GM328 Transistor Tester

Operations Manual

By Steven Vagts

Z-100 LifeLine
Insert, Issue #130

Tester Description:
The GM328 Transistor Tester is sold as a kit and requires some experience in soldering
skills as three of the parts are small surface mounted devices. A soldering iron with
a needle point tip would be very helpful here. I have seen some kits sold with the
three surface mount parts already installed. The kit is often sold with an acrylic
case, or the case may be purchased separately. Please see the separate document on
GM328 Transistor Tester Assembly for assembly assistance. This manual will concentrate
on Operational Procedures.

The Tester will automatically detect NPN, PNP, and Field Effect Transistors (FET),
diodes (including dual diode, zener diode and light emitting diode), triodes,
thyristors, triacs, and SCRs, with automatic identification of the transistor pinout.
The Tester detects power transistors with FET protection diodes built in. It also
tests resistors (including adjustable potentiometers), capacitors, and inductors.

This Tester can also generate a single square wave with 20 set frequencies from 1Hz to
2.0MHz, can measure frequencies from 1Hz to 2.9MHz with resolution to 0.001mHz, and
can use an AC/DC power adapter (6.8-12Vdc, 30mA current).

The Tester has amazing specifications in a small package:

Size: 3-1/8" long x 2-1/2" wide x 1-1/8" tall circuit board

Type: Transistor Tester
Display: 128x160 pixel color display with backlight;
8x20 characters; 16-bit, 65k color
IC PROM: Atmel Atmega328P 28-pin PROM DIP IC chip
Power: 9v battery or AC/DC power adapter (6.8-12Vdc, 30mA current)
Control: Rotary Pulse Encoder With Switch (RPEWS); auto shutdown
Inductor: Measures inductors, 0.01mH - 20H
Capacitor: Measures capacitors, 25pF - 100,000uF
Capacitor ESR: Displays ESR of capacitors >0.1uF
Resistance: Measures resistors to 0.1 ohm resolution, maximum 50M ohms
Freq Counter: 1Hz to 2.9MHz (Megahertz), with resolution to 0.001mHz;
Samples and reports the frequency every few seconds
Freq Generator: Simple, single square wave at 20 set frequencies;
From 1000mHz(1Hz) to maximum of 2000KHz(2.0MegaHertz).
PWM Generator: Variable (1-99%) duty cycle pulse signal (10-bit PWM)
at fixed 7812.5Hz frequency.
Features:
- Automatically checks the component’s pins and displays them on the LCD.
- Automatic detection of NPN and PNP transistors, N-channel and P-channel
MOSFETs, diodes (Zener diodes <4.5 Vdc, dual diodes and LEDs), triodes,
thyristors, triacs, resistors, inductors, capacitors (including ESR).
- Measures adjustable potentiometers, if wiper not positioned at one end.
- Measures capacitor ESR of capacitors >0.1uF, with resolution of 0.01 ohms.
- Measures the rate of decline (Vloss) of Capacitors >5000pF (Q value).
- Can identify zener diodes whose reverse breakdown voltage is <4.5 Vdc.
- Measures bipolar transistor current amplification factor and base-emitter
threshold voltage.
- Measures the reverse capacitance of a single diode.
- Measures the collector or emitter junction reverse capacitance of bipolar
transistors.
- Measures the gate threshold voltage and gate capacitance of a MOSFET.
- In the transistor, the MOSFET protection diode's amplification factor and
base can be sensed to determine the forward bias voltage of the emitter
transistor.
- Measures frequencies from 1Hz to 2.9MHz (Megahertz).
- Square wave generator for 20 set frequencies between 1Hz to 2MHz.
- PWM square wave generator with variable (1-99%) duty cycle pulse signal
(10-bit PWM) at fixed 7812.5Hz frequency.

Physical Layout of the Assembled Tester:

Power:

The Transistor Tester requires power

from 6.8V – 12Vdc. This can be from a
9V battery or an AC/DC power adapter.
When the power is ON, the current is
about 30mA at 9Vdc; after shutdown,
it still draws about 20nA current.

The Tester will automatically switch

OFF after a component test and no
further action is performed by the
user.

Liquid Crystal Display (LCD):

The Tester uses an 1.77" (measured diagonally), 128x160 pixel Liquid Crystal Display
(LCD). It is a general LCD Red-Green-Blue (RGB), 65k color display module with an
embedded controller, similar to the popular ST7735S, and has a backlight. It inter-
faces to the Tester via an 8-pin connector.

Similar displays are used with the Arduino, Raspberry Pi, and STM32. However, this LCD
module is NOT compatible with those generally for sale on Ebay! While the capabilities
and specifications are identical, the 8-pin connector pinout is NOT the same.

Liquid Crystal Display Specifications:

Size: 1.77" diagonal across the viewing area.

