© Copr. 1949-1998 Hewlett-Packard Co.

A High-Performance Automatic
Microwave Counter
This new counter needs only a single input to measure
10 Hz to 18 GHz, and its sensitivity is many
times better than previous counters. It's also
systems compatible.

By Richard F. Schneider

MEASURING FREQUENCIES FROM LOW other devices. All of its front-panel controls (except
AUDIO all the way to microwave has always power on/off) may be remotely programmed, in
required many different counters or counter plug- cluding resolution, range, reset, and sample mode.
ins, a good deal of range switching and cable chang
ing, and at least — 7 dBm (100 mV) of signal. Controls
Not any more. The new Model 5340A Microwave There are actually four range selections on the
Frequency Counter (Fig. 1) measures frequencies counter: 10 Hz to 18 GHz at 50Ü input impedance,
between 10 Hz and 18 GHz using only a single input 250 MHz to 18 GHz at 50fi input impedance, 10 Hz
connector. Measurements are completely automatic, to 250 MHz at 1 MO input impedance, and a time
and sensitivity is —30 dBm (7 mV) from 10 Hz to base oscillator check at 10 MHz. A precision type
500 MHz, -35 dBm (4 mV) from 500 MHz to 10 N connector is used on the 50H input and a BNC
GHz, and -25 dBm (12 mV] from 10 GHz to 18 GHz. connector is used on the 1 MO input.
Thus measurements may be made where signals
are inherently low-level, or where directional cou
plers or lossy elements reduce the original signal
Cover: Behind the type N
level. connector on the front panel
A typical sensitivity curve is shown in Fig. 2. of Model 5340A Frequency
Note that the counter is usable well above 18 GHz Counter is the assembly
and that conservative specifications apply. shown here: a power split
Model 5340A gets its high sensitivity and wide ter followed by two wide
band thin-film hybrid sam
bandwidth from the new thin-film samplers used in plers and other elements
its front end as harmonic mixers (see article, page of two phase-locked loops.
10). A new phase-locked loop design provides not The samplers are the main
only automatic operation, but also greatly reduced reason this single input is
sensitivity to spurious input signals, harmonically the only one needed to measure frequencies
from 10 Hz to 18GHz.
related or not. Frequencies from 10 Hz to 250 MHz
are counted directly, and frequencies above 250
MHz are measured using an automatic transfer In this Issue:
oscillator technique.
A High-Performance Automatic Mi
Model 5340A is compatible with the new HP bus crowave Counter, by Richard F.
interface system.1 The bus system provides for con S c h n e i d e r page 2
trol and communication between instruments up to
A dc-to-20 GHz Thin-Film Sampler
51 feet apart. As many as 15 devices can operate on for Microwave Instrumentation, by
the bus, so the 5340A can be part of an easily J e r r y M e r k e l o page 10
implemented automatic measurement system. Automating the Calibration Labora
Equipped with all of its systems options, Model tory, by E. Robert Aikin and John L.
5340A can communicate digitally with printers, cal Minck page 14
culators, card readers, computers, teleprinters, and

P R I N T E D I N U . S . A .

© Copr. 1949-1998 Hewlett-Packard Co.

 Fig. 1. Model 5340A Microwave
Frequency Counter can measure
10 Hz to 18 GHz automatically,
using only a single input. Eight
digits are displayed. Resolution
is selectable from 1 Hz to 1 MHz.

Resolution is selectable in decade steps from 1 Hz largest component's frequency.

to 1 MHz, and the normal counter reset and sample For signals within the transfer oscillator fre
rate controls are also on the front panel. Eight digits quency range, automatic amplitude discrimination
are displayed along with appropriate annunciators circuits assure that only the largest signal is mea
indicating mode of measurement (direct or phase sured. If a microwave signal in the transfer oscilla
locked) and units of kHz, MHz, or GHz. tor range contains spurious signals, such as power
supply residuals, that are within the sensitivity of
Counter Organization the direct count range, the range selection of 250
The general block diagram of the new counter is MHz to 18 GHz can be used. This enables only the
shown in Fig. 3. An internal programmer checks to automatic transfer oscillator, and the automatic
see if a directly countable signal is present (by amplitude discrimination circuitry then finds the
sensing its amplitude and frequency range) and if largest signal.
it is, the frequency is counted and displayed accord The separate 1 MO input for 10 Hz to 250 MHz
ing to the resolution setting. uses the same direct counting circuitry as the 50O
The internal programmer also checks to see if a input.
phase lockable signal is present. If it is, the auto
matic transfer oscillator is enabled, the harmonic Automatic Transfer Oscillator
number is calculated, and the gate time is extended The automatic transfer oscillator uses an IF-offset
so that the input frequency is displayed automati phase-lock loop with the thin-film sampler operat
cally according to the resolution selection. Fig. 4 is ing as a mixer. As shown in the accompanying
a simplified flow diagram of the internal program. article (page 10), the sampler IF response is very
If a directly countable signal is present, this sig flat from the lowest sampling frequency of 120 MHz
nal overrides the automatic transfer oscillator mode.
This assures that the fundamental signal will be
measured and not a harmonic frequency when the
High Z Imped
fundamental is below the transfer oscillator range. ance Converter Computer or
Also, for multiple frequency inputs where the larg Remote Pro
grammer
est signal is in the 10 MHz to 250 MHz range, this
feature assures the correct determination of the

Fig. 3. Model 5340 A measures 10 Hz to 250 MHz directly,

and 250 MHz to 18 GHz using an automatic transfer oscil
lator technique. Internal programming selects the proper
Fig. 2. Typical 5340A sensitivity. mode.

© Copr. 1949-1998 Hewlett-Packard Co.

through the 150th harmonic of 18 GHz. This re of the counter.
sponse is fundamental in obtaining the performance Fig. 5 is a block diagram of the automatic transfer
oscillator. The input signal is divided into two equal
signals by a resistive power divider. The resulting
signals are the inputs to two thin-film samplers,
one used in the input phase-lock loop and termi
nated and the other used to determine the harmonic
number. The input signal to the second sampler is
fed through to the direct count circuits.
The input phase-lock loop consists of a voltage
controlled oscillator (VCO), a sampler, an IF ampli
fier, a phase detector, and dc gain and control sys
tem compensation. The VCO searches over its range
until an IF signal equal to the reference frequency
of 20 MHz is found. Phase lock occurs when the
phase detector output drives the VCO frequency
Fi such that:

Fx = NFi - FIFl (1)

where FiF] = FIF nEF = 20 MHz at phase lock. (2)

A quadrature detector assures that the loop locks

only on the lower sideband to satisfy equation 1.
Next the VCO frequency Fi is translated to a
frequency F2 so that

F 2 = F i  ± F o ( 3 )

where the offset frequency Fn is 20 kHz.

This is done in a transfer phase-lock loop. The fre

quency F2 drives the second sampler and produces
a second IF output FIF, as follows:

Termination

To Direct Count Circuits

Fig. 5. Wideband thin -film samplers are used as harmonic

Fig. 4. Simplified flow diagram of 5340A internal program mixers in the automatic transfer oscillator phase-lock
ming. Search and increment program automatically opti loops. The input loop mixes the signal with a harmonic of
mizes phase-lock loop compensation and bandwidth in the sampling frequency. The second loop determines the
the transfer-oscillator mode. harmonic number.

© Copr. 1949-1998 Hewlett-Packard Co.

 F i r , = N F 2 - F x ( 4 ) The search ramp rate is then programmed along
with the proper octave range compensation. When
= Nf?! ± Fo) - (NFi - 20 MHz) (5)
phase lock occurs, the harmonic number is com
= Â ± N F o + 2 0 M H z [ 6 ] pared with the allowable numbers for that compen
sation. If incorrect, the programmer is stepped until
By mixing FIF, with the 20 MHz reference frequency the proper combination of harmonic number and
and rejecting 20 MHz and higher frequencies, the compensation is obtained. This procedure is accom
harmonic frequency, NF0, is obtained. Counting the plished prior to any counting (see Fig. 4).
number of zero crossings for the period of the off The results of this compensation technique are
set frequency F0 = 20 kHz then determines the normalization of the input phase-lock loop at maxi
harmonic number N of the phase lock loop. The mum bandwidth (200 kHz), optimized compensa
input frequency is then calculated and displayed tion for the octave range allowing prescribed FM
by presetting into the counter the 20 MHz reference performance, and minimum acquisition time.
frequency, measuring the VCO frequency of the Acquisition time is defined as the time it takes
input phase lock loop, and extending the gate time for the phase-lock loops to acquire a signal that is
according to the harmonic number N. abruptly switched on. Acquisition time is measured
in production at input frequencies of 400 MHz, 7
Compensation and Acquisition Time GHz, and 18 GHz. These input frequencies are
Compensation of the input phase-lock loop is switched on with a solid-state RF switch, and the
optimized for bandwidth and acquisition time by HP 5360A Computing Counter is used to measure
using the harmonic number information. First, the the time interval between the RF signal and the
compensation ranges are divided into octave input- counter main gate. A mean-time and standard-devi
frequency ranges from 250 to 500 MHz, 500 to 1000 ation program in the 5375A Computing Counter
MHz, 1 to 2 GHz, 2 to 4 GHz, 4 to 8 GHz and 8 to Keyboard averages a series of acquisition times to
18 GHz. Of course, all the ranges overlap so there provide the required data.
is continuous input frequency coverage. The acquisition time varies depending on where
the programmer is in the cycle with respect to the
signal input time, and is found to average 150 ms
with a 75 ms standard deviation. This time can be
1,000 reduced to 50 ms with a 10 ms standard deviation
by operating in the octave range programming mode
(Opt. 003).

