INTERNATIONAL ISO

STANDARD 22514-4

First edition
2016-08-01

Statistical methods in process

management — Capability and
performance —
Part 4:
Process capability estimates and
performance measures
Méthodes statistiques dans la gestion de processus — Aptitude et
performance —
Partie 4: Estimations de l’aptitude de processus et mesures de
performance

Reference number
ISO 22514-4:2016(E)

© ISO 2016
ISO 22514-4:2016(E)

COPYRIGHT PROTECTED DOCUMENT

© ISO 2016, Published in Switzerland
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form
or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior
written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of
the requester.
ISO copyright office
Ch. de Blandonnet 8 • CP 401
CH-1214 Vernier, Geneva, Switzerland
Tel. +41 22 749 01 11
Fax +41 22 749 09 47
copyright@iso.org
www.iso.org

ii © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

Contents Page

Foreword ..........................................................................................................................................................................................................................................v
Introduction................................................................................................................................................................................................................................ vi
1 Scope ................................................................................................................................................................................................................................. 1
2 Symbols and abbreviated terms ........................................................................................................................................................... 1
2.1 Symbols ......................................................................................................................................................................................................... 1
2.2 Abbreviated terms ............................................................................................................................................................................... 3
3 Basic concepts used for process capability and performance .............................................................................. 3
3.1 General ........................................................................................................................................................................................................... 3
3.2 Location......................................................................................................................................................................................................... 3
3.3 Dispersion ................................................................................................................................................................................................... 3
3.3.1 Inherent dispersion ....................................................................................................................................................... 3
3.3.2 Total dispersion ................................................................................................................................................................ 3
3.3.3 Short-term dispersion ................................................................................................................................................. 3
3.4 Mean square error (MSE) .............................................................................................................................................................. 4
3.5 Reference limits...................................................................................................................................................................................... 4
3.6 Reference interval (also known as process spread) ............................................................................................... 4
4 Capability ..................................................................................................................................................................................................................... 4
4.1 General ........................................................................................................................................................................................................... 4
4.2 Process capability ................................................................................................................................................................................. 6
4.2.1 Normal distribution ...................................................................................................................................................... 6
4.2.2 Non-normal distribution........................................................................................................................................... 7
4.3 Process location ..................................................................................................................................................................................... 7
4.4 Process capability indices for measured data .............................................................................................................. 8
4.4.1 General...................................................................................................................................................................................... 8
4.4.2 Cp index (for the normal distribution) .......................................................................................................... 9
4.4.3 Cpk index (for the normal distribution) .................................................................................................... 10
4.4.4 Cpk index for unilateral tolerances ................................................................................................................ 10
4.5 Process capability indices for measured data (non-normal)....................................................................... 10
4.5.1 General................................................................................................................................................................................... 10
4.5.2 Probability paper method..................................................................................................................................... 11
4.5.3 Pearson curves method........................................................................................................................................... 11
4.5.4 Distribution identification method ............................................................................................................... 12
4.6 Alternative method for describing and calculating process capability estimates ..................... 12
4.7 Other capability measures for continuous data ...................................................................................................... 13
4.7.1 Process capability fraction (PCF) ................................................................................................................... 13
4.7.2 Indices when the specification limit is one-sided or no specification limit
is given ................................................................................................................................................................................... 13
4.8 Assessment of proportion out-of-specification (normal distribution) ............................................... 15
5 Performance...........................................................................................................................................................................................................16
5.1 General ........................................................................................................................................................................................................ 16
5.2 Process performance indices for measured data (normal distribution) ........................................... 16
5.2.1 Pp index................................................................................................................................................................................. 16
5.2.2 Ppk index .............................................................................................................................................................................. 17
5.3 Process performance indices for measured data (non-normal distribution) ............................... 17
5.3.1 General................................................................................................................................................................................... 17
5.3.2 Probability paper method..................................................................................................................................... 17
5.3.3 Pearson curves method........................................................................................................................................... 18
5.3.4 Distribution identification method ............................................................................................................... 18
5.4 Other performance indices for measured data ........................................................................................................ 18
5.5 Assessment of proportion out-of-specification for a normal distribution of the
total distribution ................................................................................................................................................................................ 18
6 Reporting process capability and performance indices ..........................................................................................19

© ISO 2016 – All rights reserved iii

ISO 22514-4:2016(E)

Annex A (informative) Estimating standard deviations ................................................................................................................21

Annex B (informative) Estimating capability and performance measures using Pearson
curves — Procedure and example ...................................................................................................................................................23
Annex C (informative) Distribution identification..............................................................................................................................37
Annex D (informative) Confidence intervals .............................................................................................................................................42
Bibliography ............................................................................................................................................................................................................................. 44

iv © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www.iso.org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation on the meaning of ISO specific terms and expressions related to conformity
assessment, as well as information about ISO’s adherence to the WTO principles in the Technical
Barriers to Trade (TBT) see the following URL: Foreword - Supplementary information.
The committee responsible for this document is Technical Committee ISO/TC 69, Applications of
statistical methods, Subcommittee SC 4, Applications of statistical methods in process management.
This first edition of ISO 22514-4 cancels and replaces ISO/TR 22514-4:2007, which has been technically
revised.
ISO 22514 consists of the following parts, under the general title Statistical methods in process
management — Capability and performance:
— Part 1: General principles and concepts
— Part 2: Process capability and performance of time-dependent process models
— Part 3: Machine performance studies for measured data on discrete parts
— Part 4: Process capability estimates and performance measures
— Part 5: Process capability estimates and performance for attributive characteristics
— Part 6: Process capability statistics for characteristics following a multivariate normal distribution
— Part 7: Capability of measurement processes
— Part 8: Machine performance of a multi-state production process

© ISO 2016 – All rights reserved v

ISO 22514-4:2016(E)

Introduction
Many organizations have embarked upon a continuous improvement strategy. To comply with such a
strategy, any organization will need to evaluate the capability and performance of its key processes.
The methods described in this part of ISO 22514 are intended to assist any management in this respect.
These evaluations need to be constantly reviewed by the management so that actions compatible with
continuous improvement can be taken when required.
The content of this part of ISO 22514 has been subject to large shifts of opinion during recent times. The
most fundamental shift has been to philosophically separate what is named in this part of ISO 22514 as
capability conditions from performance conditions, the primary difference being whether statistical
stability has been obtained (capability) or not (performance). This naturally leads onto the two sets of
indices that are to be found in their relevant clauses. It has become necessary to draw a firm distinction
between these since it has been observed in the industry that companies have been deceived about
their true capability position due to inappropriate indices being calculated and published.
The progression of this part of ISO 22514 is from the general condition to the specific and this approach
leads to general formulae being presented before their more usual, but specific manifestations.
There exist numerous references that describe the importance of understanding the processes at
work within any organization, be it a manufacturing process or an information handling process. As
organizations compete for sales with each other, it has become increasingly apparent that it is not only
the price paid for a product or service that matters so much, but also what costs will be incurred by the
purchaser from using such a product or service. The objective for any supplier is to continually reduce
variability and not to just satisfy specification.
Continual improvement leads to reductions in the costs of failure and assists in the drive for survival in
an increasingly more competitive world. There will also be savings in appraisal costs for as variation is
reduced, the need to inspect product might disappear or the frequency of sampling might be reduced.
Process capability and performance evaluations are necessary to enable organizations to assess the
capability and performance of their suppliers. Those organizations will find the indices contained
within this part of ISO 22514 useful in this endeavour.
Quantifying the variation present within a process enables judgement of its suitability and ability
to meet some given requirement. The following paragraphs and clauses provide an outline of the
philosophy required to be understood to determine the capability or performance of any process.
All processes will be subject to certain inherent variability. This part of ISO 22514 does not attempt
to explain what is meant by inherent variation, why it exists, where it comes from nor how it affects a
process. This part of ISO 22514 starts from the premise that it exists and is stable.
Process owners should endeavour to understand the sources of variation in their processes. Methods
such as flowcharting the process and identifying the inputs and outputs from a process assist in
identification of these variations together with the appropriate use of cause and effect (fishbone)
diagrams.
It is important for the user of this part of ISO 22514 to appreciate that variations exist that will be of a
short-term nature, as well as those that will be of a long-term nature and that capability determinations
using only the short-term variation might be greatly different to those which have used the long-term
variability.
When considering short-term variation, a study that uses only the shortest-term variation, sometimes
known as a machine study and described in ISO 22514-3, might be carried out. The method required to
carry out such a study will be outside the scope of this part of ISO 22514; however, it should be noted
that such studies are important and useful.
It should be noted that where the capability indices given in this part of ISO 22514 are computed, they
only form point estimates of their true values. It is therefore recommended that, wherever possible, the

vi © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

indices’ confidence intervals are computed and reported. This part of ISO 22514 describes methods by
which these can be computed.

© ISO 2016 – All rights reserved vii

INTERNATIONAL STANDARD ISO 22514-4:2016(E)

Statistical methods in process management — Capability

and performance —
Part 4:
Process capability estimates and performance measures

1 Scope
This part of ISO 22514 describes process capability and performance measures that are commonly used.

2 Symbols and abbreviated terms

2.1 Symbols
In addition to the symbols listed below, some symbols are defined where they are used within the text.

α fraction or proportion

β shape parameter in a Weibull distribution

β2 coefficient of kurtosis

c4 constant based on subgroup size, n (see ISO 7870-2)

Cp process capability index

Cpk minimum process capability index

C pk lower process capability index

L

C pk upper process capability index

U

Cpm alternative process capability index

CR process capability fraction (PCF)

d2 constant based on subgroup size, n (see ISO 7870-2)

e Eulers’s number (approximately 2,718), mathematical constant

Φ distribution function of the standard normal distribution

γ location parameter in a Weibull distribution

γ1 coefficient of skewness

m number of subgroups

Kl, Ku multipliers for estimating the confidence limits for a process capability index

L lower specification limit

© ISO 2016 – All rights reserved 1

ISO 22514-4:2016(E)

P0,135 % lower 0,135 % percentile

μ location of the process; population mean value

N total sample size

n number of values or subgroup size (for a control chart)

Pα % α percentile

pL lower fraction nonconforming

Pp process performance index

Ppk minimum process performance index

Ppk lower process performance index

L

Ppk upper process performance index

U

pt total fraction nonconforming

pU upper fraction nonconforming

P99,865 % upper 99,865 % percentile

π geometric constant

Qk process variation index

θ parameter required for the Rayleigh distribution

R average subgroup range

S standard deviation, sample statistic

St standard deviation, with the subscript ‘t’ indicating total

S average sample standard deviation

Sj observed sample standard deviation of the jth subgroup

σ standard deviation, population

σˆ t estimated standard deviation, total

T target value

U upper specification limit

Xα % α % percentile

Xi ith value in a sample

X arithmetic mean value, sample

arithmetic mean, of a number of sample arithmetic means

X

2 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

ξ scale parameter in a Weibull distribution

Y1, Y2 values read from a graph

zα quantile of the standardized normal distribution from −∞ to α

2.2 Abbreviated terms

MSE mean square error

PCF process capability fraction

PCI process capability index

3 Basic concepts used for process capability and performance

3.1 General
The measures referred to in 4.2 to 4.6 refer only to measured data. They are unsuitable for count or
attributes data and information concerning the expression of measures for such data will be found in
ISO 22514-5.

3.2 Location
The characterization of location is the mean, μ, or the median, X50 % . Although for symmetric
distributions the mean is the most natural selection, with non-symmetric distributions the median is
the preferred selection.

3.3 Dispersion

3.3.1 Inherent dispersion

The preferred selection to quantify inherent dispersion is the standard deviation σ. This is often
estimated from the mean range value, R , taken from a range (R) chart or S from a standard deviation
(S) chart when the process is stable and in a state of statistical control as indicated in 4.1. Methods used
to estimate the process standard deviation are given in Annex A.

3.3.2 Total dispersion

It is necessary to differentiate between a standard deviation that measures only short-term variation
and that which measures longer-term variation. The total dispersion is the dispersion that is inherent in
the long-term variation. Methods of calculating the standard deviations representing these variations
are given in Annex A. Very often, when data are gathered over a long period of time, the standard
deviation is made larger by the effects of fluctuations in the process, σt .

3.3.3 Short-term dispersion

A process may have a short-term dispersion effect that is a part of the total dispersion. Figure 1
illustrates this. The short-term dispersion includes the inherent dispersion and can also include some
short-term instability effect.

© ISO 2016 – All rights reserved 3

ISO 22514-4:2016(E)

Key
1 short-term dispersion
2 overall dispersion

Figure 1 — Short-term dispersion and its relationship to the total dispersion

The total dispersion can be any shape and not necessarily normal as illustrated here.

3.4 Mean square error (MSE)

When minimizing variation, some practitioners use the mean square error as the preferred measure. It
is compatible with the methods used in off-line quality techniques.

3.5 Reference limits

The lower and upper reference limits are respectively defined as the 0,135 % and the 99,865 %
percentiles of the distribution that describe the output of the process characteristic. They are written
as X0,135 5 % and X99,865 % .