Display Type: Thin-Film-Transistor (TFT) Liquid Crystal Display (LCD)
Display Format: Graphic 128(RGB) x 160 dot matrix
Input Data: 4-wire SPI Serial Interface
 Drive IC: ST7735S or similar
Backlight System: 2-LED White Color, 3.3Vdc maximum
Brightness: 80 nils (low compared to others)
Colors: 56k, 16-bit colors
Pixel Size: 0.219mm tall x 0.219mm wide
Character Size: 8 Rows by 20 Columns
LCD Active Area: 28mm (1.1") tall x 35mm (1.38") wide
Ports Required: Minimum of 4 IO ports
Operating Temp: -20 to +70 degrees Centigrade
Operating Voltage: +3 to +5.0Vdc
Pin Descriptions: (Best guess based on Vdc measurements)
Pin 1 Backlight control pin (3.3Vdc, for full bright)
Pin 2 RES, LCM Reset pin, when low, resets Ctrlr Chip
Pin 3 SDA, Serial Data Input
Pin 4 SCL, Serial Clock Pin
Pin 5 CS, Chip Select
Pin 6 DC, Data/Command Control
Pin 7 Vcc, +5.0Vdc
Pin 8 Ground

Control:

The Transistor Tester is controlled by a "Rotary Pulse Encoder With Switch" (RPEWS),
which supports four operations:
- Power on
- Short-press
- Press and hold (long-press)
- Left and right rotation

The Tester is turned ON with a short-press of the RPEWS. If a component to be tested

is placed in the test socket, the Tester will sense the component and attempt to
identify it. If it is successful, the results will be displayed on the screen, as
described later in this paper. If unsuccessful, the user will be informed of such
action before shutting OFF.

Following the component check, and before automatically shutting OFF, the unit will
wait 15 seconds for user action. A long-press OR rotation of the RPEWS left or right
will enter the Function Menu. In the Function Menu, a ">" in the left column indicates
the present menu item selected. To select another function, rotate the RPEWS left or
right and do a short-press on the function selected.

To exit a Function, press and hold (long-press) the RPEWS knob until you are returned
to the Function Menu.

Operation:
The Transistor Tester has three Test Points (TP1, TP2, TP3) within the test socket and
three pads for surface mount components.

The Test Points in the test socket are arranged in the

pattern displayed on the circuit board silk screen
just above the test socket. The left six (3+3) belong
to TP1, the middle two (1+1) belong to TP2, and the
right six (3+3) belong to TP3.

To the right of the test socket are three test pads

that can be used to test surface mount components.

Note: The numbers of the test pads on the silk

screened board, if labeled at all, may NOT be numbered
correctly. Please check them with an ohmmeter to match
the pins of the Test Socket. Mine had to be labeled as
shown in the above picture.
When testing two or three lead components, the leads must be placed between different
test points, that is, place a component in the test socket such that each pin of the
component is in a separate test point.

Note: If TP1 and TP3 are selected, the Tester will enter a “series test mode”, where
repeat tests are done automatically. You may change components at any point in this
series. Exit the series with a long-press of the RPEWS. The test may be started again
with a short-press of the RPEWS.

Self-test & Calibration:

Note: This Tester requires calibration before use.

The Self-test & Calibration can be started by either:

- Shorting all test points and turning the device ON
- Selecting it from the Function Menu

Note: To short the Test Points together, simply construct a small test component of
three short lengths of wire, twisted and soldered together.

Upon sensing the shorted test pins, the Tester will prompt with Selftest mode..?
and a RPEWS short-press (within 2 seconds) will direct the tester into self-test
mode. The color of the Tester's LCD will change to white on a black background.
If not short-pressed within 2 seconds, the Tester will resume normal measurement.

The Tester will sense the shorted probes and report:

Selftest mode..
R0=.32 .35 .30Ù (Yours may be different)

When the test procedure prompts Isolate Probes! ... remove the shorted test component
from the test socket. The Tester will sense the disconnection of the Test Points and
report the values of Ri_Hi and Ri_Lo, such as:
Ri_Hi=22.4Ù
Ri_Lo=20.3Ù

Then it reports C0 on a new page, such as:

C0 41 42 47pF,
OK

The calibration procedure begins next, if the unit has not been calibrated, by
prompting:

1-||-3 > 100nf

0nF ...

Insert any capacity capacitor from 100nF to 20µF between TP1 and TP3. With this
capacitor, the offset voltage of the analog comparator will be compensated for better
measurement of capacity values.

Note: Do not insert the capacitor until it is asked for.

The test procedure ends when it reports: Version 1.12k and Test End.

At the end of a test (before auto-off), a long-press or

rotation of the RPEWS will enter the Function Menu. In
the Function Menu:

- RPEWS rotation changes the selection

- RPEWS short-press selects Function action
- RPEWS long-press will exit the Function Menu

Let’s look at each function now...

Function Menu Descriptions:

- Switch off - The Tester will shut down immediately.

- Transistor - Transistor test; it is also the default Function at switch ON.

Please see the section, Testing Components, next for a detailed description.

- Frequency - Measurement of frequency. For frequencies below 25kHz the

normal measurement is followed by a measurement of time period. This
additional measure only follows after a normal frequency measurement.

The picture on the left shows two GM328

Testers; the top Tester is generating a
frequency of 1000mHz (millihertz or 1Hz)
for the bottom Tester to measure. Note the
input and output terminals, as these are
unmarked on the circuit boards.

The top Tester , in f-Generator Function

(described next), has a wide selection of
20 frequencies from which to choose. The
choice is make by rotating the RPEWS left
to move the ‘>’ up, or right to move down.
A short-press of the RPEWS selects the
frequency.

The bottom Tester is in the Frequency

Function. Frequencies from 1Hz to 2999KHz
can be read.

- F-Generator - This Function can output a square wave, with 20 set non-
adjustable frequencies to choose. (See Frequency above.)

- 10-bit PWM - The function ”10-bit PWM” (Pulse Width Modulation) generates
a fixed frequency (7812.5Hz) with selectable pulse width at the pin TP2.