AM and FM Tolerance
i 100
Amplitude modulation tolerance is determined
1 by the sensitivity specification. So long as the mini
_£
- mum voltage in the modulation trough is not less
Ã-
S than the sensitivity, an accurate count is obtained.
Input Carrier Frequency
For example, with a 10 dBm input at 10 GHz,
18 GHz 94.5% modulation index will cause the signal to
drop to —35 dBm (4 mV) at its lowest amplitude
and would be the limit of modulation possible.
FM tolerance characteristics are a function of
modulation rate and input frequency. A family of
curves describing the FM capability at -20 dBm
for six input frequencies is shown in Fig. 6. These
curves show, for example, that with an 8 GHz input
100 I k 1 0 k 1 0 0 k 1 M frequency, residuals due to power supply FM can
Fm-Modulating Frequency-Hz
be tolerated to 100 MHz peak-to-peak deviation at
a 100 Hz rate.
These FM tolerance characteristics were obtained
Fig. 6. Typical 5340A frequency modulation tolerance using single-tone modulation. Multiple tones will
characteristics tor single-tone FM on input signal. Input
decrease the capability if they are within the phase-
level is —20 dBm. Carrier frequency will be correctly
measured if modulation frequency and peak-to-peak devi lock loop bandwidth.
ation are below curves. An excellent example of 5340A performance is

© Copr. 1949-1998 Hewlett-Packard Co.

 example, the carrier frequency of a microwave tele
phone relay transmitter signal, about 8 GHz, was
OdBm correctly measured in the presence of frequency
modulation equivalent to two master groups or 1200
telephone channels. Random noise was used to sim
ulate traffic in the telephone channels. Modulation
rates ranged from less than 100 kHz to nearly 6
MHz, and frequency deviation was 141 kHz rms
per channel. The spectrum of this signal is shown
in Fig. 8.

Automatic Amplitude Discrimination

The high sensitivity and wide dynamic range (42
1 MHz/cm
dB) of the 5340A present a formidable challenge
with regard to spurious signals. For example, if an
Fig. 7. Frequency spectrum of a local television station input signal of + 7 dBm has harmonically related
(Channel 36). Model 5340A correctly measured the video components 35 dB down, these signals will be at
carrier frequency (603.25 MHz) with only a UHF antenna — 28 dBm, well within the instrument's sensitivity.
connected to its input.
Another important example is that of frequency
multiplier or synthesizer chains, where spurious
shown in Fig. 7. Here the video carrier frequency of signals can occur anywhere in the input frequency
a local UHF television station (channel 36] is mea
range.
sured at 603.25 MHz. The video carrier amplitude
modulation, the color subcarrier frequency, and the
FM sound carrier and sidebands were automatically
disregarded by the counter. This measurement was
OdBm
made on a signal received from a UHF antenna
connected directly to the counter input.
The carrier frequency of signals with frequency
modulation rates greater than the phase-lock loop
bandwidth can also be measured. Since the devi
ation tolerance increases by at least 6 dB/octave at
modulation frequencies above about 1 MHz, these
sidebands will be rejected, while those within the
bandwidth will be averaged. Broadband noise sig
nals will be processed in the same manner. For
10 kHz/cm

OdBm

1 MHz/cm

3 MHz/cm
Fig. 9. Model 5340A is designed to measure only the larg
est signal in its passband. Top spectrum is of signals 10
Fig. 8. Spectrum of an 8 GHz microwave telephone sig kHz apart and differing in amplitude by 1 dB. In bottom
nal with 2 master groups (1200 channels). Model 5340A spectrum, signals are 1 MHz apart and differ by 3 dB. The
correctly measured the carrier frequency. larger signal in each case was measured.

© Copr. 1949-1998 Hewlett-Packard Co.

 shown in Fig. 11 is automatically activated. The
input signal from the main input connector is ampli-
field to a detectable level, then fed to a broadband
OdBm
diode detector and to the triggering circuit in the
counter. The threshold of the detector is set to a
level just above that required for correct counting.
A detector output is required for the control system
to display an answer, so only stable, noise-free
answers are displayed.
The direct count amplifier is ac coupled so dc
levels may exist on input signals and no external
offset adjustment is necessary. Because of the ac
coupling, unsymmetrical signals, such as pulse
2 GHz/cm
trains, can generally not be tolerated by this input.
The measurement of pulses is best accomplished by
Fig. 10. Typical worst-case 5340A amplitude discrimina the high-impedance input. This amplifier is ac
tion. Here the signals are at 450 MHz and 12 GHz and an coupled also, and requires no external offset adjust
8 dB amplitude difference was required. ment, but it has a special circuit to accommodate
pulse trains. The baseline offset characteristic of an
Automatic amplitude discrimination is incorpor unsymmetrical input, such as a pulse train, is auto
ated in the design of the input phase-lock loop and matically corrected for inputs with a duty factor as
harmonic frequency circuits. Circuits in the input low as 0.1%. Full sensitivity is thereby maintained,
phase-lock loop simultaneously observe all the sig making this input suitable for use with a 10:1
nals within the bandwidth and sensitivity of the divider oscilloscope probe on such signals as IF
instrument. Next these signals are amplified by a responses and logic levels.
hard-limiting amplifier and are filtered at the refer
ence frequency. Assuming that the largest signal Digital Input/Output
present is sufficiently large, the filtered output sig The digital output is ASCII-coded and TTL or
nal contains the frequency of the largest signal, DTL compatible. The output string has the follow
frequency-modulated by the undesired signals. A ing format:
small-dynamic-range phase detector then allows D ! L 0 | Sp Sp dddddddd E + d Cr Lf
only the largest signal to phase lock. The signals where D = DIRECT
can be present within or outside the bandwidth of L = LOCK
O = OVERFLOW
the phase-lock loop; the circuit will respond and Sp = SPACE
lock onto only the signal of largest magnitude. d = DIGIT 0 thru 9
By using a similar technique of a hard-limiting Cr = CARRIAGE RETURN
amplifier in the harmonic frequency circuit, zero Lf = LINE FEED
crossings are counted only for the largest signal
A manually programmable five-bit address is
present there also.
located on the rear panel along with a local-systems
The spectrum of two signals within the band
switch. If, for instance, the counter is used with a
width of the input phase-lock loop is shown in Fig.
printer only, the switch would be placed in the
9. The larger signal was correctly measured, illus
local position. If the counter is part of a measure
trating that at frequencies of 405.500 MHz and
ment system, the switch would be placed in the
405.501 MHz an amplitude difference of less than
systems position and the counter would respond to
1 dB is required to discriminate between the sig
the signals on the bus when properly addressed.
nals. Also shown are two 400 MHz signals 1 MHz
The 5340A is remotely programmed by placing
apart; here a 3 dB difference in amplitude was re
its address on the bus, followed by a string of ASCII
quired. Fig. 10 is the spectrum of signals at 450
characters. Programmable functions include reso
MHz and 12.0 GHz. Here an 8 dB amplitude differ
lution, range, octave program, reset, sample mode,
ence was required to discriminate between the two
sample trigger, output mode, and local-remote
signals. codes.

Direct Counting System Options

For frequencies below the second harmonic of The counter is available with a rear-panel con
the input phase-lock loop, the direct count system nector for the 50Q input, and with a 10 MHz to 250

© Copr. 1949-1998 Hewlett-Packard Co.

 Detector/
4 d B A t t e n u a t i o n \ Low Pass . To Control System
Filter

From Control
System
Fig. 11. 5340A direct-count cir
cuitry.

MHz iMn rear-panel input in parallel with the

front-panel input. A 50ÃÃ termination is provided
so that the front-panel connector may be terminated
where the additional capacitance of the cable to the
rear panel cannot be tolerated. If the termination
is used, the input impedance of the rear-panel input
is reduced to 50fi.
An optional oven time-base oscillator is avail
able. It has an aging rate of less than 5 X 10~10/day.