3.6 Reference interval (also known as process spread)

The reference interval is the interval between the upper and the lower reference limits. The reference
interval includes 99,73 % of the individuals in the population from a process that is in a state of
statistical control.

4 Capability

4.1 General
Process capability is a measure of inherent process variability. The variability that is inherent in a
process when operating in a state of statistical control is known as the inherent process variability. It
represents the variation that remains after all known removable assignable causes have been eliminated.
If the process is monitored using a control chart, the control chart will show an in control state.
Capability is often regarded as being related to the proportion of output that will occur within the
product specification tolerances. Since a process in statistical control should be described by a
predictable distribution, the proportion of out-of-specification outputs can be estimated. As long
as the process remains in statistical control, it will continue to produce the same proportion out-of-
specification.
Management actions to reduce the variation from random causes are required to improve the process’
ability to consistently meet the specification requirements.

4 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

In short, the following will be necessary:

— define the process and its operating conditions. If there is a change to those conditions, it will
necessitate a new process study;
— assess the short-term and long-term measurement variabilities as percentages of the total variability
and minimize them;
— preserve the process stability and maintain its statistical control;
— estimate the remaining inherent variation;
— select an appropriate measure of capability.
The following are the conditions that will apply for capability:
— all technical conditions, e.g. temperature and humidity, shall be clearly stated;
— the uncertainty of the measurement system shall be estimated and judged appropriate (see
ISO 22514-7);
— multi-factor, multi-level aspects of the process should be allowed;
— the duration over which the data has been gathered shall be recorded;
— the frequency of sampling and sample size shall be specified and the start and finish dates of data
collection;
— the process shall be controlled with a control chart;
— the process shall be in a state of statistical control.
It is necessary to check the control chart from which the data have been taken for statistical control
and to examine a histogram of the data with any specification limits superimposed upon it. A valid
test for normality should be used in assessing the data such as the Anderson-Darling test[15] or any
other suitable method. This test is powerful in detecting departures from normality in the tails of
the distribution and is suggested here as this is the region of interest for capability and performance
indices. Additionally, a normal probability plot can be used to look for the following:
a) verification of normality;
b) outliers;
c) data beyond any specification limit;
d) whether the data are well inside the specification limit(s);
e) evidence of asymmetry (i.e. skewness);
f) evidence of “long tails” in the data (i.e. kurtosis);
g) off-centre distribution;
h) any unusual patterns.
Explanations of anomalies should be sought in relation to these mentioned features and appropriate
action taken on the data prior to the calculation of any measure. It would be inappropriate to just discard
data that do not appear to fit any preconceived pattern. Such departures might be very revealing about
the process’ behaviour and should be thoroughly investigated.

© ISO 2016 – All rights reserved 5

ISO 22514-4:2016(E)

4.2 Process capability

4.2.1 Normal distribution

Process capability is defined as a statistical measure of inherent process variability for a given
characteristic. The conventional method is to take the reference interval that describes 99,73 % of the
individual values from a process that is in a state of statistical control with the 0,135 % remaining on
each side. This applies even if the population of individual values is not normally distributed. For a
normal distribution, this process interval is represented by six standard deviations (see Figure 2).

Y₁ Y₂

0,135 % 0,135 %

Key
a Reference interval 99,73 %.

Figure 2 — Normal distribution

On occasions, process capability is taken to account for extra sources of variation such as a multiple
stream process, for example, output from a multi-cavity injection moulding press. Under these
circumstances, the distribution of all values from all cavities could still be approximately normal,
but with extra variability so that the standard deviation shall represent the total variation, σt . It is
important to state how the standard deviation has been calculated, as well as the sampling strategy
used, sample size and the quantity and variability of output produced between samples as these will, in
practice, affect the validity of the capability assessment (see ISO 22514-2 for further information).
Data will usually be taken from a control chart. If the control chart had relaxed control lines or modified
control lines, the real process standard deviation will be larger than that estimated from data taken
from a control chart with standard control lines. Issues such as these and those given earlier will
influence the reference interval and it is important that they are stated in any capability assessment.
“Capable” processes will be those whose reference intervals are less than any specified tolerance by a
particular amount. An example of this is shown in Figure 3.

L U

Y₁ Y₂

Key
a Reference interval 99,73 %.

Figure 3 — Normal distribution with specification limits

6 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

4.2.2 Non-normal distribution

If the distribution of individual values does not form a normal distribution, but is skewed, then the
reference interval may appear as in Figure 4. The values Y1 and Y2, which will usually be the 0,135 %
and the 99,865 % percentiles, can be estimated using a suitable probability paper (see Figure 5 for
an example using an extreme value distribution probability paper) or by the use of suitable computer
software. They can also be computed using tabular values (see Annex B) or using the particular
probability function as suggested in Annex C.

Y₁ Y₂

a
0,135 % 0,135 %

Key
a Reference interval 99,73 %.

Figure 4 — Non-normal distribution

4.3 Process location

Even if a process can be deemed capable by the above definition (in 4.2.1), if the process distribution has
been poorly centred relative to the specification limits, out-of-specification items might be produced.
For this reason, it is necessary to assess the location in addition to the process interval.

© ISO 2016 – All rights reserved 7

ISO 22514-4:2016(E)

Key
best fit line

cumulative percent

Figure 5 — Example using an extreme value distribution probability paper

4.4 Process capability indices for measured data

4.4.1 General

It should be noted that when the capability indices given in this part of ISO 22514 are computed, they
only form point estimates of their true values. It is therefore recommended that wherever possible, the
indices’ confidence intervals are computed and reported. Methods by which these can be computed are
described in Annex D.
It is effective to express the capability of a process with the use of an index number. Several indices are
given. Care shall be taken when handling non-normal distributions.
The process capability indices are only established for a process that is statistically “in control”.
The process capability index often used is the ratio of a specified tolerance to the reference interval and
is known as Cp. Thus,
U−L
Cp = (1)
X 99,865 % − X 0,135 %

There are other indices that incorporate both the location and the variation. Of these, the most widely
used is the Cpk index. If the observed index is less than a specified value, the process is deemed
unacceptable and might lead to the shipment of a proportion of items outside of the specification or that
function and fit might be compromised.

8 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

The Cpk index is the ratio of the difference between a specified tolerance limit and the process location
to the difference between the corresponding natural process limit and the process location.

U − X 50 %
C pk = (2)
U X 99,865 % − X 50 %

and

X 50 % − L
C pk =
L X 50 % − X 0,135 %

The Cpk index is reported as the smaller value of these.

NOTE Some practitioners report both of the above values (that are also known as CPU and CPL, respectively).
This provides information about both sides of the process.

These indices will provide information about whether a process is poorly centred and whether it will
possibly produce out-of-specification items. Even if the Cp index is high, a low value of the Cpk index will
reveal a poorly centred process and a high probability of producing out-of-specification items.

4.4.2 Cp index (for the normal distribution)

If the individual values form a normal distribution and come from a statistically stable process, the
length of the reference interval is equal to 6σ, where σ is the inherent process standard deviation.
Therefore, the Cp index can be expressed as:
U−L
Cp =
6σ

An estimate ( σˆ ) of the inherent process standard deviation (σ ) is required to obtain an estimate of the
Cp index. When this has been obtained, usually with data from a control chart once the process is shown
to be statistically stable (see 4.1), the index is estimated:
U−L
Cˆp =
6σˆ

© ISO 2016 – All rights reserved 9

ISO 22514-4:2016(E)

4.4.3 Cpk index (for the normal distribution)

When the distribution of individual values forms a normal distribution, the median X50 % is equal to the
mean (μ). Further, X99,865 % − X50 % and X50 % − X0,135 % are each equal to 3σ. Therefore, the Cpk index
can be expressed as the minimum of:
U−µ
C pk =
U 3σ

or
µ−L
C pk =
L 3σ

The estimated Cpk , (using X to estimate μ instead of X 50 % ) will be the minimum of:

U−X
Cˆpk =
U 3σˆ

or

X −L
Cˆpk =
L 3σˆ

In computing a capability index, thought has to be given to the measure of the process variation used in
the denominator. Here, σ is given to represent the variation when the data comes from a process that is
in a state of statistical control.
The data might come from a multiple stream process such as a multi-headed filling machine or a
multi-spindle machine where the total output is treated together, where data from all streams are
simultaneously considered. The lower the index, the greater the proportion of items produced out-of-
specification.

4.4.4 Cpk index for unilateral tolerances

When there is only one specification limit given, it is only possible to calculate a Cpk index. The index
will be calculated using the appropriate limit, either an L or a U.

4.5 Process capability indices for measured data (non-normal)

4.5.1 General

If the distribution of individual values is non-normal, the expressions in Formulae (1) and (2) still
apply, but the estimation of the indices becomes more complicated. Three approaches to estimate the
reference limits are given.
The probability paper method described in 4.5.2 is fairly simple and requires little computation, but is
somewhat crude. The approach given in 4.5.4 is computationally more involved, but is superior to any
other method as far as accuracy is concerned.

10 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

4.5.2 Probability paper method

From graphs similar to that shown in Figure 4, estimates of the percentiles X0,135 % and X99,865 % can be
obtained. The estimates are denoted by Y1 and Y2, respectively, and Formula (1) becomes:
U−L
Cˆp =
Y2 − Y1

In a similar way, the Cpk formulae become:

U − X 50 %
Cˆpk =
U Y2 − X 50 %

or

X 50 % − L
Cˆpk =
L X 50 % − Y1

whichever gives the lower value.

If the observed index is less than a specified value, the process is deemed unacceptable and might lead
to the shipment of a proportion of items outside of the specification or that function and fit might be
compromised. The proportion nonconforming depends upon the distribution and the value of the index.
The link between the index and the proportion of nonconforming items produced depends on the class
of distributions. Care should be taken not to interpret indices on the basis of cut-off points that have
been derived for the normal distribution and, hence, are only applicable for that distribution.
Note that the probability paper method directly estimates fairly extreme percentiles and this can be
inaccurate.

4.5.3 Pearson curves method

As an alternative to using probability paper, standardized Pearson curves can be used. The method is
described by way of an example (see Annex B). The index is computed using:
U−L
Cˆp =
X 99,865 % − Xˆ 0,135 %
ˆ

where Xˆ 0,135 % and Xˆ 99,865 % are the 0,135 % and 99,865 % percentiles estimated from the standardized
Pearson curves.
Also, we have the formulae:

U − Xˆ50 %
Cˆpk =
U Xˆ 99,865 % − Xˆ50 %

or

Xˆ50 % − L
Cˆpk =
L Xˆ50 % − Xˆ 0,135 %

where Xˆ50 % is the estimated median.

In order to use this method, it is necessary to establish skewness and kurtosis values in addition to the
mean and standard deviation for the data set upon which the index is to be computed.
This method is not preferred, but is presented here for completeness due to its occasional use.

© ISO 2016 – All rights reserved 11

ISO 22514-4:2016(E)

This approach, and a similar one based on Johnson curves, should be regarded with considerable
caution, especially when it is a procedure within a “black box” computer program used to analyse large
sets of data. Some of the potential difficulties are as follows:
— within a system of distributions, some distributions are more difficult to fit than others. The method
of moments can yield unstable or inefficient curve parameters in some cases;
— unless the estimation technique is applied skilfully, it is possible to obtain fitted curves that are
meaningless over certain ranges of the data. For example, with the method of moments, an easily
made mistake is to fit a Pearson Type III distribution whose estimated threshold is less than the
lower bound for the process output, thereby, invalidating the estimates of X0,135 % and Cpk;
— the method of moments does not yield estimates of the variability in the estimated indices. Likewise,
these methods do not yield confidence intervals for the indices;
— not every data distribution can be described adequately with a Pearson or Johnson curve;
— goodness-of-fit tests are limited to the chi-squared test since more powerful tests are not generally
available for the Pearson and Johnson systems;
— the “black box” approach tends to displace basic practices, such as plotting the data and applying
simple normalizing transformations, that provide genuine understanding of the process.

4.5.4 Distribution identification method

Annex C describes certain families of distribution functions (such as the log-normal distribution,
the Rayleigh and the Weibull distributions) that are commonly found when investigating process
capability. The method is first to identify the appropriate family of distributions, secondly to estimate
the parameters of the distribution of the family that best explain the data by some efficient estimation
method and, finally, to express the quantiles in terms of the parameters of that distribution.
This is analogous to the procedure adopted in the case of the normal distribution where σ is estimated
and 6σ is represented by (X99,865 % − X0,135 %).
Various types of probability paper might be useful to identify the appropriate family of distributions.

4.6 Alternative method for describing and calculating process capability estimates
The bases for this method are the widely used definitions of Cp and Cpk for the “ideal process” with a
normally distributed characteristic, X, where the expectation, μ, and variance, σ2, are constant with
time and the corresponding estimates are X and S 2 .