The pulse width begins at 50%, as shown, but can be

adjusted by rotation of the RPEWS; left to decrease the
percent value, right to increase the percent value.

Additionally, a short-press (< 0.5 sec) of the RPEWS

will increase the pulse width by 1%. A long-press of
the RPEWS will increase the pulse width by 10%.

If 99% is overstepped, 100% is subtracted from the

result.

The function can be exited with a very long key press

(> 1.3 sec).
What is Pulse Width Modulation?

Once again from Wikipedia, Pulse width modulation (PWM), or pulse-duration

modulation (PDM), is a method of reducing the average power delivered by
an electrical signal, by effectively chopping it up into discrete parts.
The average value of voltage (and current) fed to the load is controlled
by turning the switch between supply and load ON and OFF at a fast rate.
The longer the switch is ON compared to the OFF periods, the higher the
total power supplied to the load. Along with Maximum Power Point Tracking
(MPPT), it is one of the primary methods of reducing the output of solar
panels to that which can be utilized by a battery. PWM is particularly
suited for running inertial loads such as motors, which are not as easily
affected by this discrete switching, because they have inertia which causes
them to react slowly to changes. The PWM switching frequency has to be high
enough not to affect the load, which is to say that the resultant waveform
perceived by the load must be as smooth as possible.

The rate (or frequency) at which the power supply must switch can vary
greatly depending on load and application. For example, switching has to be
done several times a minute in an electric stove; 120Hz in a lamp dimmer;
between a few kilohertz (kHz) and tens of kHz for a motor drive; and well
into the tens or hundreds of kHz in audio amplifiers and computer power
supplies.

The main advantage of PWM is that power loss in the switching devices is
very low. When a switch is OFF, there is practically no current, and when
it is ON and power is being transferred to the load, there is almost no
voltage drop across the switch. Power loss, being the product of voltage
and current, is thus in both cases close to zero. PWM also works well with
digital controls, which, because of their ON/OFF nature, can easily set the
needed duty cycle. PWM has also been used in certain communication systems
where its duty cycle has been used to convey information over a communica-
tions channel. PWM is also used often with computer fans.

The term duty cycle describes the proportion of

'ON' time to the regular interval or 'period'
of time; a low duty cycle corresponds to low
power, because the power is OFF for most of the
time. Duty cycle is expressed in percent, 100%
being fully ON. When a digital signal is ON
half of the time and OFF the other half of the
time, the digital signal has a duty cycle of
50% and resembles a "square" wave (See the
pictures at left and below).

When a digital signal spends more time in the

ON state than the OFF state, it has a duty
cycle of >50%. When a digital signal spends
more time in the OFF state than the ON state,
it has a duty cycle of <50%.
- C+ESR@TP1:3 - The function "C+ESR@TP1:3" selects a stand-alone capacity
measurement with ESR (Equivalent Series Resistance) measurement at the
test pins TP1 and TP3. Capacities from 2µF up to 50mF or 50,000uF can be
measured, while the 1-||-3 test can measure 25pF - 100,000uF.

Note: Because the measurement voltage is only about 300mV, in many cases
the capacitor can be measured ”in circuit” without previous disassembling.
The series of measurements can be finished with a long-press of RPEWS.

- Selftest - The menu function ”Selftest” is a full self test with

calibration. With that call, all the test functions T1 to T7 and also
the calibration with external capacitor is done every time, as follows:

The test begins with a flashing Short Probes! prompt. If you do not short
the probes within about 2 minutes, the test continues by reporting Ri_Hi
and Ri_Lo and continues from there (see below).

When you short the probes, the test procedure reports the zero resistance
(R0) of the pin combinations 1:3, 2:3 and 1:2, such as:
R0=.32 .35 .30Ù

Next, the Tester prompts Isolate Probes! The Tester will sense the
disconnection of the Test Points and reports the resistance of the port
outputs to the 5V side (Ri_Hi) and to the 0V side (Ri_Lo), such as:
Ri_Hi=22.4Ù
Ri_Lo=20.3Ù

and reports the zero capacity values (C0) with all pin combinations
(1:3, 2:3, 1:2 and 3:1, 3:2, 2:1) on a new page, though mine only
showed one set of values (See Show Data for both sets), such as:
C0 41 42 47pF
OK

The calibration procedure begins next with the prompt:

1-||-3 >100nf
0nF

Insert any capacity capacitor from 100nF to 20µF between TP1 and TP3.
With this capacitor, the offset voltage of the analog comparator will
be compensated for better measurement of capacity values.

Lastly, the correction values for the comparator (REF_C) and for the
reference voltage (REF_R) are also shown, such as:
REF_C=10
REF_R=-14.

The tests end when it reports: Version 1.12k and Test End.

- Voltage - Voltage measurement. Because a 9:1 (180K:20K) voltage divider

is connected, the maximum external voltage can be 50Vdc. The measurement can
also be exited by continuous rotation of the RPEWS.