Acknowledgments
Many individuals contributed to the development
of the 5340A Counter. The performance at micro
wave frequencies could not have been realized
without the outstanding thin-film sampler devel
oped by Jerry Merkelo and Bob Hall. The design
innovations of the input phase-lock loop with auto
matic amplitude discrimination were developed by
Art Bloedorn. Counter, programming, and bus inter
face design was the responsibility of Al Foster. Rory
Van Tuyl provided the design of the sampler driver,
the VCO's and the direct count amplifiers. Bob
Maldewin was responsible for the power supply
design and part of the VCO development. Glen
Elsea provided the mechanical design of the instru
ment and Dick Goo was the engineering aide and
technician on the project. Special recognition and Richard F. Schneider
credit is deserved by Rory Van Tuyl and Al Foster Dick Schneider was project manager for the 5340A
who provided many ideas, stimulating discussions, Counter. This was his fourth microwave counter project
since joining HP in 1 964. The others were the 5260A
and aid to the systems development. Frequency Divider, the 5240A Frequency Meter, and the
My thanks also to John Dukes, engineering sec 5257A Transfer Oscillator. Dick received his BS degree in
tion manager, for his support and to Ron Potter for electrical engineering from Case Institute of Technology
his technical aid. T in 1952 and his MS degree from California State University
at San Jose in 1968. Before coming to HP he worked in
the aerospace industry on missile and satellite test
Reference equipment, microwave amplifiers, telemetering, radar,
1. G. E. Nelson and D. W. Ricci, "A Practical Interface and receiver systems. He was a Loran specialist in the
System for Electronic Instruments," Hewlett-Packard U.S. Coast Guard. Dick is a member of IEEE.
Journal, October 1972.

© Copr. 1949-1998 Hewlett-Packard Co.

 SPECIFICATIONS
HP Model 5340A
Frequency Counter

Signal Input A separate power supply keeps the crystal oven on and up to tem
INPUT 1 perature when the instrument is turned off as long as it remains
RANGE: 10 Hz to 18 GHz. connected to the power line.
SYMMETRY: Sine wave or square wave input (40% duty factor, FREQUENCY: 10 MHz.
worst case). STABILITY:
SENSITIVITY: -30 dBm, 10 Hz-500 MHz; -35 dBm, 500 MHz- AGING RATE: <±5 x 10-K>/day after 24-hour warm-up and
10 GHz; -25 dBm, 10-18 GHz. <1.50 x 10-Vyear.
DYNAMIC RANGE: 37 dB, 10 Hz to 500 MHz; 42 dB, 500 MHz to SHORT TERM STABILITY: 1 x 10-" for 1 s avg. time.
10 GHz; 32 dB, 10 GHz to 18 GHz. 1 x 10-" for 10 s avg. time.
IMPEDANCE: 500 2 x 10-" for 100 s avg. time.
VSWR: <2:1, 10 Hz-12.4 GHz; <3:1, 12.4-18 GHz. LINE VARIATION: <±5 x 10-"> 10% change.
CONNECTOR: Precision Type N. TEMPERATURE: <±1 x 10-' frequency change over a -55° to
COUPLING: dc to load, ac to instrument. 65°C temperature range. <±2.5 x 10-' over 0 to 40°C range.
DAMAGE LEVEL: +30 dBm ±7 V dc (total power not to exceed WARM-UP: Within 5 x 10-' of final*** value 15 minutes after turn-on,
1 W). at 25°C.
ACQUISITION TIME: <150 ms mean typical. * For oscillator oil-time less than 24 hours.
INPUT 2 * 7 minute required for unit to stabilize.
RANGE: 10 Hz-250 MHz direct count. * Final value Is defined as frequency 24 hours after turn-on.
SENSITIVITY: 50 mV rms. 150 mV p-p pulses to 0.1% duty factor, FREQUENCY ADJUSTMENT RANGE: >2 x 10-» (>±40 Hz from 10
minimum pulse width 2 ns. MHz) with 18-turn control.
IMPEDANCE: 1 Mi! shunted by <25 pF. FREQUENCY ADJUSTMENT: 1 x 10-' (0.01 Hz) 18-turn control.
CONNECTOR: Type BNC female. General
COUPLING: ac. ACCURACY: ±1 count ± time base error.
MAXIMUM INPUT: 10 Hz to 100 Hz 200 V rms. RESOLUTION: Front panel switch selects 1 MHz, 100 kHz, 10 kHz,
100 Hz to 100 kHz 20 V rms. 1 kHz, 100 Hz, 10 Hz, or 1 Hz.
100 kHz to 250 MHz 2 V rms. DISPLAY: Eight in-line long-life display tubes with positioned deci
AUTOMATIC AMPLITUDE DISCRIMINATION: The counter will auto mal point and appropriate measurement units of kHz, MHz, or GHz.
matically select the largest of all signals present (250 MHz to 18 SELF CHECK: Counts and displays 10 MHz for resolution chosen.
GHz phase-lock range), providing that signal is 20 dB (10 dB OPERATING TEMPERATURE: 0° to 50°C.
typical) larger than any other. POWER: 115 V or 230 V ±10%, 50-60 Hz, 100 VA.
MAXIMUM AM MODULATION: Any modulation index as long as the REAR PANEL CONNECTORS (OPTION 002): This option provides In
minimum voltage of the signal is not less than the sensitivity put connectors on the rear panel. Input specifications remain the
specification. same. Input 1 (Type N) is on the rear panel in place of installation
Time Base on the front panel. Input 2 (BNC) is available on the front and
CRYSTAL FREQUENCY: 10 MHz. rear panels. Input impedance is reduced to 50 S3.
STABILITY: REMOTE PROGRAMMING AND DIGITAL OUTPUT (OPTION 003):
AGING RATE: <±3 x 10-' per month. Option 003 adds the capability of digital outputting and remote
SHORT TERM: <5 x 10-'° rms for 1 second averaging time. programming via a 24-pin, series 57, Microribbon connector on
TEMPERATURE: <±2 x 10-' over the range of -20° to + 65°C. the rear panel marked DIGITAL INPUT/OUTPUT. The TTL and DTL
LINE VARIATION: <±1 x 10-' for 10% line variation from 110 V compatible, bidirectional bus consists of eight (8) data lines plus
or 230 V line. 7 status and control lines.
OUTPUT FREQUENCY: 10 MHz >2.4 V square wave (TTL compatible) PRICE IN U.S.A.: 5340A, $5,300.00
available from rear panel BNC. OPTION 001: $400.00
OPTION 002: $100.00
Optional Time Base OPTION 003: $350.00
(Option 001)
Option 001 provides an oven-controlled crystal oscillator time MANUFACTURING DIVISION: SANTA CLARA DIVISION
base with an aging rate near that of a time standard. This option 5301 Stevens Creek Boulevard
results in better accuracy and longer periods between calibration. Santa Clara, California 95050

© Copr. 1949-1998 Hewlett-Packard Co.

A dc-to-20-GHz Thin-Film Signal Sampler
for Microwave Instrumentation
This rugged, miniature, wideband sampler is
responsible for many of the advanced capabilities
of the new Model 5340A Microwave Counter.

By Jerry Merkelo

ESCALATING DEMAND FOR HIGH-PERFORM pling device is illustrated by Fig. 9 of reference 1,

ANCE MICROWAVE INSTRUMENTS that which is reproduced here as Fig. 1. This design
meet tougher specifications of bandwidth, sensi calls for the ground plane to be split to form a
tivity, standing-wave ratio, and size prompted the transmission line with shorted ends. The leading
development of the improved sampling devices that edge of the gate pulse turns on the sampling diodes,
serve as wideband harmonic mixers in the new travels down the transmission line, is reflected at
Model 5340A Microwave Counter. These devices the shorted ends, and arrives back at the diodes
have bandwidths exceeding 20 GHz, very low line with inverted phase, turning them off. Thus the di
reflections (SWR <1.7 typical), and wide tolerance odes are turned on and off within a few picosec
to drive-pulse shape. They are miniature, simple, onds to form a very short sampling pulse. The di
and rugged, and their physical configuration makes odes are capacitively coupled to the gate pulse
them adaptable to a variety of uses.
The design of these new sampling devices is
based on proven design concepts developed by Sampling Pulse
Input Line
Grove1,2 and Cohn3, but uses up-to-date thin-film
quartz-substrate technology and advanced solid-
state devices. The design breaks new ground in sev
eral ways:
• Beam-lead diode chips improve balance, mini
mize parasitic reactances, and increase diode
burnout power level.
• A double microstrip structure with slot-line cou
pling is used.
• Circuit geometry is naturally balanced. Filter em
bedding of active circuits maximizes bandwidth.
• The drive line is terminated to ease gate-pulse-
generator design.

Sampler Design
Conceptually, the basic design of the new sam-
Fig. 1. Sampler equivalent circuit. Design is based on a
•See article, paje 2. split ground plane, which acts as a transmission line.