Table 1 — Process capability indices and estimates for the normal distribution
Index Estimate
U−L U−L
Cp = Cˆp =
6σ 6S
U−µ ˆ U−X
C pk = C pk =
U 3σ U 3S
µ−L ˆ X −L
C pk = C pk =
L 3σ L 3S
C pk = min(C pk , C pk )
L U Cˆ = min(Cˆ
pk
ˆ
pk L , C pk U )

This “ideal process” implies that the long-term standard deviation is equal to the short-term standard
deviation.
For the normal distribution, there is an exact relation between the lower fraction nonconforming units
and C pk and between the upper fraction nonconforming and C pk . This relation is exploited in 4.8 to
L U

12 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

calculate the proportion out-of-specification from lower and upper process capability indices. The
relationship is displayed in Table 2 for easy reference.
When these measures of process capability have to be extended to characteristics that are not
normally distributed, the fraction nonconforming item can be transformed to a capability index using
the relationships in Table 2. This method can be applied in particular if the product characteristic is
qualitative.

Table 2 — Process capability indices and estimates for the normal distribution — Equivalent
formulae
Index Estimate

C pk + C pk Cˆpk + Cˆpk
Cˆp =
U L U L
Cp =
2 2
z1 z1
pU pˆU
C pk = Cˆpk =
U 3 U 3
z1 z1
pL pˆ L
C pk = Cˆpk =
L 3 L 3

where pU and pL are the fractions nonconforming at the upper and lower specification limits and p̂U , p̂ L
are the corresponding estimates. The formulae in the above table can be applied to any distribution.
It is assumed that the user has knowledge of the shape of the distribution because of what is known
about the manufacturing process or by some evaluation of a sample by an appropriate probability paper.
For those distributions that are frequently observed (normal, log-normal, Rayleigh and Weibull), the
required relations and formulae are given in Annex C.

4.7 Other capability measures for continuous data

4.7.1 Process capability fraction (PCF)

The PCF is the inverse of the Cp index:

6σ 1
=
U − L Cp

It can be expressed as a percentage value and occasionally named CR (%).

4.7.2 Indices when the specification limit is one-sided or no specification limit is given

4.7.2.1 General

Sometimes, a specification is given that has only one limit, e.g. a maximum value. In these circumstances,
it will only be possible to compute a Cpk or a Ppk index.
There will also be situations when specification limits are not given or not known. However, if a target
or nominal value is given for the product characteristic or process parameter, the following measures
might be appropriate. They present a special appeal to those engaged in minimizing process variation
around a target value.

© ISO 2016 – All rights reserved 13

ISO 22514-4:2016(E)

4.7.2.2 Mean square error (MSE)

The mean square error provides a measure that involves both location and variation. It is computed as
follows:

σ 2 + (µ − T )

In deriving this measure from data, it is necessary to provide estimates of the process standard
deviation and μ using sample data from a control chart.

4.7.2.3 Qk index

This index uses the mean square error given in 4.7.2.2, but expresses the whole value as a coefficient of
variation and is computed as follows:

100 σ 2 + ( µ − T )2
Qk = (%)
T

for T ¹ 0 .
An interesting property of this index is if the process drifts from its target, the index will increase in
value and if the process variation increases, it will also increase the value of the index. The smaller this
index becomes, the better the process is deemed to have performed.

4.7.2.4 Cpm index

The Cpm index, like the Qk index, incorporates the target value and the MSE into the calculation.
In its simplest form, the index is:
U−L
C pm =
6 σ 2 + ( µ − T )2
This calculation implies that T is the midpoint between U and L and so a refinement was later introduced
that allowed for a non-central T value:

∗ min(U − T , T − L)
C pm =
3 σ 2 + ( µ − T )2
Compared to the usual indices, Cp and Cpk , here only one index is needed to describe a situation.
The Cpm index is sometimes referred to as a Taguchi index because of the incorporation of the MSE in
the denominator.

14 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

4.8 Assessment of proportion out-of-specification (normal distribution)

The proportion of out-of-specification items (pL and pU) that fall below L and above U can be estimated
using properties of the standard normal distribution. Standardized deviates can be calculated as
follows:

z pˆ = 3Cˆpk
U U

and

z pˆ = 3Cˆpk
L L

p̂U and p̂ L are found as the proportions exceeding z p and z p , respectively, in a standard normal
U L
distribution.
Additionally, the process yield can be computed as 100 % minus the total percentage nonconforming in
the case of a controlled process.

If a characteristic, in statistical control and stable, has a C pk of 0,86 and a C pk of 0,91, the proportion
U L
of out-of-specification can be determined using the method given above as follows.
a) Calculate the “upper” standardized deviate.

z pˆ = 3Cˆpk
L L
= 3 × 0, 91
= 2, 73
b) Calculate the “lower” standardized deviate.

z pˆ = 3Cˆpk
U U
= 3 × 0, 86
= 2, 58
c) Using the standard normal distribution, look up or calculate the values p̂U and p̂ L for the
proportions of the distribution beyond the specification limits U and L, z p and z p , respectively.
U L

For convenience and ease of use, Table 3 gives look-up values for the estimated proportion out-of-
specification. Table 3 is indexed by C pk or C pk the process capability indices (PCI). Table 3 should
U L
not be used to derive Cp nor Cpk values for attributes data.

Using the above example of a C pk of 0,86 and a C pk of 0,91, the estimated proportion beyond the
U L
specification limits U and L can be read directly from Table 3 as 0,004 9 and 0,003 2.

Table 3 — C pk or C pk (PCI in the table) and proportion of the normal distribution remaining
U L
in the tails of the distribution beyond a specification limit
PCI 0,00 0,01 0,02 0,03 0,04 0,05 0,06 0,07 0,08 0,09
1,6 7,9 × 10−07 6,8 × 10−07 5,9 × 10−07 5,0 × 10−07 4,3 × 10−07 3,7 × 10−07 3,2 × 10−07 2,7 × 10−07 2,3 × 10−07 2,0 × 10−07
1,5 3,4 × 10−06 3,0 × 10−06 2,6 × 10−06 2,2 × 10−06 1,9 × 10−06 1,7 × 10−06 1,4 × 10−06 1,2 × 10−06 1,1 × 10−06 9,2 × 10−07
1,4 1,3 × 10−05 1,2 × 10−05 1,0 × 10−05 8,9 × 10−06 7,8 × 10−06 6,8 × 10−06 5,9 × 10−06 5,2 × 10−06 4,5 × 10−06 3,9 × 10−06
1,3 4,8 × 10−05 4,2 × 10−05 3,7 × 10−05 3,3 × 10−05 2,9 × 10−05 2,6 × 10−05 2,3 × 10−05 2,0 × 10−05 1,7 × 10−05 1,5 × 10−05
1,2 0,000 2 0,000 1 0,000 1 0,000 1 0,000 1 0,000 1 0,000 1 0,000 1 0,000 1 0,000 1
1,1 0,000 5 0,000 4 0,000 4 0,000 3 0,000 3 0,000 3 0,000 3 0,000 2 0,000 2 0,000 2

© ISO 2016 – All rights reserved 15

ISO 22514-4:2016(E)

Table 3 (continued)
PCI 0,00 0,01 0,02 0,03 0,04 0,05 0,06 0,07 0,08 0,09
1,0 0,001 3 0,001 2 0,001 1 0,001 0 0,000 9 0,000 8 0,000 7 0,000 7 0,000 6 0,000 5
0,9 0,003 5 0,003 2 0,002 9 0,002 6 0,002 4 0,002 2 0,002 0 0,001 8 0,001 6 0,001 5
0,8 0,008 2 0,007 5 0,006 9 0,006 4 0,005 9 0,005 4 0,004 9 0,004 5 0,004 1 0,003 8
0,7 0,017 9 0,016 6 0,015 4 0,014 3 0,013 2 0,012 2 0,011 3 0,010 4 0,009 6 0,008 9
0,6 0,035 9 0,033 6 0,031 4 0,029 4 0,027 4 0,025 6 0,023 9 0,022 2 0,020 7 0,019 2
0,5 0,066 8 0,063 0 0,059 4 0,055 9 0,052 6 0,049 5 0,046 5 0,043 6 0,040 9 0,038 4
0,4 0,115 1 0,109 3 0,103 8 0,098 5 0,093 4 0,088 5 0,083 8 0,079 3 0,074 9 0,070 8
0,3 0,184 1 0,176 2 0,168 5 0,161 1 0,153 9 0,146 9 0,140 1 0,133 5 0,127 1 0,121 0
0,2 0,274 3 0,264 3 0,254 6 0,245 1 0,235 8 0,226 6 0,217 7 0,209 0 0,200 5 0,192 2
0,1 0,382 1 0,370 7 0,359 4 0,348 3 0,337 2 0,326 4 0,315 6 0,305 0 0,294 6 0,284 3
0,0 0,500 0 0,488 0 0,476 1 0,464 1 0,452 2 0,440 4 0,428 6 0,416 8 0,405 2 0,393 6

5 Performance

5.1 General
Process performance for a characteristic is the achieved distribution of results. The single important
difference between performance and capability is that for performance, there is no requirement for
the process to be in statistical control or for the process to be controlled using a control chart. The
following are the conditions that will apply for performance:
— all technical conditions, e.g. temperature and humidity, shall be clearly stated;
— the uncertainty of the measurement system shall be estimated and judged appropriate (see
ISO 22514-7);
— multi-factor, multi-level aspects of the process should be allowed;
— the duration over which the data has been gathered shall be recorded;
— the frequency of sampling shall be specified and the start and finish dates of data collection;
— the process need not be controlled with a control chart;
— the process need not be in a state of statistical control, in particular, historical data where the
sequence is unknown can be used to evaluate process performance.
Indices are given below to express process performance. Their form is similar to those already given in
the clause on capability and the general relationships given in Formulae (1) and (2) for measured data
are used, except they are named Pp, Ppk and Ppk , respectively.
U L

16 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

5.2 Process performance indices for measured data (normal distribution)

5.2.1 Pp index

When the individual values form a normal distribution, the length of the reference interval is equal to
6σt where σt is the total standard deviation. Therefore, the Pp index can be expressed as:
U−L
Pp =
6σ t

An estimate, σˆ t , of the total standard deviation (σt) is required to obtain an estimate of the Pp index. In
practice, σˆ t will be the standard deviation (St) of all of the data. When this has been obtained, the index
is estimated.

5.2.2 Ppk index

When the distribution of individual values forms a normal distribution, the median X50 % is equal to the
mean (μ). Further, X99,865 % − X50 % and X50 % − X0,135 % are each equal to 3σt . Therefore, the Ppk index
is the smaller of the two values:
U−µ
Ppk =
U 3σ t

or
µ−L
Ppk =
L 3σ t

where the indices are estimated by:

U−X
Pˆpk =
U 3σˆt

or

X −L
Pˆpk =
L 3σˆt

A lower index means greater proportion of items produced out-of-specification.

5.3 Process performance indices for measured data (non-normal distribution)

5.3.1 General

The approaches adopted in this clause for non-normal data is the same as that given earlier in 4.5 for
capability indices.

© ISO 2016 – All rights reserved 17

ISO 22514-4:2016(E)

5.3.2 Probability paper method

From graphs similar to those given in Figure 5, estimates of the percentiles X0,135 % and X99,865 % can
be obtained. The estimates are denoted by Y1 and Y2, respectively, and the formula becomes:
U−L
Pˆp =
Y2 − Y1

In a similar way, the Ppk formulae become:

U − Xˆ50 %
Pˆpk =
U Y2 − Xˆ50 %

or

Xˆ50 % − L
Pˆpk =
L Xˆ50 % − Y1

whichever of them gives the least value.

If the index is less than a given value, the process is deemed to have produced an excessive proportion
of items outside of the specification. The proportion nonconforming depends upon the distribution and
the value of the index. The link between the index and the proportion of nonconforming items produced
depends on the class of distributions. Care should be taken not to interpret indices on the basis of cut-off
points that have derived for the normal distribution and, hence, are only applicable for that distribution.
The probability paper method directly estimates fairly extreme percentiles and that this can be
inaccurate. Additionally, the estimation method using probability paper, although very simple to use, is
nevertheless somewhat crude and computational procedures are preferred (see Annex C).

5.3.3 Pearson curves method

As an alternative to using probability paper, standardized Pearson curves are sometimes used. The
method is described by way of an example (see Annex B). The index is computed using:
U−L
Pˆp =
X 99,865 % − Xˆ 0,135 %
ˆ

where Xˆ 0,135 % and Xˆ 99,865 % are the estimated 0,135 % and 99,865 % percentiles from the standardized
Pearson curves.
Also, we have the formulae:

U − Xˆ50 %
Pˆpk =
U Xˆ 99,865 % − Xˆ50 %

and

Xˆ50 % − L
Pˆpk =
L Xˆ50 % − Xˆ 0,135 %

where Xˆ50 % is the estimated median value.

In order to use this method, the user will need to establish skewness and kurtosis values in addition to
the mean and standard deviation for the data set upon which the index is to be computed.

18 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

This method is not preferred, but is presented here due to its occasional use for completeness (see 4.5.3
for further comments about the use of this method).

