7AD-A±55 196 FABRICRTION AND TEST OF MODIFIED GUADRUPOLE MASS LA.

SPECTROMETER(U) TRI-CON ASSOCIATES INC CAMBRIDGE MA

C G KUCZUN i@ JAN 85 RFGL-TR-85-0802 F19628-84-C-eisl

UNCLSSIFIED F/U 14/09 N

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RELIVER AND
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DAT O2 1985 -.- ".
85 51 77-'-.

AIR FOLRCEOPHYSICS LAOROR

'... - . . - ' - . . -, . . . - '- '- "" ' .' . - ' ' ' -' ' . i ., . .. i .i - I .- . ZZL Z - : I ZI i -L I -' . -' .' . - -i i -- , . i l i -i*.- " - i i " . -i ' Z -

April~ eeme~~ 94 198 177 --

 iirPFitr~xF6'!Aero GOWFINWz tqT F "N

11its technical report has been reviewed and is approved for publication.
/ • ,

EDMUND TRZCINiK1 WILLIA-M -SW ER, A~cting Chief

Co~ntract Manager Ionospheric Disturbances Branch

FOR 'rHE COMM4ANDER

ROBERT A. SKRIVANEK, Director

Ionospheric Physics Division

This report has been reviewed by the Public pSr

Affairs Office (PA) and is re-
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Qualified requestors may obtain additional copies from the Defense Technical
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 Unclassified
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62101F 4643 10 AA
11 TITLE IInctude Secuarity Classificalio)FbiainadTs

ofModified_011adrupoleMassSpectrometr ______ _______________

12. PERSONAL AUTHOR(S)

13s. TYPE OF REPORT 13b. TIME COVERED f14. COATE OF REPORT (Yr., Mo., Day) 15. PAGE COUNT
Fn FROM Api' 4T 1985Jan 10 20
16 SUPPLEMENTARY NOTATION

17 COSATI CODES 18. SUBJECT TERMS (Continuee on reverse if neceua- and identify by block number)
FIELD GROUP SUB. GR. Electronics for Modified Quadrupole Mass Spectrometer,

19 ABSTRACT /Censtnue on rverse *f neessary and identify by block, number)

> Modify, Fabricate, and Test Electronics for a Quadrupole

Ton Neutral Mass Spectrometer.,.. ,I

20 DiSTRIBUT)ON,AVAILABILITY OF ABSTRACT 21 ABSTRACT SECURITY CLASSIFICATION

UNC LASSIFIED/DUNLIMITE D I SAME AS RPT D2TIC USERS 0 Unclassified

22a NAME OF RESPONSIBLE INDIVIDUAL 22b TELEPHONE NUMBER 22c OFFICE SYMBOL
(inctude Area Code)I

Edmund Trzcinskl 617-861-5475 LID

DO FORM 1473, 83 APR EDITION OF 1 JAN 73 IS CSSOLETE
SECURITY CLASSIFICATION OF THIS PAGE
 LIST OF DPAWII4S ~

Page

D-2030 . .. . 10

D-2053,

D-2042....................12 0
SWEEP & DiATA HMTIPLEXER

D-2044....................13
ION NEUTrRAL PROGRAM CARD

D-2036....................14 .
ION NEUTRLAL C9.WAND RELAY

D-2047....................15
14IRIN4G DIAGRAM

D-2038....................16
ELECrRONIC BOX

D-4065....................17
EMISSION REGULATOR

D-1034....................18
CONSOLE

D-1032....................19
CONSOLE SCHIAF[C
INTR0DUCTION

The objective of this contract was to modify, fabricate,

test, and deliver the electronics for a quadrupole ion/
neutral mass spectrometer capable of madng positive ion
and neutral species measurments over a range of 1 to 70
atomic mass units (AMJ) wit a mass sampling rate of 100
per second and consisting of the following subassenblies.

Power Supply - Schematic D-2030;

Layout D-2031.

Command Relays and Switched Bias Amp -

Schematic D-2036; Layout D-2037.
I
Sweep Amp and Data Multiplexer -
Schematic D-2042; Layout D-2043.