- Show data - The function, ”Show Data” shows the version number of the
software and the data of the calibration. These are the zero resistance
(R0) of the pin combinations 1:3, 2:3 and 1:2. In addition, the resistance
of the port outputs to the 5V side (RiHi) and to the 0V side (RiLo) are
shown. The zero capacity values (C0) are also shown with all pin combina-
tions (1:3, 2:3, 1:2 and 3:1, 3:2, 2:1). Lastly, the correction values
for the comparator (REF C) and for the reference voltage (REF R) are also
shown. Every page is shown for 15 seconds, but you can select the next
page by a key press or a right turn of the rotary encoder. With a left
turn of the rotary encoder, you can repeat the output of the last page or
return to the previous page.
 The display screens of Show Data from one of my Testers was:

Version 1.12k
R0=.32 .35 .30Ù
Ri_Hi = 22.4Ù
Ri_Lo = 20.3Ù
C0 41 42 47pF
44 46 45pF
REF_C = 10
REF_R = -14

Then it began showing pairs of diagrams:

BJT-NPN BJT-PNP
N-JFET P-JFET
N-E-IGBT P-E-IGBT
N-D-IGBT P-D-IGBT
N-E-MOS P-E-MOS
N-D-MOS P-D-MOS

Then it showed the diagrams for the following four components:

Resistor
Coil
Capacitor
Diodes (left & right)

Finally, it finished with a display of the entire Character Set,

and returned to the Function Menu.

- FrontColor - This function can change the color of the font, the 16-bit
color is encoded in RGB(565) format; that means red maximum = 31, green
maximum = 63, blue maximum = 31 respectively. In the function, a short-
press can index the base color to change, turn left to decrease its value
and turn right increase its value. A long-press will save the result and
exit the function.
Please keep in mind the FrontColor and the BackColor can not be the same -
the LCD would show nothing. If this happens, however, you need to do a
Selftest. Enter the Selftest by turning the Tester ON with shorted probes.
Selftest will change the back color to black and front color to white
automatically. When the Selftest is finished, long-press back to the
Function Menu to modify the color again. If you do not change the color,
and turn the Tester off, the color will return to the original set color
when the Tester is turned ON again!

- BackColor - This function is the same as FrontColor, except it changes

the background color.

- 1-||-3 - This function can measure the series capacitance between TP1
and TP3. This function can measure capacitance from 25pF - 100,000uF.
However, it can measure much smaller capacitors, by testing with a 30pF
capacitor. First, test a 30pF capacitor, then test again after the other
capacitor is connected in parallel. Subtract the measured value of the
30pF capacitor with the results obtained.
A long-press will exit the function.

- 1-(resistor & inductor symbols)-3 - This function can measure the series
resistance and inductance between TP1 and TP3. A long-press will exit the
function.

- DS18B20 - The DS18B20 is a Digital Thermometer with 1 wire communicating

protocol. It looks like a transistor due to its TO-92 component package,
so it can fit into the Tester. When entering this function, Row 2 of the
LCD will show a string “1=GND 2=DQ 3=VDD”. This means to connect TP1 of
the Tester to GND of the DS18B20, and so on. The Tester can not sense the
pin configuration of the DS18B20 because it is an integrated circuit.
Therefore, you must install the DS18B20 according to the string given.
 The Tester reads the temperature using 12-bit
resolution. It first starts a “Convert T“[44h]
command, and then reads a series of 9 bytes of the
“SCRATCHPAD” and the “64-BIT LASERED ROM”. Fetch
the first two bytes within the “SCRATCHPAD” and
convert these to the readable temperature shown at
row 3 of the LCD.

Scratchpad BYTE
TEMPERATURE LSB 0
TEMPERATURE MSB 1
TH/USER BYTE 1 2
TL/USER BYTE 2 3
CONFIG 4
RESERVED 5
RESERVED 6
RESERVED 7
CRC 8

For example, the following is read from the DS18B20:

Scratchpad: 1E 02 4B 46 7F FF 0C 10 5F

It means:
Scratchpad BYTE Byte Read
TEMPERATURE LSB 0 1E
TEMPERATURE MSB 1 02
TH/USER BYTE 1 2 4B
TL/USER BYTE 2 3 46
CONFIG 4 7F
RESERVED 5 FF
RESERVED 6 0C
RESERVED 7 10
CRC 8 5F

The 64-BIT ROM is structured as:

[ 8-bit CRC Code ] [ 48-bit Serial Number ] [ 8-bit Family Code (28h) ]
MSB LSB MSB LSB MSB LSB

For example, the 64-bit ROM has: 28 FF 34 5D 36 16 04 BE

Which means:
[ 8-BIT FAMILY CODE ] = 28
[ 48-BIT SERIAL NUMBER } = 0416365D34FF
[ 8-BIT CRC CODE ] = BE

The temperature at row 3 of the LCD is shown in the decimal system. For
others, the number is hexadecimal. The Tester measures temperatures from
-55°C to +125°C. To exit this function, press and hold the RPEWS > 3 sec.

- DHT11 - The DHT11 is a sensor with temperature and humidity measurements.

The degree of accuracy is +-5% Relative Humidity (RH) and +-2 degrees C.

The Tester measures temperatures from 0 to 50 degrees

Centigrade and measures relative humidity from 20-90%
RH.

When entering this function, Row 2 of the LCD will

show a string “1=GND 2=DQ 3=VDD”. This means to
connect TP1 of the Tester to the GND of the DHT11,
the “N/A” pin of the DHT11 can be floating or
connected to GND. TP2 of the tester is connected to
DATA of the DHT11, and TP3 of the Tester is connected
to Vcc of the DHT11. The Tester can not sense the pin
configuration of the DHT11. Therefore, you must
install the DHT11 according to the string.
 When a reading occurs, the temperature is shown at row 3 and humidity is
shown at row 4. To exit this function, press and hold the RPEWS > 3 sec.