5.3.4 Distribution identification method

See Annex C for a description of certain families of distribution functions such as the log-normal
distribution, the Rayleigh and the Weibull distributions that are commonly found when investigating
process performance. See also 4.5.4 for further comments about the method.

5.4 Other performance indices for measured data

All of the indices given earlier for capability will have counterparts when considering performance.
Any standard deviation will represent the total variation (σt) instead of the inherent variation (σ).

5.5 Assessment of proportion out-of-specification for a normal distribution of the total

distribution
The same method to estimate the proportion of out-of-specification is used here as in 4.8. The reader
should substitute Pˆpk and Pˆpk respectively for C pk and C pk . Table 3 can also be used to
U L U L

determine the proportion out-of-specification and the reader should enter the table with Pˆpk or
U

Pˆpk instead of C pk or C pk .
L U L

6 Reporting process capability and performance indices

If process capability (or performance) statistics are used for process qualification, they should be
reported in relation to this part of ISO 22514. The calculation method and the number of values used as
basis for the calculation shall be stated.
An example is given in Table 4.

Table 4 — Example of report of calculated process capability indices

Process capability (or performance) index Cp = 2,01
Minimum process capability (or performance) index Cpk = 1,90
Confidence interval 1,54 < Cpk < 2,26
Number of values used for the calculation 100
Measurement uncertainty 0,002 mm
Optional:
— frequency of sampling; 30 min.
— time and duration of data taking;
— distribution model; Normal
— technical conditions (batches, operation, tools).

Additionally, the study report shall contain the following information:

a) the place where the study was performed and the type of process the machine is part of;
b) the persons who performed the study and who took the measurements;
c) when the study was performed, including the date, times of start and finish, log of any interruptions;
d) any machine and process reference numbers;
e) the component’s name and reference number;

© ISO 2016 – All rights reserved 19

ISO 22514-4:2016(E)

f) the component characteristic(s) measured;

g) the specification for the characteristic(s) and what factors were held constant;
h) ambient conditions;
i) the raw data;
j) non-standard conditions.
For each characteristic measured, the following shall be reported (or provided):
— the distribution model estimated;
— the calculated indices.
The following should be reported (or provided):
— a control chart of the data;
— a tally chart or histogram of the data;
— a probability plot of the data;
— the mean value from the data;
— the standard deviation from the data;
— the estimated percentage out of specification;
— the calculated indices’ confidence intervals;
— the measurement uncertainty/measurement process capability.

20 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

Annex A
(informative)

Estimating standard deviations

A.1 General
It is necessary to estimate the standard deviation in order to calculate the indices referred to in this
part of ISO 22514. There are two types of standard deviation to consider. The first is what might be
described as the short-term standard deviation or instantaneous (inherent) standard deviation. It is
often calculated from statistics taken from a control chart and this is shown in A.2. The other is the
estimation of the total standard deviation and this is described in A.3.
If the process has more than one mode or state, the spread should be calculated by following the method
given in ISO 22514-2 or ISO 22514-8.

A.2 Inherent standard deviation

A.2.1 Estimation using the mean range value
The inherent (process) standard deviation (the data will be taken from an “in control” control chart)
can be estimated from a range control chart using:

R
σˆ =
d2

where d2 is a factor taken from Table A.1.

Table A.1 — Factors for the estimation of process standard deviation

Subgroup size (n) d2 c4
2 1,128 0,797 9
3 1,693 0,886 2
4 2,059 0,921 3
5 2,326 0,940 0
6 2,534 0,951 5
7 2,704 0,959 4
8 2,847 0,965 0
9 2,970 0,969 3
10a 3,078 0,972 7
a Values for d2 and c4 may be found in textbooks for sample sizes greater than 10.

© ISO 2016 – All rights reserved 21

ISO 22514-4:2016(E)

A.2.2 Estimation using the mean standard deviation value

If a standard deviation control chart has been used to monitor the within subgroup variation, the
inherent (process) standard deviation can be estimated using:

S
σˆ =
c4

where c4 is a control chart factor taken from Table A.1.

A.2.3 Estimation using subgroup standard deviations

If the within subgroup standard deviation is calculated for every subgroup, the inherent (process)
standard deviation can be estimated using:

m
∑ S j2
j 1
σˆ =
m

where there are m subgroups of n observations in each.

A.3 Estimation of total standard deviation

When data are generated from a process which is “out-of-control” or if no control chart has been used,
it is inappropriate to compute the standard deviation using the methods of A.2. The following formula
should be used instead:

N 2
∑(Xi − X )
i 1
σˆ t = S t =
N −1

The circumstances that lead to the use of this formula are when fluctuations exist in the process mean
caused by assignable causes that might not be removable and this extra variation is to be incorporated
with the remaining random cause variation. It is the appropriate measure of variation for use in
calculating the performance indices.
When considering multiple stream processes, such as a multiple cavity injection moulding press, it is
often desired to treat the data from all the cavities as if they came from a single process. The data
from each cavity might form a single normal distribution. However, the reality is often that each cavity
produces a slightly different distribution because either the means or the variabilities or both are
different. If the data from all of the process streams can be considered to yield a normal distribution,
the best estimate of the process variation will be given by this formula.

22 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

Annex B
(informative)

Estimating capability and performance measures using Pearson

curves — Procedure and example1)

B.1 Record specification limits

Upper limit, U = 0,30
Lower limit, L = 0,20

B.2 Record process statistics

The process is shown to be statistically “in control”.
Mean, x = 0,235
Standard deviation, σˆ = 0,012 2

Skewness, γˆ1 = 0,7 (rounding to one decimal place)

Kurtosis, βˆ2 = 3,5 (rounding to one decimal place)

B.3 Look up standardized 0,135 percentile

For positive skewness, use Table B.1. For negative skewness, use Table B.2.
0,135 percentile, P0,135 % = 3,056 by interpolation.

B.4 Look up standardized 99,865 percentile

For positive skewness, use Table B.2. For negative skewness, use Table B.1.
99,865 percentile, P99,865 % = 4,656 by interpolation.

B.5 Look up standardized median in Table B.3

For positive skewness, reverse the sign. For negative skewness, leave positive.
Standardized median, P50 % = −0,067 5 by interpolation.

B.6 Compute estimated 0,135 % percentile

Xˆ 0,135 % = x − σˆ P0,135 %
= 0, 235 − (0, 012 2 × 3, 056)
= 0, 197 7

1) Procedure based on that in Reference [10].

© ISO 2016 – All rights reserved 23

ISO 22514-4:2016(E)

B.7 Compute estimated 99,865 % percentile

X 99,865 % = x + σˆ P99,865 %
= 0, 235 + (0, 012 2 × 4, 656)
= 0, 291 8
B.8 Compute estimated median
Xˆ50 % = x + σˆ P50 %
= 0, 235 + (0, 012 2 × −0, 067 5)
= 0, 234 2
B.9 Compute process capability indices
U−L
Cˆp =
X 99,865 % − Xˆ 0,135 %
ˆ

0, 30 − 0, 20
=
0, 291 8 − 0, 197 7
= 1, 06
U − Xˆ50 %
Cˆpk =
U Xˆ 99,865 % − Xˆ50 %
0, 30 − 0, 234 2
=
0, 291 8 − 0, 234 2
= 1, 14
Xˆ50 % − L
Cˆpk =
L Xˆ50 % − Xˆ 0,135 %
0, 234 2 − 0, 20
=
0, 234 2 − 0, 197 7
= 0, 94

24 © ISO 2016 – All rights reserved

 Table B.1
PEARSON CURVES (STANDARDIZED TAILS)
P0,135 % (0,135 percentile) for γ 1 > 0. P99,865 % (99,865 percentile) for γ 1 < 0.
Kurtosis Skewness (γ 1)
(β2)
(β2) 0,0 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 1,5 1,6 1,7 1,8 1,9 2,0
1,512 1,421 1,317 1,206 1,092 0,979 0,868 0,762
1,727 1,619 1,496 1,364 1,230 1,100 0,975 0,858 0,747
−1,4 −1,4

1,966 1,840 1,696 1,541 1,384 1,232 1,089 0,957 0,836

© ISO 2016 – All rights reserved

−1,2 −1,2

2,210 2,072 1,912 1,736 1,555 1,377 1,212 1,062 0,927 0,804 0,692
−1,0 −1,0

2,442 2,298 2,129 1,941 1,740 1,539 1,348 1,175 1,023 0,887 0,766 0,656
−0,8 −0,8
−0,6 −0,6

2,653 2,506 2,335 2,141 1,930 1,711 1,496 1,299 1,125 0,974 0,841 0,723 0,616
2,839 2,692 2,522 2,329 2,116 1,887 1,655 1,434 1,235 1,065 0,919 0,791 0,677 0,574
−0,4 −0,4

0,0 3,000 2,856 2,689 2,500 2,289 2,059 1,817 1,578 1,356 1,163 1,000 0,861 0,739 0,630 0,531 0,0
−0,2 −0,2

0,2 3,140 2,986 2,834 2,653 2,447 2,220 1,976 1,726 1,485 1,269 1,086 0,933 0,801 0,686 0,583 0,2
0,4 3,261 3,088 2,952 2,785 2,589 2,368 2,127 1,873 1,619 1,382 1,178 1,008 0,865 0,742 0,634 0,536 0,4

0,6 3,366 3,164 3,045 2,896 2,714 2,502 2,267 2,015 1,754 1,502 1,277 1,087 0,931 0,799 0,685 0,583 0,489 0,6
0,8 3,458 3,222 3,118 2,986 2,821 2,622 2,396 2,148 1,887 1,625 1,381 1,172 1,000 0,857 0,736 0,629 0,533 0,8
1,0 3,539 3,266 3,174 3,058 2,910 2,727 2,512 2,271 2,013 1,748 1,491 1,262 1,072 0,917 0,787 0,675 0,575 0,484 1,0
1,2 3,611 3,300 3,218 3,115 2,983 2,817 2,616 2,385 2,132 1,876 1,602 1,357 1,149 0,979 0,840 0,721 0,617 0,524 1,2
1,4 3,674 3,327 3,254 3,161 3,043 2,893 2,708 2,488 2,243 1,981 1,713 1,456 1,230 1,045 0,894 0,768 0,659 0,562 0,475 1,4

1,6 3,731 3,349 3,282 3,199 3,092 2,957 2,787 2,581 2,345 2,089 1,821 1,556 1,316 1,113 0,950 0,815 0,701 0,600 0,510 1,6
1,8 3,782 3,367 3,306 3,229 3,133 3,011 2,855 2,664 2,438 2,189 1,925 1,664 1,404 1,185 1,008 0,863 0,743 0,638 0,546 0,461 1,8
2,0 3,828 3,382 3,325 3,255 3,167 3,055 2,914 2,736 2,524 2,283 2,023 1,755 1,494 1,261 1,068 0,913 0,785 0,676 0,580 0,494 2,0
2,2 3,870 3,395 3,342 3,277 3,196 3,093 2,964 2,800 2,600 2,369 2,116 1,850 1,584 1,339 1,132 0,964 0,828 0,714 0,615 0,526 0,445 2,2
2,4 3,908 3,405 3,356 3,295 3,220 3,126 3,006 2,855 2,669 2,448 2,202 1,940 1,673 1,420 1,198 1,018 0,873 0,752 0,649 0,557 0,475 2,4

2,6 3,943 3,415 3,367 3,311 3,241 3,153 3,043 2,904 2,730 2,521 2,283 2,026 1,760 1,501 1,267 1,073 0,918 0,791 0,683 0,589 0,504 2,6
2,8 3,975 3,423 3,378 3,324 3,259 3,177 3,075 2,946 2,784 2,586 2,358 2,107 1,844 1,581 1,338 1,131 0,965 0,830 0,717 0,620 0,533 2,8
ISO 22514-4:2016(E)

25
 Table B.1 (continued)

26
PEARSON CURVES (STANDARDIZED TAILS)
P0,135 % (0,135 percentile) for γ 1 > 0. P99,865 % (99,865 percentile) for γ 1 < 0.
Kurtosis Skewness (γ 1)
(β2)
(β2) 0,0 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 1,5 1,6 1,7 1,8 1,9 2,0
3,0 4,004 3,430 3,387 3,326 3,274 3,198 3,103 2,983 2,831 2,646 2,427 2,183 1,924 1,661 1,410 1,191 1,013 0,870 0,752 0,651 0,562 3,0
3,2 4,031 3,436 3,395 3,346 3,288 3,216 3,127 3,015 2,874 2,699 2,491 2,254 2,000 1,738 1,483 1,253 1,063 0,911 0,787 0,681 0,590 3,2
ISO 22514-4:2016(E)

3,4 4,056 3,441 3,402 3,356 3,300 3,233 3,149 3,043 2,911 2,747 2,549 2,321 2,072 1,813 1,555 1,317 1,115 0,953 0,822 0,712 0,618 3,4