10

© Copr. 1949-1998 Hewlett-Packard Co.

 through Ci and C2 and the sampled output appears Construction
across the diodes. Fig. 2 shows the actual sampler layout with the
The signal voltage developed across each diode, ground plane slot and drive transmission line. The
neglecting nonlinear effects, is (Eq. 12, ref. 1): other side of the substrate supports the signal filter
structure. The details of construction are deter
e,n mined by the requirement to minimize stray reac
V8 = tances, especially the inductance which appears in
s2 + / R + Zo/2 \ the sampling diode circuit. This inductance includes
LC the diode beam leads and the plated-through hole
The central role of the diode inductance L, capaci in the substrate which connects to the signal trans
tance C, and resistance R is apparent in this equa mission line.
tion. The diode circuit is series-resonant and shunts The substrate thickness is a compromise between
the signal line, so the resonant frequency must be
moved above the band of interest by reducing L
and C. To obtain the minimum LC product, beam- Termination
lead diodes may be used. Such diodes are manu
factured from the same wafer and inherently have
identical characteristics. The additional benefit of
good diode matching improves symmetry and there
fore improves balance and decoupling in the sam
pler.
A central concept in the design is the balancing
of the gate pulse with respect to the signal line as
shown in Fig. 1. The slot line, introduced by S.
Cohn3, provides a natural circuit topology for this
purpose. A slot line consists of a narrow gap in a
conductive coating on one side of a dielectric sub
strate, the other side of the substrate normally be
ing bare. Slot line can be used alone, or with micro-
strip line on the other side of the substrate as it is
in the new thin-film sampler. Slot

Experimental slot transmission lines coupled to

microstrip lines were constructed, characterized by
s-parameter measurements over a wide frequency
range, and modeled. A slot parallel to and beneath Signal
Output
a microstrip transmission line is not coupled to the
line and raises the line impedance slightly. This Sampled
Output
can be compensated by increasing the microstrip
line width over the length of the slot. A short slot
transverse to the microstrip line can be accurately
modeled as a parallel resonant line or tank circuit.
The design takes advantage of these properties
by using two microstrip lines on opposite sides of
a substrate with a slot in their common ground
plane. The slot is parallel to and beneath the signal
line, and transverse and symmetrical below the
gate-pulse drive line. See Fig. 2 for details. A fast-
rising voltage on the drive line develops a pulse
across the slot but is not coupled to the signal line.
The beam-lead diode pair is connected across the
slot through capacitors and the node between the
two diodes is connected to the signal line through
a plated hole in the substrate at the center of the
Fig. 2. New thin-film 20 GHz sampler has a double-
slot. This construction fits the simplified represen microstrip structure with slot-line coupling. The two sam
tation shown in Fig. Ã. pling diodes are on beam-lead chips.

ii

© Copr. 1949-1998 Hewlett-Packard Co.

minimizing inductance and substrate fragility. For
a thin substrate, quartz is used to minimize dielec
tric constant and line losses and obtain the widest
signal transmission line for a characteristic imped
ance of 50 ohms.
With these choices, the sampling series induc
tance is about 250 pH and the diode capacitance
must be about 0.1 pF to obtain a resonance above
30 GHz. With these values for the central element,
three- to seven-section low-pass filters were de
signed using empirical methods to reduce signal line
reflections. Table 1 shows the final results of opti
mized signal-line VSWR for a 20-GHz-cutoff fiker
design. VSWR is less than 1.7 over the entire band
width.
The drive pulse enters a piggyback microstrip
line attached to the ground plane side of the sub
strate. A ribbon connection in air is made from the
end of this substrate across the sampling slot to a
terminating load resistor. The input pulse is capaci-
tively coupled to the diodes and the remaining
energy dissipates in this internal load. Output is
taken from the two sampling capacitors through
resistors and a bias circuit. The entire device is
mounted in a metal package with three miniature
coaxial connectors.

Operation and Experimental Results

Fig. 3 shows a typical circuit used for testing
sampler operation. In normal operation, the sampler
is driven by a source of fast-risetime signals which
may approximate step or pulse waveforms.
A source of repetitive signal waveforms is con
nected to either end of the signal transmission line
which is terminated at the other end in a load. An
amplifier with two inputs is connected to the two
sampling capacitors. These inputs are de-coupled

to a bias circuit and ac-coupled to the amplifier

Power
Level stages. Bias may be adjusted to effect a good com
Monitor
promise between maximum bandwidth [maximum
bias) and maximum output (minimum bias). The
Sampler amplifier may have a normal IF bandpass charac
Sweep
Under
Oscillator
Test teristic and be followed by a detector feeding an
oscilloscope display.
Samplers have been built and tested as illustrated
in Fig. 3. Fig. 4 shows the relative conversion effi
ciency, normalized to unity at low frequencies. The
Level
seven-element low-pass filter structure designed
Horizontal Monitor for 20 GHz cuts off sharply at this frequency and
or Display
Oscilloscope maintains a VSWR of less than 1.7 in the frequency
band.
In Fig. 5, the oscillators are used in their swept
Fig. 3. Typical circuit used tor testing sampler operation mode, showing a response at IFn = NFa ± Fs where
(conversion efficiency, IF response, etc.). IFn is the output frequency of the bandpass ampli-

12

© Copr. 1949-1998 Hewlett-Packard Co.

 Jerry Merkelo
Fig. 4. Relative conversion efficiency of thin-film sampler. Jerry Merkelo was born in the Ukraine. Displaced by
World War II, he received his early education in France,
where he worked as an electrician for a year before
fier, Fs is the sampled signal frequency, and NFd is
coming to the United States in 1956. After a short drafting
the drive pulse repetition rate multiplied by the career, he spent two years in the U.S. Army, then entered
harmonic number. A response is obtained when the University of Illinois and received his BS and MS
ever IFn is in the IF amplifier passband. Note that degrees in electrical engineering in 1965 and 1966. He
the responses are nearly equal in amplitude at all joined HP in 1966. Jerry has worked on microwave
components for synthesizers and high-frequency counters,
frequencies.
and in the thin-film area has developed special mixers,
age amplifiers, microwave filters, and the thin-film
samplers. He's now hybrids line manager with HP's
Acknowledgments Santa Clara Division.
I would like to express my appreciation for con
tinuous and patient support from R. W. Anderson
References
and Dexter Hartke, engineering managers at Hew
1. W. Grove, "Sampling for Oscilloscopes and Other RF
lett-Packard's Santa Clara Division. My thanks also Systems: DC Through X-Band," IEEE Transactions on
go to other members of the Hewlett-Packard team: Microwave Theory and Techniques, Vol. MTT-14, No.
to Merrill Brooksby for helpful suggestions, to John 12, pp. 629—635, December 1966.
Dukes for guidance, and to all members of the thin- 2. W. Grove, "A dc-to-12.4 GHz Feedthrough Sampler
film laboratory and secretarial staff for patient and for Oscilloscopes and Other RF Systems," Hewlett-
Packard Journal, October 1966.
irreplaceable cooperation. Members of HPA Divi 3. S. B. Cohn, "Slot Line on a Dielectric Substrate,"
sion deserve special recognition for patient and IEEE Transactions on Microwave Theory and Tech
continuous effort in device-parameter definition. S niques, Vol. MTT-17, No. 10, pp. 768-778, October 1969.

8 12 18
Frequency (GHz)

Fig. its is swept tests, the sampler produces a response whenever its output frequency is
in the passband of the IF amplifier shown in Fig. 3. Note uniformity of responses.

13

© Copr. 1949-1998 Hewlett-Packard Co.

Automating the Calibration Laboratory
This new family of systems, combining standard and
specially developed hardware and software, greatly
reduces instrument calibration times without sacrificing
precision or thoroughness.
by E. Robert Aikin and John L.Minck

COMPUTER-BASED AUTOMATIC TEST STA Prototype Leads to New Calibration Systems

TIONS have been around for a number of To study the impact of computer-assisted instru
years. They found their earliest uses in production ment calibration, HP has operated a prototype sys
areas, where throughput is high, and in engineering, tem in its Customer Service Center in Mountain
where they provide increased technical perform View, California, for several years. This system is
ance that's impossible to achieve in other ways. In used in the calibration of a wide variety of elec
many cases the complexity of tests, such as a com tronic meters, digital voltmeters, oscilloscopes,
munications satellite, simply make manual mea plug-ins, counters, and oscillators. The Service Cen
surements hopelessly slow, and so an automatic ter handles a diverse workload and hence very
system has been installed. much resembles a typical industry calibration and
Instrument calibration, on the other hand, has so repair shop.
far proved resistant to automation. Automated test The CSC system has served as the forerunner of
ing is most successful and most easily implemented a new family of systems specifically designed to
where little human intervention is required, while match many of the requirements of industry cali
instrument calibration, test, and repair have always bration laboratories. 9550 Instrument Calibration
called for the highest of skill levels and consider Systems, Fig. 1, are modular systems that can be
able manual manipulation. specialized for selective workloads or expanded to
Now, however, it's likely that even the calibra test a broader range of instruments. The systems
tion laboratory will begin to turn to automation use a software operating executive well oriented to
as the most cost-effective solution to its needs.1 a calibration laboratory.
Instruments are becoming substantially more com 9550 systems will be provided with a library of
plex in design and sophisticated in operation. calibration programs for many instruments in com
Training loads are increasing as instrument types mon use. For instruments not included in the li
proliferate. Instrument circuitry is becoming more brary, test technicians can quickly learn to write
digital, making tests more difficult manually, but special programs. The computer language is ATS-
matching computerized systems better. Corpora BASIC, an instrumentation version of the easy-to-
tions are focusing increased attention on the accu learn language BASIC. Test programs now being
racy of their production testing to document written by HP are primarily for performance test
compliance with new product liability responsibili and alignment. Repair and diagnostics are being re
ties. New federal laws concerning worker safety served for a later phase.
will mean procedures, instrumentation, and training
may have to be reexamined for safety considera What Automation Saves
tions. All these factors tend to increase the pres Calibrations with these automatic systems have
sures on the calibration laboratory. proved three to five times faster than manual tech
At the same time, instrument manufacturers are niques. For instance, a performance test of the HP
beginning to design their products with automatic 412A Multimeter runs in 6 minutes, the HP 400E
testing in mind. The computer-testable instrument Voltmeter in 4 minutes, the HP 200CD Oscillator in
is becoming an increasingly large part of the cali 5 minutes, and the HP 180A Oscilloscope main
bration laboratory's workload. frame in about 10-15 minutes.

