Electronic Science Department
Kurukshetra University
Syllabus for Ph.D. Entrance Test (Papers 1 & II) in the subject of
Electronic Science
1. Numerical Methods
Transcendental Equations, Iteration Methods, Operational Methods in Applied
Mathematics; Laplace Transforms, Fundamental rules, Approximate Methods in Applied
Mathematics,
2. Device Electronics and Modeling
Electronic Transport in Semiconductors, The p-n junction, Junction Break down, The
Junction FET, Transistor Action, Active bias, Transistor switching, Ebers-Moll Model,
Metal-Semiconductor Junction, Current-Voltage Characteristics, Non-rectifying contacts,
Surface effects, Schottky diodes. MOS structure, MOSFET, Basic Theory, Scaling
MOSFET to smaller size, Modeling, D-C Models, Small Signal Models, Use of device
models in circuit analysis, IC Building-Introduction, Switches (In Brief), Active Resistors
(In brief), Current sources and sinks - BJT and MOS (In brief), Circuit Simulation-
Introduction, MOSFET, Diode and BJT Models for circuit simulation.
3. Digital Electronics, Computer Architecture and Microprocessors
Logic families, CMOS logic, Electrical behaviour of CMOS circuits, Combinational logic
circuits design, Asynchronous Circuits, Sequential logic Design principles, Latches and
Flip-Flops, Machine Analysis, State Machine Structures, Characteristic Equations,
Microcomputer System: Computer Organisation, Number systems and Codes, Memory,
ALU, Control Unit, Personal Computer Concepts and Techniques, PC Hardware
Overview: Introduction- 8086 Microprocessor- Internal Architecture, programming the
8086. The Intel 8253 and 8254, Multiple interrupts and the 8259A Priorities Interrupt
Controllers. Digital Interfacing, Analog Interfacing: D/A converter operation, Interfacing
and applications, an 8086 based Process Control system, DMA Data Transfer, Advance
Microprocessors.
4. Communication Fundamentals, Microwave & Optoelectronic Devices
Maxwell's Equation, Wave Equation and Boundary conditions, Wave-guides,
Rectangular and Coaxial Waveguides, Resonant cavities, Transmission lines, Impedance
Matching, Radio Wave propagation, Pulse Communication, Digital Communication, FSK,
PSK, BPSK, QPSK, DPSK. Error Detection and Correction Codes, Modern Telephone
Networks, Satellite Communication, Microwave Communication and Optical Fibre
Communication, Microwave Introduction, Waveguides, Microwave Passive Components,
Measurements of Wavelength, Frequency, Impedance, SWR etc., Q of Cavity, Microwave
Linear Beam Tubes, Conventional Tubes-limitations at High Frequencies, Klystron.
Reflex Klystron. Traveling Wave Tube, Backward Wave Amplifier & Oscillator,
Transferred Electron Devices, Avalanche Transit Time Devices, IMPATT Diode,
TRAPATT Diode, BARITT Diode Parametric Devices, Parametric amplifiers, Basic
Principles of Light Emission in Semiconductors, Display Devices, Luminescence, LEDs,
Photo Detectors, Semiconductor Lasers, Heterostructure, DH Lasers, Quantum Well
Devices, Optical Fiber Communication, Propagation in Fibers, Step Index Fibers, Graded
Index Fibers, Attenuation in Optical Fibers, Photo-diode. Detectors for Optical
Communication Application, Optoelectronic Integrated Circuits.
5. Electronic Instrumentation: Instrument classification and characteristics, Basic
control actions and response of control system, Measurement and Control of Pressure,
Temperature, Speed etc., Electronic Instruments for Measuring Basic Parameters, Lock-
in-Amplifiers, Digital Storage Oscilloscopes, Transducers for displacement, sound, Force
Torque, Flow Measurements, Automatic test systems, Computer Integrated
Experimentation, Bioelectric Signals and Electrodes, Physiological transducers,
Computer Applications in Medical Field, Analogue and Digital Data Acquisition
Systems, Interfacing Transducers to Electronic Control and Measuring Systems.
6. Integrated Circuit Processing: Vacuum Science and Technology, Resistivity
measurement: Four point probe, Resistivity of Arbitrarily Shaped Samples, Resistivity
profiling: Anodic Oxidation- Carrier and Doping Concentration Measurements,
Capacitance measurements, Current-Voltage Measurements, Metallization for
Conductors, Chemical Vapor Deposition, Molecular Beam Epitaxy, Thermal Oxidation of
Silicon, Diffusion in Silicon, Ion implantation.
Photolithography, Wet Chemical Etching, Plasma Etching, Fundamental considerations
for IC Processing, NMOS IC Technology, CMOS IC Technology, MOS Memory
Technology, Bipolar IC Technology, IC Fabrication.