Program Card - Schematic D-2044;

Layout D-2045.

Electrometers - Schematic D-2053;

Layouts C-888 & C-889.

RF Oscillator - Schematic C-857;

Layout B-860.
Electronics Box - D-2028 and Wiring
Diagram D-2047.

These subassemblies are to be fabricated to the

existing manufacturing drawings indicated with
minor modifications developed in the work done
previously.

*. . . . .... . . . .

.. ..... •
 In addition, the Emission Regulator which exists
presently as Schematic D-2034; Layout D-2035, has
been redesigned as detailed in Paragraph II.

II EMISSION REGULATOR

The collected electron beam current can be set

at any level between 50 pa and 120 pa and remain
- 8 to 2x10 4
in regulation over a pressure range of 10
TORR water vapor with no oscillation.

The new Emission Regulator design is represented

by Figure 1 - Block Diagram and the card detailed
Schematic D-4065. The circuit has been bread-
boarded by using a 6AL5 electron tube to simulate
the emission chamber represented by the filament -

and anode in the actual quadrupole.

The approach is to incroporate a built-in hysterisis

or dead zone by use of two thresholds whose re-
ferences are separated by a voltage difference plus
a digital counter as control signal storage in the
loop. Referring to Figure 1, the action is as
follows:

The electron beam current collected is voltage

converted by operational amplifier A1 into E as
shown. This output is applied to opposite sense
comparators C+ and C-. For any output level E
less than T+ or greater Than T- there is no action.

-2-

1'

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-"-." ,2 , -- -i'-."i-- - . .'----, -.- - '" - -" - . " "•" - " . ." -. - :.-
Outside their limits one of the comparators
changes state and through the OR gate enables the
free running oscillator OSC. The output of this
OSC triggers the up-down counter U/D in a direction
determined by which comparator's threshold has
been exceeded. The change in state of U/D stages
are converted into an analog signal by a D/A con-
verter (after going through level changing and
into a different ground system via optical isolators
0/I). This changed analog signal Ec is used to
control the output of a switching regulator S/R
which in turn controls the filament converter and
the power to the filament. This change in fila-
ment power is such as to change E o and bring it
back into the dead zone between the two thresholds
T+ and T- of the comparators C+ and C- and thereby
inhibiting the OSC and stopping the action. If
the disturbing error is so great that a single
change in state of U/D does not make E reach the
dead zone between T+ and T- then the OSC continues
pulsing and advancing counter U/D in the direction
required until this occurs.

The advantages of this technique are as follows:

At power turn-on the up-down counter would be
preset in the middle of its range and the system
would start close to original calibration setting
in the laboratory or that determined by some pre-
vious command.

-3- .

. . . . . ..
Every time an input error results in a violation
of the hysteresis represented by the thresholds
T+ and T- the correction is made in successive
small signals by the up-down counter U/D. The
rate of these corrections is determined by
oscillator OSC. This rate is purposely made slow
enough so that after each step correction the
complete system has reached equalibrium and all
transients, overshoots, etc., are over, for ex-
ample, in order to accommodate the thermal time
constant of the filament (T) the equalibrium con-
ditions realized as a function of the oscillator
rate would be:

nT % Correction
1 37%"
2 14
3 5
4 2

Therefore, for a filament thermal time constant

of 100 milliseconds a specification of 2.5 Hz
on the OSC rate would permit the system to
stabilize to within 2% of the asymptotic of the
emission.

The dynamic range limits on the filament drive

are automatically and linearly controlled by the
fact that up-down counter would not be permitted
to roll over in either direction and the control

-4-
signal E would be limited by the D/A gain con-
trol R 3 . This feature would inherently prevent
the possibility of burning out the filament.
The switching regulator S/R and the filament re-
gulator would never be coming out of hard-on or
hard-off conditions as a function of large input
errors.

The setting of the electron beam current is

easily set by means of the offset control R 2
in the current amplifier A1 circuit. For any
nominal current I ° desired, R 2 is set so that E
0 2 0
equals zero for that current. By means of latch-
ing relays this could be changed by on-board
programming or indirect command functions.