14

© Copr. 1949-1998 Hewlett-Packard Co.

 Fig. 1. 9550 Instrument Calibra
tion Systems are modular com
puter-controlled dedicated sys
tems designed to help solve cal
ibration laboratory problems of
work overload, personnel train
ing, and laboratory management.
Large and small systems are
available. Calibration-quality
stimulus and measuring instru
ments, plus computer-applied
corrections, assure that auto
mated calibrations equal or ex
ceed manual methods.

This experience, along with comprehensive data In addition to these stimulus instruments, a pro
gathered from many calibration laboratories, has grammable line regulator (GR 1592A) controls ac
been used in a detailed analysis of the time and cost line power to the unit under test so line sensitivity
savings to be expected from automated instrument tests can be run under software control.
calibration.2 This analysis is much too detailed to Operator safety was a prime design objective in
attempt even to summarize it here. It does show, 9550 systems, since lethal voltages must be used
however, that with experienced technicians, auto in many calibrations. In computer systems high
mation can save 5-25 dollars per calibration, based voltages can appear without the operator's turning
on the time saved just in performance test, align a knob or switch, so special hardware and software
ment, and overhead functions. interlocks are provided and warnings to the oper
Not considered in this detailed analysis, but also ator are displayed before high voltage is applied.
very important, is that automation permits routine Most of the stimulus signals are routed through
calibrations to be done by less experienced person a special switching and safety panel. All dc and ac
nel. It thereby frees the experienced technician to voltages over 100 volts must be connected behind
perform more challenging tasks, such as repairing a transparent protective door on the systems inter
defective instruments and writing test programs face panel (Fig. 2). The door is arranged to accept
for newly acquired instruments. typical instrument probes inside its access space.
This door is hardware interlocked to the high-volt
Stimulus Subsystems
age supplies so they will remove all high voltage if
9550 systems use calibration-quality stimulus and the door is opened while high voltage is applied to
measuring instruments recognized by calibration any terminals behind it. Before voltages are ac
laboratory managers for their accuracy and sta tually applied to the terminals behind the closed
bility. A complete list appears on page 24. interlocked door, the software instructions ask for
Low-frequency ac stimulus to 1100 volts rms is a response from the operator to alert him that lethal
obtained from the HP 745/746 AC Calibrator. The voltages are coming.
HP 3320B Synthesizer provides frequencies up to
13 MHz, and RF stimulus to 1300 MHz comes from WARNING — HIGH VOLTAGES NOW BEING
the HP 8660A/86602A Synthesized Signal Gener APPLIED DO NOT TOUCH OUTPUT
ator. CONNECTIONS
DC calibrations to ±1100 volts and to ±110 mil- DO YOU UNDERSTAND? YES
liamperes are done with a Fluke 3330B. An HP
6263B Power Supply provides up to 5 amperes dc. Other interlocks, both hardware and software,
Pulses for testing oscilloscopes are provided by prevent switching high voltages through unex
an HP 8004A Pulse Generator and an HP 211B pected paths to terminals outside the protective
Square-Wave Generator. door. This applies not only to high stimulus volt-

15

© Copr. 1949-1998 Hewlett-Packard Co.

 interface panel. This panel provides high-voltage
scanning, the ability to monitor frequencies with
the counter and other capabilities.
Among the other functions provided by the
switching/interface panel, standard fixed resistors
from 1 ohm to 1.0 megohm are switched under
computer control to a front-panel jack so ohmme-
ters may be checked or currents measured. A spe
cial data scanning function is used for interfacing
the system to instrument data outputs such as
printer outputs on DVMs and counters. Called
"BCD scanning" and described on page 19, this
function offers a flexible method of reading a wide
variety of logic levels and codes used in different
instruments from different manufacturers.
In the future, instruments are expected to be
come more programmable. Therefore, 9550 systems
have a programming connector that permits com
puter control of 48 contact closures to exercise
programmable test units and further reduce the
need for human intervention.
Computer and Peripherals
9550 Instrument Calibration Systems are dedi
cated, "stand-alone" systems. A 16K word mini
Fig. 2. H/gÃ-i voltages in 9550 Systems appear behind this computer, the HP 2100A, operates with a mass
interlocked safety door. Hardware and software interlocks memory disc, the HP 7900A. The disc drive has one
are provided. fixed disc and one replaceable disc pack for a total
of 2.5 million words of storage. The disc serves
ages applied by the system, but also to external as mass storage for a variety of instrument pro
high voltages being measured by the system. grams. Thus the system can be calibrating voltme
ters and within seconds call up programs to cali
Measurement Subsystems brate oscilloscopes as the new workload comes in.
The primary measuring subsystem in 9550 sys A standard line of peripherals is available for
tems is the HP 3480B/3484A Digital Voltmeter various needs. A medium-speed tape punch is used
which makes up to 1000 dc measurements per sec in program writing and to generate master record
ond and provides track-and-hold for ramp and tapes for archive storage or mailing. Various hard-
waveform sampling. Also, its true-rms detector copy peripherals, such as teleprinters and line
provides accurate ac readings up to 10 MHz. Mod printers, provide program listings and permanent
erate accuracy resistance measurements are also copies of test reports. A typical test report printout
possible. is shown in Fig. 3.
Waveform and signal analysis can be performed The system is under the control of a special sys
with a manually operated oscilloscope, an HP tem control panel. On the panel is a key-operated
180D/1801A/1820C. switch that selects either operator or supervisor
Expanded versions of the 9550 family include mode. In supervisor mode, on-line debugging and
additional measuring subsystems under computer program writing are possible. In operator mode, the
control. The HP 3450B DVM provides higher accu programs can be run by the operator but cannot be
racy and resolution in dc measurements. The HP modified by him. A CRT/keyboard unit acts as the
432C Microwave Power Meter measures RF power principal interface between the operator and the
up to 3 GHz (to 18 GHz with optional thermistor system.
mounts). The HP 5327B Counter measures frequen
cies up to 550 MHz. The HP 334A Distortion Ana Human Engineering
lyzer makes measurements on oscillators and Considerable attention was given to the human
sources up to 100 kHz. engineering of the system, since a substantial
Most of the measurement subsystems are con amount of human intervention is still needed in
nected to the unit under test through the switching- calibrating any manual piece of test equipment. A

16

© Copr. 1949-1998 Hewlett-Packard Co.

 Some Definitions for
Calibration Laboratory Work
Performance Check — Primarily a front panel electrical cer
tification with no alignment performed. Might allow for in
ternal checks such as power supply voltages. Generally
includes adjustment of controls accessible without remov
ing covers.
Alignment — Adjustment of mostly internal controls which
set range sensitivities, frequency response, etc.; may be
electrical or mechanical. Very minor repairs permitted such
as changing a starred resistor value. In general, if a control
reaches the end of its travel and must be replaced, it is
considered a repair.
Repair — Diagnosis and replacement of defective compo
nents and modules of the instrument under test.
Preventive Maintenance — Routine service procedures, such
as air filter cleaning, vacuuming up paper particles, or oil
ing sliding parts.
Mechanical Inspection — Cleanup and touchup procedures
such as window polishing, cabinet paint touchup, knob
tightening, etc.

CRT, and answering DONE, YES, or NO with the

hand-held remote control unit in the other hand.
The remote control unit has a long cord su the op-
orator can move conveniently.
A novel approach to assist alignments and ad
justments is a three-light cluster on the remote con
trol unit. These can be used for a number of pur
poses, but one example is as follows. The three
lights are labeled "HIGH," "PASS" and "LOW."
As an operator is making an adjustment on an in-
Text continued on page 20.

Fig. 3. Typical 9550 test report shows failure points (*"*)

and running time.

small hand-held operator keyboard (see Fig. 4] was

designed to allow the operator to communicate with
the computer. This remote control unit is especially Fig. 4. A hand-held remote control unit with lights and
valuable when the operator is switching ranges buttons tor operator /system communication is useful in
with one hand, watching for the instructions on the many procedures.

17

© Copr. 1949-1998 Hewlett-Packard Co.