- IR_decoder - The function of decoder is achieved by a IR receiver module.

When entering the IR_Decoder Function, Row 2 of the

LCD shows a string “1=DOUT 2=GND 3=VCC”. This means
to connect TP1 of the tester to the GND of the IR
receiver module, and so on. Here are the pinouts for
some popular IR Receiver Modules:

The IR_Decoder Function supports two infrared remote control protocols

1. uPD6121
2. TC9012

The two protocols are the same except the lead code; Protocol 1 is 9ms+4.5ms
but Protocol 2 is 4.5ms+4.5ms. A successful decode is listed at rows 4 - 8
of the LCD, where row 4 displays the IR protocol (TC9012 or uPD6121), row 5
and row 6 display “User code1” and “User code2”, and row 7 displays the
data and the Bitwise NOT of the data (~data). Row 8 displays the four bytes
together. The hexadecimal system is used to display ALL of the numbers.

The µPD6121 and uPD6122 are infrared remote control transmission ICs using
the NEC transmission format that are ideally suited for TVs, VCRs, audio
equipment, air conditioners, etc. By combining external diodes & resistors,
a maximum of 65,536 custom codes can be specified. These ICs come in small
packages, thus facilitating the design of light and compact remote control
transmitters. The NEC transmission format consists of leader codes, custom
codes (16 bits), and data codes (16 bits). It can be used for various
systems through decoding by a microcontroller.

- IR_Encoder - This function is a simulation of an IR Remote Controller.

It can drive an IR LED connection at the tester’s PWM output interface
associated with the user input. Since the Tester can only provide about
6mA current, the Control distance is less than a regular IR Remote
Controller.

In the first column of the LCD is shown a “>”. This symbol can move up or
down by rotation of the RPEWS to select a certain item. Row 2 of the LCD is
to select a protocol, like the IR_Decoder above. There are two protocols
to select from, ”TC9012” and “uPD6121” and can be changed by rotating the
RPEWS knob when the “>” appears at row 2. Row 3 and row 4 change the “user
code 1” and “user code 2” value by rotating the RPEWS knob; left rotate
will decrease and right rotate will increase the value. Press and hold
the RPEWS knob for >1S and <3S (>3S will exit this function) will add the
value by 0x10 to reach the expected value faster. Row 5 changes the “data”,
and the Bitwise NOT of the “data” (~data) auto calculated by the Tester.
Row 6, the “emit:” is used to start a transmit. Move “>” to this line and
rotating the RPEWS knob, will start the transmit. An “->” will appear soon
until the transmit is complete.
 This function is “strongly” correlated with the IR_decoder. Without the
decoder, the value of the user code and data is unknown, unless you already
know them from other methods.
The infrared remote control protocol of “TC9012” is frequently used on
televisions in China.

- C(uF)- correction - This function sets the correction value for big
capacitor measurement. Positive values will reduce the measurement results.

Testing Components:

General Notes:
- Normally, the Tester begins in Transistor Test mode, automatically checking
if a component is found at the Test Socket or test pads. The Tester also
shows the battery voltage with every start.
- If the voltage falls below a limit, a warning is shown behind the battery
voltage. If you use a rechargeable 9V battery, you should replace the
battery as soon as possible or you should recharge.
- The measured supply voltage will be shown in display Row 2 for 1 second
with ”VCC=x.xxV”.
- When checking two-lead passives, such as resistors, capacitors, and
inductors, these can all be measured in the default test mode between
TP1 and TP3, but can be tested between any two test points.
- If TP1 and TP3 are selected to check these passives, the test will enter
'series test' mode, where the test is repeated every few seconds.
You can replace the component with another component at any time.
The test may be exited with a long-press of the RPEWS, and restarted
with a short-press of the RPEWS.
- If a component is polarized (for example, electrolytic capacitors),
favor TP1 for the negative lead/cathode.
- Capacitors should be discharged before measuring. Otherwise the Tester
can be damaged before the start button is pressed.
- If you try to measure components within an assembled circuit, the
equipment should always be disconnected from its power source. Furthermore
you should be sure that no residual voltages reside in the equipment.
All electronic equipment has capacitors that store power inside!
- If you try to measure little resistor values, you should keep the
resistance of plug connectors and cables in mind. The quality and
condition of plug connectors and the resistance of cables used for
measurement are important.
- The same is true for the ESR measurement of capacitors. With a poor
connection cable, an ESR value of 0.02 ohms can grow to 0.61 ohms.
- While interpreting transistor measurement results, keep in mind that
the circuit of the Tester is designed for small signal semiconductors.
In normal measurement conditions, the measurement current can only reach
about 6mA. Power semiconductors often cause identification difficulty
and inaccurate measurement because of residual current value.
- You should not expect very good measurement accuracy from this simple
Tester, especially in ESR and inductance measurements.

Push the RPEWS button to turn the Tester ON. The Tester will sense any component
installed and attempt to identify it. If it is successful, the Tester will display the
component name, diagram and measured values for about 25 seconds, then shut OFF. If
unsuccessful, the tester will display a large question mark ‘?’ and: “No, unknown or
damaged part.” for 10 seconds before shutting OFF.

You may change components while the results of the present test are being shown and
press the button again to restart the test without waiting for the Tester to turn off.