The magnitude of the hysteresis or dead zone is

established by adjustment of gain of the current
amplifier with R and the settings of thresholds
T+ and T- of comparators C+ and C-. For example
a + 5microamD hysteresis would result with thres-
holds of + 1 volt and R I equal to 200K. These
parameters could also be set in the lab or by
programming or by command.

There is an optimum relationship between the com-

parator threshold and the single bit change in
the up-down counter and therefore the incremental
change in E o . That incremental change ideally ,
would be the threshold voltage T. Too large an

-5-

. . .-. .
increment would result in a one bit oscillation
rate of OSC. Too small an increment would result
in possible increase of the hysteresis or dead
zone and therefore reduction in dynamic accuracy.
Neither of these conditions is critical.

The capacity of the up-down counter is somewhat

arbitrary but it does affect the dynamic range.
For example: if the nominal emission current I
0
is equal to 100 microamps, the dynamic range ver-
sus dead zone and counter capacity is:

Io Dead Zone Counter Dynamic

Microamps + Microamps Capacity Range

100 1 16 92-108
100 2 16 84-116
100 5 16 60-140
100 1 32 84-116
100 2 32 68-132

However the use of a counter capacity of 16 is de-

sirable, in that an up-down counter of that capacity
comes in a standard single DIP pack.

The enabling - inhibiting of the stepping oscillator

OSC could be done two different ways. One would
be to advance the up-down counter the moment
either comparator threshold was exceeded and then

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advance it at the natural rate as long as the

threshold is exceeded. The other way would be to .-

delay the triggering for one-half the OSC interval

after the threshold is exceeded and then at the
natural rate. The former is sort of a fast res-
ponse time enhancement. The latter is sort of a
built in delay to minimize reaction to rapid but
short disturbances. The OSC rate can easily en-
compass the range from 100 KHz to .01 Hz or for S
practical and useable interval limits of 100
seconds to 0.1 second.

The hardware required over and above used in the •

present systems would be quite nominal. Assuming
a four bit up-down counter which is one DIP pack- "
age: the current amplifier, two comparators, and
the oscillator could all be designed around a quad
operational amplifier chip. The OR gate could be
diodes. The optical isolator is a single DIP pack-* -

age, and the D/A converter could be synthesized

with resistors.

In the final circuit represented by D-4065, the

winding 4-5-6 on T1 which developes approximately 5
volts as H + is used as the input to the switching S
regulator, U 6 (National LH 1605CK). The emission
current collected at the anode is amplified by U 4 A.
(0P420). Its gain is controlled by selection of
R 5 0 and the amplifier offset is determined by R 2 2 .
Zeners CRI4 and CRI 5 are used to prevent saturation

-7-

Iii
:
iii
-S°
 of U 4 A which would essentially open the loop around
U4 5 . U 4 B is a non-inverting buffer and U 4 C is an
inverting buffer. U 5 A and U 5 B are sections of a
LM 139A quad-comparator. They are operated as com-
bination threshold comparators and oscillators.
When either threshold is exceeded it generates
pulses to drive the Up-Down Counter U8 (RCA CD 40193B)
in the proper direction to reduce the emission
current error such that it is less than the positive
threshold and greater than the negative threshold. The
4 binary bits of the counter (QI, Q 2, Q 3 ' Q 4 ) drive
the 4 bit optical isolator U 7 (HP 6N140). The
outputs of the optical isolator are A to D converted
at the floating filament supply level (F-) by the
binary weighted resistors R2 8 , R 2 9 , R 3 0 , R 3 1 and
this is used as control load for the switching
regulator U 6 .

Two AND gates represented by the 4 diodes of U9 A

and U9 B are used to detect the limits of the binary
counter U 8 and thereby prevent the thresholds from
being exceeded any longer and rolling over the
counter.

T11 TEST CONSOLE

A test console is supplied with the mass spectrometer

electronics to allow for field test without the
need of a large number of test instruments.

-8-4

*.*"L".
The test console will supply the power and
timing functions and display mode and data
signals received from the experiment.

Auxiliary jacks are available to allow for more

precise measurements of each parameter.

-9-
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