Digital Assignment 1

Report on Atomic Force Microscopy

Name: Vedant Nilesh Chechani, Harish Srinivas

Reg no. 22BME0562, 22BME0723

Course: Advanced Materials Characterization Methods (BMEE319E)

Faculty: Dr. Atul Kumar

Table of Content

1. Abstract
2. Introduction
3. Principles of Operation
4. Operating Modes
5. Working Mechanism
6. Application
7. Advantages
8. Limitation
9. Recent Advancements
10. Conclusion
11. References
ABSTRACT:

Atomic Force Microscopy (AFM) is a powerful imaging technique that enables the
visualization and measurement of surface topography at the nanoscale. Developed in the mid-
1980s, AFM extends the capabilities of Scanning Tunneling Microscopy (STM) to non-
conductive materials, making it a versatile tool in various fields, including materials science,
biology, and nanotechnology. The technique employs a sharp probe tip attached to a flexible
cantilever, which scans the surface of a sample to detect forces between the tip and the
surface. This interaction causes the cantilever to bend, allowing for the precise mapping of
surface features in three dimensions (X, Y, and Z axes) with resolutions reaching down to
atomic levels. AFM can operate in different modes, such as contact mode, tapping mode, and
non-contact mode, each suited for specific applications, including measuring surface
roughness, elasticity, and mechanical properties. The ability to provide high-resolution
images and quantitative data on surface characteristics has established AFM as an essential
tool in research and industry, facilitating advancements in nanotechnology, biomaterials, and
semiconductor fabrication.

Figure 1 Atomic Force Microscope

Introduction:

Atomic Force Microscopy (AFM) is a cornerstone technology in the field of nanotechnology,

offering unparalleled resolution and versatility in imaging and manipulating surfaces at the
atomic scale. Since its invention in 1986, AFM has revolutionized surface science and
enabled significant advancements across diverse scientific disciplines. This report delves into
the principles, applications, and recent advancements of AFM, illustrating its impact on
modern science and technology.

Figure 2 Schematic diagram of Atomic force Microscope with all its basic components

Historical Background

AFM was invented by Gerd Binnig, Calvin Quate, and Christoph Gerber. The invention was
based on the principles of Scanning Tunnelling Microscopy (STM) but extended to non-
conductive materials. The capability of AFM to operate in different environments, such as air,
vacuum, and liquids, made it a versatile tool for scientific research and industrial
applications.
Principles of Operation:

Basic Components:

1. Cantilever: A flexible beam with a sharp tip at its end, usually made from silicon or
silicon nitride. The cantilever deflects in response to forces between the tip and the
sample surface.

Figure 3 AFM cantilever and tip

2. Tip: The sharp point at the end of the cantilever, with a radius of curvature in the
nanometre range. The tip is crucial for achieving high resolution.

3. Laser and Photodetector: A laser beam reflects off the back of the cantilever onto a
split photodetector. As the cantilever deflects, the position of the laser spot on the
photodetector changes, allowing for precise measurement of cantilever deflection.
 Figure 4 Laser Deflection Detection System

4. Piezoelectric Scanner: This component moves the sample or the cantilever in

precise, small increments, typically in the x, y, and z directions, allowing for detailed
surface scanning.

5. Feedback System: Maintains a constant interaction force between the tip and the
sample by adjusting the cantilever's height. This system ensures high-resolution
imaging by compensating for surface irregularities.

Operating Modes

1. Contact Mode: The tip is in constant contact with the sample surface. It is suitable
for hard surfaces but can damage soft or delicate samples.

Figure 5 Contact mode operation in AFM

 2. Tapping Mode: The cantilever oscillates near its resonance frequency, intermittently
contacting the surface. This mode reduces damage to the sample and provides better
resolution for soft materials.

Figure 6 Tapping Mode Operation in AFM

3. Non-Contact Mode: The tip hovers just above the surface, sensing van der Waals
forces. This mode is ideal for very soft or delicate samples but typically has lower
resolution compared to contact and tapping modes.

Figure 7 Non-Contact Mode Operation in AFM

Working Mechanism:

Step-by-Step Process

1. Approach: The tip is brought close to the sample surface until interaction forces
between the tip and the surface can be detected. This approach is controlled to prevent
sudden contact that could damage the tip or the sample.
 Figure 8 Approach and withdrawal of the AFM tip in a single tapping cycle

2. Scanning: The piezoelectric scanner moves the sample (or the tip) in a raster pattern,
covering a defined area of the sample surface.