3,6 4,079 3,446 3,408 3,364 3,311 3,247 3,168 3,069 2,945 2,790 2,602 2,383 2,140 1,884 1,626 1,381 1,169 0,996 0,858 0,744 0,646 3,6
3,8 4,101 3,450 3,414 3,371 3,321 3,259 3,184 3,091 2,974 2,829 2,651 2,440 2,205 1,953 1,695 1,446 1,224 1,041 0,895 0,775 0,674 3,8
4,0 4,121 3,454 3,419 3,378 3,329 3,271 3,200 3,111 3,001 2,864 2,695 2,494 2,265 2,018 1,762 1,510 1,281 1,088 0,932 0,807 0,702 4,0
4,2 4,140 3,458 3,423 3,384 3,337 3,281 3,213 3,129 3,025 2,895 2,735 2,543 2,321 2,080 1,827 1,574 1,338 1,135 0,971 0,839 0,730 4,2
4,4 4,157 3,461 3,428 3,389 3,344 3,290 3,225 3,145 3,047 2,923 2,771 2,588 2,374 2,138 1,889 1,636 1,396 1,184 1,011 0,872 0,758 4,4
v
4,6 4,174 3,464 3,431 3,394 3,350 3,299 3,236 3,160 3,066 2,949 2,805 2,629 2,424 2,194 1,948 1,697 1,453 1,234 1,052 0,905 0,786 4,6
4,8 4,189 3,466 3,435 3,399 3,356 3,306 3,246 3,173 3,084 2,972 2,835 2,668 2,470 2,246 2,005 1,756 1,510 1,285 1,094 0,939 0,815 4,8
5,0 4,204 3,469 3,438 3,403 3,362 3,313 3,256 3,186 3,100 2,994 2,863 2,703 2,513 2,296 2,059 1,813 1,566 1,336 1,137 0,975 0,844 5,0
5,2 4,218 3,471 3,441 3,406 3,367 3,320 3,264 3,197 3,114 3,013 2,888 2,735 2,562 2,342 2,111 1,867 1,621 1,387 1,181 1,010 0,874 5,2
5,4 4,231 3,473 3,444 3,410 3,371 3,326 3,272 3,207 3,128 3,031 2,911 2,765 2,589 2,386 2,160 1,920 1,675 1,438 1,225 1,047 0,904 5,4
5,6 4,243 3,475 3,446 3,413 3,375 3,331 3,279 3,216 3,140 3,047 2,933 2,793 2,624 2,427 2,206 1,970 1,727 1,489 1,270 1,085 0,935 5,6
5,8 4,255 3,477 3,448 3,416 3,379 3,336 3,286 3,225 3,152 3,062 2,952 2,818 2,656 2,465 2,250 2,019 1,778 1,539 1,316 1,123 0,966 5,8
6,0 4,266 3,478 3,451 3,419 3,383 3,341 3,292 3,233 3,162 3,076 2,970 2,841 2,685 2,501 2,292 2,065 1,827 1,588 1,361 1,162 0,999 6,0
6,2 4,276 3,480 3,453 3,422 3,386 3,345 3,297 3,240 3,172 3,089 2,987 2,863 2,713 2,535 2,332 2,109 1,874 1,635 1,407 1,202 1,031 6,2
6,4 4,286 3,481 3,454 3,424 3,389 3,349 3,303 3,247 3,181 3,100 3,003 2,883 2,739 2,567 2,369 2,151 1,919 1,682 1,452 1,242 1,065 6,4

6,6 4,296 3,483 3,456 3,426 3,392 3,353 3,308 3,254 3,189 3,111 3,017 2,902 2,763 2,597 2,405 2,191 1,962 1,727 1,496 1,282 1,099 6,6
6,8 4,305 3,484 3,458 3,429 3,395 3,357 3,312 3,260 3,197 3,122 3,030 2,919 2,785 2,624 2,438 2,229 2,004 1,771 1,540 1,323 1,134 6,8
7,0 4,313 3,485 3,459 3,431 3,398 3,360 3,316 3,265 3,204 3,131 3,043 2,936 2,806 2,651 2,469 2,265 2,044 1,814 1,583 1,363 1,169 7,0
7,2 4,322 3,486 3,461 3,432 3,400 3,363 3,321 3,270 3,211 3,140 3,054 2,951 2,825 2,675 2,499 2,300 2,083 1,855 1,625 1,403 1,204 7,2
7,4 4,330 3,487 3,462 3,434 3,403 3,366 3,324 3,275 3,218 3,148 3,065 2,965 2,843 2,698 2,527 2,333 2,120 1,895 1,666 1,443 1,240 7,4

© ISO 2016 – All rights reserved

 Table B.1 (continued)
PEARSON CURVES (STANDARDIZED TAILS)
P0,135 % (0,135 percentile) for γ 1 > 0. P99,865 % (99,865 percentile) for γ 1 < 0.
Kurtosis Skewness (γ 1)
(β2)
(β2) 0,0 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 1,5 1,6 1,7 1,8 1,9 2,0

7,6 4,337 3,488 3,464 3,436 3,405 3,369 3,328 3,280 3,224 3,156 3,075 2,978 2,860 2,720 2,554 2,364 2,155 1,933 1,706 1,482 1,276 7,6
7,8 4,344 3,489 3,465 3,437 3,407 3,372 3,331 3,284 3,229 3,164 3,085 2,990 2,876 2,740 2,579 2,394 2,189 1,970 1,744 1,521 1,311 7,8

© ISO 2016 – All rights reserved

8,0 4,351 3,490 3,466 3,439 3,409 3,374 3,335 3,289 3,235 3,171 3,094 3,002 2,891 2,759 2,603 2,422 2,221 2,005 1,782 1,559 1,347 8,0
8,2 4,358 3,491 3,467 3,440 3,411 3,377 3,338 3,292 3,240 3,177 3,103 3,013 2,906 2,777 2,625 2,449 2,252 2,040 1,818 1,596 1,382 8,2
8,4 4,365 3,492 3,468 3,442 3,412 3,379 3,340 3,296 3,244 3,183 3,111 3,023 2,919 2,794 2,646 2,475 2,282 2,073 1,854 1,632 1,418 8,4

8,6 4,371 3,492 3,469 3,443 3,414 3,381 3,343 3,300 3,249 3,189 3,118 3,033 2,932 2,810 2,666 2,499 2,310 2,104 1,888 1,667 1,452 8,6
8,8 4,377 3,493 3,470 3,444 3,416 3,383 3,346 3,303 3,253 3,195 3,125 3,042 2,943 2,825 2,685 2,522 2,337 2,135 1,921 1,702 1,486 8,8
9,0 4,382 3,494 3,471 3,445 3,417 3,385 3,348 3,306 3,257 3,200 3,132 3,051 2,955 2,839 2,703 2,544 2,363 2,164 1,953 1,736 1,520 9,0
9,2 4,388 3,495 3,472 3,447 3,418 3,387 3,351 3,309 3,261 3,205 3,138 3,059 2,965 2,853 2,720 2,565 2,388 2,192 1,984 1,768 1,553 9,2
9,4 4,393 3,495 3,473 3,448 3,420 3,388 3,353 3,312 3,265 3,209 3,144 3,067 2,975 2,866 2,736 2,585 2,411 2,219 2,014 1,800 1,586 9,4

9,6 4,398 3,496 3,473 3,449 3,421 3,390 3,355 3,315 3,268 3,214 3,150 3,075 2,985 2,878 2,752 2,604 2,434 2,245 2,042 1,831 1,617 9,6
9,8 4,403 3,496 4,474 3,450 3,422 3,392 3,357 3,317 3,272 3,218 3,156 3,082 2,994 2,890 2,766 2,622 2,456 2,271 2,070 1,861 1,648 9,8
10,0 4,408 3,497 3,475 3,451 3,424 3,393 3,359 3,320 3,275 3,222 3,161 3,088 3,003 2,901 2,780 2,639 2,476 2,295 2,097 1,890 1,679 10,0
10,2 3,425 3,395 3,361 3,322 3,278 3,226 3,166 3,095 3,011 2,911 2,793 2,655 2,496 2,318 2,123 1,918 1,708 10,2
10,4 3,396 3,363 3,325 3,281 3,230 3,171 3,101 3,019 2,921 2,806 2,671 2,515 2,340 2,148 1,945 1,737 10,4

10,6 3,364 3,327 3,283 3,233 3,175 3,107 3,026 2,930 2,818 2,686 2,533 2,361 2,172 1,972 1,765 10,6
10,8 3,329 3,286 3,237 3,179 3,112 3,033 2,940 2,829 2,700 2,551 2,382 2,196 1,998 1,793 10,8
11,0 3,289 3,240 3,184 3,118 3,040 2,948 2,840 2,714 2,567 2,401 2,218 2,023 1,819 11,0
11,2 3,243 3,188 3,123 3,046 2,956 2,851 2,727 2,583 2,420 2,240 2,047 1,845 11,2
11,4 3,191 3,128 3,053 2,964 2,861 2,739 2,598 2,438 2,261 2,070 1,870 11,4

11,6 3,195 3,132 3,058 2,972 2,870 2,751 2,613 2,456 2,281 2,093 1,895 11,6
ISO 22514-4:2016(E)

27
 Table B.1 (continued)

28
PEARSON CURVES (STANDARDIZED TAILS)
P0,135 % (0,135 percentile) for γ 1 > 0. P99,865 % (99,865 percentile) for γ 1 < 0.
Kurtosis Skewness (γ 1)
(β2)
(β2) 0,0 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 1,5 1,6 1,7 1,8 1,9 2,0
11,8 3,137 3,064 2,979 2,879 2,762 2,627 2,473 2,301 2,115 1,919 11,8
12,0 3,141 3,070 2,986 2,888 2,773 2,641 2,489 2,320 2,136 1,942 12,0
ISO 22514-4:2016(E)

12,2 3,075 2,993 2,896 2,784 2,653 2,505 2,338 2,157 1,965 12,2

© ISO 2016 – All rights reserved

 Table B.2
PEARSON CURVES (STANDARDIZED TAILS)
P99,865 % (99,865 percentile) for γ 1 > 0.P0,135 % (0,135 percentile) for γ 1 < 0.
Kurtosis Skewness (γ 1)
(β2)
(β2) 0,0 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 1,5 1,6 1,7 1,8 1,9 2,0
1,512 1,584 1,632 1,655 1,653 1,626 1,579 1,516
1,727 1,813 1,871 1,899 1,895 1,861 1,803 1,726 1,636
−1,4 −1,4

1,966 2,065 2,134 2,170 2,169 2,131 2,061 1,966 1,856

© ISO 2016 – All rights reserved

−1,2 −1,2

2,210 2,320 2,400 2,446 2,454 2,422 2,349 2,241 2,108 1,965 1,822
−1,0 −1,0

2,442 2,560 2,648 2,704 2,726 2,708 2,646 2,540 2,395 2,225 2,052 1,885
−0,8 −0,8
−0,6 −0,6

2,653 2,774 2,869 2,934 2,969 2,968 2,926 2,837 2,699 2,518 2,314 2,114 1,928
2,839 2,961 3,060 3,133 3,179 3,194 3,173 3,109 2,993 2,824 2,608 2,373 2,152 1,952
−0,4 −0,4

0,0 3,000 3,123 3,224 3,303 3,358 3,387 3,385 3,345 3,259 3,116 2,914 2,665 2,405 2,169 1,960 0,0
−0,2 −0,2

0,2 3,140 3,261 3,364 3,447 3,510 3,550 3,564 3,546 3,488 3,378 3,206 2,970 2,690 2,412 2,167 0,2
0,4 3,261 3,381 3,484 3,570 3,639 3,688 3,715 3,715 3,681 3,603 3,468 3,264 2,993 2,687 2,398 2,149 0,4

0,6 3,366 3,485 3,588 3,676 3,749 3,805 3,843 3,858 3,844 3,793 3,693 3,529 3,290 2,984 2,658 2,366 2,119 0,6
0,8 3,458 3,575 3,678 3,768 3,844 3,905 3,951 3,978 3,981 3,953 3,883 3,758 3,561 3,283 2,945 2,609 2,322 0,8
1,0 3,539 3,654 3,757 3,847 3,926 3,991 4,044 4,080 4,096 4,087 4,043 3,952 3,797 3,561 3,243 2,881 2,547 2,269 1,0
1,2 3,611 3,724 3,826 3,917 3,997 4,066 4,124 4,167 4,194 4,208 4,177 4,115 3,998 3,808 3,529 3,172 2,798 2,476 1,2
1,4 3,674 3,786 3,887 3,978 4,060 4,131 4,193 4,243 4,278 4,296 4,290 4,252 4,168 4,020 3,789 3,463 3,075 2,705 2,399 1,4

