11 12 13 14 15 7
001aae708
A2 to FFs to logic
VSS
VSS1
Y2 001aae711
HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved
MR A1
Y2
Q Q Q Q Q Q Q Q
FF 1 FF 2 FF 3 FF 4 FF 5 FF 6 FF 7 FF 8
A2 T T T T T T T T
VSS1
CD CD CD CD CD CD CD CD
VDD1
Q Q Q Q Q Q Q Q
FF 9 FF 10 FF 11 FF 12 FF 13 FF 14 FF 15 FF 16
T T T T T T T T
CD CD CD CD CD CD CD CD
Q Q Q Q Q Q Q Q
FF 17 FF 18 FF 19 FF 20 FF 21 FF 22 FF 23 FF 24
T T T T T T T T
CD CD CD CD CD CD CD CD
HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved
5. Pinning information
5.1. Pinning
T package
SOT109-1 (SO16)
Q24 1 16 VDD
MR 2 15 Q23
VSS1 3 14 Q22
Y2 4 13 Q21
VDD1 5 12 Q20
A2 6 11 Q19
Y1 7 10 Q18
VSS 8 9 A1
aaa-036980
6. Count capacity
Table 3. Count capacity
Output Count capacity
18
Q18 2 = 262144
19
Q19 2 = 524288
20
Q20 2 = 1048576
21
Q21 2 = 2097152
22
Q22 2 = 4194304
23
Q23 2 = 8388608
24
Q24 2 = 16777216
HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved
7. Functional test
A test function has been included to reduce the test time required to test all 24 counter stages. This
test function divides the counter into three 8-stage sections by connecting VSS1 to VDD and VDD1 to
VSS. 255 counts are loaded into each of the 8-stage sections in parallel via A2 (connected to Y2).
All flip-flops are now at a HIGH level. The counter is now returned to the normal 24-stage in series
configuration by connecting VSS1 to VSS and VDD1 to VDD. Entering one more pulse into input A2
causes the counter to ripple from an all HIGH state to an all LOW state.
[1] 255 pulses are clocked into A2, Y2. The counter advances on the LOW to HIGH transition.
8. Limiting values
Table 5. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
VDD supply voltage -0.5 +18 V
IIK input clamping current VI < -0.5 V or VI > VDD + 0.5 V - ±10 mA
VI input voltage -0.5 VDD + 0.5 V
IOK output clamping current VO < -0.5 V or VO > VDD + 0.5 V - ±10 mA
II/O input/output current - ±10 mA
IDD supply current to any supply terminal - ±100 mA
Tstg storage temperature -65 +150 °C
Tamb ambient temperature -40 +85 °C
Ptot total power dissipation Tamb -40 °C to +85 °C - 500 mW
P power dissipation per output - 100 mW
HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved
HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved
[1] The typical values of the propagation delay and transition times are calculated from the extrapolation formulas shown (CL in pF).
HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved
MR input VM
0V
tW
1/fmax
VI
A2 input VM
0V
trec tW
tPHL tPLH
VOH
90 %
Qn output
10 %
VOL
tt tt
001aae712
a. Pulse widths, maximum frequency, recovery and transition times, and A2 to Qn propagation delays
VI VOH
A1 input VM Qn output VM
0V VOL
tPLH tPHL tPLH tPHL
VOH VOH
Y1 output VM Qn + 1 output VM
VOL VOL
Y1 propagation delays Qn to Qn + 1 propagation delays
001aak015
HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved
tW
VI
90 % 90 %
negative
pulse VM VM
10 % 10 %
0V
tf tr
tr tf
VI
90 % 90 %
positive
pulse VM VM
10 % 10 %
0V
tW
001aaj781
a. Input waveforms
VDD
VI VO
G DUT
RT CL
001aag182
b. Test circuit
Test data is given in Table 11.
Definitions for test circuit:
CL = Load capacitance including jig and probe capacitance;
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VDD
Ro 1.8 MΩ R(1)
VDD VDD1
A1 Y1
Y2
Q18
A2
HEF4521B
CS CT
MR Q24
VSS VSS1
R(1)
001aae713
HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved
001aae715
RTC VDD 102
C
fosc (1)
(kHz)
RS VDD VDD1
A1 Y1 10
Y2 (2)
Q18
A2
HEF4521B
MR Q24
VSS VSS1
10- 1
1 10 102 RTC (kΩ) 103
001aae714 10- 1 1 10 C (nF) 102
, where:
VIL(max) = maximum input voltage LOW;
II = input leakage current.
HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved
001aae658
12.5
gfs
(mA/V)
10
(1)
7.5
(2)
Rbias
560 kΩ 5 (3)
VDD
Vi input output
A io
(f = 1 kHz)
0
VSS 0 5 10 15
001aae820 VDD (V)
Fig. 9. Test setup for measuring forward Fig. 10. Typical forward transconductance gfs as a
transconductance function of the supply voltage
001aae716 001aae717
75 20
IDD
gain (mA)
(VO/VI)
15
50
typ
typ
10
25
5
0 0
0 5 10 15 0 5 10 15
VDD (V) VDD (V)
For test setup, see Fig. 13. For test setup, see Fig. 13.
Fig. 11. Voltage gain VO/VI as a function of supply Fig. 12. Supply current as a function of supply voltage
voltage
330 kΩ
A2 Y2
001aae718
Fig. 13. Test setup for measuring the voltage gain and supply current graphs
HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved
D E A
X
y HE v M A
16 9
A2
A3 A
A1
pin 1 index
q
Lp
1 8 L
e w M detail X
bp
0 5 mm
scale
HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved
14. Abbreviations
Table 13. Abbreviations
Acronym Description
ANSI American National Standards Institute
CDM Charged Device Model
CMOS Complementary Metal Oxide Semiconductor
DUT Device Under Test
ESD ElectroStatic Discharge
ESDA ElectroStatic Discharge Association
HBM Human Body Model
JEDEC Joint Electron Device Engineering Council
HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved
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Definitions Limiting values — Stress above one or more limiting values (as defined in
Draft — The document is a draft version only. The content is still under the Absolute Maximum Ratings System of IEC 60134) will cause permanent
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modifications or additions. Nexperia does not give any representations or operation of the device at these or any other conditions above those
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HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved
Contents
1. General description...................................................... 1
2. Features and benefits.................................................. 1
3. Ordering information....................................................1
4. Functional diagram.......................................................2
5. Pinning information......................................................4
5.1. Pinning.........................................................................4
5.2. Pin description............................................................. 4
6. Count capacity..............................................................4
7. Functional test.............................................................. 5
8. Limiting values............................................................. 5
9. Recommended operating conditions..........................6
10. Static characteristics..................................................6
11. Dynamic characteristics.............................................7
11.1. Waveforms and test circuit........................................ 8
12. Application information............................................. 9
13. Package outline........................................................ 12
14. Abbreviations............................................................ 13
15. Revision history........................................................13
16. Legal information......................................................14
HEF4521B All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2024. All rights reserved