Figure 9 Raster scan and Zig-Zag scan path in AFM

3. Feedback Control: Maintains constant interaction force by adjusting the cantilever

height. This ensures that the force between the tip and the sample remains constant,
providing accurate topographical data.

Figure 10 Feedback Loop of AFM

 4. Data Collection: The photodetector records deflections of the cantilever, and a
computer processes these signals to generate a three-dimensional topographic map of
the sample surface.

Figure 11 Types of required collected data

Applications:

1. Materials Science:
AFM is widely used to characterize surface roughness, texture, and mechanical
properties of various materials. It provides critical insights into material behaviour at
the nanoscale, aiding in the development of new materials and coatings.
 Figure 12 AFM analysis of the surface morphology and roughness of ZnO deposited

2. Biology:
In biological research, AFM allows for the visualization of biological molecules, such
as DNA, proteins, and cell membranes, with nanometre resolution. It provides
information on the mechanical properties of biological samples, which is crucial for
understanding their function.

Figure 13 AFM images of supercoiled DNA prepared using AP mica.

3. Nanotechnology:
AFM is instrumental in manipulating atoms and molecules to create nanoscale
structures. It is used in nanolithography, where patterns are created on a substrate with
atomic precision.
 Figure 14 AFM based methods of nanolithography

4. Semiconductors:
In the semiconductor industry, AFM is used to inspect and characterize surfaces and
thin films. It helps in identifying defects and measuring feature sizes in integrated
circuits, ensuring high-quality production.

Figure 15 Direct comparison of the defect sizes determined and defects determined using AFM
Advantages

1. High Resolution:
AFM can image features smaller than a nanometre, providing detailed surface
topography.

2. Versatility:
Operates in various environments, including air, vacuum, and liquid, making it
suitable for a wide range of samples.

3. Non-Destructive:
Requires minimal sample preparation and does not damage samples during imaging.

4. Quantitative Data:
Provides quantitative measurements of mechanical, electrical, and magnetic
properties, enhancing the understanding of material behaviour.

Figure 16 Comparison between AFM and other microscopic techniques

Limitations

1. Slow Scanning Speed:

Limited by the mechanical movement of the cantilever, making it less suitable for
dynamic processes.
 2. Limited Scan Size:
Typically scans small areas (up to a few micrometers), restricting its use for large-
scale samples.

3. Tip Wear:
The sharp tip can wear out over time, affecting resolution and accuracy. Frequent tip
replacement or re-sharpening may be necessary.

4. Complexity:
Requires careful calibration and operation by trained personnel, making it less
accessible for non-experts.

Recent Advances

1. High-Speed AFM:
Enhancements in cantilever design and scanning techniques have improved scanning
speeds, enabling real-time imaging of dynamic processes.

Figure 17 High Speed AFM imaging

2. Multi-Frequency AFM:
Utilizes multiple oscillation frequencies to extract more information from the sample,
providing insights into various material properties simultaneously.
 Figure 18 Standard and Multi Frequency AFM imaging

3. Tip-Enhanced Raman Spectroscopy (TERS):

Combines AFM with Raman spectroscopy for chemical characterization at the
nanoscale. TERS enhances the Raman signal by using a metallic AFM tip, allowing
for detailed chemical analysis.
 Figure 19 Schematic of TERS process

4. AFM-Based Nanolithography:
Advances in AFM-based patterning techniques have enabled the creation of complex
nanoscale structures, facilitating the development of new nanodevices and materials.

Figure 20 Nanolithography Process

Conclusion

Atomic Force Microscopy has significantly advanced our ability to study surfaces at the
nanoscale. Its high resolution, versatility, and non-destructive nature make it a vital tool in
various fields, from materials science to biology. Despite its limitations, ongoing
advancements in AFM technology continue to enhance its capabilities and broaden its
applications. AFM remains an indispensable instrument in the quest to understand and
manipulate the nanoworld.

References:

1. Binnig, G., Quate, C.F., & Gerber, C. (1986). Atomic Force Microscope. Physical
Review Letters, 56(9), 930-933.
2. Garcia, R., & Perez, R. (2002). Dynamic Atomic Force Microscopy Methods. Surface
Science Reports, 47(6-8), 197-301.
3. Meyer, E. (1992). Atomic Force Microscopy. Progress in Surface Science, 41(1), 3-
49.
4. https://www.ph.tum.de/academics/org/labs/fopra/docs/userguide-42.en.pdf
5. https://www.hep.physik.uni-siegen.de/teaching/masterlab/manuals/AFM_eng.pdf
6. https://my.eng.utah.edu/~lzang/images/Lecture_10_AFM.pdf
7. Images from https://www.researchgate.net/