The Tester shows the model number and battery voltage with every start. If the voltage
falls below a limit, a warning is shown behind the battery voltage. If you use a
rechargeable 9V battery, replace the battery as soon as possible or recharge.
Note: Two resistors may be placed in series by using three test points and may be
tested at the same time. This is great for finding and testing for a matched pair of
resistors. However, this will not work with other two-lead components. For whatever
reason, only one component is generally found or, such as testing an inductor and
resistor at the same time, the Tester may report both as resistors. I believe this is
because the Tester is programmed to recognize two resistances, such as a variable
potentiometer, but not other combinations of discrete components.

Resistors:
To test, insert a resistor between any two test points.

Note: If you try to measure small resistor values,

you should keep the resistance of plug connectors and
cables in mind. The quality and condition of plug
connectors are also important. So keep any cable leads
short and connectors in good condition.

A diagram of the resistor between the two test points

chosen, the resistance (to 0.1 ohm resolution; maximum
50M ohms), and any associated inductance values will
be shown. The last line shows the Battery voltage.

You can also measure two resistors, end to end in

series, or variable potentiometers. For the potentio-
meter, attach test leads to the three leads in 1, 2, 3
order and the display should be similar to that shown
here.

Inductors:

To check coils, the normal measurement of the inductance is based on the measurement
of the time constant of the current growth. The detection limit is about 0.01mH, if
the resistance of the coil is below 24 ohms. For bigger resistance values, the
resolution is only 0.1mH. If the resistance is above 2.1k ohms, this technique can
never be used to detect coils.

To test, insert an inductor between any two test

points.

A diagram of a resistor and the inductor between the

two test points chosen, the resistance value and the
inductance value (0.01mh - 20H) will be shown.

Note: Measurement resolution is only 10µH, so it is

not possible to measure very small inductors.
Capacitors:

WARNING: Always be sure to discharge capacitors BEFORE connecting them to the Tester!
The Tester may be damaged before you have switched the Tester ON. Use extreme caution
when you try to test components mounted in a circuit. The equipment must be discon-
nected from power AND be sure NO residual voltage remains in the equipment.

For measuring capacitance, the Tester’s capacitance

values are computed from the time constant created by
the serial connection of built-in resistors and
capacitor during charging.

To test, insert a capacitor between any two test

points.

A diagram of the capacitor and resistor between the two

test points chosen, the capacitance (25pF - 100,000uF)
value and, if the capacitor is larger than 90nF, the
associated ESR value will be shown.

Note: As with small resistor values, you should keep

the resistance of plug connectors and cables in mind when measuring the ESR value of
capacitors. With a poor connection cable an ESR value of 0.02 can grow to 0.61 ohms.

For Capacitors >5000pF, the Tester will also show the rate of decline (Vloss) after
the charging voltage of the capacitor value to reflect the quality factor or
(Q value) and an associated ESR resistance value.

What is Capacitor ESR?

Practical capacitors and inductors as used in electronic circuits are not ideal
components with only capacitance or inductance. However, they can be treated, to a
very good degree of approximation, as being ideal capacitors and inductors in series
with a resistance. This resistance is defined as the Equivalent Series Resistance
(ESR).

If not otherwise specified, the ESR is always an AC resistance [vague] measured at

specified frequencies, 100 kHz for switched-mode power supply components, 120 Hz for
linear power supply components, and at the self-resonant frequency for general
application components. Audio components may report "Q factor", incorporating ESR
among other things, at 1000 Hz.

In a non-electrolytic capacitor and electrolytic capacitors with solid electrolyte,

the metallic resistance of the leads and electrodes and losses in the dielectric cause
the ESR. Typically quoted values of ESR for ceramic capacitors are between 0.01 and
0.1 ohms. ESR of non-electrolytic capacitors tends to be fairly stable over time; for
most purposes real non-electrolytic capacitors can be treated as ideal components.

Aluminum and tantalum electrolytic capacitors with non

solid electrolyte have much higher ESR values, up to
several ohms; electrolytic capacitors of higher capac-
itance have lower ESR. ESR decreases with frequency up
to the capacitor's self-resonant frequency.

A very serious problem, particularly with aluminum

electrolytic capacitors, is that ESR increases over
time with use. ESR can increase enough to cause circuit
malfunction and even component damage, although
measured capacitance may remain within tolerance. While
this happens with normal aging, high temperatures and
large ripple current exacerbate the problem. In a
circuit with significant ripple current, an increase in
ESR will increase heat accumulation, thus accelerating
aging.
Electrolytic capacitors rated for high-temperature operation and of higher quality
than basic consumer-grade parts are less susceptible to becoming prematurely unusable
due to ESR increase. A cheap electrolytic capacitor may be rated for a life of less
than 1000 hours at 85°C (a year is 8760 hours). Higher-grade parts are typically rated
at a few thousand hours at max-rated temperature, as can be seen from manufacturers'
data sheets. If ESR is critical, specification of a part with higher temperature
rating, "low ESR" or larger capacitance than is otherwise required may be advanta-
geous. There is no standard for "low ESR" capacitor rating.

Polymer capacitors usually have lower ESR than wet-electrolytic capacitors of the same
value, and stable under varying temperature. Therefore, polymer capacitors can handle
higher ripple current. From about 2007 it became common for better-quality computer
motherboards to use only polymer capacitors where wet electrolytic capacitors had been
used previously.

The ESR of capacitors larger than about 1 ìF is easily measured in-circuit with an ESR
meter.

