Control_Charts
Control_Charts
com
Introduction
A Control Chart shows the time course of a process characteristic. For this purpose,
data can be taken continuously or in periodic samples. The prerequisite is that the
process capability has previously been confirmed. The Control Chart is also well
known as Statistical Process Control SPC.
There are control charts for continuing quantitative measurands and for attributive
characteristics (test with counts). The sole representation of a continuing measurand
is defined as an single measurement chart.
Time scale
If one or more values of a random sample is/are outside the control limits, this defect
must be identified and rectified as quickly as possible before the process exceeds the
tolerance limits. Note: The tolerance is normally not shown in the control chart.
2 out of 3 9 points in
points in succession on
succession the same side
outside 2s
14 points in
4 out of 5 succession
points in alternating above
succession and below the
outside 1s midline
8 points in
succession
outside 1s
UCL
OE
OEGG
OWG
OWG
UWL
385 385
Pro d u k tm e rk m a l
375 375
UWG
LWL
UWG
UE
UEG
LCLG
What are referred to as the lower/upper warning limits LWL/UWL and control limits
LCL/UCL are shown on the right.
The areas ±2 s‘ and ±3s‘ correspond to a probability range of 95.45% and 99.73%.
(Note: In sources from the German literature, warning and control limits above 95%
and 99% probability are often defined).
These limits do not reflect the tolerance range, but rather only the observed frequency
distribution (histogram on the left in the previous illustration) of the particular random
sample parameter that is being monitored. The tolerance limits are never specified
on the process control chart. The collected process data does however form the basis
for the process capability investigation in relation to the tolerance (see Cp/Cpk).
The warning and control limits are calculated periodically based on the most recent
process data. Intervention of correction of the process only takes place once the
control limits have been undershot or exceeded.
Warning and control limits for the standard deviation are calculated here using the
²-distribution:
The standard deviation should always be as small as possible, so the LWL and LCL
are not used as a rule.
p-card
The sample ranges do not have to be constant, although a fluctuation of more than
25% is not recommended. The relative proportion of faulty units is:
n* n' p p : relative defect proportion
p = = n* : number of faulty units
n' n'
n‘ : sample range (faulty and intact units)
Depending on whether the relative defect proportion (p-card) or the absolute defects
are noted on the control chart, there is also what is referred to as the np-card for the
latter case. In the np-card, the random sample range is constant.
The average defect proportion in several random samples is then:
1 m ni*
n
: number of defects per random sample
p= *
i m : number of random samples
ntot i =1 ntot : number of total units
The control limits are calculated by way of approximation to the normal distribution
where:
u u
LCL = u − 3 UCL = u + 3 u : Mean sample size
n n
Here too, LCL is generally not required, particularly since negative values are
mathematically possible.
u-card
In the u-card, the random samples must consist of units with several components or
defect possibilities. The sample size can be different, but should not fluctuate by
more than 25%. The number of defects per unit is:
c
u = c : number of defects in the random sample
n' n‘ : sample range
Analogously to the u-card, there is also the c-card, in which the absolute number of
defects is shown here. The random sample range is constant.
In the u-card, the average number of defects is:
u u
UEG = u − 3 OEG = u + 3 n : Mean sample size
n n
Using Visual-XSel
All control charts are available as templates. Click to the icon in the main guide…
Then the charts on the right main window has update with the new data
In case of the Control_Chart_x_s.vxg on the 2nd page the "Western Electric Rules"
will be shown, if relevant conditions where met here.