 Novel Procedures Speed Automatic Calibrations
The design of 9550 Instrument Calibration Systems repre Watching the needle deflection, he presses the appropriate
sents an effort to strike an optimum balance between hard button to provide more or less stimulus voltage and quickly
ware and software systems, with due consideration given to adjusts the stimulus so the needle deflection is exactly over
human factors and the nature of the unit under test. To the 0.1 cardinal point. He then presses the "DONE" button
automate a test, it's not enough to transcribe the manual on the remote controller. The system measures and records
test procedures onto the computer or simply to record all the voltage at the 41 2A meter output jack (proportional to
of the instructions out of the service procedure. Instead, meter deflection). The system also records the true dc volt
it's important to step back from manual procedures and age required at the input of the instrument to deflect the
look at the fundamental purpose of each test before starting needle to the 0.1 point.
to program an instrument for automatic test. A few examples The system next applies a nominal 20% FS signal and
will give a better perception of this technique. the sequence is repeated. And so it goes, through each of
the cardinal points as the operator adjusts the stimulus and
Electronic Meter Calibration aligns the needle to the exact cardinal point. At each of
In calibrating an electronic meter, much of the time (and these points, the system is characterizing the meter move
error) is associated with the operator's visually reading the ment in terms of the electrical output required to get a
meter movement. On a multifunction meter, such as the HP particular mechanical deflection. The whole process typi
41 2A, the operator must switch through 13 range positions cally takes 30 seconds. The data is stored in a correction
for the three different functions of volts, milliamperes and table in memory.
ohms, a total of 39 switch positions. At each position he The system ¡mmediately determines whether the meter
must interpret the full-scale indication and decide whether movement is linear from the recorded stimulus required
the instrument is within specifications. He must also run a for the series of cardinal point deflections.
meter movement linearity test on one range to make sure The real time-saving impact now occurs as the operator
that the meter movement is linear. Here's how the 9550 tests all three functions in each of the 13 different range
does it (see diagram). positions. The system instructs him to set the range to 1
First, the system programs the stimulus to a nominal 10% millivolt and, with one hand on the range switch, he clicks
of full scale (0.1 volt) and the needle deflects to approxi over to the bottom range. In his other hand he presses the
mately 10% of full scale. The operator holds the remote "DONE" button and the system immediately applies one
control box, with its "UP/DOWN" buttons, in his hand. millivolt. The operator no longer has to look at the meter
movement because the electrical output and the previously
characterized meter data tells the system whether the nee
dle is deflected to precisely full scale. The system quickly
takes its data and then issues a new instruction for the
operator to switch the range to 3 millivolts. He again presses
the "DONE" button and the system electrically reads the
meter deflection. The meter face might as well be covered
with a mask since the operator no longer pays any attention
to the meter deflection.
Once the voltage function test is completed, the milli-
ampere function and then the ohms function are checked
with much the same speed, again without any need for the
operator to watch the meter scale. The operator's total at
tention is on the CRT viewing screen; he keeps one hand
on the range switch and the remote control box in the other
hand. The entire performance test takes only 6 minutes.

Oscilloscope Time Base

Another unconventional technique can be applied to os
cilloscope time base calibrations. Using the traditional tech
niques and a time mark generator, and checking each range
of the time base plug-in for sweep accuracy, most of the
time is spent checking the very long sweeps. For instance,
the longest sweep at 5 s/cm would typically take 50 sec
onds. It's necessary for the operator to wait all the way
through each sweep to see how the last time mark comes
out. Minutes of waiting time are consumed on the slow
sweeps. Worse yet, when adjustments are needed, the op
erator must wait for the sweep retrace and start a whole
new run to see whether his time adjustment was accurate.

'Some older instruments don't have a meter output jack and the cover
System setup for calibration of electronic meter. must be removed to gain access to this voltage.

18
© Copr. 1949-1998 Hewlett-Packard Co.
 With an automatic system, time base calibrations can be resulting in a more accurate calibration.
much faster. First, the system digital voltmeter with high
input impedance is attached to the horizontal deflection
plates of the oscilloscope (usually through some isolation BCD Scanning for Counters and DVMs
resistance). Then the CRT instructs the operator to adjust In calibrating a typical digital voltmeter, an operator
the beam manually to zero centimeters and the system needs to see every numerical value of every display digit
measures the voltage required to deflect the spot to that to check for dead spots. He must also check range accu
position. The operator adjusts the beam to the 5-centimeter racy and linearity and, at the same time, look at the binary-
graticule and then to 10 cm, and the system records the coded decimal data coming from the printer output con
voltage required for those deflections. After a quick com nector on the rear. By considering this group of functional
putation of the volts per centimeter sensitivity of the CRT tests from scratch, it is possible to reorder them into an
tube, the system instructs the operator to start the sweep. extremely fast sequence, making use of the power of the
So far what has happened is equivalent to the meter char computer.
acterization already described. First, there is a severe interface problem in dealing with
The system digital voltmeter has a track-and-hold option a variety of manufacturers' BCD standards. A BCD code can
that can determine a voltage at a precisely known time. be weighted ±1224 or ±1248, and levels may have any
Using this capability, the system quickly measures two volt of the following combinations of values as well as others.
ages at an accurately timed interval and computes the
sweep voltage slope in volts/second. After comparing that
number with the precalibration in volts/cm, the system LogicO : 0V -24V -8V -28V
easily determines whether the slope of the CRT ramp is Logic 1 : + 5V -1V +18V -2V
adequately calibrated. It is not necessary to wait for the
entire sweep to occur since the slope over a small segment
is adequate for the computer to make a go/no-go decision. This is just for one manufacturer. Other manufacturers use
Finally, the operator is instructed to switch through all of their own logic levels, and some older counters and instru
tre sweep's speeds and before the trace moves more than ments use staircases for digital output.
about one-third of the total sweep, each sweep's accuracy Instead of requiring an individual interface card for each
can be assured. The sweep is permitted to go completely combination of logic codes and levels, 9550 systems use
through one full sweep so sweep linearity can be assured an interface technique that relies on the very fast dc sam
for the entire distance, but it is generally not necessary to pling of the system digital voltmeter. The four-line BCD
do this step in every range position. groups from the unit under test appear on a scanner
Naturally, it isn't possible to use this technique on faster switch that is gated to the fast-sampling system digital
sweeps. The technique is changed at about five millisec voltmeter. The DVM reads the voltage on each of the BCD
onds per centimeter due to the sampling rate and time lines, and the system software decides the logic level and
resolution of the DVM, and high-frequency loading of the logic weighting of the instrument under test.
CRT. However, as mentioned before, the fast sweeps are First, the system applies 0 volt stimulus and the operator
not the time consuming part of the calibration. adjusts the zero adjust until the display reads all zeros.
A useful byproduct of this technique comes into play When he presses the "DONE" button, the system scans
when adjustments are required on the sweep time. The across all 16 BCD output lines. Assuming a logic code of
slope readout of the system indicates whether the adjust + 1248 and logic levels of —8 and +18 volts, the system
ment made is correct. Thus it is not necessary for the op DVM would see —8 volts on all the BCD lines.
erator to wait for the entire sweep. The system then programs a nominal 1.111 from the dc
Validation tests have been run on this technique and stimulus and the operator is instructed to adjust the "UP/
correlations within 0.5 percent of traditional time-mark tech DOWN" button until all ones appear in the display. When
niques have been achieved repeatedly. The same basic he presses the "DONE" button, the system scans across
technique can be used on the vertical attenuators and all 16 lines and sees the voltages appear as follows: +18,
amplifiers by characterizing the vertical CRT sensitivity at -8, -8, -8, +18, -8, -8, -8, etc.
midfrequency ranges in volts/centimeter. Traditional high- The system then programs 2.222 and again the operator
frequency response and pulse response tests are still per makes adjustments to the stimulus until all the display
formed. digits are 2's. Again the system scans the electric outputs
The automatic system also provides benefits when cali and sees -8. +18, -8, -8, etc.
brating the faster sweeps. Using conventional time-mark Repeating this process for 0.000 through 9.999, the op
techniques the operator must estimate the number of centi erator sees every number in every digit position and at the
meters of error by observing the position of a time mark same time the system looks at every electrical output com
relative to a major graticule mark. His viewing accuracy is bination.
typically one-half minor division or 0.1 cm. In 9550 systems The advantage of the technique, however, is that the
the precise HP 3320B Synthesizer triggers the HP 8004A operator doesn't have to read the display when other func
Pulse Generator to serve as a programmable time mark tional tests are to be performed, such as ohms, or mA.
generator. The operator uses the remote control unit to The system has already compared inputs, visual readouts,
vary the synthesizer frequency UP or DOWN to align the and BCD outputs. In effect, the system can now "read"
leading edge of the time mark pulse exactly under a major the unit under test. The operator has already seen that
graticule mark. He then presses DONE and the system there are no dead spots. So in one fast run through ten
reads the frequency of the oscillator and converts the read positions, the linearity, the display and the BCD outputs are
ing to time per centimeter. Thus operator error is eliminated, all checked in less than one minute.