Typical values of ESR for various types of capacitors:

Type: 22 µF 100 µF 470 µF Freq. used
Standard aluminum 7–30 Ù 2–7 Ù 0.13–1.5 Ù 120 Hz
Low-ESR aluminum 1–5 Ù 0.3–1.6 Ù 100 KHz
Solid aluminum 0.2–0.5 Ù 500 Hz
Sanyo OS-CON 0.04–0.07 Ù 0.03–0.06 Ù 100 KHz
Standard solid tantalum 1.1–2.5 Ù 0.9–1.5 Ù 100 KHz
Low-ESR tantalum 0.2–1 Ù 0.08–0.4 Ù 100 KHz
Wet-foil tantalum 2.5–3.5 Ù 1.8–3.9 Ù not stated
Stacked-foil film < 0.015 Ù 100 KHz
Ceramic < 0.015 Ù 100 KHz

Warning: Always discharge ALL capacitors before placing them in the Tester. Any
residual voltage could damage parts of the Tester!

Notes:
- Can only measure capacitance from 25pF-100mF, with 1pF resolution.
- This Tester often gives the capacitance value in nF, where 100nF = .1uF.
- For capacitors >90nF, the Tester will also give the Equivalent Series
Resistance (ESR). The ESR has a highest resolution of 0.01Ù.
- Capacitors >5000pF will also show the rate of decline (Vloss) after the
charging voltage of the capacitor value to reflect the quality factor
(Q value).
- If testing a <25pF capacitor, the test must include a 30pF capacitor.
Test a 30pF capacitor, then test again after the other capacitor is
connected in parallel. Subtract the measured value of the 30pF capacitor
with the results obtained.

Diodes:

Insert a diode between any two test points. Polarity will not matter.

A diagram of the diode between the two test points, the

Uf value in mV, the capacitance value in pF and the
Reverse Current in nA will be shown.

We will discuss Uf in a second. But, first I wanted to

show the difference if the diode under test is a small
Zener Diode. Look at the next picture...
Zener Diodes:

The testing procedure remains the same as a normal

diode, which shows a Uf (forward voltage) of about 600-
800mV. A zener diode can be detected if the reverse
breakdown voltage is lower than about 4.5Vdc. It will
appear as a double diode, with one direction showing
the forward Uf of about 700mV, and the second in the
opposite direction with a Uf equal to the zener voltage
of the diode, in this case, 3.63Vdc.

Note: While two normal diodes may be measured in

series, do not measure an ordinary diode and a zener
diode simultaneously.

What is Uf?

This tester uses a value label foreign to me, but checking the web seems to show that
Uf is used in some languages, but it is actually Vf or the forward voltage drop of a
diode from the anode to the cathode. This is used in relation to normal diodes, light
emitting diodes or the diodes inside a transistor. Essentially it is the "on voltage",
or the forward potential below which a diode will not conduct. A typical value for
"normal" diodes is 0.7 volts; germanium and Schottky diodes will be lower.

Light Emitting Diodes:

Again, the testing procedure is the same as for a diode. Insert the LED between any
two test points. Polarity will not matter.

The Tester will cause the LED to flash a few times,

then display the diagram of the diode between the two
test points chosen, from which you may determine the
LED anode and cathode, if necessary. The Uf (forward
voltage) value in the range of 1-2Vdc, the capacitance
value in the range of 1-30pF and the Reverse Current in
nA will be shown.

If testing an infrared LED or others operating beyond

the range of visible light, no flashing will be seen,
but the diode symbol and normal values will be
displayed.

If testing a bi-color LED, the LED should flash each color as the voltage is applied
in each direction. The Tester will show the diagram of both diodes and the measured
forward voltages, Uf, in both directions.

Transistors:

For normal measurement of the three pins of a PNP or

NPN transistor, the pins can be connected in any order
to the measurement inputs of the Transistor Tester.

After pushing the start button, the Tester shows the

diagram of the transistor being tested with the pins
identified and what test points they are attached to.

The current amplification factor hFE or ß, emitter

current Ie, forward voltage drop Ube, and the pinout
are also shown.
What is hFE?

The hFE (which is also referred to as ß) of a transistor is the current gain or

amplification factor of a transistor. It is the factor by which the base current is
amplified to produce the amplified current of the transistor. The unamplified current
is the base current, which then undergoes amplification by a factor of hFE to produce
an amplified current which flows through the collector and emitter terminals. So if
1mA is fed into the base of a transistor and it has a hFE of 100, the collector
current will be 100mA.

Every transistor has its own unique hFE. The hFE is normally seen to be a constant
value, normally around 10 to 500, but it may change slightly with temperature and with
changes in collector-to-emitter voltage.

Check the transistor's datasheet for the hFE value in its specifications.

Note that hFE may refer to DC or AC current gain. Many datasheets may just specify one
value, such as the DC gain. The datasheets will normally specify whether the hFE value
is for DC or AC current gain.

Also, note that as the hFE value is highly variable, many datasheets will specify a
minimum and maximum hFE for the transistor. It is very hard for transistors to be
produced with a precise hFE value during the manufacturing process. Therefore,
manufacturers generally specify a range that hFE may be within.

Because hFE is so widely variable and unpredictable in nature, good transistor circuit
design is important to give stable, predictable amplification for transistor circuits
to account for this unpredictability.

What is Ube?

As with the diode testing, Ube is actually Vbe, and in this case is the forward
voltage drop between the base and the emitter. For silicon transistors this is usually
just below 700mV, while for some of the germanium transistors, Ube goes somewhere
between 100mV and 200mV.