1,6 3,731 3,842 3,942 4,033 4,115 4,189 4,253 4,308 4,351 4,378 4,386 4,367 4,311 4,200 4,015 3,736 3,364 2,961 2,609 1,6
1,8 3,782 3,891 3,990 4,081 4,164 4,239 4,307 4,365 4,414 4,449 4,468 4,472 4,431 4,352 4,209 3,979 3,646 3,238 2,840 2,511 1,8
2,0 3,828 3,936 4,034 4,125 4,208 4,285 4,354 4,416 4,468 4,511 4,539 4,549 4,532 4,479 4,372 4,189 3,907 3,522 3,095 2,719 2,0
2,2 3,870 3,976 4,073 4,164 4,248 4,325 4,396 4,460 4,517 4,564 4,600 4,620 4,619 4,587 4,510 4,369 4,137 3,796 3,370 2,949 2,603 2,2
2,4 3,908 4,013 4,109 4,199 4,283 4,361 4,433 4,500 4,559 4,611 4,653 4,682 4,693 4,678 4,627 4,521 4,336 4,047 3,648 3,201 2,808 2,4

2,6 3,943 4,046 4,142 4,231 4,315 4,394 4,467 4,535 4,597 4,653 4,700 4,736 4,757 4,756 4,725 4,649 4,506 4,269 3,916 3,471 3,033 2,6
2,8 3,975 4,077 4,172 4,261 4,344 4,423 4,498 4,567 4,631 4,690 4,741 4,783 4,812 4,824 4,809 4,758 4,650 4,460 4,160 3,745 3,280 2,8
ISO 22514-4:2016(E)

29
 Table B.2 (continued)

30
PEARSON CURVES (STANDARDIZED TAILS)
P99,865 % (99,865 percentile) for γ 1 > 0.P0,135 % (0,135 percentile) for γ 1 < 0.
Kurtosis Skewness (γ 1)
(β2)
(β2) 0,0 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 1,5 1,6 1,7 1,8 1,9 2,0
3,0 4,004 4,105 4,199 4,287 4,371 4,450 4,525 4,596 4,662 4,723 4,777 4,824 4,860 4,882 4,881 4,850 4,771 4,623 4,376 4,007 3,544 3,0
3,2 4,031 4,131 4,224 4,312 4,396 4,475 4,550 4,622 4,689 4,752 4,810 4,861 4,903 4,932 4,944 4,929 4,875 4,762 4,563 4,247 3,813 3,2
ISO 22514-4:2016(E)

3,4 4,056 4,155 4,247 4,335 4,418 4,498 4,573 4,645 4,714 4,779 4,839 4,893 4,940 4,976 4,997 4,996 4,963 4,880 4,723 4,461 4,072 3,4

3,6 4,079 4,177 4,269 4,356 4,439 4,518 4,594 4,667 4,737 4,803 4,865 4,922 4,973 5,015 5,044 5,055 5,038 4,980 4,859 4,647 4,311 3,6
3,8 4,101 4,197 4,288 4,375 4,458 4,537 4,614 4,687 4,757 4,825 4,888 4,948 5,002 5,049 5,085 5,106 5,103 5,066 4,976 4,806 4,524 3,8
4,0 4,121 4,217 4,307 4,393 4,476 4,555 4,631 4,705 4,776 4,845 4,910 4,972 5,029 5,080 5,122 5,150 5,159 5,139 5,075 4,943 4,712 4,0
4,2 4,140 4,234 4,324 4,410 4,492 4,571 4,648 4,722 4,794 4,863 4,929 4,993 5,052 5,107 5,153 5,189 5,208 5,202 5,159 5,059 4,873 4,2
4,4 4,157 4,251 4,340 4,425 4,508 4,587 4,663 4,737 4,809 4,879 4,947 5,012 5,074 5,131 5,181 5,223 5,250 5,257 5,232 5,159 5,012 4,4

4,6 4,174 4,267 4,355 4,440 4,522 4,601 4,677 4,752 4,824 4,895 4,963 5,029 5,093 5,152 5,207 5,253 5,288 5,305 5,295 5,244 5,131 4,6
4,8 4,189 4,281 4,369 4,454 4,535 4,614 4,691 4,765 4,838 4,909 4,978 5,045 5,110 5,172 5,229 5,280 5,321 5,346 5,349 5,318 5,233 4,8
5,0 4,204 4,295 4,383 4,467 4,548 4,627 4,703 4,778 4,851 4,922 4,992 5,060 5,126 5,190 5,249 5,303 5,350 5,383 5,396 5,381 5,320 5,0
5,2 4,218 4,308 4,395 4,479 4,560 4,638 4,715 4,789 4,862 4,934 5,004 5,073 5,141 5,206 5,267 5,325 5,376 5,415 5,437 5,436 5,395 5,2
5,4 4,231 4,321 4,407 4,490 4,571 4,649 4,725 4,800 4,873 4,945 5,016 5,086 5,154 5,220 5,284 5,344 5,399 5,443 5,474 5,483 5,460 5,4
5,6 4,243 4,332 4,418 4,501 4,581 4,659 4,736 4,810 4,884 4,956 5,027 5,097 5,166 5,233 5,299 5,361 5,418 5,468 5,505 5,525 5,516 5,6
5,8 4,255 4,343 4,429 4,511 4,591 4,669 4,745 4,820 4,893 4,966 5,037 5,108 5,177 5,246 5,312 5,376 5,436 5,491 5,533 5,561 5,565 5,8
6,0 4,266 4,354 4,439 4,521 4,600 4,678 4,754 4,829 4,902 4,975 5,046 5,117 5,188 5,257 5,325 5,390 5,452 5,511 5,558 5,593 5,608 6,0
6,2 4,276 4,364 4,448 4,530 4,609 4,695 4,763 4,837 4,911 4,983 5,055 5,126 5,197 5,267 5,336 5,403 5,467 5,529 5,581 5,621 5,645 6,2
6,4 4,286 4,373 4,457 4,538 4,618 4,703 4,771 4,845 4,919 4,991 5,063 5,135 5,206 5,276 5,346 5,414 5,480 5,542 5,600 5,646 5,678 6,4

6,6 4,296 4,382 4,466 4,547 4,626 4,710 4,778 4,853 4,926 4,999 5,071 5,143 5,214 5,285 5,356 5,425 5,492 5,557 5,618 5,669 5,706 6,6
6,8 4,305 4,391 4,474 4,554 4,633 4,717 4,785 4,860 4,933 5,006 5,078 5,150 5,222 5,293 5,364 5,434 5,503 5,569 5,634 5,688 5,732 6,8
7,0 4,313 4,399 4,481 4,562 4,640 4,724 4,792 4,867 4,940 5,013 5,085 5,157 5,229 5,301 5,372 5,443 5,513 5,581 5,648 5,706 5,754 7,0
7,2 4,322 4,406 4,489 4,569 4,647 4,730 4,799 4,873 4,946 5,019 5,091 5,164 5,236 5,308 5,380 5,451 5,522 5,591 5,658 5,722 5,775 7,2
7,4 4,330 4,414 4,496 4,576 4,654 4,736 4,805 4,879 4,952 5,025 5,097 5,170 5,242 5,314 5,387 5,459 5,530 5,601 5,669 5,736 5,792 7,4

© ISO 2016 – All rights reserved

 Table B.2 (continued)
PEARSON CURVES (STANDARDIZED TAILS)
P99,865 % (99,865 percentile) for γ 1 > 0.P0,135 % (0,135 percentile) for γ 1 < 0.
Kurtosis Skewness (γ 1)
(β2)
(β2) 0,0 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 1,5 1,6 1,7 1,8 1,9 2,0

7,6 4,337 4,421 4,503 4,582 4,660 4,742 4,811 4,885 4,958 5,031 5,103 5,175 5,248 5,320 5,393 5,466 5,538 5,609 5,679 5,749 5,808 7,6
7,8 4,344 4,428 4,509 4,588 4,666 4,747 4,817 4,890 4,963 5,036 5,109 5,181 5,253 5,326 5,399 5,472 5,545 5,617 5,688 5,760 5,823 7,8

© ISO 2016 – All rights reserved

8,0 4,351 4,434 4,515 4,594 4,672 4,753 4,822 4,896 4,969 5,041 5,114 5,186 5,259 5,331 5,404 5,478 5,551 5,624 5,696 5,771 5,836 8,0
8,2 4,358 4,441 4,521 4,600 4,677 4,758 4,827 4,901 4,974 5,046 5,118 5,191 5,263 5,336 5,410 5,483 5,557 5,631 5,704 5,775 5,847 8,2
8,4 4,365 4,447 4,527 4,605 4,682 4,762 4,832 4,905 4,978 5,051 5,123 5,195 5,268 5,341 5,414 5,488 5,562 5,637 5,710 5,783 5,858 8,4

8,6 4,371 4,452 4,532 4,611 4,687 4,767 4,837 4,910 4,983 5,055 5,127 5,200 5,272 5,345 5,419 5,493 5,567 5,642 5,717 5,790 5,867 8,6
8,8 4,377 4,458 4,538 4,616 4,692 4,772 4,841 4,914 4,987 5,059 5,132 5,204 5,276 5,349 5,423 5,497 5,572 5,647 5,722 5,797 5,875 8,8
9,0 4,382 4,463 4,543 4,621 4,697 4,776 4,845 4,918 4,991 5,063 5,135 5,208 5,280 5,353 5,427 5,501 5,576 5,652 5,727 5,803 5,883 9,0
9,2 4,388 4,468 4,548 4,625 4,701 4,780 4,850 4,923 4,995 5,067 5,139 5,211 5,284 5,357 5,431 5,505 5,580 5,656 5,732 5,808 5,883 9,2
9,4 4,393 4,473 4,552 4,630 4,705 4,784 4,854 4,926 4,999 5,071 5,143 5,215 5,287 5,361 5,434 5,509 5,584 5,660 5,736 5,813 5,889 9,4

9,6 4,398 4,478 4,557 4,634 4,710 4,788 4,857 4,930 5,002 5,074 5,146 5,218 5,291 5,364 5,437 5,512 5,587 5,663 5,740 5,817 5,894 9,6
9,8 4,403 4,483 4,561 4,638 4,714 4,791 4,861 4,934 5,006 5,078 5,149 5,222 5,294 5,367 5,440 5,515 5,590 5,667 5,744 5,821 5,898 9,8
10,0 4,408 4,487 4,565 4,642 4,717 4,795 4,865 4,937 5,009 5,081 5,153 5,225 5,297 5,370 5,443 5,518 5,593 5,670 5,747 5,825 5,903 10,0
10,2 4,721 4,798 4,868 4,940 5,012 5,084 5,156 5,228 5,300 5,373 5,446 5,521 5,596 5,673 5,750 5,828 5,906 10,2
10,4 4,871 4,943 5,015 5,087 5,158 5,230 5,303 5,375 5,449 5,523 5,599 5,675 5,753 5,831 5,910 10,4

10,6 4,874 4,947 5,018 5,090 5,161 5,233 5,305 5,378 5,451 5,526 5,601 5,678 5,755 5,834 5,913 10,6
10,8 4,949 5,021 5,092 5,164 5,236 5,308 5,380 5,454 5,528 5,603 5,680 5,757 5,836 5,915 10,8
11,0 5,024 5,095 5,166 5,238 5,310 5,383 5,456 5,530 5,605 5,682 5,760 5,838 5,918 11,0
11,2 5,098 5,169 5,240 5,312 5,385 5,458 5,532 5,607 5,684 5,762 5,840 5,920 11,2
11,4 5,171 5,243 5,314 5,387 5,460 5,534 5,609 5,686 5,763 5,842 5,922 11,4

11,6 5,173 5,245 5,316 5,389 5,462 5,536 5,611 5,687 5,765 5,844 5,924 11,6
ISO 22514-4:2016(E)

31
 Table B.2 (continued)

32
PEARSON CURVES (STANDARDIZED TAILS)
P99,865 % (99,865 percentile) for γ 1 > 0.P0,135 % (0,135 percentile) for γ 1 < 0.
Kurtosis Skewness (γ 1)
(β2)
(β2) 0,0 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 1,5 1,6 1,7 1,8 1,9 2,0
11,8 5,247 5,318 5,391 5,464 5,538 5,613 5,689 5,767 5,845 5,925 11,8
12,0 5,249 5,320 5,393 5,465 5,539 5,614 5,690 5,768 5,847 5,927 12,0
ISO 22514-4:2016(E)

12,2 5,322 5,394 5,467 5,541 5,616 5,692 5,769 5,848 5,928 12,2

© ISO 2016 – All rights reserved

 Table B.3
PEARSON CURVES (STANDARDIZED MEDIAN)
P50 % (50 percentile). Change sign for γ 1 > 0.
Kurtosis Skewness (γ 1)
(β2)
(β2) 0,0 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 1,5 1,6 1,7 1,8 1,9 2,0
0,000 0,053 0,111 0,184 0,282 0,424 0,627 0,754
0,000 0,039 0,082 0,132 0,196 0,284 0,412 0,591 0,727
−1,4 −1,4

0,000 0,031 0,065 0,103 0,151 0,212 0,297 0,419 0,586

© ISO 2016 – All rights reserved

−1,2 −1,2

0,000 0,026 0,054 0,085 0,123 0,169 0,231 0,317 0,439 0,598 0,681
−1,0 −1,0

0,000 0,023 0,047 0,073 0,104 0,142 0,190 0,254 0,343 0,468 0,616 0,653
−0,8 −0,8
−0,6 −0,6

