sup06
sup06
Management
Supplement 6 –
Statistical Process Control
PowerPoint presentation to accompany
Heizer/Render
Principles of Operations Management, 6e
Operations Management, 8e
© 2006
© 2006 Prentice
Prentice Hall, Inc. Hall, Inc. S6 – 1
Statistical Process Control
(SPC)
Variability is inherent in every process
Natural or common causes
Special or assignable causes
Provides a statistical signal when
assignable causes are present
Detect and eliminate assignable
causes of variation
© 2006 Prentice Hall, Inc. S6 – 2
Natural Variations
Also called common causes
Affect virtually all production processes
Expected amount of variation
Output measures follow a probability
distribution
For any distribution there is a measure
of central tendency and dispersion
If the distribution of outputs falls within
acceptable limits, the process is said to
be “in control”
© 2006 Prentice Hall, Inc. S6 – 3
Assignable Variations
Also called special causes of variation
Generally this is some change in the process
Variations that can be traced to a specific
reason
The objective is to discover when
assignable causes are present
Eliminate the bad causes
Incorporate the good causes
17 = UCL
Variation due to
16 = Mean natural causes
15 = LCL
Variation due
| | | | | | | | | | | |
to assignable
1 2 3 4 5 6 7 8 9 10 11 12 Out of causes
Sample number control
where
R =average range of the samples
D3 and D4=control chart factors from
Table S6.1
= (0)(5.3)
= 0 pounds
© 2006 Prentice Hall, Inc. S6 – 14
Mean and Range Charts
(a)
These (Sampling mean is
sampling shifting upward but
distributions range is consistent)
result in the
charts below
UCL
(x-chart detects
x-chart shift in central
tendency)
LCL
UCL
(R-chart does not
R-chart detect change in
mean)
LCL
Figure S6.5
© 2006 Prentice Hall, Inc. S6 – 15
Control Charts for Attributes
For variables that are categorical
Good/bad, yes/no,
acceptable/unacceptable
Measurement is typically counting
defectives
Charts may measure
Percent defective (p-chart)
Number of defects (c-chart)
© 2006 Prentice Hall, Inc. S6 – 16
Control Limits for p-Charts
Population will be a binomial distribution,
but applying the Central Limit Theorem
allows us to assume a normal distribution
for the sample statistics
.08 –
.07 –
.06 –
.05 –
.04 – p = 0.04
.03 –
.02 –
.01 – LCLp = 0.00
.00 – | | | | | | | | | |
2 4 6 8 10 12 14 16 18 20
Sample number
© 2006 Prentice Hall, Inc. S6 – 19
p-Chart for Data Entry
UCLp = p + zp^ = .04 + 3(.02) = .10
Possible
LCLp = p - zp^ = .04 - 3(.02) =assignable
0
causes present
.11 –
.10 – UCLp = 0.10
.09 –
Fraction defective
.08 –
.07 –
.06 –
.05 –
.04 – p = 0.04
.03 –
.02 –
.01 – LCLp = 0.00
.00 – | | | | | | | | | |
2 4 6 8 10 12 14 16 18 20
Sample number
© 2006 Prentice Hall, Inc. S6 – 20
Control Limits for c-Charts
Population will be a Poisson distribution,
but applying the Central Limit Theorem
allows us to assume a normal distribution
for the sample statistics
UCLc = c + 3 c LCLc = c - 3 c
UCLc = c + 3 c 14 –
UCLc = 13.35
14
Number defective
=6+3 6 12 –
= 13.35 10 –
8 –
6 – c= 6
LCLc = c - 3 c 4 –
=3-3 6 2 – LCLc = 0
0 – | | | | | | | | |
=0 1 2 3 4 5 6 7 8 9
Day
Target
Target
Target
Target
Target
Target
75 –
Probability
of 50 –
Acceptance
25 –
10 –
= 0.10 Percent
0 |– | | | | | | | |
0 1 2 3 4 5 6 7 8 defective
Consumer’s AQL LTPD
risk for LTPD Good Indifference
Bad lots
lots zone
n = 50, c = 1
n = 100, c = 2
(Pd)(Pa)(N - n)
AOQ =
N
where
Pd = true percent defective of the lot
Pa = probability of accepting the lot
N = number of items in the lot
n = number of items in the sample
100
Producer’s Risk
90 N = Sample Size
80
C = Maximum Number of
P of accepting the lot percent
70 Defectives in a Sample to
60
accept the Lot.
50
40 N = 50 , C = 2
30
20
10
0
0 2 5 10
N = Sample Size
C= Maximum Number of
Defectives
in a Sample to accept the Lot.
N
=
25
.C
=
1
N
=
50
.C
20 N
=
=
10
2
0.
C=
10 4
5
0
1 5
A.Q.L. L.T.P.D
© 2006 Prentice Hall, Inc. Actual Percent Detectives in Lot S6 – 41
Possible Errors in a Sampling Plan
Producer’s risk
Lot is actually good A favorable
(α)
(AQL) outcome
Type I Error
Consumer’s risk
Lot is actually bad A favorable
(β)
(LTPD) outcome
Type II error