Let’s check out some other special transistors that I took pictures of...

What is the N-E-MOS?

Well according to Wikipedia, the metal–oxide–semiconductor field-effect transistor

(MOSFET, MOS-FET, or MOS FET), also known as the metal–oxide–silicon transistor (MOS
transistor, or MOS), is a type of field-effect transistor that is fabricated by the
controlled oxidation of a semiconductor, typically silicon. It has an insulated gate,
whose voltage determines the conductivity of the device. This ability to change
conductivity with the amount of applied voltage can be used for amplifying or
switching electronic signals. The MOSFET is the basic building block of modern
electronics.

A key advantage of a MOSFET is that it requires almost

no input current to control the load current, when
compared with bipolar transistors (bipolar junction
transistors, or BJTs). In an enhancement mode (the E in
the label) MOSFET, voltage applied to the gate terminal
increases the conductivity of the device. In depletion
mode (a D in the label), voltage applied at the gate
reduces the conductivity. MOSFETs are easily miniatur-
ized, consume much less power, are cheaper to make, and
allow higher density, than bipolar transistors. Since
MOSFETs can be made with either p-type or n-type
semiconductors (PMOS or NMOS logic, respectively),
complementary pairs of MOS transistors can be used to
make switching circuits with very low power consump-
tion, in the form of CMOS (complementary MOS) logic.
In addition to the diagram of the MOSFET, the Tester provides Vt, which is the
threshold voltage at which current begins to flow, Cg, the capacitance at the gate and
RDS, the resistance between the drain and the source. A diagram of any diode and its
Uf (Vf), the forward voltage, may also be shown. Finally, the pinout is shown.

What is the JFET?

Again from the internet, the junction gate field-effect transistor (JFET or JUGFET) is
one of the simplest types of field-effect transistor. JFETs are three-terminal semi-
conductor devices that can be used as electronic-controlled switches, amplifiers, or
voltage-controlled resistors.

Unlike bipolar transistors, JFETs are exclusively voltage-controlled in that they do

not need a biasing current. Electric charge flows through a semiconducting channel
between source and drain terminals. By applying a reverse bias voltage to a gate
terminal, the channel is "pinched", so that the electric current is impeded or
switched off completely.

A JFET is usually ON when there is no voltage between its gate and source terminals.
If a potential difference of the proper polarity is applied between its gate and
source terminals, the JFET will be more resistive to current flow, which means less
current would flow in the channel between the source and drain terminals. JFETs are
sometimes referred to as depletion-mode devices as they rely on the principle of a
depletion region which is devoid of majority charge carriers and the depletion region
has to be closed to enable current to flow.

JFETs can have an N-type or P-type channel. In the

N-type, if the voltage applied to the gate is less than
that applied to the source, the current will be reduced
(similarly in the P-type, if the voltage applied to the
gate is greater than that applied to the source). A
JFET has a large input impedance (sometimes on the
order of 1010 ohms), which means that it has a
negligible effect on external components or circuits
connected to its gate.

In addition to the diagram of the JFET, the Tester

provides Id, which is the current flow from the drain
in mA at Vg, the voltage applied at the gate when
current begins to flow. Finally, the pinout is shown.

What is the Triac, Thyrister and SCR?

TRIAC, from TRIode for Alternating Current, is a generic trademark for a three
terminal electronic component that conducts current in either direction when
triggered. Its formal name is bidirectional triode thyristor or bilateral triode
thyristor. A thyristor is analogous to a relay in that a small voltage induced current
can control a much larger voltage and current.

TRIACs are a subset of thyristors and are related to

Silicon Controlled Rectifiers (SCRs). TRIACs differ
from SCRs in that they allow current flow in both
directions, whereas an SCR can only conduct current in
a single direction.

The Triac’s pins in the picture are A1 and A2, and G is

the gate. Some minimum voltage at the gate causes the
device to conduct current bidirectionally between A1
and A2. In addition to the diagram, the Uf, or Vf,
forward voltage is shown.
Most TRIACs can be triggered by applying either a positive or negative voltage to the
gate (an SCR requires a positive voltage). Once triggered, SCRs and TRIACs continue to
conduct, even if the gate current ceases, until the main current drops below a certain
level called the holding current.

Problem Semiconductors:

You should keep in mind by interpreting the measurement results, that the circuit of
the Transistor Tester is designed for small signal semiconductors. In normal measure-
ment condition the measurement current can only reach about 6mA. Power semiconductors
often make trouble because of residual current with the identification and the
measurement of junction capacity value.

The Tester often can not deliver enough ignition current or holding current for power
Thyristors or Triacs. So a Thyristor can be detected as an NPN transistor or diode.
Also it is possible, that a Thyristor or Triac is detected as unknown.

Another problem is the identification of semiconductors with integrated resistors. So

the base - emitter diode of a BU508D transistor can not be detected by reason of the
parallel connected internal resistor. Therefore, the transistor function cannot be
tested either.

Power Darlington transistors also have a problem with detection because of internal
base - emitter resistors, which make it difficult to identify the component with the
undersized measurement current.

Disclaimer and Recognition: As no detailed manual could be found for this series of
tester, the above information is from the Tester’s listed specifications, operational
descriptions found on the internet, Wikipedia’s description of electronic parts and
theory, and personal experimentation.

Please report any errors to the author by email at: [email protected].

Thank you.