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The document discusses different characterization techniques used to analyze materials, including microscopy and spectroscopy. It defines characterization as probing and measuring a material's structure and properties. Microscopy techniques like SEM, TEM, and optical microscopy are used to map surface and subsurface structures at different magnifications. Spectroscopy techniques like EDS, XRD, and mass spectrometry reveal a material's chemical composition, crystal structure, and other properties. Specific examples provided are the construction and working principles of SEM and TEM, as well as an EDS spectrum of stainless steel.
Overview of characterization techniques, definitions, and types including SEM, TEM, and EDS.
Characterization techniques divided into categories: Microscopy and Spectroscopy.
Microscopy defined as a technique to map material structure; various instruments such as SEM, TEM.
Spectroscopy defined to determine chemical composition and properties; instruments like EDS, X-ray Diffraction.
Focus on microscopy as a topic including construction and principles of SEM with actual images.
Focus on Transmission Electron Microscopy (TEM), construction, actual images including Polio Virus.
Further exploration of spectroscopy with details on Energy-Dispersive X-ray spectroscopy and example spectrum.


