0,000 0,020 0,041 0,064 0,091 0,122 0,161 0,212 0,280 0,375 0,504 0,633 0,616
0,000 0,018 0,037 0,058 0,081 0,108 0,141 0,183 0,237 0,311 0,413 0,542 0,638 0,574
−0,4 −0,4

0,0 0,000 0,017 0,034 0,053 0,073 0,097 0,126 0,161 0,206 0,266 0,347 0,456 0,579 0,621 0,531 0,0
−0,2 −0,2

0,2 0,000 0,015 0,032 0,049 0,068 0,089 0,114 0,145 0,183 0,233 0,299 0,388 0,501 0,605 0,582 0,2
0,4 0,000 0,014 0,029 0,045 0,063 0,082 0,105 0,132 0,165 0,208 0,263 0,336 0,433 0,545 0,607 0,536 0,4

0,6 0,000 0,013 0,028 0,043 0,059 0,077 0,097 0,122 0,151 0,188 0,235 0,297 0,379 0,481 0,579 0,579 0,489 0,6
0,8 0,000 0,013 0,026 0,040 0,055 0,072 0,091 0,113 0,140 0,172 0,213 0,266 0,336 0,425 0,527 0,590 0,533 0,8
1,0 0,000 0,012 0,025 0,038 0,053 0,068 0,086 0,106 0,130 0,159 0,196 0,242 0,301 0,379 0,474 0,563 0,569 0,484 1,0
1,2 0,000 0,011 0,024 0,036 0,050 0,065 0,082 0,100 0,122 0,148 0,181 0,222 0,274 0,341 0,426 0,520 0,576 0,524 1,2
1,4 0,000 0,011 0,023 0,035 0,048 0,062 0,078 0,095 0,116 0,140 0,169 0,206 0,252 0,310 0,385 0,474 0,554 0,555 0,475 1,4

1,6 0,000 0,010 0,022 0,034 0,046 0,060 0,074 0,091 0,110 0,132 0,159 0,192 0,233 0,285 0,351 0,432 0,518 0,564 0,510 1,6
1,8 0,000 0,010 0,021 0,032 0,044 0,057 0,072 0,087 0,105 0,126 0,151 0,180 0,217 0,264 0,323 0,396 0,480 0,549 0,540 0,461 1,8
2,0 0,000 0,009 0,020 0,031 0,043 0,055 0,069 0,084 0,101 0,120 0,143 0,171 0,204 0,246 0,299 0,365 0,443 0,521 0,552 0,494 2,0
2,2 0,000 0,009 0,020 0,030 0,042 0,054 0,067 0,081 0,097 0,115 0,137 0,162 0,193 0,231 0,279 0,338 0,410 0,488 0,544 0,522 0,445 2,2
2,4 0,000 0,009 0,019 0,029 0,040 0,052 0,065 0,078 0,094 0,111 0,131 0,155 0,183 0,218 0,261 0,315 0,381 0,456 0,524 0,538 0,475 2,4

2,6 0,000 0,008 0,018 0,029 0,039 0,051 0,063 0,076 0,091 0,107 0,126 0,148 0,175 0,207 0,246 0,295 0,355 0,426 0,498 0,539 0,503 2,6
2,8 0,000 0,008 0,018 0,028 0,038 0,049 0,061 0,074 0,088 0,104 0,122 0,143 0,167 0,197 0,233 0,278 0,333 0,398 0,470 0,526 0,522 2,8
ISO 22514-4:2016(E)

33
 Table B.3 (continued)

34
PEARSON CURVES (STANDARDIZED MEDIAN)
P50 % (50 percentile). Change sign for γ 1 > 0.
Kurtosis Skewness (γ 1)
(β2)
(β2) 0,0 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 1,5 1,6 1,7 1,8 1,9 2,0
3,0 0,000 0,008 0,017 0,027 0,037 0,048 0,059 0,072 0,085 0,101 0,118 0,138 0,161 0,189 0,222 0,263 0,313 0,374 0,443 0,506 0,530 3,0
3,2 0,000 0,008 0,017 0,027 0,037 0,047 0,058 0,070 0,083 0,098 0,114 0,133 0,155 0,181 0,212 0,250 0,296 0,352 0,417 0,483 0,525 3,2
ISO 22514-4:2016(E)

3,4 0,000 0,008 0,017 0,026 0,036 0,046 0,057 0,068 0,081 0,095 0,111 0,129 0,150 0,174 0,203 0,239 0,281 0,333 0,394 0,460 0,513 3,4

3,6 0,000 0,007 0,016 0,025 0,035 0,045 0,056 0,067 0,079 0,093 0,108 0,125 0,145 0,168 0,196 0,228 0,268 0,316 0,373 0,437 0,495 3,6
3,8 0,000 0,007 0,016 0,025 0,034 0,044 0,054 0,066 0,078 0,091 0,105 0,122 0,141 0,163 0,188 0,219 0,256 0,301 0,354 0,415 0,475 3,8
4,0 0,000 0,007 0,015 0,025 0,034 0,043 0,053 0,064 0,076 0,089 0,103 0,119 0,137 0,158 0,182 0,211 0,246 0,288 0,337 0,395 0,455 4,0
4,2 0,000 0,007 0,015 0,024 0,033 0,043 0,053 0,063 0,075 0,087 0,101 0,116 0,133 0,153 0,176 0,204 0,236 0,276 0,322 0,376 0,435 4,2
4,4 0,000 0,007 0,015 0,024 0,033 0,042 0,052 0,062 0,073 0,085 0,099 0,113 0,130 0,149 0,171 0,197 0,228 0,265 0,308 0,359 0,416 4,4

4,6 0,000 0,007 0,015 0,023 0,032 0,041 0,051 0,061 0,072 0,084 0,097 0,111 0,127 0,145 0,167 0,191 0,220 0,255 0,296 0,344 0,399 4,6
4,8 0,000 0,006 0,015 0,023 0,032 0,041 0,050 0,060 0,071 0,082 0,095 0,109 0,124 0,142 0,162 0,186 0,213 0,246 0,285 0,330 0,382 4,8
5,0 0,000 0,006 0,014 0,023 0,031 0,040 0,049 0,059 0,070 0,081 0,093 0,107 0,122 0,139 0,158 0,181 0,207 0,238 0,274 0,317 0,367 5,0
5,2 0,000 0,006 0,014 0,022 0,031 0,040 0,049 0,058 0,069 0,080 0,092 0,105 0,119 0,136 0,155 0,176 0,201 0,231 0,265 0,306 0,353 5,2
5,4 0,000 0,006 0,014 0,022 0,030 0,039 0,048 0,057 0,068 0,078 0,090 0,103 0,117 0,133 0,151 0,172 0,196 0,224 0,257 0,295 0,340 5,4
5,6 0,000 0,006 0,014 0,022 0,030 0,039 0,047 0,057 0,067 0,077 0,089 0,101 0,115 0,131 0,148 0,168 0,191 0,218 0,249 0,285 0,328 5,6
5,8 0,000 0,006 0,014 0,022 0,030 0,038 0,047 0,056 0,066 0,076 0,087 0,100 0,113 0,128 0,145 0,164 0,186 0,212 0,242 0,277 0,317 5,8
6,0 0,000 0,006 0,014 0,021 0,029 0,038 0,046 0,055 0,065 0,075 0,086 0,098 0,111 0,126 0,142 0,161 0,182 0,207 0,235 0,268 0,307 6,0
6,2 0,000 0,006 0,013 0,021 0,029 0,037 0,046 0,055 0,064 0,074 0,085 0,097 0,110 0,124 0,140 0,158 0,178 0,202 0,229 0,261 0,298 6,2
6,4 0,000 0,006 0,013 0,021 0,029 0,037 0,045 0,054 0,063 0,073 0,084 0,096 0,108 0,122 0,137 0,155 0,175 0,197 0,223 0,254 0,289 6,4

6,6 0,000 0,006 0,013 0,021 0,028 0,037 0,045 0,054 0,063 0,073 0,083 0,094 0,107 0,120 0,135 0,152 0,171 0,193 0,218 0,247 0,281 6,6
6,8 0,000 0,006 0,013 0,021 0,028 0,036 0,044 0,053 0,062 0,072 0,082 0,093 0,105 0,118 0,133 0,150 0,168 0,189 0,213 0,241 0,273 6,8
7,0 0,000 0,005 0,013 0,020 0,028 0,036 0,044 0,053 0,061 0,071 0,081 0,092 0,104 0,117 0,131 0,147 0,165 0,185 0,209 0,236 0,267 7,0
7,2 0,000 0,005 0,013 0,020 0,028 0,036 0,044 0,052 0,061 0,070 0,080 0,091 0,103 0,115 0,129 0,145 0,162 0,182 0,205 0,230 0,260 7,2
7,4 0,000 0,005 0,013 0,020 0,027 0,035 0,043 0,052 0,060 0,070 0,079 0,090 0,101 0,114 0,128 0,143 0,160 0,179 0,201 0,226 0,254 7,4

© ISO 2016 – All rights reserved

 Table B.3 (continued)
PEARSON CURVES (STANDARDIZED MEDIAN)
P50 % (50 percentile). Change sign for γ 1 > 0.
Kurtosis Skewness (γ 1)
(β2)
(β2) 0,0 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 1,5 1,6 1,7 1,8 1,9 2,0

7,6 0,000 0,005 0,012 0,020 0,027 0,035 0,043 0,051 0,060 0,069 0,079 0,089 0,100 0,113 0,126 0,141 0,157 0,176 0,197 0,221 0,249 7,6
7,8 0,000 0,005 0,012 0,020 0,027 0,035 0,043 0,051 0,059 0,068 0,078 0,088 0,099 0,111 0,124 0,139 0,155 0,173 0,193 0,217 0,243 7,8

© ISO 2016 – All rights reserved

8,0 0,000 0,005 0,012 0,019 0,027 0,034 0,042 0,050 0,059 0,068 0,077 0,087 0,098 0,110 0,123 0,137 0,153 0,170 0,190 0,213 0,238 8,0
8,2 0,000 0,005 0,012 0,019 0,027 0,034 0,042 0,050 0,058 0,067 0,076 0,086 0,097 0,109 0,121 0,135 0,151 0,168 0,187 0,209 0,234 8,2
8,4 0,000 0,005 0,012 0,019 0,026 0,034 0,042 0,050 0,058 0,067 0,076 0,086 0,096 0,108 0,120 0,134 0,149 0,165 0,184 0,205 0,229 8,4

8,6 0,000 0,005 0,012 0,019 0,026 0,034 0,041 0,049 0,057 0,066 0,075 0,085 0,095 0,107 0,119 0,132 0,147 0,163 0,181 0,202 0,225 8,6
8,8 0,000 0,005 0,012 0,019 0,026 0,033 0,041 0,049 0,057 0,066 0,075 0,084 0,094 0,106 0,118 0,131 0,145 0,161 0,179 0,199 0,221 8,8
9,0 0,000 0,005 0,012 0,019 0,026 0,033 0,041 0,049 0,057 0,065 0,074 0,084 0,094 0,105 0,116 0,129 0,143 0,159 0,176 0,196 0,218 9,0
9,2 0,000 0,005 0,012 0,019 0,026 0,033 0,040 0,048 0,056 0,065 0,073 0,083 0,093 0,104 0,115 0,128 0,142 0,157 0,174 0,193 0,214 9,2
9,4 0,000 0,005 0,012 0,019 0,026 0,033 0,040 0,048 0,056 0,064 0,073 0,082 0,092 0,103 0,114 0,127 0,140 0,155 0,172 0,190 0,211 9,4

9,6 0,000 0,005 0,012 0,019 0,025 0,033 0,040 0,048 0,055 0,064 0,072 0,082 0,091 0,102 0,113 0,125 0,139 0,153 0,170 0,188 0,208 9,6
9,8 0,000 0,005 0,012 0,018 0,025 0,032 0,040 0,047 0,055 0,063 0,072 0,081 0,091 0,101 0,112 0,124 0,137 0,152 0,168 0,185 0,205 9,8
10,0 0,000 0,005 0,011 0,018 0,025 0,032 0,040 0,047 0,055 0,063 0,071 0,080 0,090 0,100 0,111 0,123 0,136 0,150 0,166 0,183 0,202 10,0
10,2 0,000 0,032 0,039 0,047 0,054 0,063 0,071 0,080 0,089 0,099 0,110 0,122 0,135 0,149 0,164 0,181 0,200 10,2
10,4 0,000 0,032 0,039 0,047 0,054 0,062 0,071 0,079 0,089 0,099 0,109 0,121 0,133 0,147 0,162 0,179 0,197 10,4

10,6 0,000 0,039 0,046 0,054 0,062 0,070 0,079 0,088 0,098 0,109 0,120 0,132 0,146 0,160 0,177 0,195 10,6
10,8 0,000 0,046 0,054 0,061 0,070 0,078 0,088 0,097 0,108 0,119 0,131 0,144 0,159 0,175 0,192 10,8
11,0 0,000 0,053 0,061 0,069 0,078 0,087 0,097 0,107 0,118 0,130 0,143 0,157 0,173 0,190 11,0
11,2 0,000 0,061 0,069 0,078 0,087 0,096 0,106 0,117 0,129 0,142 0,156 0,171 0,188 11,2
11,4 0,000 0,069 0,077 0,086 0,095 0,105 0,116 0,128 0,141 0,154 0,169 0,186 11,4

11,6 0,000 0,068 0,077 0,086 0,095 0,104 0,116 0,127 0,139 0,153 0,168 0,184 11,6
ISO 22514-4:2016(E)

35
 Table B.3 (continued)

36
PEARSON CURVES (STANDARDIZED MEDIAN)
P50 % (50 percentile). Change sign for γ 1 > 0.
Kurtosis Skewness (γ 1)
(β2)
(β2) 0,0 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 1,5 1,6 1,7 1,8 1,9 2,0
11,8 0,000 0,076 0,085 0,094 0,104 0,115 0,126 0,138 0,152 0,166 0,182 11,8
12,0 0,000 0,076 0,085 0,094 0,104 0,114 0,125 0,137 0,150 0,165 0,181 12,0
ISO 22514-4:2016(E)

12,2 0,000 0,084 0,093 0,103 0,113 0,124 0,136 0,149 0,163 0,179 12,2

© ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

Annex C
(informative)

Distribution identification

C.1 General
Sometimes, the form of the distribution is known or can be reasonably assumed and can be verified by
goodness-of-fit tests. The approach is to estimate the parameters of that distribution and to use them to
derive the relevant quantiles from which the capability estimates are obtained. The proportion out-of-
specification can be directly estimated.
The method is illustrated below with some often encountered distributions.