19

© Copr. 1949-1998 Hewlett-Packard Co.

strument, the system may be monitoring, for exam ning for these software costs which accrue not
ple, the voltage of a power supply. only at the installation of a system but involve a
If the voltage is out of tolerance and on the high continuing expense during its useful lifetime.
side, only the "HIGH" light will turn on. The sys There is substantial advantage in having the in
tem may even tell the operator which direction to strument manufacturer generate test programs. In
turn the adjustment, and, as he moves down into ternal knowledge of the instrument under test as
the in-tolerance region, the "HIGH" light will stay evidenced in a program written by technicians ex
lighted and the "PASS" light will turn on. Finally, perienced with the instrument can offer subtle im
as he moves through the center of the tolerance provements over a test program merely transcribed
band the "HIGH" light will switch to "LOW" with from the instrument manual by a professional pro
the "PASS" light remaining on. Subsequently, the grammer.
"PASS" light will go out when the voltage is below Therefore, HP has planned a user interchange li
the tolerance band. brary starting with a group of HP-furnished pro
Thus a very precise center-of-range indication is grams to allow early cost-effectiveness for installed
provided to the operator. Since the box is movable, systems. The early programs will cover high popu
it can be placed close to the operator's field of view lation instruments typical of many calibration labo
as he makes his adjustments. This can be a major ratories. Fig. 5 is a list of these programs.
safety feature if adjustments are being made on These application programs include performance
very high voltage supplies. The operator does not tests plus alignment and adjustment procedures.
have to look over to the system panels. For HP instruments, the program content is at least
equal in capability to the calibration techniques
Software Operating System described in the service manuals, and frequently
The software operating system is a disc-based includes tests and techniques learned in years of
executive called TODS (Test Oriented Disc Sys instrument test experience (see page 18).
tem). TODS is designed to eliminate restrictions on Of course, it will be impossible for HP to provide
the size and scope of software programs that might test programs for all instruments that require peri
otherwise be limited by the available computer core odic calibration, so most users will at some time
memory. It provides for segmenting of programs write programs of their own. Because instrument
on the disc and easy access to the various seg testing has many common aspects regardless of
ments via program and subroutine linking. HP ATS- where it is done, there is substantial advantage in
BASIC, FORTRAN, and HP Assembly Language are standardizing instrument calibration programs and
all compatible with TODS. operating systems. With suitable standards, there
TODS also provides editing routines that can can be general compatibility and interchange of
automatically delete or change source programs on programs among dozens and perhaps even hun
the disc. This is important when new programs are dreds of users for better efficiency.
being written and debugged. It is often surprising even to experienced pro
Another important feature of TODS is the cata grammers what degree of conformity is required
log and librarian system. As the system stores pro and how detailed standards must be to guarantee
grams on the disc it catalogs their locations so they compatibility. To assure compatibility among cali
can easily be accessed by instrument test routines. bration programs written not only by HP but also
On command, the librarian will print out a list of by different users, relatively strict standards have
the programs stored on any selected portion of the
disc. It will also print the amount of space remain
ing on the disc.
In addition to programs, the disc also provides
data storage for test results. Test data is normally
stored in data files using a standardized system
format that allows easy access for printed test rec
ords or other more permanent files.
Calibration Programs
A widely used rule of thumb for system planners
is if entirely new applications software must be
Fig. 5. HP will supply performance test and alignment pro
generated, costs can easily run between one and
grams tor many instruments, starting with these. A users'
three times the cost of the hardware in the system. group is being established so user-written programs can
Therefore, careful concern must be given to plan also be shared.

20

© Copr. 1949-1998 Hewlett-Packard Co.

 been established. Fig. 6 shows the required test pro
TEST PROGRAM FORMAT gram format and some typical program segments.
Notice that REM (remark) statements are used ex
tensively to communicate the function of each sec
tion of the program.

Executive Sequence Control

As common and standardized as instrument cali
brations are (a 400D is calibrated much the same
in all calibration laboratories), it is still true that
most laboratories have their own special test phi
losophies and operating rules. Based on experience
with the Customer Service Center system and other
work, Hewlett-Packard has developed a special ex
ecutive sequence control for 9550 Instrument Cali
bration Systems. This operating executive serves
Typical Program Mainflow as a central traffic director for the ongoing techni
cal tests.
Generally, most of the tests made on an instru
REM OPERATOR INSTRUCTIONS
8500
ment are divided into technical test segments as
"DEPRESS DONE WHEN COMPLETED"
shown in Fig. 7. The HP 412A test program, for
instance, consists of a test directory, five technical
REM VALUES
test segments, a test record segment, and an align
READ
• '
R C n . P C S ]
S A V E E X P E C T E D * T O L E R A N C E V A L U E S
ment segment. In this case, the sequence control
LET t 1 J-V
' - C I ) - T
D S P L A Y R A N G E R E Q U I R E D
handles the entry into each test segment and pro
: ,- i 7
6
D S P L A Y
D S P L A Y
R C
R t
1
I !
1 / I 0 0 0 Ã T A B ( 0 > ; " V "
i T A B Ã 0 ) ; " V "
vides for an orderly sequence through the test seg
DON E 7
7 Ml ments. At the same time, it is controlling the dis
OT PC 1 ] GOTO I 160
•-
I I |
I T RANGE > 1 0 MV GOTO I 508
3 GOTO 1500
position of data and keeping track of the status and
APPLY CURRENT ACROSS i OHM RESISTOR j n sequence of test segments.
5.31 >
37.41 )
EXPRESS CURRENT IN MA
The sequence control is needed because various
LET PC2J=1000»PC2]
REM * APPLY VOLTAGE
things happen in a typical calibration sequence that
GOSUB 7800
WAIT 200 require operator intervention, and these events
GOTO 2000
REM * SET SWITCHING FOR VOLTAGE PROGRAMMING must be made compatible with a computerized
system. For example, if a probe falls off the inter
Typical Subroutine for Entering Ranges and Tolerances face panel during a test, the operator must halt the
5810 REM * EXPECTED VALUE 4 FULL SCALE TOLERANCE program and return to some point from which he
Sfl20 DATA I . .01
5830 REM * RANGE (MV) t FULL SCALE VOLTAGE (V>
5840 DATA I,. 00 1. 3. .00316. I 0. . 01 , 30. .03 I 6. 1 00. . I. 300,. 31 6
can proceed forward again. In 9550 systems, a
5850 REM * RANGE (V) t FULL SCALE VOLTAGE (V)
5660 DATA I/ 1,3, 3- 16. 10. 10. 30, 31. 6, I 00. 100,300.316. 1002, 1000 "bailout" button is provided. Pressing this button
turns off stimulus and clears switching in an orderly
Typical Measurement Subroutine way, returns to the sequence control, displays the
•-*
R Â £ M
REM •
M E T E R D C O U T P U T M E A S test directory (Fig. 7), preserves the previous data,
-- -
••â.€¢
D V M S U ( I ,
F O R K - l
, 2 >
0 2 0
and asks the operator where to restart.
-•.- D U M M U C 2 . ( 7 ) . 4 0 0 )
-••
â-€¢
R E M
IF APS t P
* S E T L E D T O
7 3 - P 1 8 1
- I t ?
X . 0 0 1 Â « P t ? ) G O T O 9 6 8 0
Another example: an internal malfunction causes
9 6 6 0 - T L E O T O 2 M I L L I V O L T S O N S C A L E S
an instrument to start smoking when a high voltage,
M -•
NEXT K
REM • PASS VOLTAGE READ such as 1000 volts, is applied to it during a normal
.- -
test cycle. In some systems, stopping the program
.- . .
simply halts the computer, leaving all switches
closed and 1000 volts still applied to the instrument.
In 9550 systems, pressing the bailout button starts
an orderly shutdown sequence which opens all
Fig. 6. Strict standards will help assure compatibility of switches and turns off the high voltage. Then the
HP and user-written programs. Program format is fixed,
sequence control places the test directory back on
and REM statements are used liberally in programs to
enable others to understand them. Language is ATS- the screen to inform the operator of the present
BASIC, an instrumentation version of the easy-to-learn status of the test sequence.
language, BASIC. Another function of the sequence control is to

21

© Copr. 1949-1998 Hewlett-Packard Co.

 Enter

Instrument
Select

TEST DIRECTORY «12

TEST SETUP i ID GENERAL TESTS

MLTER CHARA! FtHIZATTON
VOLTAGE RAM! : ACCURACY

RESISTANCE RANGE ACCURACY

TEST REPORT

... SELECT SEGMENT NUMBER I

Trap Exit
Entry

Fig. 7. Executive sequence con

trol adapts sophisticated 9550
software to the calibration labo
ratory environment. A normal se
quence proceeds automatically,
but test interruptions and de
cision points cause the test di
rectory to appear on the CRT so
the operator can select what to
do next.

provide for operator alignment or adjustment se substantial improvements in instrumen accuracies

quences after any performance test. If a particular by means of computer-stored correction routines.
test segment fails, the operator gets a "segment fail" Correction factors and cable losses as well as in
indication and may then choose an associated align strument calibration factors can all be worked into
ment test segment to adjust the instrument within the programs so that substantially better accuracies
specification. can be achieved than with any one of the instru
Probably the most important feature of the ments themselves. Hence automated calibration
sequence control is that it is written in the same gives up nothing in precision compared to manual
ATS BASIC language as all test segments. Thus, techniques; in fact the opposite is true.
although HP personnel have written the executive
with their best ideas of proper sequence and test Acknowledgments
philosophies, it is easy for the local calibration The HP Customer Service Center in Mountain
laboratory to add its own administrative procedures View, California, provided the early impetus for
and test philosophies to the basic control. If the automatic instrument calibration. Neil Neilson
local laboratory needs to enter technician badge planned and built the prototype system to test con
numbers or output special instructions to the op cepts and cost effectiveness with the management
erator, it can easily insert them. If the local labora support of John Walling, Jim Hodel, and Chuck
tory doesn't want an operator to perform alignment Ernst. Mark Sayer contributed greatly to system
or adjustment segments, it takes only a few ATS- configuration and software.
BASIC statements to implement this capability. The On the 9550 project, Chuck Martin designed the
great advantage is that a change need only be made special switching interface, Larry Lim did the me
in the sequence control and it is automatically in chanical design, Bob Valentine assisted with high
corporated in all test programs without modifying accuracy measuring techniques, and Steve Harper
the test programs. developed system self-check procedures. Homer
Tsuda designed the sequence control architecture.
Better than Manual Accuracy The entire project was aided by the management
The power of the computer offers a chance to get insight of Dale Ewy. The project manager is now

22
© Copr. 1949-1998 Hewlett-Packard Co.
 Don Lawrence and Ron Gould is in charge of pro
Observations from duction engineering.
an Operating System We feel it's also important to acknowledge the
The following observations from the operating system in active interest in automatic instrument calibration
the HP Customer Service Center in Mountain View may be of the U.S. Army's Metrology Engineering Center
appropriate. at Huntsville, Alabama. Mr. Fred Seeley, Mr. Wil
Automatic calibration systems must keep busy. Running
liam Barron and Mr. Malcolm Shelton contributed
time for a typical station is worth about $1 per minute, de
pending how overhead is assigned. This means that the
much in concept, vision, and encouragement during
system must have instruments available in a warmup mode the project.
in front of the system before they actually reach the test Finally, many system safety concepts were intro
position. For instance, if six or eight meters can run per duced to protect the system operators by Ernie
hour and a given meter requires a one-hour warmup, eight
Harper, who heads HP Automatic Measurement
or ten warmup positions must be provided.
It is especially important to provide adequate interface Division efforts to develop design concepts for sys
switching rather than rely on an operator to cable and un- tem safety to meet IEC and other standards. J
cable interconnections. A given connection absorbs about
30 seconds of running time, including the time it takes to References
read an instruction, to understand it, to connect, to check 1. "Management Strategy for Calibration Labs," HP
the connection, and an average time to correct mistakes. 9550 Tech Note 2, HP Publication 5952-1382.
Thus specialized switching is quite cost-effective. 2. J. Minck, "Justifying Automatic Calibration Systems,"
The combination of the computer system and an innova Instruments and Control Systems, October 1972. Also
tive programmer knowledgeable in metrology techniques is published as "HP 9550 Automatic Calibration System
hard to overestimate. Experience with a typical program Investment Analysis," HP Publication 5952-1378.
writing cycle for the HP 412A Multimeter is instructive. On
the first pass, the HP 41 2A sequence ran about 11 minutes.
Multiple probe changes were required and a number of
techniques were quite clumsy. By changing switching and
providing faster and novel measuring techniques, the time
was reduced to 9 minutes, and finally to 6 minutes.

John L. Minck
John Minck is Market Manager for Instrument Calibration
Systems at HP's Automatic Measurement Division. A
member of the Precision Measurement Association and
the American Society for Quality Control, he also serves
as Region 1 2 Coordinator for the National Conference of
Standards Laboratories. He's the author of several articles
in technical publications and co-editor of a textbook on
microwave measurements. John received his BSEE degree
in 1952 from the University of Notre Dame and his
MSEE-Administration degree from Stanford University in
1956. He joined HP in 1958 as a sales and applications
engineer and later served as regional sales manager. In
1 964 he became marketing manager of the Microwave
Division, and five years later, manager of the Solid State
Display Department. He assumed his present position
in 1971.

E. Robert Aikin
After serving in the U.S. Navy, Bob Aikin attended the
University of Colorado, graduating with a BSEE degree in
1 952. He came to HP the same year. Since then, he's
been assistant service manager, applications engineer,
field service engineering manager, program manager, and
engineering project manager, his latest project being the
9550 Instrument Calibration System. Bob and his wife
have an unusual family; besides one child of their own
they have four adopted ones — two from Korea, one from
Greece, and one from California. Bob serves on the board
of directors of the local area association and favors
outdoor recreational pursuits, including sailing,
backpacking, and skiing.

23

© Copr. 1949-1998 Hewlett-Packard Co.

 SYSTEM INFORMATION RESISTANCE
HP 9550 Instrument Calibration Systems HP 3480B/3484A Multifunction DVM
Ohms Range: 100 !! to 10 Mfi, F.S.
Stimulus WAVEFORM
AC CALIBRATION SOURCE HP 180D/1801A/1820A 50 MHz Dual-Channel Oscilloscope
HP 745A-H18/746A-H17 AC Calibrator (Manual Operation)
HIGH RESOLUTION DC VOLTAGE
Frequency Range: 10 Hz to 110 kHz
HP 3450A Digital Voltmeter
Voltage Range: 1 mv to 110 V rms (745A) to 1100 V rms (746A)
AC SOURCE Voltage Range: 100 mV to 1000 V, F.S.
FREQUENCY
HP 3320B 13 MHz Synthesizer
HP 5327B Timer/Counter
Frequency Range: .001 Hz to 13 MHz
Frequency Range: 0 to 550 MHz
Output Level: -73 dBm to +26.99 dBm (5 V rms into 500)
Period Range: 0 to 10 MHz, 1 to 10' periods
RF SOURCE
Time Interval: 0.1 MS to 10' sec
HP 8660A/86602A 1300 MHz Synthesizer
DISTORTION
Frequency Range: 1 MHz to 1300 MHz
HP 334A-H15 Distortion Analyzer
Output Level: -146 dBm to 13 dBm (1.0 V rms into 50 Ã!)
Fundamental Range: 50 Hz to 100 kHz
DC CALIBRATION SOURCE
Distortion Range: 0.1 to 100%
Fluke 3330 B DC Calibrator
RF POWER
Voltage Range: 0 to ±1100 Vdc
HP 432C/478A Power Meter
Current Range: 0 to ±110 mA
Frequency Range: 1 MHz to 3 GHz (18 GHz optional)
PULSE SOURCE
Power Range: 10 ^W to 10 mW. F.S. (beyond 10 mW with
HP 8004A Pulse Generator (Manual Operation, Rate Programmed)
calibrated attenuators)
Repetition Rate: 100 Hz to 10 MHz
HIGH VOLTAGE AND SWITCHING
Transition Times: < 1.5ns
HP 09551-60002 Signal Switching Interface and
Pulse Amplitude: ±0.05 V to ±5 V peak (into 50 Ã-¡)
High Voltage Safety Interlock Panel
Pulse Width: 0 to 1 ms
SQUARE WAVE SOURCE Computer and Peripherals
HP 211 B Square Wave Generator HP 2100 A Computer, 16K Core Memory
Frequency Range: 1 Hz to 10 MHz HP 2752A Teleprinter
Output Voltage: 0 to 5 V, 50 !.' HP 2748A Photo Reader
0 to 60 V, Open Circuit HP 9403A System Control Panel
HIGH CURRENT SOURCE HP 7900A Dual Disc Memory (one disc pack replaceable)
HP 6263B High Current Source HP 2600A Keyboard/Display
Current Range: 0 to 5 A HP 9404A Control Unit
Voltage Range: 0 to 5 V HP 2155A Input/Output Extender
AC LINE POWER SOURCE HP 12539B Time Base Clock
GR 1592 AC Line Regulator
Output Voltage: 102, 115, 125 V rms
Options
HP 2895.A Medium Speed Punch
Output Current: 0 to 10 A
HP 2767A Line Printer
Input Voltage: 100 to 130 V rms
HP 2754B Heavy Duty Teleprinter
RESISTANCE SOURCE (Programmable)
HP 11163A Worktable
Fixed Values: 1 !>, 10 Ü, 100 S, 1 k«,
10 ku, 100 kSJ, 1 MO General
SIZE: 3-bay or 4-bay Cabinet
Measurement
64.25 inches (1632 mm), overall height
DC VOLTAGE
POWER: 3-Phase, 20 A per phase
HP 3480B/3484A Multifunction DVM
PRICE IN USA: $125,000 to $175,000 depending upon capability
Voltage Range: 100 mV to 1000 V, F.S.
and options.
AC VOLTAGE
MANUFACTURING DIVISION:AUTOMATIC MEASUREMENT DIVISION
HP 3480B/3484A Multifunction DVM
974 East Arques Avenue
Frequency Range: 1 Hz to 10 MHz
Sunnyvale, California 94086
Voltage Range: 100 mV to 1000 V, F.S.

Bulk Rate
Hewlett-Packard Company. 1501 Page Mill U.S. Postage
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Hewlett-Packard
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HEWLETT-PACKARDJCONAL
APRIL 1973 Volume 24 • Numbers
Technical information from the Laboratories of
Hewlett-Packard Company
Hewlett Packard S t-
Geneva. Switzerland

. apan

Editorial Director • Howard L Roberts

Managing Editor • Richard P. Dolan
Contributing Editors • Ross H. Snyder,
Laurence D Shergalis

Art Director. Photographer • Arvid A. Danielson

Art Assistant • Erica R Helstrom
Administrative Services • Anne S LoPresti
E u rop 'Can Production Manager • Kurt Hungerbühle

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© Copr. 1949-1998 Hewlett-Packard Co.