C.2 Normal distribution

If X1, ..., XN is a sample from a normal distribution with mean, μ, and variance, σ2, the estimates of μ
and σ2 are
N
1
µ̂ = X =
N
∑ Xi
i 1

and
N 2
1
σˆ 2 =
N −1i
∑(Xi − X )
1

The capability indices can, in turn, be estimated using the formulae given in this part of ISO 22514. Thus,

U−L
Cˆp =
6σˆ
U − µˆ
Cˆpk =
U 3σˆ
µˆ −L
Cˆpk =
L 3σˆ
and, finally,

Cˆpk = min(Cˆpk , Cˆpk )

L U

The estimated proportion out-of-specification items below L is calculated as

(
pˆ L = 1 − Φ 3Cˆpk
L
)
and the estimated proportion out-of-specification items above U is calculated as

(
pˆU = 1 − Φ 3Cˆpk
U
)
Here, Φ denotes the distribution function of the standard normal distribution. The actual calculations
of p̂ L and p̂U may be performed as outlined in 4.8.

© ISO 2016 – All rights reserved 37

ISO 22514-4:2016(E)

C.3 Log-normal distribution

C.3.1 General
The log-normal distribution with parameters μ and σ has probability density function

 
( )
2
1  log X − µ 
f (x) = exp  − 
X σ 2π  2σ 2 
 
where X > 0, and log denotes the natural logarithm, i.e. the logarithm to base e. When X has a log-normal
distribution with parameters μ and σ, then logX has a normal distribution with mean, μ, and variance σ2.
If X1, ..., XN is a sample from a log-normal distribution, the data can be transformed to normality by
taking the logarithms logX1, ..., logXN. The calculations in C.2 can then be used. Alternatively, the
calculations can be made directly in the original scale of the measurements. The two methods are given
below. In both cases, the parameters are estimated as
N
1
µ̂ = X =
N
∑ Xi
i 1

and
N 2
1
σˆ 2 =
N −1i
∑(Xi − X )
1

C.3.2 Log-normal distribution — Transformation to normality

The upper and lower specification limits shall be transformed so they become logU and logL. The
formulae in C.2 can then be applied. For example, the estimates of Cp, C pk and C pk are calculated as
L U

logU − logL
Cˆp =
6σˆ
log U − µˆ
Cˆpk =
U 3σˆ
ˆ µˆ − logL
C pk =
L 3σˆ
C pk and C pk may, in turn, be inserted in the appropriate formulae in C.2 to give the estimated
L U
proportions out-of-specification.

38 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

C.3.3 Log-normal distribution — Original scale

The quantiles of the log-normal distribution are

X α = exp σΦ ( 1
(α ) + µ )
where Φ−1 is the inverse of the distribution function of the standard normal distribution. In particular,

X 0,135 % = e 3σ + µ

X 50 % = e µ

X 99,865 % = e 3σ + µ
and the estimated indices are
U−L
Cˆp =
3σˆ + µˆ ˆ ˆ
e − e 3σ + µ
ˆ
U − eµ
Cˆpk =
ˆ ˆ ˆ
U
e 3σ + µ − e µ
ˆ
eµ − L
Cˆpk =
ˆ ˆ ˆ
L
e µ − e 3σ + µ
These indices will be numerically different from those obtained using the transformation approach of
C.3.2. A process owner with log-normally distributed items could well develop a “feel” for the indices,
but their interpretation should not routinely be based on the cut-off points used for indices calculated
for normal data.
The estimated proportion of out-of-specification items is calculated using the specification limits and
the distribution function of the log-normal distribution. Thus,
 logL − µˆ 
pˆ L = Φ  
 σˆ 
and
 logU − µˆ 
pˆU = 1 − Φ  
 σˆ 
These estimates are exactly the same as those obtained with the transformation approach in C.3.2.

C.4 Rayleigh distribution

This distribution is used almost exclusively to describe position, eccentricity and run-off in two-
dimensional problems. In these situations, it is typical for there to be only a one-sided specification
limit, U.

© ISO 2016 – All rights reserved 39

ISO 22514-4:2016(E)

The Rayleigh distribution has distribution function:

 X2 
( )
F x = 1 − exp  −
 2θ 2


 
where X > 0 and θ is a positive parameter. If X1, ..., XN is a sample from a Rayleigh distribution, the
parameter θ is estimated by

N
∑ Xi2
θˆ = i 1
2N

and the estimated proportion out-of-specification is given by

 
 
 NU 2 
p̂U = exp  − 
 N 
 Xi2
∑ 
 
 i 1 
C.5 Weibull distribution
This is a distribution of great versatility. It is often used in analysing data gathered during reliability
studies when the patterns that describe the data are often irregular and non-normal. The distribution
has three parameters:
a) ξ a scale parameter;
b) β a shape parameter;
c) γ a location parameter, frequently assumed to be 0.
There are occasions when a capability study will not produce data that follow a normal distribution
pattern, but the Weibull distribution can be used to describe the data and, thereafter, provide a way to
calculate capability or performance measures.
The distribution function of the Weibull distribution is
 β 
 X −γ  
( )
F X = 1 − exp  − 
  ξ  
 
 
and, hence, the percentiles of the Weibull distribution are
β
Xα % ( (
= Y − ξ − log 1 − p ))
In particular, the percentiles X0,135 %, X50 % and X99,865 % and, subsequently, the capability indices can
be calculated. More importantly, the proportions out-of-specification items are
 β 
L−γ  
()
p L = F L = 1 − exp  − 
  ξ  
 
 
and
 β 
U −γ  
pU = 1 − F U = exp  − 
( )  
  ξ  
 
The estimated proportions out-of-specification are obtained using estimates of the parameters.

40 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

C.6 Folded half-normal distribution

The folded half-normal distribution is often used to describe the variation in a characteristic whose
specification includes geometrical tolerances. This situation gives a one-sided specification. It typically
applies where geometrical characteristics, form and orientation are specified.
The folded half-normal distribution, with parameters μ and σ, has probability density function:
 2
 1 X −µ  
( )
f x =
2
exp −   
σ 2π  2  σ  

 
where 0 ≤ X < ∞ .
The folded half-normal distribution is proportional to the normal distribution. The distribution’s
estimated proportions can therefore be found using a standard normal distribution table with the
appropriate table value multiplied by 2.

C.7 Other distributions

The distributions given above are those frequently to be encountered. There exist many others that the
reader will find documented in the numerous text books on statistics.

© ISO 2016 – All rights reserved 41

ISO 22514-4:2016(E)

Annex D
(informative)

Confidence intervals

D.1 Normal distribution

D.1.1 General
It is important for any person having calculated a capability index to realize that the computed value is
only an estimate of the true value of that index. Usually, the greater the amount of data used to compute
the index, the better the estimate will be. The following paragraphs are intended to alert the reader to
this fact and to provide methods that confidence intervals for the indices can be calculated.
The confidence interval calculations are only appropriate when the mean and not the median has been
the chosen measure of location.

D.1.2 Normal distribution — Formula method

The 1 − α confidence intervals are

Cˆp
Cˆp ± z 1 α 2
2N − 2
Cˆ 2
1 pk U
Cˆpk ± z1 α 2 +
U 9 N 2N -2
Cˆ 2
1 pk L
Cˆpk ± z 1 α 2 +
L 9 N 2N -2
where z is the standardized variate for the normal distribution. These calculations should be done with
at least 50 readings.
NOTE These formulae assume the estimated indices have been computed using a standard deviation based
on the total sample size (N).

D.1.3 Normal distribution — Tabular method for the Cp index

D.1.3.1 General

An example of the method to estimate a confidence interval for a Cp index is shown in D.1.3.2.
The method requires multipliers Kl and Ku are read from Table D.1. These differ according to how many
readings the estimated Cp has been based on. The index is multiplied by these multipliers to give the
confidence interval. This calculation should be done with at least 50 readings.
As an example, the 95 % confidence interval would be

Kl Cˆp £ C p £ K u Cˆp
95 % 95 %

42 © ISO 2016 – All rights reserved

 ISO 22514-4:2016(E)

D.1.3.2 Procedure and example

a) Record estimated Cp value and total sample size:

Cˆp = 1, 20 and N = 100

b) Select the required conficence level.

Confidence level = 95 %
c) Read multipliers from Table D.1.
Kl = 0, 86
95 %
Ku = 1, 1, 4
95 %

d) Calculate confidence interval.

Kl Cˆp ≤ C p ≤ K u Cˆp
95 % 95 %
0, 86 × 1, 20 ≤ C p ≤ 1, 14 × 1, 20
1, 03 ≤ C p ≤ 1, 37

Table D.1 — Multipliers for the confidence interval of the Cp index

Total sample size, N
Confidence interval Multiplier
50 75 100 150 300
Kl 0,83 0,86 0,88 0,90 0,93
90 %
Ku 1,17 1,14 1,12 1,10 1,07
Kl 0,80 0,84 0,86 0,89 0,92
95 %
Ku 1,20 1,16 1,14 1,11 1,08
Kl 0,74 0,79 0,82 0,85 0,89
99 %
Ku 1,25 1,21 1,18 1,15 1,10

D.2 Other confidence intervals

Confidence intervals for other calculated indices (not graphical estimates) can be found for non-normal
distributions, as well as for normal distributions.

© ISO 2016 – All rights reserved 43

ISO 22514-4:2016(E)

Bibliography

[1] ISO 3534-1, Statistics — Vocabulary and symbols — Part 1: General statistical terms and terms
used in probability
[2] ISO 3534-2, Statistics — Vocabulary and symbols — Part 2: Applied statistics
[3] ISO 5479, Statistical interpretation of data — Tests for departure from the normal distribution
[4] ISO 7870-1, Control charts — Part 1: General guidelines
[5] ISO 7870-2, Control charts — Part 2: Shewhart control charts
[6] ISO 9000, Quality management systems — Fundamentals and vocabulary
[7] ISO/IEC 12207, Information technology — Software life cycle processes
[8] AUTOMOTIVE INDUSTRY ACTION GROUP. Statistical process control (SPC) – Reference material.
AIAG, 2005
[9] Chou Y., Owen D.B., Borrego S.A. Lower Confidence Limits on Process Capability Indices. J.
Qual. Technol. 1990, 22 (3) p. 225
[10] Clements J.A. Process capability calculations for non-normal distributions. Quality Process.
1989, 22 pp. 95–100
[11] Duncan A.J. Quality control and industrial statistics. Richard D. Irwin, Inc, 1986
[12] Kotz S., & Johnson N.L. Process Capability Indices. Chapman & Hall, 1993
[13] Kotz S., & Lovelace C.R. Process Capability Indices in Theory and Practice. Hodder Arnold, 1998
[14] Rodriguez R.N. Recent Developments in Process Capability Analysis. J. Qual. Technol. 1992,
24 (4) p. 179
[15] Stephens M.A. Anderson-Darling Test for Goodness of Fit. In: Encyclopedia of Statistical
Sciences, (Johnson N.L., & Kotz S. eds.). Wiley Interscience, Vol. 1, 1982, pp. 81–5.

44 © ISO 2016 – All rights reserved

This page is intentionally blank.
This page is intentionally blank.
This page is intentionally blank.
ISO 22514-4:2016(E)

ICS 03.120.30
Price based on 44 pages

© ISO 2016 – All rights reserved